CN111579488A - Method, device and equipment for measuring surface emissivity of object and storage medium - Google Patents
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- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
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- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
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Abstract
The invention discloses a method for measuring the surface emissivity of an object, which comprises the steps of determining the reflectivity of the surface of the object to be measured to infrared light output by an infrared light source according to a first infrared induction signal and a second infrared induction signal output by an infrared sensor for sensing infrared light radiated by the object to be measured under the irradiation of the infrared light source and under the irradiation of no infrared light source on the surface of the object to be measured; and determining the emissivity of the object to be measured according to the reflectivity. When the emissivity of an object to be tested is measured, a standard sample is not needed to be used as a reference, error interference generated by the external environment on a test result can be well eliminated, the requirement on the test condition is low, the test process is simplified, and the accuracy of the test result is improved. The application also provides a device and equipment for measuring the surface emissivity of the object and a computer readable storage medium, which have the beneficial effects.
Description
Technical Field
The invention relates to the technical field of material emissivity, in particular to a method, a device and equipment for measuring the surface emissivity of an object and a computer readable storage medium.
Background
Emissivity is defined as the ratio of the surface radiant energy of a material to the radiant energy of a black body at the same temperature. The surface emissivity of various materials is an important thermophysical parameter of the material. The measurement of the emissivity of the material relates to the application of the material in a plurality of fields such as aerospace, military, chemical engineering, construction, medical treatment, new energy and the like.
In the prior art, the measurement method for emissivity of a material mainly includes three methods: calorimetry, reflectance, radiant energy. However, in the currently adopted reflectivity method, a standard sample is often used for reference, the test conditions are harsh, errors caused by the reflection of the tested sample to the ambient radiation cannot be eliminated, and the emissivity of the sample with low emissivity is difficult to measure.
Disclosure of Invention
The invention aims to provide a method, a device and equipment for measuring the surface emissivity of an object and a computer readable storage medium, which improve the accuracy of the measured surface emissivity of the object.
In order to solve the above technical problem, the present invention provides a method for measuring an emissivity of a surface of an object, comprising:
respectively acquiring a first infrared sensing signal and a second infrared sensing signal which are output by the infrared sensor sensing infrared rays radiated by an object to be measured under the irradiation of an infrared light source and without the irradiation of the infrared light source on the surface of the object to be measured;
collecting a third infrared sensing signal generated by the infrared sensor when infrared rays of the infrared light source radiate the infrared sensor;
determining the reflectivity of the surface of the object to be detected to the infrared light output by the infrared light source according to the first infrared induction signal, the second infrared induction signal and the third infrared induction signal;
and determining the emissivity of the object to be detected according to the reflectivity and the corresponding relation between the reflectivity and the emissivity of the object to be detected.
In an optional embodiment of the present application, determining, according to the first infrared sensing signal, the second infrared sensing signal, and the third infrared sensing signal, a reflectivity of the surface of the object to be measured to the infrared light output by the infrared light source includes:
according to the reflectivity formula of the surface of the object to be detected: e ═ S2-S1)/S3Determining the reflectivity e; wherein S is1Is the first infrared induction signal, S2Is the second infrared induction signal, S3Is the third infrared sensing signal.
In an optional embodiment of the present application, determining the emissivity of the object to be measured according to the reflectivity and the corresponding relationship between the reflectivity and the emissivity of the object to be measured includes:
according to the corresponding relation satisfied between the reflectivity and the emissivity of the object to be detected: and E, determining the emissivity E of the object to be measured, wherein E is 1-E.
The application also provides a measuring device of object surface emissivity, includes:
the first acquisition module is used for respectively acquiring a first infrared sensing signal and a second infrared sensing signal which are output by the infrared sensor sensing infrared rays radiated by the object to be detected under the irradiation of an infrared light source and without the irradiation of the infrared light source on the surface of the object to be detected;
the second acquisition module is used for acquiring a third infrared sensing signal generated by the infrared sensor when infrared light of the infrared light source radiates the infrared sensor;
the reflectivity module is used for determining the reflectivity of the surface of the object to be detected to the infrared light output by the infrared light source according to the first infrared induction signal, the second infrared induction signal and the third infrared induction signal;
and the emissivity module is used for determining the emissivity of the object to be detected according to the reflectivity and the corresponding relation between the reflectivity and the emissivity of the object to be detected.
In an optional embodiment of the present application, the reflectivity module is specifically configured to, according to a reflectivity formula of the surface of the object to be measured: e ═ S2-S1)/S3Determining the reflectivity e; wherein S is1Is said first infrared signal, S2Is said second infrared signal, S3Is the firstAnd (4) three infrared signals.
The application also provides a device for measuring the surface emissivity of the object, which comprises an infrared light source, an infrared sensor and a signal processor;
the infrared sensor is used for respectively sensing radiation infrared rays of an object to be detected under the irradiation of the infrared light source and without the irradiation of the infrared light source to generate a first infrared sensing signal and a second infrared sensing signal; the infrared light source is also used for sensing infrared light radiation of the infrared light source and generating a third infrared sensing signal;
the signal processor is used for executing the steps of the method for measuring the surface emissivity of the object according to any one of the first infrared induction signal, the second infrared induction signal and the third infrared induction signal.
In an optional embodiment of the present application, the infrared sensor further comprises an optical lens disposed on an incident light path of the infrared sensor.
In an optional embodiment of this application, still include mobilizable speculum for when infrared sensor detects infrared light source's infrared radiation, move to on infrared light source's the emergent light path, and will infrared light source's infrared light reflection incides to infrared sensor.
In an optional embodiment of the present application, the apparatus further includes a driving device capable of driving the infrared light source to move, and the driving device is configured to drive the infrared light source to move to a position where infrared light is incident on the object to be measured when the infrared sensor senses and generates the first infrared sensing signal; and when the infrared sensor generates a third infrared sensing signal, driving the infrared light source to emit infrared light to the infrared sensor.
In a computer-readable storage medium of the present application, a computer program is stored, which when executed by a processor implements the steps of a method for measuring the emissivity of a surface of an object as described in any one of the preceding claims.
The invention provides a method for measuring the surface emissivity of an object, which comprises the steps of respectively acquiring a first infrared induction signal and a second infrared induction signal which are output by an infrared sensor sensing infrared rays radiated by the object to be measured under the irradiation of an infrared light source and under the irradiation without the infrared light source on the surface of the object to be measured; collecting a third infrared sensing signal generated by an infrared ray radiation infrared sensor of an infrared light source; determining the reflectivity of the surface of the object to be detected to the infrared light output by the infrared light source according to the first infrared induction signal, the second infrared induction signal and the third infrared induction signal; and determining the emissivity of the object to be detected according to the reflectivity and the corresponding relation between the reflectivity and the emissivity of the object to be detected.
In the application, when the emissivity of an object to be detected is measured, two infrared sensing signals of the object to be detected under the irradiation of an infrared light source and under the irradiation of no infrared light source are directly collected, obviously, the energy of infrared light reflected radiation light of the object to be detected to the infrared light source can be obviously determined based on the two infrared sensing signals, and therefore, errors generated by external environmental factors on the infrared light sensed by detection are eliminated; and then collecting the energy of the infrared sensor directly irradiated by the infrared light source, obviously, the reflectivity of the object to be detected to the surface of the object to be detected can be determined by using the light energy of the infrared light source radiated by the object to be detected and the radiation energy of the infrared light source reflected and radiated by the object to be detected, and the emissivity of the object to be detected can be obtained based on the reflectivity of the object to be detected.
When the emissivity of an object to be tested is measured, a standard sample is not needed to be used as a reference, error interference generated by the external environment on a test result can be well eliminated, the requirement on the test condition is low, the test process is simplified, and the accuracy of the test result is improved.
The application also provides a device and equipment for measuring the surface emissivity of the object and a computer readable storage medium, which have the beneficial effects.
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In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
Fig. 1 is a schematic flowchart of a method for measuring an emissivity of a surface of an object according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of an apparatus for measuring surface emissivity of an object according to an embodiment of the present disclosure;
FIG. 3 is a block diagram of an apparatus for measuring surface emissivity of an object according to an embodiment of the invention;
fig. 4 is another schematic structural diagram of an apparatus for measuring surface emissivity of an object according to an embodiment of the present application.
Detailed Description
The core of the invention is to provide a technical scheme for measuring the surface emissivity of a material object, so that the interference error generated by the external environment can be eliminated to the maximum extent according to the measurement result, the operation process of measuring the emissivity is simplified, and the requirement on the test environment is reduced.
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, fig. 1 is a schematic flowchart of a method for measuring an emissivity of a surface of an object according to an embodiment of the present application, where the method may include:
s1: the infrared light source irradiates the surface of an object to be detected, and a first infrared sensing signal is collected through the sensing of the infrared sensor.
Specifically, referring to fig. 2, fig. 2 is a schematic structural diagram of an apparatus for measuring an emissivity of a surface of an object provided in this embodiment of the present application, in which an infrared light source 3 emits an infrared light to a surface of an object 6 to be measured, the infrared light is reflected on the surface of the object 6 to be measured, and an infrared sensor 2 is disposed on a reflection light path of the infrared light, receives an infrared light beam reflected from the surface of the object 6 to be measured, and generates a corresponding infrared sensing signal.
It should be noted that, for the infrared detector 2, it should include three parts to receive the infrared light reflected by the surface of the object to be measured 6, the first part is the infrared light reflected by the infrared light beam of the infrared light source 3, the second part is the infrared light radiated by the object to be measured 6 itself, and the third part is the infrared light reflected by the surface of the object to be measured 6 to the infrared sensor 2.
S2: and turning off the infrared light source, and acquiring a second infrared induction signal of the surface of the object to be detected through the infrared sensor.
When the object 6 to be measured is not irradiated by the infrared light source 3, the infrared light radiated outwards from the surface of the object 6 to be measured includes two parts, one part is the infrared light radiated outwards from the object 6 to be measured, and the other part is the infrared light reflected by the object 6 to be measured to the environment and incident to the infrared sensor 2.
Obviously, the infrared light radiated outward by the object to be measured 6 itself included in the second infrared sensing signal in step S2 and the infrared light in the environment reflected by the object to be measured 6 included in the first infrared sensing signal in step S1 should be the same.
S3: and directly irradiating the infrared beam of the infrared light source to the infrared sensor, and acquiring a third infrared sensing signal generated by the infrared sensor.
When the infrared light source 3 emits infrared light beams directly entering the infrared sensor 2, that is, the infrared sensor 2 receives the irradiation of all the infrared light beams emitted by the infrared light source 2.
It should be noted that, there is no necessary sequence for steps S1, S2, and S3, and in actual operation, the sequences of the three steps may be interchanged according to test convenience, which is not specifically limited in this application.
S4: and determining the reflectivity of the surface of the object to be detected to the infrared light output by the infrared light source according to the first infrared sensing signal, the second infrared sensing signal and the third infrared sensing signal.
Specifically, as described above, the first infrared sensing signal is a sensing signal generated by the infrared sensor 2 sensing an infrared light beam reflected by the object 6 to be measured from the infrared light source 3, an infrared light beam radiated from the object 6 to be measured, and an infrared light beam reflected by the surface of the object 6 to be measured from the infrared light beam in the environment;
and the second infrared sensing signal is a sensing signal generated by the infrared sensor 2 sensing the infrared light radiated outwards by the object 6 to be measured and the infrared light reflected by the surface of the object 6 to be measured to the infrared light in the environment.
Obviously, the difference between the first infrared sensing signal and the second sensing signal is also the sensing signal generated by the infrared sensor 2 sensing the infrared light of the infrared light source reflected by the object to be measured.
And the third infrared sensing signal is a sensing signal generated by the infrared sensor 2 directly receiving the infrared light irradiation of the infrared light source 3.
Obviously, for the object 6 to be measured, when the beam of the infrared light source 3 is irradiated on the surface thereof, the object 6 to be measured is not necessarily 100% reflective to the infrared light source 3, but partially absorbing and partially reflecting.
The total energy ratio of the object 6 to be measured to the reflected infrared light from the infrared light source 3 incident on the surface thereof is the reflectivity of the object 6 to be measured. Then, in this embodiment, the difference between the first infrared sensing signal and the second infrared sensing signal is that after the object 6 to be measured partially reflects the light incident from the infrared light source 3 to the infrared sensor 2, the infrared sensor 2 receives the generated sensing signal.
The infrared light beam directly incident on the surface of the object 6 to be measured by the infrared light source 3 and the light beam incident on the infrared sensor 2 by the infrared light source 3 should be the same, and the infrared sensor 2 receives a third infrared sensing signal generated by the direct incidence of the infrared light source, that is, a sensing signal generated by the infrared sensor 2 sensing the total infrared light beam incident on the surface of the object 6 to be measured by the infrared light source 3.
Therefore, when the reflectivity of the object 6 to be detected is determined according to the first infrared sensing signal, the second infrared sensing signal and the third infrared sensing signal, the difference operation is performed on the first infrared sensing signal and the second infrared sensing signal, the ratio calculation is performed on the result of the difference operation and the third infrared sensing signal, and the result of the ratio calculation is also the reflectivity of the object 6 to be detected.
Alternatively, the reflectance calculation formula may be directly employed: e ═ S2-S1)/S3And determining the reflectivity e of the object to be measured.
Wherein S is1Is a first infrared induction signal, S2Is the second infrared induction signal, S3Is the third infrared sensing signal.
S5: and determining the emissivity of the object to be detected according to the reflectivity and the corresponding relation between the reflectivity and the emissivity of the object to be detected.
For the object 6 to be measured, the sum of the reflectivity and the absorptivity of the object 6 to be measured to the infrared light is 1, and the absorptivity and the emissivity of the object 6 to be measured to the infrared light are equal, that is, the sum of the emissivity and the reflectivity of the object 6 to be measured is equal to 1. Thus, after the reflectivity of the object 6 is determined, the emissivity E of the object 6 can be determined according to E ═ 1-E.
When measuring the emissivity on object surface in this application, not the direct emissivity to the object that awaits measuring, but measure earlier and there is the reflectivity of definite incidence relation with the object emissivity that awaits measuring, and when measuring reflectivity, eliminate infrared sensor induction production infrared induction signal in-process through measuring the object that awaits measuring under infrared light source's irradiation and not having infrared light source irradiation infrared light's infrared ray's difference, the interference that infrared light among the external environment produced, and then improve the object that awaits measuring to the rate of accuracy of infrared light reflectivity at to a great extent, the accuracy of the emissivity of the object that awaits measuring has just been guaranteed. The requirement of whole operation process to measuring environment is low in this application, and the operation of being convenient for just can guarantee the accuracy of the emissivity that records at to a great extent.
The following describes an apparatus for measuring surface emissivity of an object according to an embodiment of the present invention, and the apparatus for measuring surface emissivity of an object described below and the apparatus for measuring surface emissivity of an object described above may be referred to in correspondence.
Fig. 3 is a block diagram of a device for measuring surface emissivity of an object according to an embodiment of the present invention, where the device for measuring surface emissivity of an object according to fig. 3 may include:
the first acquisition module 100 is configured to respectively acquire a first infrared sensing signal and a second infrared sensing signal, which are output by the infrared sensor sensing infrared light emitted by an object to be detected under the irradiation of an infrared light source and under the irradiation of no infrared light source, on the surface of the object to be detected;
the second acquisition module 200 is configured to acquire a third infrared sensing signal generated by the infrared sensor when infrared light of the infrared light source radiates the infrared sensor;
a reflectivity module 300, configured to determine, according to the first infrared signal, the second infrared signal, and the third infrared signal, a reflectivity of the surface of the object to be measured to the infrared light output by the infrared light source;
and the emissivity module 400 is configured to determine the emissivity of the object to be measured according to the reflectivity and the corresponding relationship between the reflectivity and the emissivity of the object to be measured.
In another optional embodiment of the present application, the reflectivity module 300 is specifically configured to, according to a reflectivity formula of the surface of the object to be measured: e ═ S2-S1)/S3Determining the reflectivity e; wherein S is1Is said first infrared signal, S2Is said second infrared signal, S3Is the third infrared signal.
In another optional embodiment of the present application, the emissivity module 400 is specifically configured to, according to a corresponding relationship that is satisfied between the reflectivity and the emissivity of the object to be measured: and E, determining the emissivity E of the object to be measured, wherein E is 1-E.
The device for measuring the surface emissivity of the object of the present embodiment is used to implement the method for measuring the surface emissivity of the object, and therefore, the specific implementation of the device for measuring the surface emissivity of the object may be found in the foregoing embodiment of the method for measuring the surface emissivity of the object, and is not described herein again.
The present application further provides an embodiment of an apparatus for measuring an emissivity of a surface of an object, which may specifically refer to fig. 2, and the apparatus may include:
an infrared light source 3, an infrared sensor 2 and a signal processor 1;
the infrared sensor 2 is used for respectively sensing radiation infrared rays of an object 6 to be detected under the irradiation of the infrared light source 3 and without the irradiation of the infrared light source 3 to generate a first infrared sensing signal and a second infrared sensing signal; the infrared induction device is also used for inducing infrared ray radiation of the infrared light source 3 and generating a third infrared induction signal;
the signal processor 1 is configured to execute the steps of the method for measuring the surface emissivity of an object according to any one of the above-mentioned first infrared sensing signal, second infrared sensing signal and third infrared sensing signal.
Specifically, the infrared light source 3 may emit infrared light to the object 6 to be measured, and the infrared light is reflected by the surface of the object 6 to be measured and then enters the infrared sensor 2.
When measuring the first infrared induction signal, can control infrared light source 3 to light, and when measuring the second infrared induction signal, control infrared light source 3 to extinguish.
Alternatively, in consideration of a small light-sensing area of the general infrared sensor 2, detection of infrared light of a large field range is not possible. The optical lens 4 may be arranged in front of the infrared sensor 2. Specifically, the device formed by combining the infrared sensor 2 and the optical lens 4 may be a thermal infrared imager.
Alternatively, in another alternative embodiment of the present application, as shown in fig. 4, fig. 4 is a schematic diagram of an apparatus for measuring the surface emissivity of an object provided in another embodiment of the present application, and fig. 2 and fig. 4 are compared with each other, and the difference is only the inversion of the position of the mirror 5 therein. The infrared light emitted by the infrared light source 3 is shielded by the reflector 5 and does not enter the object to be measured 6 any more, but the light path is changed by the reflector 5 and enters the infrared sensor 2.
In fig. 2 and 4, the infrared light source 1 is fixedly disposed outside the optical lens 4. Then, the light beam of the infrared light source 1 needs to be incident on the optical lens 4 and then incident on the infrared sensor 2 through the optical lens 4, and the reflection mirror 5 is required to deflect the light path.
The mirror 5 used in fig. 2 and 4 is a triangular prism. In practice, it is not excluded to use other forms of mirror 5.
Considering that the light beam of the infrared light source 3 is reflected by the reflector 5, and there is a light loss to a greater or lesser extent, in another optional embodiment of the present application, the present application further includes a driving device capable of driving the infrared light source 3 to move, so as to drive the infrared light source 3 to move to a position for injecting infrared light to the object 6 to be measured when the infrared sensor 2 senses and generates the first infrared sensing signal; when the infrared sensor 2 generates the third infrared sensing signal, the infrared light source 3 is driven to irradiate the infrared sensor 2 with the position of the infrared light.
Specifically, the infrared light source 3 is provided as a movable light source, and is connected to a driving device. When the infrared light is required to enter the light beam to the object to be measured 6, the driving device moves the infrared light source 3 to a position where the infrared light can enter the object to be measured, such as one side of the optical lens 4, even closer to the object to be measured 6, so as to reduce the light loss as much as possible; when infrared light is required to be incident into the optical lens 4, the infrared light source 3 is moved to a position where the infrared light is directly emitted to the optical lens 4.
To sum up, the measurement of object surface emissivity in this application can control infrared light source and realize the accurate measurement of the reflectivity on object to be measured surface to transmitting infrared light beam on object to be measured and the infrared detector, has avoided the interference that environmental factor produced infrared sensor response object to be measured reflection infrared light source's light beam, eliminates the environment to the degree of accuracy of surveying object surface reflectivity to be measured, and then has guaranteed the precision of the emissivity on object to be measured surface.
Embodiments of a computer-readable storage medium are also provided. In particular, the computer readable storage medium is used for storing a computer program which, when being executed by a processor, realizes the operation steps of the method for measuring the surface emissivity of an object as described in any of the above embodiments.
In particular, the computer-readable storage medium may be Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Furthermore, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include elements inherent in the list. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element. In addition, parts of the above technical solutions provided in the embodiments of the present application, which are consistent with the implementation principles of corresponding technical solutions in the prior art, are not described in detail so as to avoid redundant description.
The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (10)
1. A method for measuring the emissivity of a surface of an object, comprising:
respectively acquiring a first infrared sensing signal and a second infrared sensing signal which are output by an infrared sensor sensing infrared rays radiated by an object to be detected under the irradiation of an infrared light source and without the irradiation of the infrared light source on the surface of the object to be detected;
collecting a third infrared sensing signal generated by the infrared sensor when infrared rays of the infrared light source radiate the infrared sensor;
determining the reflectivity of the surface of the object to be detected to the infrared light output by the infrared light source according to the first infrared induction signal, the second infrared induction signal and the third infrared induction signal;
and determining the emissivity of the object to be detected according to the reflectivity and the corresponding relation between the reflectivity and the emissivity of the object to be detected.
2. The method for measuring the surface emissivity of the object according to claim 1, wherein determining the reflectivity of the surface of the object to be measured to the infrared light output by the infrared light source according to the first infrared sensing signal, the second infrared sensing signal and the third infrared sensing signal comprises:
according to the reflectivity formula of the surface of the object to be detected: e ═ S2-S1)/S3Determining the reflectivity e; wherein S is1Is the first infrared induction signal, S2Is the second infrared induction signal, S3Is the third infrared sensing signal.
3. The method for measuring the surface emissivity of the object according to claim 2, wherein determining the emissivity of the object to be measured according to the reflectivity and the corresponding relationship between the reflectivity and the emissivity of the object to be measured comprises:
according to the corresponding relation satisfied between the reflectivity and the emissivity of the object to be detected: and E, determining the emissivity E of the object to be measured, wherein E is 1-E.
4. An apparatus for measuring the emissivity of a surface of an object, comprising:
the first acquisition module is used for respectively acquiring a first infrared sensing signal and a second infrared sensing signal which are output by the infrared sensor sensing infrared rays radiated by the object to be detected under the irradiation of an infrared light source and without the irradiation of the infrared light source on the surface of the object to be detected;
the second acquisition module is used for acquiring a third infrared sensing signal generated by the infrared sensor when infrared light of the infrared light source radiates the infrared sensor;
the reflectivity module is used for determining the reflectivity of the surface of the object to be detected to the infrared light output by the infrared light source according to the first infrared signal, the second infrared signal and the third infrared signal;
and the emissivity module is used for determining the emissivity of the object to be detected according to the reflectivity and the corresponding relation between the reflectivity and the emissivity of the object to be detected.
5. The apparatus for measuring surface emissivity of an object according to claim 4, wherein the reflectivity module is specifically configured to, according to a reflectivity formula of the surface of the object to be measured: e ═ S2-S1)/S3Determining the reflectivity e; wherein S is1Is the first infrared induction signal, S2Is the second infrared induction signal, S3Is the third infrared sensing signal.
6. The device for measuring the surface emissivity of the object is characterized by comprising an infrared light source, an infrared sensor and a signal processor;
the infrared sensor is used for respectively sensing radiation infrared rays of an object to be detected under the irradiation of the infrared light source and without the irradiation of the infrared light source to generate a first infrared sensing signal and a second infrared sensing signal; the infrared light source is also used for sensing infrared light radiation of the infrared light source and generating a third infrared sensing signal;
the signal processor is configured to perform the steps of the method for measuring the emissivity of a surface of an object according to any one of claims 1 to 3, based on the first infrared sensing signal, the second infrared sensing signal and the third infrared sensing signal.
7. The apparatus for measuring surface emissivity of an object of claim 6, further comprising an optical lens disposed in an incident optical path of the infrared sensor.
8. The apparatus for measuring surface emissivity of an object of claim 7, further comprising a movable mirror for moving to an exit path of the infrared light source and reflecting infrared light from the infrared light source to the infrared sensor when the infrared sensor detects infrared light radiation from the infrared light source.
9. The apparatus for measuring surface emissivity of an object of claim 7, further comprising a driving device for driving the infrared light source to move, when the infrared sensor senses the first infrared sensing signal, the driving device drives the infrared light source to move to a position where infrared light is incident on the object to be measured; and when the infrared sensor generates a third infrared sensing signal, driving the infrared light source to emit infrared light to the infrared sensor.
10. A computer-readable storage medium for storing a computer program which, when being executed by a processor, carries out the steps of the method for measuring the emissivity of a surface of an object as claimed in any one of claims 1 to 3.
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