CN112904228A - Secondary circuit short-circuit fault arc identification method based on electro-optical information composite criterion - Google Patents

Secondary circuit short-circuit fault arc identification method based on electro-optical information composite criterion Download PDF

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CN112904228A
CN112904228A CN202110096044.9A CN202110096044A CN112904228A CN 112904228 A CN112904228 A CN 112904228A CN 202110096044 A CN202110096044 A CN 202110096044A CN 112904228 A CN112904228 A CN 112904228A
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circuit
current
short
circuit fault
secondary circuit
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CN112904228B (en
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陈昊
谭风雷
徐鹏
张海华
刘怀宇
张兆君
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Maintenance Branch of State Grid Jiangsu Electric Power Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/52—Testing for short-circuits, leakage current or ground faults
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y04—INFORMATION OR COMMUNICATION TECHNOLOGIES HAVING AN IMPACT ON OTHER TECHNOLOGY AREAS
    • Y04S—SYSTEMS INTEGRATING TECHNOLOGIES RELATED TO POWER NETWORK OPERATION, COMMUNICATION OR INFORMATION TECHNOLOGIES FOR IMPROVING THE ELECTRICAL POWER GENERATION, TRANSMISSION, DISTRIBUTION, MANAGEMENT OR USAGE, i.e. SMART GRIDS
    • Y04S10/00—Systems supporting electrical power generation, transmission or distribution
    • Y04S10/50—Systems or methods supporting the power network operation or management, involving a certain degree of interaction with the load-side end user applications
    • Y04S10/52—Outage or fault management, e.g. fault detection or location

Abstract

The invention discloses a secondary circuit short-circuit fault arc identification method based on electro-optical information composite criterion, which belongs to the technical field of relay protection of a power system, and realizes secondary circuit short-circuit fault arc identification based on electrical and optical characteristics by arranging an arc light sensor and a current acquisition unit on a main (branch) branch of a secondary circuit, and mainly comprises the following steps: determining the characteristic frequency of the short-circuit fault current of the secondary circuit; calculating a secondary circuit short-circuit fault arc identification parameter; establishing a secondary circuit short-circuit fault electric arc identification logic based on the secondary circuit short-circuit fault electric arc identification parameters, and identifying and processing the secondary circuit short-circuit fault electric arc. The method can reliably identify the secondary circuit short-circuit fault electric arc, shorten the average judging time of the secondary circuit short-circuit fault to be within 10ms, and realize the quick and reliable removal of the secondary circuit short-circuit fault.

Description

Secondary circuit short-circuit fault arc identification method based on electro-optical information composite criterion
Technical Field
The invention relates to a secondary circuit short-circuit fault arc identification method based on electro-optical information composite criterion, and belongs to the technical field of relay protection of power systems.
Background
When the secondary circuit has short-circuit fault, electric arcs generated by fault current easily cause open fire to burn out secondary cables and peripheral operating equipment. Although the conventional protection device can remove faults, the judgment time is too long (400ms-3000ms), the action accuracy is low, the fire spread is easily caused, and the normal operation of a secondary circuit is threatened.
Disclosure of Invention
In order to overcome the defects in the prior art, the invention provides a secondary circuit short-circuit fault electric arc identification method based on electro-optical information composite criterion.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows:
the invention provides a secondary circuit short-circuit fault arc identification method based on electro-optical information composite criterion, which comprises the following steps:
an arc light sensor and a current acquisition unit are arranged on a main branch of the secondary circuit, and the arc light sensor is arranged on a bus; the arc light sensor and the current acquisition unit are arranged at the head end of each branch cable of the secondary circuit; collecting current information of a secondary circuit of the branch in which the current collecting unit is arranged, and collecting light information of the branch in which the current collecting unit is arranged through an arc light sensor;
determining the characteristic frequency of the secondary circuit short-circuit fault current according to the acquired secondary circuit current information;
calculating a secondary loop short-circuit fault electric arc identification parameter according to the secondary loop current sampling information and the secondary loop short-circuit fault current characteristic frequency;
and establishing a secondary circuit short-circuit fault arc identification logic based on the secondary circuit short-circuit fault arc identification parameters.
Further, the determining the characteristic frequency of the secondary circuit short-circuit fault current according to the collected secondary circuit current information includes:
carrying out Fourier transform on the secondary circuit short-circuit fault current;
sorting harmonic components of the secondary circuit short-circuit fault current based on the secondary circuit short-circuit fault current after Fourier transform;
and determining the characteristic frequency of the secondary circuit short-circuit fault current based on the sorted secondary circuit short-circuit fault current.
Further, the fourier transform of the secondary circuit short-circuit fault current includes:
Figure BDA0002914074720000021
wherein ix(t) is the short-circuit fault current of the secondary loop at the time of t, F represents the sampling frequency of the system, IxjRepresents the effective value of the jth harmonic component of the secondary loop short-circuit fault currentxjThe j harmonic phase value of the secondary loop short-circuit fault current is shown, and t represents time.
Further, the sorting the harmonic components of the secondary-loop short-circuit fault current based on the secondary-loop short-circuit fault current after the fourier transform includes:
sorting the harmonic components of the short-circuit fault current of the secondary circuit according to the effective values;
wherein, when the effective values of some two harmonic components are equal, the frequency lower harmonic is arranged in front of the frequency higher harmonic.
Further, the determining a characteristic frequency of the secondary-circuit short-circuit fault current based on the sorted secondary-circuit short-circuit fault currents includes:
calculating the ratio of harmonic components:
Figure BDA0002914074720000022
wherein, Px(n) represents that the harmonic components of the short-circuit fault current of the secondary circuit are sorted according to the magnitude of the effective valueJ (k) represents the harmonic times corresponding to the kth harmonic after the harmonic components of the short-circuit fault current of the secondary circuit are sorted according to the effective value;
when P is presentxAnd (n) is more than or equal to 0.8, the first n harmonics are the characteristic harmonics of the short-circuit fault current of the secondary circuit, and the frequency corresponding to the characteristic harmonics is the characteristic frequency.
Further, the calculating the secondary circuit short-circuit fault arc identification parameter according to the secondary circuit current sampling information and the secondary circuit short-circuit fault current characteristic frequency includes:
calculating the secondary loop current according to the secondary loop current sampling information;
judging the distortion position of the secondary loop current based on the secondary loop current;
calculating a fault arc identification parameter based on the secondary loop current and the characteristic frequency of the secondary loop short-circuit fault current by taking the secondary loop current from the z moment to the z +0.01 moment of the secondary loop current distortion position as a research object; the identification parameters comprise a secondary loop current effective value, a secondary loop current harmonic total proportion and a secondary loop current characteristic harmonic proportion.
Further, the calculating the secondary loop current according to the secondary loop current sampling information includes:
Figure BDA0002914074720000031
Figure BDA0002914074720000032
wherein I (t) is the secondary loop current at time t, IRMSEffective value of secondary loop current, t1Indicating the initial moment of sampling, w0Is the initial phase, i, of the secondary loop currentCtF represents the system sampling frequency, which is the sampled value of the secondary loop current.
Further, the determining a distortion position of the secondary loop current based on the secondary loop current includes:
calculating the current change rate:
Figure BDA0002914074720000033
wherein, YtThe current change rate of two adjacent sampling points at time t,
calculating YtCorresponding maximum value Ymaxt；
Rate of change of current Y at a certain momentzGreater than YmaxtWhen the current is zero, the time z is the suspected distortion position of the secondary loop current, and when the current is Yz+1/FAnd Yz+2/FAre all greater than YmaxtThen, the z time is the distortion position of the secondary loop current.
Further, the calculating the fault arc identification parameters comprises:
effective value I of secondary loop current from z moment to z +0.01 momentRMSZ：
Figure BDA0002914074720000034
Total harmonic ratio P of secondary loop current1：
Figure BDA0002914074720000041
Characteristic harmonic ratio P of secondary loop current2：
Figure BDA0002914074720000042
Wherein, tzDenotes time z, IjRepresenting the effective value, I, of the jth harmonic component of the secondary loop currentjThe harmonic component of the secondary circuit short-circuit fault current is obtained by performing Fourier transform on the secondary circuit current from z moment to z +0.01 moment, K represents the number of the characteristic frequency of the secondary circuit short-circuit fault current, and J (K) represents the harmonic component of the secondary circuit short-circuit fault current according to an effective valueAnd after the sizes are sorted, the harmonic times corresponding to the kth harmonic are obtained.
Further, the establishing a secondary circuit short-circuit fault arc identification logic based on the secondary circuit short-circuit fault arc identification parameter includes:
defining a secondary circuit short-circuit fault arc identification condition:
condition 1: effective value of secondary loop current IRMSZGreater than the maximum effective value I of the secondary loop current allowed in the normal stateMAX；
Condition 2: total harmonic ratio P of secondary loop current1The maximum harmonic total ratio P of the secondary loop current which is larger than the allowable secondary loop current in the normal state1MAX；
Condition 3: characteristic harmonic ratio P of secondary loop current2The ratio of the secondary loop current characteristic harmonic wave P which is larger than the allowable secondary loop current characteristic harmonic wave in the normal state2MAX，P2MAXGenerally greater than 0.8;
condition 4: the arc sensor detects arc information and shows that G is 1;
establishing secondary circuit short circuit fault arc identification logic according to identification conditions:
branch circuit arc identification logic:
when a branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4, the branch is delayed for 10ms to be opened;
when a certain branch of the secondary circuit simultaneously meets the conditions 1, 2, 3 and 4, directly tripping the branch to be opened;
total branch arc identification logic:
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4 or all the branch circuits simultaneously meet the conditions 1, 2 and 4, the main branch is opened in an empty mode after being delayed for 10 ms;
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4 and all the branch circuits are in the branch positions, directly tripping the main branch circuit to be in the open state;
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2, 3 and 4 or all the branch circuits simultaneously meet the conditions 1, 2, 3 and 4, the main branch is directly tripped and is opened.
The invention has the beneficial effects that:
the invention provides a secondary circuit short-circuit fault arc identification method based on 'electrical and optical' information composite criterion, which realizes the quick and reliable identification of the secondary circuit short-circuit fault arc based on electrical and optical characteristics through an arc sensor and a current acquisition unit of a secondary circuit main (branch) branch cable. The method can accurately identify the secondary circuit short-circuit fault arc; the average judgment time of the short-circuit fault of the secondary circuit can be shortened to be within 10ms, and the short-circuit fault of the secondary circuit can be quickly and reliably cut off.
Drawings
FIG. 1 is a schematic view of the mounting position of the arc sensor and current collection unit of the present invention.
FIG. 2 is a flow chart of a secondary circuit short circuit fault arc identification method of the present invention.
Fig. 3 is a schematic diagram of secondary loop short circuit fault arc identification logic of the present invention.
Detailed Description
The invention is further described below. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
The invention provides a secondary circuit short-circuit fault arc identification method based on 'electricity and light' information composite criterion, wherein an arc light sensor and a current acquisition unit are arranged on a main branch circuit of a secondary circuit, and the arc light sensor is arranged on a bus; and arc light sensors and current acquisition units are arranged at the head ends of the branch cables of the secondary circuit. The current information of each branch circuit of the secondary circuit is independently acquired through the current acquisition unit, and the identification of the short-circuit fault electric arc of the secondary circuit is realized by combining the light information acquired by the arc light sensor.
The installation positions of the arc sensor and the current acquisition unit of the invention are shown in figure 1.
An arc light sensor and a current acquisition unit are arranged on a main branch of the secondary circuit, wherein the arc light sensor is arranged on a bus; and arc light sensors and current acquisition units are arranged at the head ends of the branch cables of the secondary circuit.
The secondary circuit short-circuit fault arc identification method of the invention, as shown in fig. 2, comprises the following steps:
step 1: determining the characteristic frequency of the secondary circuit short-circuit fault current, comprising the following steps:
step 1.1: fourier transform is carried out on the secondary circuit short-circuit fault current,
after Fourier transformation, the secondary loop short-circuit fault current ix(t) can be expressed as:
Figure BDA0002914074720000061
wherein F represents the system sampling frequency, IxjRepresents the effective value of the jth harmonic component of the secondary loop short-circuit fault currentxjThe j harmonic phase value of the secondary loop short-circuit fault current is shown, and t represents time.
Step 1.2: and sequencing harmonic components of the secondary circuit short-circuit fault current.
Sorting the harmonic components of the short-circuit fault current of the secondary circuit according to the effective values;
wherein, when the effective values of some two harmonic components are equal, the lower harmonic is arranged in front of the higher harmonic.
Step 1.3: and determining the characteristic frequency of the short-circuit fault current of the secondary circuit based on a 'two eight principle'.
After the secondary circuit short-circuit fault current harmonic component sorting is finished, calculating the proportion of the harmonic component, wherein the calculation expression is as follows:
Figure BDA0002914074720000062
in the formula, PxAnd J (k) represents the harmonic times corresponding to the kth harmonic after the harmonic components of the short-circuit fault current of the secondary circuit are sorted according to the effective values.
According to the two eight principle, when PxWhen (n) is more than or equal to 0.8, the first n harmonicsThe characteristic harmonic of the short-circuit fault current of the secondary circuit is obtained, and the frequency corresponding to the characteristic harmonic is the characteristic frequency.
Step 2: and calculating the secondary loop short-circuit fault arc identification condition.
Step 2.1: the current of the secondary loop is calculated,
let the sampling value of the secondary loop current be iCtThe effective value of the secondary loop current IRMSCan be expressed as:
Figure BDA0002914074720000071
in the formula, t1Indicating the initial moment of sampling.
Let the initial phase of the secondary loop current be w0The sinusoidal form of the secondary loop current i (t) can then be expressed as:
Figure BDA0002914074720000072
step 2.2: and judging the distortion position of the secondary loop current.
According to the secondary loop current i (t), the current change rate Y of two consecutive sampling points can be obtainedtComprises the following steps:
Figure BDA0002914074720000073
calculating YtCorresponding maximum value Ymaxt；
Rate of change of current Y at a certain momentzGreater than YmaxtWhen Y is the pseudo distortion position of the secondary loop current, the time z is considered as the pseudo distortion position of the secondary loop currentz+1/FAnd Yz+2/FAre all greater than YmaxtThen, the z time is considered as the distortion position of the secondary loop current.
Step 2.3: and calculating the current identification parameter of the secondary loop current short-circuit fault arc.
And when the moment z is detected to be the distortion position of the secondary loop current, calculating the current identification parameter of the fault arc by taking the secondary loop current from the moment z to the moment z +0.01 as a research object.
Firstly, calculating the effective value I of the secondary loop current from the z moment to the z +0.01 momentRMSZ：
Figure BDA0002914074720000074
tzRepresents time z;
then, Fourier transform is carried out on the secondary loop current from the z moment to the z +0.01 moment, and the following results are obtained:
Figure BDA0002914074720000075
in the formula IjRepresenting the effective value, w, of the jth harmonic component of the secondary loop currentjRepresenting the j harmonic phase value of the secondary loop current.
Calculating the total harmonic ratio P of the secondary loop current1：
Figure BDA0002914074720000081
Calculating the characteristic harmonic ratio P of the secondary loop current2：
Figure BDA0002914074720000082
In the formula, K represents the number of secondary circuit short-circuit fault current characteristic frequencies.
And step 3: and establishing secondary loop short circuit fault arc identification logic.
The secondary circuit short circuit fault arc identification logic of the present invention is shown in fig. 3.
Defining a secondary circuit short-circuit fault arc identification condition:
condition 1: effective value of secondary loop current IRMSZGreater than the allowable secondary return under normal conditionsMaximum effective value of current IMAX；
Condition 2: total harmonic ratio P of secondary loop current1The maximum harmonic total ratio P of the secondary loop current which is larger than the allowable secondary loop current in the normal state1MAX；
Condition 3: characteristic harmonic ratio P of secondary loop current2The ratio of the secondary loop current characteristic harmonic wave P which is larger than the allowable secondary loop current characteristic harmonic wave in the normal state2MAX，P2MAXGenerally greater than 0.8;
condition 4: the arc sensor detects arc information and indicates that G is 1.
Defining secondary circuit short circuit fault arc identification logic according to identification conditions:
branch circuit arc identification logic:
when a branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4, the branch is delayed for 10ms to be opened;
when a branch of the secondary circuit simultaneously meets the conditions 1, 2, 3 and 4, the branch is directly tripped and is opened.
Total branch arc identification logic:
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4 or all the branch circuits simultaneously meet the conditions 1, 2 and 4, the main branch is opened in an empty mode after being delayed for 10 ms;
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4 and all the branch circuits are in the branch positions, directly tripping the main branch circuit to be in the open state;
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2, 3 and 4 or all the branch circuits simultaneously meet the conditions 1, 2, 3 and 4, the main branch is directly tripped and is opened.
The above description is only of the preferred embodiments of the present invention, and it should be noted that: it will be apparent to those skilled in the art that various modifications and adaptations can be made without departing from the principles of the invention and these are intended to be within the scope of the invention.

Claims (10)

1. A secondary circuit short-circuit fault arc identification method based on electro-optical information composite criterion is characterized by comprising the following steps:
an arc light sensor and a current acquisition unit are arranged on a main branch of the secondary circuit, and the arc light sensor is arranged on a bus; the arc light sensor and the current acquisition unit are arranged at the head end of each branch cable of the secondary circuit; collecting current information of a secondary circuit of the branch in which the current collecting unit is arranged, and collecting light information of the branch in which the current collecting unit is arranged through an arc light sensor;
determining the characteristic frequency of the secondary circuit short-circuit fault current according to the acquired secondary circuit current information;
calculating a secondary loop short-circuit fault electric arc identification parameter according to the secondary loop current sampling information and the secondary loop short-circuit fault current characteristic frequency;
and establishing a secondary circuit short-circuit fault arc identification logic based on the secondary circuit short-circuit fault arc identification parameters.
2. The method for identifying secondary circuit short-circuit fault arcs based on electro-optical information composite criterion as claimed in claim 1, wherein the determining the characteristic frequency of the secondary circuit short-circuit fault current according to the collected secondary circuit current information comprises:
carrying out Fourier transform on the secondary circuit short-circuit fault current;
sorting harmonic components of the secondary circuit short-circuit fault current based on the secondary circuit short-circuit fault current after Fourier transform;
and determining the characteristic frequency of the secondary circuit short-circuit fault current based on the sorted secondary circuit short-circuit fault current.
3. The method for identifying a secondary circuit short-circuit fault arc based on the electro-optical information composite criterion as claimed in claim 2, wherein the performing Fourier transform on the secondary circuit short-circuit fault current comprises:
Figure FDA0002914074710000011
wherein ix(t) is the secondary circuit short circuit at time tBarrier current, F represents the system sampling frequency, IxjRepresents the effective value of the jth harmonic component of the secondary loop short-circuit fault currentxjThe j harmonic phase value of the secondary loop short-circuit fault current is shown, and t represents time.
4. The method for identifying secondary-loop short-circuit fault arcs based on electro-optical information composite criterion as claimed in claim 3, wherein the step of sorting the harmonic components of the secondary-loop short-circuit fault currents based on the secondary-loop short-circuit fault currents after Fourier transform comprises the steps of:
sorting the harmonic components of the short-circuit fault current of the secondary circuit according to the effective values;
wherein, when the effective values of some two harmonic components are equal, the frequency lower harmonic is arranged in front of the frequency higher harmonic.
5. The method for identifying secondary circuit short-circuit fault arcs based on electro-optical information composite criterion as claimed in claim 3, wherein the determining the characteristic frequency of the secondary circuit short-circuit fault current based on the sorted secondary circuit short-circuit fault currents comprises:
calculating the ratio of harmonic components:
Figure FDA0002914074710000021
wherein, Px(n) represents the ratio of the first n harmonic components to the total harmonic component after the harmonic components of the secondary circuit short-circuit fault current are sorted according to the effective value, and J (k) represents the harmonic times corresponding to the kth harmonic after the harmonic components of the secondary circuit short-circuit fault current are sorted according to the effective value;
when P is presentxAnd (n) is more than or equal to 0.8, the first n harmonics are the characteristic harmonics of the short-circuit fault current of the secondary circuit, and the frequency corresponding to the characteristic harmonics is the characteristic frequency.
6. The method for identifying secondary circuit short-circuit fault arc based on electro-optical information composite criterion according to claim 1, wherein the calculating of the secondary circuit short-circuit fault arc identification parameter according to the secondary circuit current sampling information and the secondary circuit short-circuit fault current characteristic frequency comprises:
calculating the secondary loop current according to the secondary loop current sampling information;
judging the distortion position of the secondary loop current based on the secondary loop current;
calculating a fault arc identification parameter based on the secondary loop current and the characteristic frequency of the secondary loop short-circuit fault current by taking the secondary loop current from the z moment to the z +0.01 moment of the secondary loop current distortion position as a research object; the identification parameters comprise a secondary loop current effective value, a secondary loop current harmonic total proportion and a secondary loop current characteristic harmonic proportion.
7. The method for identifying secondary circuit short-circuit fault arcs based on electro-optical information composite criterion as claimed in claim 6, wherein the calculating of the secondary circuit current according to the secondary circuit current sampling information comprises:
Figure FDA0002914074710000022
Figure FDA0002914074710000023
wherein I (t) is the secondary loop current at time t, IRMSEffective value of secondary loop current, t1Indicating the initial moment of sampling, w0Is the initial phase, i, of the secondary loop currentCtF represents the system sampling frequency, which is the sampled value of the secondary loop current.
8. The method for identifying the secondary circuit short-circuit fault arc based on the electro-optical information composite criterion as claimed in claim 7, wherein the step of judging the distortion position of the secondary circuit current based on the secondary circuit current comprises the following steps:
calculating the current change rate:
Figure FDA0002914074710000031
wherein, YtThe current change rate of two adjacent sampling points at time t,
calculating YtCorresponding maximum value Ymaxt；
Rate of change of current Y at a certain momentzGreater than YmaxtWhen the current is zero, the time z is the suspected distortion position of the secondary loop current, and when the current is Yz+1/FAnd Yz+2/FAre all greater than YmaxtThen, the z time is the distortion position of the secondary loop current.
9. The method for identifying a secondary circuit short-circuit fault arc based on electro-optical information composite criterion as claimed in claim 7, wherein the calculating of the fault arc identification parameters comprises:
effective value I of secondary loop current from z moment to z +0.01 momentRMSZ：
Figure FDA0002914074710000032
Total harmonic ratio P of secondary loop current1：
Figure FDA0002914074710000033
Characteristic harmonic ratio P of secondary loop current2：
Figure FDA0002914074710000041
Wherein, tzDenotes time z, IjRepresents the effective value of the jth harmonic component of the secondary loop current,Ijthe harmonic frequency is obtained by performing Fourier transform on the secondary loop current from the moment z to the moment z +0.01, wherein K represents the number of the characteristic frequencies of the secondary loop short-circuit fault current, and J (K) represents the harmonic frequency corresponding to the kth harmonic after the harmonic components of the secondary loop short-circuit fault current are sorted according to the effective value.
10. The method for identifying secondary circuit short-circuit fault arcs based on electro-optical information composite criterion as claimed in claim 9, wherein the establishing of the secondary circuit short-circuit fault arc identification logic based on the secondary circuit short-circuit fault arc identification parameters comprises:
defining a secondary circuit short-circuit fault arc identification condition:
condition 1: effective value of secondary loop current IRMSZGreater than the maximum effective value I of the secondary loop current allowed in the normal stateMAX；
Condition 2: total harmonic ratio P of secondary loop current1The maximum harmonic total ratio P of the secondary loop current which is larger than the allowable secondary loop current in the normal state1MAX；
Condition 3: characteristic harmonic ratio P of secondary loop current2The ratio of the secondary loop current characteristic harmonic wave P which is larger than the allowable secondary loop current characteristic harmonic wave in the normal state2MAX，P2MAXGenerally greater than 0.8;
condition 4: the arc sensor detects arc information and shows that G is 1;
establishing secondary circuit short circuit fault arc identification logic according to identification conditions:
branch circuit arc identification logic:
when a branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4, the branch is delayed for 10ms to be opened;
when a certain branch of the secondary circuit simultaneously meets the conditions 1, 2, 3 and 4, directly tripping the branch to be opened;
total branch arc identification logic:
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4 or all the branch circuits simultaneously meet the conditions 1, 2 and 4, the main branch is opened in an empty mode after being delayed for 10 ms;
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2 and 4 and all the branch circuits are in the branch positions, directly tripping the main branch circuit to be in the open state;
when the main branch of the secondary circuit simultaneously meets the conditions 1, 2, 3 and 4 or all the branch circuits simultaneously meet the conditions 1, 2, 3 and 4, the main branch is directly tripped and is opened.
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