CN112904138A - IPM reliability test method, device and system and computer storage medium - Google Patents
IPM reliability test method, device and system and computer storage medium Download PDFInfo
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Abstract
The invention discloses an IPM reliability testing method, which comprises the following steps: applying a first preset bias voltage to the IPM to be tested, acquiring a first leakage current of the IPM and judging whether the IPM is invalid or not according to the first leakage current; if the test temperature is effective, setting the test temperature to be a first preset temperature and applying a second preset bias voltage; after the second preset time, the static test environment is recovered to the normal temperature; applying a first preset bias voltage to the IPM to obtain a second leakage current of the IPM; judging whether the IPM is invalid or not based on the second leakage current and the limit leakage current of the IPM; if the test temperature is effective, setting the test temperature to be a second preset temperature and setting the test humidity to be a preset humidity, and applying a third preset bias voltage; after lasting for a third preset time, recovering to a normal-temperature static test environment; after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM to obtain a third leakage current of the IPM; and judging whether the IPM is invalid or not based on the third leakage current and the limit leakage current of the IPM.
Description
Technical Field
The present invention relates to the field of power semiconductors, and in particular, to a method, an apparatus, a system, and a computer storage medium for testing IPM reliability.
Background
An Intelligent Power Module (IPM) is a Power driving product combining Power electronics and integrated circuit technology, integrates a Power switch device and a high-voltage driving circuit, and is widely applied to the fields of industrial control, household appliances and the like.
The intelligent power module can be influenced by severe environment in actual application, particularly high-temperature, high-humidity and high-pressure environment. In order to evaluate the reliability of the intelligent power module, a high-temperature reverse bias experiment and a high-temperature high-humidity reverse bias experiment are performed on the intelligent power module so as to simulate a high-temperature, high-pressure and high-humidity environment encountered by the intelligent power module.
However, the high-temperature reverse bias experiment and the high-temperature high-humidity reverse bias experiment of the intelligent power module are parallel experiments, the two experiments are independent of each other, the experiment environment is single, the experiment environment cannot be close to the complex environment encountered by the intelligent power module, and the reliability of the intelligent power module cannot be effectively evaluated.
Disclosure of Invention
The invention mainly aims to provide an IPM reliability test method, and aims to solve the technical problem that the existing reliability evaluation method of an intelligent power module cannot effectively evaluate the IPM reliability test method.
In order to achieve the above object, the present invention provides an IPM reliability testing method, including: applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment; after lasting for a first preset duration, acquiring a first leakage current of the IPM; determining whether the IPM is failed based on the first leakage current and a limit leakage current of the IPM; if the IPM is valid, setting the testing temperature of the IPM to be a first preset temperature and applying a second preset bias voltage to the IPM; after lasting for a second preset time, restoring the current IPM testing environment to a normal-temperature static testing environment; after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again; after lasting for a first preset duration, acquiring a second leakage current of the IPM; determining whether the IPM is failed based on the second leakage current and a limit leakage current of the IPM; if the IPM is valid, setting the test temperature of the IPM to be a second preset temperature, setting the test humidity to be a preset humidity and applying a third preset bias voltage to the IPM; after lasting for a third preset time, restoring the current IPM testing environment to a normal-temperature static testing environment; after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again; after lasting for a first preset duration, acquiring a third leakage current of the IPM; and judging whether the IPM is invalid or not based on the third leakage current and the limit leakage current of the IPM.
Preferably, the determining whether the IPM is failed based on the first leakage current and a limit leakage current of the IPM comprises: comparing the first leakage current with the limit leakage current; if the first leakage current is greater than the limit leakage current, the IPM is indicated to be invalid; and if the first leakage current is less than or equal to the limit leakage current, the IPM is effective.
Preferably, the determining whether the IPM is failed based on the second leakage current and the limit leakage current of the IPM comprises: comparing the second leakage current with the limit leakage current; if the second leakage current is greater than the limit leakage current, the IPM is indicated to be invalid; and if the second leakage current is less than or equal to the limit leakage current, the IPM is effective.
Preferably, the determining whether the IPM is failed based on the third leakage current and the limit leakage current of the IPM includes: comparing the third leakage current with the limit leakage current; if the third leakage current is greater than the limit leakage current, the IPM is invalid; and if the third leakage current is less than or equal to the limit leakage current, the IPM is effective.
Preferably, the first preset temperature is 125 ℃.
Preferably, the second preset temperature is 85 ℃.
The present invention further provides an IPM reliability testing apparatus, comprising: the first setting module is used for applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment; the first obtaining module is used for obtaining a first leakage current of the IPM after the IPM lasts for a first preset duration; the first judging module is used for judging whether the IPM is invalid or not based on the first leakage current and the limit leakage current of the IPM; the second setting module is used for setting the test temperature of the IPM to be a first preset temperature and applying a second preset bias voltage to the IPM when the IPM is effective; the third setting module is used for recovering the current IPM testing environment to a normal-temperature static testing environment after the IPM is continued for a second preset time; the fourth setting module is used for reapplying the first preset bias voltage to the IPM after the IPM is restored to the normal-temperature static test environment; the second obtaining module is used for obtaining a second leakage current of the IPM after the IPM lasts for a first preset duration; the second judging module is used for judging whether the IPM is invalid or not based on the second leakage current and the limit leakage current of the IPM; the fifth setting module is used for setting the test temperature of the IPM to be a second preset temperature and the test humidity to be preset humidity and applying a third preset bias voltage to the IPM when the IPM is effective; the sixth setting module is used for recovering the current IPM testing environment to a normal-temperature static testing environment after the IPM is continued for a third preset time; the seventh setting module is used for reapplying the first preset bias voltage to the IPM after the IPM is restored to the normal-temperature static test environment; the third obtaining module is used for obtaining a third leakage current of the IPM after the IPM lasts for a first preset duration; and the third judging module is used for judging whether the IPM fails or not based on the third leakage current and the limit leakage current of the IPM.
The invention provides an IPM reliability test system, which comprises:
a memory for storing a computer program;
a processor for implementing the aforementioned IPM reliability testing method when executing the computer program, the IPM reliability testing method comprising at least the following steps;
applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment; after lasting for a first preset duration, acquiring a first leakage current of the IPM; determining whether the IPM is failed based on the first leakage current and a limit leakage current of the IPM; if the IPM is valid, setting the testing temperature of the IPM to be a first preset temperature and applying a second preset bias voltage to the IPM; after lasting for a second preset time, restoring the current IPM testing environment to a normal-temperature static testing environment; after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again; after lasting for a first preset duration, acquiring a second leakage current of the IPM; determining whether the IPM is failed based on the second leakage current and a limit leakage current of the IPM; if the IPM is valid, setting the test temperature of the IPM to be a second preset temperature, setting the test humidity to be a preset humidity and applying a third preset bias voltage to the IPM; after lasting for a third preset time, restoring the current IPM testing environment to a normal-temperature static testing environment; after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again; after lasting for a first preset duration, acquiring a third leakage current of the IPM; and judging whether the IPM is invalid or not based on the third leakage current and the limit leakage current of the IPM.
The present invention further provides a computer storage medium storing a computer program which, when executed by a processor, implements the aforementioned described IPM reliability testing method, the IPM reliability testing method comprising at least the following steps;
applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment; after lasting for a first preset duration, acquiring a first leakage current of the IPM; determining whether the IPM is failed based on the first leakage current and a limit leakage current of the IPM; if the IPM is valid, setting the testing temperature of the IPM to be a first preset temperature and applying a second preset bias voltage to the IPM; after lasting for a second preset time, restoring the current IPM testing environment to a normal-temperature static testing environment; after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again; after lasting for a first preset duration, acquiring a second leakage current of the IPM; determining whether the IPM is failed based on the second leakage current and a limit leakage current of the IPM; if the IPM is valid, setting the test temperature of the IPM to be a second preset temperature, setting the test humidity to be a preset humidity and applying a third preset bias voltage to the IPM; after lasting for a third preset time, restoring the current IPM testing environment to a normal-temperature static testing environment; after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again; after lasting for a first preset duration, acquiring a third leakage current of the IPM; and judging whether the IPM is invalid or not based on the third leakage current and the limit leakage current of the IPM.
Compared with the prior art, the embodiment of the invention has the beneficial technical effects that:
according to the IPM reliability testing method provided by the embodiment of the invention, the complicated environment encountered by the IPM is simulated through a high-temperature reverse bias and high-temperature high-humidity reverse bias serial experiment, and the reliability of the IPM in the complicated environment is verified, so that the reliability of the IPM is effectively evaluated.
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FIG. 1 is a flow chart of the IPM reliability testing method of the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are exemplary and intended to be illustrative of the present invention and should not be construed as limiting the present invention, and all other embodiments that can be obtained by one skilled in the art based on the embodiments of the present invention without inventive efforts shall fall within the scope of protection of the present invention.
Example one
An embodiment of the present invention provides an IPM reliability testing method, which is shown in fig. 1 and includes:
step S10, applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment;
step S20, after lasting for a first preset duration, obtaining a first leakage current of the IPM;
step S30, judging whether the IPM is invalid or not based on the first leakage current and the limit leakage current of the IPM;
in this embodiment, the IPM to be tested is tested in the normal temperature static environment to verify the reliability of the IPM to be tested in the normal temperature static environment, and if the IPM fails in the normal temperature static environment, the IPM does not need to be tested in the high temperature, high humidity and high pressure environment. It should be noted that the reliability of the IPM means whether the IPM fails after being used in different environments, and if the IPM fails, the reliability of the IPM is poor, and if the IPM is still valid, the reliability of the IPM is reliable.
Specifically, the IPM to be tested is placed in a test box, and then the temperature of the test box is adjusted through an experiment program controller, so that the IPM to be tested is in a normal-temperature environment; then, electrifying the IPM to be tested through an electrifying device, and applying a first preset bias voltage to each bridge arm of the IPM to be tested through a bias power supply for a first preset duration after electrifying; and finally, after the first preset bias voltage is continuously applied for a first preset duration, acquiring a first leakage current of the IPM to be detected through a leakage current monitoring device.
It can be understood that each different IPM has its ultimate leakage current, which means the maximum leakage current that the IPM can bear, and whether the IPM fails in the normal-temperature static environment can be determined according to the actual leakage current (the first leakage current) of the IPM to be tested and its ultimate leakage current.
Step S40, if the IPM is valid, setting the testing temperature of the IPM to a first preset temperature and applying a second preset bias voltage to the IPM;
step S50, after lasting for a second preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
step S60, after the static test environment is recovered to the normal temperature, the first preset bias voltage is applied to the IPM again;
step S70, after lasting for a first preset time, obtaining a second leakage current of the IPM;
step S80, based on the second leakage current and the limit leakage current of IPM, judging whether IPM is invalid;
in this embodiment, after the IPM passes the reliability test in the normal temperature static environment, the test environment of the IPM is changed to simulate the high temperature and high pressure environment that the IPM may encounter in practical application, that is: after the IPM passes the test under the normal temperature static environment, the current test environment (normal temperature static environment) of the IPM is adjusted to be the high temperature high pressure environment, after the IPM continues for a second preset time under the high temperature high pressure environment, the IPM is restored to the initial test environment (normal temperature static environment), then the first preset bias voltage is applied to the IPM again, the second leakage current of the IPM is obtained after the IPM continues for the first preset time, and finally whether the IPM is invalid or not is judged based on the actual leakage current (second leakage current) of the IPM and the limit leakage current of the IPM.
Specifically, whether the IPM to be tested passes the reliability test in the normal-temperature static environment or not is judged, and if the IPM passes the reliability test, the temperature in the experiment box is adjusted to be a first preset temperature through the experiment program controller, so that the IPM to be tested is in the high-temperature environment; then, applying a second preset bias voltage to the IPM to be tested through the bias voltage power supply and continuing for a second preset duration; then, after lasting for a second preset duration, acquiring a second leakage current of the IPM to be detected through a leakage current monitoring device; and finally, judging the reliability of the IPM to be detected after encountering a high-temperature and high-pressure environment according to the obtained second leakage current and the limit leakage current of the IPM to be detected, namely judging whether the IPM to be detected is invalid or not.
Step S90, if the IPM is valid, setting the test temperature of the IPM to be a second preset temperature, setting the test humidity to be a preset humidity, and applying a third preset bias voltage to the IPM;
s100, after lasting for a third preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
step S200, after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again;
step S300, after lasting for a first preset time, obtaining a third leakage current of the IPM;
step S400, whether the IPM is invalid or not is judged based on the third leakage current and the limit leakage current of the IPM.
In this embodiment, after the IPM passes the reliability test under the normal temperature static environment and the high temperature and high pressure environment, respectively, the test environment of the IPM is changed again to simulate the high temperature, high humidity, and high pressure environment that the IPM may encounter in practical application, that is: after passing reliability tests in a normal-temperature static environment and a high-temperature high-pressure environment respectively, adjusting the current testing environment (normal-temperature static environment) of the IPM to be a high-temperature, high-pressure and high-humidity environment, recovering the IPM to the initial testing environment (normal-temperature static environment) after the IPM continues in the high-temperature, high-pressure and high-humidity environment for a third preset time, applying a first preset bias voltage to the IPM again, obtaining a third leakage current of the IPM after the IPM continues for the first preset time, and finally judging whether the IPM fails or not based on the actual leakage current (third leakage current) of the IPM and the limit leakage current of the IPM.
Specifically, whether the IPM to be tested passes the reliability test in the normal-temperature static environment high-temperature high-pressure environment or not is judged, and if the IPM passes the reliability test, the temperature in the experiment box is adjusted to be a second preset temperature through the experiment program controller, so that the IPM to be tested is in the high-temperature environment; then, applying a third preset bias voltage to the IPM to be tested through the bias power supply and continuing for a third preset time; then, after lasting for a third preset duration, acquiring a third leakage current of the IPM to be detected through a leakage current monitoring device; and finally, judging the reliability of the IPM to be detected after the IPM to be detected encounters high-temperature, high-pressure and high-humidity environment according to the obtained third leakage current and the limit leakage current of the IPM to be detected, namely judging whether the IPM to be detected fails or not.
Further, step S30 according to the present embodiment of the present invention includes the following steps:
comparing the first leakage current with the limit leakage current;
if the first leakage current is larger than the limit leakage current, the IPM is invalid;
if the first leakage current is less than or equal to the threshold leakage current, the IPM is effective.
Further, step S80 according to the present embodiment of the present invention includes the following steps:
comparing the second leakage current with the limit leakage current;
if the second leakage current is larger than the limit leakage current, the IPM is invalid;
if the second leakage current is less than or equal to the threshold leakage current, the IPM is effective.
Further, step S400 provided in the embodiment of the present invention includes the following steps:
comparing the third leakage current with the limit leakage current;
if the third leakage current is larger than the limit leakage current, the IPM is invalid;
if the third leakage current is less than or equal to the limit leakage current, the IPM is effective.
Based on the IPM reliability testing method proposed in the foregoing embodiment, the present invention further provides an IPM reliability testing apparatus, including:
the first setting module is used for applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment;
the first obtaining module is used for obtaining a first leakage current of the IPM after the IPM lasts for a first preset duration;
the first judgment module is used for judging whether the IPM is invalid or not based on the first leakage current and the limit leakage current of the IPM;
the second setting module is used for setting the test temperature of the IPM to be a first preset temperature and applying a second preset bias voltage to the IPM when the IPM is effective;
the third setting module is used for recovering the current IPM testing environment to a normal-temperature static testing environment after the IPM is continued for a second preset time;
the fourth setting module is used for reapplying the first preset bias voltage to the IPM after the IPM is restored to the normal-temperature static test environment;
the second obtaining module is used for obtaining a second leakage current of the IPM after the IPM lasts for the first preset duration;
the second judgment module is used for judging whether the IPM is invalid or not based on the second leakage current and the limit leakage current of the IPM;
the fifth setting module is used for setting the test temperature of the IPM to be a second preset temperature and the test humidity to be preset humidity and applying a third preset bias voltage to the IPM when the IPM is effective;
the sixth setting module is used for recovering the current IPM testing environment to a normal-temperature static testing environment after the IPM is continued for a third preset time;
the seventh setting module is used for reapplying the first preset bias voltage to the IPM after the IPM is restored to the normal-temperature static test environment;
the third obtaining module is used for obtaining a third leakage current of the IPM after the IPM lasts for the first preset duration;
and the third judging module is used for judging whether the IPM is invalid or not based on the third leakage current and the limit leakage current of the IPM.
Based on the IPM reliability testing method proposed by the foregoing embodiment, the present invention further provides an IPM reliability testing system, including:
a memory for storing a computer program;
a processor, configured to implement the IPM reliability testing method according to the foregoing embodiment when executing the computer program, wherein the IPM reliability testing method at least includes the following steps:
step S10, applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment;
step S20, after lasting for a first preset duration, obtaining a first leakage current of the IPM;
step S30, judging whether the IPM is invalid or not based on the first leakage current and the limit leakage current of the IPM; .
Step S40, if the IPM is valid, setting the testing temperature of the IPM to a first preset temperature and applying a second preset bias voltage to the IPM;
step S50, after lasting for a second preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
step S60, after the static test environment is recovered to the normal temperature, the first preset bias voltage is applied to the IPM again;
step S70, after lasting for a first preset time, obtaining a second leakage current of the IPM;
step S80, based on the second leakage current and the limit leakage current of IPM, judging whether IPM is invalid;
step S90, if the IPM is valid, setting the test temperature of the IPM to be a second preset temperature, setting the test humidity to be a preset humidity, and applying a third preset bias voltage to the IPM;
s100, after lasting for a third preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
step S200, after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again;
step S300, after lasting for a first preset time, obtaining a third leakage current of the IPM;
step S400, whether the IPM is invalid or not is judged based on the third leakage current and the limit leakage current of the IPM.
Based on the IPM reliability testing method proposed by the foregoing embodiment, the present invention further proposes a computer storage medium, in which a computer program is stored, and when the computer program is executed by a processor, the IPM reliability testing method described in the foregoing embodiment is implemented, where the IPM reliability testing method at least includes the following steps:
step S10, applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment;
step S20, after lasting for a first preset duration, obtaining a first leakage current of the IPM;
step S30, judging whether the IPM is invalid or not based on the first leakage current and the limit leakage current of the IPM; .
Step S40, if the IPM is valid, setting the testing temperature of the IPM to a first preset temperature and applying a second preset bias voltage to the IPM;
step S50, after lasting for a second preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
step S60, after the static test environment is recovered to the normal temperature, the first preset bias voltage is applied to the IPM again;
step S70, after lasting for a first preset time, obtaining a second leakage current of the IPM;
step S80, based on the second leakage current and the limit leakage current of IPM, judging whether IPM is invalid;
step S90, if the IPM is valid, setting the test temperature of the IPM to be a second preset temperature, setting the test humidity to be a preset humidity, and applying a third preset bias voltage to the IPM;
s100, after lasting for a third preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
step S200, after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again;
step S300, after lasting for a first preset time, obtaining a third leakage current of the IPM;
step S400, whether the IPM is invalid or not is judged based on the third leakage current and the limit leakage current of the IPM.
In the several embodiments provided in the present application, it should be understood that the disclosed method and apparatus may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the modules is only one logical division, and other divisions may be realized in practice, for example, a plurality of modules or components may be combined or integrated into another apparatus, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or modules, and may be in an electrical, mechanical or other form.
The modules described as separate parts may or may not be physically separate, and parts displayed as modules may or may not be physical modules, may be located in one place, or may be distributed on a plurality of network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment.
In addition, functional modules in the embodiments of the present invention may be integrated into one processing module, or each of the modules may exist alone physically, or two or more modules are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode.
The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
The above is only a part or preferred embodiment of the present invention, and neither the text nor the drawings should limit the scope of the present invention, and all equivalent structural changes made by the present specification and the contents of the drawings or the related technical fields directly/indirectly using the present specification and the drawings are included in the scope of the present invention.
Claims (9)
1. An IPM reliability testing method, comprising:
applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment;
after lasting for a first preset duration, acquiring a first leakage current of the IPM;
determining whether the IPM is failed based on the first leakage current and a limit leakage current of the IPM;
if the IPM is valid, setting the testing temperature of the IPM to be a first preset temperature and applying a second preset bias voltage to the IPM;
after lasting for a second preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again;
after lasting for a first preset duration, acquiring a second leakage current of the IPM;
determining whether the IPM is failed based on the second leakage current and a limit leakage current of the IPM;
if the IPM is valid, setting the test temperature of the IPM to be a second preset temperature, setting the test humidity to be a preset humidity and applying a third preset bias voltage to the IPM;
after lasting for a third preset time, restoring the current IPM testing environment to a normal-temperature static testing environment;
after the static test environment at the normal temperature is recovered, applying a first preset bias voltage to the IPM again;
after lasting for a first preset duration, acquiring a third leakage current of the IPM;
and judging whether the IPM is invalid or not based on the third leakage current and the limit leakage current of the IPM.
2. The IPM reliability testing method of claim 1, wherein the determining whether the IPM is failed based on the first leakage current and a limit leakage current of the IPM comprises:
comparing the first leakage current with the limit leakage current;
if the first leakage current is greater than the limit leakage current, the IPM is indicated to be invalid;
and if the first leakage current is less than or equal to the limit leakage current, the IPM is effective.
3. The IPM reliability testing method of claim 1, wherein the determining whether the IPM is failed based on the second leakage current and a limit leakage current of the IPM comprises:
comparing the second leakage current with the limit leakage current;
if the second leakage current is greater than the limit leakage current, the IPM is indicated to be invalid;
and if the second leakage current is less than or equal to the limit leakage current, the IPM is effective.
4. The IPM reliability testing method of claim 1, wherein the determining whether the IPM is failed based on a third leakage current and a limit leakage current of the IPM comprises:
comparing the third leakage current with the limit leakage current;
if the third leakage current is greater than the limit leakage current, the IPM is invalid;
and if the third leakage current is less than or equal to the limit leakage current, the IPM is effective.
5. The IPM reliability testing method of claim 1, wherein the first predetermined temperature is 125 ℃.
6. The IPM reliability testing method of claim 1, wherein the second predetermined temperature is 85 ℃.
7. An IPM reliability testing apparatus, comprising:
the first setting module is used for applying a first preset bias voltage to the IPM to be tested in a normal-temperature static test environment;
the first obtaining module is used for obtaining a first leakage current of the IPM after the IPM lasts for a first preset duration;
the first judging module is used for judging whether the IPM is invalid or not based on the first leakage current and the limit leakage current of the IPM;
the second setting module is used for setting the test temperature of the IPM to be a first preset temperature and applying a second preset bias voltage to the IPM when the IPM is effective;
the third setting module is used for recovering the current IPM testing environment to a normal-temperature static testing environment after the IPM is continued for a second preset time;
the fourth setting module is used for reapplying the first preset bias voltage to the IPM after the IPM is restored to the normal-temperature static test environment;
the second obtaining module is used for obtaining a second leakage current of the IPM after the IPM lasts for a first preset duration;
the second judging module is used for judging whether the IPM is invalid or not based on the second leakage current and the limit leakage current of the IPM;
the fifth setting module is used for setting the test temperature of the IPM to be a second preset temperature and the test humidity to be preset humidity and applying a third preset bias voltage to the IPM when the IPM is effective;
the sixth setting module is used for recovering the current IPM testing environment to a normal-temperature static testing environment after the IPM is continued for a third preset time;
the seventh setting module is used for reapplying the first preset bias voltage to the IPM after the IPM is restored to the normal-temperature static test environment;
the third obtaining module is used for obtaining a third leakage current of the IPM after the IPM lasts for a first preset duration;
and the third judging module is used for judging whether the IPM fails or not based on the third leakage current and the limit leakage current of the IPM.
8. An IPM reliability test system, comprising:
a memory for storing a computer program;
a processor for implementing the IPM reliability testing method of any one of claims 1 to 6 when executing said computer program.
9. A computer storage medium storing a computer program which, when executed by a processor, implements the IPM reliability testing method of any one of claims 1 to 6.
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