CN112880587B - Online measurement method for assembly deviation of thin plate - Google Patents
Online measurement method for assembly deviation of thin plate Download PDFInfo
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- CN112880587B CN112880587B CN202110041026.0A CN202110041026A CN112880587B CN 112880587 B CN112880587 B CN 112880587B CN 202110041026 A CN202110041026 A CN 202110041026A CN 112880587 B CN112880587 B CN 112880587B
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- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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Abstract
The invention relates to an on-line measurement method for assembly deviation of a thin plate, wherein a measurement platform based on Fourier transform profilometry is arranged above an assembly platform, and a reference surface is placed and adjusted to be horizontal; adjusting the camera and projector to positions that satisfy the principles of Fourier transform profilometry according to the desired camera field of view; calibrating a shooting calibration plate; shooting reference surface stripes; placing a standard component, and shooting the standard component for phase and height system calibration; taking down the reference surface and the standard part, and shooting stripes before and after the thin plate is assembled; and solving the contour data of the thin plate before and after assembly to obtain the assembly deviation of the thin plate, thereby realizing the online measurement of the assembly deviation of the thin plate. The measuring system has the advantages of simple method, low cost and wide application.
Description
Technical Field
The invention relates to the technical field of optical measurement, in particular to an online measurement method for assembly deviation of a thin plate.
Background
In recent years, with the development of scientific technology and the improvement of industrial level, different industries mainly including processing, manufacturing and assembling, such as die manufacturing, automobiles, ships, aerospace and the like, have increasingly high requirements on large-size and high-precision three-dimensional outline measurement technology and on-line measurement and assembly error technology.
The vision measurement system based on the machine vision theory has the advantages of non-contact, low cost, high efficiency, high automation degree, high measurement precision and the like, is widely applied to the measurement of the size and assembly deviation of thin plate parts, and the Fourier transform profilometry can rapidly reconstruct the three-dimensional profile of an object by using fewer collected pictures. The traditional vision measuring system designed by utilizing the principle of Fourier transform profilometry comprises an optical pen type vision measuring system, a mechanism light scanning measuring system based on a three-coordinate measuring machine and a 3D scanner, wherein the optical pen type vision measuring system and the mechanism light scanning measuring system can only carry out point measurement, the measuring efficiency is low, the price of the 3D scanner is high, and therefore, how to use simple equipment to complete the online measurement of the sheet assembly deviation is short of the measuring method of the system.
Disclosure of Invention
The invention provides an on-line measurement method for assembly deviation of a thin plate, which is based on the principle of Fourier transform profilometry, is used for completing measurement by using simple equipment such as a camera, a projector and the like, and is convenient to use and low in cost.
The technical scheme adopted by the invention is as follows:
s1: mounting a measuring platform based on Fourier transform profilometry above the assembling platform, and mounting a camera and a projector on the measuring platform;
s2: fixing the reference surface at the assembling position of the assembling platform through a positioning clamp, and adjusting the reference surface to be horizontal;
s3: adjusting the positions of the camera and the projector according to the camera view field required by assembling the thin plate, and setting a proper projection fringe period of the projector;
s4: adjusting the camera and projector to a position that satisfies the principle of fourier transform profilometry;
s5: placing a calibration plate on the reference surface, and shooting the calibration plate for calibration;
s6: taking down the calibration plate, and collecting stripe photos before and after the phase shift of the reference surface pi as a reference standard for subsequently solving the phase difference of the thin plate;
s7: placing a standard part on a reference surface, and collecting stripe photos of the standard part before and after pi phase shift; establishing and solving a relation general formula of the phase difference and the height of the measured object relative to the reference surface;
s8: taking down the standard part and the reference surface, fixing the thin plate to be tested at a determined position of the assembly platform through the positioning fixture, and then acquiring stripe photos before and after pi phase shift of the thin plate before assembly to obtain the phase difference of the thin plate before assembly relative to the reference surface;
s9: assembling the thin plate fixed in the S8, partially removing the connection between the thin plate and the positioning clamp, ensuring the deterministic positioning of the thin plate, avoiding over-positioning, and then collecting stripe photos before and after the pi phase shift of the assembled thin plate to obtain the phase difference of the assembled thin plate relative to a reference surface;
s10: the profile data before and after the thin plate assembly is obtained from the phase difference in S8 and S9 by using the general relation of the phase difference and the height in S7, and the assembly deviation of the thin plate is obtained by solving.
The further technical scheme is as follows:
in S4, the camera and the projector are adjusted to satisfy three constraints of fourier transform profilometry: the camera optical axis MO is vertical to the reference surface, the connecting line of the camera optical axis M and the projector optical axis N is parallel to the reference surface, and the camera optical axis MO and the projector optical axis NO intersect at one point on the reference surface.
In the step S7, the standard part adopts at least two standard quadrangular prisms with different heights; shooting stripe photos of the at least two standard quadrangular prisms before and after pi phase shift to obtain the phase difference of the at least two standard quadrangular prisms;
height h (x, y) of object surface and phase difference of object surface
The mapping relationship between the two is as follows:
wherein 1 is the distance from the connection line of the camera optical center M and the projector optical center N to the reference surface, d is the distance from the camera optical center M to the projector optical center N, f0Is the grating spatial frequency; two parameters C are introduced1(x，y)、C2(x, y), write the formula:
substituting the phase difference of the at least two standard quadrangular prisms obtained according to the acquired fringe photos into an equation (2), so as to obtain a relational equation of the height and the phase difference:
in the step S2, the positioning fixture is a supporting angle iron, the top end of the positioning fixture is provided with a through hole for fastening, and the bottom end of the positioning fixture is fixed on the assembly platform; and fixing the reference surface at the sheet assembling position on the assembling platform by using the supporting angle iron, and adjusting the reference surface to be horizontal by using a supporting column arranged on the assembling platform.
In the step S8, the standard part and the reference surface are taken down, at least two thin plates which need to be assembled into a whole are fixedly connected to the corresponding supporting angle iron respectively by using a fastening piece, and striped pictures before and after pi phase shift are taken before and after the thin plates are assembled, so that the phase difference of the thin plates before assembly relative to the reference surface is obtained;
in the step S9, the two thin plates are fastened to each other, a part of the fastening members are released on the premise of ensuring the deterministic positioning, the supporting columns supported at the bottoms of the thin plates are taken down, the released assembly body is obtained, and then, the stripe photographs before and after the pi phase shift of the assembled thin plate assembly body are collected.
In S10, the phase difference between the sheet before and after assembly is substituted into the general relation between the phase difference and the height, to obtain the profile data of the sheet before and after assembly, i.e. the three-dimensional point cloud data of the surface of the sheet before and after assembly, and the height values corresponding to the sheet before and after assembly are subtracted to obtain the sheet assembly deviation.
And in the step S8, the thin plate is fixed on the positioning fixture, the horizontal position of the thin plate is consistent with that of the reference surface in the step S7, and the phase continuity between the reference surface and the measured thin plate in a certain range is realized.
In S5, the calibration board with the checkerboard is placed on the reference surface, a plurality of calibration pictures at different positions are taken, and the calibration is completed using software.
The invention has the following beneficial effects:
the method for measuring the assembly deviation of the thin plate part on line is based on the principle of Fourier transform profilometry, combines a pi phase shift method with the Fourier transform profilometry, and reduces the influence of background light on a shooting site.
The invention adopts the deformed stripes of the thin plate before and after assembly to obtain the point cloud data of the outline of the thin plate, thereby realizing the visualization of the assembly deviation result.
The invention uses simple equipment such as a camera, a projector and the like to complete measurement, the adopted measurement method has the advantages of easy hardware construction, less pictures to be taken, convenient use, low cost, quick recovery time of the sheet profile and improved measurement efficiency.
The invention skillfully solves the problems of assembly interference and phase continuity of Fourier transform profilometry by placing, shooting and taking down the reference surface.
Drawings
FIG. 1 is a schematic structural diagram of an online measurement platform for sheet assembly deviation according to the present invention.
FIG. 2 is a schematic diagram of a reference plane adjustment state according to the present invention.
FIG. 3 is a schematic diagram of the principle of fringe projection three-dimensional measurement of the height of the object surface according to the present invention.
FIG. 4 is a schematic structural diagram of a chessboard pattern calibration board shooting status according to the invention.
FIG. 5 is a schematic diagram of a standard quadrangular prism according to the present invention.
Fig. 6 is a schematic structural view of a photographed state after the first and second thin plates are placed.
Fig. 7 is a structural view illustrating a photographed state after the first thin plate and the second thin plate are released from the assembly according to the present invention.
FIG. 8 is a flow chart of the measurement method of the present invention.
In the figure: 1. a measuring platform; 2. a camera; 3. a projector; 4. assembling a platform; 5. supporting angle iron; 6. a support pillar; 7. a reference surface; 8. calibrating the plate; 10. a standard quadrangular prism with a height of 45 mm; 11. a standard quadrangular prism with a height of 25 mm; 12. a first thin plate; 13. a second thin plate; p1, first position; p2, second position; p3, third position; p4, fourth position; 14. and (7) assembling holes.
Detailed Description
The following describes embodiments of the present invention with reference to the drawings.
As shown in fig. 8, the method for measuring the assembling deviation of the thin plate member in the embodiment comprises the following steps:
s1: as shown in fig. 1, a measuring platform 1 based on fourier transform profilometry is built, a camera 2 and a projector 3 are preliminarily installed to be approximately in accordance with the constraint principle of fourier transform profilometry, and the measuring assembly 1 is placed at a proper position above an assembly platform 4 according to the positions of four supporting angle irons 5 for fixing and positioning for determining the position of a thin plate and supporting columns 6 with adjustable height on the assembly platform 4, so that the space of assembly work is in the camera view field;
s2: after the measuring platform 1 is preliminarily built, as shown in fig. 2, the reference surface 7 is placed at an assembly position, the support column 6 is adjusted to enable the reference surface 7 to be in a horizontal position, and the horizontal position is measured by using a level;
specifically, the assembly platform 4 is provided with a corresponding mounting hole, the bottom of the adjusting support column 6 is inserted into the mounting hole, and the height can be adjusted through threaded fit.
S3: the smaller the field of view of the camera is, the higher the measurement accuracy is, so that the field of view of the camera is as small as possible under the condition that a target area for assembling the thin plate can be shot, the camera is adjusted according to the principle, the positions of the projector 3 and the camera 2 at almost the same height are adjusted, sine stripes before and after pi phase shift are projected, and a proper stripe period is selected;
s4: as shown in fig. 3, a schematic diagram of the principle of fringe projection three-dimensional measurement of the height of the object surface is shown, where M, N is the optical centers of the camera 2 and the projector 3, respectively, and after the reference surface 7 is adjusted to be horizontal, the measurement platform 1, the camera 2, and the projector 3 are adjusted so that the camera 2 and the projector 3 satisfy three constraints of fourier transform profilometry: the optical axis of the camera is vertical to the reference surface 7, namely MO ^ OC; the connecting line of the camera optical center M and the projector optical center N is parallel to the reference surface 7, namely MN/OC, and the connecting line of the camera optical axis and the projector optical axis is compared with one point on the reference surface, namely MO is crossed with NO at the point O on the reference surface;
s5: as shown in fig. 4, a calibration plate 8 with a checkerboard is placed on the adjusted reference surface 7, a group of multiple calibration pictures at different positions are taken, and calibration is completed by using software;
s6: taking down the calibration plate, and shooting stripe photos of the reference surface 7 before and after the pi phase shift as a benchmark for thin plate contour recovery;
s7: as shown in FIG. 5, a standard quadrangular prism 11 with a height of 25mm and a standard quadrangular prism 10 with a height of 45mm are placed on an adjusted reference surface 7, striped photographs before and after pi phase shift of the two quadrangular prisms are taken, the phases are expanded to obtain the phase difference of the two standard quadrangular prisms, the average value of a region of the upper surface of the quadrangular prism is selected as the height phase difference of the upper surface of the quadrangular prism, and the upper surface phase difference of the standard quadrangular prism 11 with a height of 25mm is obtained by calculation
And a phase difference of the upper surface of the standard quadrangular prism 10 having a height of 45mm
Fig. 3 is a schematic diagram of a principle of projecting the height of the surface of a three-dimensional measurement object by using stripes, wherein 1 is the distance from the connecting line of a camera optical center M and a projector optical center N to a reference surface 7, and d is the distance from the camera optical center M to the projector optical center N; the phase difference between A, C on the reference plane 7 is recorded as
The height of the measured object is recorded as h (x, y), and the phase difference between the surface height h (x, y) of the object and the surface of the object can be obtained according to the triangle similarity relation delta ACH-delta MNH and by combining the fundamental frequency formula of the reference grating
The mapping relationship between the two is as follows:
in the formula (1), f0Is the grating spatial frequency;
two parameters C are introduced1(x，y)、C2(x, y), then in equation (1) can be written as:
then two groups of phase difference data obtained by the two standard quadrangular prisms obtained by the experiment before and after the pi phase shift are substituted into a formula (2) to obtain an equation set, and C is obtained by solving1(x，y)＝0.008736，C2(x, y) 0.376653, and system parameters l, f0And d, obtaining a relation formula of height and phase:
s8: and (3) removing the standard quadrangular prism and the reference surface 7, as shown in fig. 6, fixedly mounting the bottom of the supporting angle iron 5 on the assembling platform 4, and arranging a through hole for fastening at the top of the supporting angle iron 5, wherein the through hole is shown as a first position P1, a first position P2, a first position P3 and a first position P4 in the figure. When the sheet is placed on the support angle 5, it is locked to the support angle 5 by means of bolts, nuts and washers of the same thickness as the reference plane 7.
Specifically, four supporting angle irons 5 distributed at four corners are installed, a first thin plate 12 to be assembled is deterministically positioned (cannot move and rotate after being locked) at two supporting angle irons 5 at one side, namely a first position P1 and a second position P2, a second thin plate 13 is deterministically positioned (cannot move and rotate after being locked) at two supporting angle irons at the other side, namely a third position P3 and a fourth position P4, for better assembly, the first thin plate 12 and the second thin plate 13 respectively have a corresponding assembly area, the placement position of the first thin plate 12 is 2mm higher than that of the second thin plate 13, each assembly area is respectively provided with a corresponding 5 assembly holes 14, and deformation stripe pictures before and after pi phase shift of the thin plates before and after pi phase shift are taken to obtain the phase difference of the thin plates before assembly relative to a reference plane:
specifically, the reference surface 7 is 5mm, and the gasket is arranged in the through holes in the first position P1, the first position P2, the first position P3 and the first position P4 of the supporting angle iron 5, so that the height of the whole fixed and positioned thin plate is higher than 5mm of the upper surface of the supporting angle iron 5, and the interference of the supporting angle iron 5 is prevented. Meanwhile, the thin plate is ensured to be approximately at the position of the reference surface 7, and the phase continuity between the reference surface 7 and the measured thin plate in a certain range is realized.
S9: after the positioning of the thin plates is completed, the two thin plates are locked and connected through the assembly holes 14 of the assembly area, then the fasteners (bolt and nut) at the second position P2 and the third position P3 are released, and the adjusting support column 6 is removed, so that only the fasteners at the first position P1 and the fourth position P4 are reserved. Since the first position P1 and the fourth position P4 already limit the 6 degrees of freedom of the sheet, i.e. the mounting body does not rotate and move, both a deterministic positioning is achieved and an over-positioning is avoided.
Due to the assembly stress, the assembly body after being released has a certain rebound deformation compared with that before being released, and deformation stripe photos before and after pi phase shift of the assembly body after being released are shot to obtain the phase difference of the assembled thin plate relative to the reference surface 7;
s10: and (3) obtaining the phase difference between the front and the back of the unfolded thin plate assembly by taking the reference surface 7 as a reference through S8 and S9, solving the contour point cloud data of the front and the back of the thin plate assembly through a relational expression of the height and the phase in S7, and subtracting the corresponding height values of the front and the back of the assembly to obtain the assembly deviation of the thin plate.
Claims (8)
1. An online measurement method for the assembly deviation of a thin plate part is characterized by comprising the following steps:
s1: mounting a Fourier transform profilometry-based measuring platform (1) above a mounting platform (4), and mounting a camera (2) and a projector (3) on the measuring platform (1);
s2: fixing the reference surface (7) at the assembling position of the assembling platform (4) through a positioning clamp, and adjusting the reference surface (7) to be horizontal;
s3: adjusting the positions of the camera (2) and the projector (3) according to the camera view field required by assembling the thin plate, and setting a proper projection fringe period of the projector (3);
s4: adjusting the camera (2) and the projector (3) to positions that satisfy the principle of fourier transform profilometry;
s5: placing a calibration plate (8) on the reference surface (7), and shooting the calibration plate (8) for calibration;
s6: taking down the calibration plate (8), and collecting stripe photos before and after pi phase shift of the reference surface (7) as a reference standard for subsequently solving the phase difference of the thin plate;
s7: placing a standard part on the reference surface (7), and collecting stripe photos of the standard part before and after pi phase shift; establishing and solving a relation general formula of the phase difference and the height of the measured object relative to the reference surface (7);
s8: taking down the standard part and the reference surface (7), fixing the thin plate to be tested at a determined position of the assembly platform (4) through the positioning fixture, and then acquiring stripe photos before and after pi phase shift of the thin plate before assembly to obtain a phase difference of the thin plate before assembly relative to the reference surface (7);
s9: assembling the thin plate fixed in the S8, partially removing the connection between the thin plate and the positioning clamp to ensure the deterministic positioning of the thin plate, and then collecting stripe photos before and after the phase shift of the assembled thin plate to obtain the phase difference of the assembled thin plate relative to a reference surface (7);
s10: the profile data before and after the sheet assembly is obtained from the phase difference obtained in S8 and S9 by using the general expression of the relationship between the phase difference and the height in S7, and the assembly deviation of the sheet is obtained by solving.
2. The thin plate member assembling deviation on-line measuring method as set forth in claim 1, wherein in S4, the adjusting camera (2) and the projector (3) satisfy three constraints of fourier transform profilometry: the camera optical axis MO is vertical to the reference surface (7), the connecting line of the camera optical axis M and the projector optical axis N is parallel to the reference surface (7), and the camera optical axis MO and the projector optical axis NO intersect at one point on the reference surface (7).
3. An on-line measurement method of assembly deviation of thin plate members as claimed in claim 2, wherein in said S7, said standard member is at least two standard quadrangular prisms having different heights; shooting stripe photos of the at least two standard quadrangular prisms before and after pi phase shift to obtain the phase difference of the at least two standard quadrangular prisms; establishing a phase difference between the height h (x, y) of the object surface and the object surface
The mapping relationship between the two is as follows:
in the formula (1), 1 is the distance from the connecting line of the camera optical center M and the projector optical center N to the reference surface (7), d is the distance from the camera optical center M to the projector optical center N, f0Is the grating spatial frequency; two parameters C are introduced1(x，y)、C2(x, y), writing equation (1) as:
substituting the phase difference of the at least two standard quadrangular prisms into the formula (2) to obtain a relation formula of height and phase difference:
4. the thin plate member assembling deviation on-line measuring method of claim 3, wherein in said S2, said positioning jig is a supporting angle bar (5) having a through hole for fastening at its top end and a bottom end fixed on said assembling platform (4); and fixing the reference surface (7) at a thin plate assembling position on the assembling platform (4) by using the supporting angle iron (5), and adjusting the reference surface (7) to be horizontal through a supporting column (6) arranged on the assembling platform (4).
5. The thin plate member assembling deviation on-line measuring method according to claim 4, wherein in S8, the standard member and the reference surface (7) are removed, at least two thin plates to be assembled into a whole are fixedly connected to the corresponding supporting angle iron (5) by fasteners respectively, and the phase difference of the thin plates before assembling relative to the reference surface (7) is obtained by taking the streak photographs before and after pi phase shift;
in the step S9, the two thin plates are fastened and connected with each other, part of the fastening pieces are released on the premise of ensuring the deterministic positioning, meanwhile, the supporting columns (6) supported at the bottoms of the thin plates are taken down to obtain a released assembly body, and then stripe photos before and after the pi phase shift of the assembled thin plate assembly body are collected.
6. The method of claim 5, wherein in step S10, the relation between the phase difference and the height is substituted by the phase difference before and after assembling the thin plate, so as to obtain the profile data of the thin plate before and after assembling, i.e. the three-dimensional point cloud data of the surface of the thin plate before and after assembling, and the height values before and after assembling are subtracted to obtain the assembling deviation of the thin plate.
7. The method for on-line measurement of the assembling deviation of the thin plate member as claimed in claim 1, wherein in the step S8, the thin plate is fixed on the positioning jig, so as to ensure that the horizontal position of the thin plate is consistent with the horizontal position of the reference surface (7) in the step S7, and the reference surface (7) and the thin plate to be measured are in phase continuity within a certain range.
8. The method for on-line measurement of assembly deviation of thin plate member as claimed in claim 1, wherein in said S5, said calibration plate (8) with checkerboard is placed on said reference surface (7), a plurality of calibration photographs are taken at a set of different positions, and calibration is performed using software.
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