CN112800627A - Method and device for analyzing light incidence of direct light of cultivation layer in three-dimensional cultivation mode - Google Patents
Method and device for analyzing light incidence of direct light of cultivation layer in three-dimensional cultivation mode Download PDFInfo
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Abstract
The invention provides a method and a device for analyzing the light incidence of direct light of a cultivation layer in a three-dimensional cultivation mode. Wherein, the method comprises the following steps: acquiring target parameters corresponding to the cultivation layer; inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer respectively to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time; and obtaining the information of the change of the light entering rate of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle. By adopting the method for analyzing the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode, the operation is more convenient, the cost is lower, no external sensor equipment is required to be installed, and the calculation efficiency and the practicability of the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode of the existing greenhouse can be effectively improved.
Description
Technical Field
The invention relates to the technical field of artificial intelligence, in particular to a method and a device for analyzing the light incidence rate of direct light of a cultivation layer in a three-dimensional cultivation mode. In addition, an electronic device and a non-transitory computer readable storage medium are also related.
Background
The greenhouse is a farming mode for continuously producing plants all the year round by utilizing sunlight (or auxiliary artificial supplementary lighting) and nutrient solution cultivation technology in a semi-closed greenhouse environment. The crop luminous environment mainly comes from sunlight, so the operation cost is low. However, the greenhouse light environment is easily restricted by external sunlight and shading of building structures, so that annual production is unstable, and the yield of the greenhouse light environment is far lower than that of an artificial light type plant factory which carries out high-density cultivation in a multi-layer three-dimensional cultivation mode. The three-dimensional cultivation technique is also called a vertical cultivation technique, and is a layered cultivation method in which a vertical gradient is spatially performed through a cultivation rack or a cultivation duct. The three-dimensional cultivation mode can utilize the internal space of the facility to the maximum extent, and improve the utilization rate of the land and the yield of unit area. In artificial light plant factories, three-dimensional cultivation is mainly used because the plants are not influenced by the external light environment and the light shielding of building structures. In a greenhouse, a single-layer cultivation mode is adopted mostly, and three-dimensional cultivation research is less. Therefore, the problem that the single-layer cultivation space utilization rate of the greenhouse is low and the illumination intensity of the lower layer of the three-dimensional cultivation is weak is solved by combining natural light and artificial supplementary lighting, analyzing the distribution characteristics of natural light at the lower layer of the three-dimensional cultivation frame of the greenhouse, and performing difference supplementary lighting on the lower-layer cultivated crops.
At present, solar radiation sensors are mainly arranged at multiple points in the lower-layer light environment of a three-dimensional cultivation frame in a greenhouse, solar radiation values of all points are obtained through monitoring, and finally the ratio of the average value of all the points to the solar radiation value of an upper cultivation layer is taken to obtain the light inlet rate. However, in the actual greenhouse production, the space between the cultivation shelves and the space between the rows are adjusted according to the crops to be planted, and the direct solar radiation also changes from time to time, so that it is not practical to obtain the light inlet rate by actually measuring the value of the solar radiation. After solar radiation irradiates the cultivation frames, the light environment of the lower cultivation layer is shielded by the upper cultivation layer and the cultivation frames on the two sides. The sun ray angle is constantly changed in one day, and the shadow area of the lower cultivation layer also dynamically changes along with time. Therefore, how to design a direct light incidence rate analysis scheme of the cultivation layer in the three-dimensional cultivation mode becomes an important subject of research in the field.
Disclosure of Invention
Therefore, the invention provides a method and a device for analyzing the light incidence of direct light of a cultivation layer in a three-dimensional cultivation mode, and aims to solve the problems that the light incidence analysis scheme of the cultivation layer in the three-dimensional cultivation mode of the greenhouse in the prior art is high in limitation and poor in analysis efficiency and practicability.
The invention provides a method for analyzing the light incidence rate of direct light of a cultivation layer under a three-dimensional cultivation mode, which comprises the following steps:
acquiring target parameters corresponding to the cultivation layer;
inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer respectively to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time;
and obtaining the information of the change of the light entering rate of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
Further, the method for analyzing the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode further comprises the following steps: before acquiring target parameters corresponding to the cultivation layers, determining the light incoming rate of the cultivation layers in the three-dimensional cultivation mode as the product of the light incoming rate in the east-west direction and the light incoming rate in the north-south direction in advance.
Further, the target parameters include: the width of cultivation layer, the length of cultivation layer and at least one of the interval of cultivation layer, the height of cultivation groove, the interval and the solar altitude angle of east-west to cultivation frame.
Further, the formula for calculating the light inlet rate of the cultivation layer is as follows:
ψ(ω)＝ψns(ω)×ψew(ω)
ω＝15(t-12)
in the formula: psi is the light incidence rate of the cultivation layer, psinsIs the incident light rate of east-west, psinsThe south-north light incidence rate is, omega is a time angle, t is a target time period or a sight solar time, and the value range of t is determined according to the rising time and the falling time of the local sun.
Further, the algorithm formula corresponding to the north-south direction instantaneous light incidence model is as follows:
in the formula: w is the width of the cultivation layer, L is the length of the cultivation layer, H is the upper and lower spacing of the cultivation layer, alpha is the solar altitude angle, delta is the declination angle,
and n is the geographical latitude of the greenhouse, and is the target time period.
Correspondingly, the invention also provides a device for analyzing the direct light incidence rate of the cultivation layer in the three-dimensional cultivation mode, which comprises:
the target parameter acquisition unit is used for acquiring target parameters corresponding to the cultivation layer;
the model analysis unit is used for respectively inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time;
and the light incidence analysis unit is used for obtaining the information of the change of the light incidence of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
Further, the device for analyzing the incidence of direct light of the cultivation layer in the three-dimensional cultivation mode further comprises: and the light incidence determining unit is used for determining the light incidence of the cultivation layer in the three-dimensional cultivation mode as the product of the light incidence in the east-west direction and the light incidence in the north-south direction in advance before acquiring the target parameters corresponding to the cultivation layer.
Further, the target parameters include: the width of cultivation layer, the length of cultivation layer and at least one of the interval of cultivation layer, the height of cultivation groove, the interval and the solar altitude angle of east-west to cultivation frame.
Further, the formula for calculating the light inlet rate of the cultivation layer is as follows:
ψ(ω)＝ψns(ω)×ψew(ω)
ω＝15(t-12)
in the formula: psi is the light incidence rate of the cultivation layer, psinsIs the incident light rate of east-west, psinsThe south-north light incidence rate is, omega is a time angle, t is a target time period or a sight solar time, and the value range of t is determined according to the rising time and the falling time of the local sun.
Further, the algorithm formula corresponding to the north-south direction instantaneous light incidence model is as follows:
in the formula: w is the width of the cultivation layer, L is the cultivation layerH is the upper and lower spacing of the cultivation layer, alpha is the solar altitude angle, delta is the declination angle,
and n is the geographical latitude of the greenhouse, and is the target time period.
Correspondingly, the invention also provides an electronic device, comprising: a memory, a processor and a computer program stored in the memory and operable on the processor, wherein the processor when executing the program implements the steps of the method for analyzing direct light incidence rate of a cultivation layer in a three-dimensional cultivation mode as described in any one of the above.
Accordingly, the present invention also provides a non-transitory computer readable storage medium having stored thereon a computer program which, when executed by a processor, implements the steps of the method for direct light incidence and light incidence analysis of a cultivation layer in a stereoscopic cultivation mode as described in any one of the above.
By adopting the method for analyzing the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode, the operation is more convenient, the cost is lower, no external sensor equipment is required to be installed, the calculation efficiency and the practicability of the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode of the existing greenhouse can be effectively improved, and the use experience of users is improved.
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In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic flow chart of a method for analyzing the direct light incidence rate of a cultivation layer in a three-dimensional cultivation mode according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a north-south instantaneous light incidence model according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of an east-west instantaneous light incidence model according to an embodiment of the present invention;
FIG. 4 is a schematic structural diagram of a direct-light incidence rate analysis device for a cultivation layer under a three-dimensional cultivation mode according to an embodiment of the present invention;
fig. 5 is a schematic physical structure diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The following describes an embodiment of the method for analyzing the direct light incidence rate of the cultivation layer in the three-dimensional cultivation mode according to the present invention in detail. As shown in fig. 1, which is a schematic flow chart of a method for analyzing a direct light incidence rate of a cultivation layer in a three-dimensional cultivation mode according to an embodiment of the present invention, the specific implementation process includes the following steps:
step 101: and acquiring target parameters corresponding to the cultivation layer.
In the embodiment of the invention, before the target parameters corresponding to the cultivation layer are obtained, the light incidence rate of the cultivation layer in the three-dimensional cultivation mode can be determined as the product of the light incidence rate in the east-west direction and the light incidence rate in the north-south direction. Wherein the target parameters comprise at least one of the width of the cultivation layer, the length of the cultivation layer, the distance between the cultivation layers, the height of the cultivation groove, the distance between the east and west cultivation shelves, the solar altitude angle and the like. The spacing of the cultivation layers may include the layer spacing and the row spacing of the cultivation shelves.
The calculation formula of the light inlet rate of the cultivation layer is as follows:
ψ(ω)＝ψns(ω)×ψew(ω)
ω＝15(t-12)
in the above formula: psi is the light incidence rate of the cultivation layer, psinsIs the incident light rate of east-west, psinsThe south-north light incidence rate is, omega is a time angle, t is a target time period or a sight solar time, and the value range of t is determined according to the rising time and the falling time of the local sun.
Step 102: and respectively inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time.
The algorithm formula corresponding to the north-south direction instantaneous light incidence rate model is as follows:
in the above formula: w is the width of the cultivation layer, L is the length of the cultivation layer, H is the upper and lower spacing of the cultivation layer, alpha is the solar altitude angle, delta is the declination angle,
and n is the day of the year, such as day 20, which is calculated according to the target time period and corresponds to the geographical latitude of the greenhouse.
The algorithm formula corresponding to the east-west direction instantaneous light incidence rate model is as follows:
in the above formula: d is the east-west spacing of the cultivation shelves; h is the height of the cultivation groove; the range of omega is-90 degrees, and the light incidence rate in the east-west direction corresponding to the time angle beyond the range is 0.
Step 103: and obtaining the information of the change of the light entering rate of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
In the specific implementation process, the adopted complete technical scheme at least comprises the following steps:
step 1: considering the light incidence rate psi of the cultivation layer as the east-west light incidence rate psinsAnd north-south light incidence psinsThe product of (a).
Step 2: determining the width W of the cultivation layer, the length L of the cultivation layer, the height H of the cultivation groove, the interlayer spacing H of the cultivation layer, the cultivation shelf spacing D, the geographical latitude of the greenhouse
And step 3: determining the calculated t for the nth day of the year as neededxThe light incidence rate of the lower layer of the cultivation frame through direct solar radiation is kept at all times.
And 4, step 4: the solar declination angle delta is calculated according to the nth day.
And 5: calculating the rising and falling time of the sun according to the nth day, namely the rising time t of the sun when alpha is 00Value and sunset time tmThe value is obtained. The specific calculation formula is as follows:
ωx＝15(tx-12)
step 6: rising the nth day from the sun by t0From time to sun mountain tmThe time interval of the moment is divided into time intervals of t, and then t is counted0Time txIn the order of t0、t0+t、t0+2t、…、tm。
And 7: according to time txSequentially calculating corresponding solar time angles omegax。
And 8: according to the solar time angle omegaxSequentially calculating the corresponding solar altitude angle alphax。
And step 9: according to the solar altitude angle alphaxAnd sequentially calculating the light incidence rate of the lower cultivation layer in the north-south direction. The specific calculation formula is as follows:
step 10: when the solar altitude is changed between 0 degree and 90 degrees, the solar altitude is changed according to the solar hour angle omegaxThe changes of (2) and (3) are combined with the graph shown in fig. 3 to find out that the special time angles of the upper cultivation layer (2) and the side cultivation layer (3) for shielding the cultivation layer (5) are respectively:
Step 10: when the solar time angle is changed from 0 degrees to 90 degrees, the light incoming rate is exactly symmetrical from-90 degrees to 0 degrees.
Specifically, in order to explain the technical contents of the present invention in detail, the following description will be made in conjunction with the embodiments and accompanying fig. 2 and 3.
Step 1: defining the light incidence of the cultivation plate as the product of the east-west light incidence and the south-north light incidence: psi ═ psins×ψns。
Step 2: consider that in this example, the greenhouse is in Beijing and the geographic latitude
The distance D between the cultivation shelves is 1.3m, the width W between the cultivation shelves is 1.2m, the length L between the cultivation shelves is 3.7m, the height H between the cultivation troughs is 0.1m, and the distance H between the layers is 0.5 m.
And step 3: calculating the light incidence rate of direct light of the lower cultivation layer when the summer solstice is that n is 173.
And 4, step 4: the solar declination angle δ was calculated 23 ° 27' from day 173.
And 5: the solar rise and fall times, i.e., the solar rise time t when α is 0, were calculated from the 173 th day0Sun hill-fall time t ═ 5m＝19。
Step 6: dividing the time span from 5 am to 19 pm into 2 hours, namely tx5:00, 7:00, 9:00, 11:00, 13:00, 15:00, 17:00, 19:00, respectively.
And 7: calculating the solar time angle, omega, from timexRespectively-105 deg. -75 deg. -45 deg. -15 deg., 45 deg., 75 deg., 105 deg..
And 8: calculating the solar altitude alpha according to the solar time anglex3.8 °, 5.5 °, 7.3 °, …, 7.3 °, 5.5 °, 3.8 °, respectively.
And step 9: according to the solar altitude angle alphaxThe light incidence rates of the lower cultivation layer in the north-south direction are calculated to be 1, 0.28, 0.12, 0.05, 0.12, 0.28 and 1 in sequence.
Step 10: when the solar altitude is changed between 0 degree and 90 degrees, the solar altitude is changed according to the solar hour angle omegaxThe changes of (2) and (3) are combined with the graph shown in fig. 3 to find out that the special time angles of the upper cultivation layer (2) and the side cultivation layer (3) for shielding the cultivation layer (5) are respectively:
and sequentially calculating the light incidence rate of the corresponding lower cultivation layer in the east-west direction. OmegaxWhen the light incidence is-105 degrees, -75 degrees, -45 degrees, -15 degrees, the light incidence in the east-west direction is 0, 0.22, 0.42 and 0.11 respectively.
Step 10: when the solar time angle is changed from 0 deg. to 90 deg., its light-entering rate is exactly symmetrical to that from-90 deg. to 0 deg., omegaxAt 15 °, 45 °, 75 °, and 105 °, the east-west light-entering rates are 0.11, 0.42, 0.22, and 0, respectively.
By adopting the method for analyzing the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode, the operation is more convenient, the cost is lower, no external sensor equipment is required to be installed, the calculation efficiency and the practicability of the light incidence rate of the direct light of the cultivation layer in the existing three-dimensional cultivation mode of the greenhouse can be effectively improved, and the use experience of a user is improved.
Corresponding to the method for analyzing the direct light incidence rate of the cultivation layer in the three-dimensional cultivation mode, the invention also provides a device for analyzing the direct light incidence rate of the cultivation layer in the three-dimensional cultivation mode. Since the embodiment of the device is similar to the above method embodiment, the description is simple, and please refer to the description of the above method embodiment, and the embodiment of the direct light entering the light ratio analysis device of the cultivation layer in the three-dimensional cultivation mode described below is only schematic. Fig. 4 is a schematic structural diagram of a direct light incidence rate analysis device for a cultivation layer under a three-dimensional cultivation mode according to an embodiment of the present invention.
The invention relates to a device for analyzing the direct light incidence rate of a cultivation layer in a three-dimensional cultivation mode, which comprises the following parts:
a target parameter obtaining unit 401, configured to obtain a target parameter corresponding to the cultivation layer.
The model analysis unit 402 is configured to input the target parameters into the north-south instantaneous light incidence model and the east-west instantaneous light incidence model corresponding to the cultivation layer, respectively, to obtain a functional relationship between the instantaneous light incidence of the cultivation layer and a time variation.
The light entrance rate analysis unit 403 is configured to obtain information of a change of the light entrance rate of the cultivation layer with time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period, and the declination angle.
By adopting the device for analyzing the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode, the operation is more convenient, the cost is lower, no external sensor equipment is required to be installed, the calculation efficiency and the practicability of the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode of the existing greenhouse can be effectively improved, and the use experience of a user is improved.
Corresponding to the method for analyzing the light incidence rate of the direct light of the cultivation layer in the three-dimensional cultivation mode, the invention also provides electronic equipment. Since the embodiment of the electronic device is similar to the above method embodiment, the description is simple, and please refer to the description of the above method embodiment, and the electronic device described below is only schematic. Fig. 5 is a schematic physical structure diagram of an electronic device according to an embodiment of the present invention. The electronic device may include: a processor (processor)501, a memory (memory)502 and a communication bus 503, wherein the processor 501 and the memory 502 are communicated with each other through the communication bus 503. Processor 501 may invoke logic instructions in memory 502 to perform a cultivation layer direct light incidence rate analysis method in a stereoscopic cultivation mode, the method comprising: acquiring target parameters corresponding to the cultivation layer; inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer respectively to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time; and obtaining the information of the change of the light entering rate of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
Furthermore, the logic instructions in the memory 502 may be implemented in software functional units and stored in a computer readable storage medium when sold or used as a stand-alone product. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and other various media capable of storing program codes.
In another aspect, an embodiment of the present invention further provides a computer program product, where the computer program product includes a computer program stored on a non-transitory computer-readable storage medium, the computer program includes program instructions, and when the program instructions are executed by a computer, the computer is capable of executing the cultivation layer direct light incidence rate analysis method in the stereoscopic cultivation mode provided by the above-mentioned method embodiments, and the method includes: acquiring target parameters corresponding to the cultivation layer; inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer respectively to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time; and obtaining the information of the change of the light entering rate of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
In another aspect, an embodiment of the present invention further provides a non-transitory computer-readable storage medium, on which a computer program is stored, where the computer program, when executed by a processor, is implemented to perform the method for analyzing the direct light incidence rate of a cultivation layer in a stereoscopic cultivation mode provided in the foregoing embodiments, where the method includes: acquiring target parameters corresponding to the cultivation layer; inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer respectively to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time; and obtaining the information of the change of the light entering rate of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A method for analyzing the light incidence rate of direct light of a cultivation layer in a three-dimensional cultivation mode is characterized by comprising the following steps:
acquiring target parameters corresponding to the cultivation layer;
inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer respectively to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time;
and obtaining the information of the change of the light entering rate of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
2. The method for analyzing the direct light incidence rate of a cultivation layer in a three-dimensional cultivation mode according to claim 1, further comprising: before acquiring target parameters corresponding to the cultivation layers, determining the light incoming rate of the cultivation layers in the three-dimensional cultivation mode as the product of the light incoming rate in the east-west direction and the light incoming rate in the north-south direction in advance.
3. The method for analyzing the direct light incidence rate of the cultivation layer in the stereoscopic cultivation mode as claimed in claim 1, wherein the target parameters include: the width of cultivation layer, the length of cultivation layer and at least one of the interval of cultivation layer, the height of cultivation groove, the interval and the solar altitude angle of east-west to cultivation frame.
4. The method for analyzing the direct light incidence rate of the cultivation layer under the stereoscopic cultivation mode as claimed in claim 2, wherein the formula for calculating the light incidence rate of the cultivation layer is:
ψ(ω)＝ψns(ω)×ψew(ω)
ω＝15(t-12)
in the formula: psi is the light incidence rate of the cultivation layer, psinsIs the incident light rate of east-west, psinsThe south-north light incidence rate is, omega is a time angle, t is a target time period or a sight solar time, and the value range of t is determined according to the rising time and the falling time of the local sun.
5. The method for analyzing the direct light incidence rate of the cultivation layer under the stereoscopic cultivation mode as claimed in claim 1, wherein the north-south instantaneous light incidence rate model corresponds to an algorithm formula:
in the formula: w is the width of the cultivation layer, L is the length of the cultivation layer, H is the upper and lower spacing of the cultivation layer, alpha is the solar altitude angle, delta is the declination angle,
and n is the day of the year corresponding to the target time period and needing to be calculated, wherein the geographic latitude of the greenhouse is shown.
6. The utility model provides a cultivation layer direct light incidence analytical equipment under three-dimensional cultivation mode which characterized in that includes:
the target parameter acquisition unit is used for acquiring target parameters corresponding to the cultivation layer;
the model analysis unit is used for respectively inputting the target parameters into a north-south direction instantaneous light incidence model and an east-west direction instantaneous light incidence model corresponding to the cultivation layer to obtain a function relation of the instantaneous light incidence of the cultivation layer along with the change of time;
and the light incidence analysis unit is used for obtaining the information of the change of the light incidence of the cultivation layer along with the time in the target time period according to the geographical latitude of the greenhouse, the sequence number corresponding to the target time period and the declination angle.
7. The device for analyzing the incoming light rate of the direct light from the cultivation layer in the three-dimensional cultivation mode as claimed in claim 6, further comprising: and the light incidence determining unit is used for determining the light incidence of the cultivation layer in the three-dimensional cultivation mode as the product of the light incidence in the east-west direction and the light incidence in the north-south direction in advance before acquiring the target parameters corresponding to the cultivation layer.
8. The device for analyzing the direct light incidence rate of the cultivation layer in the stereoscopic cultivation mode as claimed in claim 6, wherein the target parameters include: the width of cultivation layer, the length of cultivation layer and at least one of the interval of cultivation layer, the height of cultivation groove, the interval and the solar altitude angle of east-west to cultivation frame.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor when executing the program implements the steps of the method for direct light incidence rate analysis of a cultivation layer in a stereoscopic cultivation mode as claimed in any one of claims 1 to 5.
10. A non-transitory computer readable storage medium, on which a computer program is stored, wherein the computer program, when executed by a processor, implements the steps of the cultivation layer direct light incidence rate analysis method in the stereoscopic cultivation mode according to any one of claims 1 to 5.
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