CN112782547A - Method for predicting service life of electron multiplier of cesium atomic clock - Google Patents
Method for predicting service life of electron multiplier of cesium atomic clock Download PDFInfo
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- CN112782547A CN112782547A CN202011444421.5A CN202011444421A CN112782547A CN 112782547 A CN112782547 A CN 112782547A CN 202011444421 A CN202011444421 A CN 202011444421A CN 112782547 A CN112782547 A CN 112782547A
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- electron multiplier
- atomic clock
- service life
- cesium
- cesium atomic
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- 229910052792 caesium Inorganic materials 0.000 title claims abstract description 60
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 title claims abstract description 58
- 238000000034 method Methods 0.000 title claims abstract description 26
- 238000012360 testing method Methods 0.000 claims description 18
- 238000005259 measurement Methods 0.000 claims description 4
- 230000008859 change Effects 0.000 abstract description 5
- 230000007774 longterm Effects 0.000 abstract description 4
- NCMHKCKGHRPLCM-UHFFFAOYSA-N caesium(1+) Chemical compound [Cs+] NCMHKCKGHRPLCM-UHFFFAOYSA-N 0.000 description 4
- 238000007885 magnetic separation Methods 0.000 description 4
- -1 cesium ions Chemical class 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000010884 ion-beam technique Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 229910052701 rubidium Inorganic materials 0.000 description 1
- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Abstract
The invention discloses a method for predicting the service life of a cesium atomic clock electron multiplier, which is characterized in that the change rule of the working voltage of the cesium atomic clock electron multiplier is obtained based on the analysis of long-term operation data of a cesium atomic clock, the service life of a newly developed cesium atomic clock electron multiplier is obtained by analyzing and calculating according to the rule, the blank of the method for predicting the service life of the electron multiplier is filled, the prediction deviation is less than 10%, and the service life of the cesium atomic clock can be directly deduced.
Description
Technical Field
The invention belongs to the technical field of vacuum electronics, and particularly relates to a method for predicting the service life of a cesium atomic clock electron multiplier.
Background
The high-precision cesium magnetic separation atomic clock is an important component of a precision time frequency system, and is widely applied to the fields of communication, navigation positioning, time keeping, metering, precision striking and the like. Compared with rubidium atomic clocks and hydrogen atomic clocks, the magnetic separation cesium atomic clocks have the characteristics of good long-term stability and small drift rate. The cesium ion beam current intensity after passing through the magnetic separation state in a cesium atomic clock is very weak, and is only 5 multiplied by 10 < -12 > amperes, so that a tiny current signal cannot be used for signal identification at all, and frequency identification cannot be carried out, the signal identification and the frequency identification are facilitated only by amplifying the cesium ion beam current to about 5 multiplied by 10 < -8 > amperes, meanwhile, the time interval between the amplified signal and an original signal is required to be short, the time response is fast, and the function of an electron multiplier is used for achieving the purpose.
The principle of electron multipliers for amplifying cesium ion signals is based on the electron multiplication effect of secondary electron emission. A9-dozen-grade structure is adopted, and an MgO secondary electron emission film plated on the inner surface of a dynode is used for generating gain electrons to amplify incident weak cesium ion signals step by step. In the use process, except for emitting electrons, the electron multiplier seizing stages firstly suffer continuous bombardment of high-energy cesium ions, the bombardment energy is up to 2000eV, then several stages of seizing stages suffer continuous bombardment of gain current, the bombardment effect is enhanced along with the increase of the stage number, the bombardment energy is about 300eV, and the beam current is about 50 nA. Under the continuous bombardment of high-energy cesium ions and large-beam gain electron beams, the gain current of the electron multiplier is gradually reduced. In order to stabilize the gain current (cesium atomic clock frequency-locked signal), the negative high voltage loaded on the electron multiplier needs to be continuously increased, and the emission coefficient of the secondary electron emission film needs to be increased. However, there is a limit to the negative high voltage applied to the electron multiplier, and if the limit is reached, the electron multiplier fails. Because the electron multiplier cannot be replaced, the failure of the electron multiplier means the end of the service life of the cesium atomic clock, and therefore the electron multiplier is a key device influencing the service life of the magnetic separation cesium atomic clock.
The service life index is a very key technical index of a cesium atomic clock product, and the prediction of the service life of the cesium atomic clock is very important for predicting the operation condition of the cesium atomic clock. Besides the electron multiplier, the main factors influencing the service life of the cesium atomic clock include the cesium charging amount of the cesium furnace and the vacuum degree of the cesium beam tube. By filling a cesium furnace with a sufficient amount of cesium and maintaining the cesium beam tube vacuum degree through titanium pump pumping, the service life of the cesium atomic clock at present has no problem in terms of the cesium filling amount of the cesium furnace and the cesium beam tube vacuum degree. Due to the great difficulty in development, the problem that the attenuation rate is high and the service life of the existing electron multiplier is short still exists, and the problem becomes a key problem influencing the service life of the cesium atomic clock. The service life of the cesium atomic clock can be directly estimated by realizing the service life prediction of the electron multiplier, however, no corresponding method is available at present for predicting the service life of the electron multiplier, and the service life of the cesium atomic clock cannot be predicted.
Disclosure of Invention
In view of this, the invention provides a method for predicting the service life of a cesium atomic clock electron multiplier, which can accurately predict the service life of the cesium atomic clock electron multiplier.
The method for predicting the service life of the electron multiplier of the cesium atomic clock is used for predicting the vacuum degree of a cesium beam tube to be more than 1 multiplied by 10-3Pa, the working temperature range t is more than or equal to minus 30 ℃ and less than or equal to 50 ℃, and the output current I of the electron multiplier is more than or equal to 10nA and less than or equal to 100nA, and the method is characterized by comprising the following steps:
selecting data of the cesium atomic clock electron multiplier at a descending stage of working voltage as test data; fitting a graph formed from the test data to obtain a mathematical expression of a linear equation: u is aT + b, where U is the operating voltage of the cesium atomic clock electron multiplier, T is the test time, b is a parameter of an equation, and the increase of the average voltage per unit measurement time is a;
calculating the working voltage value U of the electron multiplier0And a cut-off operating voltage value U of the electron multipliertDifference value U ofd＝Ut-U0The service life of the electron multiplier is Tr＝Ud/a。
Further, the time span of the test data is not less than 1 month.
Further, the unit measurement time is days.
Further, the electronsCutoff operating voltage value U of multipliertThe value is-2650V.
Further, the output current of the electron multiplier is 50 nA.
Further, the recording time interval of the test data is not more than 2 h.
Has the advantages that:
the method obtains the change rule of the working voltage of the cesium atomic clock electron multiplier based on the analysis of the long-term operation data of the cesium atomic clock, obtains the service life of the newly developed cesium atomic clock electron multiplier by analyzing and calculating according to the rule, fills the blank of a method for predicting the service life of the electron multiplier, has the prediction deviation smaller than 10 percent, and can directly infer the service life of the cesium atomic clock.
Drawings
Fig. 1 is a flowchart of a method for predicting the service life of an electron multiplier of a cesium atomic clock according to the present invention.
Fig. 2 is a graph of the working voltage variation of the electron multiplier of the method for predicting the service life of the electron multiplier of the cesium atomic clock provided by the invention.
Detailed Description
The invention is described in detail below by way of example with reference to the accompanying drawings.
The basis of the method is the working rule of the cesium atomic clock electron multiplier obtained based on the long-term operation data of the cesium atomic clock, namely that under a certain output current, the working voltage of the electron multiplier firstly decreases and then rises, the rising stage is changed linearly, and the change curve is shown in figure 2. The cesium atomic clock analyzed in the invention is a whole clock formed by packaging an electron multiplier in a cesium beam tube, and the working conditions are as follows: vacuum degree in cesium beam tube is better than 1 x 10-3Pa, the working temperature range is-30 ℃ to 50 ℃, and the output current range of the electron multiplier is 10nA to 100 nA.
The method for predicting the service life of the electron multiplier of the cesium atomic clock, provided by the invention, has the flow shown in figure 1, and comprises the following steps:
selecting the data of the working voltage reduction stage of the cesium atomic clock electron multiplier to be tested for analysis, and testing the dataAnd drawing the test data into a graph with the ordinate as test time T and the abscissa as working voltage U at the time of not less than 1 month, and fitting a variation trend line according to the test result graph to form a mathematical expression of a linear equation: u is aT + b, giving the increase in average voltage per day, a, b is. According to the working voltage value U of the electron multiplier entering the descending stage0And the cut-off operating voltage value U of the electron multipliert-2650V, difference U between themd＝Ut-U0The service life of the electron multiplier is Tr＝Ud/a。
According to the method for predicting the service life of the cesium atomic clock electron multiplier, aiming at the condition that the output current of the electron multiplier is 50nA, after a cesium atomic clock signal is locked, the output current needs to be stably output, and the deviation needs to be less than +/-1 nA.
In the process of obtaining test data, after the cesium atomic clock locks signals, the working voltage change data of the electron multiplier are recorded, and the recording time interval is not more than 2 h.
Example 1:
in this embodiment, by using the method for predicting the service life of the cesium atomic clock electron multiplier provided by the invention, data of the working voltage drop-in stage of the electron multiplier is selected for analysis, the data testing time is 1 month, the test data is plotted into a graph, the ordinate is the test time T, the abscissa is the working voltage U, a change trend line is fitted according to the graph, a mathematical expression U of a linear equation is 0.00003889T-1254.2, and the daily average voltage amplitude is obtained to be 0.56 v/day. According to the working voltage value U of the electron multiplier entering the falling stage0-1254.2V, and cut-off operating voltage value U of electron multipliert-2650V, difference U between themd＝Ut-U0When the voltage is equal to-1396V, the service life T of the electron multiplier at 50nA output is obtainedr＝UdAnd a is 6.83 years.
In summary, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (6)
1. A method for predicting the service life of electron multiplier in cesium atomic clock for the vacuum degree greater than 1X 10 of cesium beam tube-3Pa, the working temperature range t is more than or equal to minus 30 ℃ and less than or equal to 50 ℃, and the output current I of the electron multiplier is more than or equal to 10nA and less than or equal to 100nA, and the method is characterized by comprising the following steps:
selecting data of the cesium atomic clock electron multiplier at a descending stage of working voltage as test data; fitting a graph formed from the test data to obtain a mathematical expression of a linear equation: u is aT + b, where U is the operating voltage of the cesium atomic clock electron multiplier, T is the test time, b is a parameter of an equation, and the increase of the average voltage per unit measurement time is a;
calculating the working voltage value U of the electron multiplier0And a cut-off operating voltage value U of the electron multipliertDifference value U ofd＝Ut-U0The service life of the electron multiplier is Tr＝Ud/a。
2. The prediction method of claim 1, wherein the time span of the test data is not less than 1 month.
3. The prediction method according to claim 1, wherein the unit of measurement time is a day.
4. Prediction method according to claim 1, characterized in that the cut-off operating voltage value U of the electron multiplier is such thattThe value is-2650V.
5. The prediction method according to claim 1, characterized in that the output current of the electron multiplier is 50 nA.
6. The prediction method of claim 1, wherein the recording time interval of the test data is not more than 2 h.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113289922A (en) * | 2021-05-14 | 2021-08-24 | 南京指南砺剑通信技术有限公司 | Synchronous aging screening method for multiple rubidium atomic clocks |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113289922A (en) * | 2021-05-14 | 2021-08-24 | 南京指南砺剑通信技术有限公司 | Synchronous aging screening method for multiple rubidium atomic clocks |
| CN113289922B (en) * | 2021-05-14 | 2023-04-25 | 江苏指南针导航通信技术股份有限公司 | Synchronous aging screening method for multiple rubidium atomic clocks |
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