CN112747768A - Star sensor stray light resistance verification and test system - Google Patents
Star sensor stray light resistance verification and test system Download PDFInfo
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Abstract
The invention discloses a system for verifying and testing stray light resistance of a star sensor, which comprises: an optical platform; the solar simulator is positioned at one end of the optical platform and is used for emitting quasi-parallel irradiation beams; the beam shaping system is arranged at a position close to the outlet of the solar simulator and used for shaping the parallel irradiation beams to obtain irradiation beams matched with the size of the light inlet of the target to be measured; the optical chopper is arranged at the position close to the outlet of the beam shaping system and is used for modulating and outputting the irradiation beam; a mechanical movement device disposed on the optical platform and proximate to the optical chopper; and the target to be detected is arranged on the mechanical movement device and is irradiated by the modulated irradiation light beam so as to evaluate the stray light resistance of the target to be detected. The method can effectively evaluate the stray light inhibition level of the star sensor, and provides a test and evaluation means for the on-orbit application of the star sensor.
Description
Technical Field
The invention relates to the technical field of aerospace star field detection, in particular to a system for verifying and testing stray light resistance of a star sensor.
Background
The star sensor mainly aims at the imaging of a space weak and small moving target, works in a severe environment with strong radiation sources (such as the sun, the moon and the earth) outside a system visual field, and has serious influence of background veiling glare. The influence of stray light on the system is mild, so that the signal-to-noise ratio of a target is reduced, the contrast is reduced, and the detection or identification capability of the whole system is influenced; if the detected target signal is completely annihilated in the stray light background, the system can not extract the target; or due to uneven distribution of stray light on the image surface, false signals are formed on a system detector, so that the system detects false targets and even the whole system fails, and the attitude measurement precision of the star sensor is seriously influenced.
Aiming at the stray light inhibition requirement of a star sensor system in orbit application, a quantitative test and analysis method of the stray light inhibition performance is urgently needed to complete the ground verification and test system development of the stray light resistance of the star sensor, and the method is used for carrying out physical test on the stray light inhibition capability of the star sensor. Meanwhile, the stray light inhibition performance of the star sensor is quantitatively analyzed, and a theoretical basis and a technical method are provided for the design of star sensor products developed at the present stage and the optimization design of stray light resistance performance of novel star sensors in the future.
Disclosure of Invention
The invention aims to provide a system for verifying and testing stray light resistance of a star sensor, which can realize the purposes of quantitative test, analysis and verification of an optical system consisting of a light shield assembly and a light shield and the stray light inhibition level of the whole star sensor, effectively evaluate the stray light inhibition level of the star sensor and the performance of a star map target extraction algorithm through staged, parallel and layer-by-layer quantitative comprehensive test, and provide a test and evaluation means for on-orbit application of the star sensor.
In order to achieve the above purpose, the invention is realized by the following technical scheme:
a star sensor stray light resistance verification and test system comprises: an optical platform; a solar simulator located at one end of the optical platform, the solar simulator for emitting quasi-parallel irradiation beams; the beam shaping system is arranged at a position close to the outlet of the solar simulator and is used for shaping the quasi-parallel irradiation beams to obtain irradiation beams matched with the size of the light inlet of the target to be measured; an optical chopper disposed at an exit position near the beam shaping system, the optical chopper being configured to modulate and output the irradiation beam; a mechanical movement device disposed on the optical platform and proximate to the optical chopper; and the target to be detected is arranged on the mechanical movement device and is irradiated by the modulated irradiation light beam so as to evaluate the stray light resistance of the target to be detected.
Preferably, when the target to be tested is a star sensor light shield and the extinction ratio of the target to be tested is quantitatively tested, the method further comprises the following steps: and the star sensor light shield and the integrating sphere are arranged on the mechanical movement device. The mechanical motion device is used for driving the star sensor light shield and the integrating sphere to do circular motion on a horizontal plane; the extinction ratio test of the star sensor light shield under the irradiation of incident light at different angles is realized.
Preferably, the integrating sphere comprises a first integrating sphere with a first detector and a second integrating sphere with a second detector; the light inlet of the star sensor hood receives irradiation of the irradiation light beam modulated by the optical chopper, and the light outlet of the star sensor hood is connected with the second integrating sphere; the irradiation light beam emitted by the star sensor light shield enters the second integrating sphere; the second detector is used for measuring the first radiant flux received by the second integrating sphere. And removing the star sensor light shield, moving the first integrating sphere to the position of the light inlet of the star sensor light shield, wherein the first detector is used for measuring a second radiation flux received by the first integrating sphere, and the ratio of the first radiation flux to the second radiation flux is the measured extinction ratio.
Preferably, when the target to be measured is a star sensor light shield and the quantitative test of the energy distribution of the light outlet is performed on the target to be measured, the method further includes: and the star sensor light shield and the low-light-level camera are arranged on the mechanical motion device. And the modulated irradiation light beams enter the light inlet of the star sensor light shield. The micro-light camera is used for collecting energy distribution image data of a light outlet of the star sensor light shield. And controlling the mechanical movement device to do circular movement on the horizontal plane, and acquiring energy distribution image data at the light outlet of the star sensor light shield under the irradiation of the modulated irradiation light beams at different angles. And processing the energy distribution image data based on the calibration data of the low-light-level camera to obtain the radiation energy distribution of the light outlet of the star sensor light shield.
Preferably, when the target to be tested is a whole star sensor and the whole star sensor is subjected to stray light quantitative test, the whole star sensor is arranged on the mechanical movement device. The modulated irradiation light beams are incident to a light inlet of a star sensor light shield assembled on the star sensor complete machine, and then are sequentially processed by a shading system, an optical system, a detector and imaging electronics in the star sensor complete machine to form a gray image. And controlling the mechanical movement device to rotate to drive the star sensor complete machine to do circular motion on a horizontal plane, acquiring the gray level images under different incidence angles, storing all the gray level images into a database, and performing comprehensive analysis basic data of the stray light inhibition performance of the star sensor complete machine according to the gray level images.
Preferably, the solar simulator adopts a short-arc xenon lamp with 1KW power as a light source, and has the total radiation illumination with adjustable solar constants of 0.4-1.0.
Preferably, the mechanical movement device comprises an electric control turntable, an electric control displacement table and a horizontal plate with a pulley support, the electric control turntable is arranged on the bearing table surface of the optical platform, the horizontal plate is arranged on the electric control turntable, the electric control displacement table is arranged on the horizontal plate, and the electric control turntable is used for driving the horizontal plate to rotate around the center of the electric control turntable. Preferably, the electrically controlled displacement stage comprises: the first two-dimensional electric control displacement table and the second two-dimensional electric control displacement table. The first two-dimensional electric control displacement platform is arranged on the horizontal flat plate and is close to the electric control rotary table. And the second two-dimensional electric control displacement platform is arranged on the horizontal flat plate and is close to the first two-dimensional electric control displacement platform. The first two-dimensional electric control displacement platform is used for providing a bearing foundation for the target to be measured and driving the target to be measured to adjust in the front-back direction and the up-down direction. The second two-dimensional electric control displacement platform is used for providing a bearing foundation for the integrating sphere and the low-light-level camera and moving the integrating sphere or the low-light-level camera in the front-back direction and the left-right direction.
Preferably, the beam shaping system is arranged at a beam outlet of a solar simulator, and the quasi-parallel irradiation beam output by the solar simulator is shaped into the irradiation beam matched with the dimension of a light inlet of a star sensor light shield through parameter matching with the solar simulator. The optical chopper is arranged at an outlet of the light beam shaping system, and modulates the irradiation light beam output by the light beam shaping system into an alternating signal by performing parameter matching with the light beam shaping system.
Preferably, the method further comprises the following steps: and the test computer is used for operating the stray light test and analysis software and calculating the stray light inhibition performance evaluation index in real time according to the gray level image.
The invention has at least one of the following advantages:
the invention can realize the quantitative test, analysis and verification of the stray light inhibition level of an optical system formed by the star sensor light shield and the whole star sensor, effectively evaluates the stray light inhibition level of the star sensor and the performance of a star map target extraction algorithm through the comprehensive test of grading, parallel and layer-by-layer quantization, and provides a test and evaluation means for the on-orbit application of the star sensor.
Drawings
FIG. 1 is a schematic diagram of a system for quantitatively testing an extinction ratio of a light shield of a star sensor by using a system for verifying and testing an anti-stray light performance of the star sensor according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a system for quantitatively testing an energy distribution at an outlet of a light shield of a star sensor according to a system for verifying and testing an anti-stray light performance of the star sensor provided by the second embodiment of the present invention;
fig. 3 is a schematic view of a system for verifying and testing the stray light resistance of a star sensor according to a third embodiment of the present invention, which is used for quantitatively testing the stray light of the star sensor.
Detailed Description
The following describes in detail an anti-stray light performance verification and test system for a star sensor according to the present invention with reference to the accompanying drawings and the detailed description. The advantages and features of the present invention will become more apparent from the following description. It is to be noted that the drawings are in a very simplified form and are all used in a non-precise scale for the purpose of facilitating and distinctly aiding in the description of the embodiments of the present invention. To make the objects, features and advantages of the present invention comprehensible, reference is made to the accompanying drawings. It should be understood that the structures, ratios, sizes, and the like shown in the drawings and described in the specification are only used for matching with the disclosure of the specification, so as to be understood and read by those skilled in the art, and are not used to limit the implementation conditions of the present invention, so that the present invention has no technical significance, and any structural modification, ratio relationship change or size adjustment should still fall within the scope of the present invention without affecting the efficacy and the achievable purpose of the present invention.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
In the description of the present invention, it is to be understood that the terms "center," "height," "thickness," "upper," "lower," "vertical," "horizontal," "top," "bottom," "inner," "outer," "axial," "radial," "circumferential," and the like are used in the orientations and positional relationships indicated in the drawings for convenience in describing the present invention and for simplicity in description, and are not intended to indicate or imply that the referenced devices or elements must have a particular orientation, be constructed and operated in a particular orientation, and are not to be considered limiting. In the description of the present invention, "a plurality" means two or more unless otherwise specified.
In the description of the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "fixed" are to be construed broadly, e.g., as meaning either a fixed connection, a removable connection, or an integral part; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
In the present invention, unless otherwise expressly stated or limited, "above" or "below" a first feature means that the first and second features are in direct contact, or that the first and second features are not in direct contact but are in contact with each other via another feature therebetween. Also, the first feature being "on," "above" and "over" the second feature includes the first feature being directly on and obliquely above the second feature, or merely indicating that the first feature is at a higher level than the second feature. A first feature being "under," "below," and "beneath" a second feature includes the first feature being directly under and obliquely below the second feature, or simply meaning that the first feature is at a lesser elevation than the second feature.
Example one
As shown in fig. 1, the present embodiment provides a system for verifying and testing stray light resistance of a star sensor, including: an optical platform 100.
A solar simulator 200 located at one end of the optical platform 100, the solar simulator 200 for emitting quasi-parallel irradiation beams;
and the beam shaping system 300 is arranged at a position close to the outlet of the solar simulator 200, and the beam shaping system 300 is used for shaping the quasi-parallel irradiation beams to obtain irradiation beams matched with the size of the light inlet of the target to be measured.
An optical chopper 400 disposed at a position near an exit of the beam shaping system, the optical chopper being for modulating and outputting the irradiation light beam.
A mechanical movement device 700 disposed on the optical platform 100 and located proximate to the optical chopper 400.
A target to be measured disposed on the mechanical movement device 700, the target to be measured being irradiated by the modulated irradiation light beam to evaluate an anti-stray light performance of the target to be measured.
Referring to fig. 1, in the present embodiment, the object to be tested is a star sensor light shield 500, and when performing the extinction ratio quantitative test on the object to be tested, the method further includes: the integrating sphere 600, the star sensor shade 500 and the integrating sphere 600 are disposed on the mechanical movement device 700.
The mechanical movement device 700 is configured to drive the star sensor light shield 500 and the integrating sphere 600 to make a circular movement on a horizontal plane (as shown by reference number 701 in fig. 1); the extinction ratio test of the star sensor light shield 500 under the irradiation of the incident light of different angles is realized.
The integrating sphere 600 includes a first integrating sphere with a first detector and a second integrating sphere with a second detector.
The light inlet of the star sensor hood 500 is close to the optical chopper 400, and the light outlet thereof is connected with a small integrating sphere (second integrating sphere) in the integrating sphere 600; the irradiation light beam emitted from the star sensor hood 500 enters the small integrating sphere.
The second detector is used for measuring the first radiant flux received by the small integrating sphere.
The star sensor hood 500 is removed, a large integrating sphere (a second integrating sphere) in the integrating sphere 600 is moved to a position at an entrance of the star sensor hood 500, a first detector in the large integrating sphere (a first integrating sphere) in the integrating sphere 600 is used for measuring a second radiant flux received by the large integrating sphere (the first integrating sphere) in the integrating sphere 600, and a ratio between the first radiant flux and the second radiant flux is the measured extinction ratio of the star sensor hood 500.
It will be appreciated that the size of the integrating sphere is generally specified in terms of its side aperture diameter, and is generally divided into: 0.3m, 0.5m, 1.0m, 1.5m, 1.75m, 2.0m, etc. The diameter of a side aperture of the first integrating sphere is larger than that of the side aperture of the first integrating sphere.
Example two
As shown in fig. 2, the present embodiment provides a system for verifying and testing stray light resistance of a star sensor, including: an optical platform 100.
A solar simulator 200 located at one end of the optical platform 100, the solar simulator 200 for emitting quasi-parallel irradiation beams.
And the light beam shaping system 300 is arranged at a position close to the outlet of the solar simulator 200, and the light beam shaping system 300 is used for shaping the quasi-parallel irradiation light beams to obtain irradiation light beams matched with the size of the light inlet of the target to be measured.
An optical chopper 400 disposed at a position near an exit of the beam shaping system.
The optical chopper is used for modulating and outputting the irradiation light beam.
A mechanical movement device 700 disposed on the optical platform 100 and located proximate to the optical chopper 400.
And the target to be detected is arranged on the mechanical movement device and is irradiated by the modulated irradiation light beam so as to evaluate the stray light resistance of the target to be detected.
Referring to fig. 2, in the present embodiment, the target to be tested is the star sensor light shield 500, and when the quantitative test of the energy distribution at the light outlet is performed on the target to be tested, the method further includes: the low-light camera 601, the star sensor hood 500 and the low-light camera 601 are arranged on the mechanical movement device 700.
The modulated irradiation light beam is incident into the light inlet of the star sensor light shield 500.
The low-light-level camera 601 is configured to acquire image data of energy distribution at a light exit of the star sensor light shield 500.
The mechanical movement device 700 is controlled to make a circular movement on the horizontal plane (as shown by reference numeral 701 in fig. 2), and then energy distribution image data at the light exit of the star sensor light shield 500 under the irradiation of the modulated irradiation light beam at different angles is acquired.
And processing the acquired energy distribution image data of the light outlet of the star sensor light shield 500 under irradiation of different incident angles based on the calibration data of the low-light-level camera 601 to obtain the radiation energy distribution of the light outlet of the star sensor light shield 500. That is, the image data obtained by shooting is processed based on the calibration data of the low-light-level camera 601, so as to obtain the radiance distribution at the outlet of the star sensor hood 500.
EXAMPLE III
As shown in fig. 3, the present embodiment provides a system for verifying and testing stray light resistance of a star sensor, including: an optical platform 100.
A solar simulator 200 located at one end of the optical platform 100, the solar simulator 200 for emitting quasi-parallel irradiation beams.
And the light beam shaping system 300 is arranged at a position close to the outlet of the solar simulator 200, and the light beam shaping system 300 is used for shaping the quasi-parallel irradiation light beams to obtain irradiation light beams matched with the size of the light inlet of the target to be measured.
An optical chopper 400 disposed at a position near an exit of the beam shaping system, the optical chopper being for modulating and outputting the irradiation light beam.
A mechanical movement device 700 disposed on the optical platform 100 and located proximate to the optical chopper 400.
And the target to be detected is arranged on the mechanical movement device and is irradiated by the modulated irradiation light beam so as to evaluate the stray light resistance of the target to be detected.
Referring to fig. 3, in the present embodiment, the target to be tested is a star sensor whole machine 602, and when performing a parasitic light quantitative test on the star sensor whole machine 602, the method further includes: a star sensor light shield 500, the star sensor light shield 500 being assembled to the star sensor whole machine 602 and being disposed on the mechanical moving device 700.
The modulated irradiation light beam is incident to the light inlet of the star sensor light shield 500, and then sequentially passes through the light shield system, the optical system, the detector and the imaging electronics in the star sensor complete machine 500 to form a gray image.
And controlling the mechanical movement device 700 to rotate to drive the star sensor complete machine 602 to make circular motion on a horizontal plane, acquiring gray level images at different incidence angles, storing all the gray level images into a database for the subsequent comprehensive analysis of the stray light inhibition performance of the star sensor complete machine 602, and performing the basic data of the comprehensive analysis of the stray light inhibition performance of the star sensor complete machine according to the gray level images.
It can be understood that, in the first to third embodiments, the optical platform 100 is an air-floating type automatic-balancing standard optical platform (precision 0.2 ") with a built-in damping hole, and the air compressor pump is used as an air source of the optical platform 100, has horizontal and vertical bidirectional vibration-proof and vibration-isolating functions, and is equipped with an anti-static device such as an anti-static bracelet and a grounding pile. The device is used for providing stable bearing foundation and ensuring flatness and levelness for other optical electromechanical devices used by the system provided by the embodiment.
It can be understood that, in the first to third embodiments, the solar simulator 200 adopts a short-arc xenon lamp with 1KW power as a light source, and has 0.4 to 1.0 total irradiance with adjustable solar constant. And the solar simulator 200 is provided with a power supply 201 for supplying power thereto. The instability of the test light source of the solar simulator 200 is not more than 5%, for example, the stability of the test light source is not less than 98% within 72h, a strong radiation source outside a system field of view in an on-orbit state can be truly simulated, and the stray light resistance of the whole star sensor can be accurately and quantitatively evaluated.
It is understood that in the first to third embodiments, the mechanical motion device 700 includes an electrically controlled displacement table, an electrically controlled turntable, a horizontal plate 702 with a pulley support, and a motion controller 800.
The electric control turntable is arranged on a bearing table surface of the optical platform, the horizontal plate 702 is arranged on the electric control turntable, the electric control displacement table is arranged on the horizontal plate 702, and the electric control turntable is used for driving the horizontal plate 702 to rotate around the center of the electric control turntable. The motion controller 800 is used for controlling the electric control displacement table to move on a horizontal plane and controlling the electric control rotary table to rotate, wherein the electric control rotary table is a high-precision electric control rotary table (the positioning precision is better than 0.01 degrees), and the electric control displacement table is a high-precision electric control displacement table (the resolution is better than 5 microns).
Specifically, the horizontal plate 702 with the pulley is arranged on the electric control rotary table through a tool, and the electric control rotary table is used for driving the horizontal plate 702 with the pulley support to rotate around the center of the electric control rotary table.
The quantity of automatically controlled displacement platform is two sets, wherein, includes: the first two-dimensional electric control displacement table and the second two-dimensional electric control displacement table.
The first two-dimensional electric control displacement table is arranged on the horizontal flat plate 702 and close to the electric control rotary table.
The second two-dimensional electric control displacement table is arranged on the horizontal flat plate 702 and is close to the first two-dimensional electric control displacement table.
The first two-dimensional electronic control displacement platform is used for providing a bearing foundation for the target to be detected (a lens hood assembly to be detected, a star sensor complete machine and the like); and the device is used for driving the target to be measured to adjust the front-back direction and the up-down direction.
The second two-dimensional electric control displacement table is used for providing a bearing foundation for integrating spheres (large integrating sphere, small integrating sphere, micro-light camera, auxiliary tool equipment and the like) and realizing the movement of the integrating spheres in the front-back direction and the left-right direction.
In the testing process of the first to third embodiments, the star sensor is controlled to accurately move by the high-precision electric control turntable and the high-precision electric control displacement table on the air-floating type automatic-balance optical platform with the built-in damping hole, so that the testing requirements of different angles can be met, and the repeatability is very good.
It is understood that, in the first to third embodiments, the light beam shaping system 300 is disposed near the light beam outlet of the solar simulator 200, and shapes the quasi-parallel irradiation light beam output from the solar simulator 200 into an irradiation light beam matched with the dimension of the light inlet of the star sensor light shield 500 by performing parameter matching with the solar simulator 200. The beam shaping system 300 is a beam shaping mask.
The optical chopper 400 is arranged at an outlet close to the beam shaping system 300, and modulates the irradiation beam output by the beam shaping system 300 into an alternating signal by performing parameter matching with the beam shaping system 300, so that drift errors accumulated when the radiation measuring instrument detects weak light signals for a long time are reduced, and stray light interference of the external environment is inhibited. The modulation frequency accuracy of the optical chopper 400 is better than 0.002 Hz.
It is understood that, in each of the first to third embodiments, the following may be further included: the test computer is used for operating the stray light test and analysis software, is provided with an interface for carrying out real-time communication with the integrating sphere, the glimmer measuring camera (glimmer camera), the optical chopper, the electric control displacement table, the electric control rotary table and the star sensor whole machine, and controls the measured integrating time and the data acquisition angle step length so as to complete the stray light quantitative test of the sensor hood or the star sensor whole machine; and the testing computer calculates the evaluation index of the stray light inhibition performance in real time according to the image data by running stray light testing and analyzing software so as to process and analyze the stray light data.
In the second embodiment, the low-light-level camera 601 is a low-light-level measuring camera, and when the energy distribution at the exit of the mask is measured, the low-light-level measuring camera 601 is mounted on the second two-dimensional displacement table and used for shooting and acquiring image data of the energy distribution at the exit of the mask.
It can be understood that, in the first embodiment, when the extinction ratio of the star sensor hood is measured, the integrating sphere includes a first integrating sphere and a second integrating sphere, the diameter of the first integrating sphere is larger than that of the second integrating sphere, the first integrating sphere and the second integrating sphere are mounted on the second two-dimensional displacement table, and are used for stably detecting and accurately measuring the luminous flux of the light inlet and the light outlet of the star sensor hood, and before the test, a standard lamp needs to be turned on to perform field calibration on the integrating sphere.
In conclusion, the method can realize quantitative test, analysis and verification of the stray light inhibition level of an optical system formed by the star sensor light shield and the star sensor complete machine, effectively evaluate the stray light inhibition level of the star sensor and the performance of a star map target extraction algorithm through comprehensive test of grading, parallel and layer-by-layer quantization, and provide a test and evaluation means for on-orbit application of the star sensor.
While the present invention has been described in detail with reference to the preferred embodiments, it should be understood that the above description should not be taken as limiting the invention. Various modifications and alterations to this invention will become apparent to those skilled in the art upon reading the foregoing description. Accordingly, the scope of the invention should be determined from the following claims.
Claims (10)
1. A star sensor stray light resistance verification and test system is characterized by comprising:
an optical platform;
a solar simulator located at one end of the optical platform, the solar simulator for emitting quasi-parallel irradiation beams;
the beam shaping system is arranged at a position close to the outlet of the solar simulator and is used for shaping the quasi-parallel irradiation beams to obtain irradiation beams matched with the size of the light inlet of the target to be measured;
an optical chopper disposed at an exit position near the beam shaping system, the optical chopper being configured to modulate and output the irradiation beam;
a mechanical movement device disposed on the optical platform and proximate to the optical chopper;
and the target to be detected is arranged on the mechanical movement device and is irradiated by the modulated irradiation light beam so as to evaluate the stray light resistance of the target to be detected.
2. The verification and test system for stray light resistance of star sensor according to claim 1, wherein when the object to be tested is a light shield of star sensor and the extinction ratio thereof is quantitatively tested,
further comprising: the star sensor light shield and the integrating sphere are arranged on the mechanical movement device; the mechanical movement device is used for driving the star sensor hood and the integrating sphere to do circular motion on a horizontal plane so as to realize the extinction ratio test of the star sensor hood under the irradiation of incident light at different angles.
3. The star sensor stray light resistance verification and testing system according to claim 2, wherein the integrating sphere comprises a first integrating sphere with a first detector and a second integrating sphere with a second detector;
the light inlet of the star sensor hood receives irradiation of the irradiation light beam modulated by the optical chopper, and the light outlet of the star sensor hood is connected with the second integrating sphere; the irradiation light beam emitted by the star sensor light shield enters the second integrating sphere;
the second detector is used for measuring a first radiant flux received by the second integrating sphere;
and removing the star sensor light shield, moving the first integrating sphere to the position of the light inlet of the star sensor light shield, wherein the first detector is used for measuring a second radiation flux received by the first integrating sphere, and the ratio of the first radiation flux to the second radiation flux is the measured extinction ratio.
4. The system for verifying and testing stray light resistance of star sensor according to claim 1, wherein when the object to be tested is a light shield of the star sensor and the quantitative test of energy distribution of the light outlet is performed on the object to be tested, the system further comprises: the star sensor light shield and the low-light camera are arranged on the mechanical movement device;
the modulated irradiation light beam is incident to a light inlet of the star sensor light shield,
the micro-light camera is used for collecting energy distribution image data of a light outlet of the star sensor light shield;
controlling the mechanical movement device to do circular motion on a horizontal plane, and acquiring energy distribution image data at a light outlet of the star sensor light shield under the irradiation of modulated irradiation light beams at different angles;
and processing the energy distribution image data based on the calibration data of the low-light-level camera to obtain the radiation energy distribution of the light outlet of the star sensor light shield.
5. The system for verifying and testing stray light resistance of the star sensor according to claim 1, wherein when the object to be tested is a whole star sensor and the whole star sensor is subjected to the stray light quantitative test, the whole star sensor is arranged on the mechanical movement device;
the modulated irradiation light beams are incident to a light inlet of a star sensor light shield assembled on the star sensor complete machine, and then are sequentially processed by a shading system, an optical system, a detector and imaging electronics in the star sensor complete machine to form a gray image;
and controlling the mechanical movement device to rotate to drive the star sensor complete machine to do circular motion on a horizontal plane, acquiring the gray level images under different incidence angles, storing all the gray level images into a database, and performing comprehensive analysis basic data of the stray light inhibition performance of the star sensor complete machine according to the gray level images.
6. The system for verifying and testing the stray light resistance of the star sensor according to any one of claims 1 to 5, wherein the solar simulator adopts a short-arc xenon lamp with 1KW power as a light source, and has 0.4 to 1.0 total radiation illumination with adjustable solar constant.
7. The system for verifying and testing stray light resistance of a star sensor according to claim 6, wherein the mechanical movement device comprises an electrically controlled turntable, an electrically controlled displacement table and a horizontal plate with a pulley support, the electrically controlled turntable is disposed on the carrying table of the optical platform, the horizontal plate is disposed on the electrically controlled turntable, the electrically controlled displacement table is disposed on the horizontal plate, and the electrically controlled turntable is configured to drive the horizontal plate to rotate around the center of the electrically controlled turntable.
8. The star sensor stray light resistance verification and testing system of claim 7 wherein,
the electrically controlled displacement table comprises: a first two-dimensional electric control displacement table and a second two-dimensional electric control displacement table;
the first two-dimensional electric control displacement table is arranged on the horizontal flat plate and is close to the electric control rotary table;
the second two-dimensional electric control displacement table is arranged on the horizontal flat plate and is close to the first two-dimensional electric control displacement table;
the first two-dimensional electric control displacement table is used for providing a bearing foundation for the target to be measured and driving the target to be measured to adjust in the front-back direction and the up-down direction;
the second two-dimensional electric control displacement platform is used for providing a bearing foundation for the integrating sphere and the low-light-level camera and moving the integrating sphere or the low-light-level camera in the front-back direction and the left-right direction.
9. The star sensor stray light resistance verification and testing system of claim 8 wherein,
the light beam shaping system is arranged at a light beam outlet of a solar simulator, and is used for shaping the quasi-parallel irradiation light beam output by the solar simulator into the irradiation light beam matched with the dimension of a light inlet of the star sensor light shield through parameter matching with the solar simulator;
the optical chopper is arranged at an outlet of the light beam shaping system, and modulates the irradiation light beam output by the light beam shaping system into an alternating signal by performing parameter matching with the light beam shaping system.
10. The star sensor stray light resistance verification and test system of claim 9, further comprising: and the test computer is used for operating the stray light test and analysis software and calculating the stray light inhibition performance evaluation index in real time according to the gray level image.
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