CN112729647A - 一种x射线衍射全谱多峰拟合模式的多晶材料残余应力测量方法 - Google Patents
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Abstract
本发明提出一种X射线衍射全谱多峰拟合模式的多晶材料残余应力测量方法,利用材料的一张X射线衍射全谱谱线,采用多峰拟合模式,考虑了多晶体晶粒取向的基础上,获得多晶体材料平面应变,在此基础上结合多晶体材料应力应变关系,最终计算出多晶体材料残余应力值。本发明在计算材料应变过程中采用多个衍射峰信息,考虑了多晶体材料晶粒取向,避免了由于多晶体材料的择优取向对传统X射线衍射应力分析方法的影响,为多晶体材料残余应力测量提供了一种方便快捷的方法。
Description
技术领域
本发明涉及分析测试技术领域,尤其涉及一种X射线衍射全谱多峰拟合模式的多晶材料残余应力测量方法。
背景技术
在材料生产、处理或加工过程中,由于材料的局部区域变形的不均匀性从而在材料中产生了残余应力。适当的残余应力分布可以成为有利因素提高材料的性能。例如通过喷丸强化技术,在金属工件表面形成残余压应力场,可有效提高工件的使用寿命。因此,为了更好地利用残余应力优化材料性能,就需要检测和控制材料在生产中各个工序的残余应力。
X射线衍射技术,理论基础比较严谨,实验技术日渐完善,无需破坏试样是目前残余应力分析的有效方法之一。然而该方法在测量残余应力时,需要设置不同的测量倾斜角,同时对测试材料也有一定的限制。例如当多晶材料中存在织构时,传统方法就很难实现。
经对现有技术文献的检索发现,M.Guagliano等人在《Engineering FailureAnalysis,2002,Vol.9,No.2,pp147-158》(工程失效分析,2002年,9卷,第2期,第147-158页)发表了“Contact fatigue failure analysis ofshot-peened gears”论文,研究了残余应力对齿轮疲劳寿命的影响,指出残余应力值是分析齿轮强化效果的一个重要指标。P.J.Withers等人在《Materials Science andTechnology,2001,Vol.17,No.4,pp355-365》(材料科学与技术,2001年,17卷,第4期,第355-365页)上发表了“Overview-Residualstress Part 1-Measurmenttechniques”论文,总结了X射线衍射法测量残余应力的方法以及不足,如果材料中存在织构,传统X射线衍射法测量残余应力的结果将会产生较大误差。
发明内容
本发明的目的在于提出一种残余应力测量经过精准的测量方法。
为达到上述目的,本发明提出一种X射线衍射全谱多峰拟合模式的多晶材料残余应力测量方法,包括以下步骤:
A、利用X射线衍射仪获取多晶材料样品的X射线衍射全谱;
B、建立多晶材料样品的应力-应变表达关系式,
所述应力-应变关系表达式为:
式中,σx为沿样品坐标系X轴的应力、σy为沿样品坐标系Y轴的应力,C11、C12、C13、C33为材料的弹性系数,εz为沿样品坐标系Z轴的应变;
C、利用X射线衍射全谱求解应变值εz;
求解表达式为:
式中,m为晶粒取向数,ν(hxkxlx)为晶粒取向是(hx kx lx)的晶粒体积分数;
D、利用衍射全谱以及多晶材料的弹性系数求解残余应力;
将应变值εz结合多晶材料的弹性系数代入表达式(3)中求解,得到多晶材料的残余应力。
进一步的,利用单张X射线衍射谱线以及多晶材料的弹性系数,结合建立的多晶材料应力应变表达式求解出材料残余应力值
与现有技术相比,本发明的优势之处在于:本发明基于X射线衍射全谱的多晶材料残余应力测量方法,考虑了多晶体材料的不同晶粒取向,有效的避免了多晶体的择优取向对传统X射线应力测量方法的影响。同时该方法仅需一张X射线衍射图谱,通过计算即可获得残余应力值,十分方便。
附图说明
图1为本发明实施例中多晶材料样品的X射线衍射几何示意图。
图2为本发明实施例中多晶材料的衍射全谱。
图3为本发明实施例多晶材料采用不同喷丸强度处理后的残余应力值。
具体实施方式
为使本发明的目的、技术方案和优点更加清楚,下面将对本发明的技术方案作进一步地说明。
本发明提出一种X射线衍射全谱多峰拟合模式的多晶材料残余应力测量方法,其具体步骤、工作过程和原理如下:
1、利用X射线衍射仪获取多晶体材料的X射线衍射全谱
对于多晶材料,当X射线照射在多晶材料表面时,如果衍射角与衍射晶面符合布拉格衍射方程时,相应的衍射峰就会出现加强。多晶材料的衍射几何如图1所示。
2、建立多晶材料的应力-应变表达关系式
其原理是,设立样品坐标系,让X轴、Y轴位于样品表面互相垂直,Z轴平行于样品表面法线方向。对于横向各向同性材料其沿样品坐标系中的应力与应变关系可以表示为:
σx=C11εx+C12εy+C13εz
σy=C12εx+C11εy+C13εz
σz=C13εx+C13εy+C33εz (1)
式中,σx、σy、σz为应力,C11、C12、C13、C33为材料弹性系数,εx、εy、εz为沿样品坐标系的应变,当表面为二维应力时,σz=0,在此边界条件下应力-应变关系表达式为:
当表面应力各向同性时,σx=σy,上式可以简化为:
3、利用X射线衍射全谱求解应变值εz
在多晶材料中,如果存在m种晶粒取向,则沿样品表面法线Z轴的应变可以表示为每种取向晶粒沿Z轴的应变与该种取向体积分数乘积之和,具体表达式为:
4、利用衍射全谱以及多晶材料的弹性系数求解残余应力
对获得的X射线衍射谱线采用公式(4)计算出样品沿Z轴的应变值εz,然后结合材料弹性系数代入公式(3)中求解样品残余应力。
具体实施例如下:
多晶材料样品为304奥氏体不锈钢,样品尺寸为20mm×20mm×5mm,分为三组。利用气动喷丸机及的高强度钢丝切丸,对样品表面进行喷丸强化处理,三组喷丸强度(以A型Almen试片弧高值表示)分别为:0.30mm,0.35mm,0.40mm。
材料X射线衍射全谱测量参数设置
如图1所示,在试验中具体的X射线衍射仪测量参数为管电压:40kV,管电流:30mA,Cu-Kα辐射,扫描速度2°/min,扫描步幅为0.01°,设置扫描范围为35°-100°。
利用X射线衍射仪获取304奥氏体不锈钢不同喷丸强度的X射线衍射谱线。
采用衍射仪(Rigaku UltimaⅣ),依照式(2)中的测试参数,获得不同喷丸强度的X射线衍射全谱,具体见图2。
利用衍射全谱数据以及304奥氏体不锈钢弹性系数,计算其残余应力值。
对X射线衍射谱线按照式(4)-式(6)计算沿Z轴应变,结合304奥氏体不锈钢弹性系数,代入式(3)中计算出不同喷丸强度下的残余应力值,结果见图3。
测量结果表明,利用X射线衍射全谱结合多峰拟合分析多晶体材料残余应力结果与报道的传统方法结果基本吻合。该方法理论清晰,仅需一张X射线衍射图谱即可计算出残余应力值,且考虑了多晶体材料中不同晶粒取向,能确保X射线应力测定结果的可靠性
上述仅为本发明的优选实施例而已,并不对本发明起到任何限制作用。任何所属技术领域的技术人员,在不脱离本发明的技术方案的范围内,对本发明揭露的技术方案和技术内容做任何形式的等同替换或修改等变动,均属未脱离本发明的技术方案的内容,仍属于本发明的保护范围之内。
Claims (2)
1.一种X射线衍射全谱多峰拟合模式的多晶材料残余应力测量方法,其特征在于,包括以下步骤:
A、利用X射线衍射仪获取多晶材料样品的X射线衍射全谱;
B、建立多晶材料样品的应力-应变表达关系式,
所述应力-应变关系表达式为:
式中,σx为沿样品坐标系X轴的应力、σy为沿样品坐标系Y轴的应力,C11、C12、C13、C33为材料的弹性系数,εz为沿样品坐标系Z轴的应变;
C、利用X射线衍射全谱求解应变值εz;
求解表达式为:
D、利用衍射全谱以及多晶材料的弹性系数求解残余应力;
将应变值εz结合多晶材料的弹性系数代入表达式(3)中求解,得到多晶材料的残余应力。
2.如权利要求1所述的基于X射线衍射全谱的多晶材料残余应力测量方法,其特征在于:利用单张X射线衍射谱线以及多晶材料的弹性系数,结合建立的多晶材料应力应变表达式求解出材料残余应力值。
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CN1793872A (zh) * | 2005-12-29 | 2006-06-28 | 哈尔滨工业大学 | 微小区域残余应力的无损检测方法 |
CN104034744A (zh) * | 2014-06-03 | 2014-09-10 | 杭州电子科技大学 | 一种x射线衍射测量热解炭涂层残余应力的方法 |
CN105021331A (zh) * | 2014-04-29 | 2015-11-04 | 上海理工大学 | 基于x射线衍射全谱的多晶材料残余应力测量方法 |
CN111089670A (zh) * | 2018-10-24 | 2020-05-01 | 中国石油化工股份有限公司 | 一种快速检测高分子材料制品残余主应力的方法 |
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CN1793872A (zh) * | 2005-12-29 | 2006-06-28 | 哈尔滨工业大学 | 微小区域残余应力的无损检测方法 |
CN105021331A (zh) * | 2014-04-29 | 2015-11-04 | 上海理工大学 | 基于x射线衍射全谱的多晶材料残余应力测量方法 |
CN104034744A (zh) * | 2014-06-03 | 2014-09-10 | 杭州电子科技大学 | 一种x射线衍射测量热解炭涂层残余应力的方法 |
CN111089670A (zh) * | 2018-10-24 | 2020-05-01 | 中国石油化工股份有限公司 | 一种快速检测高分子材料制品残余主应力的方法 |
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