CN112710946A - Socket testing device for Beidou navigation chip - Google Patents
Socket testing device for Beidou navigation chip Download PDFInfo
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- CN112710946A CN112710946A CN202011493860.5A CN202011493860A CN112710946A CN 112710946 A CN112710946 A CN 112710946A CN 202011493860 A CN202011493860 A CN 202011493860A CN 112710946 A CN112710946 A CN 112710946A
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- socket
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- beidou navigation
- chip
- testing device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a socket testing device for a Beidou navigation chip, and belongs to the technical field of socket testing devices. The utility model provides a socket testing arrangement for big dipper navigation chip, including the test main part, test main part left side lower extreme is equipped with the regulating box, the carousel upside is annular equidistant and is equipped with a plurality of fixed blocks, splint inboard clamp is equipped with the socket that awaits measuring, breach disc circumference outer wall one side is equipped with the rocking arm, the hemisphere sheave has been cup jointed at the pivot middle part, hemisphere sheave upside circumference outer wall is annular equidistant and has seted up a plurality of arcs, arc and breach disc sliding connection, between the structure closely cooperate, make it can carry out indirect test to a plurality of chip sockets, the effectual condition of having avoided testing at every turn that a socket changes one again, thereby the efficiency of chip socket test has been improved, staff's burden has been alleviateed, the condition that leads to the fact chip socket to damage has been avoided changing repeatedly simultaneously, the cost has effectively been.
Description
Technical Field
The invention relates to the technical field of socket testing devices, in particular to a socket testing device for a Beidou navigation chip.
Background
With the progress and development of technology, the development of chips is rapid, and the chips are also called microcircuits (microcircuits), microchips (microchips), and Integrated Circuits (ICs). Refers to a silicon chip containing integrated circuits, which is small in size and is often part of a computer or other electronic device. A chip generally refers to a carrier for an integrated circuit, and is the result of the integrated circuit after design, fabrication, packaging, and testing, and is usually a stand-alone entity that can be used immediately.
In recent years, along with the rapid development and the application of china's satellite navigation positioning technique, big dipper chip is as the basis and the core of satellite navigation positioning technique, big dipper chip has contained the RF radio frequency chip, baseband chip and microprocessor's chipset, relevant equipment passes through big dipper chip, can accept the signal by big dipper satellite transmission, thereby accomplish the function of location navigation, different fields are to big and big to big dipper chip demand, in order to guarantee the function and the performance of big dipper chip, big dipper chip test before dispatching from the factory is indispensable, so a big dipper chip testing arrangement not only safe but also convenient operation seems especially important. The prior art publication No. CN111649928A provides a socket testing device for a beidou navigation chip, which has the following problems: 1. the device is provided with the chip socket male and female parts, and then the insertion test is carried out through alignment, so that the structure is extremely complex, the action significance is very small, the misalignment condition can occur, the chip socket male and female parts are directly damaged, the test cannot be finished, and the serious loss is caused; 2. the device just changes one chip socket after testing one chip socket each time, so that the efficiency is extremely low, and the requirements cannot be met; 3. after the device finishes testing the socket to be tested, the socket to be tested needs to be subjected to certain device adjustment, and the socket cannot be automatically retracted to the original position, so that the next socket to be tested is tested, the testing efficiency is reduced, and therefore the socket testing device for the Beidou navigation chip is provided.
Disclosure of Invention
1. Technical problem to be solved
The invention aims to provide a socket testing device for a Beidou navigation chip, which aims to solve the problems in the background technology.
2. Technical scheme
A socket testing device for a Beidou navigation chip comprises a testing main body, wherein a detection plug is arranged at the upper end of the left side of the testing main body, an adjusting box is arranged at the lower end of the left side of the testing main body, a turntable is arranged above the adjusting box, a plurality of fixed blocks are arranged on the upper side of the turntable at equal intervals in an annular shape, two clamping plates are symmetrically arranged inside the fixed blocks, sockets to be tested are clamped inside the clamping plates, two sleeves are arranged on the bottom surface of each fixed block in a diagonal structure, a telescopic rod is arranged on the upper side of each sleeve, the lower end of each telescopic rod penetrates through the upper wall of each sleeve to extend into the corresponding sleeve and is fixedly provided with a limiting plate, a spring A is arranged below each limiting plate, a crank is arranged at the rear end of the middle part of the left side of the adjusting box, the right end of, the rocking arm outside has set firmly spacing post, crank right side circumference outer wall has set firmly the pointer, the rotation of adjusting box internal intermediate position is connected with the pivot, the pivot upper end pass the adjusting box inner wall extend to the outside and with carousel bottom surface mid-connection is fixed, the hemisphere sheave has been cup jointed at the pivot middle part, adjusting box internal left side intermediate position has set firmly fixed ear, fixed ear upside rotates through round pin axle symmetry and is connected with two movable rods, is located the inboard the movable rod right-hand member has cup jointed the regulation post, it has cup jointed the regulating block to adjust post rear end, the regulating block top is equipped with the lever, lever left side upper end is equipped with the push rod, it is the equidistant a plurality of scale marks that are equipped with of annular to adjust box left side outer wall rear end.
Preferably, the outer side of the clamping plate is symmetrically provided with two springs B through sleeve columns, and the outer ends of the springs B are fixedly connected with the inner wall of a hole formed in the fixing block.
Preferably, the cam is in an arc structure with a large upper part and a small lower part, and the cam is tightly pressed with the movable rod positioned on the outer side.
Preferably, the outer wall of the circumference of the upper side of the hemispherical grooved wheel is provided with arc-shaped grooves at equal intervals in an annular shape, and the arc-shaped grooves are connected with the notch disc in a sliding manner.
Preferably, the limiting column is arranged in an inclined structure, and the limiting column is in sliding connection with strip-shaped grooves which are formed in the outer wall of the circumference of the upper side of the hemispherical grooved wheel at equal intervals in an annular mode.
Preferably, the upper part of the right side of the adjusting block is fixedly provided with a hinged support through the upper end and the lower end of the fixed rod, the hinged support at the lower end is rotatably connected with the right end of the adjusting block through a pin shaft, and the hinged support at the upper end is rotatably connected with the right side of the lever through a pin shaft.
Preferably, the right end of the lever is rotatably connected with a hole in the inner wall of the adjusting box through a pin shaft, a limiting groove is formed in the upper side of the right end of the lever, the inner wall of the limiting groove is rotatably connected with the lower end of the push rod through a pin shaft, and the upper end of the push rod sequentially penetrates through the inside of the adjusting box and the inside of the turntable, extends to the outside and is abutted against the bottom surface of the fixing block.
3. Advantageous effects
Compared with the prior art, the invention has the advantages that:
1. the invention has the advantages that the lower end of the left side of the testing main body is provided with the adjusting box, the upper side of the turntable is provided with a plurality of fixed blocks at equal intervals in an annular manner, the inner side of the clamping plate is clamped with the sockets to be tested, one side of the circumferential outer wall of the notched disc is provided with the rocker arm, the middle part of the rotating shaft is sleeved with the hemispherical groove wheel, the circumferential outer wall of the upper side of the hemispherical groove wheel is provided with the arc grooves at equal intervals in an annular manner, the arc grooves are connected with the notched disc in a sliding manner, the limiting column is connected with the strip grooves arranged at equal intervals in an annular manner on the circumferential outer wall of the upper side of the hemispherical groove wheel in a, therefore, the efficiency of testing the chip socket is improved, the burden of workers is reduced, the situation that the chip socket is damaged due to repeated replacement is avoided, and the cost is effectively saved.
2. According to the invention, the two movable rods are symmetrically and rotatably connected to the upper side of the fixed lug through the pin shaft, the right end of the movable rod positioned on the inner side is sleeved with the adjusting column, the lever is arranged above the adjusting block, the push rod is arranged at the upper end of the left side of the lever, the limiting groove is formed in the upper side of the right end of the lever, the inner wall of the limiting groove is rotatably connected with the lower end of the push rod through the pin shaft, and the upper end of the push rod sequentially penetrates through the inside of the adjusting box and the inside of the rotary table to extend to the outside and is abutted against the bottom surface of the fixed block, so that the chip socket can be automatically subjected to plug-in test with the detection plug through the.
3. According to the invention, the crank is arranged at the rear end of the middle part of the left side of the adjusting box, the right end of the crank penetrates through the outer wall of the adjusting box to extend into the adjusting box and is sleeved with the cam, the cam is of an arc structure with a large upper part and a small lower part, the cam is tightly pressed with the movable rod positioned on the outer side, and the cam is skillfully arranged, so that when the cam presses the movable rod downwards, the socket to be detected is pushed into the detection plug through the push rod and the lever principle of the lever to detect, the structure is simple, the functions are complete, the condition of each plugging is avoided, and manpower.
4. According to the invention, the two clamping plates are symmetrically arranged in the fixed block, the sockets to be tested are clamped on the inner sides of the clamping plates, the two sleeves are arranged on the bottom surface of the fixed block in a diagonal structure, the telescopic rods are arranged on the upper sides of the sleeves, the lower ends of the telescopic rods penetrate through the upper walls of the sleeves to extend to the inside and are fixedly provided with the limiting plates, the springs A are arranged below the limiting plates, and the sockets to be tested can automatically retract to the original positions after the sockets to be tested are tested, so that the next socket to be tested is tested, and the.
5. According to the invention, the pointer is fixedly arranged on the outer wall of the circumference of the right side of the crank, and the plurality of scale marks are annularly and equidistantly arranged at the rear end of the outer wall of the left side of the adjusting box, so that a worker can control the insertion test of the socket to be tested through the scales, and the next socket to be tested is tested by rotating to the corresponding scales.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a cross-sectional view of the overall structure of the present invention;
FIG. 3 is a sectional view of the inner structure of the adjustment box of the present invention;
figure 4 is a schematic view of a hemispherical sheave structure of the present invention;
FIG. 5 is an exploded view of the cam structure of the present invention;
FIG. 6 is an enlarged view of the structure at A of the present invention;
the reference numbers in the figures illustrate: 1. testing the subject; 2. detecting the plug; 3. an adjustment box; 301. a rotating shaft; 302. a hemispherical grooved wheel; 303. an arc-shaped slot; 304. a strip-shaped groove; 305. scale lines; 4. a turntable; 401. a sleeve; 402. a telescopic rod; 403. a limiting plate; 404. a spring A; 5. a fixed block; 501. a splint; 502. a spring B; 503. a socket to be tested; 6. a crank; 601. a cam; 602. a notched disc; 603. a rocker arm; 604. a limiting column; 605. a pointer; 7. fixing the ear; 701. a movable rod; 702. an adjustment column; 703. an adjusting block; 704. a lever; 705. hinging seat; 706. a push rod; 707. a limiting groove.
Detailed Description
In the description of the present invention, it is to be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", and the like, indicate orientations and positional relationships based on those shown in the drawings, and are used only for convenience of description and simplicity of description, and do not indicate or imply that the equipment or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus, should not be considered as limiting the present invention.
In the description of the present invention, "a plurality" means two or more unless specifically defined otherwise.
In the description of the present invention, it should be noted that, unless otherwise explicitly specified or limited, the terms "mounted," "disposed," "sleeved/connected," "connected," and the like are to be construed broadly, e.g., "connected," which may be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Referring to fig. 1-6, the present invention provides a technical solution:
a socket testing device for a Beidou navigation chip comprises a testing main body 1, a detection plug 2 is arranged at the upper end of the left side of the testing main body 1, an adjusting box 3 is arranged at the lower end of the left side of the testing main body 1, a rotary disc 4 is arranged above the adjusting box 3, a plurality of fixed blocks 5 are arranged on the upper side of the rotary disc 4 at equal intervals in an annular shape, two clamping plates 501 are symmetrically arranged inside the fixed blocks 5, a socket 503 to be tested is clamped inside the clamping plates 501, two sleeves 401 are arranged on the bottom surfaces of the fixed blocks 5 in a diagonal structure, telescopic rods 402 are arranged on the upper sides of the sleeves 401, the lower ends of the telescopic rods 402 penetrate through the upper wall of the sleeves 401 to extend into the interior and are fixedly provided with limiting plates 403, springs A404 are arranged below the limiting plates 403, a crank 6 is arranged at the rear end of the middle part of the left side of the adjusting box 3, the rocking arm 603 outside has set firmly spacing post 604, 6 right side circumference outer walls of crank have set firmly pointer 605, the inside intermediate position of regulating box 3 rotates and is connected with pivot 301, pivot 301 upper end is passed the 3 inner walls of regulating box and is extended to the outside and is connected fixedly with 4 bottom surfaces middle parts of carousel, hemisphere sheave 302 has been cup jointed at pivot 301 middle part, the inside left side intermediate position of regulating box 3 has set firmly fixed ear 7, fixed ear 7 upside is rotated through the round pin axle symmetry and is connected with two movable rods 701, the movable rod 701 right-hand member that is located the inboard has cup jointed regulating post 702, the regulating post 702 rear end has cup jointed regulating block 703, regulating block 703 top is equipped with lever 704, lever 704 left side upper end is equipped with push rod 706, regulating box 3 left side outer wall rear end is the equidistant a plurality of scale. Closely cooperate between the structure, make it can carry out indirect test to a plurality of sockets 503 that await measuring, effectually avoided having tested a socket at every turn and having changed the condition of one again to improve the efficiency of socket 503 test that awaits measuring, alleviateed staff's burden, avoided changing the condition that causes socket 503 to await measuring to damage repeatedly simultaneously, effectively must practiced thrift the cost.
Specifically, the outer side of the clamping plate 501 is symmetrically provided with two springs B502 through sleeve columns, and the outer ends of the springs B502 are fixedly connected with the inner wall of a hole formed in the fixing block 5. So that the socket 503 to be tested can be effectively clamped and limited.
Further, the cam 601 is an arc structure with a large top and a small bottom, and the cam 601 is tightly pressed with the movable rod 701 located at the outer side. Cam 601's ingenious setting for when cam 601 pushed down the movable rod, through lever 704's lever principle and push away the socket 503 that awaits measuring through push rod 706 and detect in detecting plug 2, simple structure, and it is multiple functional, avoided the condition of pegging graft at every turn, the effectual manpower and materials of having practiced thrift.
Still further, the outer wall of the circumference of the upper side of the hemispherical grooved wheel 302 is provided with arc-shaped grooves 303 at equal intervals, and the arc-shaped grooves 303 are connected with the notched disc 602 in a sliding manner. The socket 503 to be tested can be accurately rotated to the lower part of the detection plug 2 for testing, so that accurate plugging is realized, and the damage caused by inaccurate plugging is avoided.
Furthermore, the limiting column 604 is disposed in an inclined structure, and the limiting column 604 is slidably connected to the strip-shaped groove 304 formed on the outer wall of the upper circumference of the hemispherical grooved wheel 302 at equal intervals in an annular shape. The socket 503 to be tested can be indirectly tested, the situation that one socket is replaced after each test is effectively avoided, the testing efficiency of the socket 503 to be tested is improved, the burden of workers is reduced, the situation that the socket 503 to be tested is damaged due to repeated replacement is avoided, and the cost is effectively saved.
It should be noted that the upper part of the right side of the adjusting block 703 is fixedly provided with a hinged support 705 through the upper and lower ends of the fixing rod, the hinged support 705 at the lower end is rotatably connected with the right end of the adjusting block 703 through a pin shaft, and the hinged support 705 at the upper end is rotatably connected with the right side of the lever 704 through a pin shaft. The hinged support 705 is designed to form a lever principle, and the socket 503 to be tested is pushed into the test plug 2 for testing through the lever principle of the lever 704 and the push rod 706, so that the condition of each plugging is avoided.
It is worth noting that the right end of the lever 704 is rotatably connected with a hole in the inner wall of the adjusting box 3 through a pin shaft, a limiting groove 707 is formed in the upper side of the right end of the lever 704, the inner wall of the limiting groove 707 is rotatably connected with the lower end of the push rod 706 through a pin shaft, and the upper end of the push rod 706 sequentially penetrates through the inside of the adjusting box 3 and the inside of the rotating disc 4 to extend to the outside and is abutted against the bottom surface of the. When the socket 503 to be tested rotates to the position right below the detection plug 2, the socket 503 to be tested can be automatically pushed by the push rod 706 to be tested to be plugged with the detection plug 2, so that accurate plugging is realized, and the condition that the plugging is inaccurate and the damage is caused is avoided.
The working principle is as follows: when the socket testing device of the Beidou navigation chip is required to test, firstly, two springs B502 are symmetrically arranged on the outer side of a clamping plate 501 through sleeve columns, the outer ends of the springs B502 are fixedly connected with the inner wall of a hole formed in a fixed block 5, so that the socket 503 to be tested can be effectively clamped and limited, a crank 6 is rotated, a notched disc 602 is sleeved at the right end of the crank 6, a rocker arm 603 is arranged on one side of the circumferential outer wall of the notched disc 602, a limiting column 604 is fixedly arranged on the outer side of the rocker arm 603, the limiting column 604 is arranged in an inclined structure, the limiting column 604 is in sliding connection with a strip-shaped groove 304 formed in the circumferential outer wall on the upper side of a hemispherical grooved wheel 302 in an annular equal interval manner, a plurality of arc-shaped grooves 303 are formed in the circumferential outer wall on the upper side of the hemispherical grooved wheel 302 in an annular equal interval manner, the arc-, the test is carried out, the accurate insertion is realized, the damage caused by inaccurate insertion is avoided, the socket 503 to be tested can be indirectly tested by rotating and converting different sockets 503 to be tested, the situation that one socket is replaced after each test is effectively avoided, the test efficiency of the socket 503 to be tested is improved, the burden of workers is lightened, the damage caused by repeated replacement of the socket 503 to be tested is avoided, the cost is effectively saved, meanwhile, because the right end of the crank 6 passes through the outer wall of the adjusting box 3 to extend to the inside and is sleeved with the cam 601, the cam 601 is of an arc structure with a large upper end and a small lower end, the cam 601 is tightly pressed with the movable rod 701 positioned at the outer side, and the ingenious arrangement of the cam 601 ensures that when the cam 601 presses the movable rod downwards, because the hinge base 705 is fixedly arranged at the upper part and the lower part of the fixed rod above the right side of the adjusting block, the hinge base 705 positioned at the lower, the hinged support 705 at the upper end is rotatably connected with the right side of the lever 704 through a pin shaft, the right end of the lever 704 is rotatably connected with a hole on the inner wall of the adjusting box 3 through a pin shaft, the upper side of the right end of the lever 704 is provided with a limit groove 707, the inner wall of the limit groove 707 is rotatably connected with the lower end of the push rod 706 through a pin shaft, the upper end of the push rod 706 sequentially penetrates through the inside of the adjusting box 3 and the inside of the turntable 4 to extend to the outside and is abutted against the bottom surface of the fixed block 5, the socket 503 to be detected is rotated to the right below the detection plug 2, simultaneously, the lever principle is formed through the design of the hinged support 705, the socket 503 to be detected is pushed into the detection plug 2 through the push rod 706 through the lever principle of the lever 704 to be detected, the condition of each time of plugging is avoided, the pointer is fixedly arranged on the outer wall of the right side circumference of, and the next socket to be tested is detected by rotating to the corresponding scale.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, and the preferred embodiments of the present invention are described in the above embodiments and the description, and are not intended to limit the present invention. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (7)
1. The utility model provides a socket testing arrangement for beidou navigation chip, includes test main part (1), its characterized in that: the test device is characterized in that a detection plug (2) is arranged at the upper end of the left side of the test main body (1), an adjusting box (3) is arranged at the lower end of the left side of the test main body (1), a turntable (4) is arranged above the adjusting box (3), a plurality of fixing blocks (5) are arranged on the upper side of the turntable (4) at equal intervals in an annular mode, two clamping plates (501) are symmetrically arranged inside the fixing blocks (5), a socket (503) to be tested is arranged on the inner side of each clamping plate (501), two sleeves (401) are arranged on the bottom surface of each fixing block (5) in a diagonal structure mode, a telescopic rod (402) is arranged on the upper side of each sleeve (401), the lower end of each telescopic rod (402) penetrates through the upper wall of each sleeve (401) to extend to the inside of each clamping plate and is fixedly provided with a limiting plate (403), a spring A (404) is arranged below each limiting plate (403), a crank, the right end of the crank (6) is sleeved with a notched disc (602), one side of the circumferential outer wall of the notched disc (602) is provided with a rocker arm (603), the outer side of the rocker arm (603) is fixedly provided with a limiting column (604), the circumferential outer wall of the right side of the crank (6) is fixedly provided with a pointer (605), the middle position inside the adjusting box (3) is rotatably connected with a rotating shaft (301), the upper end of the rotating shaft (301) penetrates through the inner wall of the adjusting box (3) to extend to the outside and is fixedly connected with the middle part of the bottom surface of the turntable (4), the middle part of the rotating shaft (301) is sleeved with a hemispherical grooved pulley (302), the middle position on the left side inside the adjusting box (3) is fixedly provided with a fixing lug (7), the upper side of the fixing lug (7) is symmetrically and rotatably connected with two movable rods (701) through a pin shaft, the right end of the movable rod (701), the adjusting block (703) top is equipped with lever (704), lever (704) left side upper end is equipped with push rod (706), it is annular equidistant a plurality of scale marks (305) to adjust box (3) left side outer wall rear end.
2. The socket testing device for the Beidou navigation chip according to claim 1, is characterized in that: the outer side of the clamping plate (501) is symmetrically provided with two springs B (502) through sleeve columns, and the outer ends of the springs B (502) are fixedly connected with the inner wall of a hole formed in the fixing block (5).
3. The socket testing device for the Beidou navigation chip according to claim 1, is characterized in that: the cam (601) is in an arc structure with a large upper part and a small lower part, and the cam (601) is tightly pressed with the movable rod (701) positioned on the outer side.
4. The socket testing device for the Beidou navigation chip according to claim 1, is characterized in that: the outer wall of the circumference of the upper side of the hemispherical grooved wheel (302) is provided with arc-shaped grooves (303) at equal intervals in an annular shape, and the arc-shaped grooves (303) are connected with the notch disc (602) in a sliding manner.
5. The socket testing device for the Beidou navigation chip according to claim 1, is characterized in that: the limiting column (604) is arranged in an inclined structure, and the limiting column (604) is in sliding connection with strip-shaped grooves (304) which are formed in the outer wall of the circumference of the upper side of the hemispherical grooved wheel (302) at equal intervals in an annular mode.
6. The socket testing device for the Beidou navigation chip according to claim 1, is characterized in that: the upper part of the right side of the adjusting block (703) is fixedly provided with a hinged support (705) through the upper end and the lower end of a fixed rod, the hinged support (705) at the lower end is rotatably connected with the right end of the adjusting block (703) through a pin shaft, and the hinged support (705) at the upper end is rotatably connected with the right side of the lever (704) through a pin shaft.
7. The socket testing device for the Beidou navigation chip according to claim 1, is characterized in that: the right end of the lever (704) is rotatably connected with a hole in the inner wall of the adjusting box (3) through a pin shaft, a limiting groove (707) is formed in the upper side of the right end of the lever (704), the inner wall of the limiting groove (707) is rotatably connected with the lower end of the push rod (706) through a pin shaft, and the upper end of the push rod (706) sequentially penetrates through the inside of the adjusting box (3) and the inside of the turntable (4) to extend to the outside and is abutted to the bottom surface of the fixing block (5).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN202011493860.5A CN112710946A (en) | 2020-12-17 | 2020-12-17 | Socket testing device for Beidou navigation chip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN202011493860.5A CN112710946A (en) | 2020-12-17 | 2020-12-17 | Socket testing device for Beidou navigation chip |
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CN112710946A true CN112710946A (en) | 2021-04-27 |
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Application Number | Title | Priority Date | Filing Date |
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CN202011493860.5A Withdrawn CN112710946A (en) | 2020-12-17 | 2020-12-17 | Socket testing device for Beidou navigation chip |
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CN (1) | CN112710946A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114843864A (en) * | 2022-04-19 | 2022-08-02 | 珠海市精实测控技术有限公司 | Three-plug module integrated mechanism and application thereof |
CN117092492A (en) * | 2023-10-18 | 2023-11-21 | 深圳市芯盛智能信息有限公司 | Component plugging assembly for Beidou navigation chip |
-
2020
- 2020-12-17 CN CN202011493860.5A patent/CN112710946A/en not_active Withdrawn
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114843864A (en) * | 2022-04-19 | 2022-08-02 | 珠海市精实测控技术有限公司 | Three-plug module integrated mechanism and application thereof |
CN117092492A (en) * | 2023-10-18 | 2023-11-21 | 深圳市芯盛智能信息有限公司 | Component plugging assembly for Beidou navigation chip |
CN117092492B (en) * | 2023-10-18 | 2024-01-09 | 深圳市芯盛智能信息有限公司 | Component plugging assembly for Beidou navigation chip |
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Application publication date: 20210427 |