CN112710390A - Resolution-adjustable off-axis four-counter-rotation zoom imaging spectrometer - Google Patents
Resolution-adjustable off-axis four-counter-rotation zoom imaging spectrometer Download PDFInfo
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- CN112710390A CN112710390A CN202011415060.1A CN202011415060A CN112710390A CN 112710390 A CN112710390 A CN 112710390A CN 202011415060 A CN202011415060 A CN 202011415060A CN 112710390 A CN112710390 A CN 112710390A
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- 238000010183 spectrum analysis Methods 0.000 abstract description 3
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- 238000001514 detection method Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
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- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0237—Adjustable, e.g. focussing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2823—Imaging spectrometer
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
- G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
- G02B17/0647—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors
- G02B17/0663—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror using more than three curved mirrors off-axis or unobscured systems in which not all of the mirrors share a common axis of rotational symmetry, e.g. at least one of the mirrors is warped, tilted or decentered with respect to the other elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/08—Mirrors
- G02B5/0808—Mirrors having a single reflecting layer
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
- G02B7/18—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors
- G02B7/182—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors
- G02B7/1821—Mountings, adjusting means, or light-tight connections, for optical elements for prisms; for mirrors for mirrors for rotating or oscillating mirrors
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- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The invention discloses an off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution, which comprises an incident slit, a main reflector, a secondary reflector, a third reflector, a fourth reflector and a detector, wherein the incident slit is provided with a first reflecting surface and a second reflecting surface; the incident slit emits light and is positioned at the focal point of the main reflector; the main reflector reflects the light from the incident slit into parallel light; the secondary reflector is a cylindrical surface or a toroidal surface mirror, is arranged on the reflected light path of the main reflector and reflects the light rays from the main reflector for the second time; the third reflector is a cylindrical surface or a toroidal surface mirror, is arranged on the reflecting light path of the secondary reflector and reflects the reflecting light from the secondary reflector again; the fourth reflector is arranged on a reflection light path of the third reflector and reflects and focuses the reflection light from the third reflector again; the detector is arranged on a reflected light path of the fourth reflecting mirror and used for receiving the fourth reflected light and imaging; the invention can realize object imaging and spectral analysis with adjustable spatial resolution and spectral resolution.
Description
Technical Field
The invention belongs to the technical field of spectral imaging instruments, and particularly relates to an off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution.
Background
In the fields of space remote sensing detection and the like, the imaging spectrometer has very wide application prospect due to the functions of object imaging and spectral measurement. Most of existing push-broom imaging spectrometers adopt a transmission type structure, the system is large in size and large in element number, actual spectral measurement range is narrow due to material limitation, and the resolution of each waveband is a fixed value, so that spectral resolution and spatial resolution cannot be adjusted according to detection requirements. The reflective system contributes to a more compact structure due to its characteristic of not introducing chromatic aberration. The off-axis reflection structure is introduced into the design of the imaging spectrometer, so that the spectral measurement range can be effectively expanded, the problem of light blocking in the on-axis reflection system is avoided, and the compactness of the system structure is improved.
The existing reflection type mechanical zoom optical system needs to mechanically move a plurality of reflectors to realize the modulation of the focal length of the system, has higher difficulty in controlling the space volume and is not beneficial to improving the compactness of the system structure; the existing reflection type active zooming optical system utilizes active optical devices such as a deformable mirror and the like to realize the modulation of the focal length of the system, and because the aperture of the active optical element and the deformation are limited, the larger zoom ratio is difficult to realize, and the system cost is higher.
The surface types such as the cylindrical surface, the X toroidal surface, the Y toroidal surface and the like have non-rotational symmetry and are commonly used for correcting non-rotational symmetric aberration, and the modulation change of the focal length in a specific direction can be realized by rotating the combined lens of the surface types.
Disclosure of Invention
In view of this, the invention provides an off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution, which can realize object imaging and spectral analysis with adjustable spatial resolution and spectral resolution.
The technical scheme for realizing the invention is as follows:
an off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution comprises an incident slit, a main reflector, a secondary reflector, a third reflector, a fourth reflector and a detector;
the incident slit emits light and is positioned at the focal point of the main reflector;
the main reflecting mirror is used for reflecting the light rays from the incident slit into parallel light to form first reflected light;
the secondary reflector is a cylindrical surface or a toroidal surface mirror, is arranged on the reflection light path of the main reflector and is used for secondarily reflecting the light rays from the main reflector to form second reflection light;
the third reflector is a cylindrical surface or a toroidal surface mirror, is arranged on the reflecting light path of the secondary reflector and is used for reflecting the reflecting light from the secondary reflector again to form third reflecting light;
the fourth reflector is arranged on the reflection light path of the third reflector and used for reflecting and focusing the reflection light from the third reflector again to form fourth reflection light;
the detector is arranged on a reflected light path of the fourth reflector and used for receiving the fourth reflected light and imaging;
the secondary reflector and the third reflector form a zooming subsystem, the secondary reflector and the third reflector synchronously rotate for a set angle a, the zooming ratio of the focal length of the zooming subsystem is b times, and the numerical value of the zooming ratio is related to the parameter settings of the secondary reflector and the third reflector.
Furthermore, the main reflecting mirror is a diffraction grating, and the scribing direction of the diffraction grating is parallel to the slit direction and is used for dispersing the reflected light.
Further, the surface of the main reflector is an 8-order aspheric surface.
Further, the surface type of the fourth reflector is a free-form surface.
Furthermore, the reflecting surfaces of the main reflector, the secondary reflector, the third reflector and the fourth reflector are all plated with gold film reflection increasing films.
Has the advantages that:
1) compared with the prior art, the secondary reflector and the third reflector of the off-axis four-counter-rotation zooming imaging spectrometer are arranged into the cylindrical surface/the toroidal surface, the focal length is modulated through the combined rotation of the cylindrical surface/the toroidal surface, the functions of object imaging and spectrum analysis with adjustable spatial resolution and spectral resolution can be realized without moving, the system volume is reduced, and the cost is reduced.
2) Compared with the existing spectrometer, the off-axis reflection rotation zooming structure is integrated into the spectrometer structure, and the free-form surface is arranged, so that the degree of freedom of the system is increased, the large view field and high imaging quality can be realized, the number of elements is small, the internal structure is compact, and the volume and the quality of the system are favorably reduced.
3) Compared with the prior art, the system has no large displacement device inside, only needs to rotate the secondary reflector and the third reflector, has compact structure, small element number, small volume, light weight and low cost, and is suitable for being applied to space remote sensing detection equipment.
Drawings
Fig. 1 is a schematic diagram of an initial state (low spectral resolution) optical path structure of an off-axis four-mirror rotation zoom imaging spectrometer with adjustable resolution according to an embodiment of the present invention.
Fig. 2 is a schematic structural diagram of an optical path of an off-axis four-mirror rotation zoom imaging spectrometer with adjustable resolution in a state of rotating 90 ° (high spectral resolution) according to an embodiment of the present invention.
The device comprises an incident slit 00, a main reflector 01, a secondary reflector 02, a third reflector 03, a fourth reflector 04 and a detector 05.
Detailed Description
The invention is described in detail below by way of example with reference to the accompanying drawings.
The invention provides an off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution, which comprises an incidence slit 00, a main reflector 01, a secondary reflector 02, a third reflector 03, a fourth reflector 04 and a detector 05, wherein the incidence slit 00 is provided with a plurality of optical lenses;
the system is located in a global spatial coordinate system (x, y, z);
the entrance slit 00 is an object of the whole system, can sample an object in space and emit light, and the slit direction is parallel to the x axis and vertical to the y axis;
the curvature radius of the main reflecting mirror 01 is 200mm, the main reflecting mirror 01 is used for reflecting light from the incident slit 00 to form first reflected light, and meanwhile, the main reflecting mirror 01 is a diffraction grating, the scribing direction of the diffraction grating is parallel to the slit direction, so that the light is dispersed;
the secondary reflector 02 is arranged on a reflection light path of the main reflector 01, has a curvature radius of 200mm and a rotation radius of 400mm, and is used for reflecting light rays from the main reflector 01 for the second time to form second reflection light;
the third reflector 03 with the curvature radius of 100mm and the rotation radius of 200mm is arranged on the light reflecting path of the secondary reflector 02 and used for reflecting the reflected light from the secondary reflector 02 again to form third reflected light;
the fourth reflecting mirror 04 is provided with a curvature radius of 100mm, is arranged on the reflection light path of the third reflecting mirror 03, and is used for reflecting and focusing the reflection light from the third reflecting mirror 03 again to form fourth reflection light;
the detector 05 is arranged on a reflection light path of the fourth reflecting mirror 04 and is used for receiving the fourth reflection light and imaging.
The spatial dimension direction of the spectrograph is the x axial direction, and the spectral dimension direction is the y axial direction;
the surface of the main reflector 01 is an 8-order aspheric surface;
the surface types of the secondary reflector 02 and the third reflector 03 are cylindrical surfaces/toroidal surfaces;
the surface of the fourth reflector 04 is a free-form surface;
the materials of the main reflector 01, the sub-reflector 02, the third reflector 03 and the fourth reflector 04 are not limited. The metal material such as aluminum, copper and the like and the inorganic non-metal material such as silicon dioxide and the like can be selected. In order to increase the reflectance of the main mirror 01, the sub-mirror 02, the third mirror 03, and the fourth mirror 04, a gold film reflection increasing film may be plated on the respective reflection surfaces.
The primary mirror 01 is a diffraction grating. The reticle density was 200lines/mm, the reticle direction was parallel to the entrance slit direction, and the diffraction order used was-1 order.
The aperture diaphragm of the resolution-adjustable off-axis three-inverse-zoom imaging spectrometer is a main reflector 01.
The spatial resolution zoom ratio of the resolution-adjustable off-axis three-inverse zoom imaging spectrometer is 2 times.
The spectrum resolution zoom ratio of the resolution-adjustable off-axis three-inverse-zoom imaging spectrometer is 2 times.
The working light path of the off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution is as follows:
light from an object is sampled by the incident slit 00, then enters the reflecting surface of the main reflecting mirror 01, is reflected by the reflecting surface of the main reflecting mirror 01 and is dispersed by the diffraction grating etched on the reflecting surface to form first dispersed reflected light, the first dispersed reflected light is parallel light, the first dispersed reflected light enters the reflecting surface of the secondary reflecting mirror 02 and is reflected by the secondary reflecting mirror 02 to form second reflected light, the second reflected light enters the reflecting surface of the third reflecting mirror 03 and is reflected by the third reflecting mirror 03 to form third reflected light, the third reflected light is parallel light, the third reflected light enters the reflecting surface of the fourth reflecting mirror 04 and is reflected by the fourth reflecting mirror 04 to form fourth reflected light, and the fourth reflected light is received by the detector 05 to form a spectrum image. The main reflector 01, the secondary reflector 02, the third reflector 03 and the fourth reflector 04 are all provided with a certain eccentric amount and a certain inclination amount, and are used for realizing an off-axis light path without blocking.
The zooming process of the resolution-adjustable off-axis four-counter-rotation zooming imaging spectrometer is as follows:
the secondary reflector 02, the third reflector 03 and the fourth reflector 04 constitute a focusing subsystem, and in an initial state shown in fig. 1, the y axial focal length of the focusing subsystem is 100mm, and the x axial focal length is 200 mm. In order to increase the system resolution, the spatial positions of the incident slit 00, the main reflector 01, the fourth reflector 04 and the detector 05 are unchanged, the secondary reflector 02 and the third reflector 03 rotate around the optical axis by 90 degrees at the same time, and relative rotation and spatial displacement do not occur between the two reflectors, as shown in fig. 2, at this time, the y-axial focal length of the focusing subsystem is switched to 200mm, and the x-axial focal length is switched to 100mm, so that the spectral resolution is 2 times. The magnification of the off-axis four-reverse rotation zoom imaging spectrometer is switched from 1:2 to 1:1 after zooming, so that the spatial resolution zoom ratio is 0.5 times.
Because the secondary reflector 02 and the third reflector 03 are non-rotational symmetric surfaces, a certain amount of non-rotational symmetric aberration is introduced, and the off-axis eccentricity and the inclination of the reflectors also generate rotational asymmetric aberration, the fourth reflector is a free-form surface, and auxiliary correction of the non-rotational symmetric aberration is performed.
The off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution, provided by the embodiment of the invention, has the following advantages:
1) compared with the traditional imaging spectrometer, the resolution-adjustable off-axis four-counter-rotation zooming imaging spectrometer can realize the functions of adjustable spatial resolution and spectral resolution without moving the spatial positions of the secondary reflector and the third reflector or using an active optical element through the common rotation of the secondary reflector and the third reflector, and the image surface position is unchanged, so that the cost and the assembly and adjustment difficulty of the system are reduced.
2) The four reflectors of the off-axis four-counter-rotation zoom imaging spectrometer system with adjustable resolution are provided with aperture decentration and inclination, belong to off-axis reflection type imaging optical systems, and have larger view field and no blocking compared with a coaxial reflection type optical system; because the reflector can not generate chromatic aberration, compared with a transmission type spectrometer, the off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution can not introduce extra chromatic aberration except the chromatic aberration generated by grating diffraction, the number of elements is small, and the fourth reflector is set to be a free-form surface, so that the degree of freedom of the system is increased, and the correction of the chromatic aberration is facilitated.
3) The resolution-adjustable off-axis three-inverse-zoom imaging spectrometer arranges the diffraction grating on the main reflector, does not need to move the secondary reflector and the third reflector, only needs to rotate for a certain angle through the rotating device, reduces the number of system elements, realizes a more compact structure, and greatly reduces the volume and the quality of the system.
In summary, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (5)
1. An off-axis four-counter-rotation zoom imaging spectrometer with adjustable resolution is characterized by comprising an incident slit, a main reflecting mirror, a secondary reflecting mirror, a third reflecting mirror, a fourth reflecting mirror and a detector;
the incident slit emits light and is positioned at the focal point of the main reflector;
the main reflecting mirror is used for reflecting the light rays from the incident slit into parallel light to form first reflected light;
the secondary reflector is a cylindrical surface or a toroidal surface mirror, is arranged on the reflection light path of the main reflector and is used for secondarily reflecting the light rays from the main reflector to form second reflection light;
the third reflector is a cylindrical surface or a toroidal surface mirror, is arranged on the reflecting light path of the secondary reflector and is used for reflecting the reflecting light from the secondary reflector again to form third reflecting light;
the fourth reflector is arranged on the reflection light path of the third reflector and used for reflecting and focusing the reflection light from the third reflector again to form fourth reflection light;
the detector is arranged on a reflected light path of the fourth reflector and used for receiving the fourth reflected light and imaging;
the secondary reflector and the third reflector form a zooming subsystem, the secondary reflector and the third reflector synchronously rotate for a set angle a, the zooming ratio of the focal length of the zooming subsystem is b times, and the numerical value of the zooming ratio is related to the parameter settings of the secondary reflector and the third reflector.
2. The resolution-adjustable off-axis four-counter-rotating zoom imaging spectrometer of claim 1, wherein the primary mirror is a diffraction grating having a scribe line direction parallel to the slit direction for dispersing the reflected light.
3. The resolution-adjustable off-axis four-counter-rotating zoom imaging spectrometer of claim 2, wherein the primary mirror has an 8-step aspheric profile.
4. The resolution-adjustable off-axis four-counter-rotating zoom imaging spectrometer of claim 1, wherein the surface of the fourth mirror is a free-form surface.
5. The resolution-adjustable off-axis four-reverse rotation zoom imaging spectrometer of claim 1, wherein the reflecting surfaces of the primary mirror, the secondary mirror, the third mirror and the fourth mirror are coated with a gold film reflection increasing film.
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| CN202011415060.1A CN112710390B (en) | 2020-12-07 | 2020-12-07 | Resolution-adjustable off-axis four-counter-rotation zoom imaging spectrometer |
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| CN202011415060.1A CN112710390B (en) | 2020-12-07 | 2020-12-07 | Resolution-adjustable off-axis four-counter-rotation zoom imaging spectrometer |
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| CN114815203A (en) * | 2022-04-11 | 2022-07-29 | 北京理工大学 | Large-relative-aperture off-axis four-reflection type non-axial zooming imaging optical system |
| CN117170078A (en) * | 2023-11-02 | 2023-12-05 | 中国科学院长春光学精密机械与物理研究所 | Reflection type zoom afocal optical system |
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Cited By (3)
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| CN117170078A (en) * | 2023-11-02 | 2023-12-05 | 中国科学院长春光学精密机械与物理研究所 | Reflection type zoom afocal optical system |
| CN117170078B (en) * | 2023-11-02 | 2024-01-12 | 中国科学院长春光学精密机械与物理研究所 | Reflection type zoom afocal optical system |
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