CN112702240A - System and method for testing ground electronic unit - Google Patents
System and method for testing ground electronic unit Download PDFInfo
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Abstract
The invention provides a test system and a test method for a ground electronic unit. The method comprises the following steps: the ground electronic unit transmits the message signal to the PXI test host and the vector network analyzer for testing after passing through the test circuit provided by the interface adaptation box; the PXI test host machine comprises a digital board card, during testing, the digital board card adjusts the signal output type of the ground electronic unit to be a C1 effective information message signal or a C6 activation energy signal, and switches the load of an output channel of the test circuit according to the test requirement. The testing device controls the work of each hardware by the PXI bus controller, can realize the functions of flexible configuration of testing items, automatic execution of the testing process, real-time display of testing states, analysis and uploading of testing results and the like, the testing states are displayed on a software interface of the upper computer in real time, and the testing results can generate reports and can be uploaded to an information system of a production testing factory as required. The problems of dispersed system test components and low test efficiency in the prior art are solved.
Description
Technical Field
The invention belongs to the field of testing, and particularly relates to a system and a method for testing a ground electronic unit.
Background
The ground electronic unit LEU is a device which can convert message information of a specific train into message signals and transmit the message signals to a track active transponder, so that the message signals can be received through electromagnetic induction when the train passes through the active transponder, and the train operation control is realized.
At present, when the product is produced and tested, a set of simulation train control center is needed to issue message information to an LEU and analyze the content of message signals output by the LEU. And according to TB/T3485 and 2017 contents, a series of test functions such as signal quality and open-short circuit monitoring are completed.
The current testing process generally needs to use real equipment as assistance and combine with general instruments such as oscilloscopes, vector network analyzers and the like to carry out communication and signal testing. Because each device and instrument are operated independently, the operation of the test process is complex, and the consistency of the test result is poor.
Disclosure of Invention
In view of the above problem, the present invention provides a method for testing a ground electronic unit, the method comprising:
the PXI test host sends message information to the ground electronic unit, and the ground electronic unit converts the message information into a message signal;
the ground electronic unit transmits the message signal to a PXI test host and a vector network analyzer for testing after passing through a test circuit provided by an interface adaptation box;
the PXI test host machine comprises a digital board card, during testing, the digital board card adjusts the signal output type of the ground electronic unit to be a C1 effective information message signal or a C6 activation energy signal, and switches the load of an output channel of the test circuit according to the test requirement.
Further, when the PXI test host is used for testing, an oscilloscope in the PXI test host is used for testing the output signal index of the ground electronic unit;
and the vector network analyzer is used for testing the return loss index of the C interface of the ground electronic unit.
Further, the test content comprises one or more of a transparent transmission function test, a redundancy function test, an activation energy signal characteristic test, an open-short circuit test and a return loss test.
Further, when the transparent transmission function test is carried out:
a load switching circuit is built in the interface adaptation box through a relay circuit, the digital board card controls the ground electronic unit to stop outputting a C6 signal, the communication card transmits various message information to the ground electronic unit according to an S interface protocol, and the ground electronic unit converts the message information into a message signal to be output;
a switching circuit is built in the interface adaptation box through a relay circuit, the digital board card adjusts the matching resistance of the output interface of the ground electronic unit, the C1 message signal code of the oscilloscope analysis channel is used for obtaining the C1 signal characteristic index, and the oscilloscope tests the C1 signal characteristic index.
Further, when the return loss test is carried out:
a load switching circuit is built through a relay circuit in the interface adaptation box, the load of an output channel of the ground electronic unit is switched through the digital board card, the resistance adaptation card adjusts the load resistance to achieve the load condition required by testing, and the vector network analyzer performs return loss testing on transmitted C1 signals and C6 signals.
Furthermore, an attenuator is arranged between the load switching circuit and the vector network analyzer, and test points are respectively arranged in front of and behind the attenuator, so that impedance test and calibration of the vector network analyzer can be performed.
Further, when the activation energy signal characteristic test is carried out:
a load switching circuit is built in the interface adaptation box through a relay circuit, the digital board card controls the ground electronic unit to stop outputting a C1 signal, the communication card transmits various message information to the ground electronic unit according to an S interface protocol, and the ground electronic unit converts the message information into a message signal to be output;
a switching circuit is built in the interface adaptation box through a relay circuit, the digital board card and the resistance adaptation card adjust the matching resistance of the output interface of the ground electronic unit, and the oscilloscope measures the characteristic of the C6 activation energy signal.
The invention also provides a test system of the ground electronic unit, which comprises a PXI test host, an interface adaptation box and a vector network analyzer, wherein the PXI test host comprises a digital board card;
the interface adaptation box is connected with the PXI test host and the ground electronic unit, and the PXI test host is connected with the vector network analyzer;
the PXI test host is used for sending message information to the ground electronic unit, and the ground electronic unit converts the message information into a message signal;
the ground electronic unit is used for transmitting the message signal to the PXI test host and the vector network analyzer for testing after passing through a test circuit provided by the interface adaptation box;
the digital board card is used for adjusting the message signal output type and switching the load of the output channel of the test circuit according to the test requirement.
Furthermore, the PXI test host also comprises a controller, a communication card, an oscilloscope and a resistance adapter card;
the communication card is used for simulating the communication between the train control center and the ground electronic unit and sending message information;
the oscilloscope is used for testing the output signal index of the ground electronic unit;
the resistance adapter card is used for adjusting the load resistance of the output channel of the ground electronic unit.
Further, the system test content comprises one or more of a transparent transmission function test, a redundancy function test, an activation energy signal characteristic test, an open-short circuit test and a return loss test.
According to the system and the method for testing the ground electronic unit, the PXI bus controller controls the hardware to work, functions of flexible configuration of test items, automatic execution of a test process, real-time display of a test state, analysis and uploading of a test result and the like can be realized, the test state is displayed on a software interface of the upper computer in real time, and the test result can generate a report and can be uploaded to an informatization system of a production test factory as required. The problems of dispersed system test components and low test efficiency in the prior art are solved.
Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 shows a schematic diagram of a test system in an embodiment of the invention;
FIG. 2 is a schematic diagram showing a specific internal structure of a test system in an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating channel load switching in the testing method according to the embodiment of the present invention;
fig. 4 shows a return loss test circuit in the test method in the embodiment of the invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In the embodiment of the invention: the S interface signal represents a signal transmitted to the LEU by the test system; the C interface is an output signal interface of the LEU and is connected with the test system, the C interface mainly comprises a C1 signal and a C6 signal, the C1 signal represents a data effective information message signal transmitted from the LEU to the test system, and the C6 signal represents an activation energy signal transmitted from the LEU to the test system.
The C1 and C6 signals are transmitted in a pair of special shielded twisted pairs. Since interface C1 signals the message data to be transmitted from the LEU to the test system, the problem of selecting the baseband pattern in the transmission interface is involved. In the Eurobalise technical specification, a DBPL (Differential Bi-Phase Level) code is selected as a basic code pattern of transponder C interface baseband transmission.
The C1 signal is a valid information message signal, and the LEU performs pattern conversion on the test system transmission message, converts it to a DBPL code, and sends it uninterruptedly over the cable to the active transponder. The C6 signal is an activation energy signal. The LEU sends an 8.820KHz sine wave directly through a cable to the test system without interruption.
Fig. 1 is a schematic diagram of a testing system according to an embodiment of the present invention, in which the system includes a PXI testing host, an interface adaptation box, a vector network analyzer, and a dc power supply, and the interface adaptation box is used to connect the testing host and an LEU (ground electronic unit), implement interface matching, and provide testing circuits for different testing items of the LEU. The vector network analyzer is independently accessed to a PXI bus controller through USB communication and is used for realizing return loss index testing of a C interface in an LEU. The direct current power supply adopts USB communication to carry out output control, and the access interface adaptation case provides LEU power supply and interface power supply.
PXI (PCI extensions for Instrumentation, instrument system oriented PCI extension) is a robust PC-based measurement and automation platform promulgated by the PXI consortium. PXI combines the electrical bus characteristics of PCI (Peripheral Component interconnect) with the robustness, modularity, and Eurocard mechanical packaging characteristics of CompactPCI (compact PCI) to develop mechanical, electrical, and software specifications suitable for testing, measurement, and data acquisition applications. The PXI specification was developed to perfectly combine the cost performance advantage of desktop PCs with the necessary expansion of the PCI bus to the instrumentation domain, forming a mainstream virtual instrument test platform. This makes it a high performance, low cost carrier platform for measurement and automation systems.
Fig. 2 shows a schematic diagram of an internal specific structure of a test system in an embodiment of the present invention, in fig. 2, the PXI test host includes a controller, a digital board card, a communication interface card, an oscilloscope, and a resistance adapter card, specifically, the digital board card is a digital IO board card, the communication interface card is an RS422 communication card, the controller is a bus controller, and includes an Enet communication (ethernet) and a USB communication (a communication protocol that supports serial data transmission between a USB host and a USB device), the resistance adapter card is a programmable resistance card, and the PXI test host is configured to provide hardware resources required by a test.
Specifically, when the oscilloscope tests the LEU output signal index, the LEU output signal index is stored according to the sampling rate of 10M/S and the sampling length of 1M. And (3) the upper computer program performs resampling through 1128960Hz and then decodes 1023-bit messages through a zero crossing point algorithm according to a DBPL coding principle. Meanwhile, voltage peak-to-peak value, jitter time, data rate, frequency, rising edge time, falling edge time, second harmonic, all harmonics and eye pattern are calculated according to the fixed function of the oscilloscope.
The digital board card is a printed circuit board, called PCB for short, and has a plug core during manufacturing, and can be inserted into a slot of a main circuit board (motherboard) of a computer to control the operation of hardware, such as a display, a collection card, and other devices, and after a driver is installed, the corresponding hardware function can be realized. And the IO board card is used for acquiring data, wherein I represents input, and O represents output.
Specifically, the PXI test host may call each bus hardware driver through a formalized language such as labview, etc. to implement each test function. labview is a program development environment.
Specifically, the digital IO board has two functions, one is for switching the output of the LEU message signal, and usually, the LEU output interface (C interface) has two signals, one is an effective information message signal C1, and the other is an activation energy signal C6. Because the signal quality of the C1 and the C6 needs to be analyzed respectively in the test process, the specified pins of the LEU power amplification board are short-circuited through the output nodes of the PXI digital IO board card, and only the C1 signal or the C6 signal is output. The other is to switch the load of the LEU output channel according to the test requirement; the PXI programmable resistor is used for adjusting load resistance of an LEU output channel; the PXI oscilloscope is used for testing LEU output signal indexes; the PXI-RS422 communication card is used for simulating communication (S interface) between the train control center and the LEU and sending message information. The extension plate extends the LEU power amplification plate from the LEU complete machine. A short circuit jump cap controlled by a PXI digital IO board card is arranged on a designated pin on the PCB element surface of the LEU power amplification board, and the pin is controlled to be short-circuited or opened by controlling the output of the IO board card.
The test system also comprises an extension plate, wherein the extension plate is used for extending the LEU power amplification plate out of the whole machine, so that a jump cap can be conveniently installed, the LEU power amplification plate is connected, an effective information message signal C1 and an activation energy signal C6 signal separation jump wire can be conveniently installed.
The embodiment of the invention also provides a test method of the ground electronic unit, which comprises the following steps:
the PXI test host sends message information to the ground electronic unit, wherein the message information is application data received and forwarded by the LEU, and the message is used for providing train ground control information; the ground electronic unit converts the message information into a message signal, and the message signal is 1023-bit DBPL coded data.
The ground electronic unit transmits the message signal to a PXI test host and a vector network analyzer for testing after passing through a test circuit provided by the interface adaptation box;
and the digital board card adjusts the message signal output type and switches the load of the output channel of the test circuit according to the test requirement.
Specifically, when the transparent transmission function test is performed: controlling the digital board card to stop outputting a C6 signal, transmitting various message information to the ground electronic unit by the PXI-RS422 communication card according to an S interface protocol, and converting the message information into a message signal by the ground electronic unit for outputting;
a switching circuit is built in the interface adaptation box through a relay circuit, the digital board card adjusts the matching resistance of the C interface output by the ground electronic unit, the oscilloscope is used for analyzing a C1 message signal DBPL code to obtain a C1 signal characteristic index, the oscilloscope tests the C1 signal characteristic index, and the C1 signal characteristic index comprises eye diagram data, signal obtaining amplitude, average rate and return loss. DPBL decoding should be consistent with the incoming message, with signal characteristics satisfying the results of table 1.
In the embodiment of the invention, the DBPL coding is a coding mode exceeding the transmission limit of the traditional number. DBPL codes are widely used in engineering applications such as Ethernet, engineering logging instruments, and railway transponders. In the railway transponder, a signal is transmitted to a train-mounted processor through DBPL codes, and the control of train operation is realized.
TABLE 1 LEU output interface "C1" Signal measurement expectation
It can be seen from table 1 that both the signal amplitude and the eye pattern meet the specifications of the eye pattern of TB/T3485-20176.3.2.5, the average data rate is 564.48 × (1 ± 0.02%) kbit/s, the return loss is greater than 6dB, and meanwhile, the test is performed on the eye pattern data of the message signal channel, the obtained signal amplitude, the average rate and the return loss, the test components are centralized, and the test efficiency is high.
In the embodiment of the present invention, a channel refers to a medium for transmitting data between devices, and includes a wired channel (e.g., an optical fiber, a cable), a wireless channel (e.g., a wireless channel, an infrared ray), and the like.
Fig. 3 shows a schematic diagram of channel load switching in the testing method in the embodiment of the present invention, and in fig. 3, the circuit can only send one output signal to the channel CH0 of the oscilloscope at any time for detection, and can adjust the load resistance of the output channel according to different testing requirements. In the figure, four groups of terminals, 12, 14, 10, 13, 2, 5, 1 and 3, come from a signal output interface of an LEU device, the LEU has four output channels in total, each channel contains signals C1 and C6, a signal C1 is an effective information message signal, a signal C6 is an activation energy signal, four groups of relays, namely relays 1 and 2, relays 21 and 22, relays 31 and 32, and relays 41 and 42, are respectively controlled by a digital IO board card in a test host to realize channel load switching, when the digital IO board card corresponding interface outputs a high level, the relays access R + and R-to the channels, and when the IO board card corresponding interface outputs a low level, the relays access 120 Ω loads to the channels. R + and R-are two poles of an adjustable resistor in a resistor adapter card in the test host respectively, and the adjustment of the resistor can be realized through software. The Relay4, the Relay14, the Relay24 and the Relay34 are respectively controlled by IO board cards in the test host to realize channel selection, and a signal channel to be tested is accessed to an oscilloscope CH0 interface, wherein R + and R-are connected with a programmable resistance card (Relay).
Specifically, R + and R-are two poles of an adjustable resistor in a resistor adapter card in the test host respectively, and the resistance value of the resistor adapter card can be adjusted between 0 and 1000 omega to adapt to different test functions.
Specifically, in fig. 3, the channel 12 is connected to the input end side of the channel 14 through the relays Relay1 and Relay2 connected in series, a 120 Ω resistor is connected between the Relay1 and the Relay2, and the output side of the relays Relay4 are connected together; the channel 10 is connected with one side of the input end of the channel 13 through relays Relay21 and Relay22 which are connected in series, a 120 omega resistor is connected between Relay21 and Relay22, and the output sides are connected with a Relay Relay14 together; the channel 2 is connected with one side of the input end of the channel 5 through relays Relay31 and Relay32 which are connected in series, a 120 omega resistor is connected between Relay31 and Relay32, and the output sides are connected with a Relay Relay24 together; the channel 1 and the channel 3 are connected through relays Relay41 and Relay42 which are connected in series, a 120 omega resistor is connected between Relay41 and Relay42, and the output sides are connected with a Relay Relay34 together; 12. 14 is a first channel, 10, 13 are second channels, 2, 5 are third channels, 1, 3 are fourth channels, the oscilloscope only uses CH0 to test, and the testing channels are selected by switching four relays of Relay4, Relay14, Relay24, Relay 34.
When a redundancy function test is carried out, the digital board card controls the ground electronic unit to stop outputting a C6 signal, an external communication interface of the LEU device is two RS422 channels, two channels of interfaces of a 422 communication card in the test host are connected with the two RS422 channels of the LEU in a one-to-one correspondence mode through an adaptation box in a direct connection mode, the PXI-RS422 communication card transmits various message information to the LEU according to an S interface protocol, the matching resistance of the C interface output by the LEU is adjusted, the specific matching resistance value is 120 ohms, and one channel of RS422 communication is respectively closed to confirm message switching and normal signal characteristics. And closing the two RS422 communication paths to confirm that the LEU outputs the default message normally. And confirming that the switching states in the monitoring data are consistent through the Ethernet interface protocol of the monitoring board.
Specifically, when the message switching and the signal characteristics are determined to be normal, the signal amplitude, the average rate, the eye diagram and the message information are all normal, and the message is considered to be normal.
When the activation energy signal characteristic test is carried out, the digital board card controls the ground electronic unit to stop outputting the C1 signal, the PXI-RS422 communication card transmits various message information to the ground electronic unit according to the S interface protocol, and the ground electronic unit converts the message information into a message signal to be output; a switching circuit is built in the interface adaptation box through a relay circuit, and the digital board card adjusts the matching resistance of the ground electronic unit output C interface to measure the characteristic of the C6 signal. The signal characteristics satisfy the results of table 2.
TABLE 2 LEU output interface "C6" Signal measurement expectation
When the open-short circuit test is carried out, the power supply voltage of a power supply is adjusted to be 30V, the PXI-RS422 communication card transmits message information to the LEU according to an S interface protocol, the LEU is adjusted to output a matching resistor connected with a C interface, the impedance is set to be 35 omega during the short circuit test, the impedance is set to be no-load during the open circuit test, the 120 omega (normal) load is recovered after the open circuit test is finished, and the test system confirms that alarm information is consistent with the reality through measuring signal characteristics and monitoring board Ethernet data. A quick determination is made as to whether an open circuit or short circuit fault is present in the surface electronics unit.
When the return loss test is carried out, according to a standard test method, the return loss needs to be tested under various load conditions, the result is calculated, a load switching circuit is built in an interface adaptation box through a relay circuit, the resistance adaptation card is controlled through a digital board card to switch the load of an output channel of a ground electronic unit, the load conditions needed by the test are realized, and the vector network analyzer carries out the return loss test on the transmitted signals. Fig. 4 shows a schematic diagram of a return loss test circuit in the test method in the embodiment of the present invention, where the circuit can only access one output channel to an input port of a vector network analyzer at any time for detection, and can adjust load matching impedance of the output channel according to different test requirements. In the figure, four groups of terminals, namely 12, 14, 10, 13, 2, 5, 1 and 3, come from a signal output interface of the LEU equipment, Relay5, Relay15, Relay25, Relay35 and four relays are respectively controlled by a digital IO board card in a test host, so that a channel is connected to a load circuit. The Relay unit comprises relays 6 and 7, relays 16 and 17, relays 26 and 27 and relays 36 and 37, wherein the relays are respectively controlled by a digital IO board card in a test host and are used for switching loads so as to realize load conditions required by testing. A20 DB attenuator is connected between the vector network analyzer and the load circuit for attenuation of the signal. Test points are respectively arranged at the front and the rear of the attenuator, so that impedance test and vector network analyzer calibration can be performed.
Specifically, in fig. 4, 12 and 14 are first paths, 10 and 13 are second paths, 2 and 5 are third paths, 1 and 3 are fourth paths, anodes of Relay6 and Relay7 are connected together, cathodes of Relay16 and Relay17 are connected together, cathodes of Relay26 and Relay27 are connected together, cathodes of Relay36 and Relay37 are connected together, and cathodes of Relay 8584 are connected together.
Specifically, in the circuit, 12 and 14 are first paths, 10 and 13 are second paths, 2 and 5 are third paths, 1 and 3 are fourth paths, and one path of path can be sent to a vector network analyzer through any one of Relay6 and 7, Relay16 and 17, Relay26 and 27 and Relay36 and 37 at any time.
According to the system and the method for testing the ground electronic unit, the PXI bus controller controls the hardware to work, and the functions of flexible configuration of test items, automatic execution of a test process, real-time display of a test state, analysis and uploading of a test result and the like can be realized. The problems of dispersed system test components and low test efficiency in the prior art are solved.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. A method of testing a ground electronics unit, the method comprising:
the PXI test host sends message information to the ground electronic unit, and the ground electronic unit converts the message information into a message signal;
the ground electronic unit transmits the message signal to a PXI test host and a vector network analyzer for testing after passing through a test circuit provided by an interface adaptation box;
the PXI test host machine comprises a digital board card, during testing, the digital board card adjusts the signal output type of the ground electronic unit to be a C1 effective information message signal or a C6 activation energy signal, and switches the load of an output channel of the test circuit according to the test requirement.
2. The method of testing a ground electronic unit of claim 1,
when the PXI test host is used for testing, an oscilloscope in the PXI test host is used for testing the output signal index of the ground electronic unit;
and the vector network analyzer is used for testing the return loss index of the C interface of the ground electronic unit.
3. The method of claim 2, wherein the test content includes one or more of a pass-through function test, a redundancy function test, an activation energy signal characteristic test, an open-short circuit test, and a return loss test.
4. A method for testing a ground electronic unit according to claim 3, wherein, in the event of a transparent transmission function test:
a load switching circuit is built in the interface adaptation box through a relay circuit, the digital board card controls the ground electronic unit to stop outputting a C6 signal, the communication card transmits various message information to the ground electronic unit according to an S interface protocol, and the ground electronic unit converts the message information into a message signal to be output;
a switching circuit is built in the interface adaptation box through a relay circuit, the digital board card adjusts the matching resistance of the output interface of the ground electronic unit, the C1 message signal code of the oscilloscope analysis channel is used for obtaining the C1 signal characteristic index, and the oscilloscope tests the C1 signal characteristic index.
5. A method of testing a ground electronics unit according to claim 3, wherein the return loss test is performed by:
a load switching circuit is built through a relay circuit in the interface adaptation box, the load of an output channel of the ground electronic unit is switched through the digital board card, the resistance adaptation card adjusts the load resistance to achieve the load condition required by testing, and the vector network analyzer performs return loss testing on transmitted C1 signals and C6 signals.
6. The method of claim 5, wherein an attenuator is disposed between the load switching circuit and the vector network analyzer, and test points are disposed before and after the attenuator, respectively, for performing the impedance test and the calibration of the vector network analyzer.
7. A method for testing a surface electronics unit according to claim 3, wherein the activation energy signal characteristic test is performed by:
a load switching circuit is built in the interface adaptation box through a relay circuit, the digital board card controls the ground electronic unit to stop outputting a C1 signal, the communication card transmits various message information to the ground electronic unit according to an S interface protocol, and the ground electronic unit converts the message information into a message signal to be output;
a switching circuit is built in the interface adaptation box through a relay circuit, the digital board card and the resistance adaptation card adjust the matching resistance of the output interface of the ground electronic unit, and the oscilloscope measures the characteristic of the C6 activation energy signal.
8. A test system of a ground electronic unit is characterized by comprising a PXI test host, an interface adaptation box and a vector network analyzer, wherein the PXI test host comprises a digital board card;
the interface adaptation box is connected with the PXI test host and the ground electronic unit, and the PXI test host is connected with the vector network analyzer;
the PXI test host is used for sending message information to the ground electronic unit, and the ground electronic unit converts the message information into a message signal;
the ground electronic unit is used for transmitting the message signal to the PXI test host and the vector network analyzer for testing after passing through a test circuit provided by the interface adaptation box;
the digital board card is used for adjusting the message signal output type and switching the load of the output channel of the test circuit according to the test requirement.
9. The system for testing a ground electronic unit of claim 8, wherein the PXI test mainframe further comprises a controller, a communication card, an oscilloscope, and a resistance adapter card;
the communication card is used for simulating the communication between the train control center and the ground electronic unit and sending message information;
the oscilloscope is used for testing the output signal index of the ground electronic unit;
the resistance adapter card is used for adjusting the load resistance of the output channel of the ground electronic unit.
10. The system for testing a ground electronic unit according to claim 9, wherein the system test content comprises one or more of a pass-through function test, a redundancy function test, an activation energy signal characteristic test, an open-short circuit test, a return loss test.
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| CN115877187A (en) * | 2023-02-08 | 2023-03-31 | 北京全路通信信号研究设计院集团有限公司 | Testing device and method for ground electronic unit |
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