CN111722969A - LEU complete machine automatic test system - Google Patents

LEU complete machine automatic test system Download PDF

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Publication number
CN111722969A
CN111722969A CN202010595913.8A CN202010595913A CN111722969A CN 111722969 A CN111722969 A CN 111722969A CN 202010595913 A CN202010595913 A CN 202010595913A CN 111722969 A CN111722969 A CN 111722969A
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leu
test
software
interface
complete machine
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CN111722969B (en
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李稳民
邓晨
赵阳
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Huanghua Jiaoda Sino Technology Co ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G06F11/221Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273Test methods
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/36Preventing errors by testing or debugging software
    • G06F11/3668Software testing
    • G06F11/3672Test management
    • G06F11/3688Test management for test execution, e.g. scheduling of test suites

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  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

According to the LEU complete machine automatic testing system, complete machine testing software provides switching among various input conditions for an LEU through controlling a program control power supply, a relay switching device and a C interface switching device; the LEU outputs information collected by an oscilloscope, analyzes by applying high-level language analysis software and monitors by monitoring software; and finally, summarizing all test results through the complete machine test software to form a report, so that the LEU complete machine automatic test is realized. The invention has the advantages that: the method can be used for LEU-P, LEU-S detection, all tests are automatically completed, and a test report is produced, so that the test efficiency and the test reliability are greatly improved; the C interface data can be quantized by automatically analyzing the C interface data by an MATLAB software analysis method.

Description

LEU complete machine automatic test system
Technical Field
The invention relates to the field of railway signal communication, in particular to an automatic LEU complete machine testing system. In particular to an automatic whole-machine function and performance testing system suitable for a ground Electronic Unit (Parallel-Parallel type, abbreviated as LEU-P) and a ground Electronic Unit (Serial-series type, abbreviated as LEU-S).
Background
At present, a ground Electronic Unit (LEU) is widely introduced into a CTCS and CBTC train control system, a shunting protection system in a motor train section (station), a jingjingchun inter-city train control system, and a transponder (including an active transponder and a passive transponder), a train control system, and a train-mounted interrogator form a point type transponder system.
The traditional LEU complete machine test system consists of a column control simulation system, a transponder and a BTM (or BP), wherein the column control simulation system is divided into an LEU-S column control simulation system and an LEU-P column control simulation system according to different types of LEUs, the LEU-S column control simulation system is completed through PC software, the LEU-P column control simulation system is realized through an electrical mode, and the connection mode is shown in figure 1, and the LEU complete machine test system is specifically realized: the DC24V supplies power to the LEU through the P interface and completes the complete power consumption test of the LEU by means of a measuring instrument; the column control simulation system provides simulation information for the LEU through the S interface by the simulation data, simultaneously the C interface sends the simulation data to the responder, the information is read by the BTM or BP, and the simulation data is compared with the data of the M interface for monitoring the information, and whether the simulation data is qualified is checked through manual comparison.
This test method has the following disadvantages: (1) the related parameters of the C interface cannot be accurately measured; (2) the number of required test equipment is large, and the connection is complex; (3) the test environment is set up and the test time is longer; the low test efficiency and the lack of key parameters are caused; (4) most of the devices adopt special equipment, and the maintainability of the equipment is poor.
Therefore, a new device is needed to ensure the reliability and operability of the complete machine test of the LEU.
Disclosure of Invention
The invention provides an implementation scheme of an LEU complete machine automatic test system.
The invention provides an LEU complete machine automatic test system, which comprises a program control power supply, a relay switching device, a C interface switching device, an oscilloscope, complete machine test software, high-level language analysis software and monitoring software;
the complete machine test software provides switching among various input conditions for the LEU by controlling the program control power supply, the relay switching device and the C interface switching device;
the LEU outputs information collected by an oscilloscope, analyzes by applying high-level language analysis software and monitors by monitoring software;
the LEU-S train control simulation system is directly integrated in the whole machine test software, and the LEU-P train control simulation system is realized by controlling the relay switching device through the whole machine test software and provides input conditions for the whole machine test of the LEU through an S interface;
the whole machine testing software outputs a control signal to enable the program-controlled power supply to work, energy is provided for the LEU whole machine through the P interface, meanwhile, power consumption data are returned to the whole machine testing software and compared with data in an automatic testing system;
the monitoring software is connected with the LEU through an M interface to monitor the state information of the LEU in real time, and feeds back the state information to the whole machine testing software through the testing content to perform comparative analysis;
the oscilloscope collects C interface data of the LEU complete machine through the C interface switching device, and analyzes and processes the data through the high-level language analysis software;
and finally, summarizing all test results through the complete machine test software to form a report, so that the LEU complete machine automatic test is realized.
The invention has the advantages that: the method can be used for LEU-P, LEU-S detection, all tests are automatically completed, and a test report is produced, so that the test efficiency and the test reliability are greatly improved; the C interface data can be quantized by automatically analyzing the C interface data by an MATLAB software analysis method.
Drawings
FIG. 1 is a schematic diagram of a test system for an existing LEU;
FIG. 2 is a schematic diagram of an LEU overall testing system of the present invention;
FIG. 3 is a schematic diagram of the architecture implementation of the automated test system of the present invention;
fig. 4 is a schematic diagram of the consistency test of the message test according to the present invention.
Detailed Description
The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention.
The LEU complete machine automatic test system comprises 7 parts such as a program control power supply, a relay simulation device, a C interface switching device, an oscilloscope, LEU complete machine test software, high-level language analysis software (based on a high-level programming language suitable for machine learning or data science work, such as analysis software designed by Matlab/Python and the like) and monitoring software, and can realize the full-automatic test of the LEU function and performance, and the connection mode is shown in figure 2.
The specific implementation mode is as follows: the whole machine testing software provides switching among various input conditions for the LEU by controlling the program-controlled power supply, the relay simulation device and the C interface switching device, the LEU outputs information acquired by the oscilloscope, analyzes by applying high-level language analysis software (MATLAB analysis software is taken as an example below), monitors by the monitoring software, and finally summarizes all testing results by the whole machine testing software to form a report and stores the report to the local computer. Meanwhile, the LEU serial number can be automatically read or manually input through the code scanning gun, and the information of the tester can be input, so that the test result can be traced.
The scheme can be used for detecting an LEU-P, LEU-S complete machine, all other tests can be automatically completed except that the LED lamp position indication state needs to be observed manually in the test process, and a test report is produced, so that the test efficiency and the test reliability are greatly improved.
The invention firstly relates to a scheme of an LEU complete machine automatic test system, and the architecture implementation principle of the automatic test system is shown in figure 3.
LEU complete machine test software completes input and output changes of test conditions of an LEU complete machine by controlling a program control power supply, a column control simulation system, a C interface switching device and other control systems, and meanwhile, relevant test information is collected by a code scanning gun, the program control power supply, an oscilloscope and monitoring software to be compared, analyzed and judged with a standard value in the LEU complete machine test software, and finally, an LEU complete machine test report and a test conclusion are generated, so that the automatic test of the LEU complete machine is realized.
The specific implementation mode is as follows: (1) LEU complete machine test software: starting a central control function, and providing input conditions, loadable test conditions (variable), loadable judgment standards (variable) and acquisition of related information, personnel input, result judgment and report generation in the test process for LEU complete machine test;
(2) measuring power consumption: outputting a control signal according to LEU complete machine test software to enable a program-controlled power supply to work, providing energy for an LEU complete machine through a P interface, simultaneously returning power consumption data to the complete machine test software, and comparing the power consumption data with data in an LEU complete machine test system to complete the test;
(3) a train control simulation system: the column control simulation system is compatible with LEU-P, LEU-S (including transparent transmission and non-transparent transmission), and can be selected according to test requirements, wherein the LEU-S column control simulation system is directly integrated in LEU complete machine test software, and the LEU-P column control simulation system is realized by controlling a relay switching device through LEU complete machine test software, and provides input conditions for LEU complete machine test through an S interface;
(4) c interface switching device: the device is connected with an LEU complete machine through a C interface, switches between an open circuit and a short circuit, and loads of 170 omega and 120 omega, and is controlled through LEU complete machine test software according to test requirements to complete corresponding condition conversion;
(5) monitoring software: the LEU state information is monitored in real time through connection of the M interface and the test content, and the LEU state information is fed back to LEU complete machine test software through the test content to perform comparative analysis and complete the test;
(6) an oscilloscope: the C interface data of the LEU complete machine is acquired through the C interface switching device, and the data is analyzed and processed through MATLAB analysis software, so that a C1 interface can be measured: amplitude, DBPL code rate, jitter time, DBPL eye shadow margin, etc.; and measurement C6 interface: amplitude, frequency, etc.; analyzing the LEU message data through a logic algorithm to realize a message automatic test function;
(7) sweep a yard rifle: the LEU complete machine serial number information can be automatically identified through a code scanning gun and returned to LEU complete machine testing software;
(8) and (4) judging a result: LEU complete machine test software can automatically judge whether the test result is qualified;
(9) and (3) automatically generating a report: LEU complete machine test software can automatically generate a test report according to the test condition, and the report contains information such as testing personnel, test time, serial numbers, test items, measurement value quantification of each test item, individual judgment of each result, overall judgment of the complete machine test result and the like.
Compared with the existing LEU complete machine test system, the LEU complete machine automatic test system has the main advantages that: (1) and (3) universal testing: all parameters and messages in the whole machine test system can be adjusted through configuration, and the functional test of an LEU product with different parameters LEU-P, LEU-S transparent message transmission and LEU-S non-transparent message transmission can be met; (2) automated testing: the input work of the host serial number reducing personnel can be automatically identified, the automatic generation function of the report can be realized, the input work of the personnel can be reduced, and the judgment of the inspection result can be automatically realized; (3) the index can be quantized: the C interface data is automatically analyzed through an MATLAB software analysis method, and the C interface data can be quantized; (4) traceability: automatic identification (manual input) of the complete machine serial number of the LEU and entry of a tester can be realized through the code scanning gun, a report with test time is automatically generated, and the test result can be traced.
An embodiment of a C-interface signal quantifiable test scheme.
Compared with the existing LEU C interface test method, the LEUC interface quantitative test method comprises the following steps: the quantitative test of the LEU C interface data is realized, the defect that the C interface test point cannot be quantized in the existing test method is overcome, and the measurement preparation and reliability of the product can be improved.
The realization principle is as follows: LEU C interface signal processing: an LEU C interface signal processing mechanism is formed by the C interface switching device, the oscilloscope and high-level language analysis software (such as MATLAB analysis software), different C interface data are measured by the oscilloscope, and the MATLAB analysis software is applied to model and analyze the measured data to finally generate specific parameters of the required test points, so that the test is completed.
The specific implementation mode is as follows: (1) c6 interface index quantization: the analog load is switched to the 170 omega resistor through the C interface switching device, the oscilloscope collects the measurement parameters of the 170 omega resistor, the MATLAB analysis software collects the oscilloscope measurement data, a model is established to analyze the data, the C6 signal is analyzed, and the C6 amplitude, frequency and other indexes can be decomposed to complete the C6 amplitude quantitative test;
(2) c1 interface index quantization: the analog load is switched to a 120 omega resistor through a C interface switching device, an oscilloscope collects measurement parameters of the 120 omega resistor, and MATLAB analysis software collects oscilloscope measurement data, a model is established to analyze the data, analysis and processing of a C1 signal are realized, and information such as amplitude, average data rate, jitter time, DBPL eye diagram shadow region allowance, rising and falling edge time and the like is used for completing the C1 amplitude quantization test.
Embodiment two LEU complete machine test message consistency test scheme
The existing message test mode: the S interface provides message information for the LEU, the message information is output to the responder through the C interface, and the message information is transmitted to the vehicle-mounted equipment through the responder to be compared with the DBPL code; and the message consistency universal test scheme of the LEU complete machine test adopts standard equipment for analysis, thereby being convenient for equipment maintenance.
The realization principle is as follows: the consistency test of the message of the LEU complete machine test is composed of an oscilloscope, a C interface switching device, MATLAB analysis software and LEU complete machine test software; and acquiring waveforms at two ends of a 120 omega resistor through an oscilloscope, carrying out data analysis through MATLAB analysis software, and finally carrying out consistency comparison with S interface message information in LEU complete machine test software to finish the test.
The specific implementation mode is as follows: LEU complete machine test software inputs test messages to an LEU through an S interface, switches the output end of a C interface to a 120 omega load through a C interface switching device, and collects waveforms at two ends of a 120 omega load resistor by using an oscilloscope (see figure 4 in detail); and (3) reversely decomposing the DBPL code waveform into binary messages by using MATLAB software, checking, intercepting 1023-bit data in the binary messages passing the check (only relevant requirements are made on the message length and no requirements are made on the message content), transmitting the 1023-bit data to LEU complete machine test software to realize message comparison, and performing consistency judgment to complete the test.
The third embodiment is suitable for the LEU complete machine test S interface simulation system design scheme compatible with LEU-P, LEU-S transparent transmission and LEU-S non-transparent transmission.
The existing LEU integral S interface test needs to be carried out by two sets of different LEU-P, LEU-S systems, the number of test tools and the maintenance cost are increased, the LEU integral machine test adopts an S interface generalized simulation system test scheme design, the S interface test of the LEU-P, LEU-S is integrated, the tests of different LEU types such as LEU-P, LEU-S transparent transmission and LEU-S non-transparent transmission can be met, and the number of LEU test tools and the maintenance cost are reduced.
The realization principle is as follows: the LEU _ S interface generalized simulation system is a column control simulation system, is formed by combining LEU complete machine test software and a relay switching device, and can finish the LEU _ S interface test by selecting LEU types, selecting and loading different input conditions; the input conditions loaded by this simulation system are variable in order to accommodate testing of different LEU types.
The specific implementation mode is as follows: and starting different devices for testing according to different LEU types and loading conditions selected by LEU complete machine testing software. If the LEU type is LEU-P type, starting the relay switching device to provide S interface test conditions for the LEU complete machine; if the LEU type is LEU-S type, the simulation data in the LEU complete machine test software provides S interface test conditions for the LEU complete machine, at the moment, an LEU-S transparent transmission type or an LEU-S message storage type can be selected, and tests on different types of LEUs can be completed by selecting different types of LEUs.
The invention has the beneficial effects that:
1. the test efficiency can be improved: the manual setting-up environment and manual recording are reduced, automatic testing and automatic recording are all carried out, manual intervention is reduced, and the testing efficiency is greatly improved.
2. Compatibility: the method can be compatible with LEU-P, LEU-S message transmission and LEU-S non-transparent transmission type LEU test.
3. Quantization: the C interface data can be quantized by automatically analyzing the C interface data by an MATLAB software analysis method.
4. Maintainability: the design hardware is less, most of the design hardware adopts standard instruments and meters, and the equipment maintenance is simple and convenient.
The above description is only a preferred embodiment of the present novel scheme, and is not intended to limit the scope of the present novel scheme. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the new scheme shall be included in the protection scope of the new scheme.

Claims (7)

1. An LEU complete machine automatic test system comprises a program control power supply, a relay switching device, a C interface switching device, an oscilloscope, complete machine test software, high-level language analysis software and monitoring software;
the complete machine test software provides switching among various input conditions for the LEU by controlling the program control power supply, the relay switching device and the C interface switching device;
the LEU outputs information collected by an oscilloscope, analyzes by applying high-level language analysis software and monitors by monitoring software;
the LEU-S train control simulation system is directly integrated in the whole machine test software, and the LEU-P train control simulation system is realized by controlling the relay switching device through the whole machine test software and provides input conditions for the whole machine test of the LEU through an S interface;
the whole machine testing software outputs a control signal to enable the program-controlled power supply to work, energy is provided for the LEU whole machine through the P interface, meanwhile, power consumption data are returned to the whole machine testing software and compared with data in an automatic testing system;
the monitoring software is connected with the LEU through an M interface to monitor the state information of the LEU in real time, and feeds back the state information to the whole machine testing software through the testing content to perform comparative analysis;
the oscilloscope collects C interface data of the LEU complete machine through the C interface switching device, and analyzes and processes the data through the high-level language analysis software;
and finally, summarizing all test results through the complete machine test software to form a report, so that the LEU complete machine automatic test is realized.
2. The automated test system of claim 1, further comprising a code scanning gun, wherein the code scanning gun is capable of automatically identifying LEU machine serial number information and retrieving the LEU machine serial number information to the machine test software.
3. The automated testing system of claim 1, wherein the complete machine testing software is capable of automatically determining whether the test result is acceptable.
4. The automated testing system of claim 1, wherein the C interface switching device is connected to the LEU overall unit through the C interface to switch between an open circuit and a short circuit, a 170 Ω load, and a 120 Ω load, and is controlled by the overall unit testing software according to testing requirements to complete corresponding condition conversion.
5. The automated testing system according to claim 4, wherein the high-level language analysis software is, for example, MATLAB analysis software, and the MATLAB analysis software automatically analyzes C interface data, so as to quantize the C interface data, that is, to realize quantization of C1 and C6 interface indexes;
and analyzing LEU message data to realize a message automatic test function, acquiring waveforms at two ends of a 120 omega resistor through an oscilloscope, performing data analysis through MATLAB analysis software, namely reversely decomposing a DBPL code waveform into a binary message by applying the MATLAB analysis software, verifying, and finally performing consistency comparison with S interface message information in the whole machine test software to finish the test.
6. The automated test system of claim 1, wherein all parameters and messages in the automated test system are configurable to meet functional tests of LEU products with different parameters LEU-P, LEU-S for transparent messaging and LEU-S for non-transparent messaging.
7. The automated testing system of claim 6, wherein during the testing process, the status of the LED light position indication is observed manually, and the other tests are automatically completed and a test report is generated.
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CN113325247A (en) * 2021-01-12 2021-08-31 山西润泽丰科技股份有限公司 LEU test board system, test method thereof and calibration method thereof
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