CN110928274A - Test system of LEU equipment - Google Patents

Test system of LEU equipment Download PDF

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Publication number
CN110928274A
CN110928274A CN201911249307.4A CN201911249307A CN110928274A CN 110928274 A CN110928274 A CN 110928274A CN 201911249307 A CN201911249307 A CN 201911249307A CN 110928274 A CN110928274 A CN 110928274A
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China
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module
leu
test
tested
impedance
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CN201911249307.4A
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CN110928274B (en
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叶轲
连乐
王通
房海云
侯艳
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Beijing Railway Signal Co Ltd
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CRSC Beijing Rail Industry Co Ltd
Rail Transit Technology Research Institute of CRSC Beijing Railway Industry Co Ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/20—Pc systems
    • G05B2219/24—Pc safety
    • G05B2219/24065—Real time diagnostics

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The application discloses test system of LEU equipment, test system of LEU equipment comprises control module, functional module and communication group casket, functional module includes communication module, impedance module, switch module and collection module, communication group casket cooperation communication module realizes communication between control module and the LEU equipment that awaits measuring, control module and functional module carry out the analysis of signal simulation and feedback signal under the different test modes according to the application scene and the operational environment of the LEU equipment that awaits measuring to realize the acquisition of test record under the different test modes, satisfy the test demand of autonomic LEU equipment, and then realize carrying out the purpose of each item test for autonomic LEU equipment.

Description

Test system of LEU equipment
Technical Field
The application relates to the technical field of railway signal testing, in particular to a testing system of LEU equipment.
Background
An LEU (line Electronic Unit) is an important component in a train control system in China, and provides an interface between a signal system and a transponder to transmit line information to an active transponder.
At present, railway engineers independently design and research autonomous LEU equipment so as to achieve the purpose of replacing imported LEU equipment with the autonomous LEU equipment. Before the autonomous LEU device is put into use, the autonomous LEU device generally needs to be tested by using a testing system of the LEU device, but the current testing system of the LEU device mainly aims at the testing of imported LEU devices and cannot realize the testing of the autonomous LEU device, so that how to design the testing system for the autonomous LEU device becomes one of the research and development targets of railway engineers.
At present, the LEU equipment in the train control system is mostly dependent on imported LEU equipment, LEU equipment developed by using autonomous design becomes one of the efforts of related researchers,
disclosure of Invention
In order to solve the technical problem, the application provides a test system of an LEU device, so as to achieve the purpose of carrying out various tests on the independent LEU device.
In order to achieve the technical purpose, the embodiment of the application provides the following technical scheme:
a test system for an LEU device for testing an LEU device under test, the test system for an LEU device comprising: the system comprises a control module, a functional module and a communication box; wherein,
the control module is used for determining a test mode according to an input instruction, and transmitting a control instruction to the functional module according to the test mode or transmitting a default message to the LEU equipment to be tested according to the test mode; the LEU equipment to be tested is used for receiving a feedback signal of the LEU equipment to be tested, analyzing the feedback signal and generating a test record;
the functional module includes: the device comprises a communication module, an impedance module, a switch module and an acquisition module; the communication module is used for being matched with the communication box to realize communication between the control module and the LEU equipment to be tested;
the impedance module is used for determining an impedance mode corresponding to the test mode according to the control instruction;
the switch module comprises a plurality of relay switches and is used for controlling the closing states of the relay switches according to the control instruction so as to realize the matching of the output channel of the LEU equipment to be tested, the impedance mode and the acquisition channel of the acquisition module;
and the acquisition module is used for acquiring the feedback signal of the LEU equipment to be tested according to the test mode and returning the feedback signal to the control module.
Optionally, the control module is further configured to perform configuration programming according to the input configuration information to complete the configuration process.
Optionally, the control module performs configuration programming according to input configuration information to complete a configuration process, and is specifically configured to perform configuration programming according to the input configuration information to determine the default packet and a working mode of the control module.
Optionally, the test mode includes: the test system comprises an open circuit test mode, a short circuit test mode, a C interface signal test mode and a message test mode.
Optionally, when the test mode is a short circuit test mode;
the impedance module is specifically used for switching an impedance mode into a short-circuit load mode according to the control instruction;
the switch module is specifically used for sequentially connecting four output channels of the LEU equipment to be tested with the impedance module, and connecting an acquisition channel of the acquisition module with a channel corresponding to the short-circuit load mode of the impedance module;
the acquisition module is specifically used for acquiring an output signal of the LEU equipment to be tested during short circuit test as a feedback signal and transmitting the feedback signal to the control module;
and the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal so as to obtain parameters of each output channel of the LEU equipment to be tested during short circuit test.
Optionally, when the test mode is an open circuit test mode;
the impedance module is specifically configured to switch an impedance mode to an open-circuit load mode according to the control instruction;
the switch module is specifically configured to sequentially connect four output channels of the LEU device to be tested with the impedance module, and connect an acquisition channel of the acquisition module with a channel corresponding to an open load mode of the impedance module;
the acquisition module is specifically used for acquiring an output signal of the LEU equipment to be tested during open circuit testing as a feedback signal and transmitting the feedback signal to the control module;
and the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal so as to obtain parameters of each output channel of the LEU equipment to be tested during open circuit test.
Optionally, when the test mode is a C interface signal test mode;
the impedance module is specifically used for switching an impedance mode into a normal load mode according to the control instruction;
the switch module is specifically used for sequentially connecting four output channels of the LEU equipment to be tested with the impedance module, and connecting an acquisition channel of the acquisition module with a channel corresponding to a normal load mode of the impedance module;
the acquisition module is specifically used for acquiring an output signal of the LEU equipment to be detected when the LEU equipment to be detected is connected with a channel corresponding to the normal load mode of the impedance module and transmitting the output signal as a feedback signal to the control module;
and the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal so as to obtain test parameters of each output channel of the LEU equipment to be tested in the process of testing the C interface signal.
Optionally, when the test mode is a message test mode;
the control module transmits a default message to the LEU equipment to be tested;
the impedance module is specifically configured to switch an impedance mode to a zero impedance mode according to the control instruction;
the switch module is specifically used for sequentially connecting four output channels of the LEU equipment to be tested with the impedance module and connecting an acquisition channel of the acquisition module with the impedance module;
the acquisition module is specifically configured to acquire a real-time message output by the to-be-tested LEU device during message testing, and transmit the real-time message as the feedback signal to the control module;
the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal and judging whether each output channel of the LEU equipment to be tested outputs a real-time message during message testing.
Optionally, the control module is right the feedback signal analyzes, judges whether each output channel of the to-be-tested LEU device outputs a real-time message during message testing, and specifically is used for analyzing the real-time message output by the output channel of the to-be-tested LEU device to obtain real-time message information, and compares the real-time message information with the default message information, when the real-time message information is different from the default message information, the output channel of the to-be-tested LEU device outputs the real-time message, and when the real-time message information is different from the default message information, the output channel of the to-be-tested LEU device does not output the real-time message.
According to the technical scheme, the test system of the LEU equipment is composed of the control module, the functional module and the communication group box, the functional module comprises the communication module, the impedance module, the switch module and the acquisition module, the communication group box is matched with the communication module to realize communication between the control module and the LEU equipment to be tested, the control module and the functional module perform signal simulation and feedback signal analysis in different test modes according to the application scene and the working environment of the LEU equipment to be tested, so that test records in different test modes are acquired, the test requirements of the independent LEU equipment are met, and the purpose of testing the independent LEU equipment is achieved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, it is obvious that the drawings in the following description are only embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
Fig. 1 is a schematic structural diagram of a test system of an LEU device according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of a test system of an LEU device according to another embodiment of the present application.
Detailed Description
As described in the background art, the imported LEU device is usually tested in a test environment built by separate devices (tools) such as a direct-current power supply, an oscilloscope, a switch and the like, and because the imported LEU device and the autonomous LEU device are different in style and test requirements, the test environment built for testing the imported LEU device cannot be applied to the test of the autonomous LEU device.
In view of this, an embodiment of the present application provides a test system for an LEU device, configured to test an LEU device to be tested, where the test system for the LEU device includes: the system comprises a control module, a functional module and a communication box; wherein,
the control module is used for determining a test mode according to an input instruction, and transmitting a control instruction to the functional module according to the test mode or transmitting a default message to the LEU equipment to be tested according to the test mode; the LEU equipment to be tested is used for receiving a feedback signal of the LEU equipment to be tested, analyzing the feedback signal and generating a test record;
the functional module includes: the device comprises a communication module, an impedance module, a switch module and an acquisition module; the communication module is used for being matched with the communication box to realize communication between the control module and the LEU equipment to be tested;
the impedance module is used for determining an impedance mode corresponding to the test mode according to the control instruction;
the switch module comprises a plurality of relay switches and is used for controlling the closing states of the relay switches according to the control instruction so as to realize the matching of the output channel of the LEU equipment to be tested, the impedance mode and the acquisition channel of the acquisition module;
and the acquisition module is used for acquiring the feedback signal of the LEU equipment to be tested according to the test mode and returning the feedback signal to the control module.
The test system of the LEU equipment is composed of a control module, a functional module and a communication box, wherein the functional module comprises a communication module, an impedance module, a switch module and an acquisition module, the communication box is matched with the communication module to realize communication between the control module and the LEU equipment to be tested, the control module and the functional module perform signal simulation and feedback signal analysis in different test modes according to an application scene and a working environment of the LEU equipment to be tested so as to realize acquisition of test records in different test modes, meet test requirements of the autonomous LEU equipment and further achieve the purpose of performing various tests on the autonomous LEU equipment.
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The embodiment of the present application provides a test system of LEU equipment, as shown in fig. 1, is used for testing the LEU equipment 40 that awaits measuring, the test system of LEU equipment includes: a control module 10, a function module 20 and a communication cassette 30; wherein,
the control module 10 is configured to determine a test mode according to an input instruction, and transmit a control instruction to the function module 20 according to the test mode or transmit a default message to the LEU device 40 to be tested according to the test mode; and a feedback signal for receiving the LEU device 40 to be tested, analyzing the feedback signal, and generating a test record;
the functional module 20 includes: the device comprises a communication module 21, an impedance module 22, a switch module 23 and an acquisition module 24; the communication module 21 is configured to cooperate with the communication cassette 30 to implement communication between the control module 10 and the LEU device 40 to be tested;
the impedance module 22 is configured to determine an impedance mode corresponding to the test mode according to the control instruction;
the switch module 23 includes a plurality of relay switches, and is configured to control the closing states of the plurality of relay switches according to the control instruction, so as to implement matching between the output channel of the to-be-tested LEU device 40, the impedance mode, and the acquisition channel of the acquisition module 24;
the acquisition module 24 is configured to acquire a feedback signal of the LEU device 40 to be tested according to the test mode, and return the feedback signal to the control module 10.
In fig. 1, in addition to the communication module 21, the impedance module 22, the switch module 23 and the acquisition module 24, the functional module 20 further shows a power module 25, where the power module 25 is configured to provide synchronous power supply and power off functions for the functional module, the control module, the communication box and/or the LEU device to be tested, and may further integrate functions of detecting an output voltage value and a total power value.
In addition, the control module 10 may be connected to the LEU device to be tested through a USB or network cable interface; the functional module 20 CAN be connected to the communication box through a CAN communication interface, the communication box is further connected to an S interface of the LEU device to be tested, and the functional module is further connected to a C interface of the LEU device to be tested. The functions and definitions of the S interface and the C interface of the LEU device to be tested are well known to those skilled in the art, and are not described herein in detail.
In this embodiment, the input instruction is input by a tester, and the test mode corresponding to the input instruction may include an open circuit test mode, a short circuit test mode, a C interface signal test mode, a message test mode, and the like. Specifically, the input mode of the input instruction may be a trigger input of an option provided by a tester through a touch screen or a key input of the tester through an input device, and the like, which is not limited in the present application and is determined according to the actual situation.
In the functional module 20, the communication module 21 and the communication cassette 30 cooperate to enable communication between the LEU device under test 40 and the control module 10. The communication stack 30 may be a LEU interface communication stack 30 of the type CI-X7, and the LEU device communicates with the control module 10 through a TIU communication board in the communication stack 30 and may receive a real-time message sent by the control module 10.
The impedance module 22 is configured to provide different impedances according to different test modes, so as to simulate different loads connected to the LEU device, and complete test requirements for different test modes.
The switch module 23 includes a plurality of relay switches, and the closed states of the plurality of relay switches determine the connection relationship between the output channels of the LEU devices and the impedance channels of the impedance module 22 and the acquisition channels of the acquisition module 24. Optionally, in an embodiment of the present application, the number of the output channels of the LEU device is four, the four output channels are respectively connected to four relay switches, the impedance channels of the impedance module 22 also include four impedance channels for providing four types of impedances, the four types of impedances are respectively connected to four relay switches, the number of the acquisition channels of the acquisition module 24 is two, and the two acquisition channels are respectively connected to two relay switches. According to the internal connection relation of the matrix switch formed by the relay switches, a corresponding topological structure is selected, such as a one-line connection method, a two-line connection method, a matrix connection method and the like, and considering that the output signal of the LEU equipment is a differential signal, the matrix switch can select the two-line connection method, four output channels of the LEU equipment, four impedance channels of the impedance module 22 and two acquisition channels of the acquisition module 24 are distributed at corresponding nodes, when one output channel needs to be connected with one impedance channel and one acquisition channel, the connection can be realized through the closing of the relay switch, and when the output channel or the impedance channel or the acquisition channel needs to be switched, the connection and disconnection can still be realized through the closing and the opening of the relay switch.
To sum up, the test system of the LEU device provided by the embodiment of the present application is composed of a control module 10, a functional module 20 and a communication group box 30, the functional module 20 includes a communication module 21, an impedance module 22, a switch module 23 and an acquisition module 24, the communication group box 30 cooperates with the communication module 21 to realize communication between the control module 10 and the LEU device 40 to be tested, the control module 10 and the functional module 20 perform signal simulation and feedback signal analysis under different test modes according to an application scenario and a working environment of the LEU device 40 to be tested, so as to realize acquisition of test records under different test modes, meet test requirements of the autonomous LEU device, and further realize the purpose of performing various tests on the autonomous LEU device.
Optionally, before use, the control module 10 may also perform configuration programming according to input configuration information to complete a configuration process.
Specifically, the control module 10 performs configuration programming according to the input configuration information to complete the configuration process, and is specifically configured to perform configuration programming according to the input configuration information to determine the default packet and the working mode of the control module 10.
The default message is used to test the LEU device 40 to be tested in the message testing process, and the working mode of the control module 10 may include: the control module 10 is a redundant type or a single type, and the control module 10, the LEU device 40 to be tested, and the communication mode of the functional module 20, and whether to output a C1/C6 signal to the LEU device 40 to be tested, etc.
The C1 signal is the message information sent by the LEU to the transponder in the uplink, and is expressed in DBPL code format, and the C6 signal is the controllable signal transmitted by the LEU to the active transponder, and is a sinusoidal signal.
The following describes a specific working process of each module when the test system of the LEU device provided by the embodiment of the present application is in each different test mode.
In one embodiment of the present application, when the test mode is a short circuit test mode;
the impedance module 22 is specifically configured to switch the impedance mode to a short-circuit load mode according to the control instruction;
the switch module 23 is specifically configured to sequentially connect the four output channels of the LEU device 40 to be tested with the impedance module 22, and connect the acquisition channel of the acquisition module 24 with a channel corresponding to the short-circuit load mode of the impedance module 22;
the acquisition module 24 is specifically configured to acquire an output signal of the to-be-tested LEU device 40 during the short circuit test, and transmit the output signal as a feedback signal to the control module 10;
the control module 10 analyzes the feedback signal and generates a test record, which is specifically used for analyzing the feedback signal to obtain parameters of each output channel of the LEU device 40 to be tested during the short circuit test.
When the test mode is an open circuit test mode;
the impedance module 22 is specifically configured to switch the impedance mode to an open-circuit load mode according to the control instruction;
the switch module 23 is specifically configured to sequentially connect four output channels of the LEU device 40 to be tested with the impedance module 22, and connect an acquisition channel of the acquisition module 24 with a channel corresponding to an open load mode of the impedance module 22;
the acquisition module 24 is specifically configured to acquire an output signal of the to-be-tested LEU device 40 during an open circuit test, and transmit the output signal as a feedback signal to the control module 10;
the control module 10 analyzes the feedback signal and generates a test record, which is specifically used for analyzing the feedback signal to obtain parameters of each output channel of the LEU device 40 to be tested during the open circuit test.
When the test mode is a C interface signal test mode;
the impedance module 22 is specifically configured to switch the impedance mode to a normal load mode according to the control instruction;
the switch module 23 is specifically configured to sequentially connect four output channels of the LEU device 40 to be tested with the impedance module 22, and connect an acquisition channel of the acquisition module 24 with a channel corresponding to a normal load mode of the impedance module 22;
the acquisition module 24 is specifically configured to acquire an output signal of the to-be-tested LEU device 40 when connected to a channel corresponding to the normal load mode of the impedance module 22, and transmit the output signal as a feedback signal to the control module 10;
the control module 10 analyzes the feedback signal and generates a test record, which is specifically used for analyzing the feedback signal to obtain a test parameter of each output channel of the to-be-tested LEU device 40 during the C interface signal test.
When the test mode is a message test mode;
the control module 10 transmits a default message to the LEU device 40 to be tested;
the impedance module 22 is specifically configured to switch the impedance mode to a zero impedance mode according to the control instruction;
the switch module 23 is specifically configured to sequentially connect the four output channels of the LEU device 40 to be tested with the impedance module 22, and connect the acquisition channel of the acquisition module 24 with the impedance module 22, so that the acquisition module 24 is directly connected with the LEU device to be tested;
the acquisition module 24 is specifically configured to acquire a real-time message output by the to-be-tested LEU device 40 during message testing, and transmit the real-time message as the feedback signal to the control module 10;
the control module 10 analyzes the feedback signal and generates a test record, which is specifically used for analyzing the feedback signal and determining whether each output channel of the LEU device 40 to be tested outputs a real-time message during a message test.
It should be noted that, in the process of analyzing the feedback signal by the control module 10, the connection between the LEU device to be tested and the communication box is disconnected, that is, a new real-time message is not transmitted any more.
Wherein, control module 10 is right feedback signal analyzes, judges whether each output channel of the LEU equipment 40 that awaits measuring has exported real-time message when the message test specifically is used for, right the real-time message of the output channel output of the LEU equipment 40 that awaits measuring analyzes to obtain real-time message information, will real-time message information with acquiescence message information compares, works as real-time message information with acquiescence message information is different, judges the real-time message has been exported to the output channel of the LEU equipment 40 that awaits measuring, works as real-time message information with acquiescence message information is the same, judges the output channel of the LEU equipment 40 that awaits measuring does not export real-time message.
On the basis of the above embodiment, in another embodiment of the present application, the control module 10 may be integrated in an upper computer with an operation function, and referring to fig. 2, may specifically include a record generating unit 11, a configuration programming unit 12, a signal analyzing unit 13, a data collecting unit 14, and a scene simulation unit 15; wherein,
the record generating unit 11 is configured to record various parameters of the LEU device 40 to be tested in each test mode, including output end current, voltage value, open/short circuit state, input/output amount of each chip in the LEU device 40 to be tested, and the like.
The configuration programming unit 12 is configured to complete a configuration programming process according to the input configuration information, and the test system of the LEU device can normally operate after the configuration programming is completed.
The signal analysis unit 13 is configured to analyze and process specific test items of the output signal of the to-be-tested LEU device 40, where the test items are different according to different test modes, and the output signal of the to-be-tested LEU device 40 is a mixed signal formed by coupling a C1 signal and a C6 signal.
The data acquisition unit 14 is configured to receive data acquired by an acquisition module 24 of the functional module 20, where the acquisition module 24 mainly performs oscilloscope acquisition.
The scene simulation unit 15 is configured to simulate a Train Control Center (TCC), send a real-time message to the to-be-tested LEU device 40 in a message test mode, and receive the real-time message fed back by the to-be-tested LEU device 40, so as to detect whether the output of the to-be-tested LEU device 40 is correct.
To sum up, the embodiment of the present application provides a test system of LEU equipment, the test system of LEU equipment comprises control module 10, functional module 20 and communication group casket 30, functional module 20 includes communication module 21, impedance module 22, switch module 23 and acquisition module 24, communication group casket 30 cooperation communication module 21 realizes communication between control module 10 and the LEU equipment 40 that awaits measuring, control module 10 and functional module 20 carry out the analysis of signal simulation and feedback signal under the different test modes according to the application scene and the operational environment of the LEU equipment 40 that awaits measuring to realize the acquisition of test record under the different test modes, satisfy the test demand of autonomic LEU equipment, and then realize carrying out the purpose of each item test for autonomic LEU equipment.
The embodiments in the present description are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (9)

1. A test system of an LEU device, which is used for testing the LEU device to be tested, and comprises: the system comprises a control module, a functional module and a communication box; wherein,
the control module is used for determining a test mode according to an input instruction, and transmitting a control instruction to the functional module according to the test mode or transmitting a default message to the LEU equipment to be tested according to the test mode; the LEU equipment to be tested is used for receiving a feedback signal of the LEU equipment to be tested, analyzing the feedback signal and generating a test record;
the functional module includes: the device comprises a communication module, an impedance module, a switch module and an acquisition module; the communication module is used for being matched with the communication box to realize communication between the control module and the LEU equipment to be tested;
the impedance module is used for determining an impedance mode corresponding to the test mode according to the control instruction;
the switch module comprises a plurality of relay switches and is used for controlling the closing states of the relay switches according to the control instruction so as to realize the matching of the output channel of the LEU equipment to be tested, the impedance mode and the acquisition channel of the acquisition module;
and the acquisition module is used for acquiring the feedback signal of the LEU equipment to be tested according to the test mode and returning the feedback signal to the control module.
2. The system of claim 1, wherein the control module is further configured to perform configuration programming based on the input configuration information to complete the configuration process.
3. The system according to claim 2, wherein the control module performs configuration programming according to input configuration information to complete a configuration process, and is specifically configured to perform configuration programming according to the input configuration information to determine the default packet and the operation mode of the control module.
4. The test system of an LEU device of claim 1, wherein the test mode comprises: the test system comprises an open circuit test mode, a short circuit test mode, a C interface signal test mode and a message test mode.
5. The test system of an LEU device of claim 4, wherein when the test mode is a short circuit test mode;
the impedance module is specifically used for switching an impedance mode into a short-circuit load mode according to the control instruction;
the switch module is specifically used for sequentially connecting four output channels of the LEU equipment to be tested with the impedance module, and connecting an acquisition channel of the acquisition module with a channel corresponding to the short-circuit load mode of the impedance module;
the acquisition module is specifically used for acquiring an output signal of the LEU equipment to be tested during short circuit test as a feedback signal and transmitting the feedback signal to the control module;
and the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal so as to obtain parameters of each output channel of the LEU equipment to be tested during short circuit test.
6. The test system of an LEU apparatus of claim 4, wherein when the test mode is an open circuit test mode;
the impedance module is specifically configured to switch an impedance mode to an open-circuit load mode according to the control instruction;
the switch module is specifically configured to sequentially connect four output channels of the LEU device to be tested with the impedance module, and connect an acquisition channel of the acquisition module with a channel corresponding to an open load mode of the impedance module;
the acquisition module is specifically used for acquiring an output signal of the LEU equipment to be tested during open circuit testing as a feedback signal and transmitting the feedback signal to the control module;
and the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal so as to obtain parameters of each output channel of the LEU equipment to be tested during open circuit test.
7. The test system of an LEU device of claim 4, wherein when the test mode is a C-interface signal test mode;
the impedance module is specifically used for switching an impedance mode into a normal load mode according to the control instruction;
the switch module is specifically used for sequentially connecting four output channels of the LEU equipment to be tested with the impedance module, and connecting an acquisition channel of the acquisition module with a channel corresponding to a normal load mode of the impedance module;
the acquisition module is specifically used for acquiring an output signal of the LEU equipment to be detected when the LEU equipment to be detected is connected with a channel corresponding to the normal load mode of the impedance module and transmitting the output signal as a feedback signal to the control module;
and the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal so as to obtain test parameters of each output channel of the LEU equipment to be tested in the process of testing the C interface signal.
8. The LEU device testing system of claim 4, wherein when the test mode is a message test mode;
the control module transmits a default message to the LEU equipment to be tested;
the impedance module is specifically configured to switch an impedance mode to a zero impedance mode according to the control instruction;
the switch module is specifically used for sequentially connecting four output channels of the LEU equipment to be tested with the impedance module and connecting an acquisition channel of the acquisition module with the impedance module;
the acquisition module is specifically configured to acquire a real-time message output by the to-be-tested LEU device during message testing, and transmit the real-time message as the feedback signal to the control module;
the control module analyzes the feedback signal and generates a test record, and the test record is specifically used for analyzing the feedback signal and judging whether each output channel of the LEU equipment to be tested outputs a real-time message during message testing.
9. The system of claim 8, wherein the control module analyzes the feedback signal, determines whether each output channel of the LEU device under test outputs a real-time message during message testing, analyzes the real-time message output by the output channel of the LEU device under test to obtain real-time message information, compares the real-time message information with the default message information, determines that the output channel of the LEU device under test outputs a real-time message when the real-time message information is different from the default message information, and determines that the output channel of the LEU device under test does not output a real-time message when the real-time message information is different from the default message information.
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