CN112696195B - Stratum resistivity azimuth anisotropy determining method and device - Google Patents

Stratum resistivity azimuth anisotropy determining method and device Download PDF

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CN112696195B
CN112696195B CN201911011399.2A CN201911011399A CN112696195B CN 112696195 B CN112696195 B CN 112696195B CN 201911011399 A CN201911011399 A CN 201911011399A CN 112696195 B CN112696195 B CN 112696195B
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resistivity
characteristic value
anisotropy
determining
pair
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CN112696195A (en
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李潮流
胡海川
冯周
宋连腾
李霞
胡法龙
宁从前
袁超
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Petrochina Co Ltd
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    • EFIXED CONSTRUCTIONS
    • E21EARTH DRILLING; MINING
    • E21BEARTH DRILLING, e.g. DEEP DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
    • E21B49/00Testing the nature of borehole walls; Formation testing; Methods or apparatus for obtaining samples of soil or well fluids, specially adapted to earth drilling or wells
    • EFIXED CONSTRUCTIONS
    • E21EARTH DRILLING; MINING
    • E21BEARTH DRILLING, e.g. DEEP DRILLING; OBTAINING OIL, GAS, WATER, SOLUBLE OR MELTABLE MATERIALS OR A SLURRY OF MINERALS FROM WELLS
    • E21B47/00Survey of boreholes or wells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02ATECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
    • Y02A90/00Technologies having an indirect contribution to adaptation to climate change
    • Y02A90/30Assessment of water resources

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  • Engineering & Computer Science (AREA)
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  • Mining & Mineral Resources (AREA)
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Abstract

The method and the device for determining the azimuth anisotropy of the formation resistivity, provided by the application, determine the electric anisotropy by utilizing the resistivities measured by the current and the voltage of the electrode microelements on the plurality of pairs of polar plates, and the measured electric anisotropy further comprises azimuth information due to the fact that the plurality of pairs of polar plates have set azimuth angles, so that the anisotropy data are more accurate and comprehensive.

Description

Stratum resistivity azimuth anisotropy determining method and device
Technical Field
The application relates to the technical field of oil field exploration, in particular to a method and a device for determining azimuthal anisotropy of formation resistivity.
Background
In oil exploration, well logging interpretation work needs to provide mechanical elastic parameters required by engineering, including information such as horizontal principal stress, fracture pressure, anisotropy and the like, besides finding and evaluating hydrocarbon reservoirs, so that basis is provided for hydraulic fracturing improvement scheme design.
Anisotropy refers to the fact that the values of the sonic velocity and resistivity of the rock have directional characteristics. It is important to study the anisotropy of rock, since it is mainly derived from the discontinuous structure of rock, macroscopically including joints, cracks, layers, etc., microscopically including the directional arrangement of constituent rock particles or various grades of microcracks, etc. Therefore, the degree of crack/joint/layer formation can be indirectly judged by analyzing the strength and the cause of the anisotropy of the rock, and the extension direction of the hydraulic fracturing artificial joint can be estimated so as to optimize the construction scheme and improve the fracturing effect.
The traditional method for researching the anisotropism is to extract and analyze the fast and slow transverse wave information by special software through cross dipole measurement of the array sound wave so as to judge the anisotropism degree and direction. The current approach to study anisotropy is single and only describes acoustic anisotropy based on array sound waves, which cannot be characterized for other physical parameters.
Disclosure of Invention
To address at least one of the above-mentioned deficiencies, an embodiment of a first aspect of the present application provides a method for determining azimuthal anisotropy of formation resistivity, comprising:
arranging a plurality of pairs of polar plates in a borehole of a logging well at set angle intervals, wherein two polar plates in a pair of polar plates are arranged in a central symmetry manner, a plurality of electrode microelements are arranged on each polar plate, and each polar plate is positioned at the same set height;
applying a voltage to each polar plate to obtain the current of all the electrode microelements on each polar plate;
and determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates.
In some embodiments, the voltage applied to each plate is the same or different.
In some embodiments, each electrode microcell is arranged in an array on the plate on which it is located.
In some embodiments, the determining the azimuthal anisotropy of formation resistivity from the currents and corresponding voltages of all electrode microelements on each pair of plates, and the azimuthal orientation of each pair of plates, comprises:
generating micro-resistivity scanning images according to the currents and the corresponding voltages of all the electrode micro-elements on each pair of polar plates, wherein the micro-resistivity scanning images can represent the resistivity data corresponding to the electrode micro-elements on each pair of polar plates;
counting the resistivity data in each micro resistivity scanning image, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
taking the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding pair of polar plates, and sequencing each characteristic value to obtain a characteristic value sequence;
and calculating the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence, and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the polar plates corresponding to the first characteristic value and the last characteristic value.
In some embodiments, the array of electrode microelements on each plate forms a plurality of columns, each column being spaced apart by a set distance.
In some embodiments, the determining the azimuthal anisotropy of formation resistivity from the currents and corresponding voltages of all electrode microelements on each pair of plates, and the azimuthal orientation of each pair of plates, comprises:
generating a micro-resistivity scanning image according to the current and the corresponding voltage of the electrode micro-elements of each column, wherein the micro-resistivity scanning image can represent the resistivity data corresponding to the electrode micro-elements in each column;
counting the resistivity data of each column, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
taking the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding column, and sequencing each characteristic value to obtain a characteristic value sequence;
and calculating the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence, and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the corresponding columns of the first characteristic value and the last characteristic value.
In some embodiments, the determining the azimuthal anisotropy of formation resistivity from the currents and corresponding voltages of all electrode microelements on each pair of plates, and the azimuthal orientation of each pair of plates, further comprises:
the azimuth angle of each pair of polar plates is calibrated.
In some embodiments, the determining the azimuthal anisotropy of formation resistivity from the currents and corresponding voltages of all electrode microelements on each pair of plates, and the azimuthal orientation of each pair of plates, further comprises:
the azimuth of each column is calibrated.
In some embodiments, the determining the azimuthal anisotropy of formation resistivity from the currents and corresponding voltages of all electrode microelements on each pair of plates, and the azimuthal orientation of each pair of plates, further comprises:
and carrying out median filtering treatment on all the resistivity data.
An embodiment of the second aspect of the present application provides a formation resistivity azimuthal anisotropy determining apparatus, comprising:
the pole plate setting module is used for setting a plurality of pairs of pole plates in a borehole of a logging at set angle intervals, wherein two pole plates in a pair of pole plates are arranged in a central symmetry manner, a plurality of electrode infinitesimal are arranged on each pole plate, and each pole plate is at the same set height;
the current acquisition module is used for applying a voltage to each polar plate and acquiring the currents of all the electrode microelements on each polar plate;
and the anisotropy determining module is used for determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates.
In some embodiments, the voltage applied to each plate is the same or different.
In some embodiments, each electrode microcell is arranged in an array on the plate on which it is located.
In certain embodiments, the anisotropy determination module comprises:
the resistivity data generating unit generates micro-resistivity scanning images according to the currents and the corresponding voltages of all the electrode micro-elements on each pair of polar plates, wherein the micro-resistivity scanning images can represent the resistivity data corresponding to the electrode micro-elements on each pair of polar plates;
a distribution frequency histogram generation unit for counting the resistivity data in each micro resistivity scanning image, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
the characteristic value sequence generating unit takes the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of the corresponding pair of polar plates, and sequences each characteristic value to obtain a characteristic value sequence;
and the anisotropic coefficient generation unit is used for solving the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the polar plates corresponding to the first characteristic value and the last characteristic value.
In some embodiments, the array of electrode microelements on each plate forms a plurality of columns, each column being spaced apart by a set distance.
In certain embodiments, the anisotropy determination module comprises:
a resistivity data generating unit for generating a micro-resistivity scan image according to the current and the corresponding voltage of the electrode micro-elements in each column, wherein the micro-resistivity scan image can represent the resistivity data corresponding to the electrode micro-elements in each column;
a distribution frequency histogram generation unit that counts the resistivity data of each column, sets a distribution interval according to the counted resistivity data, and correspondingly generates a distribution frequency histogram;
the characteristic value sequence generating unit takes the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding column, and sorts each characteristic value to obtain a characteristic value sequence;
and the anisotropic coefficient generation unit is used for obtaining the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the corresponding columns of the first characteristic value and the last characteristic value.
In certain embodiments, the anisotropy determination module further comprises:
and the azimuth angle calibration unit is used for calibrating the azimuth angle of each pair of polar plates.
In certain embodiments, the anisotropy determination module further comprises:
and the azimuth angle calibration unit is used for calibrating the azimuth angle of each column.
In certain embodiments, the anisotropy determination module further comprises:
and the median filtering processing unit is used for carrying out median filtering processing on all the resistivity data.
An embodiment of the third aspect of the present application provides an electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, which when executed by the processor implements the steps of the formation resistivity azimuth anisotropy determination method as described above.
An embodiment of a fourth aspect of the present application provides a computer readable storage medium having stored thereon a computer program which when executed by a processor implements the steps of a formation resistivity azimuth anisotropy determination method as described above.
The beneficial effects of the application are as follows:
the method and the device for determining the azimuth anisotropy of the formation resistivity, provided by the application, determine the electric anisotropy by utilizing the resistivities measured by the current and the voltage of the electrode microelements on the plurality of pairs of polar plates, and the measured electric anisotropy further comprises azimuth information due to the fact that the plurality of pairs of polar plates have set azimuth angles, so that the anisotropy data are more accurate and comprehensive.
Drawings
In order to more clearly illustrate the embodiments of the application or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for determining azimuthal anisotropy of formation resistivity in accordance with an embodiment of the application.
FIG. 2a shows a top view of a wellbore in an embodiment of the application.
Fig. 2b shows a schematic diagram of a bipolar plate in an embodiment of the application.
Fig. 2c shows a schematic view of a button electrode in an embodiment of the present application.
FIG. 3 is a schematic diagram showing a comparative example of electrical anisotropy and array acoustic anisotropy in an embodiment of the present application.
FIG. 4 shows a schematic structural diagram of a device for determining the azimuthal anisotropy of formation resistivity in an embodiment of the application.
Fig. 5 shows a schematic diagram of an electronic device suitable for implementing an embodiment of the application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the application without making any inventive effort, are intended to be within the scope of the application.
FIG. 1 illustrates a method of formation resistivity azimuthal anisotropy determination, comprising:
s1: arranging a plurality of pairs of polar plates in a borehole of a logging well at set angle intervals, wherein two polar plates in a pair of polar plates are arranged in a central symmetry manner, a plurality of electrode microelements are arranged on each polar plate, and each polar plate is positioned at the same set height;
s2: applying a voltage to each polar plate to obtain the current of all the electrode microelements on each polar plate;
s3: and determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates.
The method for determining the azimuth anisotropy of the formation resistivity provided by the application utilizes the resistivities measured by the current and the voltage of electrode microelements on a plurality of pairs of polar plates to determine the electric anisotropy, and the measured electric anisotropy further comprises azimuth information due to the fact that the plurality of pairs of polar plates have set azimuth angles, so that the anisotropy data is more accurate and comprehensive.
In some embodiments, the plate may be provided by a microresistivity imaging scanner, which is currently used primarily for crack identification and does not have a way to extract the anisotropy of the resistivity distribution at different orientations based on the image.
In this embodiment, step S3 specifically includes:
s311: generating micro-resistivity scanning images according to the currents and the corresponding voltages of all the electrode micro-elements on each pair of polar plates, wherein the micro-resistivity scanning images can represent the resistivity data corresponding to the electrode micro-elements on each pair of polar plates;
s312: counting the resistivity data in each micro resistivity scanning image, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
s313: taking the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding pair of polar plates, and sequencing each characteristic value to obtain a characteristic value sequence;
s314: and calculating the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence, and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the polar plates corresponding to the first characteristic value and the last characteristic value.
The micro resistivity scanning image can show the resistivity data detected by each electrode micro element, the resistivity data are counted according to a certain distribution interval, a distribution frequency chart corresponding to each pair of polar plates is obtained, the median of the distribution interval with the highest frequency is taken as a characteristic value, namely, each pair of polar plates generates a characteristic value, and the characteristic value can be used for representing the resistivity characteristic value of the azimuth angle corresponding to the polar plate.
In some specific embodiments, a plurality of polar plates (corresponding to different orientations) on the instrument are grouped according to the distribution orientations, the polar plates which are 180 degrees different form a polar plate pair, and the corresponding micro-resistivity data matrix characteristic values are counted; and similarly processing the polar plate pairs in different orientations, judging the orientations of the maximum and minimum values, and adopting the ratio of the maximum value to the minimum value as the electric anisotropy coefficient of the depth.
More specifically, please refer to fig. 2a. First, the plate group is conducted according to the specific instrument type, 4 plates are total, namely 1# plate, 2# plate, 3# plate and 4# plate, and the two plates are different by 90 degrees. Each polar plate is provided with a main polar plate and an auxiliary polar plate, so that 8 polar plates are provided in total. The group pair mode is that the 1# main pole plate is paired with the 3# main pole plate, the 1# auxiliary pole plate is paired with the 3# auxiliary pole plate, the 2# main pole plate is paired with the 4# main pole plate, and the 2# auxiliary pole plate is paired with the 4# auxiliary pole plate, so that 4 pairs of pole plates are formed in total.
The current electric anisotropy measurement can be carried out by a method for inverting the resistivity anisotropy of the array lateral resistivity logging, and compared with a method for judging the anisotropy by extracting the fast and slow transverse waves by the array acoustic logging, the method can provide electric anisotropy information and judge the distribution direction of the maximum and minimum resistivity of the stratum. Compared with the method for inverting the resistivity anisotropy of the array lateral resistivity well logging, the method provided by the application has the advantages that the electrical anisotropy result has azimuth information with higher resolution, and the azimuth information can only be reflected by the average horizontal resistivity and the average vertical resistivity.
In some embodiments, to avoid the problem of excessive data throughput, a processing window may be selected, within which the resistivity data is selected.
Furthermore, in some embodiments, the median filtering process may be advanced to reject noise.
For example, in one processing window length, all the median filtered resistivity data are grouped into 4 groups according to the above group pairing mode, the distribution frequency histogram of each group is counted, and the peak value is selected as the characteristic value, so that the resistivity characteristic values in 4 different directions are obtained in total.
In order to make the anisotropic calculation more accurate, the application further arranges the electrode microelements on each polar plate to form a plurality of columns, and the distance is set between each column.
In this embodiment, since each column has a distance interval, the converted azimuth angle also has a converted angle corresponding to the distance interval, and each column is used as a processing group to count the resistivity data of each column, that is, step S3 in this embodiment specifically includes:
s321: generating a micro-resistivity scanning image according to the current and the corresponding voltage of the electrode micro-elements of each column, wherein the micro-resistivity scanning image can represent the resistivity data corresponding to the electrode micro-elements in each column;
s322: counting the resistivity data of each column, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
s323: taking the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding column, and sequencing each characteristic value to obtain a characteristic value sequence;
s324: and calculating the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence, and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the corresponding columns of the first characteristic value and the last characteristic value.
In this embodiment, each column has a characteristic value, and each column corresponds to an azimuth angle, so that the calculation accuracy of the anisotropic coefficient can be made higher.
In addition, the method further comprises the following steps: calibrating azimuth angles of each polar plate or calibrating azimuth angles of each column.
Specifically, one of the polar plates or columns can be calibrated, and then the azimuth angle of each polar plate or column is calculated through geometric conversion.
Referring to the specific example, fig. 2a to 2c are schematic diagrams of plate structures of conventional micro resistivity scanning imaging logging instruments. Fig. 2a is a schematic diagram of the structure of a plate when the apparatus is in operation in a borehole, fig. 2b is a schematic diagram of a plate in which a pair is 180 ° different, and fig. 2c is a schematic diagram of a matrix of button electrodes on the plate, each button electrode measuring a resistivity. Fig. 3 shows the actual processing results. The first path is depth, and the second path is GR curve and double-well path curve reflecting stratum lithology; the third pass is a micro-scanned static image; the fourth path is the electric anisotropy curve DANI extracted by the method and the time difference anisotropy curve SLOANI extracted from the fast and slow transverse waves of the array sound waves, which have good consistency, so that the method can accurately calculate the stratum electric anisotropy coefficient consistent with the array sound wave logging.
FIG. 4 shows a device for determining azimuthal anisotropy of formation resistivity according to an embodiment of the application, including:
the pole plate setting module 1 is used for setting a plurality of pairs of pole plates in a borehole of a logging at set angle intervals, wherein two pole plates in a pair of pole plates are arranged in a central symmetry manner, a plurality of electrode microelements are arranged on each pole plate, and each pole plate is at the same set height;
the current acquisition module 2 is used for applying a voltage to each polar plate and acquiring the currents of all the electrode microelements on each polar plate;
and the anisotropy determining module 3 determines the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates.
The stratum resistivity azimuth anisotropy determining device provided by the application utilizes the resistivities measured by the current and the voltage of the electrode microelements on the plurality of pairs of polar plates to determine the electric anisotropy, and the measured electric anisotropy further comprises azimuth information due to the fact that the plurality of pairs of polar plates have set azimuth angles, so that the anisotropy data are more accurate and comprehensive.
Based on the same inventive concept, in one embodiment, the voltages applied to each plate are the same or different.
Based on the same inventive concept, in an embodiment, each electrode microcell is arranged in an array on the electrode plate where it is located.
Based on the same inventive concept, in an embodiment, the anisotropy determining module includes:
the resistivity data generating unit generates micro-resistivity scanning images according to the currents and the corresponding voltages of all the electrode micro-elements on each pair of polar plates, wherein the micro-resistivity scanning images can represent the resistivity data corresponding to the electrode micro-elements on each pair of polar plates;
a distribution frequency histogram generation unit for counting the resistivity data in each micro resistivity scanning image, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
the characteristic value sequence generating unit takes the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of the corresponding pair of polar plates, and sequences each characteristic value to obtain a characteristic value sequence;
and the anisotropic coefficient generation unit is used for solving the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the polar plates corresponding to the first characteristic value and the last characteristic value.
Based on the same inventive concept, in one embodiment, the electrode microelements on each polar plate are arranged to form a plurality of columns, and a distance is set between each two columns.
In this embodiment, the anisotropy determination module includes:
a resistivity data generating unit for generating a micro-resistivity scan image according to the current and the corresponding voltage of the electrode micro-elements in each column, wherein the micro-resistivity scan image can represent the resistivity data corresponding to the electrode micro-elements in each column;
a distribution frequency histogram generation unit that counts the resistivity data of each column, sets a distribution interval according to the counted resistivity data, and correspondingly generates a distribution frequency histogram;
the characteristic value sequence generating unit takes the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding column, and sorts each characteristic value to obtain a characteristic value sequence;
and the anisotropic coefficient generation unit is used for obtaining the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the corresponding columns of the first characteristic value and the last characteristic value.
Based on the same inventive concept, in an embodiment, the anisotropic determination module further includes:
and the azimuth angle calibration unit is used for calibrating the azimuth angle of each pair of polar plates.
Based on the same inventive concept, in an embodiment, the anisotropic determination module further includes:
and the azimuth angle calibration unit is used for calibrating the azimuth angle of each column.
Based on the same inventive concept, in an embodiment, the anisotropic determination module further includes:
and the median filtering processing unit is used for carrying out median filtering processing on all the resistivity data.
The embodiment of the present application further provides a specific implementation manner of an electronic device capable of implementing all the steps in the method in the foregoing embodiment, and referring to fig. 5, the electronic device specifically includes the following:
a processor (processor) 601, a memory (memory) 602, a communication interface (Communications Interface) 603, and a bus 604;
wherein the processor 601, the memory 602, and the communication interface 603 complete communication with each other through the bus 604;
the processor 601 is configured to invoke a computer program in the memory 602, where the processor executes the computer program to implement all the steps in the method in the above embodiment, for example, the processor executes the computer program to implement the following steps:
s1: arranging a plurality of pairs of polar plates in a borehole of a logging well at set angle intervals, wherein two polar plates in a pair of polar plates are arranged in a central symmetry manner, a plurality of electrode microelements are arranged on each polar plate, and each polar plate is positioned at the same set height;
s2: applying a voltage to each polar plate to obtain the current of all the electrode microelements on each polar plate;
s3: and determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates.
From the above description, the present application provides a computer device for determining electrical anisotropy by using the resistivities measured by the currents and voltages of the electrode microelements on the pairs of polar plates, and since the pairs of polar plates have set azimuth angles, the measured electrical anisotropy further contains azimuth information, and the anisotropy data is more accurate and comprehensive.
An embodiment of the present application also provides a computer-readable storage medium capable of implementing all the steps of the method in the above embodiment, the computer-readable storage medium storing thereon a computer program that, when executed by a processor, implements all the steps of the method in the above embodiment, for example, the processor implements the following steps when executing the computer program:
s1: arranging a plurality of pairs of polar plates in a borehole of a logging well at set angle intervals, wherein two polar plates in a pair of polar plates are arranged in a central symmetry manner, a plurality of electrode microelements are arranged on each polar plate, and each polar plate is positioned at the same set height;
s2: applying a voltage to each polar plate to obtain the current of all the electrode microelements on each polar plate;
s3: and determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates.
As can be seen from the above description, the computer readable storage medium provided by the present application uses the resistivities measured by the currents and voltages of the electrode microelements on the pairs of polar plates to determine the electrical anisotropy, and since the pairs of polar plates have the set azimuth angles, the measured electrical anisotropy further contains azimuth information, and the anisotropy data is more accurate and comprehensive.
In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for a hardware+program class embodiment, the description is relatively simple, as it is substantially similar to the method embodiment, as relevant see the partial description of the method embodiment. Although the present description provides method operational steps as described in the examples or flowcharts, more or fewer operational steps may be included based on conventional or non-inventive means. The order of steps recited in the embodiments is merely one way of performing the order of steps and does not represent a unique order of execution. When implemented in an actual device or end product, the instructions may be executed sequentially or in parallel (e.g., in a parallel processor or multi-threaded processing environment, or even in a distributed data processing environment) as illustrated by the embodiments or by the figures. The terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, it is not excluded that additional identical or equivalent elements may be present in a process, method, article, or apparatus that comprises a described element. For convenience of description, the above devices are described as being functionally divided into various modules, respectively. Of course, when implementing the embodiments of the present disclosure, the functions of each module may be implemented in the same or multiple pieces of software and/or hardware, or a module that implements the same function may be implemented by multiple sub-modules or a combination of sub-units, or the like. The above-described apparatus embodiments are merely illustrative, for example, the division of the units is merely a logical function division, and there may be additional divisions when actually implemented, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form. The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks. It will be appreciated by those skilled in the art that embodiments of the present description may be provided as a method, system, or computer program product. Accordingly, the present specification embodiments may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present description embodiments may take the form of a computer program product on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) having computer-usable program code embodied therein. In this specification, each embodiment is described in a progressive manner, and identical and similar parts of each embodiment are all referred to each other, and each embodiment mainly describes differences from other embodiments. In particular, for system embodiments, since they are substantially similar to method embodiments, the description is relatively simple, as relevant to see a section of the description of method embodiments. In the description of the present specification, a description referring to terms "one embodiment," "some embodiments," "examples," "specific examples," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the embodiments of the present specification. In this specification, schematic representations of the above terms are not necessarily directed to the same embodiment or example. Furthermore, the different embodiments or examples described in this specification and the features of the different embodiments or examples may be combined and combined by those skilled in the art without contradiction. The foregoing is merely an example of an embodiment of the present disclosure and is not intended to limit the embodiment of the present disclosure. Various modifications and variations of the illustrative embodiments will be apparent to those skilled in the art. Any modification, equivalent replacement, improvement, or the like, which is within the spirit and principles of the embodiments of the present specification, should be included in the scope of the claims of the embodiments of the present specification.

Claims (18)

1. A method for determining azimuthal anisotropy of formation resistivity, comprising:
arranging a plurality of pairs of polar plates in a borehole of a logging well at set angle intervals, wherein two polar plates in a pair of polar plates are arranged in a central symmetry manner, a plurality of electrode microelements are arranged on each polar plate, and each polar plate is positioned at the same set height;
applying a voltage to each polar plate to obtain the current of all the electrode microelements on each polar plate;
determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates;
wherein the determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates comprises:
generating micro-resistivity scanning images according to the currents and the corresponding voltages of all the electrode micro-elements on each pair of polar plates, wherein the micro-resistivity scanning images can represent the resistivity data corresponding to the electrode micro-elements on each pair of polar plates;
counting the resistivity data in each micro resistivity scanning image, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
taking the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding pair of polar plates, and sequencing each characteristic value to obtain a characteristic value sequence;
and calculating the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence, and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the polar plates corresponding to the first characteristic value and the last characteristic value.
2. The method of determining azimuthal anisotropy of formation resistivity according to claim 1, wherein the voltages applied to each plate are the same or different.
3. The method of determining azimuthal anisotropy of formation resistivity according to claim 1, wherein each electrode cell is arranged in an array on the plate where it is located.
4. The method of determining the azimuthal anisotropy of formation resistivity according to claim 3, wherein the array of microelements on each plate form a plurality of columns, each column being spaced apart by a set distance.
5. The method of determining azimuthal anisotropy of formation resistivity according to claim 4, wherein the determining azimuthal anisotropy of formation resistivity comprises:
generating a micro-resistivity scanning image according to the current and the corresponding voltage of the electrode micro-elements of each column, wherein the micro-resistivity scanning image can represent the resistivity data corresponding to the electrode micro-elements in each column;
counting the resistivity data of each column, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
taking the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding column, and sequencing each characteristic value to obtain a characteristic value sequence;
and calculating the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence, and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the corresponding columns of the first characteristic value and the last characteristic value.
6. The method of determining azimuthal anisotropy of formation resistivity according to claim 1, wherein the determining azimuthal anisotropy of formation resistivity based on the currents and corresponding voltages of all electrode microelements on each pair of plates, and the azimuthal orientation of each pair of plates, further comprises:
the azimuth angle of each pair of polar plates is calibrated.
7. The method of determining azimuthal anisotropy of formation resistivity according to claim 5, wherein the determining azimuthal anisotropy of formation resistivity further comprises:
the azimuth of each column is calibrated.
8. The method of determining azimuthal anisotropy of formation resistivity according to claim 1 or 5, further comprising:
and carrying out median filtering treatment on all the resistivity data.
9. A formation resistivity azimuthal anisotropy determining apparatus, comprising:
the pole plate setting module is used for setting a plurality of pairs of pole plates in a borehole of a logging at set angle intervals, wherein two pole plates in a pair of pole plates are arranged in a central symmetry manner, a plurality of electrode infinitesimal are arranged on each pole plate, and each pole plate is at the same set height;
the current acquisition module is used for applying a voltage to each polar plate and acquiring the currents of all the electrode microelements on each polar plate;
the anisotropy determining module is used for determining the azimuthal anisotropy of the formation resistivity according to the currents and the corresponding voltages of all the electrode microelements on each pair of polar plates and the azimuth of each pair of polar plates;
wherein the anisotropy determination module comprises:
the resistivity data generating unit generates micro-resistivity scanning images according to the currents and the corresponding voltages of all the electrode micro-elements on each pair of polar plates, wherein the micro-resistivity scanning images can represent the resistivity data corresponding to the electrode micro-elements on each pair of polar plates;
a distribution frequency histogram generation unit for counting the resistivity data in each micro resistivity scanning image, setting a distribution interval according to the counted resistivity data, and correspondingly generating a distribution frequency histogram;
the characteristic value sequence generating unit takes the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of the corresponding pair of polar plates, and sequences each characteristic value to obtain a characteristic value sequence;
and the anisotropic coefficient generation unit is used for solving the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence and generating an anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angles of the polar plates corresponding to the first characteristic value and the last characteristic value.
10. The apparatus for determining azimuthal anisotropy of formation resistivity according to claim 9, wherein the voltages applied to each plate are the same or different.
11. The device for determining the azimuthal anisotropy of formation resistivity according to claim 9, wherein each electrode cell is arranged in an array on the plate where it is located.
12. The apparatus of claim 11, wherein the array of microelements on each plate forms a plurality of columns, each column being spaced apart by a set distance.
13. The formation resistivity azimuthal anisotropy determining apparatus as described in claim 12, wherein,
a resistivity data generating unit further configured to generate a micro-resistivity scan image, which may represent resistivity data corresponding to the electrode micro-elements in each column, from the current and the corresponding voltage of the electrode micro-elements in each column;
a distribution frequency histogram generation unit configured to count resistivity data of each column, set a distribution interval according to the counted resistivity data, and correspondingly generate a distribution frequency histogram;
the characteristic value sequence generating unit is further configured to sort each characteristic value by taking the median of the distribution interval with the highest frequency in each distribution frequency histogram as the characteristic value of a corresponding column, so as to obtain a characteristic value sequence;
and the anisotropic coefficient generation unit is further configured to obtain the ratio of the first characteristic value to the last characteristic value in the characteristic value sequence, and generate the anisotropic coefficient corresponding to the azimuth angle of the resistivity of the set height according to the azimuth angle of the column corresponding to the first characteristic value and the last characteristic value.
14. The formation resistivity azimuth anisotropy determining device of claim 9, wherein the anisotropy determining module further comprises:
and the azimuth angle calibration unit is used for calibrating the azimuth angle of each pair of polar plates.
15. The formation resistivity azimuth anisotropy determining device of claim 13, wherein the anisotropy determining module further comprises:
and the azimuth angle calibration unit is used for calibrating the azimuth angle of each column.
16. The formation resistivity azimuth anisotropy determining device of claim 9 or 13, wherein the anisotropy determining module further comprises:
and the median filtering processing unit is used for carrying out median filtering processing on all the resistivity data.
17. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the method of any one of claims 1 to 8 when executing the program.
18. A computer readable storage medium, on which a computer program is stored, characterized in that the computer program, when being executed by a processor, implements the method of any one of claims 1 to 8.
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