CN112683398B - Solid laser power measurement calibration method and device - Google Patents
Solid laser power measurement calibration method and device Download PDFInfo
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Abstract
The embodiment of the application provides a method and a device for measuring and calibrating power of a solid laser. The method comprises the following steps: performing photoelectric conversion on an optical signal emitted by the solid laser to obtain a voltage signal corresponding to optical power; converting the voltage signal corresponding to the optical power into a digital signal with level quantization corresponding to the optical power; carrying out anti-pulse interference processing on a digital signal with quantized optical power level, namely an optical power level quantized value, and then carrying out mean value filtering to obtain an optical power level quantized average value; obtaining a corresponding optical power level quantization threshold revision value according to a preset threshold value; and carrying out sectional calibration according to the optical power level quantization threshold value revision value and a reference power value detected by a thermoelectric laser power probe positioned outside the solid laser to obtain a level quantization calibration value of optical power output. According to one embodiment, the measurement feedback value of the photodiode type laser power probe can be corrected to be close to the actual power value of the solid laser.
Description
Technical Field
The embodiment of the application relates to the technical field of laser pre-factory power calibration, and provides a solid laser power measurement calibration method and device.
Background
It is noted that the technical contents referred to herein are made for the purpose of enhancing an understanding of the present application, and do not necessarily represent that these contents can be regarded as the prior art.
At present, along with the development of the technology, the development of the solid laser makes remarkable progress, and is praised as the revival era of the solid laser. Solid lasers have a wide range of applications in the military, processing, medical and scientific research fields. It is commonly used in ranging, tracking, guidance, drilling, cutting and welding, annealing of semiconductor materials, micromachining of electronic devices, atmospheric sensing, spectroscopic studies, surgical and ophthalmic surgery, plasma diagnostics, pulse holography, and laser nuclear fusion.
In actual operation, there is a problem that the actual laser power of the generated laser does not match the required laser power, which may be caused by xenon lamp attenuation, crystal damage, resonator damage, optical path pollution or water path pollution. When the actual laser power does not match the required laser power, the use effect of the laser device is affected.
In the process of development, production and application of a laser, the step of measuring and calibrating the power of the laser is an essential step, and a laser power probe is divided into a thermoelectric type laser power probe and a photodiode type laser power probe according to different principles and materials.
The photodiode type laser power probe has very fast response time and very high response frequency, but has certain limitation on the use wavelength, for example, a Si photodiode can only measure light within 1 micron generally, and is more suitable for measuring laser with small power, for example, laser with 1pW to hundreds mW can be directly detected, and a filter with a specific waveband is added, so that laser within 3W can be measured.
Thermoelectric type laser power probe, because of its absorbent material kind is more, different absorbent material corresponds different absorption spectrum and different power density damage threshold, all can use from ultraviolet to far infrared band, and measuring range is wide, can follow mW magnitude to several kW magnitudes. When continuous laser irradiation is measured, when a laser light source irradiates a detector target center of a thermopile, generated heat is converted into electric potential through the detector, the electric potential is diffused from the center to the edge along a passive region, electric potential difference is formed between the hot end and the cold end of the thermocouple, and finally the electric potential is read by a voltmeter.
Disclosure of Invention
The applicant researches and discovers that in the field of power measurement and calibration before the solid laser leaves a factory, a thermoelectric laser power probe is common, the measurement result is accurate and reliable, heat dissipation is generally considered in the technology, the size of the solid laser power probe is large, and the solid laser power probe is not suitable for being integrated into a solid laser cavity.
On the other hand, the applicant also found that, since the solid-state laser is basically controlled by pulses, the measurement feedback value of the photodiode-type laser power probe is affected by the interference generated by the frequency pulse signal, and the measurement result is deviated to some extent and inaccurate, and further, the solid-state laser needs to be calibrated by the thermoelectric-type laser power probe before shipment, so as to correct the measurement feedback value of the photodiode-type laser power probe.
Therefore, it is desirable to provide a method for calibrating power measurement of a solid-state laser, which can correct the measurement feedback value of the photodiode-type laser power probe to approach the actual power value of the solid-state laser without interfering with the normal operation of the solid-state laser (e.g., without requiring an external thermoelectric laser power probe to perform real-time measurement and thus increase the cost).
Technical problem to be solved by the invention
The inventor of the invention intensively studies and provides a solid laser power measurement calibration method, and aims to solve the technical problem that the measurement feedback value of a photodiode type laser power probe deviates from the actual power value of a solid laser to cause the erroneous judgment of the actual output power of the solid laser by a user.
Means for solving the problems
A method for measuring and calibrating power of a solid laser comprises the following steps:
s1, performing photoelectric conversion on an optical signal emitted by the solid laser through a photodiode type laser power probe positioned in the solid laser to obtain a voltage signal corresponding to the optical power;
s2, converting the voltage signal corresponding to the optical power into a level-quantized digital signal corresponding to the optical power, i.e. an optical power level quantized value;
s3, performing anti-pulse interference processing on the digital signal with the quantified optical power level, namely the quantified optical power level, and performing mean value filtering to obtain a quantified mean value of the optical power level;
s4, obtaining a corresponding optical power level quantization threshold value revision value according to a preset threshold value; and
and S5, performing segmented calibration according to the optical power level quantization threshold value revision value and a reference power value detected by a thermoelectric laser power probe positioned outside the solid laser to obtain a level quantization calibration value of optical power output.
Further, step S1 includes the following steps:
s11, converting the optical signal emitted by the solid laser into a voltage signal through the photoelectric conversion circuit;
s12, amplifying the voltage signal by a differential amplifier circuit; and
and S13, performing active second-order low-pass filtering on the voltage signal amplified by the differential amplifying circuit through the signal conditioning circuit.
Further, S3 includes the steps of:
step S31, collecting n quantized values X (i) of optical power levels, wherein i is an integer from 1 to n, n is greater than 2, and the n quantized values of optical power levels from X (1) to X (n) are stored in a one-dimensional array;
step S32, comparing the quantized values of the optical power levels one by one from X (1) to X (n) in the one-dimensional array, and arranging the quantized values into an ordered sequence from big to small;
step S33, finding the maximum value of the quantized value of the optical power level from the ordered sequence of step S32 and assigning it to XmaxAnd finding the minimum of the quantized values of the optical power level and assigning it to Xmin；
Step S34, calculating the sum of n quantized values of optical power level, and removing the maximum value X of quantized optical power levelmaxAnd minimum value X of optical power level quantizationminThe formula is as follows:
step S35, removing the maximum value X of the optical power level quantizationmaxAnd minimum value X of optical power level quantizationminAnd averaging the sum of the quantized values of the optical power level to obtain a quantized average value of the optical power level, wherein the formula is as follows:
further, step S4 includes the following steps: quantizing the optical power level to an average value EmMinus a predetermined threshold E0The collection starting point of the quantized value of the optical power level is reset to zero to obtain a revised value delta E of the quantized threshold value of the optical power levelmThe formula is as follows:
ΔEm＝Em-E0 (m≥0)；
wherein E is0Is a fixed preset threshold.
Further, step S5 includes the following steps:
step S51, collecting j light power level quantization threshold value revision values delta EkWhere k is a number from 1 to j, from Δ E1To Δ EjThe j quantized threshold values of the optical power level are stored in a one-dimensional array;
step S52, inputting reference power values detected by thermoelectric laser power probes outside the solid laser corresponding to the j quantized threshold values of optical power level
Where k is a number from 1 to j, from
To
Reference power values detected by a thermoelectric laser power probe positioned outside the solid laser and corresponding to the j optical power level quantization threshold revision values are stored in a one-dimensional array;
step S53, obtaining the linear formula proportional term of the optical power output value by using the reference power value detected by every two adjacent thermoelectric laser power probes positioned outside the solid laser and the corresponding optical power level quantization threshold revision value
The formula is as follows:
step S54, utilizing the light power level to quantize the threshold revision value Delta EkProportional term of linear formula of sum light power output value
Obtaining a linear formula constant term of the light power output value, wherein the formula is as follows:
step S55, linear formula proportional term of light power output value
Adding, and carrying out arithmetic average filtering to obtain a linear formula proportional term average value a of the optical power output value, wherein the formula is as follows:
step S56, linear formula constant term of light power output value
Adding, and carrying out arithmetic mean filtering to obtain a constant term b of a linear formula of the optical power output value, wherein the formula is as follows:
step S57, obtaining a level quantization calibration value of the optical power output according to a linear formula by using the optical power output value linear formula proportion term a and the optical power output value linear formula constant term b, where the formula is:
Pk＝aΔEk+b。
further, the method for measuring and calibrating the power of the solid laser further comprises the following steps: and S6, displaying the level quantization calibration value of the segmented calibrated optical power output in real time through the display device.
On the other hand, a solid laser power measurement calibration device is provided for implementing the solid laser power measurement calibration method, which includes:
the photoelectric diode type laser power probe is used for performing photoelectric conversion on the emitted light signals to obtain voltage signals corresponding to light power;
the analog-digital conversion module is used for converting the voltage signal corresponding to the optical power into a digital signal with level quantization corresponding to the optical power, namely an optical power level quantization value;
the interference preventing average filter is used for carrying out pulse interference preventing treatment on a digital signal with quantized optical power level, namely an optical power level quantized value, and then carrying out average filtering to obtain an optical power level quantized average value;
the threshold value revising module is used for obtaining a corresponding optical power level quantization threshold value revising value according to a preset threshold value;
the piecewise linearization module is used for carrying out piecewise calibration according to the optical power level quantization threshold revision value and a reference power value detected by a thermoelectric laser power probe positioned outside the solid laser to obtain a level quantization calibration value of optical power output; and
and the display device is used for displaying the level quantization calibration value of the optical power output of the sectional calibration in real time.
ADVANTAGEOUS EFFECTS OF INVENTION
In the method for measuring and calibrating the power of the solid laser according to an embodiment, before the solid laser leaves a factory, after a voltage signal corresponding to optical power is obtained through photoelectric conversion, a voltage amplitude severe fluctuation signal caused by pulse interference is removed, for an accidental pulse interference error, a sampling error can be eliminated by adopting pulse interference prevention processing, a high-frequency interference signal in the sampling signal is effectively removed, then, a piecewise successive approximation mode is adopted, a curve of an optical power output value is linearized, and a measurement feedback value of a photodiode type laser power probe is corrected to be close to an actual power value of the solid laser (for example, a measurement result detected by a thermoelectric type laser power probe). In a further embodiment, the quantized value of the optical power output is made to be closer to the actual power value of the solid laser by arithmetic mean filtering of a proportional term and a constant term of a linear formula of the optical power output value.
Drawings
FIG. 1 is an exemplary flow chart of a solid state laser power measurement calibration method according to an embodiment;
FIG. 2 is an exemplary flowchart of photoelectric conversion and processing steps in a solid state laser power measurement calibration method according to an embodiment;
FIG. 3 is an exemplary flowchart of the steps of pulse interference prevention and mean value filtering in the calibration method for measuring the power of the solid state laser according to one embodiment;
FIG. 4 is an exemplary flowchart of a piecewise linearization step in a solid state laser power measurement calibration method according to one embodiment;
FIG. 5 is a functional block diagram of an optical-to-electrical conversion circuit of a photodiode-type laser power probe within a solid state laser of the present application in some embodiments;
FIG. 6 is a schematic circuit diagram of an optoelectronic conversion circuit of a photodiode-type laser power probe within a solid state laser according to the present application in some embodiments;
fig. 7 is a block diagram of a solid-state laser power measurement calibration apparatus for implementing the solid-state laser power measurement calibration method according to an embodiment.
Detailed Description
It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
In the following description, suffixes such as "module", "component", or "unit" used to denote elements are used only for facilitating the explanation of the present invention, and have no specific meaning in itself. Thus, "module", "component" or "unit" may be used mixedly.
Referring to fig. 1, in the illustrated embodiment, the method for calibrating the power measurement of the solid-state laser includes the following steps:
s1, performing photoelectric conversion on an optical signal emitted by the solid laser through a photodiode type laser power probe positioned in the solid laser to obtain a voltage signal corresponding to the optical power;
s2, converting the voltage signal corresponding to the optical power into a level-quantized digital signal corresponding to the optical power, i.e. an optical power level quantized value;
s3, performing anti-pulse interference processing on the digital signal with the quantified optical power level, namely the quantified optical power level, and performing mean value filtering to obtain a quantified mean value of the optical power level;
s4, obtaining a corresponding optical power level quantization threshold value revision value according to a preset threshold value; and
and S5, performing segmented calibration according to the optical power level quantization threshold value revision value and a reference power value detected by a thermoelectric laser power probe positioned outside the solid laser to obtain a level quantization calibration value of optical power output.
Specifically, as shown in fig. 2, step S1 includes the following steps:
s11, converting the optical signal emitted by the solid laser into a voltage signal through the photoelectric conversion circuit;
s12, amplifying the voltage signal by a differential amplifier circuit; and
and S13, performing active second-order low-pass filtering on the voltage signal amplified by the differential amplifying circuit through the signal conditioning circuit.
As shown in fig. 5 and 6, the photoelectric conversion circuit 100 includes:
the photodiode D1 with the grounded anode is used for receiving an optical signal emitted by the solid laser and converting the optical signal into an inverted bias current signal; and
a feedback resistor for converting the inverted bias current signal to a voltage signal, the feedback resistor comprising: a first resistor R1 having one end connected to the negative electrode of the photodiode D1; a second resistor R2 having one end connected to the first resistor R1; a third resistor R3 having one end connected to the first resistor R1 and the other end grounded; and
one end of a first capacitor C1, one end of a first capacitor C1 is connected with the cathode of the photodiode D1, and the first capacitor C1 is a voltage stabilizing capacitor and can play a role in filtering and stabilizing voltage; and
the inverting input terminal of the first operational amplifier IC1A is connected to the cathode of the photodiode D1, the other terminal of the first resistor R1, and the other terminal of the first capacitor C1, respectively, of the first operational amplifier IC 1A.
In the conventional technology, when the power of the optical signal output by the solid laser is detected, the power of the optical signal output by the solid laser at the light outlet is directly measured, and the power at the light outlet is generally higher, so that no method is available for synchronously using the solid laser when the power of the optical signal output by the solid laser is detected. The optical signal to be detected with weak intensity is separated from the optical path of the solid laser and is used for detecting the power of the optical signal output by the solid laser, so that the problem of synchronously using the solid laser when detecting the power of the light emitted by the solid laser can be solved.
The power of the optical signal output by the solid-state laser and the voltage corresponding to the voltage signal converted from the optical signal form a positive correlation relationship, so that the power of the optical signal output by the solid-state laser can be known only by detecting the voltage signal, and the power is convenient to regulate and control. The present application is made at least partially according to the foregoing principle, and particularly, as mentioned above, the present application is mainly realized by the photoelectric conversion circuit 100 converting an optical signal emitted by a solid-state laser into a voltage signal, and the operation principle of the photoelectric conversion circuit 100 is as follows:
the load resistance of the photodiode D1 constitutes the input impedance between two input terminals (two input terminals refer to the non-inverting input terminal and the inverting input terminal of the operational amplifier) of the first operational amplifier IC1A, so that the photodiode can be considered to be in a short-circuit state when the amplification factor and the feedback resistance of the operational amplifier of the first operational amplifier IC1A are greater than predetermined criteria (the predetermined criteria can be determined by those skilled in the art according to actual needs). Thus, the photodiode can output an ideal reverse bias current in a short-circuit state, which becomes a negative voltage signal through the feedback resistors (i.e., the first resistor R1, the second resistor R2, and the third resistor R3), according to the received optical signal.
It should be noted that the feedback resistors (i.e., the first resistor R1, the second resistor R2, and the third resistor R3) are used for collecting the reverse bias current of the photodiode D1, and convert the current signal in the circuit into a voltage signal, and under the condition of a constant current, the magnitude of the feedback resistor can change the magnitude of the output voltage.
The principle that the photodiode can output an ideal reverse bias current in a short circuit state according to a received optical signal is as follows: according to the forward conduction characteristic of the diode, when the diode is changed into positive-phase impedance, the impedance value is small, and when the diode is changed into negative-phase impedance, the impedance value is large, so that the unidirectionality of current flowing through the diode can be ensured. Therefore, under the condition that the positive phase of the photodiode D1 is grounded, the conducting forward voltage of the photodiode D1 is also grounded, and the other end of the photodiode D1 needs to be negatively charged; accordingly, all feedback resistors (including the first resistor R1, the second resistor R2, and the third resistor R3) collect negative current because if they are positive current, the photodiode cannot conduct.
In other words, in the process of detecting the power of the output light of the solid-state laser, the photodiode is used to convert the optical signal into a voltage signal, and the power of the output light signal of the solid-state laser is measured according to the voltage signal. The photodiode has a very wide spectrum effect, is sensitive to weak light and has extremely short time for responding to optical signals; therefore, when the optical signal to be detected is a weak optical signal, the method and the device can still realize quick weak optical signal conversion on the optical signal to be detected and finish accurate measurement.
In addition, the noise of the electric signal is effectively reduced through the third resistor R3. As long as the third resistor R3 is pulled down to the ground, a load can be added to the feedback voltage to absorb a part of noise voltage signals formed by no load, thereby playing a role in removing noise of the voltage signals.
In some embodiments, the photodiode is an enhancement photodiode having a band-pass filter.
Further, the power feedback acquisition circuit further comprises: and the differential amplifying circuit 200 is used for amplifying the voltage signal and reducing the influence of interference signals in the power feedback acquisition circuit on the voltage signal. Since an interference signal like a guided light signal is generated in the solid-state laser, it is necessary to remove such a signal using the differential amplification circuit 200. The power feedback acquisition circuit may be implemented by existing techniques.
In some embodiments, the differential amplifier circuit 200 includes:
a fourth resistor R4, one end of the fourth resistor R4 being connected to the output terminal of the first operational amplifier IC 1A; and
a fifth resistor R5; and
a sixth resistor R6; and
a seventh resistor R7, one end of the seventh resistor R7 being connected to ground; and
an eighth resistor R8, one end of the eighth resistor R8 is used for connecting with a reference voltage source; and
a ninth resistor R9; and
a second operational amplifier IC1B, wherein the positive input of the second operational amplifier IC1B is grounded; the inverting input terminal of the second operational amplifier IC1B is connected to the other end of the fourth resistor R4 and one end of the fifth resistor R5, respectively; and
a third operational amplifier IC 2B; the inverting input end of the third operational amplifier IC2B is connected to the other end of the eighth resistor R8 and one end of the ninth resistor R9, respectively; a positive input end of the third operational amplifier IC2B is connected to one end of the sixth resistor R6 and the other end of the seventh resistor R6, respectively; an output terminal of the third operational amplifier IC2B is connected to the other terminal of the fifth resistor R5, the other terminal of the sixth resistor R6, and the other terminal of the ninth resistor R9, respectively.
In the present application, the voltage signal collected by the photodiode D1 is converted from a negative voltage signal to a positive voltage signal by using the proportional amplification and inverting input function of the second operational amplifier IC 1B. The conversion voltage of the photodiode D1 is subtracted by the reference voltage REF + from the reference voltage source by the differential amplifier circuit 200 formed of the second operational amplifier IC2B, so that the bias voltage generated by the light guided in the solid-state laser can be effectively removed; meanwhile, the difference between the two voltages can be amplified, common mode voltage is restrained, the voltage conversion range is effectively expanded, and digital processing in subsequent signal processing is facilitated.
Further, in some embodiments, the power feedback acquisition circuit further comprises: the signal conditioning circuit 300 may be implemented by the prior art, which performs active second-order low-pass filtering on the voltage signal amplified by the differential amplifying circuit 200 and follows the signal conditioning circuit 300.
Further, in some embodiments, the signal conditioning circuit 300 includes:
a tenth resistor R10; and
an eleventh resistor R11 having one end connected to one end of the tenth resistor R10; and
a twelfth resistor R12, one end of which is grounded and the other end of which is connected to the other end of the tenth resistor R10; and
a second capacitor C2, one end of which is connected to the other end of the tenth resistor R10;
a third capacitor C3, one end of which is grounded and the other end of which is connected with one end of the eleventh resistor R11; and
a fourth operational amplifier IC2A, a non-inverting input terminal of the fourth operational amplifier IC2A being connected to the other terminal of the eleventh resistor R11 and the other terminal of the third capacitor C3, respectively, an output terminal of the fourth operational amplifier IC2A being connected to the non-inverting input terminal of the fourth operational amplifier IC2A and the other terminal of the second capacitor C2, respectively, wherein,
the output of the fourth operational amplifier IC2A is further adapted to be connected to a digital circuit AD for converting analog signals to digital signals.
Therefore, the tenth resistor R10, the eleventh resistor R11, the second capacitor C2, the third capacitor C3 and the fourth operational amplifier IC2A form a second-order active low-pass filter, voltage fluctuation in the circuit can be effectively reduced through the active low-pass filter, interference signals are attenuated quickly, and the signal-to-noise ratio is improved. Since solid-state lasers are all pulse signals, all filtering is necessary to ensure the stability of the voltage.
In some embodiments, the twelfth resistor R12 is a load resistor. The twelfth resistor R12 is a load resistor, and can effectively absorb abnormal voltage generated by no load in the circuit. Under the condition that the voltage is zero, the voltage on the filter capacitor can be conducted to the ground, so that the rapid charging and discharging of the capacitor are realized, and the condition that the power is zero and the voltage is output due to the fact that the capacitor is charged is prevented.
S2, the voltage signal corresponding to the optical power is converted into a quantized value of the optical power level, which is a digital signal with a quantized level corresponding to the optical power, for example, the voltage signal range is 0 to 3V, and the quantized value is quantized to a quantized value in the range of 0 to 4096.
Specifically, as shown in fig. 3, S3 includes the following steps:
step S31, collecting n quantized values X (i) of optical power levels, wherein i is an integer from 1 to n, n is greater than 2, and the n quantized values of optical power levels from X (1) to X (n) are stored in a one-dimensional array;
step S32, comparing the quantized values of the optical power levels one by one from X (1) to X (n) in the one-dimensional array, and arranging the quantized values into an ordered sequence from big to small;
step S33, finding the maximum value of the quantized value of the optical power level from the ordered sequence of step S32 and assigning it to XmaxAnd finding the minimum of the quantized values of the optical power level and assigning it to Xmin；
Step S34, calculating the sum of n quantized values of optical power level, and removing the maximum value X of quantized optical power levelmaxAnd minimum value X of optical power level quantizationminThe formula is as follows:
step S35, removing the maximum value X of the optical power level quantizationmaxAnd minimum value X of optical power level quantizationminAnd averaging the sum of the quantized values of the optical power level to obtain a quantized average value of the optical power level, wherein the formula is as follows:
thus, in step S34, the maximum value X quantized to the optical power level is removedmaxAnd minimum value X of optical power level quantizationminAnd the anti-pulse interference processing is realized. Furthermore, the method can effectively remove the signal with violent voltage amplitude fluctuation caused by pulse interference, and can eliminate sampling errors by adopting anti-pulse interference processing for the accidental pulse interference errors, thereby effectively removing high-frequency interference signals in the sampling signals.
Thus, in step S35, random interference signals fluctuating around the upper and lower quantized optical power values can be effectively removed by arithmetic mean filtering, and the quantized average of the optical power levels can be obtained quickly and efficiently.
Specifically, step S4 includes the steps of: quantizing the optical power level to an average value EmMinus a predetermined threshold E0The collection starting point of the quantized value of the optical power level is reset to zero to obtain a revised value delta E of the quantized threshold value of the optical power levelmThe formula is as follows:
ΔEm＝Em-E0 (m≥0)；
wherein E is0Is a fixed preset threshold. E0The magnitude of the value is determined by an offset signal quantified by the optical power generated by the solid-state laser in the guide light signal, and in the case of the solid-state laser only guiding the light, the measured value of the optical power is equal to a fixed preset threshold value E0Are equal. Subtracting a preset threshold value E from a quantized value of the optical power0Thereby, the digital acquisition starting point of the light power quantization value is reset to zero, so as to obtain the variation range of the effective light power quantization value,
specifically, as shown in fig. 5, step S5 includes the steps of:
step S51, collecting j light power level quantization threshold value revision values delta EkWhere k is a number from 1 to j, from Δ E1To Δ EjThe j quantized threshold values of the optical power level are stored in a one-dimensional arrayPerforming the following steps;
step S52, inputting reference power values detected by thermoelectric laser power probes outside the solid laser corresponding to the j quantized threshold values of optical power level
Where k is a number from 1 to j, from
To
Reference power values detected by a thermoelectric laser power probe positioned outside the solid laser and corresponding to the j optical power level quantization threshold revision values are stored in a one-dimensional array;
inputting reference power values detected by thermoelectric laser power probes outside the solid laser corresponding to j optical power level quantization threshold revision values
Means, for example, that the threshold value of the quantization is modified by a value Δ E at the optical power levelkReference power value detected by the pyroelectric laser power probe collected in a time interval (such as a middle point, an end point, etc.)
Of course, the threshold revision Δ E may also be quantified at the optical power levelkThe reference power values detected by the plurality of pyroelectric laser power probes are collected during the time interval of (a), and then the average value of the values is adopted.
Step S53, obtaining the linear formula proportional term of the optical power output value by using the reference power value detected by every two adjacent thermoelectric laser power probes positioned outside the solid laser and the corresponding optical power level quantization threshold revision value
The formula is as follows:
step S54, utilizing the light power level to quantize the threshold revision value Delta EkProportional term of linear formula of sum light power output value
Obtaining a linear formula constant term of the light power output value, wherein the formula is as follows:
step S55, linear formula proportional term of light power output value
Adding, and carrying out arithmetic average filtering to obtain a linear formula proportional term average value a of the optical power output value, wherein the formula is as follows:
step S56, linear formula constant term of light power output value
Adding, and carrying out arithmetic mean filtering to obtain a constant term b of a linear formula of the optical power output value, wherein the formula is as follows:
the linear formula constant term of the optical power output value can enable the revision value delta E of the quantization threshold value at the optical power level to be obtained through arithmetic mean filteringkThe optical power of the point quantificationally outputs a display value, and the display value is detected by an optical power meter through proportional amplification of an optical power linear formula and offset addition and subtraction of a constant term of the optical power linear formulaThe display values are close.
Step S57, obtaining a level quantization calibration value of the optical power output according to a linear formula by using the optical power output value linear formula proportion term a and the optical power output value linear formula constant term b, where the formula is:
Pk＝aΔEk+b。
in step S5, the reference power value detected by the pyroelectric laser power probe located outside the solid-state laser and the corresponding revised value of the optical power level quantization threshold are gradually approximated in segments, and then the output of the optical power curve is linearized by using a straight-line fitting algorithm.
Specifically, the method for measuring and calibrating the power of the solid laser further comprises the following steps: and S6, displaying the level quantization calibration value of the segmented calibrated optical power output in real time through the display device.
As described above, in the method for measuring and calibrating power of a solid-state laser according to the above embodiment, before the solid-state laser leaves factory, after a voltage signal corresponding to optical power is obtained through photoelectric conversion, a signal with a voltage amplitude that fluctuates sharply due to pulse interference is removed, for an accidental pulse interference error, a sampling error can be eliminated by performing anti-pulse interference processing, a high-frequency interference signal in the sampling signal is effectively removed, then, a piecewise successive approximation manner is used to linearize a curve of an optical power output value, and a measurement feedback value of a photodiode-type laser power probe is corrected to make the measurement feedback value approach an actual power value of the solid-state laser (for example, a measurement result detected by a thermoelectric-type laser power probe). In a further embodiment, the quantized value of the optical power output is made to be closer to the actual power value of the solid laser by arithmetic mean filtering of a proportional term and a constant term of a linear formula of the optical power output value.
On the other hand, as shown in fig. 7, a solid laser power measurement calibration apparatus is provided for implementing the solid laser power measurement calibration method described above, which includes:
the photoelectric diode type laser power probe is used for performing photoelectric conversion on the emitted light signals to obtain voltage signals corresponding to light power;
the analog-digital conversion module is used for converting the voltage signal corresponding to the optical power into a digital signal with level quantization corresponding to the optical power, namely an optical power level quantization value;
the interference preventing average filter is used for carrying out pulse interference preventing treatment on a digital signal with quantized optical power level, namely an optical power level quantized value, and then carrying out average filtering to obtain an optical power level quantized average value;
the threshold value revising module is used for obtaining a corresponding optical power level quantization threshold value revising value according to a preset threshold value;
the piecewise linearization module is used for carrying out piecewise calibration according to the optical power level quantization threshold revision value and a reference power value detected by a thermoelectric laser power probe positioned outside the solid laser to obtain a level quantization calibration value of optical power output; and
and the display device is used for displaying the level quantization calibration value of the optical power output of the sectional calibration in real time. The display device has, for example, a human-computer interaction interface. It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present invention.
While the present invention has been described with reference to the embodiments shown in the drawings, the present invention is not limited to the embodiments, which are illustrative and not restrictive, and it will be apparent to those skilled in the art that various changes and modifications can be made therein without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (5)
1. A method for measuring and calibrating the power of a solid laser is characterized by comprising the following steps:
s1, performing photoelectric conversion on an optical signal emitted by the solid laser through a photodiode type laser power probe positioned in the solid laser to obtain a voltage signal corresponding to the optical power;
s2, converting the voltage signal corresponding to the optical power into a level-quantized digital signal corresponding to the optical power, i.e. an optical power level quantized value;
s3, performing anti-pulse interference processing on the digital signal with the quantified optical power level, namely the quantified optical power level, and performing mean value filtering to obtain a quantified mean value of the optical power level;
s4, obtaining a corresponding optical power level quantization threshold value revision value according to a preset threshold value; and
s5, according to the light power level quantization threshold value revision value and the reference power value detected by the thermoelectric laser power probe outside the solid laser, the calibration is carried out in a segmented way to obtain the level quantization calibration value of the light power output,
wherein, S3 includes the following steps:
step S31, collecting n quantized values X (i) of optical power levels, wherein i is an integer from 1 to n, n is greater than 2, and the n quantized values of optical power levels from X (1) to X (n) are stored in a one-dimensional array;
step S32, comparing the quantized values of the optical power levels one by one from X (1) to X (n) in the one-dimensional array, and arranging the quantized values into an ordered sequence from big to small;
step S33, finding the maximum value of the quantized value of the optical power level from the ordered sequence of step S32 and assigning it to XmaxAnd finding the minimum of the quantized values of the optical power level and assigning it to Xmin；
Step S34, calculating the sum of n quantized values of optical power level, and removing the maximum value X of quantized optical power levelmaxAnd minimum value X of optical power level quantizationminThe formula is as follows:
step S35, removing the maximum value X of the optical power level quantizationmaxAnd minimum value X of optical power level quantizationminAnd then, averaging the sum of the quantized values of the optical power level to obtain a quantized average value of the optical power level, wherein the formula is as follows:
step S4 includes the following steps:
quantizing the optical power level to an average value EmMinus a predetermined threshold E0The collection starting point of the quantized value of the optical power level is reset to zero to obtain a revised value delta E of the quantized threshold value of the optical power levelmThe formula is as follows:
ΔEm＝Em-E0 (m≥0)；
wherein E is0Is a fixed preset threshold.
2. The method for calibrating power measurement of a solid state laser according to claim 1, wherein the step S1 comprises the steps of:
s11, converting the optical signal emitted by the solid laser into a voltage signal through the photoelectric conversion circuit;
s12, amplifying the voltage signal by a differential amplifier circuit; and
and S13, performing active second-order low-pass filtering on the voltage signal amplified by the differential amplifying circuit through the signal conditioning circuit.
3. The method for calibrating power measurement of a solid state laser according to claim 1, wherein the step S5 comprises the steps of:
step S51, collecting j light power level quantization threshold value revision values delta EkWhere k is a number from 1 to j, from Δ E1To Δ EjThe j quantized threshold values of the optical power level are stored in a one-dimensional array;
step S52, inputting reference power values detected by thermoelectric laser power probes outside the solid laser corresponding to the j quantized threshold values of optical power level
Where k is a number from 1 to j, from
To
Reference power values detected by a thermoelectric laser power probe positioned outside the solid laser and corresponding to the j optical power level quantization threshold revision values are stored in a one-dimensional array;
step S53, obtaining the linear formula proportional term of the optical power output value by using the reference power value detected by every two adjacent thermoelectric laser power probes positioned outside the solid laser and the corresponding optical power level quantization threshold revision value
The formula is as follows:
step S54, utilizing the light power level to quantize the threshold revision value Delta EkProportional term of linear formula of sum light power output value
Obtaining a linear formula constant term of the light power output value, wherein the formula is as follows:
step S55, linear formula proportional term of light power output value
Adding, and carrying out arithmetic average filtering to obtain a linear formula proportional term average value a of the optical power output value, wherein the formula is as follows:
step S56, linear formula constant term of light power output value
Adding, and carrying out arithmetic mean filtering to obtain a constant term b of a linear formula of the optical power output value, wherein the formula is as follows:
step S57, obtaining a level quantization calibration value of the optical power output according to a linear formula by using the optical power output value linear formula proportion term a and the optical power output value linear formula constant term b, where the formula is:
Pk＝aΔEk+b。
4. the solid state laser power measurement calibration method of claim 1, further comprising the steps of:
and S6, displaying the level quantization calibration value of the segmented calibrated optical power output in real time through the display device.
5. A solid laser power measurement calibration apparatus for implementing the solid laser power measurement calibration method according to claim 1, characterized by comprising:
the photoelectric diode type laser power probe is used for performing photoelectric conversion on the emitted light signals to obtain voltage signals corresponding to light power;
the analog-digital conversion module is used for converting the voltage signal corresponding to the optical power into a digital signal with level quantization corresponding to the optical power, namely an optical power level quantization value;
the interference preventing average filter is used for carrying out pulse interference preventing treatment on a digital signal with quantized optical power level, namely an optical power level quantized value, and then carrying out average filtering to obtain an optical power level quantized average value;
the threshold value revising module is used for obtaining a corresponding optical power level quantization threshold value revising value according to a preset threshold value;
the piecewise linearization module is used for carrying out piecewise calibration according to the optical power level quantization threshold revision value and a reference power value detected by a thermoelectric laser power probe positioned outside the solid laser to obtain a level quantization calibration value of optical power output; and
and the display device is used for displaying the level quantization calibration value of the optical power output of the sectional calibration in real time.
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