CN112673285B - 多片式单层辐射探测器 - Google Patents

多片式单层辐射探测器 Download PDF

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Publication number
CN112673285B
CN112673285B CN201980058844.2A CN201980058844A CN112673285B CN 112673285 B CN112673285 B CN 112673285B CN 201980058844 A CN201980058844 A CN 201980058844A CN 112673285 B CN112673285 B CN 112673285B
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China
Prior art keywords
pixels
sub
array
sensor
radiation
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CN201980058844.2A
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English (en)
Chinese (zh)
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CN112673285A (zh
Inventor
J·W·M·雅各布斯
R·K·O·贝林
R·斯特德曼布克
G·福格特米尔
O·J·维默斯
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Koninklijke Philips NV
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Koninklijke Philips NV
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20181—Stacked detectors, e.g. for measuring energy and positional information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20184—Detector read-out circuitry, e.g. for clearing of traps, compensating for traps or compensating for direct hits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/242—Stacked detectors, e.g. for depth information
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/36—Measuring spectral distribution of X-rays or of nuclear radiation spectrometry
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/12—Active materials

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Sustainable Development (AREA)
CN201980058844.2A 2018-09-10 2019-09-10 多片式单层辐射探测器 Active CN112673285B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP18193337.5A EP3620826A1 (en) 2018-09-10 2018-09-10 Multi-piece mono-layer radiation detector
EP18193337.5 2018-09-10
PCT/EP2019/074036 WO2020053174A1 (en) 2018-09-10 2019-09-10 Multi-piece mono-layer radiation detector

Publications (2)

Publication Number Publication Date
CN112673285A CN112673285A (zh) 2021-04-16
CN112673285B true CN112673285B (zh) 2024-10-18

Family

ID=63556160

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201980058844.2A Active CN112673285B (zh) 2018-09-10 2019-09-10 多片式单层辐射探测器

Country Status (5)

Country Link
US (1) US11506802B2 (enExample)
EP (2) EP3620826A1 (enExample)
JP (1) JP7453215B2 (enExample)
CN (1) CN112673285B (enExample)
WO (1) WO2020053174A1 (enExample)

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EP3660542A1 (en) * 2018-11-29 2020-06-03 Koninklijke Philips N.V. Hybrid x-ray and optical detector
FR3119708B1 (fr) * 2021-02-11 2023-08-25 Trixell Détecteur numérique à étages de conversion superposés
US12429612B2 (en) * 2021-09-13 2025-09-30 Redlen Technologies, Inc. Radiation sensor dies having visual identifiers and methods of fabricating thereof
CN115808707A (zh) * 2021-09-14 2023-03-17 睿生光电股份有限公司 感测装置
CN118235248A (zh) * 2021-12-23 2024-06-21 德克特里斯股份公司 用于辐射的位置分辨检测的辐射检测器
EP4533047A4 (en) * 2022-05-27 2026-07-22 Nat Univ Singapore 3D LIGHT FIELD DETECTOR, SENSOR AND THEIR MANUFACTURING PROCESSES
EP4394456A3 (en) * 2022-12-29 2024-07-10 FEI Company Improved detectors for microscopy
KR102993276B1 (ko) * 2023-10-13 2026-07-22 주식회사 레이언스 엑스선 디텍터
WO2025155249A1 (en) * 2024-01-17 2025-07-24 National University Of Singapore Multi wavelength imaging sensor
WO2026053942A1 (ja) * 2024-09-05 2026-03-12 キヤノン株式会社 放射線撮像装置、及び放射線撮像システム

Citations (1)

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DE102007058447A1 (de) * 2007-12-05 2009-06-10 Siemens Ag Röntgendetektor, Röntgengerät und Verfahren zur Erfassung einer Röntgenstrahlung

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JP2008538971A (ja) 2005-04-29 2008-11-13 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｃｔ用のエネルギー分解された光子計数
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CN102066976A (zh) * 2008-06-16 2011-05-18 皇家飞利浦电子股份有限公司 辐射探测器和制造辐射探测器的方法
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Also Published As

Publication number Publication date
JP2021536580A (ja) 2021-12-27
EP3620826A1 (en) 2020-03-11
US11506802B2 (en) 2022-11-22
WO2020053174A1 (en) 2020-03-19
US20210356608A1 (en) 2021-11-18
EP3850400A1 (en) 2021-07-21
JP7453215B2 (ja) 2024-03-19
CN112673285A (zh) 2021-04-16

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