CN112611995A - Testing device for AC/DC trial delivery instrument - Google Patents
Testing device for AC/DC trial delivery instrument Download PDFInfo
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- CN112611995A CN112611995A CN202011317950.9A CN202011317950A CN112611995A CN 112611995 A CN112611995 A CN 112611995A CN 202011317950 A CN202011317950 A CN 202011317950A CN 112611995 A CN112611995 A CN 112611995A
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- 238000012360 testing method Methods 0.000 title claims abstract description 47
- 238000007689 inspection Methods 0.000 claims abstract description 99
- 230000005540 biological transmission Effects 0.000 claims abstract description 84
- 239000003990 capacitor Substances 0.000 claims description 34
- 239000004973 liquid crystal related substance Substances 0.000 claims description 22
- 238000004088 simulation Methods 0.000 claims description 20
- 230000009471 action Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 15
- 238000001514 detection method Methods 0.000 description 3
- 238000012795 verification Methods 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 235000014676 Phragmites communis Nutrition 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000012031 short term test Methods 0.000 description 1
- 238000009966 trimming Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
Abstract
The application relates to an inspection device of appearance is sent in examination to alternating current-direct current, and this inspection device includes: the device comprises a power supply, a control chip and an inspection analog circuit; the inspection analog circuit includes a first switching circuit; two ends of the first switch circuit are respectively connected between the output end of the AC/DC trial transmission instrument and the grounding end; the power supply is connected with the control chip, and the control end of the control chip is connected with the switch control end of the first switch circuit; the control chip is used for controlling the conduction of the first switch circuit, so that the inspection analog circuit simulates the short circuit state of the alternating current/direct current trial transmission instrument. That is to say, the inspection device of the ac/dc test delivery instrument provided in the embodiment of the present application is connected to the ac/dc test delivery instrument, and the control chip in the inspection device can control the conduction of the first switch circuit of the inspection analog circuit in the inspection device, so as to simulate the short-circuit state of the ac/dc test delivery instrument, thereby implementing the test of the short-circuit performance of the ac/dc test delivery instrument.
Description
Technical Field
The application relates to the technical field of equipment inspection, in particular to an inspection device of an alternating current/direct current trial delivery instrument.
Background
The appearance is sent in the alternating current-direct current examination as the instrument equipment that an organic whole line maintenance maintainer often used, can join in marriage under the circumstances that the net line broke down for the maintenance maintainer can send the trouble of appearance short-term test cable through the alternating current-direct current examination, improves the operating efficiency.
However, the fault of the cable can be accurately detected only under the condition that the AC/DC trial transmission instrument can work normally and has good functions, otherwise, the inspection result may be inaccurate due to the poor AC/DC trial transmission instrument, and further, a safety accident may occur after power transmission.
At present, no test equipment for testing the performance of the AC/DC test delivery instrument exists.
Disclosure of Invention
In view of the above, it is desirable to provide an inspection device for an ac/dc test transportation device, which can inspect the performance of the ac/dc test transportation device.
The embodiment of the application provides an inspection device that appearance was sent in examination to alternating current-direct current, this inspection device includes: the device comprises a power supply, a control chip and an inspection analog circuit; the inspection analog circuit includes a first switching circuit;
two ends of the first switch circuit are respectively connected between the output end of the AC/DC trial transmission instrument and the grounding end; the power supply is connected with the control chip, and the control end of the control chip is connected with the switch control end of the first switch circuit;
the control chip is used for controlling the conduction of the first switch circuit, so that the inspection analog circuit simulates the short circuit state of the alternating current/direct current trial transmission instrument.
In one embodiment, the first switch circuit comprises a first relay, the control terminal of the control chip is connected with the first control terminal of the first relay, and the grounding terminal of the first relay is grounded.
In one embodiment, the verification analog circuit further comprises a second switching circuit; two ends of the second switch circuit are respectively connected between the output end of the AC/DC trial transmission instrument and the grounding end;
the control chip is specifically configured to control the second switch circuit and the first switch circuit to be turned on or off, so that the inspection analog circuit simulates any one of a short-circuit state, a first resistance state and a second resistance state of the ac/dc test transmission instrument, and a resistance value of the inspection analog circuit in the first resistance state is greater than a resistance value of the inspection analog circuit in the second resistance state.
In one embodiment, the second switching circuit includes a second relay, a first resistor, and a second resistor;
one end of the first resistor is connected with the output end of the AC/DC trial transmission instrument, the other end of the first resistor is connected with one end of the second resistor, and the other end of the second resistor is connected with the grounding end of the AC/DC trial transmission instrument;
one end of the second relay is connected with the output end of the AC/DC trial transmission instrument, the second control end of the second relay is connected with the control end of the control chip, the other end of the second relay is connected between the first resistor and the second resistor, and the grounding end of the second relay is grounded.
In one embodiment, the inspection analog circuit further includes first capacitors respectively connected between the output terminals of the ac/dc test sending instruments and the ground terminal.
In one embodiment, the inspection simulation circuit further comprises a third switch circuit, and two ends of the third switch circuit are respectively connected between the output end and the ground end of the ac/dc trial transmission instrument;
the control chip is specifically configured to enable the inspection analog circuit to simulate any one of a short-circuit state, a first resistance state, a second resistance state, a first cable state, and a second cable state of the ac/dc trial transmission instrument by controlling on/off of the third switch circuit, the first switch circuit, and the second switch circuit;
the resistance value of the checking analog circuit in the first resistance state is larger than that in the second resistance state;
the capacitance value of the checking analog circuit in the first cable state is larger than that in the second cable state.
In one embodiment, the third switching circuit includes: a third relay and a second capacitor;
one end of the third relay is connected with the output end of the AC/DC trial sending instrument, the other end of the third relay is connected with one end of the second capacitor, the third control end of the third relay is connected with the control end of the control chip, the grounding end of the third relay is grounded, and the other end of the second capacitor is connected with the grounding end of the AC/DC trial sending instrument.
In one embodiment, the testing apparatus further comprises: the state selection unit is connected with the control chip and comprises at least one trigger interface in a fault simulation state;
the state selection unit is used for acquiring a selection instruction of a target trigger interface selected by a user and sending the selection instruction to the control chip;
the control chip is used for controlling the first switch circuit, the second switch circuit and the third switch circuit to be switched on or switched off according to the selected instruction.
In one embodiment, the state selection unit comprises a liquid crystal driving chip, a touch liquid crystal chip and a display screen;
the display screen is used for displaying at least one trigger interface of a fault simulation state under the action of the touch liquid crystal chip and the liquid crystal driving chip.
In one embodiment, the inspection apparatus further comprises: an insulating box body; the power supply, the control chip and the inspection analog circuit are fixed in the inner cavity of the insulating box body.
The application embodiment provides an inspection device that appearance was sent in examination to alternating current-direct current, includes: the device comprises a power supply, a control chip and an inspection analog circuit; the inspection analog circuit includes a first switching circuit; two ends of the first switch circuit are respectively connected between the output end of the AC/DC trial transmission instrument and the grounding end; the power supply is connected with the control chip, and the control end of the control chip is connected with the switch control end of the first switch circuit; the control chip is used for controlling the conduction of the first switch circuit, so that the inspection analog circuit simulates the short circuit state of the alternating current/direct current trial transmission instrument. That is to say, the inspection device of the ac/dc test delivery instrument provided in the embodiment of the present application is connected to the ac/dc test delivery instrument, and the control chip in the inspection device can control the conduction of the first switch circuit of the inspection analog circuit in the inspection device, so as to simulate the short-circuit state of the ac/dc test delivery instrument, thereby implementing the test of the short-circuit performance of the ac/dc test delivery instrument.
Drawings
Fig. 1 is a schematic structural diagram of an inspection apparatus of an ac/dc trial transmission instrument according to an embodiment of the present application;
fig. 2 is a schematic structural diagram of a first switch circuit according to an embodiment of the present application;
fig. 3 is a schematic structural diagram of a first switch circuit according to another embodiment of the present application;
fig. 4 is a schematic structural diagram of an inspection apparatus of an ac/dc trial transmission instrument according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of a second switch circuit according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of a second switch circuit according to another embodiment of the present application;
fig. 7 is a schematic structural diagram of an inspection apparatus of an ac/dc trial transmission instrument according to an embodiment of the present application;
fig. 8 is a schematic structural diagram of an inspection apparatus of an ac/dc trial transmission instrument according to an embodiment of the present application;
fig. 9 is a schematic structural diagram of an inspection device of an ac/dc trial transmission instrument according to an embodiment of the present application.
Description of reference numerals:
10: a power source; 20: a control chip; 201: a control end; 30: checking the analog circuit;
301: a first switching circuit; 3011: a switch control terminal of the first switch circuit;
40: an AC/DC trial sending instrument; 401: the output end of the AC/DC trial sending instrument;
402: the grounding end of the AC/DC trial sending instrument; 3012: an electronic switch;
In1: an input terminal of an electronic switch; out1: an output terminal of the electronic switch;
Cont1: a switch control terminal of the electronic switch; 3013: a first relay;
Cont2: a first control terminal of the first relay; GND2: a ground terminal of the first relay;
In2: one end of a first relay; out2: the other end of the first relay;
Cont3: electronic switch K1The switch control terminal of (1); cont4: electronic deviceSwitch K2The switch control terminal of (1);
302: a second switching circuit; 3021: a second relay; 3022: a first resistor;
3023: a second resistor; in5: one end of a second relay;
Cont5: a second control terminal of the second relay; out5: the other end of the second relay;
GND5: a ground terminal of the second relay; 303: a first capacitor;
304: a third switch circuit; 3041: a third relay; 3042: a second capacitor;
In6: one end of a third relay; out6: the other end of the third relay;
Cont6: a third control terminal of a third relay; GND6: a ground terminal of the third relay;
50: a state selection unit; 501: triggering an interface;
502: a liquid crystal driving chip; 503: touching the liquid crystal chip; 504: a display screen;
60: an insulating box body; 601: a first terminal post; 602: and a second terminal.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
The utility model provides an inspection device of appearance is sent in examination to alternating current-direct current, be applicable to equipment inspection technical field, before the staff adopts direct current examination to send the appearance or exchange examination to send the appearance to the cable that awaits measuring or the equipment that awaits measuring carries out withstand voltage test or fault detection, it is good to need to ensure this direct current examination to send the appearance or exchange examination to send the equipment performance of appearance self, otherwise through direct current examination that has the problem send the appearance or exchange examination to send the appearance and carry out withstand voltage test or fault detection to the cable that awaits measuring or the equipment that awaits measuring, certain error can necessarily exist, can cause the incident because of this direct current examination send the appearance or exchange examination equipment problem of sending appearance self even.
However, in the prior art, there is no testing device for testing the performance of the dc test handler or the ac test handler, and it is not possible to ensure whether the performance of each device is good or not before use.
The following describes the technical solutions of the present application and how to solve the above technical problems with specific examples. The following several specific embodiments may be combined with each other, and details of the same or similar concepts or processes may not be repeated in some embodiments. Embodiments of the present application will be described below with reference to the accompanying drawings.
Fig. 1 is a schematic structural diagram of an inspection apparatus of an ac/dc trial transmission instrument according to an embodiment of the present application. As shown in fig. 1, the inspection apparatus includes: a power supply 10, a control chip 20 and a detection analog circuit 30; the inspection analog circuit 30 includes a first switch circuit 301; two ends of the first switch circuit 301 are respectively connected between the output end 401 and the ground end 402 of the ac/dc trial transmission instrument 40; the power source 10 is connected to the control chip 20, and the control terminal 201 of the control chip 20 is connected to the switch control terminal 3011 of the first switch circuit 301; the control chip 20 is configured to control the first switch circuit 301 to be turned on, so that the inspection simulation circuit 30 simulates a short-circuit state of the ac/dc test transmission instrument 40.
Alternatively, as shown In fig. 2, the first switch circuit 301 may include an electronic switch 3012, the electronic switch 3012 may be a thyristor, a transistor, a field effect transistor, a thyristor, or the like, and the electronic switch 3012 may include an input terminal In1And an output terminal Out1And switch control terminal Cont1Input terminal In of the electronic switch 30121An output terminal Out of the electronic switch 3012 connected to the output terminal 401 of the ac/dc trial transfer device 401A switch control terminal Cont of the electronic switch 3012 connected to the ground terminal 402 of the AC/DC trial transfer apparatus 401Is connected with the control terminal 201 of the control chip 20; the power supply 10 is the control chip20, the control chip 20 can control the switch control terminal Cont of the electronic switch 3012 when it is powered on1To control the on and off of the first switch circuit 301; when the first switch circuit 301 is turned on, the inspection simulation circuit 30 can simulate the short-circuit state of the ac/dc trial transmission instrument 40; the present embodiment does not specifically limit the type of the electronic switch 3012, as long as the electronic switch can be turned on and off according to the control signal output by the control terminal 201 of the control chip 20.
Above-mentioned inspection device that appearance was sent in alternating current-direct current examination includes: the device comprises a power supply, a control chip and an inspection analog circuit; the inspection analog circuit includes a first switching circuit; two ends of the first switch circuit are respectively connected between the output end of the AC/DC trial transmission instrument and the grounding end; the power supply is connected with the control chip, and the control end of the control chip is connected with the switch control end of the first switch circuit; the control chip is used for controlling the conduction of the first switch circuit, so that the inspection analog circuit simulates the short circuit state of the alternating current/direct current trial transmission instrument. That is to say, the inspection device of the ac/dc test delivery instrument provided in the embodiment of the present application is connected to the ac/dc test delivery instrument, and the control chip in the inspection device can control the conduction of the first switch circuit of the inspection analog circuit in the inspection device, so as to simulate the short-circuit state of the ac/dc test delivery instrument, thereby implementing the test of the short-circuit performance of the ac/dc test delivery instrument.
Fig. 3 is a schematic structural diagram of a first switch circuit according to another embodiment of the present disclosure. As shown in fig. 3, the electronic switch 3012 may be a relay, for example: the dry reed relay does not limit the types of relays in the embodiment of the application; optionally, the first switch circuit 301 may include a first relay 3013, the control terminal 201 of the control chip 20 and the first control terminal Cont of the first relay 30132Ground terminal GND of the first relay 30132Ground, one end In of the first relay 30132The other end Out of the first relay 3013 is connected to the output end 401 of the ac/dc trial transmission instrument 402Is connected to the ground terminal 402 of the ac/dc test transmission device 40; optionally, theFirst control terminal Cont of first relay 30132When the voltage is high, the first relay 3013 is turned on, and the first control terminal Cont of the first relay 30132When the voltage is low, the first relay 3013 is turned off; for example: when the control chip 20 is powered on, the control terminal 201 of the control chip 20 supplies a first control terminal Cont of the first relay 30132A high level is output, so that the first relay 3013 is turned on, and the output terminal 401 of the ac/dc trial transmission device 40 is connected to the ground terminal 402, thereby forming a line-to-ground short circuit state of the ac/dc trial transmission device 40.
In the embodiment of the application, the relay is used as the electronic switch of the first switch circuit, and the relay can sense different changes of various variables such as current, voltage, temperature, pressure and the like, so that the relay is used as the electronic switch of the first switch circuit, the application range of the first switch circuit can be increased, and the application range of the inspection device is further increased.
Fig. 4 is a schematic structural diagram of an inspection device of an ac/dc trial transmission instrument according to an embodiment of the present application. As shown in fig. 4, the inspection analog circuit 30 further includes a second switching circuit 302; two ends of the second switch circuit 302 are respectively connected between the output end 401 and the ground end 402 of the ac/dc trial transmission instrument 40; the control chip 20 is specifically configured to control the second switch circuit 302 and the first switch circuit 301 to be turned on or off, so that the inspection simulation circuit 30 simulates any one of a short-circuit state, a first resistance state and a second resistance state of the ac/dc test transmission instrument 40, where a resistance value of the inspection simulation circuit 30 in the first resistance state is greater than a resistance value of the inspection simulation circuit 30 in the second resistance state.
Specifically, the inspection simulation circuit 30 includes a first switch circuit 301 and a second switch circuit 302, wherein the first switch circuit can simulate the short-circuit state of the ac/dc test transmission instrument 40; different resistance states of the ac/dc trial transmission instrument 40 can be simulated through the second switch circuit, and the resistance states may include a first resistance state and a second resistance state; alternatively, the second switching circuit 302 may refer to a circuit configuration as shown in fig. 5 (which is required)It is noted that the circuit configuration shown in fig. 5 is one of the circuit configurations that realizes the first resistance state and the second resistance state, and is not intended to limit the second switch circuit), the second switch circuit 302 may include an electronic switch K1Electronic switch K2Resistance R1And a resistance R2(ii) a Wherein the resistor R1Is greater than the resistance R2Resistance value of (1), the resistance R1And a resistance R2The resistor can be a fixed resistor or a variable resistor; the electronic switch K1And the resistor R1After being connected in series, the electronic switch K is connected between the output end 401 and the grounding end 402 of the AC/DC trial sending instrument 402And the resistor R2After being connected in series, the AC/DC trial transmission instrument 40 is connected between the output end 401 and the grounding end 402 of the AC/DC trial transmission instrument 40; the electronic switch K1Switch control terminal Cont of3And the electronic switch K2Switch control terminal Cont of4Respectively connected with the control terminal 201 of the control chip 20, the control chip 20 controls the first relay 3013 and the electronic switch K1And the electronic switch K2To simulate a short circuit condition, a first resistance condition, and a second resistance condition of the ac/dc test delivery instrument 40; when the control chip 20 controls the first relay 3013 to be turned on, the short-circuit state of the ac/dc trial transmission instrument 40 can be simulated; the control chip 20 controls the first relay 3013 to be turned off and the electronic switch K1Conducting the electronic switch K2When the switch is turned off, the first resistance state of the ac/dc trial transmission instrument 40 can be simulated, and the control chip 20 controls the first relay 3013 to be turned off and the electronic switch K to be turned off1Off, the electronic switch K2When conducting, a second resistance state of the ac/dc test delivery instrument 40 can be simulated. In addition, the second switch circuit 302 in this embodiment of the application may further include a plurality of resistor circuits with different resistance values, such as a third resistor circuit and a fourth resistor circuit, so as to be able to simulate a plurality of different resistance states of the ac/dc trial transmission instrument 40, which is not limited in this embodiment of the application.
In the embodiment of the application, any one of the short circuit state, the first resistance state and the second resistance state of the AC/DC trial sending instrument is simulated through the first switch circuit and the second switch circuit, the simulated fault state of the AC/DC trial sending instrument is enriched, and the accuracy of testing the AC/DC trial sending instrument is improved.
Fig. 6 is a schematic structural diagram of a second switch circuit according to another embodiment of the present disclosure. As shown in fig. 6, the second switching circuit 302 may include a second relay 3021, a first resistor 3022, and a second resistor 3023; one end of the first resistor 3022 is connected to the output terminal 401 of the ac/dc trial transmission apparatus 40, the other end of the first resistor 3022 is connected to one end of the second resistor 3023, and the other end of the second resistor 3023 is connected to the ground terminal 402 of the ac/dc trial transmission apparatus 40; one end In of the second relay 30215A second control terminal Cont of the second relay 3021 connected to the output terminal 401 of the AC/DC trial transmission device 405The other end Out of the second relay 3021 is connected to the control end 201 of the control chip 205A ground terminal GND of the second relay 3021 connected between the first resistor 3022 and the second resistor 30235And (4) grounding.
Specifically, a first resistor 3022 and a second resistor 3023 in the second switch circuit 302 are connected in series, and the second relay 3021 is connected in parallel with the first resistor 3022; the control terminal 201 of the control chip 20 is connected to the first control terminal Cont of the first relay 30132And a second control terminal Cont of the second relay 30215When both outputs a low level, the first relay 3013 and the second relay 3021 are disconnected, the ac/dc trial transmission instrument 40 connects the first resistor 3022 and the second resistor 3023, and is in a first resistance state, which may be a high resistance state of the ac/dc trial transmission instrument 40 to ground; the control terminal 201 of the control chip 20 is connected to the first control terminal Cont of the first relay 30132Outputs a low level to the second control terminal Cont of the second relay 30215When a high level is output, the first relay 3013 is turned off, the second relay 3021 is turned on, the ac/dc trial transmission instrument 40 is connected to the second resistor 3023, and the ac/dc trial transmission instrument 40 is in a second resistance state, which may be a low resistance state of the ac/dc trial transmission instrument 40 to ground.
In the embodiment of the application, the first resistor and the second resistor are connected in series, the second relay is connected to two ends of the first resistor in parallel, the first resistor state is simulated by controlling the first relay and the second relay to be switched off, the second resistor state is simulated by controlling the first relay to be switched off and the second relay to be switched on, and the using number of devices is reduced.
Fig. 7 is a schematic structural diagram of an inspection device of an ac/dc trial transmission instrument according to an embodiment of the present application. As shown in fig. 7, the inspection analog circuit 30 further includes first capacitors 303, and the first capacitors 303 are respectively connected between the output terminal 401 of the ac/dc test transmission instrument 40 and the ground terminal 402; the first capacitor 303, in combination with the first switch circuit 301 and the second switch circuit 302, can simulate different cable length states of the ac/dc test transmission instrument 40.
Optionally, the larger the capacitance value of the first capacitor 303, the longer the simulated cable length; the first capacitor 303 may be at least one of a fixed capacitor, a variable capacitor, or a trimming capacitor. For example: when the first switch circuit 301 is turned off, the second switch circuit 302 is in a first resistance state, and the first capacitor 303 is in a high capacitive reactance state, the state of the long cable of the ac/dc trial transmission instrument 40 can be simulated; when the first switch circuit 301 is turned off, the second switch circuit 302 is in the first resistance state, and the first capacitor 303 is in the low capacitive reactance state, the short cable state of the ac/dc test transmission instrument 40 can be simulated.
Optionally, the inspection simulation circuit 30 further includes a third switching circuit 304, and two ends of the third switching circuit 304 are respectively connected between the output terminal 401 and the ground terminal 402 of the ac/dc trial transmission instrument 40; the control chip 20 is specifically configured to control the third switch circuit 304, the first switch circuit 301, and the second switch circuit 302 to be turned on or off, so that the inspection simulation circuit 30 simulates any one of a short-circuit state, a first resistance state, a second resistance state, a first cable state, and a second cable state of the ac/dc trial transmission instrument 40; the resistance value of the inspection analog circuit 30 in the first resistance state is larger than the resistance value of the inspection analog circuit 30 in the second resistance state; the capacitance value of the verification analog circuit 30 in the first cable state is larger than the capacitance value of the verification analog circuit 30 in the second cable state.
Specifically, the inspection analog circuit 30 includes a first switch circuit 301, a second switch circuit 302, a first capacitor 303, and a third switch circuit 304 (optionally, the first capacitor is a capacitor with a fixed capacitance value), and optionally, the third switch circuit 304 may include: a third relay 3041 and a second capacitor 3042; one end In of the third relay 30416The output end 401 of the ac/dc trial transmission instrument 40 and the other end Out of the third relay 3041 are connected6One end of the second capacitor 3042, and a third control terminal Cont of the third relay 3041 are connected6The control terminal 201 of the control chip 20 and the ground terminal GND of the third relay 3041 are connected6The other end of the second capacitor 3042 is connected to the ground terminal 402 of the ac/dc trial transmission instrument 40; that is, the third relay 3041 and the second capacitor 3042 are connected in series, and the series-connected third relay 3041 and second capacitor 3042 are connected in parallel with the first capacitor 303; optionally, the control terminal 201 of the control chip 20 is connected to the first control terminal Cont of the first relay 30132And a second control terminal Cont of the second relay 30215Outputs a low level to the third control terminal Cont of the third relay 30416When outputting a high level, the first relay 3013 and the second relay 3021 are turned off, the third relay 3041 is turned on, the ac/dc trial sending apparatus 40 is connected to the first resistor 3022, the second resistor 3023, the first capacitor 303 and the second capacitor 3042, and may be used to simulate a first cable state of the ac/dc trial sending apparatus 40, where the first cable state may be a long cable state; the control terminal 201 of the control chip 20 is connected to the first control terminal Cont of the first relay 30132A second control terminal Cont of the second relay 30215And a third control terminal Cont of the third relay 30416When all output low levels, the first relay 3013, the second relay 3021, and the third relay 3041 are all turned off, and the ac/dc trial sending apparatus 40 is connected to the first resistor 3022, the second resistor 3023, and the first capacitor 303, and may be used to simulate a second cable state of the ac/dc trial sending apparatus 40The second cable state may be a short cable state.
In the embodiment of the application, any one of a short-circuit state, a first resistance state, a second resistance state, a first cable state and a second cable state of the alternating current/direct current trial transmission instrument is simulated through the first switch circuit, the second switch circuit, the first capacitor and the third switch circuit, so that the simulated fault state of the alternating current/direct current trial transmission instrument is enriched, and the accuracy of testing the alternating current/direct current trial transmission instrument is improved.
Fig. 8 is a schematic structural diagram of an inspection device of an ac/dc trial transmission instrument according to an embodiment of the present application. As shown in fig. 8, the inspection apparatus further includes: a state selection unit 50 connected to the control chip 20, wherein the state selection unit 50 includes at least one trigger interface 501 for a fault simulation state; the state selecting unit 50 is configured to obtain a selected instruction of a target trigger interface selected by a user, and send the selected instruction to the control chip 20; the control chip 20 is configured to control the first switch circuit 301, the second switch circuit 302, and the third switch circuit 303 to be turned on or off according to the selected instruction.
Optionally, the state selection unit 50 includes a liquid crystal driving chip 502, a touch liquid crystal chip 503, and a display screen 504; the display screen 504 is used for displaying at least one trigger interface 501 of a fault simulation state under the action of the liquid crystal driving chip 502 and the touch liquid crystal chip 503; as can be known from the descriptions in the foregoing embodiments, the inspection device in this embodiment of the application may simulate any one of the short-circuit state, the first resistance state, the second resistance state, the first cable state, and the second cable state of the ac/dc trial transmission instrument, and may display the trigger interfaces corresponding to the fault simulation states on the display screen 504, that is, the trigger interface that may display at least one fault simulation state on the display screen 504, where the trigger interface 501 may be a button or a virtual key, and a user may press a target trigger interface, so that the touch liquid crystal chip 503 sends a selected instruction of the target trigger interface to the liquid crystal driving chip 502 after obtaining the selected instruction of the target trigger interface, and the liquid crystal driving chip 502 sends the selected instruction of the target trigger interface to the control chip 20, the control chip 20 controls the first switch circuit 301, the second switch circuit 302 and the third switch circuit 303 to be turned on or off according to the selected instruction of the target trigger interface.
Optionally, as shown in fig. 9, the inspection apparatus further includes: an insulating case 60; the power supply 10, the control chip 20 and the inspection analog circuit 30 are fixed in the inner cavity of the insulation box 60; the display screen 504 in the state selection unit 50 is fixed on one side of the insulating box 60, and the liquid crystal driving chip 502 and the touch liquid crystal chip 503 in the state selection unit 50 are fixed in the inner cavity of the insulating box 60; the control chip 20, the inspection analog circuit 30, the liquid crystal driving chip 502 and the touch liquid crystal chip 503 can be fixed on a printed circuit board and connected through a lead on the printed circuit board, and the display screen 504 can be connected with the touch liquid crystal chip 503 through a flat cable with a copper shield; a first terminal 601 and a second terminal 602 can be arranged on the other side of the insulating box 60, and the first terminal 601 and the second terminal 602 can be fixed on the other side of the insulating box 60 by screws; the first terminal 601 and the second terminal 602 are connected to two ends of the first switch circuit 301, the second switch circuit 302, the first capacitor 303 and the third switch circuit 304, wherein the first terminal 601 can be connected to the output terminal 401 of the ac/dc trial transmission instrument 40, and the second terminal 602 can be connected to the ground terminal 402 of the ac/dc trial transmission instrument 40; the output end 401 and the grounding end 402 of the ac/dc trial transmission instrument 40 can be connected to the conductors of the first terminal 601 and the second terminal 602 by a wire hook or a wire clamp, and the wire hook can be screwed by a nut after connection so as to connect the ac/dc trial transmission instrument 40 and the inspection device, thereby realizing the performance inspection of the ac/dc trial transmission instrument 40.
Optionally, the testing apparatus may further include a voltage detector or a current detector, where the voltage detector may be connected in parallel to two ends of the testing analog circuit 30, and is configured to detect voltage values at two ends of the testing analog circuit 30, that is, a voltage value output by the ac/dc test transmission instrument, and calculate a current value in each fault state according to the voltage value and a resistance value corresponding to each fault state; or a current detector may be connected in series with the checking analog circuit 30 to detect the current value of the checking analog circuit 30 in each fault state; and the corresponding voltage, current, resistance, and capacitance values for each fault condition are displayed on the display 504 of the inspection device.
After the ac/dc trial sending instrument 40 and the inspection equipment are connected, a user can select a trigger interface 501 of a fault simulation state to be inspected on a display 504 of the inspection equipment, and the inspection device forms a corresponding fault state circuit according to the trigger interface 501; then, the user can turn on the power switch of the ac/dc trial transmission instrument 40, and set the voltage as a trial transmission voltage, that is, the voltage output to the inspection apparatus; under the condition that a user selects a trigger interface in a short-circuit state, observing whether a current value displayed by an ammeter on the AC/DC trial sending instrument 40 is a maximum value or not and observing whether an overcurrent protection function of the AC/DC trial sending instrument 40 is started or not; under the condition that the current value of the AC/DC trial sending instrument 40 is not maximum and the overcurrent protection function is not started, the AC/DC trial sending instrument can be judged to have a fault and needs to be checked and maintained; when the user selects the trigger interface in any one of the first resistance state, the second resistance state, the first cable state, and the second cable state, by observing the current value displayed on the ammeter in the ac/dc trial transmission instrument 40 and the current value displayed on the display 504 of the inspection apparatus, it is possible to determine that the ac/dc trial transmission instrument 40 has a failure when the current value of the ac/dc trial transmission instrument 40 is significantly different from the current value displayed on the display 504 of the inspection apparatus or the ammeter in the ac/dc trial transmission instrument 40 has no current; optionally, by determining a size relationship between a difference between the current value of the ac/dc trial sending apparatus 40 and the current value displayed on the display 504 of the inspection apparatus and a preset threshold, if the difference is greater than the preset threshold, it may be determined that the ac/dc trial sending apparatus 40 has a fault; in the embodiment of the present application, the basis for determining whether the ac/dc trial transmission instrument 40 has a fault is not limited.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. The utility model provides an inspection device of appearance is sent in examination to alternating current-direct current, its characterized in that includes: the device comprises a power supply, a control chip and an inspection analog circuit; the inspection analog circuit includes a first switching circuit;
two ends of the first switch circuit are respectively connected between the output end of the alternating current/direct current trial transmission instrument and the grounding end; the power supply is connected with the control chip, and the control end of the control chip is connected with the switch control end of the first switch circuit;
the control chip is used for controlling the conduction of the first switch circuit to enable the inspection analog circuit to simulate the short-circuit state of the alternating current/direct current trial transmission instrument.
2. The apparatus of claim 1, wherein the first switch circuit comprises a first relay, the control terminal of the control chip is connected to the first control terminal of the first relay, and the ground terminal of the first relay is grounded.
3. The apparatus of claim 2, wherein the verify analog circuit further comprises a second switching circuit; two ends of the second switch circuit are respectively connected between the output end of the alternating current/direct current trial transmission instrument and the grounding end;
the control chip is specifically configured to control the second switch circuit and the first switch circuit to be turned on or off, so that the inspection analog circuit simulates any one of a short-circuit state, a first resistance state and a second resistance state of the ac/dc trial transmission instrument, and a resistance value of the inspection analog circuit in the first resistance state is greater than a resistance value of the inspection analog circuit in the second resistance state.
4. The apparatus of claim 3, wherein the second switching circuit comprises a second relay, a first resistor, and a second resistor;
one end of the first resistor is connected with the output end of the AC/DC trial transmission instrument, the other end of the first resistor is connected with one end of the second resistor, and the other end of the second resistor is connected with the grounding end of the AC/DC trial transmission instrument;
one end of the second relay is connected with the output end of the alternating current-direct current trial transmission instrument, the second control end of the second relay is connected with the control end of the control chip, the other end of the second relay is connected between the first resistor and the second resistor, and the grounding end of the second relay is grounded.
5. The apparatus of claim 4, wherein the test analog circuit further comprises first capacitors respectively connected between the output terminal and the ground terminal of the AC/DC trial-and-error instrument.
6. The apparatus of claim 5, wherein the inspection simulation circuit further comprises a third switch circuit, and two ends of the third switch circuit are respectively connected between the output end and the ground end of the AC/DC trial sending instrument;
the control chip is specifically configured to enable the inspection simulation circuit to simulate any one of a short-circuit state, a first resistance state, a second resistance state, a first cable state, and a second cable state of the ac/dc trial transmission instrument by controlling on/off of the third switch circuit, the first switch circuit, and the second switch circuit;
the resistance value of the inspection analog circuit in the first resistance state is larger than the resistance value of the inspection analog circuit in the second resistance state;
the capacitance value of the inspection analog circuit in the first cable state is larger than the capacitance value of the inspection analog circuit in the second cable state.
7. The apparatus of claim 6, wherein the third switching circuit comprises: a third relay and a second capacitor;
one end of the third relay is connected with the output end of the AC/DC trial sending instrument, the other end of the third relay is connected with one end of the second capacitor, the third control end of the third relay is connected with the control end of the control chip, the grounding end of the third relay is grounded, and the other end of the second capacitor is connected with the grounding end of the AC/DC trial sending instrument.
8. The apparatus of claim 7, wherein said verifying means further comprises: the state selection unit is connected with the control chip and comprises at least one trigger interface in a fault simulation state;
the state selection unit is used for acquiring a selection instruction of a target trigger interface selected by a user and sending the selection instruction to the control chip;
and the control chip is used for controlling the first switch circuit, the second switch circuit and the third switch circuit to be switched on or switched off according to the selected instruction.
9. The device of claim 8, wherein the state selection unit comprises a liquid crystal driving chip, a touch liquid crystal chip and a display screen;
the display screen is used for displaying at least one trigger interface of a fault simulation state under the action of the touch liquid crystal chip and the liquid crystal driving chip.
10. The apparatus of any one of claims 1 to 9, wherein the inspection apparatus further comprises: an insulating box body;
the power supply, the control chip and the inspection analog circuit are fixed in the inner cavity of the insulating box body.
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| CN202011317950.9A CN112611995A (en) | 2020-11-23 | 2020-11-23 | Testing device for AC/DC trial delivery instrument |
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| CN202011317950.9A CN112611995A (en) | 2020-11-23 | 2020-11-23 | Testing device for AC/DC trial delivery instrument |
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| CN201402539Y (en) * | 2009-03-19 | 2010-02-10 | 山东科汇电力自动化有限公司 | Simulating device for electrical cable fault test |
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