CN112577408B - Device and method for detecting thickness of electrolyte plasma polishing anode gas film - Google Patents
Device and method for detecting thickness of electrolyte plasma polishing anode gas film Download PDFInfo
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- CN112577408B CN112577408B CN202011260973.0A CN202011260973A CN112577408B CN 112577408 B CN112577408 B CN 112577408B CN 202011260973 A CN202011260973 A CN 202011260973A CN 112577408 B CN112577408 B CN 112577408B
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- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
Abstract
The invention relates to a device for detecting the thickness of an electrolyte plasma polishing anode gas film and a detection method thereof, wherein the device comprises an anode clamp, a gas film thickness measuring patch and a voltage measuring instrument; the air film thickness measuring patch is adhered to the concave surface of the anode clamp, and the micro conductive wire is connected with the voltage measuring instrument through a lead; the voltage tester is provided with a voltage value display and a micro conductive wire selection knob, and the number corresponding to the selection knob corresponds to the micro conductive wire; a first one of the plurality of micro conductive wires laid in parallel in the gas film thickness measuring patch is connected with the anode, and the other end of the plurality of micro conductive wires is connected with the anode of the voltage measuring circuit; the rest of the fine conductive wires are connected with metal sheets uniformly distributed on the rotary knob circular table through leads, and the thickness of the film is detected according to the diameters of the conductive wires and the distance between the conductive wires by measuring the voltage variation trend between the anode and each metal sheet. The invention has the advantages of convenient carrying, simple operation and lower cost, and can monitor the thickness of the electrolyte plasma polishing anode gas film in real time.
Description
Technical Field
The invention relates to the technical field of electrolyte plasma polishing and processing, in particular to a device and a method for monitoring the thickness of an electrolyte plasma polishing anode gas film.
Background
The electrolyte plasma polishing and processing technology is a green, environment-friendly and efficient surface polishing, cleaning and deburring technology which is gradually developed in 30 years, and has extremely wide application prospects in the fields of aerospace, medical instruments, precise instruments and meters and the like. The method is mainly used for reducing the roughness value of the surface of the workpiece, improving the finish, removing the edge burrs of the complex workpiece and ensuring that the processed workpiece has certain corrosion resistance.
Electrolyte plasma polishing is a special electrochemical surface treatment method. In particular, it is a special case of anodic electrochemical dissolution, which, unlike electrochemical polishing, requires higher voltages and uses environmentally friendly salt solutions. The method is mainly characterized in that a layer of gas film is generated on the surface of an anode in the processing process, plasma is generated under the action of a strong electric field and generates complex physical and chemical reaction with anode materials, and due to the tip effect, the protruding part of a workpiece is removed first, so that the polishing and deburring effects are generated. The gas film generated in the electrolyte plasma polishing and processing process mainly comprises water vapor and oxygen, the impedance value of the gas film is far larger than that of a conductive medium, the thickness of the gas film is small and is about 0.3-3 mm, the thickness of the gas film directly determines the electric field intensity between the gas films and the current density of the anode surface, and the removal rate and the processing effect of materials are further influenced. Although the electrolyte plasma polishing and processing technology is applied to a certain extent, the influence factors of the material removal mechanism and the gas film thickness are not clear, but the monitoring of the gas film thickness in the electrolyte plasma polishing and processing process has great significance for researching the material removal mechanism and improving the processing effect. Therefore, there is a need to develop an apparatus and method for detecting the thickness of a gas film during electrolyte plasma polishing and processing with simple operation.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides a device for detecting the thickness of an electrolyte plasma polishing anode gas film and a detection method thereof. The measuring range of the micro conductive wires with different diameters can be enlarged by replacing the micro conductive wires with different diameters, and the micro conductive wires which are leaked again by polishing can be reused, so that the cost is low.
The device consists of an anode clamp, a gas film thickness measuring patch and a voltage measuring instrument. The gas film thickness measuring patch is adhered to an anode clamp by high-strength glue, one side of the gas film thickness measuring patch is in contact with an anode workpiece, a first micro conductive wire in the gas film thickness measuring patch is in contact with the anode workpiece, after a gas film is generated, a part of the parallel micro conductive wires are positioned in the gas film, the micro conductive wires at the moment are positioned in electrolyte when the voltage value is not changed greatly by measuring the voltage value between the anode workpiece and each micro conductive wire, and the gas film thickness can be calculated according to the number of resistance wires and the distance between the resistance wires.
In order to achieve the purpose, the invention adopts the following technical scheme:
a device for detecting the thickness of an electrolyte plasma polishing anode gas film comprises an anode clamp, a gas film thickness measuring patch and a voltage measuring instrument.
The air film thickness measuring patch is adhered to the concave surface of the anode clamp, and the micro conductive wire is connected with the voltage measuring instrument through a lead. The corresponding serial numbers (0, 1, 2 and 3 …) on the voltage tester are sequentially corresponding to the micro conductive wires.
The voltage measuring instrument is provided with a voltage value display and a micro conductive wire selection knob, different micro conductive wires are sequentially connected to the voltage measuring circuit by rotating the knob, and measured voltage value data are stored. And fitting by taking the serial number of the fine conductive wire as an abscissa and the voltage measurement value as an ordinate to obtain a curve, wherein when the slope of the curve is reduced, the fine conductive wire crosses the gas film area and enters the electrolyte solution.
The micro conductive wire selection knob is fixed on the voltage measuring instrument through three positioning grooves of the knob round table. The micro conductive wire selection knob is connected with the knob round table through a conductive slip ring groove and a spring contact, and the micro conductive wire to be measured is selected by rotating the conductive wire selection knob, so that different voltage values between the micro conductive wire and the anode workpiece are obtained. The rotary knob round platform is provided with grooves with the same number as the micro conductive wires, the micro conductive wires are sequentially embedded into the conductive sheet grooves on the rotary knob round platform and are bonded with the bottoms of the grooves through high-strength glue.
The anode clamp is provided with a pre-tightening screw, an anode workpiece can be fixed on the anode clamp, and the anode clamp is provided with a concave surface which has the same length and width as the gas film thickness measuring patch and is used for sticking the gas film thickness measuring patch. A first micro conductive wire (No. 0) in the air film thickness measuring patch is connected with the anode workpiece and the positive electrode of the voltage measuring circuit, the micro conductive wire is connected with a wire plug through a wire, and the micro conductive wire is connected with a voltage measuring instrument through an interface. The anode clamp and the pre-tightening screw thereof are made of insulating materials.
The gas film thickness measuring patch is mainly formed by bonding two mica sheets with the same size and thickness, is stuck on the concave surface of the anode clamp and is attached to a workpiece. And paving fine conductive wires between the mica sheets from one edge, wherein the fine conductive wires are adhered to the mica sheets by using insulating glue and are clamped between the two mica sheets.
The fine conductive wire is made of metal or nonmetal materials with excellent wire performance and higher melting point, such as tungsten wires, platinum wires or carbon fibers; the micro conductive wires are laid horizontally and vertically to the plane of the anode workpiece to be measured, are insulated from each other, have one end flush with and leak out of the conductive substrate, and have the other end connected with the lead and connected with a voltage tester through a lead plug and an interface.
A method for detecting the thickness of an electrolyte plasma polishing anode gas film comprises the following steps:
(1) manufacturing an air film thickness measuring patch: uniformly coating a layer of insulating paint on the outer surfaces of other conductive wires except the No. 0 micro conductive wire to ensure that the diameters of the micro conductive wires are the same, and measuring the diameter phi of the No. 0 micro conductive wire by using a micrometer screw after the insulating paint is dried0 And recorded. And (2) paving the number 0 micro conductive wire along the edge of the mica sheet, measuring the diameter phi of the rest micro conductive wires by using a micrometer caliper, recording, paving the rest micro conductive wires on the mica sheet side by side towards the other edge in sequence, ensuring that the micro conductive wires are close to each other in the paving process, and clamping and fixing the paved micro conductive wires between the two mica sheets by using insulating glue after the paving is finished. Polishing the mica sheet by a precision grinding machine perpendicular to the end part of the conductive wire to enable the top end of the mica sheet to be flush and expose the metal matrix of the conductive wire;
(2) clamping a workpiece on an anode clamp, tightly attaching a gas film thickness measuring patch to the workpiece and fixing the gas film thickness measuring patch on the anode clamp, enabling the polished plane to be vertical to one surface of the workpiece to be measured, and connecting a lead plug with a voltage measuring instrument;
(3) connecting a workpiece to a power supply, immersing the workpiece into electrolyte after electrifying, performing electrolyte plasma polishing, rotating a conductive wire selection knob of a voltage measuring instrument, selecting micro conductive wires at different gears, and storing and recording the voltage value of each gear;
(4) calculating the thickness of the gas film: the stored voltage data is derived and numbered by the corresponding number N of the micro conductive wireiThe abscissa is the voltage value and the ordinate is the voltage value, and the curve is fitted with data processing software. When the curve begins to become flat and slow, the fine conductive wire is indicated to enter the electrolyte, and the corresponding knob number N is recorded at the momenti. The thickness value of the air film can be obtained by the formula L = phi0+φ×NiCalculating to obtain;
wherein L is the thickness value of the gas film; n is a radical ofiThe number value of the corresponding micro conductive wire when the voltage begins to become flat and slow; phi is a0The diameter of the number 0 micro conductive wire; phi is the diameter of the micro conductive wire coated with the insulating paint.
The invention has the technical effects that:
(1) the device provided by the invention can monitor the thickness value of the gas film of the anode workpiece in the electrolyte plasma polishing process in real time, and can calculate the thickness of the gas film by measuring the voltage change value between each micro conductive wire and the anode by utilizing the characteristic of larger voltage gradient in the gas film.
(2) Simple structure, easy and simple to handle, it is convenient to dismantle, can enlarge its measuring range through the fine conductive filament of using different diameters again, and spill fine conductive filament repeatedly usable again through polishing, low cost.
Drawings
FIG. 1 is a schematic diagram of the overall structure of the apparatus for detecting the thickness of an electrolyte plasma polishing anode gas film according to the present invention;
FIG. 2 is a detailed view of the anode clamp and the gas film thickness measurement patch of the present invention;
FIG. 3 is a schematic structural view of a fine conductive yarn selection knob according to the present invention;
FIG. 4 is a schematic view of a wire plug;
FIG. 5 is a schematic structural view of a circular truncated view of the knob of the present invention;
FIG. 6 is a fine conductive filament-voltage fit graph;
FIG. 7 is a schematic view of a stepped fine conductive filament arrangement;
FIG. 8 is a schematic diagram of electrolyte plasma polishing and processing gas film portable measurement.
Description of the main symbols in the drawings: 1-an anode clamp, 11-a pre-tightening screw, 12-a workpiece, 2-a gas film thickness measuring patch, 21-a gas film, 22-a mica sheet, 23-a micro conductive wire, 24-a gas-liquid boundary, 25-a lead, 26-a lead plug, 261-a positioning boss, 262-a micro conductive wire pin, 27-a portable measuring contact, 3-a voltage measuring instrument, 31-a display, 32-a micro conductive wire selection knob, 321-a conductive sheet, 322-a lead groove, 323-a knob round table and 324-a spring contact (a, b and c), wherein the three parts have the same structure but different functions, a and b mainly play a role of conducting a circuit, c mainly plays a role of balance and fixed support, 325-a knob round table positioning groove and 326-a conductive slip ring, 327-positive terminal post of voltage measuring circuit, 328-knob round platform through hole.
Detailed Description
The invention is further described with reference to the following examples.
Example 1
As shown in figure 1, the device for monitoring the thickness of the electrolyte plasma polishing anode gas film comprises an anode clamp 1, a gas film thickness measuring patch 2 and a voltage measuring instrument 3. The anode clamp and the gas film thickness measuring patch are connected by high-strength insulating glue, and the micro conductive wire 23 (with the diameter of 50-100 microns) is connected with the voltage measuring instrument 3 through a lead 25. The voltage tester (the measurable voltage range is 0-1500V) is correspondingly provided with serial numbers (0, 1, 2 and 3 …) corresponding to each micro conductive wire laid side by side.
As shown in fig. 2, the air film thickness measuring patch 2 is composed of fine conductive wires 23 and two mica sheets 22 (with a thickness of 0.5 to 2 mm) for holding the fine conductive wires. The fine conductive wires are coated with insulating paint and are laid from one side of the mica sheets in parallel in serial numbers (0, 1 and 2 …), in order to ensure that the conductive wires are not damaged by electrolyte plasma processing on the mica sheets, the conductive wires are adhered to the mica sheets by using insulating glue, then one mica sheet is added to clamp the conductive wires between the two mica sheets, and then the mica sheets are polished by using a precision grinding machine perpendicular to the fine conductive wires, so that the end surfaces of the fine conductive wires are flush with the edges of the mica sheets, and the metal matrix is exposed. The length of each fine conductive wire is longer than that of the mica sheet, the exposed part of each fine conductive wire is connected with a single lead, the number of the first conductive wire connected with the anode workpiece is 0, the conductive wires are sequentially increased in sequence and are respectively and correspondingly connected with pins in the lead plug through the leads.
Specifically, the fine conductive yarn No. 0 is connected to the anode workpiece and the positive terminal 327 of the voltage measuring circuit (fig. 3), and is connected to the positive electrode of the voltage measuring circuit. The fine conductive wire is connected to the voltage measuring device 3 via a line 25 and a line plug.
In order to ensure that the corresponding micro conductive wire is accurately connected to the voltage measuring instrument, a positioning boss 261 and a micro conductive wire pin 262 are arranged on the lead plug.
As shown in fig. 3, the fine conductive wire selection knob 32 is fixed to the voltage measuring apparatus through a positioning groove on a knob circular truncated cone 323, and the fine conductive wire selection knob is matched with a groove on a conductive slip ring 326 through two symmetrical spring contacts 324 (b, c). The rotary knob round platform is provided with conducting strip grooves and conducting strips 321 which are the same as the number of the micro conducting wires, and the conducting strips are numbered (0, 1 and 2 …), the number of the conducting strips is the same as the number of the micro conducting wires, the conducting strips are sequentially embedded into the conducting strip grooves on the rotary knob round platform, and the conducting strips are bonded with the bottoms of the grooves by high-strength glue. When the fine conductive wire selection knob is rotated, the selected fine conductive wire is connected with the negative electrode of the voltage measuring circuit through the conductive sheet 321, the spring contacts 324 (a, b) and the conductive slip ring 326 in sequence to form a loop, and the voltage value between the fine conductive wire and the anode workpiece can be measured.
Preferably, the anode clamp and the pre-tightening screw are made of high-temperature-resistant, acid-base-resistant and insulating materials and have certain rigidity, so that the anode clamp is prevented from participating in reaction in the machining process. The anode clamp is provided with a pre-tightening bolt 11 for fixing the workpiece, and the height of the clamp is slightly lower than that of the anode workpiece, so that the workpiece has enough section to be attached to the gas film thickness measuring patch. In addition, a concave surface with the depth the same as the size and the thickness of the mica sheet 22 is reserved on the anode clamp, so that one mica sheet in the gas film thickness measuring patch is embedded into the anode clamp, and the anode clamp and the gas film thickness measuring patch are connected in a gluing mode for convenient disassembly and assembly.
Preferably, the fine conductive wire is made of a high-temperature-resistant conductive material, such as tungsten wire, platinum wire, etc., and in order to prevent the fine conductive wire from being damaged in the processing process, the fine conductive wire needs to be insulated, and two mica sheets are used to sandwich the fine conductive wire.
The knob round platform is made of insulating materials, a through hole is reserved in the middle of the knob round platform, a lead connected with the micro conductive wire is evenly embedded into the lead groove through the through hole and connected with the conductive sheet, and three grooves are formed in the bottom of the round platform and fixed with the shell of the voltage measuring instrument. The spring contact has a hemispherical top and a cylindrical bottom and is made of a conductive material. And the conductive slip ring is made of a conductive material, the cross section of the conductive slip ring is provided with an arc groove with the same diameter as the spring contact, and the conductive slip ring is provided with a cathode binding post and is connected with the voltage measuring circuit by a lead.
A method for monitoring the thickness of gas film of anode in the process of polishing electrolyte plasma features that a layer of gas film 21 is generated under the action of electrolysis and Joule heat, and the voltage gradients at both sides of gas-liquid boundary 24 are different, so monitoring the voltage difference between each fine conducting wire and anode can calculate the thickness of gas film.
Specifically, the method comprises the following steps:
(1) making a gas film thickness measuring patch, uniformly coating a layer of insulating paint on the outer surface of the micro conductive wire 23 except the No. 0 micro conductive wire to ensure that the diameters of the micro conductive wire are consistent, and measuring the diameter phi of the No. 0 micro conductive wire by using a micrometer screw after the insulating paint is dried0And the diameter phi of the rest of the fine conductive wires. The conductive wires are laid on the mica sheets in parallel by number from the edge of the mica sheet 22 and sandwiched between the two mica sheets by insulating glue. Polishing the mica sheet by a precision grinding machine perpendicular to the conductive wire to enable the top end of the mica sheet to be flush and level, and leaking out of the metal matrix; another of the fine conductive filamentsOne end of the micro conductive wire is connected with a wire 25, and each micro conductive wire is connected with a separate wire and is connected with the voltage measuring instrument 3 through a wire plug 26.
(2) Clamping a workpiece 12 on an anode clamp 1, tightly attaching a gas film thickness measuring patch 2 to the workpiece, enabling a polished plane to be perpendicular to one surface of the workpiece 12 to be measured, ensuring that a No. 0 micro conductive wire is in contact with the anode workpiece, adhering the micro conductive wire to the anode clamp, and connecting a lead plug 26 with a voltage measuring instrument.
(3) The work piece 12 is connected to a power supply, is immersed into the electrolyte after being electrified, carries out electrolyte plasma polishing processing, rotates the fine conductive wire selection knob 32 of the voltage measuring instrument 3 and stores and records the voltage value of each gear.
(4) And (3) fitting a curve by using data processing software by taking the corresponding serial number of the micro conductive wire as an abscissa and taking the voltage value as an ordinate. When the curve begins to become flat and slow, the fine conductive wire is indicated to enter the electrolyte, and the corresponding knob number N is recorded at the momenti. The thickness value of the air film can be calculated by the following formula;
L=φ0+φ×Ni
wherein L is the thickness value of the gas film; n is a radical ofiNumbering the micro conductive wires correspondingly; phi is a0The diameter of the number 0 micro conductive wire; phi is the diameter of the micro conductive wire coated with the insulating paint.
Further, if the fine conductive filaments are arranged in a stepwise manner as shown in fig. 7, the calculation formula of the thickness of the air film is L = L × NiAnd l is the distance between the end faces of each micro conductive wire.
When the anode workpiece is regular in shape and convenient to clamp, the workpiece can be directly clamped on the anode clamp, and when the anode workpiece is irregular in shape and inconvenient to clamp on the anode clamp, such as a round or workpiece cavity, the gas film measuring patch can be adhered to the portable measuring contact 27 for handheld measurement.
The above description is only for the preferred embodiment of the present invention, but the scope of the present invention is not limited thereto, and any person skilled in the art should be considered to be within the technical scope of the present invention, and the technical solutions and the inventive concepts thereof according to the present invention should be equivalent or changed within the scope of the present invention.
Claims (8)
1. A device for detecting the thickness of an electrolyte plasma polishing anode gas film is characterized by comprising an anode clamp, a gas film thickness measuring patch and a voltage measuring instrument; the air film thickness measuring patch is adhered to the concave surface of the anode clamp, and the micro conductive wire is connected with the voltage measuring instrument through a lead; the voltage tester is provided with a voltage value display and a micro conductive wire selection knob, and the number corresponding to the selection knob corresponds to the micro conductive wire;
the air film thickness measuring patch is formed by horizontally bonding two mica sheets with the same size and thickness, micro conductive wires which are laid between two edges in parallel are clamped between the mica sheets, the micro conductive wires are mutually insulated, one end of each micro conductive wire is flush and exposes out of a conductive base body, and the other end of each micro conductive wire is connected with a wire and is connected with a voltage tester through a wire plug and an interface.
2. The apparatus for detecting the thickness of the gas film of the electrolyte plasma polishing anode according to claim 1, wherein a first fine conductive wire laid along the edge of the mica sheet in the fine conductive wires is connected with a positive terminal of a voltage measuring circuit and is connected to a positive electrode of the voltage measuring circuit; a micro conductive wire selection knob of the voltage tester is fixed with the voltage tester through a positioning groove on a knob round table (323); the micro conductive wire selection knob is matched with a groove on the conductive sliding ring (326) through two symmetrical spring contacts, and when the micro conductive wire selection knob is rotated, the selected micro conductive wire is connected with the negative electrode of the voltage measuring circuit through the conductive sheet (321), the spring contacts and the conductive sliding ring (326) in sequence.
3. The apparatus for detecting the thickness of an electrolyte plasma polishing anode gas film according to claim 1 or 2, wherein the fine conductive wires are arranged in a stepped manner.
4. The apparatus as claimed in claim 1, wherein the fine conductive wire is made of a metal or nonmetal material having a high melting point and excellent conductivity.
5. The apparatus for detecting the thickness of an anode gas film in electrolyte plasma polishing according to claim 1 or 4, wherein the fine conductive wire is made of any one of tungsten wire, platinum wire or carbon fiber.
6. The apparatus for detecting the thickness of an electrolyte plasma polishing anode gas film according to claim 1, wherein the fine conductive wire selection knob is fixed on the voltage measuring instrument through three positioning grooves of a circular table of the knob; the micro conductive wire selection knob is connected with the knob round table through a conductive slip ring groove and a spring contact, and the micro conductive wire to be measured is selected by rotating the conductive wire selection knob, so that different voltage values between the micro conductive wire and the anode workpiece are obtained.
7. The apparatus of claim 2, wherein the knob circular table is provided with grooves having the same number as the number of the fine conductive wires, and the fine conductive wires are sequentially embedded into the grooves of the conductive sheet on the knob circular table and fixed at the bottom of the grooves.
8. The method for detecting the gas film thickness of the electrolyte plasma polishing anode based on the device for detecting the gas film thickness of the electrolyte plasma polishing anode of claim 1, wherein the gas film thickness value is calculated by monitoring the voltage difference between each fine conductive wire and the anode, and the method comprises the following steps:
(1) manufacturing an air film thickness measuring patch: uniformly coating a layer of insulating paint on the outer surfaces of other conductive wires except the No. 0 micro conductive wire to ensure that the diameters of the micro conductive wires are the same, and measuring the diameter phi of the No. 0 micro conductive wire after the insulating paint is dried0And recording; the number 0 micro conductive wire is laid along the edge of the mica sheet, and the rest micro conductive wires are measured to be straightAfter the diameter phi is recorded, the micro conductive wires are sequentially laid on the mica sheets side by side towards the other edge, the micro conductive wires are ensured to be close to each other in the laying process, and after the laying is finished, the laid micro conductive wires are clamped and fixed between the two mica sheets by using insulating glue; polishing the mica sheet by a precision grinding machine perpendicular to the end part of the conductive wire to enable the top end of the mica sheet to be flush and expose the metal matrix of the conductive wire;
(2) clamping a workpiece on an anode clamp, tightly attaching an air film thickness measuring patch to the workpiece and fixing the air film thickness measuring patch on the anode clamp, enabling a polished plane of the air film thickness measuring patch to be perpendicular to one surface of the workpiece to be measured, and connecting a lead plug with a voltage measuring instrument;
(3) connecting a workpiece to a power supply, immersing the workpiece into electrolyte after being electrified, performing electrolyte plasma polishing, rotating a conductive wire selection knob of a voltage measuring instrument, selecting the micro conductive wires at different gears, driving a spring contact (324) by the micro conductive wire selection knob to sequentially connect the micro conductive wires to the negative electrode of a voltage measuring circuit through a conductive slip ring (326), measuring the voltage value between the micro conductive wires and the anode workpiece, and storing and recording the voltage value of each gear;
(4) calculating the thickness of the gas film: deriving the stored voltage data, taking the corresponding serial number Ni of the micro conductive wire as an abscissa and the voltage value as an ordinate, and fitting a curve by using data processing software; when the curve begins to become flat and slow, the fine conductive wire is indicated to enter the electrolyte, and the corresponding knob number N is recorded at the momenti;
The thickness value of the air film can be obtained by the formula L = phi0+φ×NiCalculating to obtain;
wherein L is the thickness value of the gas film; n is a radical ofiThe number value of the corresponding micro conductive wire when the voltage begins to become flat and slow; phi is a0The diameter of the number 0 micro conductive wire; phi is the diameter of the micro conductive wire coated with the insulating paint.
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