CN211785275U - Electrical test sample pool suitable for low-temperature strong magnetic field - Google Patents
Electrical test sample pool suitable for low-temperature strong magnetic field Download PDFInfo
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- CN211785275U CN211785275U CN202020303286.1U CN202020303286U CN211785275U CN 211785275 U CN211785275 U CN 211785275U CN 202020303286 U CN202020303286 U CN 202020303286U CN 211785275 U CN211785275 U CN 211785275U
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Abstract
The utility model relates to an electrical test sample cell, in particular to an electrical test sample cell suitable for a low-temperature high-intensity magnetic field, which comprises a sample cell main body, an insulating partition plate, a PCB adapter plate and an electrode contact pin insulating plate which are arranged in sequence, wherein the bottom of the sample cell main body is provided with a first threaded hole for fixing the insulating partition plate, the PCB adapter plate and the electrode contact pin insulating plate, the top of the sample cell main body is provided with a second threaded hole for fixing a sample, and the PCB adapter plate is connected with the electrode contact pin insulating plate through a wire spring bus contact pin; the utility model provides a technical scheme can effectively overcome the defect that test electrode that prior art exists connects inconvenience, test function singleness.
Description
Technical Field
The utility model relates to an electricity test sample cell, concretely relates to electricity test sample cell suitable for low temperature high-intensity magnetic field.
Background
Resistivity, carrier density and mobility are three important parameters for understanding the electrical transport properties of a material. The carrier transport property is one of the most important intrinsic characteristics of the material, and the transport behavior of the film can be judged to be metal, semiconductor or insulator by measuring the change of the resistivity of the film along with the temperature.
The measurement of carrier density and mobility usually adopts hall resistance measurement method, the measured hall resistance is a function of magnetic field, and the obtained slope sign of the hall resistance can judge whether the carrier type is electron (corresponding to negative slope) or hole (corresponding to positive slope). From both basic research at the front of science and application development research, people are urgently required to test and master the electrical transport characteristics of materials in a low-temperature strong magnetic field environment.
Generally, the low-temperature strong magnetic field environment where the tested sample is located is narrow in space, the connection of a testing electrode is inconvenient, the time consumed by sample replacement is long, the testing function is single, and high-flux electrical characterization and multifunctional electrical testing of scientific researchers are not facilitated.
SUMMERY OF THE UTILITY MODEL
Technical problem to be solved
To the above-mentioned shortcoming that prior art exists, the utility model provides an electricity test sample cell suitable for low temperature high-intensity magnetic field can effectively overcome the defect that test electrode that prior art exists connects inconvenience, test function singleness.
(II) technical scheme
In order to achieve the above purpose, the utility model discloses a following technical scheme realizes:
an electrical test sample cell suitable for a low-temperature high-intensity magnetic field comprises a sample cell main body, an insulating partition plate, a PCB adapter plate and an electrode pin insulating plate which are sequentially arranged, wherein a first threaded hole for fixing the insulating partition plate, the PCB adapter plate and the electrode pin insulating plate is formed in the bottom of the sample cell main body, and a second threaded hole for fixing a sample is formed in the top of the sample cell main body;
the PCB adapter plate is connected with the electrode contact pin insulating plate through a wire spring female contact pin.
Preferably, the side edge of the sample cell main body is provided with rectangular grooves which are uniformly distributed and used for accommodating the conducting wires.
Preferably, a clamping groove for clamping and transferring is formed in the side edge of the sample cell main body.
Preferably, the insulation partition plate, the PCB adapter plate and the electrode contact pin insulation plate are fixed with the sample cell main body through oxygen-free copper screws matched with the first threaded holes, and the sample cell main body is fixed with the sample through oxygen-free copper screws matched with the second threaded holes.
Preferably, the sample cell main body is made of oxygen-free copper, and after the sample cell main body is manufactured, 30 microns of gold is plated, and then sand blasting is performed.
Preferably, the insulating partition plate and the electrode pin insulating plate are both made of polytrifluoroethylene, and the surfaces of the insulating partition plate and the electrode pin insulating plate are subjected to smoothing treatment after the manufacturing is finished.
Preferably, the PCB interposer is made of one material of phenolic resin, glass fiber, and epoxy resin.
Preferably, the sample cell main body is provided with a holding tank for holding the fixed insulating partition plate and the PCB adapter plate.
Preferably, the insulating partition plate and the PCB adapter plate are respectively provided with a first positioning hole and a second positioning hole for alignment.
(III) advantageous effects
Compared with the prior art, the utility model provides an electricity test sample cell suitable for low temperature high-intensity magnetic field can realize corresponding functional test through changing the sample PCB board of different test functions, such as hall effect test, resistivity test, device field effect test etc. sample cell can realize seamless butt joint through wire spring female contact pin and the cavity inside in the low temperature high-intensity magnetic field, can once only realize the electricity test demand of a plurality of sample PCB boards under low temperature high-intensity magnetic field environment on the one hand, improves the efficiency of electricity test greatly; on the other hand, the sample cell can only need to be changed corresponding sample PCB board according to the test demand, just can satisfy different test demands, greatly improves efficiency of software testing, greatly reduced sample cell's maintenance cost.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
FIG. 1 is an exploded view of the structure of the present invention;
FIG. 2 is a left side view of the sample cell body of FIG. 1 according to the present invention;
FIG. 3 is a cross-sectional view of the sample cell body of FIG. 1 according to the present invention;
FIG. 4 shows the results of resistance-temperature tests performed on a plurality of samples according to the present invention;
in the figure:
1. a sample cell body; 2. an insulating spacer; 3. a PCB adapter plate; 4. an electrode pin insulating plate; 5. a rectangular groove; 6. a second threaded hole; 7. a first threaded hole; 8. a card slot; 9. a second positioning hole; 10. a first locating hole.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the drawings in the embodiments of the present invention are combined below to clearly and completely describe the technical solutions in the embodiments of the present invention. It is to be understood that the embodiments described are only some of the embodiments of the present invention, and not all of them. Based on the embodiments in the present invention, all other embodiments obtained by a person skilled in the art without creative efforts belong to the protection scope of the present invention.
An electrical test sample cell suitable for a low-temperature high-intensity magnetic field comprises a sample cell main body 1, an insulating partition plate 2, a PCB adapter plate 3 and an electrode pin insulating plate 4 which are sequentially arranged, wherein a first threaded hole 7 for fixing the insulating partition plate 2, the PCB adapter plate 3 and the electrode pin insulating plate 4 is formed in the bottom of the sample cell main body 1, and a second threaded hole 6 for fixing a sample is formed in the top of the sample cell main body 1;
the PCB adapter plate 3 is connected with the electrode pin insulating plate 4 through a wire spring female pin.
The side of the sample cell main body 1 is provided with a clamping groove 8 for clamping and transferring.
The clamping groove 8 is convenient to transfer the whole device by adopting a clamping device and is suitable for a low-temperature high-intensity magnetic field with narrow environmental space.
The insulating partition plate 2, the PCB adapter plate 3 and the electrode pin insulating plate 4 are fixed with the sample cell main body 1 through oxygen-free copper screws matched with the first threaded holes 7, and the sample cell main body 1 is fixed with a sample through oxygen-free copper screws matched with the second threaded holes 6.
The sample cell main body 1 is made of oxygen-free copper, and after the sample cell main body is manufactured, 30 mu m of gold is plated, and then sand blasting is carried out.
The insulating partition plate 2 and the electrode pin insulating plate 4 are both made of polytrifluoroethylene, and the surfaces of the insulating partition plate and the electrode pin insulating plate are subjected to smoothing treatment after the manufacturing is finished.
The PCB adapter plate 3 is made of one of phenolic resin, glass fiber and epoxy resin.
The sample cell main body 1 is provided with a holding tank for holding the fixed insulating partition plate 2 and the PCB adapter plate 3.
The insulating partition board 2 and the PCB adapter board 3 are respectively provided with a first positioning hole 10 and a second positioning hole 9 for alignment.
The sample cell main body 1 is made of oxygen-free copper, so that the sample cell main body has good thermal conductivity in a low-temperature environment, and does not change a magnetic field environment in a strong magnetic field environment to influence an electrical test, and after the sample cell main body is manufactured, 30 mu m of gold is plated, and then sand blasting is performed, so that the sample cell main body has good oxidation resistance and wear resistance.
The insulating partition board 2 and the electrode pin insulating board 4 are both made of polytrifluoroethylene, so that high mechanical strength, excellent insulating property and super-strong low temperature resistance are ensured.
The PCB adapter plate 3 is made of one of phenolic resin, glass fiber and epoxy resin, and high reliability and long service life of a sample in a test under a low-temperature strong magnetic field environment are guaranteed. The PCB adapter plate 3 is used for leading the electrodes to the sample cell main body 1, and the conducting wires penetrate through the rectangular grooves 5, so that the connection test with the sample is facilitated.
The sample cell main body 1, the insulating partition plate 2, the PCB adapter plate 3 and the electrode pin insulating plate 4 are fixed by oxygen-free copper screws, and the sample cell main body 1 is fixed with a sample by the oxygen-free copper screws matched with the second threaded holes 6. The PCB adapter plate 3 and the electrode pin insulating plate 4 are connected through a wire spring female pin, and the wire spring female pin has the advantages of good electric contact, long service life and the like.
FIG. 3 shows the results of resistance-temperature measurements performed on multiple samples simultaneously using the teachings of the present application. The technical scheme of the application has the characteristics of conveniently replacing the samples and carrying out the test on the samples at one time, and greatly improves the test efficiency. Four wires are needed for four-wire resistance testing in general common testing, twelve threading holes are formed in the PCB adapter plate 3 and the electrode pin insulating plate 4 respectively, and therefore 3 samples can be tested at one time. In actual use, the number of the sample PCB boards can be reasonably selected according to the test type and the test purpose.
During testing, a sample can be flatly placed on the sample cell main body 1, and the lead and the sample PCB can be connected through a bonding process or through silver adhesive.
The technical scheme of the application can also be suitable for electrical testing or in-situ online monitoring and the like of samples in different gas environments and humidity environments after the samples are sealed.
The above embodiments are only used to illustrate the technical solution of the present invention, and not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it should be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not depart from the spirit and scope of the present invention in its corresponding aspects.
Claims (9)
1. An electrical test sample cell suitable for a low-temperature strong magnetic field is characterized in that: the sample cell comprises a sample cell main body (1), an insulating partition plate (2), a PCB adapter plate (3) and an electrode pin insulating plate (4) which are sequentially arranged, wherein a first threaded hole (7) for fixing the insulating partition plate (2), the PCB adapter plate (3) and the electrode pin insulating plate (4) is formed in the bottom of the sample cell main body (1), and a second threaded hole (6) for fixing a sample is formed in the top of the sample cell main body (1);
the PCB adapter plate (3) is connected with the electrode pin insulating plate (4) through a wire spring female pin.
2. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 1, wherein: the side edge of the sample cell main body (1) is provided with evenly distributed rectangular grooves (5) for accommodating wires.
3. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 1 or 2, wherein: the side of the sample cell main body (1) is provided with a clamping groove (8) for clamping and transferring.
4. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 1, wherein: the insulation baffle (2), the PCB adapter plate (3) and the electrode contact pin insulation plate (4) are fixed with the sample cell main body (1) through the oxygen-free copper screw matched with the first threaded hole (7), and the sample cell main body (1) is fixed with a sample through the oxygen-free copper screw matched with the second threaded hole (6).
5. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 1, wherein: the sample cell main body (1) is made of oxygen-free copper, and after the sample cell main body is manufactured, 30 mu m of gold is plated, and then sand blasting is performed.
6. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 1, wherein: the insulating partition plate (2) and the electrode contact pin insulating plate (4) are both made of polytrifluoroethylene, and the surfaces of the insulating partition plate and the electrode contact pin insulating plate are subjected to smoothing treatment after the insulating partition plate and the electrode contact pin insulating plate are manufactured.
7. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 1, wherein: the PCB adapter plate (3) is made of one of phenolic resin, glass fiber and epoxy resin.
8. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 1, wherein: the sample cell is characterized in that a containing groove used for containing the fixed insulating partition plate (2) and the PCB adapter plate (3) is formed in the sample cell main body (1).
9. An electrical test sample cell suitable for use in high magnetic fields at low temperatures according to claim 8, wherein: and the insulating partition plate (2) and the PCB adapter plate (3) are respectively provided with a first positioning hole (10) and a second positioning hole (9) for alignment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020303286.1U CN211785275U (en) | 2020-03-12 | 2020-03-12 | Electrical test sample pool suitable for low-temperature strong magnetic field |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202020303286.1U CN211785275U (en) | 2020-03-12 | 2020-03-12 | Electrical test sample pool suitable for low-temperature strong magnetic field |
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| Publication Number | Publication Date |
|---|---|
| CN211785275U true CN211785275U (en) | 2020-10-27 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202020303286.1U Active CN211785275U (en) | 2020-03-12 | 2020-03-12 | Electrical test sample pool suitable for low-temperature strong magnetic field |
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| Country | Link |
|---|---|
| CN (1) | CN211785275U (en) |
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- 2020-03-12 CN CN202020303286.1U patent/CN211785275U/en active Active
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