CN112556551A - Target hole capable of accurately judging layer deviation - Google Patents

Target hole capable of accurately judging layer deviation Download PDF

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Publication number
CN112556551A
CN112556551A CN202011226977.7A CN202011226977A CN112556551A CN 112556551 A CN112556551 A CN 112556551A CN 202011226977 A CN202011226977 A CN 202011226977A CN 112556551 A CN112556551 A CN 112556551A
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CN
China
Prior art keywords
core
scale
target hole
identification
layer deviation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202011226977.7A
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Chinese (zh)
Inventor
肖仲波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Aoshikang Technology Co Ltd
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Aoshikang Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aoshikang Technology Co Ltd filed Critical Aoshikang Technology Co Ltd
Priority to CN202011226977.7A priority Critical patent/CN112556551A/en
Publication of CN112556551A publication Critical patent/CN112556551A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/24Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes
    • G01B5/25Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
    • G01B5/252Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes for measuring eccentricity, i.e. lateral shift between two parallel axes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

The invention relates to the technical field of PCB (printed circuit board) manufacturing, and discloses a target hole for accurately judging layer deviation. Compared with the prior art, the core board positioning method and the core board positioning device have the advantages that the identification patterns are arranged, the scale identification lines are arranged on the identification patterns, the identification patterns on the core boards are compared with the corresponding scale lines, if the positions of the identification patterns do not correspond to the scale lines, the core boards are deviated, and if the positions of the identification patterns do not correspond to the scale lines, the core boards are not deviated. The layer deviation condition of each layer can be accurately judged through the structural design.

Description

Target hole capable of accurately judging layer deviation
Technical Field
The invention relates to the technical field of PCB manufacturing, in particular to a target hole capable of accurately judging layer deviation.
Background
In the PCB graphic design, a tool hole-target hole at the edge of a board is one of necessary tool holes, and whether the layer is deviated or not is judged by using an X-ray to check concentric circles at the edge of the board at present.
Therefore, it is necessary to provide a new target hole for accurately determining layer deviation to solve the above-mentioned technical problems.
Disclosure of Invention
The invention aims to solve the technical problem of providing a target hole capable of accurately judging layer deviation, which has a simple structure and can accurately judge the layer deviation condition of each layer.
According to the technical scheme, the target hole capable of accurately judging layer deviation comprises a PCB, wherein the PCB comprises a plurality of core plates which are sequentially stacked from top to bottom, identification patterns are arranged on the core plates, the identification patterns of the core plates are sequentially increased or decreased from top to bottom, and a scale identification line is arranged on the identification pattern of one of the core plates.
Preferably, the identification pattern is circular.
Preferably, a plurality of scale marks are arranged on the scale mark lines, and the scale marks and the mark patterns are arranged in a one-to-one correspondence manner.
Preferably, the number of the scale marks is four, and the four scale marks form a cross structure.
Preferably, the scale mark line is arranged on the core plate at the top end or the core plate at the bottom end.
Compared with the prior art, the core board positioning method and the core board positioning device have the advantages that the identification patterns are arranged, the scale identification lines are arranged on the identification patterns, the identification patterns on the core boards are compared with the corresponding scale lines, if the positions of the identification patterns do not correspond to the scale lines, the core boards are deviated, and if the positions of the identification patterns do not correspond to the scale lines, the core boards are not deviated. The layer deviation condition of each layer can be accurately judged through the structural design.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic diagram of a target hole structure of the PCB of the present invention with layer offset;
FIG. 3 is a schematic diagram of a concentric circle structure of a PCB with layer deviation in the prior art;
fig. 4 is a schematic structural diagram of the third embodiment.
In the figure:
1. marking pattern, 2 graduation marking lines, 21 graduation lines.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Example one
The invention provides a target hole capable of accurately judging layer deviation, which comprises a PCB (printed circuit board), wherein the PCB comprises a plurality of core plates which are sequentially stacked from top to bottom, the core plates are provided with identification patterns 1, the identification patterns 1 of the core plates are sequentially reduced from top to bottom, and the identification pattern 1 of one core plate in the core plates is provided with a scale identification line 2.
The identification pattern 1 is circular.
The scale mark lines 2 are provided with a plurality of scale lines 21, and the scale lines 21 are arranged in one-to-one correspondence with the mark patterns 1. Referring to fig. 1, in the present embodiment, the circle is tangent to the graduation marks 21, indicating that the core plates are not deviated. If the circle is not tangent to its corresponding graduation mark 21, the deviation of the circle can be easily found.
The number of the scale marks 2 is four, and the four scale marks 2 form a cross structure. The four scale mark lines 2 are distributed on a circle in an array mode, so that the circular deviation degree can be observed conveniently from any direction, and the detection efficiency is further improved.
The scale mark line 2 is arranged on the core plate at the top end.
Example two
The present embodiment is substantially the same as the first embodiment, except that:
the identification patterns 1 of the core plate are sequentially increased from top to bottom.
EXAMPLE III
The present embodiment is substantially the same as the first embodiment, except that:
referring to fig. 4, the logo pattern 1 has a square shape.
Example four
The present embodiment is substantially the same as the first embodiment, except that:
the scale mark lines 2 are arranged on the core plate at the bottom end.
Referring to fig. 3, each core has no deviation in the circular shape, and referring to the smallest circular shape, the second smallest circular shape is easily seen as having a deviation from the second smallest circular position, but it is difficult to determine whether there is a deviation by viewing the other circular shapes.
Referring to fig. 2, by adding the marked scale lines 21, the circle on each core plate is compared with the corresponding scale line 21, if the position is not tangent, the core plate is deviated, and if the position is tangent, the core plate is not deviated.
In the invention, the layer deviation condition of each layer can be accurately judged by arranging the identification pattern 1 and arranging the scale identification lines 2 on the identification pattern 1.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents and improvements made within the spirit and principle of the present invention are intended to be included within the scope of the present invention.

Claims (5)

1. The utility model provides an accurate target hole of judging layer partially, its characterized in that, includes the PCB board, the PCB board is including from top to bottom stacking a plurality of cores of establishing in proper order, be equipped with the identification pattern on the core, the identification pattern of core from top to bottom increases in proper order or reduces in proper order, and is a plurality of be equipped with the scale mark line on the identification pattern of a core in the core.
2. The target hole for accurately determining layer bias according to claim 1, wherein the identification pattern is circular.
3. The target hole for accurately judging layer deviation according to claim 2, wherein a plurality of scale marks are arranged on the scale mark line, and the scale marks are arranged in one-to-one correspondence with the mark patterns.
4. The target hole for accurately determining layer deviation according to claim 3, wherein the number of the scale marks is four, and four scale marks form a cross structure.
5. The target hole for accurately judging layer deviation according to claim 4, wherein the scale mark line is arranged on the top core plate or the bottom core plate.
CN202011226977.7A 2020-11-05 2020-11-05 Target hole capable of accurately judging layer deviation Pending CN112556551A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202011226977.7A CN112556551A (en) 2020-11-05 2020-11-05 Target hole capable of accurately judging layer deviation

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202011226977.7A CN112556551A (en) 2020-11-05 2020-11-05 Target hole capable of accurately judging layer deviation

Publications (1)

Publication Number Publication Date
CN112556551A true CN112556551A (en) 2021-03-26

Family

ID=75041670

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202011226977.7A Pending CN112556551A (en) 2020-11-05 2020-11-05 Target hole capable of accurately judging layer deviation

Country Status (1)

Country Link
CN (1) CN112556551A (en)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW423713U (en) * 1999-01-26 2001-02-21 Taiwan Semiconductor Mfg Position calibration of the wafer edge width
CN105072830A (en) * 2015-09-10 2015-11-18 江门崇达电路技术有限公司 Layer deviation detection method
CN208847140U (en) * 2018-10-29 2019-05-10 贵州开磷机电装备工程有限责任公司 A kind of junction box levelling device
CN109862690A (en) * 2019-03-30 2019-06-07 奥士康科技股份有限公司 A kind of pcb board in integrated multiple types of tools hole
CN210019372U (en) * 2019-01-09 2020-02-07 荆莹 Spine measuring instrument
CN111123653A (en) * 2019-12-06 2020-05-08 武汉新芯集成电路制造有限公司 Measuring disc and eccentricity value measuring method
CN111315157A (en) * 2020-02-28 2020-06-19 江门崇达电路技术有限公司 Method for quantifying slice hole offset

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW423713U (en) * 1999-01-26 2001-02-21 Taiwan Semiconductor Mfg Position calibration of the wafer edge width
CN105072830A (en) * 2015-09-10 2015-11-18 江门崇达电路技术有限公司 Layer deviation detection method
CN208847140U (en) * 2018-10-29 2019-05-10 贵州开磷机电装备工程有限责任公司 A kind of junction box levelling device
CN210019372U (en) * 2019-01-09 2020-02-07 荆莹 Spine measuring instrument
CN109862690A (en) * 2019-03-30 2019-06-07 奥士康科技股份有限公司 A kind of pcb board in integrated multiple types of tools hole
CN111123653A (en) * 2019-12-06 2020-05-08 武汉新芯集成电路制造有限公司 Measuring disc and eccentricity value measuring method
CN111315157A (en) * 2020-02-28 2020-06-19 江门崇达电路技术有限公司 Method for quantifying slice hole offset

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Application publication date: 20210326

RJ01 Rejection of invention patent application after publication