CN112525818A - Clamping assembly and microscope - Google Patents

Clamping assembly and microscope Download PDF

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Publication number
CN112525818A
CN112525818A CN201910880278.5A CN201910880278A CN112525818A CN 112525818 A CN112525818 A CN 112525818A CN 201910880278 A CN201910880278 A CN 201910880278A CN 112525818 A CN112525818 A CN 112525818A
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CN
China
Prior art keywords
probe
mounting surface
clamping assembly
pin
pressing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201910880278.5A
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Chinese (zh)
Inventor
许宝芝
李勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Delutong Shijiazhuang Biotechnology Co ltd
Original Assignee
Delutong Shijiazhuang Biotechnology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
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Application filed by Delutong Shijiazhuang Biotechnology Co ltd filed Critical Delutong Shijiazhuang Biotechnology Co ltd
Priority to CN201910880278.5A priority Critical patent/CN112525818A/en
Publication of CN112525818A publication Critical patent/CN112525818A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • G01N2021/0106General arrangement of respective parts
    • G01N2021/0112Apparatus in one mechanical, optical or electronic block

Abstract

The invention provides a clamping assembly and a microscope, wherein the clamping assembly is used for clamping a probe and comprises a clamping base body, and a first bearing structure and a second bearing structure are respectively arranged at two ends of the clamping base body along the length direction and are respectively used for supporting two ends of the probe; the first fixing structure is arranged on the first bearing structure and used for fixing one end of the probe; and the second fixing structure is arranged on the second bearing structure and used for fixing the other end of the probe. The clamping assembly can clamp the probe and prevent the probe from bending and deforming, so that the detection precision is improved.

Description

Clamping assembly and microscope
Technical Field
The invention relates to the technical field of detection equipment, in particular to a clamping assembly. Meanwhile, the invention also relates to a microscope with the clamping assembly.
Background
In the process of disease diagnosis, whether living cells are diseased or not is judged, the conventional means is to adopt a filamentous or needle-shaped probe to carry out living body puncture to obtain cell tissues to be detected, the probe is fixed on an objective table of a microscope through a clamping device, and the cell characteristics are observed through the microscope, so that the conclusion whether the cells are diseased or not is obtained.
The probe is in a structure with a large length-to-fineness ratio, the length of the probe is more than three times of the diameter of the probe, the probe is easy to generate bending deformation in a free state, and particularly, the probe is more difficult to maintain a straight state under the condition that cell tissues to be detected are attached to the probe. The traditional clamping device applies tension to two ends of the probe, provides certain clamping rigidity for the probe and enables the probe to keep straight. In the practical application process, the tension force is difficult to control, and if the tension force is too small, the probe is easy to loosen; if the tension force is too large, the probe is easy to generate torsional deformation due to uneven stress, and the detection precision of the cell tissue to be detected is further reduced.
Disclosure of Invention
In view of the above, the present invention is directed to a clamping assembly for balancing a probe placed thereon, and preventing torsional deformation due to uneven stress, thereby improving detection accuracy.
In order to achieve the purpose, the technical scheme of the invention is realized as follows:
a clamping assembly for clamping a probe; it is characterized by comprising: the clamping assembly includes:
clamping the substrate; a first bearing structure and a second bearing structure are respectively arranged at two ends of the clamping base body along the length direction and are respectively used for supporting two ends of the probe;
the first fixing structure is arranged on the first bearing structure and used for fixing one end of the probe;
and the second fixing structure is arranged on the second bearing structure and used for fixing the other end of the probe.
Further, the first bearing structure comprises:
the vertical plate is fixedly arranged at one end of the clamping base body and is vertical to the length direction of the probe;
the adapter is arranged on one side, facing the second bearing structure, of the vertical plate and is in rotary connection with the vertical plate; the adaptor is used for supporting the probe and arranging the first fixing structure.
Further, the adaptor is provided with a first mounting surface for arranging a first fixing structure, and the first mounting surface is provided with a first positioning groove for accommodating a probe; the first fixing structure is used for pressing the probe in the first positioning groove for fixing.
Further, the first fixing structure includes:
the first pin is fixedly inserted on the adapter piece along the direction vertical to the first mounting surface;
one end of the pressing piece is rotationally connected with the first pin; the pressing piece can rotate to a first position or a second position relative to the first pin; when in the first position, the pressing piece is in contact with the first mounting surface and presses the probe; in the second position, the hold-down member is disengaged from the first mounting surface to remove hold-down force from the probe.
Furthermore, the bottom surface of the pressing piece is an inclined surface, so that the bottom surface of the end part of the pressing piece close to the first pin is tightly attached to the first mounting surface.
Furthermore, a hook is arranged at one end, far away from the first pin, of the pressing piece;
the first fixing structure further includes:
the second pin is fixedly inserted on the adapter piece along the direction vertical to the first mounting surface; a gap capable of accommodating a hook is reserved between the head of the second pin and the first mounting surface; when the pressing piece is at the first position, the hook is accommodated in the gap and is hooked on the second pin.
Furthermore, a second mounting surface is arranged on the second bearing structure, and a second positioning groove for accommodating the probe is arranged on the second mounting surface; and a limiting pin vertical to the second mounting surface is inserted into the tail end of the second positioning groove.
Furthermore, the second bearing structure is provided with an observation hole of which the center line is vertical to the second mounting surface, and the observation hole cuts the second positioning groove into a front part and a rear part; the probe is arranged above the observation hole in a spanning mode, and the parts, located on two sides of the observation hole respectively, are all accommodated in the second positioning groove.
Further, the second fixing structure includes:
the pressing cover is rotationally connected with the second bearing structure; the hold-down cover is rotatable to a closed position or an open position relative to the second load-bearing structure; when in the closed position, the pressing cover is in contact with the second mounting surface and presses the probe; the hold down cover is separated from the second mounting surface when in the open position; the pressing cover is provided with an observation window corresponding to the observation hole in position;
a locking member provided on the second load bearing structure for locking the hold-down cover when the hold-down cover is in the closed position.
Furthermore, a magnetic adsorption piece is arranged in the locking piece;
the pressing cover is provided with a protruding part extending towards the locking piece, and a magnetic force adsorbed piece is arranged in the protruding part.
The pressing cover is in a square frame shape, and the observation window is formed in the area with the hollow middle part;
when the pressing cover is in the closed position, the two short frames of the pressing cover are both in contact with the second mounting surface and exert pressing force on the second mounting surface.
Further, the method also comprises the following steps:
and the connecting shaft is connected with the adapter from one side of the vertical plate departing from the second bearing structure.
Compared with the prior art, the invention has the following advantages:
according to the clamping assembly, the first bearing structure and the second bearing structure are respectively arranged at two ends of the clamping base body and used for supporting two ends of the probe, the first fixing structure is arranged on the first bearing structure to fix one end of the probe, the second fixing structure is arranged on the second bearing structure to fix the other end of the probe, and due to the fact that the force applied to the probe by the first bearing structure and the first fixing structure is perpendicular to the axial direction of the probe, and the force applied to the probe by the second bearing structure and the second fixing structure is perpendicular to the axial direction of the probe, torsional force or axial tensile force cannot be applied to the probe, the problem that the probe is prone to torsional deformation due to the fact that torsional force and axial tensile force are applied to the probe in a two-end clamping mode in the traditional scheme is solved, and the purpose of improving the detection effect is achieved.
Another objective of the present invention is to provide a microscope including the above clamping assembly.
The microscope provided by the invention can be used for conveniently observing the cell tissue to be detected on the probe by adopting the clamping assembly.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate an embodiment of the invention and, together with the description, serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 is a schematic structural diagram of a clamping assembly according to an embodiment of the present invention;
FIG. 2 is a schematic view of a first fixing structure of the clamping assembly according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a clamp assembly according to an embodiment of the present invention with the clamping member in a second position;
FIG. 4 is a schematic illustration of a clamp assembly according to an embodiment of the present invention with the clamping member in a first position
Fig. 5 is a schematic structural view of a clamping assembly according to an embodiment of the present invention, wherein a pressing cover is in an open position.
Reference numerals
1-clamping the substrate;
2-a first bearing structure, 21-a vertical plate, 22-an adapter and 221-a first positioning groove;
3-a second bearing structure, 31-a second positioning groove, 32-a limiting pin and 33-an observation hole;
4-a first fixing structure, 41-a first pin, 42-a pressing piece, 421-a hook, 43-a second pin and 44-a rotating sliding block;
5-second fixing structure, 51-hold-down cover, 511-projection, 512-viewing window, 52-locking element,
6-probe;
7-a connecting shaft; 71-locknut.
Detailed Description
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
In the description of the present invention, it should be noted that the terms "upper", "lower", "inner", "back", and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings, and are only for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
Example one
The embodiment relates to a clamping assembly for clamping a probe. The probe is in a structure with a large slenderness ratio, wherein the large slenderness ratio refers to the length being more than three times of the diameter. When the diameter of the probe is thicker, the probe can be called as a rod shape; when the diameter of the probe is slightly smaller, the probe can be called as a needle shape; when the diameter of the probe is very thin, it may be referred to as filamentous. Therefore, the clamping assembly provided by the present embodiment can clamp the probes, and the specific diameter of the probe is not limited.
As shown in fig. 1, the clamping assembly provided in this embodiment includes: the clamping device comprises a clamping base body 1, a first bearing structure 2, a second bearing structure 3, a first fixing structure 4 and a second fixing structure 5. The first carrier structure 2 and the second carrier structure 3 are respectively disposed at two ends of the clamping substrate 1 along a length direction, the length direction is the same as the length direction of the probe 6, and the length direction of the probe 6 can also be referred to as an axial direction. The first bearing structure 2 and the second bearing structure 3 are respectively positioned below two ends of the probe 6 and used for supporting two ends of the probe 6, and the supporting force is perpendicular to the axial direction of the probe.
A first fixing structure 4 is arranged on the first carrier structure 2 for fixing one end of the probe 6. A second fixing structure 5 is arranged on the second carrier structure 3 for fixing the other end of the probe 6. The first fixing structure 4 and the second fixing structure 5 apply pressing force to the probe 6 perpendicular to the axial direction of the probe, fix the probe 6, but do not apply torsion force or axial pulling force to the probe 6.
The technical scheme that this embodiment provided, adopt first bearing structure and second bearing structure to set up the both ends at the centre gripping base member respectively, a both ends for supporting the probe, still adopt first fixed knot structure to set up the one end to the probe on first bearing structure and fix, second fixed knot constructs the setting and fixes the other end to the probe on second bearing structure, because first bearing structure and first fixed knot construct the power of exerting force to the probe and be perpendicular to probe axial direction, second bearing structure and second fixed knot construct the power of exerting force also perpendicular to probe axial direction to the probe, consequently can not exert torsional force or axial tension to the probe, the mode of adopting the centre gripping of both ends can exert torsional force and axial tension to the probe in having solved traditional scheme makes the probe take place torsional deformation's problem easily, thereby can improve the detection precision.
On the basis of the above technical solution, the present embodiment further exemplifies implementation manners of each component in the above clamping assembly:
the first bearing structure 2 may specifically include: a vertical plate 21 fixed on one end of the clamping base body 1 and an adapter 22 arranged on the vertical plate 21. The vertical plate 21 is perpendicular to the longitudinal direction of the probe 6. The adapter 22 is arranged on the vertical plate 21 on the side facing the second supporting structure 3 and can rotate relative to the vertical plate 21. One end of the probe 6 may be secured to an adapter 22, the adapter 22 being located below the end of the probe 6 for supporting the probe 6. The first fixing structure 4 is arranged on the adapter piece 22 for cooperating with the adapter piece 22 for fixing the probe 6.
In addition, the adaptor 22 may be connected to an external rotation driving motor, and the rotation driving motor may drive the adaptor 22 to rotate, so as to drive the probe 6 to rotate. The probe 6 is a cylindrical structure with a large length-thin ratio, an observed object is attached to the peripheral surface of the probe, when the observed object is observed in a fixed position, the observed object attached to each position on the arc-shaped surface can be observed by rotating the probe 6, the comprehensiveness of detection of the observed object is improved, and the accuracy can be improved.
One specific implementation is as follows: the adaptor 22 is a semi-cylinder, and a plane parallel to the axial direction on the adaptor 22 is a first mounting surface. The first mounting surface is provided with a first positioning groove 221 extending along the axial direction, the end part of the probe 6 can be accommodated in the first positioning groove 221, and the first positioning groove 221 plays a role in limiting the probe 6 so that the probe 6 cannot move along the radial direction. The first fixing structure 4 may be disposed on the first mounting surface for pressing the probe 6 into the first positioning groove 221 so that the probe 6 cannot be removed from the first positioning groove 221.
For the first fixing structure 4, there are various implementations, for example, the following can be adopted:
as shown in fig. 2 to 4, the first fixing structure 4 includes: a first pin 41 and a pressing member 42. Wherein the first pin 41 is inserted on the adaptor 22 in a direction perpendicular to the first mounting surface. One end of the pressing member 42 is rotatably connected to the first pin 41, and the pressing member 42 can rotate about the first pin 41.
The pressing member 42 is rotated counterclockwise to a first position where the pressing member 42 contacts and applies a pressing force to the first mounting surface to press the probe 6, as shown in fig. 4; the hold down member 42 may also be rotated in a clockwise direction to a second position in which the hold down member 42 is disengaged from the first mounting surface to remove the hold down force on the probe 6, as shown in fig. 3. Specifically, the pressing member 42 is a flat structure, and the bottom surface thereof is an inclined surface and forms a certain included angle with the first mounting surface. Corresponding to the gradual change in thickness of the pressing member 42, the thicker end thereof is rotatably coupled to the first pin 41. When the pressing member 42 is in the second position, the contact area with the first mounting surface is small; when the pressing piece 42 rotates counterclockwise, the contact area between the pressing piece 42 and the first installation surface is larger and larger, and the thicker part of the pressing piece 42 is more closely attached to the first installation surface, so that pressing force is generated on the first installation surface.
In this embodiment, a second pin 43 may also be adopted, and is fixedly inserted on the adaptor 22 along a direction perpendicular to the first mounting surface, and the second pin 43 and the first pin 41 are respectively located at two sides of the first positioning groove 221. A gap is left between the head of the second pin 43 and the first mounting surface. One end of the pressing member 42, which is far away from the first pin 41, is provided with a hook 421, and when the pressing member 42 rotates counterclockwise to the first position, the hook 421 can be accommodated in the gap and hooked on the second pin 41, so that the fixing of the pressing member 42 is strengthened, and the pressing member is prevented from being loosened.
An alternative way is to: the pressing piece 42 is fixedly provided with a rotating slide block 44, and an operator can drive the pressing piece 42 to rotate relative to the first pin 41 by pulling the rotating slide block 44 with a hand, so that the operation is convenient.
Besides the above, the first fixing structure 4 can also be implemented in other ways, such as: the mode of adopting threaded connection: an external thread is arranged on the first pin 41, and the pressing piece 42 is fixedly connected with the first pin 41. The pressing piece 42 is rotated to drive the first pin 41 to rotate, the distance between the head of the first pin 41 and the first mounting surface is shortened, and then the pressing piece 42 applies pressing force to the first mounting surface.
As shown in fig. 5, the second support structure 3 is provided at the end of the clamp base 1 and is fixed by bolts. The second bearing structure 3 is provided with a second mounting surface on which a second positioning groove 31 is formed, and the other end of the probe 6 can be accommodated in the second positioning groove 31. The second carrier structure 3 is used to support the probe 6. A limit pin 32 is inserted at the end of the second positioning slot 31, and the limit pin 32 is used for axially limiting the probe 6.
One specific implementation is as follows: the second bearing structure 3 is provided with an observation hole 33, and the center line of the observation hole 33 is perpendicular to the second mounting surface. The observation hole 33 cuts off the second positioning groove 31 into a front part and a rear part, the probe 6 is arranged above the observation hole 33 in a crossing mode, and the parts of the front side and the rear side of the observation hole 33 are all accommodated in the second positioning groove 31, so that the front and the rear parts of the second positioning groove 31 can support and limit the probe 6.
For the second fixing structure 5, there are various implementations, for example, the following can be adopted: as shown in fig. 5, the second fixing structure 5 includes: a hold-down cover 51 and a locking piece 52. The hold-down cover 51 is connected to the second carrier structure 3 in a rotatable manner, so that the hold-down cover 51 can be rotated into a closed position or an open position relative to the second carrier structure 3. When the hold-down cover 51 is turned down to the closed position, it contacts the second mounting surface and holds down the probe 6; when the hold-down cover 51 is flipped up to the open position, it is separated from the second mounting surface and no hold-down force is applied to the probe 6. A lock 52 is provided on the second carrier structure 3 for locking the hold-down cover 51 when the hold-down cover 51 is in the closed position.
For the locking member 52, it can be realized in various ways, for example: the locking piece 52 may be connected to the hold-down cover 51 by means of a screw connection, a snap connection, or the following means may be used: the locking piece 52 and the pressing cover 51 are respectively provided with a magnetic attraction piece and an attracted piece, so that the locking piece 52 and the pressing cover 51 are fixed together in a magnetic attraction manner. For example: a permanent magnet is provided on the locking member 52, an iron block is provided on the holding cover 51, and the holding cover 51 is firmly fixed to the locking member 52 by the magnetic force of the permanent magnet on the iron block.
In this embodiment, the locking member 52 is provided on the side surface of the holding base 1, the pressing cover 51 is provided with a projection 511 extending toward the locking member 52, and the projection 511 is provided with a magnetically attracted member. When the hold-down cover 51 is in the closed state, the projection 511 is positioned above the lock member 52, and the projection 511 is attracted to be closely fitted to the lock member 52 by a magnetic force.
In the present embodiment, the hold-down cover 51 is provided with an observation window 512, and the observation window 512 corresponds to the observation hole 33. Specifically, the pressing cover 51 is in a square frame shape, the observation window 512 is formed in the hollow area in the middle, and when the pressing cover 51 is in the closed position, both short frames of the pressing cover 51 are in contact with the second mounting surface and apply pressing force to the second mounting surface so as to limit the probe 6 from moving in the radial direction.
In addition, the connecting shaft 7 is adopted, one side, which is away from the adapter 22, of the vertical plate 21 is connected with the adapter 22, and the other end of the connecting shaft 7 is connected with the rotating motor, so that the adapter 22 is driven to rotate through the rotating motor, and the probe 6 is driven to rotate.
The connection of the connection shaft 7 to the rotating electrical machine can be made by conventional means, such as: the connection is carried out by a coupler, in particular, a locknut 71 can be used for connection, so that the connecting shaft 7 is prevented from being separated.
Example two
The embodiment relates to a clamping microscope, which comprises the clamping assembly in the first embodiment. The probe is fixed on an objective table of a microscope through the clamping assembly, and cell characteristics are observed through the microscope, so that the conclusion whether the cells are diseased or not is obtained. The microscope in this embodiment is a prior art microscope. It can be convenient for examine the cell tissue observation to getting on the probe through adopting the centre gripping subassembly in the embodiment one.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims (13)

1. A clamping assembly for clamping a probe (6); it is characterized by comprising: the clamping assembly includes:
a clamping base (1); a first bearing structure (2) and a second bearing structure (3) are respectively arranged at two ends of the clamping base body (1) along the length direction and are respectively used for supporting two ends of the probe (6);
a first fixing structure (4) arranged on the first bearing structure (2) and used for fixing one end of the probe (6);
and the second fixing structure (5) is arranged on the second bearing structure (3) and is used for fixing the other end of the probe (6).
2. The clamping assembly of claim 1, wherein: the first load bearing structure (2) comprises:
a vertical plate (21) fixedly arranged at one end of the clamping base body (1), wherein the vertical plate (21) is vertical to the length direction of the probe (6);
the adapter (22) is arranged on one side, facing the second bearing structure (3), of the vertical plate (21) and is in rotating connection with the vertical plate (21); the adaptor (22) is used for supporting the probe (6) and arranging the first fixing structure (4).
3. The clamping assembly of claim 2, wherein: the adaptor (22) is provided with a first mounting surface for arranging the first fixing structure (4), and the first mounting surface is provided with a first positioning groove (221) for accommodating the probe (6); the first fixing structure (4) is used for pressing the probe (6) in the first positioning groove (221) for fixing.
4. The clamping assembly of claim 3, wherein: the first fixing structure (4) comprises:
the first pin (41) is fixedly inserted on the adapter (22) along the direction vertical to the first mounting surface;
a pressing piece (42), one end of which is rotationally connected with the first pin (41); the pressing piece (42) can rotate to a first position or a second position relative to the first pin (41); in the first position, the pressing piece (42) is in contact with the first mounting surface and presses the probe (6); in the second position, the hold down (42) is disengaged from the first mounting surface to remove hold down of the probe (6).
5. The clamping assembly of claim 4, wherein: the bottom surface of the pressing piece (42) is an inclined surface, so that the bottom surface of the end part of the pressing piece (42) close to the first pin (41) is tightly attached to the first mounting surface.
6. Clamping assembly according to claim 4 or 5, wherein: a hook (421) is arranged at one end of the pressing piece (42) far away from the first pin (41);
the first fixing structure (4) further comprises:
the second pin (43) is fixedly inserted on the adapter (22) along the direction vertical to the first mounting surface; a gap for accommodating the hook (421) is reserved between the head of the second pin (43) and the first mounting surface; when the pressing piece (42) is at the first position, the hook (421) is accommodated in the gap and is hooked on the second pin (43).
The second pin (43) is fixedly inserted on the adapter (22) along the direction vertical to the first mounting surface; a gap for accommodating the hook (421) is reserved between the head of the second pin (43) and the first mounting surface; when the pressing piece (42) is at the first position, the hook (421) is accommodated in the gap and is hooked on the second pin (43).
7. The clamping assembly of claim 1, wherein: a second mounting surface is arranged on the second bearing structure (3), and a second positioning groove (32) for accommodating the probe (6) is arranged on the second mounting surface; and a limiting pin (32) vertical to the second mounting surface is inserted into the tail end of the second positioning groove (32).
8. The clamping assembly of claim 7, wherein: the second bearing structure (3) is provided with an observation hole (33) with the central line perpendicular to the second mounting surface, and the second positioning groove (31) is cut into a front part and a rear part by the observation hole (33); the probes (6) are arranged above the observation holes (33) in a spanning mode, and the parts, located on two sides of the observation holes (33), of the probes are contained in the second positioning grooves (31).
9. The clamping assembly of claim 8, wherein: the second fixing structure (5) comprises:
a pressing cover (51) which is rotatably connected with the second bearing structure (3); the hold-down cover (51) can be rotated to a closed position or an open position relative to the second carrying structure (3); in the closed position, the hold-down cover (51) contacts the second mounting surface and holds down the hold-down probe (6); the hold-down cover (51) is separated from the second mounting surface in the open position; an observation window (512) corresponding to the observation hole (33) in position is arranged on the pressing cover (51);
a locking member (52) provided on the second carrying structure (3) for locking the hold-down cover (51) when the hold-down cover (51) is in the closed position.
10. The clamping assembly of claim 8, wherein: a magnetic adsorption piece is arranged in the locking piece (52);
the pressing cover (51) is provided with a protruding part (511) extending towards the locking piece (52), and a magnetic force attracted piece is arranged in the protruding part (511).
11. The clamping assembly of claim 9, wherein: the pressing cover (51) is in a square frame shape, and the observation window (512) is formed in the area with the hollow middle part;
when the pressing cover (51) is in the closed position, two short frames of the pressing cover (51) are in contact with the second mounting surface and exert pressing force on the second mounting surface.
12. The clamping assembly of claim 2, wherein: further comprising:
the connecting shaft (7) is connected with the adapter (22) from one side of the vertical plate (21) departing from the second bearing structure (3).
13. A microscope, comprising: the clamping assembly of any one of claims 1-12.
CN201910880278.5A 2019-09-18 2019-09-18 Clamping assembly and microscope Pending CN112525818A (en)

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Application Number Priority Date Filing Date Title
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Application Number Priority Date Filing Date Title
CN201910880278.5A CN112525818A (en) 2019-09-18 2019-09-18 Clamping assembly and microscope

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110568605A (en) * 2019-08-30 2019-12-13 北京临近空间飞行器系统工程研究所 Positioning assembly and microscope

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Publication number Priority date Publication date Assignee Title
CN109932530A (en) * 2019-02-25 2019-06-25 天津大学 A kind of afm scan probe clamper
CN110568605A (en) * 2019-08-30 2019-12-13 北京临近空间飞行器系统工程研究所 Positioning assembly and microscope
CN210605179U (en) * 2019-08-30 2020-05-22 北京临近空间飞行器系统工程研究所 Positioning assembly and microscope

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109932530A (en) * 2019-02-25 2019-06-25 天津大学 A kind of afm scan probe clamper
CN110568605A (en) * 2019-08-30 2019-12-13 北京临近空间飞行器系统工程研究所 Positioning assembly and microscope
CN210605179U (en) * 2019-08-30 2020-05-22 北京临近空间飞行器系统工程研究所 Positioning assembly and microscope

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110568605A (en) * 2019-08-30 2019-12-13 北京临近空间飞行器系统工程研究所 Positioning assembly and microscope

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