CN112505560B - Battery screening method, device, equipment and storage medium - Google Patents
Battery screening method, device, equipment and storage medium Download PDFInfo
- Publication number
- CN112505560B CN112505560B CN202011454583.7A CN202011454583A CN112505560B CN 112505560 B CN112505560 B CN 112505560B CN 202011454583 A CN202011454583 A CN 202011454583A CN 112505560 B CN112505560 B CN 112505560B
- Authority
- CN
- China
- Prior art keywords
- standard test
- standard
- resistance
- point
- determining
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012216 screening Methods 0.000 title claims abstract description 80
- 238000000034 method Methods 0.000 title claims abstract description 58
- 238000012360 testing method Methods 0.000 claims abstract description 430
- 239000002923 metal particle Substances 0.000 claims abstract description 42
- 230000015556 catabolic process Effects 0.000 claims description 41
- 239000002245 particle Substances 0.000 claims description 29
- 238000004590 computer program Methods 0.000 claims description 4
- 206010011906 Death Diseases 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 21
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 12
- 239000000243 solution Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 6
- 229910052802 copper Inorganic materials 0.000 description 6
- 239000010949 copper Substances 0.000 description 6
- 229910052742 iron Inorganic materials 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 6
- 238000012545 processing Methods 0.000 description 5
- 238000000926 separation method Methods 0.000 description 3
- 238000010998 test method Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000006870 function Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000000644 propagated effect Effects 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 239000013618 particulate matter Substances 0.000 description 1
- 230000008707 rearrangement Effects 0.000 description 1
- 238000010187 selection method Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
- G01R31/385—Arrangements for measuring battery or accumulator variables
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Abstract
The embodiment of the invention discloses a battery screening method, a device, equipment and a storage medium. The battery screening method comprises the following steps: determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell; determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture; determining a standard sorting resistance value based on the Hi-point resistance value of the third sample cell at the standard test pressure and the standard test voltage and the Hi-point resistance value of the first sample cell at the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type; and screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
Description
Technical Field
The embodiment of the invention relates to a lithium battery detection technology, in particular to a battery screening method, a device, equipment and a storage medium.
Background
Hi-pot test is used as a detection technology in the early stage of the battery cell, if the bad battery cells are all detected before the liquid injection process, the cost is saved for the company, and the battery meeting the requirements of customers is produced.
Currently, the test voltages of the modules of each company are 300V, 250V, 200V and the like, the test time is 1s, 2s, 4s and the like, and the judgment standards are 5MΩ, 10MΩ and 100MΩ. Under the test method, the problems of unstable Hi-point resistance of the battery core, difficult detection of mixed metal particles into the battery core and low detected rate of the battery core with smaller diaphragm pinholes exist. Therefore, it is necessary to develop a standard set of effective detection methods for Hi-spot testing.
Disclosure of Invention
The embodiment of the invention provides a battery screening method, a device, equipment and a storage medium, which are used for providing a standard Hi-port test method, improving the reliability of the Hi-port test and improving the screening success rate of bad battery cells.
In a first aspect, an embodiment of the present invention provides a battery screening method, including:
determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell;
Determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture;
determining a standard sorting resistance value based on a Hi-pot resistance value of a third sample cell at the standard test pressure and the standard test voltage and a Hi-pot resistance value of the first sample cell at the standard test pressure and the standard test voltage, wherein the third sample cell is doped with a preset type of metal particles;
and screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
In a second aspect, an embodiment of the present invention further provides a battery screening apparatus, including:
the standard test pressure determining module is used for determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell;
the standard test voltage determining module is used for determining standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture;
The standard sorting resistance determining module is used for determining a standard sorting resistance based on the Hi-point resistance of a third sample cell at the standard test pressure and the standard test voltage and the Hi-point resistance of the first sample cell at the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type;
and the screening module is used for screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
In a third aspect, an embodiment of the present invention further provides a battery screening apparatus, including:
one or more processors;
a storage means for storing one or more programs;
the one or more programs, when executed by the one or more processors, cause the one or more processors to implement the battery screening method of any embodiment of the present invention.
In a fourth aspect, an embodiment of the present invention further provides a computer readable storage medium, where a computer program is stored, where the program when executed by a processor implements the battery screening method according to any embodiment of the present invention.
According to the battery screening method provided by the embodiment of the invention, hi-port tests are carried out on the first sample battery core in a preselected good state by using different test pressures and different test voltages so as to detect the influence of the different test pressures on the Hi-port resistance value of the battery core, and the test pressures when the Hi-port resistance value is stable are obtained by verifying the detection results by the different test voltages, namely the standard test pressures; the voltage of the inflection point when the battery cell is completely broken down is detected by performing Hi-point test on the battery cell with the preset pinhole, so that the standard test voltage of the Hi-point test is obtained. On the basis, the Hi-point test is carried out on the battery cell doped with the metal particles with the preset size by using the standard test pressure and the standard test voltage so as to eliminate the influence of the unstable Hi-point resistance and the small pinhole diaphragm on the Hi-point resistance, the Hi-point resistance of the battery cell doped with the particles and the Hi-point resistance of the battery cell doped with the particles are obtained by respectively carrying out the Hi-point test on the battery cell doped with the particles and the sound battery cell, and therefore the standard sorting resistance can be determined, and the battery cell containing the metal particles can be detected by using the standard sorting resistance. According to the battery screening method provided by the embodiment, the problems that the Hi-pot resistance value of the battery cell is unstable, the battery cell with smaller diaphragm pinholes is difficult to detect and the battery cell mixed with metal particles is low in detected rate in the prior art can be solved by determining the standard test pressure, the standard test voltage and the standard sorting resistance value of the Hi-pot test, and the screening rate of the bad battery cell can be improved.
Drawings
Fig. 1 is a flowchart of a battery screening method according to an embodiment of the present invention;
FIG. 2 is a flowchart of another battery screening method according to an embodiment of the present invention;
FIG. 3 is a graph showing the relationship between Hi-point resistance and test pressure and test voltage according to the embodiment of the present invention;
FIG. 4 is a flowchart of another battery screening method according to an embodiment of the present invention;
FIG. 5 is a schematic diagram of a placement position of a diaphragm pinhole according to an embodiment of the present invention;
FIG. 6 is a flowchart of another battery screening method according to an embodiment of the present invention;
fig. 7 is a block diagram of a battery screening apparatus according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of a battery screening apparatus according to an embodiment of the present invention.
Detailed Description
The invention is described in further detail below with reference to the drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting thereof. It should be further noted that, for convenience of description, only some, but not all of the structures related to the present invention are shown in the drawings.
The embodiment provides a battery screening method, which is used for detecting bad battery cells mixed with metal particles and containing diaphragm pinholes in a Hi-port test procedure before battery cell liquid injection, and improving the stability of the Hi-port test. Fig. 1 is a flowchart of a battery screening method according to an embodiment of the present invention, and referring to fig. 1, the battery screening method includes the following steps:
S110, determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell.
The first sample cell is a qualified cell passing detection. The method aims at finding out critical pressure affecting the Hi-point resistance stability of the battery cell by carrying out Hi-point test on the selected qualified battery cell.
When the test voltage and the test pressure change, the Hi-point resistance of the battery cell also changes. In order to detect the variation relation between the Hi-point resistance value and the test pressure and the test voltage, the embodiment can specifically fix the test voltage at first, and detect the influence of the test pressure on the Hi-point resistance value under the current test voltage by changing the test pressure under the test voltage; and then, by changing the test voltage and using the same method, detecting the influence of the test pressure on the Hi-point resistance value under the new test voltage, thereby obtaining the change relation between the Hi-point resistance value of the battery cell under different test voltages and the test pressure.
The standard test pressure refers to the pressure that can stabilize the Hi-point resistance of the cell. When the standard test pressure is used, the diaphragm of the battery cell to be tested can be fully contacted with the positive and negative plates, so that the battery cell to be tested cannot have unstable Hi-point resistance of the battery cell.
It should be noted that, in this implementation, after the standard test pressure is obtained, the standard test pressure needs to be converted into the standard pressure according to the surface area of the selected first sample cell, and when different cells are detected, the standard test pressure corresponding to the cell to be detected is calculated based on the surface area of the cell to be detected by using the standard pressure.
S120, determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture.
The second sample cell has a pinhole with a preset aperture, and the working condition of the small pinhole diaphragm cell is simulated by using the second sample cell, so that the critical test voltage of the cell with the diaphragm pinhole in complete breakdown is obtained by detecting the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage.
It can be known that when the test voltage increases, the capability of electrons passing through the pinhole of the diaphragm is enhanced, so that the Hi-spot resistance of the battery cell is reduced, and when the test voltage increases to a certain value, the positive and negative electrodes of the battery cell are in a short circuit state, based on the principle, the inflection point resistance of the battery cell, in which the Hi-spot resistance of the battery cell is changed, can be found by increasing the test voltage, and the test voltage corresponding to the inflection point resistance is the standard test voltage required by the embodiment.
S130, determining a standard sorting resistance value based on the Hi-point resistance value of the third sample cell under the standard test pressure and the standard test voltage and the Hi-point resistance value of the first sample cell under the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type.
Wherein, the third sample cell uses a cell doped with a predetermined type of metal particulate matter. The predetermined type of metal particles may be, for example, copper particles, iron particles, etc., and the predetermined type of metal particles have different sizes. According to the embodiment, the working condition that the battery cell is mixed into the metal particle area is simulated by using the third sample battery cell, so that the critical resistance of the battery cell under the working condition of mixing the metal particles is determined by detecting the Hi-point resistance of the third sample battery cell, and the Hi-point resistance of the intact battery cell under the same test condition is combined to obtain the standard sorting resistance. It is known that the standard sorting resistance should lie between the Hi-pot resistance of the intact cell and the Hi-pot resistance of the cell doped with metal particles. Therefore, when the Hi-point test of the battery core is carried out, the battery core mixed with the metal particles can be screened out based on the comparison result of the Hi-point resistance value of the battery core to be tested and the standard sorting resistance value, and the problem that the metal particles are difficult to be detected when the Hi-point is carried out currently is solved.
And S140, screening the battery cells to be detected by using standard test pressure, standard test voltage and standard sorting resistance.
After standard pressure is used, the Hi-point resistance of the battery cell to be tested can be ensured to be stable; after standard test voltage is used, the battery cell with the diaphragm pinholes can be detected; and then according to the standard sorting resistance, whether metal particles are mixed in the battery core can be detected according to the comparison result of the Hi-point resistance of the battery core to be detected and the standard sorting resistance. Therefore, the Hi-point detection standard provided by the embodiment is used for detecting the battery cell to be detected, so that the problems that the Hi-point resistance of the battery cell is unstable, the battery cell of the diaphragm with the smaller pinhole is difficult to detect, and the detection rate of the battery cell mixed with metal particles in the battery cell is low can be solved.
According to the battery screening method provided by the embodiment of the invention, hi-port tests are carried out on the first sample battery core in a preselected good state by using different test pressures and different test voltages so as to detect the influence of the different test pressures on the Hi-port resistance value of the battery core, and the test pressures when the Hi-port resistance value is stable are obtained by verifying the detection results by the different test voltages, namely the standard test pressures; the voltage of the inflection point when the battery cell is completely broken down is detected by performing Hi-point test on the battery cell with the preset pinhole, so that the standard test voltage of the Hi-point test is obtained. On the basis, the Hi-point test is carried out on the battery cell doped with the metal particles with the preset size by using the standard test pressure and the standard test voltage so as to eliminate the influence of the unstable Hi-point resistance and the small pinhole diaphragm on the Hi-point resistance, the Hi-point resistance of the battery cell doped with the particles and the Hi-point resistance of the battery cell doped with the particles are obtained by respectively carrying out the Hi-point test on the battery cell doped with the particles and the sound battery cell, and therefore the standard sorting resistance can be determined, and the battery cell containing the metal particles can be detected by using the standard sorting resistance. According to the battery screening method provided by the embodiment, the problems that the Hi-pot resistance value of the battery cell is unstable, the battery cell with smaller diaphragm pinholes is difficult to detect and the battery cell mixed with metal particles is low in detected rate in the prior art can be solved by determining the standard test pressure, the standard test voltage and the standard sorting resistance value of the Hi-pot test, and the screening rate of the bad battery cell can be improved.
Optionally, on the basis of the above technical solution, before determining the standard test pressure based on the variation relationship between the Hi-spot resistance value of the first sample cell under different test voltages and the test pressure, the battery screening method further includes:
respectively detecting Hi-point resistance values of the first sample battery cell when the voltage is increased according to preset time length;
if the Hi-point resistance value becomes the breakdown resistance value, determining the corresponding voltage as the breakdown voltage, wherein the test voltage applied in the process of determining the standard test pressure and the standard test voltage should be smaller than the breakdown voltage.
The preset time period may be set to be slightly longer than that in the conventional Hi-spot test. For example, the test duration used in the conventional Hi-spot test is 4s, and the preset duration here may be set to 6s. The purpose of this arrangement is that the limit withstand voltage value of the cell can be detected by testing the first sample cell for a certain period of time.
The breakdown resistance, i.e., the resistance of the cell when broken down, is typically zero, or near zero. The test voltage when the Hi-point resistance of the battery core is the breakdown resistance is the breakdown voltage.
In this embodiment, by increasing the test voltage, the breakdown voltage, which is the ultimate withstand voltage of the first sample cell, is detected, so that when the standard test voltage and the standard test voltage are determined in the subsequent steps, the applied voltage value should not exceed the breakdown voltage, i.e., the test voltage should be applied within the range of the breakdown voltage, so as to ensure that the sample cell to be tested is not broken down.
Optionally, fig. 2 is a flowchart of another battery screening method according to an embodiment of the present invention, where the method is optimized based on the foregoing embodiment, and referring to fig. 2, the method includes the following steps:
s210, determining a preset number of test voltages.
When the test voltage is selected, it is required to consider that the selected test voltage cannot exceed the breakdown voltage of the first sample cell, so as to avoid breakdown damage to the first sample cell.
In one embodiment, the selected test voltage includes three steps of 150V,250V and 350V. Of course, the change steps of the test voltage and the number of the test voltages can be adjusted according to the actual needs and the output capability of the test equipment, and the selection number of the test voltages and the specific selection method are not limited in this embodiment.
S220, detecting Hi-point resistance values of the first sample cells by using the gradient increasing test pressure under each test voltage.
In this embodiment, the Hi-pot resistance of the first sample cell is detected by fixing the test voltages and then using the test pressure with a gradient increase at each test voltage.
The test pressure gradient increase means that the test pressure is increased step by step according to a certain increase. For example, the gradient is 300N, i.e. the test pressure is gradually increased from 0 according to 300N, and the Hi-point resistance of the first sample cell under different pressures is detected.
And (3) respectively carrying out a certain number of gradient pressure detection on each test voltage to obtain the change relation of the Hi-point resistance value of the battery cell at different test pressures and different test voltages.
S230, determining critical pressure when the Hi-point resistance value is stable under each test voltage.
When the Hi-point resistance of the battery cell starts to be stable, the positive electrode and the negative electrode of the battery cell are fully contacted. The critical pressure is the test pressure at which the Hi-point resistance of the cell is just stable. Thus, the Hi-pot resistance of the first sample cell tends to stabilize as the test pressure continues to increase after the critical pressure.
And S240, determining a standard test pressure based on the maximum critical pressure and the life end expansion force of the battery cell, wherein the standard test pressure is larger than the maximum critical pressure and smaller than the life end expansion force.
Wherein the critical pressure of the first sample cell may be different in consideration of different test voltages, the determined standard test pressure needs to be not less than the maximum critical pressure in order to ensure that the determined standard test pressure can be applied to all test voltages. Meanwhile, the standard test pressure cannot exceed the maximum bearing pressure of the battery cell, namely the standard test pressure also needs to be smaller than the service life end expansion force of the battery cell.
The method of the present embodiment will be further described with reference to the accompanying drawings. For example, fig. 3 is a graph showing a relation between a Hi-pot resistance value and a test pressure and a test voltage according to an embodiment of the present invention, it can be seen from fig. 3 that, at each test voltage, the Hi-pot resistance value of the first sample cell gradually decreases with an increase of the test pressure, and after a critical pressure of 1200N, the Hi-pot resistance value starts to stabilize. Therefore, when the test pressure is 1200N, the diaphragm of the battery cell is fully contacted with the positive and negative plates, so that the Hi-point resistance value of the battery cell can not be changed when the test pressure is increased. Thus, a test pressure greater than 1200N and less than the end-of-life expansion force of the cell can be taken as the standard test pressure.
S250, determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture.
S260, determining a standard sorting resistance value based on the Hi-point resistance value of the third sample cell under the standard test pressure and the standard test voltage and the Hi-point resistance value of the first sample cell under the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type.
And S270, screening the battery cells to be detected by using standard test pressure, standard test voltage and standard sorting resistance.
According to the battery screening method provided by the embodiment, the change relation between the Hi-point resistance value of the intact sample battery cell and the test pressure is detected by selecting the preset number of test voltages and using the test pressure with gradient increase under each test voltage, so that the change relation between the Hi-point resistance value of the battery cell and different test voltages and different test pressures is obtained. And obtaining the critical pressure by selecting the test pressure when the Hi-point resistance value of the battery cell starts to be stable, thereby determining the standard test pressure between the critical pressure and the life end expansion force of the battery cell. When the standard test pressure is used for Hi-point test, the diaphragm of the battery cell can be ensured to be fully contacted with the anode and the cathode, so that the stability of the Hi-point resistance of the battery cell is ensured.
Optionally, fig. 4 is a flowchart of another battery screening method according to an embodiment of the present invention, where the method is optimized based on the foregoing embodiment, and referring to fig. 4, the method includes the following steps:
s410, determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell.
S420, determining a preset number of test voltages.
The test voltage in this embodiment is similar to the method for selecting the test voltage when determining the standard test pressure in the above embodiment, and will not be described in detail in this embodiment.
S430, detecting Hi-point resistance values of a preset number of second sample cells by using standard test pressure under each test voltage.
And under each test voltage, standard test pressure is used, so that stable Hi-point resistance can be detected under each test voltage, and the influence of the instability of the Hi-point resistance on the determination of the standard test voltage is eliminated.
In the step, the number of the second sample cells is required to be certain, so that the influence of random factors on the detection result is eliminated by increasing the number of the samples, and the detection result is more reliable.
S440, determining the corresponding test voltage as the standard test voltage when the Hi-point resistance values of all the second sample cells are breakdown resistance values.
The Hi-point resistance of the second sample cell gradually decreases with increasing test voltage until electrons can completely pass through the pinhole in the diaphragm, and the second sample cell becomes a breakdown resistor.
It can be known that when the pin hole is located at a different position of the battery cell, the battery cell has different impedance states, and based on this, the step of detecting the Hi-pot resistance value of the preset number of second sample battery cells at each test voltage by using the standard test pressure respectively in this embodiment may be specifically optimized as follows:
and detecting the Hi-point resistance of the first number of second sample cells, the Hi-point resistance of the second number of second sample cells and the Hi-point resistance of the third number of second sample cells at each test voltage by using standard test pressure.
The pinholes of the first number of second sample cells are all located at a first preset position of the corresponding cells, the pinholes of the second number of second sample cells are all located at a second preset position of the corresponding cells, and the pinholes of the third number of second sample cells are all located at a third preset position of the corresponding cells.
Fig. 5 is a schematic diagram of a placement position of a diaphragm pinhole according to an embodiment of the present invention, and referring to fig. 5, in the figure, point a is located 1/2 of the distance from the top edge to the center, point B is located 1/2 of the distance from the bottom edge to the center, point a is a first preset position, point B is a second preset position, and point C is a third preset position. When pinholes are located at different positions, the obtained Hi-point resistance values are also different. Only when the pinhole is located at the three positions under a certain test voltage, the detected Hi-point resistance is the breakdown resistance, which indicates that the test voltage is a test voltage capable of shorting the cell of the diaphragm pinhole, and the voltage can be used as a standard test voltage.
Accordingly, determining the corresponding test voltage as the standard test voltage when the Hi-point resistance values of all the second sample cells are breakdown resistance values may be specifically optimized as follows:
and determining the corresponding test voltage as the standard test voltage when the Hi-point resistance values of all the first number of second sample cells are breakdown resistance values, the Hi-point resistance values of all the second number of second sample cells are breakdown resistance values and the Hi-point resistance values of all the third number of second sample cells are breakdown resistance values.
For example, in one specific embodiment, the aperture of the diaphragm pinhole is 80-100 μm, and the diaphragm pinhole with the aperture is detected at three positions A, B, C respectively, so as to obtain the following detection results: the breakdown rate of the battery core containing the diaphragm pinholes with the aperture of 80-100 mu m at the A, B, C position is 0 under the test conditions of 150V and 4 s; under the test conditions of 250V and 4s, the breakdown rates at the A, B, C position are 80%, 40% and 30% respectively; under the test conditions of 350V and 4s, the breakdown rate at the A, B, C position is 100 percent; therefore, it can be determined that 350V is the voltage of the breakdown resistance of the Hi-point resistor of the battery cell, namely the standard test voltage.
It should be noted that, in this embodiment, in order to eliminate the influence of the test duration on the determination of the standard test voltage, under the standard test pressure, the same test duration is applied to each test voltage, so that the influence of the test duration on the detected Hi-pot resistance value is the same, and thus the influence of the test duration on the Hi-pot resistance value of the battery cell under different test voltages can be eliminated.
S450, determining a standard sorting resistance value based on the Hi-point resistance value of the third sample cell under the standard test pressure and the standard test voltage and the Hi-point resistance value of the first sample cell under the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type.
And S460, screening the battery cells to be detected by using standard test pressure, standard test voltage and standard sorting resistance.
According to the embodiment, different test voltages are applied to the second sample cell with the pinhole under the standard test pressure, so that the change relation between the Hi-point resistance value of the second sample cell and the test voltage is detected, and the test voltage when the second sample cell is completely broken down is found to be the standard test voltage. And specifically, by adjusting the positions of pinholes on the diaphragms, whether the Hi-point resistance of the battery core is a breakdown resistance or not is detected respectively, and only when the Hi-point resistance of the battery core is the breakdown resistance under the pinhole working conditions of different positions, the obtained test voltage is used as a standard test voltage, so that when the battery core is screened by using the test voltage, the bad battery core with a small diaphragm pinhole can be completely screened, and the screening rate of the battery core is improved.
Optionally, fig. 6 is a flowchart of another battery screening method according to an embodiment of the present invention, where the method is optimized based on the foregoing embodiment, and referring to fig. 6, the method specifically includes the following steps:
s610, determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell.
S620, determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture.
And S630, respectively applying standard test pressure and standard test voltage to a preset number of first sample cells to obtain a first Hi-point resistor set.
As can be seen from the above embodiments, in this step, the Hi-spot test under the standard test pressure and the standard test voltage is performed on the first sample cell to obtain the Hi-spot resistance value of the good cell under the standard test condition, which is used to define the standard sorting resistance value.
Meanwhile, the Hi-point test under the standard test voltage and the standard test pressure is carried out by selecting a certain number of first sample cells in the step, so that the interference of random factors is eliminated through a certain number of test results, and the standard sorting resistance value is defined more accurately.
And S640, respectively applying standard test pressure and standard test voltage to a preset number of third sample cells to obtain a second Hi-point resistor set.
The resistance value in the second Hi-port resistance set characterizes the Hi-port resistance state when the metal particles exist in the battery cell, that is, the possible variation range of the Hi-port resistance value when the metal particles are mixed in the battery cell.
Obviously, by increasing the sample number of the third sample cell, the resistance value in the second Hi-point resistor set can have a wider boundary value, and the Hi-point resistance state of the cell containing metal particles can be truly reflected.
S650, determining a standard sorting resistance interval by taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance and the maximum value in the second Hi-point resistor set as the lower limit of the sorting resistance.
The third sample cell is a cell doped with a metal particle of a preset type, and the first sample cell is a perfect cell, and obviously, under the same test condition, the Hi-point resistance of the cell doped with the particle and the Hi-point resistance of the perfect cell should belong to different resistance sections, and the embodiment determines a standard sorting resistance section based on the two resistance sections, wherein the standard sorting resistance section is used as a basis for screening the cell mixed with the metal particle.
Specifically, when standard test voltage and standard test pressure are applied to a preset number of first sample cells, a preset number of first Hi-point resistance values are obtained, namely a first Hi-point resistance set. When standard test voltage and standard test pressure are applied to a preset number of third sample cells, a preset number of second Hi-point resistance values are obtained, namely a second Hi-point resistance set. And selecting the minimum value from the first Hi-point resistor set as the upper limit of the sorting resistance value, and selecting the maximum value from the second Hi-point resistor set as the lower limit of the sorting resistance value to obtain a resistance value range, wherein the resistance value range is the standard sorting resistance value interval. That is, any resistance value located in the standard sorting resistance value interval can be used as the standard sorting resistance value for judging whether metal particles are mixed in the battery cell.
In some embodiments, the middle value of the standard sorting resistance interval is selected as the standard sorting resistance in consideration of practical convenience.
Considering that the battery cell presents different impedance when the metal particles are positioned at different positions of the battery cell, based on the above technical scheme, the step can be further optimized as follows:
respectively applying standard test pressure and standard test voltage to a third number of third sample cells and a fourth number of third sample cells to obtain a third Hi-point resistor set and a fourth Hi-point resistor set, wherein the third number of third sample cells doped with particles are positioned at a first preset position of the corresponding cells, and the fourth number of third sample cells doped with particles are positioned at a second preset position of the corresponding cells;
Correspondingly, taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance value, taking the maximum value in the second Hi-point resistor set as the lower limit of the sorting resistance value, and determining the standard sorting resistance value interval can be optimized as follows:
taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance value, taking the maximum value in the third Hi-point resistor set as the lower limit of the first sorting resistance value, and determining a first standard sorting resistance value interval, wherein the first standard sorting resistance value interval is used for detecting whether the first position of the battery cell has particles or not; the method comprises the steps of,
and taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance value, taking the maximum value in the fourth Hi-point resistor set as the lower limit of the second sorting resistance value, and determining a second standard sorting resistance value interval, wherein the second standard sorting resistance value interval is used for detecting whether the second position of the battery cell has particles or not.
The separation resistance interval under the condition of doping the particulate matters at different positions can be determined by respectively carrying out Hi-point resistance detection on the particulate matters at different positions.
Considering that metal particles are easy to be doped in a first preset position and a second preset position in an actual detection process, and metal particles are not easy to be doped in a third preset position, in this embodiment, only the Hi-point test of the working condition of doping the metal particles is performed on the first preset position and the second preset position, and a first standard sorting resistance interval and a second standard sorting resistance interval are obtained by combining Hi-point test results of the first sample cell, whether the metal particles are mixed in the first preset position of the cell is detected by using the first standard sorting resistance interval, and whether the metal particles are mixed in the second preset position of the cell is detected by using the second standard sorting resistance interval.
In some embodiments, in order to make the obtained separation resistance interval more accurate, copper and iron are used as preset types of metal particles to detect respectively, i.e. Hi-pot test is performed under the condition that the first preset position and the second preset position are doped with copper particles respectively, so as to obtain a separation resistance lower limit. And then respectively doping iron particles at the first preset position and the second preset position for Hi-point test to obtain another lower limit of the sorting resistance, and taking the larger one of the two lower limits of the sorting resistance as the final lower limit of the sorting resistance.
In other embodiments, further detection is performed on metal particles doped with different sizes, specifically, hi-spot test is performed on copper particles with a diameter of 300 μm at both the first preset position and the second preset position, so as to determine a lower limit value of the sorting resistance; performing Hi-point test under the condition that copper particles with the diameter of 500 mu m are doped at the first preset position and the second preset position, and determining the lower limit value of the other sorting resistance value; similarly, performing Hi-point test on the condition that the first preset position and the second preset position are doped with iron particles with the diameter of 300 mu m, and determining a lower limit value of a sorting resistance value; performing Hi-point test on the condition that the first preset position and the second preset position are doped with iron particles with the diameter of 500 mu m, and determining the lower limit value of the sorting resistance value. And selecting the maximum value of the determined sorting resistance lower limit values under the four working conditions as the final sorting resistance lower limit.
Illustratively, table one uses test conditions in one embodiment: and (3) under the test conditions of U=350V, T=4s and P=0.31 MPa, respectively performing Hi-point test on copper particles and iron particles doped with different sizes and the intact battery cell to obtain a sorting resistance statistical table. Obviously, by adding the detection sample, the boundary value of the standard sorting interval can be expanded, so that the determined standard sorting resistance value is more accurate.
Table I, intrinsic cell and damage cell Hi-point resistance at 350V, 4s, 0.31MPa
And S660, screening the battery cells to be detected by using standard test pressure, standard test voltage and standard sorting resistance.
According to the embodiment, a certain number of intact electric cores and a certain number of electric cores doped with metal particles are selected, hi-point tests under standard test pressure and standard test voltage are respectively carried out on the two electric cores, hi-point resistance sections under two working conditions are obtained, the upper limit of standard sorting resistance and the lower limit of standard sorting resistance are determined based on the two Hi-point resistance sections, and a standard sorting resistance section is obtained.
Optionally, fig. 7 is a block diagram of a battery screening apparatus according to an embodiment of the present invention, where the battery screening apparatus includes: a standard test pressure determination module 710, a standard test voltage determination module 720, a standard sort resistance determination module 730, and a screening module 740, wherein,
the standard test pressure determining module 710 is configured to determine a standard test pressure based on a variation relationship between a Hi-point resistance value of the first sample cell under different test voltages and the test pressure, where the first sample cell is a qualified cell;
the standard test voltage determining module 720 is configured to determine a standard test voltage based on a variation relationship between a Hi-point resistance value of the second sample cell under a standard test pressure and the test voltage, where a diaphragm of the second sample cell has a pinhole with a preset aperture;
the standard sorting resistance determining module 730 is configured to determine a standard sorting resistance based on a Hi-spot resistance of the third sample cell at the standard test pressure and the standard test voltage and a Hi-spot resistance of the first sample cell at the standard test pressure and the standard test voltage, where the third sample cell is doped with a metal particulate of a preset type;
and the screening module 740 is used for screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
Optionally, based on the above technical solution, the standard test voltage determining module 720 includes:
a first test voltage determining unit for determining a preset number of test voltages;
the first Hi-point resistance detection unit is used for detecting the Hi-point resistance of the first sample cell by using the test pressure with gradient increase under each test voltage;
the critical pressure determining unit is used for determining critical pressure when the Hi-point resistance value is stable under each test voltage;
and the standard test pressure determining unit is used for determining the standard test pressure based on the maximum critical pressure and the life end expansion force of the battery cell, wherein the standard test pressure is larger than the maximum critical pressure and smaller than the life end expansion force.
Optionally, based on the above technical solution, the standard test voltage determining module 720 includes:
a second test voltage determining unit for determining a preset number of test voltages;
the second Hi-point resistance detection unit is used for detecting the Hi-point resistance of a preset number of second sample cells by using standard test pressure under each test voltage;
and the standard test voltage determining unit is used for determining the corresponding test voltage as the standard test voltage when the Hi-point resistance values of all the second sample cells are breakdown resistance values.
Optionally, based on the above technical solution, the second Hi-spot resistance detection unit is specifically configured to:
detecting Hi-point resistance values of a first number of second sample cells, hi-point resistance values of a second number of second sample cells and Hi-point resistance values of a third number of second sample cells by using standard test pressure under each test voltage, wherein pinholes of the first number of second sample cells are located at first preset positions of the corresponding cells, pinholes of the second number of second sample cells are located at second preset positions of the corresponding cells, and pinholes of the third number of second sample cells are located at third preset positions of the corresponding cells;
optionally, on the basis of the above technical solution, the standard test pressure determining unit is specifically configured to:
and determining the corresponding test voltage as the standard test voltage when the Hi-point resistance values of all the first number of second sample cells are breakdown resistance values, the Hi-point resistance values of all the second number of second sample cells are breakdown resistance values and the Hi-point resistance values of all the third number of second sample cells are breakdown resistance values.
Optionally, based on the above technical solution, the standard sorting resistance determining module 730 includes:
The first Hi-point resistor set acquisition unit is used for respectively applying standard test pressure and standard test voltage to a preset number of first sample cells to obtain a first Hi-point resistor set;
the second Hi-point resistor set acquisition unit is used for respectively applying standard test pressure and standard test voltage to a preset number of third sample cells to obtain a second Hi-point resistor set;
and the standard sorting resistance interval determining unit is used for determining a standard sorting resistance interval by taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance and the maximum value in the second Hi-point resistor set as the lower limit of the sorting resistance.
Optionally, based on the above technical solution, the second Hi-spot resistor set obtaining unit is specifically configured to:
respectively applying standard test pressure and standard test voltage to a third number of third sample cells and a fourth number of third sample cells to obtain a third Hi-point resistor set and a fourth Hi-point resistor set, wherein the third number of third sample cells are doped with particles at a first preset position of the corresponding cells; the fourth number of third sample cell doped particles are located at a second preset position corresponding to the cell;
optionally, based on the above technical solution, the standard sorting resistance interval determining unit is specifically configured to:
Taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance value, taking the maximum value in the third Hi-point resistor set as the lower limit of the first sorting resistance value, and determining a first standard sorting resistance value interval, wherein the first standard sorting resistance value interval is used for detecting whether the first position of the battery cell has particles or not; the method comprises the steps of,
and taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance value, taking the maximum value in the fourth Hi-point resistor set as the lower limit of the second sorting resistance value, and determining a second standard sorting resistance value interval, wherein the second standard sorting resistance value interval is used for detecting whether the second position of the battery cell has particles or not.
Optionally, on the basis of the above technical solution, the battery screening device further includes:
the second Hi-point resistance detection module is used for respectively detecting the Hi-point resistance of the first sample cell when the voltage is increased according to a preset duration;
and the breakdown voltage determining module is used for determining the corresponding voltage as the breakdown voltage if the Hi-point resistance value is changed into the breakdown resistance value, wherein the test voltage applied in the process of determining the standard test pressure and the standard test voltage is smaller than the breakdown voltage.
Optionally, fig. 8 is a schematic structural diagram of a battery screening apparatus according to an embodiment of the present invention. Fig. 8 shows a block diagram of an exemplary battery screening apparatus 812 suitable for use in implementing embodiments of the present invention. The battery screening apparatus 812 shown in fig. 8 is merely an example and should not be construed as limiting the functionality and scope of use of embodiments of the present invention.
As shown in fig. 8, the battery screening device 812 is in the form of a general purpose computing device. Components of battery screening apparatus 812 may include, but are not limited to: one or more processors or processing units 816, a system memory 828, and a bus 818 that connects the various system components, including the system memory 828 and the processing unit 816.
The system memory 828 may include computer system readable media in the form of volatile memory, such as Random Access Memory (RAM) 30 and/or cache memory 832. Battery screening device 812 may further include other removable/non-removable, volatile/nonvolatile computer system storage media. By way of example only, storage system 834 may be used to read from or write to non-removable, nonvolatile magnetic media (not shown in FIG. 8, commonly referred to as a "hard disk drive"). Although not shown in fig. 8, a magnetic disk drive for reading from and writing to a removable non-volatile magnetic disk (e.g., a "floppy disk"), and an optical disk drive for reading from or writing to a removable non-volatile optical disk (e.g., a CD-ROM, DVD-ROM, or other optical media) may be provided. In such cases, each drive may be coupled to bus 818 through one or more data medium interfaces. Memory 828 may include at least one program product having a set (e.g., at least one) of program modules configured to carry out the functions of embodiments of the invention.
A program/utility 840 having a set (at least one) of program modules 842 may be stored in, for example, memory 828, such program modules 842 including, but not limited to, an operating system, one or more application programs, other program modules, and program data, each or some combination of which may include an implementation of a network environment. Program modules 842 generally perform the functions and/or methods in the embodiments described herein.
The processing unit 816 executes various functional applications and data processing by running a program stored in the system memory 828, for example, to implement a battery screening method provided by an embodiment of the present invention, the method comprising: determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell; determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture; determining a standard sorting resistance value based on the Hi-point resistance value of the third sample cell at the standard test pressure and the standard test voltage and the Hi-point resistance value of the first sample cell at the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type; and screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
The ninth embodiment of the present invention also provides a computer readable storage medium having stored thereon a computer program which when executed by a processor implements the battery screening method as provided by the embodiment of the present invention, the method comprising: determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell; determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture; determining a standard sorting resistance value based on the Hi-point resistance value of the third sample cell at the standard test pressure and the standard test voltage and the Hi-point resistance value of the first sample cell at the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type; and screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
The computer storage media of embodiments of the invention may take the form of any combination of one or more computer-readable media. The computer readable medium may be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium can be, for example, but not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or a combination of any of the foregoing. More specific examples (a non-exhaustive list) of the computer-readable storage medium would include the following: an electrical connection having one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing. In this document, a computer readable storage medium may be any tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device.
The computer readable signal medium may include a propagated data signal with computer readable program code embodied therein, either in baseband or as part of a carrier wave. Such a propagated data signal may take any of a variety of forms, including, but not limited to, electro-magnetic, optical, or any suitable combination of the foregoing. A computer readable signal medium may also be any computer readable medium that is not a computer readable storage medium and that can communicate, propagate, or transport a program for use by or in connection with an instruction execution system, apparatus, or device.
Program code embodied on a computer readable medium may be transmitted using any appropriate medium, including but not limited to wireless, wireline, optical fiber cable, RF, etc., or any suitable combination of the foregoing.
Computer program code for carrying out operations of the present invention may be written in any combination of one or more programming languages, including an object oriented programming language such as Java, smalltalk, C ++ and conventional procedural programming languages, such as the "C" programming language or similar programming languages. The program code may execute entirely on the user's computer, partly on the user's computer, as a stand-alone software package, partly on the user's computer and partly on a remote computer or entirely on the remote computer or server. In the case of a remote computer, the remote computer may be connected to the user's computer through any kind of network, including a Local Area Network (LAN) or a Wide Area Network (WAN), or may be connected to an external computer (for example, through the Internet using an Internet service provider).
Note that the above is only a preferred embodiment of the present invention and the technical principle applied. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, while the invention has been described in connection with the above embodiments, the invention is not limited to the embodiments, but may be embodied in many other equivalent forms without departing from the spirit or scope of the invention, which is set forth in the following claims.
Claims (10)
1. A battery screening method, comprising:
determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell;
determining a standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture;
determining a standard sorting resistance value based on a Hi-pot resistance value of a third sample cell at the standard test pressure and the standard test voltage and a Hi-pot resistance value of the first sample cell at the standard test pressure and the standard test voltage, wherein the third sample cell is doped with a preset type of metal particles;
and screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
2. The battery screening method according to claim 1, wherein the determining the standard test pressure based on the variation relationship between the Hi-spot resistance value of the first sample cell at different test voltages and the test pressure comprises:
Determining a preset number of test voltages;
detecting Hi-point resistance values of the first sample cell at each of the test voltages by using a gradient increasing test pressure;
determining critical pressure when the Hi-point resistance value is stable under each test voltage;
and determining a standard test pressure based on the maximum critical pressure and the end-of-life expansion force of the battery cell, wherein the standard test pressure is greater than the maximum critical pressure and less than the end-of-life expansion force.
3. The battery screening method according to claim 1, wherein the determining a standard test voltage based on a variation relationship between the Hi-spot resistance of the second sample cell at the standard test pressure and the test voltage comprises:
determining a preset number of test voltages;
detecting Hi-point resistance values of a preset number of second sample cells at each test voltage by using the standard test pressure;
and determining the corresponding test voltage when all Hi-point resistance values of the second sample battery cells are breakdown resistance values as standard test voltage.
4. The battery screening method according to claim 3, wherein the detecting the Hi-pot resistance of the predetermined number of second sample cells using the standard test pressure at each of the test voltages, respectively, comprises:
Detecting the Hi-point resistance of a first number of second sample cells, the Hi-point resistance of a second number of second sample cells and the Hi-point resistance of a third number of second sample cells by using the standard test pressure under each test voltage, wherein pinholes of the first number of second sample cells are all located at a first preset position of the corresponding cells, pinholes of the second number of second sample cells are all located at a second preset position of the corresponding cells, and pinholes of the third number of second sample cells are all located at a third preset position of the corresponding cells;
correspondingly, the determining the corresponding test voltage as the standard test voltage when the Hi-point resistance values of all the second sample cells are breakdown resistance values includes:
and determining the corresponding test voltage as the standard test voltage when all Hi-point resistance values of the first number of second sample cells are breakdown resistance values, all Hi-point resistance values of the second number of second sample cells are breakdown resistance values and all Hi-point resistance values of the third number of second sample cells are breakdown resistance values.
5. The battery screening method of claim 1, wherein the determining a standard sorting resistance based on the Hi-spot resistance of the third sample cell at the standard test pressure and the standard test voltage and the Hi-spot resistance of the first sample cell at the standard test pressure and the standard test voltage comprises:
Respectively applying the standard test pressure and the standard test voltage to a preset number of first sample cells to obtain a first Hi-point resistor set;
respectively applying the standard test pressure and the standard test voltage to a preset number of third sample cells to obtain a second Hi-point resistor set;
and taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance value, taking the maximum value in the second Hi-point resistor set as the lower limit of the sorting resistance value, and determining a standard sorting resistance value interval.
6. The battery screening method according to claim 5, wherein applying the standard test pressure and the standard test voltage to the preset number of third sample cells to obtain a second Hi-pot resistance set includes:
applying the standard test pressure and the standard test voltage to a third number of third sample cells and a fourth number of third sample cells respectively to obtain a third Hi-point resistance set and a fourth Hi-point resistance set, wherein the third number of third sample cells doped with particles are positioned at a first preset position of the corresponding cells; the fourth number of the third sample cell doped particles are located at a second preset position of the corresponding cell;
Correspondingly, the determining a standard sorting resistance interval by taking the minimum value in the first Hi-point resistor set as an upper sorting resistance limit and the maximum value in the second Hi-point resistor set as a lower sorting resistance limit includes:
taking the minimum value in the first Hi-point resistor set as the upper limit of a sorting resistance value, taking the maximum value in the third Hi-point resistor set as the lower limit of a first sorting resistance value, and determining a first standard sorting resistance value interval, wherein the first standard sorting resistance value interval is used for detecting whether particles exist at a first position of an electric core or not; the method comprises the steps of,
and taking the minimum value in the first Hi-point resistor set as the upper limit of the sorting resistance value, taking the maximum value in the fourth Hi-point resistor set as the lower limit of the second sorting resistance value, and determining a second standard sorting resistance value interval, wherein the second standard sorting resistance value interval is used for detecting whether particles exist at the second position of the battery cell.
7. The battery screening method of claim 1, wherein prior to determining the standard test pressure based on the variation relationship of Hi-spot resistance of the first sample cell at different test voltages and the test pressure, the method further comprises:
Respectively detecting Hi-point resistance values of the first sample battery cell when the voltage is increased according to preset duration;
and if the Hi-point resistance value is changed into a breakdown resistance value, determining the corresponding voltage as a breakdown voltage, wherein the test voltage applied in the process of determining the standard test pressure and the standard test voltage is smaller than the breakdown voltage.
8. A battery screening apparatus, comprising:
the standard test pressure determining module is used for determining standard test pressure based on the change relation between Hi-point resistance values of the first sample cell under different test voltages and the test pressure, wherein the first sample cell is a qualified cell;
the standard test voltage determining module is used for determining standard test voltage based on the change relation between the Hi-point resistance value of the second sample cell under the standard test pressure and the test voltage, wherein a diaphragm of the second sample cell is provided with a pinhole with a preset aperture;
the standard sorting resistance determining module is used for determining a standard sorting resistance based on the Hi-point resistance of a third sample cell at the standard test pressure and the standard test voltage and the Hi-point resistance of the first sample cell at the standard test pressure and the standard test voltage, wherein the third sample cell is doped with metal particles of a preset type;
And the screening module is used for screening the battery cells to be detected by using the standard test pressure, the standard test voltage and the standard sorting resistance.
9. A battery screening apparatus, comprising:
one or more processors;
a storage means for storing one or more programs;
when the one or more programs are executed by the one or more processors, the one or more processors are caused to implement the battery screening method of any of claims 1-7.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the program, when executed by a processor, implements the battery screening method according to any one of claims 1-7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011454583.7A CN112505560B (en) | 2020-12-10 | 2020-12-10 | Battery screening method, device, equipment and storage medium |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011454583.7A CN112505560B (en) | 2020-12-10 | 2020-12-10 | Battery screening method, device, equipment and storage medium |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112505560A CN112505560A (en) | 2021-03-16 |
| CN112505560B true CN112505560B (en) | 2023-05-30 |
Family
ID=74973405
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011454583.7A Active CN112505560B (en) | 2020-12-10 | 2020-12-10 | Battery screening method, device, equipment and storage medium |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112505560B (en) |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4684887A (en) * | 1986-06-24 | 1987-08-04 | General Battery Corporation | High voltage test confirmation apparatus |
| JP2011028931A (en) * | 2009-07-23 | 2011-02-10 | Yokogawa Electric Corp | Battery insulation testing device |
| GB201420843D0 (en) * | 2014-11-24 | 2015-01-07 | Thunot Andre And Robertson Paul | Cell internal impedance diagnostic system |
| CN107020251A (en) * | 2017-03-23 | 2017-08-08 | 苏州协鑫集成储能科技有限公司 | The screening technique of battery and battery pack |
| CN108398651A (en) * | 2018-03-20 | 2018-08-14 | 王伟波 | A kind of lithium battery voltage inner walkway device |
| CN109709491A (en) * | 2017-10-26 | 2019-05-03 | 宁德新能源科技有限公司 | The method of discrimination of problem battery core |
| CN110333463A (en) * | 2019-07-09 | 2019-10-15 | 深圳市清新电源研究院 | A kind of battery core conformity classification method and its system |
| CN209570681U (en) * | 2018-12-29 | 2019-11-01 | 四川鑫唐新能源科技有限公司 | Ladder uses dynamic lithium battery identification system |
| CN210347869U (en) * | 2019-03-15 | 2020-04-17 | 欣旺达电子股份有限公司 | Electricity core testing arrangement |
| CN111381182A (en) * | 2018-12-27 | 2020-07-07 | 广州汽车集团股份有限公司 | Battery cell short circuit detection clamp, device and detection method |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4658795B2 (en) * | 2005-12-27 | 2011-03-23 | プライムアースＥｖエナジー株式会社 | Battery inspection device, voltage measuring instrument, and fixture |
| US10159770B2 (en) * | 2013-03-12 | 2018-12-25 | Kci Licensing, Inc. | Apparatus and method for identifying alternative cell chemistries for batteries |
-
2020
- 2020-12-10 CN CN202011454583.7A patent/CN112505560B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4684887A (en) * | 1986-06-24 | 1987-08-04 | General Battery Corporation | High voltage test confirmation apparatus |
| JP2011028931A (en) * | 2009-07-23 | 2011-02-10 | Yokogawa Electric Corp | Battery insulation testing device |
| GB201420843D0 (en) * | 2014-11-24 | 2015-01-07 | Thunot Andre And Robertson Paul | Cell internal impedance diagnostic system |
| CN107020251A (en) * | 2017-03-23 | 2017-08-08 | 苏州协鑫集成储能科技有限公司 | The screening technique of battery and battery pack |
| CN109709491A (en) * | 2017-10-26 | 2019-05-03 | 宁德新能源科技有限公司 | The method of discrimination of problem battery core |
| CN108398651A (en) * | 2018-03-20 | 2018-08-14 | 王伟波 | A kind of lithium battery voltage inner walkway device |
| CN111381182A (en) * | 2018-12-27 | 2020-07-07 | 广州汽车集团股份有限公司 | Battery cell short circuit detection clamp, device and detection method |
| CN209570681U (en) * | 2018-12-29 | 2019-11-01 | 四川鑫唐新能源科技有限公司 | Ladder uses dynamic lithium battery identification system |
| CN210347869U (en) * | 2019-03-15 | 2020-04-17 | 欣旺达电子股份有限公司 | Electricity core testing arrangement |
| CN110333463A (en) * | 2019-07-09 | 2019-10-15 | 深圳市清新电源研究院 | A kind of battery core conformity classification method and its system |
Non-Patent Citations (3)
| Title |
|---|
| 新能源动力锂电池灌胶模组检测系统设计;郝瑞超等;制造业自动化(第06期);全文 * |
| 电动汽车耐压测试系统研究;杨胜兵等;轻型汽车技术(第06期);全文 * |
| 采用线结构光的电动汽车电池包箱体孔组位置在线测量;孙浩楠等;制造技术与机床(第3期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112505560A (en) | 2021-03-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN113489457B (en) | Photovoltaic module fault detection method and device | |
| CN113378403B (en) | Simulation test modeling method, system, test method, device and storage medium | |
| TW201419292A (en) | Systems and methods for testing memory | |
| CN115547396B (en) | Test method and device for eMMC | |
| CN105740122A (en) | Method and system for monitoring mobile phone memory leak | |
| US20130111268A1 (en) | Testing device capable of simulating plugging and unplugging operations and method thereof | |
| CN111209148A (en) | Method and system for testing storage stability of server | |
| CN114210604A (en) | Multi-feature echelon utilization power battery sorting method and device and storage medium | |
| CN107621608B (en) | Method for detecting sulfation of 2V valve-controlled lead-acid storage battery pole plate | |
| CN112505560B (en) | Battery screening method, device, equipment and storage medium | |
| CN115902641A (en) | Method and device for predicting battery capacity diving and storage medium | |
| CN116338487B (en) | Battery cell detection method and device, electronic equipment and storage medium | |
| CN113777516B (en) | Method and device for judging abnormal battery cells | |
| CN114117737A (en) | Lithium ion battery simulation method and device, electronic equipment and readable storage medium | |
| CN113030675A (en) | Non-back-gold MOSFET wafer testing method based on near particle method | |
| CN113125974A (en) | Method and device for detecting lithium separation of battery | |
| CN114693043A (en) | Method, system, electronic device, and medium for evaluating health condition of vehicle battery | |
| CN112644334A (en) | Control method, system, vehicle and storage medium for preventing battery from over-discharging | |
| CN116365615A (en) | Method and device for determining charging current value of battery cell and electronic equipment | |
| CN216013565U (en) | Circuit for automatically measuring ESD tube voltage drop | |
| CN114200324B (en) | Lithium iron phosphate battery sorting method, device, equipment and storage medium | |
| CN115754619A (en) | Method, device, equipment and medium for detecting breakdown voltage of lithium battery diaphragm | |
| CN113156318B (en) | Fault cell detection method and device, electronic equipment and storage medium | |
| CN213750205U (en) | Transmission rate testing device | |
| CN217689268U (en) | Chip detection circuit and test system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |