CN112463504B - Double-control storage product testing method, system, terminal and storage medium - Google Patents
Double-control storage product testing method, system, terminal and storage medium Download PDFInfo
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- CN112463504B CN112463504B CN202011465128.7A CN202011465128A CN112463504B CN 112463504 B CN112463504 B CN 112463504B CN 202011465128 A CN202011465128 A CN 202011465128A CN 112463504 B CN112463504 B CN 112463504B
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
Abstract
The invention provides a method, a system, a terminal and a storage medium for testing a double-control storage product, wherein the method comprises the following steps: registering and recording a management control unit of the double-control storage product to be tested through a serial port; presetting the test times, and controlling the management control unit to be circularly restarted according to the test times; after the management control unit is restarted every time, acquiring uplink port state information and downlink port state information of a chip from the management control unit; storing the uplink port state information and the downlink port state information to a test log, and marking the current restart times; and analyzing the speed of the hard disk port in the test log to obtain a test result. The invention can test the reliability of the hard disk by the double-control JBOF product, and gets rid of the dependence on the storage main cabinet; when the hard disk fails, the current scheme can visually embody the current failure state of a PCIE link state machine of the failed hard disk, and is beneficial to research and development of rapid and accurate positioning of failure reasons.
Description
Technical Field
The invention relates to the technical field of storage products, in particular to a method, a system, a terminal and a storage medium for testing a double-control storage product.
Background
The double-control JBOF (storage online) product is a 2U25 full-flash expansion cabinet with high density, high stability and double-control redundancy, the front end of the double-control JBOF needs to be matched with a double-control main cabinet storage product, and an MCS system (management control software) is operated in the storage main cabinet to manage the current double-control JBOF; the storage double-control JBOF system is managed by a PSX (programmable chip management control unit), and MCS upper-layer software is communicated with the PSX through a PCIE interface to set and acquire JBOF related information; therefore, the reliability of the hard disk of the double-control JBOF product needs to be tested by depending on the storage management control software of the main cabinet.
Currently, the reliability of the hard disk of the double-control JBOF product is tested, the double-control main cabinet is matched for storing the product, and the related state information of the JBOF hard disk is checked on the storage of the main cabinet. The current scheme has strong dependence on the storage main cabinet product, and practical test execution has limitation.
Disclosure of Invention
In view of the above-mentioned deficiencies of the prior art, the present invention provides a method, a system, a terminal and a storage medium for dual-control storage product testing, so as to solve the above-mentioned technical problems.
In a first aspect, the present invention provides a method for testing a dual-control storage product, including:
registering and recording a management control unit of the double-control storage product to be tested through a serial port;
presetting the test times, and controlling the management control unit to be circularly restarted according to the test times;
after the management control unit is restarted every time, acquiring uplink port state information and downlink port state information of a chip from the management control unit;
storing the uplink port state information and the downlink port state information to a test log, and marking the current restart times;
and analyzing the speed of the hard disk port in the test log to obtain a test result.
Further, the acquiring chip uplink port state information and chip downlink port state information from the management control unit after the management control unit is restarted each time includes:
and checking the state information of an uplink port and the state information of all downlink ports of the chip through a port checking command, wherein the uplink port is connected with the main storage cabinet, and the downlink port is connected with the hard disk.
Further, analyzing the speed of the hard disk port in the test log to obtain a test result includes:
extracting the speed of the hard disk port restarted each time from the test log through a shutdown field;
and if the hard disk port rate is an abnormal rate, checking a state machine field, and acquiring the state machine state corresponding to the current link through the state machine field.
In a second aspect, the present invention provides a dual-control storage product testing system, including:
the management login unit is configured with a management control unit for logging in the dual-control storage product to be tested through a serial port;
the number setting unit is configured for presetting the number of testing times and controlling the management control unit to be circularly restarted according to the testing times;
the information acquisition unit is configured to acquire the uplink port state information and the downlink port state information of the chip from the management control unit after the management control unit is restarted each time;
the log storage unit is configured to store the uplink port state information and the downlink port state information to a test log and mark the current restart times;
and the result acquisition unit is configured to analyze the hard disk port rate in the test log and acquire a test result.
Further, the information collecting unit includes:
the acquisition module is configured to check the state information of an uplink port and the state information of all downlink ports of the chip through a port checking command, wherein the uplink port is connected with the main storage cabinet, and the downlink port is connected with the hard disk.
Further, the result obtaining unit includes:
the speed extraction module is configured to extract the speed of the hard disk port restarted each time from the test log through the shutdown field;
and the abnormality analysis module is configured to check a state machine field if the hard disk port rate is an abnormal rate, and acquire a state machine state corresponding to the current link through the state machine field.
In a third aspect, a terminal is provided, which includes:
a processor, a memory, wherein,
the memory is used for storing a computer program which,
the processor is configured to call and run the computer program from the memory, so that the terminal performs the method of the terminal described above.
In a fourth aspect, a computer storage medium is provided having stored therein instructions that, when executed on a computer, cause the computer to perform the method of the above aspects.
The beneficial effect of the invention is that,
the double-control storage product testing method, the double-control storage product testing system, the terminal and the storage medium can test the reliability of the hard disk by the double-control JBOF product, and get rid of the dependence on the storage main cabinet; when the hard disk fails, the current scheme can intuitively embody the current failure state of a PCIE link state machine of the failed hard disk, and is beneficial to research and development of rapid and accurate positioning of failure reasons; and the frequency of hard disk failures in the log is counted, so that the probability of the hard disk failures can be counted.
In addition, the invention has reliable design principle, simple structure and very wide application prospect.
Drawings
In order to more clearly illustrate the embodiments or technical solutions in the prior art of the present invention, the drawings used in the description of the embodiments or prior art will be briefly described below, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the present invention.
FIG. 2 is a schematic block diagram of a system of one embodiment of the present invention.
Fig. 3 is a schematic structural diagram of a terminal according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solution of the present invention, the technical solution in the embodiment of the present invention will be clearly and completely described below with reference to the drawings in the embodiment of the present invention, and it is obvious that the described embodiment is only a part of the embodiment of the present invention, and not all embodiments. All other embodiments, which can be obtained by a person skilled in the art without making any creative effort based on the embodiments in the present invention, shall fall within the protection scope of the present invention.
FIG. 1 is a schematic flow diagram of a method of one embodiment of the invention. The execution main body in fig. 1 may be a dual-control storage product test system.
As shown in fig. 1, the method includes:
and 150, analyzing the speed of the hard disk port in the test log to obtain a test result.
Specifically, the double-control storage product testing method comprises the following steps:
(1) Login PSX management control unit through serial port
(2) The states of the upstream port and each downstream port of the PM8546 chip of the double-control JBOF are checked through a command topo 0, the PM8546 upstream port is connected with the storage main cabinet, and the PM8546 downstream port is connected with the hard disk on the double-control JBOF device, so that the state of the hard disk on the JBOF device can be checked through the state of the PM8546 downstream port, and the following command query result is taken as an example:
Logical port ID:1
Physical port ID:16(stk2.0)
Port Type:DSP
Max link rate:vector(3)
Neg link rate:G3
Bif link width:2
Cfg link width:2
Neg link width:2
LTSSM:L0-L0
the command query result shows the Physical slot position information Physical port ID of the hard disk, the speed Neg link rate of the PCIE link of the current port and the current state of the LTSSM state machine
(3) Recording the query result of topo 0 command through log
(4) Restarting PSX by reset command
(5) Delay wait 20s
(6) Repeating steps 1-5
(7) Analyzing the topo 0 command query result log in the step 3, and analyzing the reliability test execution result
And checking the speed of the hard disk port through a Neg link rate field, wherein if the speed G3 of the hard disk represents that the hard disk is normal, the hard disk port fails when the speed G2 or G1 of the hard disk port does not exist.
When the hard disk fails, the LTSSM field can be checked, the current PCIE link state can be displayed by the field, and the state of the current link in the LTSSM state machine can be seen through the field, so that research and development personnel do not need to check the port state of the failed hard disk again through a chiplink tool, and the problem location is conveniently conducted;
the LTSSM state machine covers 11 states, including Detect, polling, configuration, recovery, L0, L0s, L1, L2, hot Reset, loopback, disable. The normal PCIE link training state conversion process sequentially comprises that Detect- > Polling- > Configuration- > L0.L0 is a power state in which the PCIe link can normally work
As shown in fig. 2, the system 200 includes:
the management login unit 210 is configured to log in a management control unit of the dual-control storage product to be tested through a serial port;
a number setting unit 220 configured to preset a number of tests and control the management control unit to restart cyclically according to the number of tests;
an information acquisition unit 230 configured to acquire chip uplink port state information and chip downlink port state information from the management control unit after the management control unit is restarted each time;
a log saving unit 240 configured to save the uplink port state information and the downlink port state information to a test log, and mark the current restart times;
and the result obtaining unit 250 is configured to analyze the hard disk port rate in the test log to obtain a test result.
Optionally, as an embodiment of the present invention, the information acquiring unit includes:
the acquisition module is configured to check the state information of an uplink port and the state information of all downlink ports of the chip through a port checking command, wherein the uplink port is connected with the main storage cabinet, and the downlink port is connected with the hard disk.
Optionally, as an embodiment of the present invention, the result obtaining unit includes:
the speed extraction module is configured to extract the speed of the hard disk port restarted each time from the test log through a shutdown field;
and the abnormality analysis module is configured to check a state machine field if the hard disk port rate is an abnormal rate, and acquire a state machine state corresponding to the current link through the state machine field.
Fig. 3 is a schematic structural diagram of a terminal 300 according to an embodiment of the present invention, where the terminal 300 may be used to execute the dual-control storage product testing method according to the embodiment of the present invention.
Among them, the terminal 300 may include: a processor 310, a memory 320, and a communication unit 330. The components communicate via one or more buses, and those skilled in the art will appreciate that the architecture of the servers shown in the figures is not intended to be limiting, and may be a bus architecture, a star architecture, a combination of more or less components than those shown, or a different arrangement of components.
The memory 320 may be used for storing instructions executed by the processor 310, and the memory 320 may be implemented by any type of volatile or non-volatile storage terminal or combination thereof, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk or optical disk. The executable instructions in memory 320, when executed by processor 310, enable terminal 300 to perform some or all of the steps in the method embodiments described below.
The processor 310 is a control center of the storage terminal, connects various parts of the entire electronic terminal using various interfaces and lines, and performs various functions of the electronic terminal and/or processes data by operating or executing software programs and/or modules stored in the memory 320 and calling data stored in the memory. The processor may be composed of an Integrated Circuit (IC), for example, a single packaged IC, or a plurality of packaged ICs connected with the same or different functions. For example, the processor 310 may include only a Central Processing Unit (CPU). In the embodiment of the present invention, the CPU may be a single operation core, or may include multiple operation cores.
A communication unit 330, configured to establish a communication channel so that the storage terminal can communicate with other terminals. And receiving user data sent by other terminals or sending the user data to other terminals.
The present invention also provides a computer storage medium, wherein the computer storage medium may store a program, and the program may include some or all of the steps in the embodiments provided by the present invention when executed. The storage medium may be a magnetic disk, an optical disk, a read-only memory (ROM) or a Random Access Memory (RAM).
Therefore, the reliability of the hard disk can be tested by the double-control JBOF product, and the dependence on the storage main cabinet is eliminated; when the hard disk fails, the current scheme can intuitively embody the current failure state of a PCIE link state machine of the failed hard disk, and is beneficial to research and development of rapid and accurate positioning of failure reasons; the number of hard disk failures in the log is counted, and the probability of the hard disk failures can be counted.
Those skilled in the art will readily appreciate that the techniques of the embodiments of the present invention may be implemented using software plus any required general purpose hardware platform. Based on such understanding, the technical solutions in the embodiments of the present invention may be embodied in the form of a software product, where the computer software product is stored in a storage medium, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like, and the storage medium can store program codes, and includes instructions for enabling a computer terminal (which may be a personal computer, a server, or a second terminal, a network terminal, and the like) to perform all or part of the steps of the method in the embodiments of the present invention.
The same and similar parts in the various embodiments in this specification may be referred to each other. Especially, for the terminal embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant points can be referred to the description in the method embodiment.
In the several embodiments provided in the present invention, it should be understood that the disclosed system and method may be implemented in other manners. For example, the above-described system embodiments are merely illustrative, and for example, the division of the units is only one logical functional division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, systems or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit.
Although the present invention has been described in detail in connection with the preferred embodiments with reference to the accompanying drawings, the present invention is not limited thereto. Various equivalent modifications or substitutions can be made on the embodiments of the present invention by those skilled in the art without departing from the spirit and scope of the present invention, and these modifications or substitutions are within the scope of the present invention/any person skilled in the art can easily conceive of the changes or substitutions within the technical scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (8)
1. A dual-control storage product testing method is characterized by comprising the following steps:
logging in a management control unit of a dual-control storage product to be tested through a serial port;
presetting testing times, and controlling the management control unit to be circularly restarted according to the testing times;
after the management control unit is restarted every time, acquiring uplink port state information and downlink port state information of a chip from the management control unit;
storing the uplink port state information and the downlink port state information to a test log, and marking the current restart times;
analyzing the speed of the hard disk port in the test log to obtain a test result;
the uplink port is connected with the storage main cabinet, and the downlink port is connected with the hard disk.
2. The method of claim 1, wherein collecting chip upstream port state information and downstream port state information from the management control unit after each reboot of the management control unit comprises:
and checking the state information of the uplink ports and the state information of all downlink ports of the chip through the port checking command.
3. The method of claim 1, wherein analyzing the hard disk port rate in the test log to obtain the test result comprises:
extracting the speed of the hard disk port restarted each time from the test log through a shutdown field;
and if the hard disk port rate is an abnormal rate, checking a state machine field, and acquiring the state machine state corresponding to the current link through the state machine field.
4. A dual-control storage product testing system, comprising:
the management login unit is configured with a management control unit which is used for logging in the dual-control storage product to be tested through a serial port;
the number setting unit is configured for presetting the number of testing times and controlling the management control unit to be circularly restarted according to the testing times;
the information acquisition unit is configured to acquire the uplink port state information and the downlink port state information of the chip from the management control unit after the management control unit is restarted each time;
the log storage unit is configured to store the uplink port state information and the downlink port state information to a test log and mark the current restart times;
the result acquisition unit is configured to analyze the speed of the hard disk port in the test log and acquire a test result;
the uplink port is connected with the storage main cabinet, and the downlink port is connected with the hard disk.
5. The system of claim 4, wherein the information acquisition unit comprises:
and the acquisition module is configured to check the state information of the uplink ports and the state information of all the downlink ports of the chip through the port check command.
6. The system of claim 4, wherein the result obtaining unit comprises:
the speed extraction module is configured to extract the speed of the hard disk port restarted each time from the test log through a shutdown field;
and the abnormality analysis module is configured to check a state machine field if the hard disk port rate is an abnormal rate, and acquire a state machine state corresponding to the current link through the state machine field.
7. A terminal, comprising:
a processor;
a memory for storing instructions for execution by the processor;
wherein the processor is configured to perform the method of any one of claims 1-3.
8. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the method according to any one of claims 1-3.
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