CN112444677B - Super capacitor service life monitoring method, device and storage medium - Google Patents
Super capacitor service life monitoring method, device and storage medium Download PDFInfo
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- CN112444677B CN112444677B CN201910821940.XA CN201910821940A CN112444677B CN 112444677 B CN112444677 B CN 112444677B CN 201910821940 A CN201910821940 A CN 201910821940A CN 112444677 B CN112444677 B CN 112444677B
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Abstract
The embodiment of the invention discloses a super capacitor life monitoring method, a super capacitor life monitoring device and a storage medium, and relates to the field of electronics and electrics. The method comprises the following steps: obtaining the capacitance value of the super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series; acquiring a target capacitor internal resistance corresponding to the capacity value of the super capacitor in a preset corresponding relation between the capacity value and the internal resistance of the super capacitor; determining an aging factor by utilizing the target capacitor internal resistance, the current of the super capacitor and the capacitor failure parameter, wherein the aging factor is used for representing the influence of aging on the capacitor internal resistance; and determining the service life time of the super capacitor corresponding to the aging factor according to the aging factor. The technical scheme of the embodiment of the invention can realize the monitoring of the service life of the super capacitor.
Description
Technical Field
The invention belongs to the field of electronics and electrics, and particularly relates to a super capacitor life monitoring method, a super capacitor life monitoring device and a storage medium.
Background
Super capacitors (i.e., ultra capacitors), also known as electrochemical capacitors (electrochemical capacitors), are an electrochemical element that stores energy through a polarized electrolyte. The super capacitor can be repeatedly charged and discharged for hundreds of thousands of times, and can be used as a backup power supply and the like.
Because the super capacitor has a certain charge-discharge cycle life, the capacity and the energy storage capacity of the super capacitor are reduced after the service life of the super capacitor is reduced. The use of the super capacitor as a backup power supply and the like is important for the time division of the system in which the super capacitor is located. Therefore, a method for monitoring the lifetime of the supercapacitor is needed.
Disclosure of Invention
The embodiment of the invention provides a super capacitor life monitoring method, a super capacitor life monitoring device and a storage medium, which can realize monitoring of super capacitor life.
In a first aspect, an embodiment of the present invention provides a method for monitoring service life of a supercapacitor, including: obtaining the capacitance value of the super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series; acquiring a target capacitor internal resistance corresponding to the capacity value of the super capacitor in a preset corresponding relation between the capacity value and the internal resistance of the super capacitor; determining an aging factor by utilizing the target capacitor internal resistance, the current of the super capacitor and the capacitor failure parameter, wherein the aging factor is used for representing the influence of aging on the capacitor internal resistance; and determining the service life time of the super capacitor corresponding to the aging factor according to the aging factor.
In some embodiments, obtaining the capacitance value of the supercapacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling period includes: for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle time of the sampling time period and the duration of the sampling time period; determining the capacitance of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period; and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
In some embodiments, determining the capacitance of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling period includes: calculating an average value of the first quotient values in a plurality of sampling time periods to serve as a capacitance value of the capacitor module; or, the first quotient in a sampling time period is used as the capacitance of the capacitor module.
In some embodiments, determining the aging factor using the target internal resistance of the capacitor, the current of the supercapacitor, and the capacitor failure parameter comprises: calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor; and determining an aging factor according to the difference value between the second quotient and the target capacitance internal resistance.
In some embodiments, determining a lifetime of the supercapacitor corresponding to the aging factor according to the aging factor comprises: calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor; and determining the service life time of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
In some embodiments, the super capacitor life monitoring method further includes: obtaining the capacitance and internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process; and according to the capacitance and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, adopting a fitting algorithm to obtain a fitting curve of the capacitance and the internal resistance of the super capacitor, and taking the fitting curve as a preset corresponding relation of the capacitance and the internal resistance of the super capacitor.
In some embodiments, the super capacitor life monitoring method further includes: obtaining capacitance values corresponding to aging time of the plurality of capacitor modules in the aging process; obtaining internal resistance corresponding to an aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure ratio which is reduced to an initial capacity value; obtaining individual failure parameters corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value; and determining the capacitance failure parameters based on the individual failure parameters corresponding to each capacitance module.
In a second aspect, an embodiment of the present invention provides a supercapacitor lifetime monitoring device, including: the capacitance acquisition module is used for acquiring the capacitance of the super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, and the capacitor module comprises one super capacitor or more than two super capacitors connected in series; the internal resistance acquisition module is used for acquiring the target capacitor internal resistance corresponding to the capacity value of the super capacitor in the preset corresponding relation between the capacity value of the super capacitor and the internal resistance; the aging factor determining module is used for determining an aging factor by utilizing the target internal resistance of the capacitor, the current of the super capacitor and the capacitor failure parameter, wherein the aging factor is used for representing the influence of aging on the internal resistance of the capacitor; and the service life determining module is used for determining the service life time length of the super capacitor corresponding to the aging factor according to the aging factor.
In some embodiments, the capacity value obtaining module is specifically configured to: for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle time of the sampling time period and the duration of the sampling time period; determining the capacitance of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period; and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
In some embodiments, the capacity acquisition module is further to: calculating an average value of the first quotient values in a plurality of sampling time periods to serve as a capacitance value of the capacitor module; or, the first quotient in a sampling time period is used as the capacitance of the capacitor module.
In some embodiments, the aging factor determination module is specifically configured to: calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor; and determining an aging factor according to the difference value between the second quotient and the target capacitance internal resistance.
In some embodiments, the lifetime determination module is specifically configured to: calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor; and determining the service life time of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
In some embodiments, the super capacitor life monitoring device further includes a fitting module, where the fitting module is configured to obtain capacitance values and internal resistances corresponding to each aging time of the plurality of capacitor modules in the aging process; and according to the capacitance and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, adopting a fitting algorithm to obtain a fitting curve of the capacitance and the internal resistance of the super capacitor, and taking the fitting curve as a preset corresponding relation of the capacitance and the internal resistance of the super capacitor.
In some embodiments, the super capacitor life monitoring device further includes a failure parameter determining module, where the failure parameter determining module is configured to obtain capacitance values corresponding to each aging time of the plurality of capacitor modules in the aging process; obtaining internal resistance corresponding to an aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure ratio which is reduced to an initial capacity value; obtaining individual failure parameters corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value; and determining the capacitance failure parameters based on the individual failure parameters corresponding to each capacitance module.
In some embodiments, the supercapacitor life monitoring device is disposed in a pitch controller of the wind turbine.
In a third aspect, an embodiment of the present invention provides a storage medium, where a computer program is stored, where the computer program when executed by a processor implements the method for monitoring the lifetime of a supercapacitor in the technical solution of the first aspect.
The embodiment of the invention provides a super capacitor life monitoring method, a super capacitor life monitoring device and a storage medium. The method comprises the steps of obtaining the target capacitor internal resistance corresponding to the capacity value of the super capacitor, determining an aging factor which can represent the influence of aging on the capacitor internal resistance by utilizing the target capacitor internal resistance, the current of the super capacitor and the capacitor failure parameter, and further determining the service life of the super capacitor after the super capacitor receives the aging influence, so that the monitoring of the service life of the super capacitor is realized.
Drawings
The invention will be better understood from the following description of specific embodiments thereof taken in conjunction with the accompanying drawings in which like or similar reference characters designate like or similar features.
FIG. 1 is a flowchart of a method for monitoring the lifetime of a supercapacitor according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of a discharging circuit with a capacitor module according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of a discharge curve of a supercapacitor according to an embodiment of the present invention;
FIG. 4 is a flowchart of a method for monitoring the lifetime of a supercapacitor according to another embodiment of the present invention;
FIG. 5 is a flowchart of a method for monitoring the lifetime of a supercapacitor according to another embodiment of the present invention;
FIG. 6 is a block diagram illustrating a super capacitor life monitor according to an embodiment of the present invention;
fig. 7 is a block diagram of a super capacitor life monitoring device according to another embodiment of the present invention.
Detailed Description
Features and exemplary embodiments of various aspects of the invention are described in detail below. In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the invention by showing examples of the invention. The present invention is in no way limited to any particular configuration and algorithm set forth below, but rather covers any modification, substitution, and improvement of elements, components, and algorithms without departing from the spirit of the invention. In the drawings and the following description, well-known structures and techniques have not been shown in order to avoid unnecessarily obscuring the present invention.
The embodiment of the invention provides a super capacitor life monitoring method, a super capacitor life monitoring device and a storage medium, which can be applied to a scene of monitoring the life of a super capacitor. For example, in the field of wind power generation, in order to ensure the normal operation of a wind turbine generator system, power output is controlled, and the pitch system can execute an emergency pitch function in the event of a failure of the wind turbine generator system. Under the condition that the power grid is normal, the power grid can supply power for the pitch system. In the event of a grid failure, such as a power failure or low voltage ride through, the pitch system needs a backup power supply to supply power. The super capacitor has the advantages of high power density, high charging speed, long cycle life, wide working temperature range and the like, can be used as a backup power supply for supplying power to the pitch system, and is applied to a severe working environment of the pitch system of the wind generating set.
The super capacitor has a certain charge-discharge cycle life, which is called as life for short. When the service life of the super capacitor is reduced, the capacity and the energy storage capacity of the super capacitor are also reduced suddenly. With the development of wind power generation technology, the number of wind generating sets is increased sharply, and the time for which the wind generating sets are put into operation is also gradually prolonged, so that the assessment of the service life of the super capacitor is more critical and important.
In the embodiment of the invention, the service life of the super capacitor is determined by using the capacitance value of the super capacitor, the corresponding relation between the preset capacitance value and the internal resistance of the super capacitor, the current of the super capacitor and the capacitor failure parameter, so as to realize the monitoring of the service life of the super capacitor.
Fig. 1 is a flowchart of a method for monitoring the lifetime of a supercapacitor according to an embodiment of the invention. As shown in fig. 1, the super capacitor life monitoring method may include steps S101 to S104.
In step S101, the capacitance of the super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling period.
The capacitor module comprises a super capacitor or more than two super capacitors connected in series. The working state of the capacitor module comprises a charging state and a discharging state. Under the condition that the capacitor module is in a charging state, the current of the capacitor module is the charging current of the capacitor module, and specifically, the charging current of a charger for charging the capacitor module can be directly obtained as the charging current of the capacitor module. Under the condition that the capacitor module is in a discharging state, the current of the capacitor module is the discharging current of the capacitor module, specifically, the resistance value of the discharging resistor of the discharging circuit where the capacitor module is located and the voltage of the capacitor module can be obtained, and the discharging current of the capacitor module is obtained according to the resistance value of the discharging resistor of the discharging circuit where the capacitor module is located and the voltage of the capacitor module.
For example, fig. 2 is a schematic diagram of a discharging circuit where a capacitor module is located in an embodiment of the present invention. As shown in fig. 2, the discharging circuit includes a capacitor module C', a contactor switch K1, and a discharging resistor R1. The resistance of the discharge resistor R1 is the resistance of the discharge resistor of the discharge circuit.
The duration of the sampling period may be set according to the working scenario and the working requirement, and is not limited herein. In order to improve the accuracy of the lifetime monitoring, the duration of the sampling period may be set longer, for example, the duration of the sampling period may be 1 to 8 seconds. It should be noted that, when the capacitance value of the super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the resistance value of the power consumption resistor of the working circuit where the capacitor module is located in more than two sampling time periods, the duration of the more than two sampling time periods may be the same or different, which is not limited herein.
For a sampling period, the voltage of the capacitor module may be collected multiple times in the sampling period, or the corresponding relationship between the voltage of the capacitor module and time in the sampling period may be obtained, such as a voltage curve, and specifically, may be a charging curve of the super capacitor or a discharging curve of the super capacitor.
For example, fig. 3 is a schematic diagram of a discharge curve of a supercapacitor according to an embodiment of the present invention. As shown in fig. 3, the abscissa is time and the ordinate is voltage. The discharging curve shown in fig. 3 can refer to the discharging circuit shown in fig. 2, and the discharging curve in fig. 3 is the discharging curve of the capacitor module in fig. 2. According to fig. 3, the voltage of the capacitor module is continuously reduced during the discharging process of the capacitor module, and the voltage drop rate of the capacitor module is also continuously reduced. And obtaining the discharge current of the capacitor module by using the voltage of the capacitor module and the resistance value of the discharge resistor of the discharge circuit where the capacitor module is positioned in the sampling time period. The capacitance of the capacitor module can be obtained by using the voltage of the capacitor module and the discharge current of the capacitor module. According to the capacitance of the capacitor module, the capacitance of the super capacitor in the capacitor module can be obtained.
In step S102, a target internal resistance of the capacitor corresponding to the capacitance value of the supercapacitor is obtained from a preset correspondence between the capacitance value and the internal resistance of the supercapacitor.
The corresponding relation between the capacitance value and the internal resistance of the super capacitor can be obtained through experiments on the plurality of capacitor modules and is used as the corresponding relation between the capacitance value and the internal resistance of the preset super capacitor. And the corresponding relation between the capacitance value and the internal resistance of the super capacitor can be obtained as the corresponding relation between the capacitance value and the internal resistance of the preset super capacitor by sampling in a large range to obtain the relevant parameters of the different capacitor modules from the factory. Other ways of obtaining the corresponding relation between the preset capacitance value and the internal resistance of the super capacitor are also within the protection scope of the embodiment of the invention.
The preset corresponding relation between the capacitance value and the internal resistance of the super capacitor comprises at least one group of corresponding capacitance value and internal resistance of the super capacitor, and the internal resistance corresponding to the capacitance value of the super capacitor obtained in the step S101 in the corresponding relation is the target internal resistance of the capacitor.
In step S103, an aging factor is determined using the target internal resistance of the capacitor, the current of the supercapacitor, and the capacitor failure parameter.
Wherein the aging factor is used to characterize the effect of aging on the internal resistance of the capacitor. The capacitance failure parameter is related to the voltage achievable by the supercapacitor failure. In embodiments of the present invention, capacitance failure is considered to be age-related. Therefore, the aging factor can be obtained by using the capacitor failure parameter, the target capacitor content and the current of the super capacitor.
The current of the super capacitor is the current flowing through the super capacitor. Taking the super capacitor in a discharge state as an example, the current of the super capacitor may be a discharge current. For example, if the super capacitor is discharged with a constant current, the discharge current is 5A (i.e. amperes), and the current of the super capacitor is 5A.
In step S104, a lifetime of the supercapacitor corresponding to the aging factor is determined according to the aging factor.
The aging factor is related to the capacity value, the accelerated aging time and the service life of the super capacitor, namely the normal working time. Therefore, the service life time of the super capacitor corresponding to the aging factor can be determined according to the aging chair.
After the service life of the super capacitor is obtained, if the service life of the super capacitor is longer than or equal to the service life of the super capacitor, indicating that the super capacitor may fail; if the operation time of the super capacitor is shorter than the service life of the super capacitor, the super capacitor can be used normally. The obtained difference value between the service life of the super capacitor and the operation time of the super capacitor is the residual service life of the super capacitor.
In the embodiment of the invention, the capacitance value of the super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period. The method comprises the steps of obtaining the target capacitor internal resistance corresponding to the capacity value of the super capacitor, determining an aging factor which can represent the influence of aging on the capacitor internal resistance by utilizing the target capacitor internal resistance, the current of the super capacitor and the capacitor failure parameter, and further determining the service life of the super capacitor after the super capacitor receives the aging influence, so that the monitoring of the service life of the super capacitor is realized.
In addition, in the process of monitoring the service life of the super capacitor in the embodiment of the invention, aiming at the super capacitor, the influence of process variables such as charge and discharge times, temperature and the like of the super capacitor is not required to be paid attention to, but the capacitance of the super capacitor is paid attention to, so that the monitoring of the service life of the super capacitor is simplified. The super capacitor life monitoring method is suitable for super capacitors with different voltage levels, can be applied to super capacitors in a charging process or a discharging process, and is wider in applicability. Because the super-capacitor life monitoring method in the embodiment of the invention is simpler, the performance requirements on the parts such as a controller or a processor for executing the super-capacitor life monitoring method are lower, the miniaturization of devices, equipment and the like for realizing the super-capacitor life monitoring method is facilitated, and the cost of the devices, equipment and the like for realizing the super-capacitor life monitoring method can be reduced.
Fig. 4 is a flowchart of a method for monitoring the lifetime of a supercapacitor according to another embodiment of the present invention. Fig. 4 is different from fig. 1 in that step S101 shown in fig. 1 may be thinned into steps S1011 to S1013 shown in fig. 4; step S103 shown in fig. 1 can be thinned into step S1031 and step S1032 shown in fig. 4; step S104 shown in fig. 1 can be thinned into step S1041 and step S1042 shown in fig. 4.
In step S1011, a first product of the current of the capacitor module at the middle time of the sampling period and the duration of the sampling period is calculated.
In step S1012, the capacitance of the capacitor module is determined according to the first quotient of the first product and the voltage variation of the capacitor module in the sampling period.
Under the condition that the super capacitor is in a working state, the change of the voltage curve of the super capacitor is regular. For example, under the condition that the super capacitor is in a charging state, the voltage of the super capacitor gradually rises; under the condition that the super capacitor is in a discharging state, the voltage of the super capacitor gradually drops. It should be noted that the voltage curve of the super capacitor may fluctuate and jump to some extent.
In the embodiment of the invention, the current of the capacitor module is calculated by adopting a median method, and the description is given below taking the discharge state of the super capacitor in the capacitor module as an example.
For example, as shown in fig. 3, the discharge curve of the battery module may be divided into a sufficient number of small segments, and the curve in each small segment may be approximately regarded as a straight line. For example, the period between time t1 and time tn is a sampling period, and the curve corresponding to the period between time t1 and time tn is approximately regarded as a straight line, and from the characteristics of the straight line equation, equation (1) can be obtained as follows:
U tn +U t1 ＝U tn-1 +U t2 ＝U tn-2 +U t3 ＝2×(U tn/2 ) (1)
wherein U is t1 For the voltage of the capacitor module at time t1, U t2 For the voltage of the capacitor module at time t2, U t3 For the voltage of the capacitor module at time t3, U tn/2 For the voltage of the capacitor module at time tn/2, U tn-2 For the voltage of the capacitor module at time tn-2, U tn-1 For the voltage of the capacitor module at time tn-1, U tn The voltage of the capacitor module at time tn.
It can be obtained that the voltage of the capacitor module at the middle moment of the sampling period is approximately equal to the average voltage value in the sampling period. Because the resistance value of the discharge resistor in the discharge circuit where the capacitor module is located is fixed, the current of the capacitor module at the middle moment of the sampling time period is approximately equal to the current average value in the sampling time period, and therefore the accuracy of current measurement of the capacitor module in the process of calculating the capacitance value of the capacitor module can be improved.
According to steps S1011 to S1013, the capacitance of the capacitor module can be obtained according to equation (2):
C’＝(I×t)/ΔU＝(U×t)/(ΔU×R 1 ) (2)
wherein C' is the capacitance of the capacitor module, I is the current of the capacitor module at the middle time of the sampling period, t is the duration of the sampling period, deltaU is the voltage variation of the capacitor module in the sampling period, U is the voltage of the capacitor module at the middle time of the sampling period, R 1 The resistance value of the discharge resistor of the discharge circuit where the capacitor module is located.
It should be noted that, the duration of the sampling period may be set longer, for example, the duration of the sampling period may be in a range of 1 to 8 seconds, so that Δu in the above formula becomes larger, and the influence of voltage fluctuation in the working state of the capacitor module is reduced, thereby improving the measurement accuracy of the capacitance value of the capacitor module.
In some examples, an average value of the first quotient over a plurality of sampling periods may be calculated as the capacitance value of the capacitive module. The first quotient value in each sampling time period is the capacitance value of the capacitor module in the sampling time period. The average value of the capacitance values of the capacitor modules in a plurality of sampling time periods can be used as the capacitance value of the capacitor module participating in subsequent calculation, so that the service life accuracy of the obtained super capacitor is further improved. The duration of the intervals of the multiple sampling periods cannot be too long to avoid affecting the accuracy of the resulting supercapacitor lifetime.
For example, an average value of the first quotient in two adjacent sampling periods can be used as the capacitance value of the capacitor module. Specifically, for example, three times arranged in time series are time t1, time t2, and time t3, respectively. And (3) resetting the measurement count and the capacitance accumulation initialization immediately before the first measurement of the capacitance entering the capacitance module. When the time reaches the time t1, the first measurement of the capacitance value of the capacitor module is started, the first measurement of the capacitance value of the capacitor module is ended when the time t2 is ended, the measurement count is increased by one, and the capacitance value is accumulated and increased by the capacitance value measured for the first time. I.e. the time period between time t1 and time t2 is the first sampling time period. However, when the time reaches the time t2, the second measurement of the capacitance value of the capacitor module is started, and when the time t3 is reached, the second measurement of the capacitance value of the capacitor module is ended, the measurement count is increased by one, and the capacitance value is increased by the capacitance value measured for the second time in an accumulated manner. I.e. the time period between time t2 and time t3 is the second sampling time period. The quotient of the capacitance accumulation and the measurement count is the average value of the capacitance module in the first sampling period and the capacitance of the capacitance module in the second sampling period.
In other examples, the first quotient value in a sampling period is used as the capacitance value of the capacitor module. If only the first quotient in one sampling time period is calculated, the first quotient in the sampling time period can be directly used as the capacitance value of the capacitor module. If the first quotient in the sampling time periods is calculated, the first quotient in any sampling time period can be selected as the capacitance of the capacitor module, or according to a certain rule, the first quotient in one sampling time period is selected as the capacitance of the capacitor module. For example, the first quotient value centered in the magnitude of the plurality of sampling periods is selected as the capacitance value of the capacitor module, which is not limited herein.
In step S1013, the capacitance of the super capacitor in the capacitor module is determined based on the capacitance of the capacitor module.
If the capacitor module comprises a super capacitor, the capacitance of the capacitor module can be used as the capacitance of the super capacitor. If the capacitor module comprises N super capacitors connected in series, the capacitance of the super capacitor is N times of the capacitance of the capacitor module.
In step S1031, a second quotient of the capacitor failure parameter and the current of the supercapacitor is calculated.
In step S1032, an aging factor is determined according to the difference between the second quotient and the target internal resistance of the capacitor.
In step S1041, a second product of the aging factor and the capacitance of the supercapacitor is calculated.
In step S1042, the service life of the supercapacitor corresponding to the aging factor is determined by using the second product and the preset aging time conversion coefficient.
The capacitor module can be applied to a pulse scene. It should be noted that, in the scenario of large instantaneous current, a super capacitor with low internal resistance (Equivalent Series Resistance, ESR) may be selected to reduce voltage drop, and in the scenario of small current application, a super capacitor with large capacity may be selected to reduce voltage drop.
For example, in the pulse scenario, the relationship among the difference between the starting operating voltage and the stopping operating voltage of the supercapacitor, the aging factor of the supercapacitor, the current of the supercapacitor and the internal resistance of the supercapacitor is shown in the following formula (3):
V＝I(R+T×a/c) (3)
wherein V is the difference between the starting working voltage and the stopping working voltage of the super capacitor, I is the current of the super capacitor, R is the internal resistance of the super capacitor, T is the aging factor of the super capacitor, T is the normal working time of the super capacitor, namely the service life of the super capacitor, a is the aging time conversion coefficient of the accelerated aging time of the super capacitor and the service life of the super capacitor, and c is the capacitance value of the super capacitor.
Under the influence of aging, the difference between the actual operating voltage and the cut-off operating voltage of the super capacitor is reduced. In some examples, the cutoff operating voltage is 0V. The capacitance failure parameter is related to the voltage achievable by the supercapacitor failure. Therefore, the relation among the capacitor failure parameter, the difference value between the starting working voltage and the stopping working voltage of the super capacitor, the aging factor of the super capacitor, the current of the super capacitor and the internal resistance of the super capacitor is shown as an expression (4):
I(R+T×a/c)＞M (4)
wherein M is a capacitance failure parameter, and the physical meaning of other parameters in the formula (4) can be seen from the formula (3).
From the above equation (4), equation (5) of the lifetime of the supercapacitor can be obtained:
T＞(M/I-R)×c/a (5)
it should be noted that the capacity value of the super capacitor calculated in the step S1014 may not be used to determine the service life of the super capacitor, and the capacity value of the capacitor module obtained in the step S1013 may be used to determine the service life of the super capacitor. If the capacitor module comprises N super capacitors connected in series, the capacitance value of the capacitor module is equal to 1/N of the capacitance value of the super capacitor, and the internal resistance of the capacitor module is equal to N times of the internal resistance of the super capacitor. Correspondingly, the capacitance failure parameter corresponding to the capacitance module is also N times of the capacitance failure parameter corresponding to the super capacitor. Substituting the capacitance value of the capacitor module, the internal resistance of the capacitor module and the capacitor failure parameter corresponding to the capacitor module into the above formula (5) can eliminate N, and can still use the formula (5) for calculation.
Fig. 5 is a flowchart of a method for monitoring lifetime of a supercapacitor according to another embodiment of the invention. Fig. 5 is different from fig. 1 in that the super capacitor life monitoring method shown in fig. 5 further includes steps S105 to S110.
In step S105, capacitance and internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process are obtained.
And (3) obtaining a plurality of capacitor modules to perform an aging experiment to obtain the capacitance and the internal resistance corresponding to each aging time of the capacitor modules in the aging process. For example, the following table shows the capacitance, internal resistance, capacitance change, internal resistance change, and difference between the starting operating voltage and the stopping operating voltage of the super capacitor (in the table, the voltage difference is simply referred to as "voltage difference") corresponding to different aging times of the four capacitor modules in the aging process.
List one
The capacitor modules comprise four capacitor modules, namely a module 1, a module 2, a module 3 and a module 4.
In step S106, a fitting algorithm is adopted according to the capacitance and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, so as to obtain a fitting curve of the capacitance and the internal resistance of the super capacitor, and the fitting curve is used as a preset corresponding relation between the capacitance and the internal resistance of the super capacitor.
For example, according to the capacitance value and the internal resistance corresponding to each aging time of the capacitor module in the first table, a fitting curve of the capacitance value and the internal resistance of the super capacitor is obtained by fitting, and the fitting curve represents the corresponding relation between the capacitance value and the internal resistance of the super capacitor. According to the capacitance and the internal resistance in the table one, the expression of a fitting curve obtained by fitting is shown as an expression (6):
R＝(A-D)/[1+(c/C) B ]+D (6)
wherein R is the internal resistance of the super capacitor, c is the capacitance of the super capacitor, and A, B, C and D are both constant coefficients. From the data in table one, a=0.72453215178867, b=13.7344879830501, c=2695.84379114985, d= 0.102391229153561 can be calculated. According to the result of the fitting curve, the fitting precision is 0.95, and the accuracy of the fitting curve is high, so that the service life duration of the super capacitor obtained by service life monitoring is more accurate.
In some fields, for example, in the field of wind power generation, it is difficult to detect the internal resistance of the supercapacitor on line due to limitations of equipment precision and sampling precision. Because of the large number of wind generating sets, the workload of detaching the super capacitor from the wind generating sets for detection is huge, and the workload of installing the super capacitor into the wind power generating sets is also huge. Therefore, off-line detection of the internal resistance of the super capacitor is not practical.
In the embodiment of the invention, the fitting curve obtained by fitting is utilized to determine the internal resistance of the target capacitor corresponding to the super capacitor, so that the requirement on the detection precision of equipment is low, and the super capacitor is not required to be detached and reinstalled, thereby greatly reducing the workload.
In step S107, capacitance values corresponding to each aging time of the plurality of capacitor modules in the aging process are obtained.
In step S108, the internal resistance corresponding to the aging failure capacity value of each capacitor module is obtained.
Wherein the aged failure capacity value is the capacity value of the failure ratio which is reduced to the initial capacity value. The failure duty cycle may be set according to the working scenario and the working requirement, and is not limited herein. For example, if the failure ratio is 80%, the super capacitor is considered to be likely to fail when the capacitance of the super capacitor drops to 80% of the initial capacitance. From Table one, the capacity of modules 1, 2, 3 and 4 at an aging time of 779.5 hours was the aging failure capacity.
In step S109, according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value, the individual failure parameter corresponding to each capacitor module is obtained.
And calculating the difference between the starting working voltage and the stopping working voltage corresponding to each capacitor module by using the aging failure capacity value of the capacitor module and the internal resistance corresponding to the aging failure capacity value, and taking the difference as an individual failure parameter corresponding to each capacitor module.
For example, as can be seen from Table one, the individual failure parameters for each of modules 1, 2, 3 and 4 are 4.148751526, 4.219895806, 4.127009028 and 4.574356112, respectively.
In step S110, a capacitance failure parameter is determined based on the individual failure parameter corresponding to each capacitance module.
Wherein, a value can be selected as the capacitor failure parameter in a value range determined according to each individual failure parameter. For example, from the individual failure parameters in Table one, 4.5 may be selected as the capacitance failure parameter.
It should be noted that, if the capacitor module includes a super capacitor, the capacitor failure parameter of the capacitor module may be used as the capacitor failure parameter of the super capacitor. If the capacitor module comprises N super capacitors connected in series, the capacitance failure parameter of the capacitor module is N times of the capacitance failure parameter of the super capacitors.
And obtaining a plurality of individual failure parameters according to the aging failure capacity values of the plurality of capacitor modules along with the shadow and the resistance corresponding to the aging failure capacity values. A capacitance failure parameter is determined based on the plurality of individual failure parameters. The capacitor failure parameters are consistent, so that the service life of the super capacitor obtained by the embodiment of the invention is more accurate.
Fig. 6 is a block diagram of a super capacitor life monitoring device according to an embodiment of the present invention. As shown in fig. 6, the supercapacitor life monitoring device 200 may include a capacity acquisition module 201, an internal resistance acquisition module 202, an aging factor determination module 203, and a life determination module 204.
The capacitance value obtaining module 201 is configured to obtain a capacitance value of the super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling period.
The capacitor module comprises a super capacitor or more than two super capacitors connected in series.
The internal resistance obtaining module 202 is configured to obtain, in a preset correspondence between the capacitance value and the internal resistance of the supercapacitor, a target internal resistance of the capacitor corresponding to the capacitance value of the supercapacitor.
The aging factor determining module 203 is configured to determine an aging factor by using the target internal resistance of the capacitor, the current of the supercapacitor and the capacitor failure parameter.
Wherein the aging factor is used to characterize the effect of aging on the internal resistance of the capacitor.
The life determining module 204 determines a life duration of the supercapacitor corresponding to the aging factor according to the aging factor.
In the embodiment of the invention, the capacitance value of the super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period. The method comprises the steps of obtaining the target capacitor internal resistance corresponding to the capacity value of the super capacitor, determining an aging factor which can represent the influence of aging on the capacitor internal resistance by utilizing the target capacitor internal resistance, the current of the super capacitor and the capacitor failure parameter, and further determining the service life of the super capacitor after the super capacitor receives the aging influence, so that the monitoring of the service life of the super capacitor is realized.
In some examples, the capacity value obtaining module 201 may be specifically configured to: for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle time of the sampling time period and the duration of the sampling time period; determining the capacitance of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period; and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
Specifically, the capacity value obtaining module 201 may further be configured to: calculating an average value of the first quotient values in a plurality of sampling time periods to serve as a capacitance value of the capacitor module; or, the first quotient in a sampling time period is used as the capacitance of the capacitor module.
In some examples, the aging factor determination module 203 may be specifically configured to: calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor; and determining an aging factor according to the difference value between the second quotient and the target capacitance internal resistance.
In some examples, the lifetime determination module 204 may be specifically configured to: calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor; and determining the service life time of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
Fig. 7 is a block diagram of a super capacitor life monitoring device according to another embodiment of the present invention. Fig. 7 differs from fig. 6 in that the supercapacitor life monitoring device shown in fig. 7 may further comprise a fitting module 205 and a failure parameter determination module 206.
The fitting module 205 is configured to obtain capacitance values and internal resistances corresponding to each aging time of the plurality of capacitor modules in the aging process; and according to the capacitance and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, adopting a fitting algorithm to obtain a fitting curve of the capacitance and the internal resistance of the super capacitor, and taking the fitting curve as a preset corresponding relation of the capacitance and the internal resistance of the super capacitor.
The failure parameter determining module 206 is configured to obtain capacitance values corresponding to each aging time of the plurality of capacitor modules in the aging process; obtaining internal resistance corresponding to an aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure ratio which is reduced to an initial capacity value; obtaining individual failure parameters corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value; and determining the capacitance failure parameters based on the individual failure parameters corresponding to each capacitance module.
In some examples, the super-capacitor life monitoring device 200 may be disposed in a pitch controller of a wind turbine to monitor a life span of a super-capacitor in a pitch system of the wind turbine.
The embodiment of the invention also provides a storage medium, and the storage medium stores a computer program which, when executed by a processor, realizes the processes of the super capacitor life monitoring method embodiment in the above embodiment, and can achieve the same technical effects, and for avoiding repetition, the description is omitted here. The storage medium may include, but is not limited to, read-Only Memory (ROM), random access Memory (Random Access Memory, RAM), magnetic or optical disk, and the like.
It should be understood that, in the present specification, each embodiment is described in an incremental manner, and the same or similar parts between the embodiments are all referred to each other, and each embodiment is mainly described in a different point from other embodiments. For device embodiments and storage medium embodiments, reference may be made to the description of method embodiments for relevant points. The invention is not limited to the specific steps and structures described above and shown in the drawings. Those skilled in the art will appreciate that various alterations, modifications, and additions may be made, or the order of steps may be altered, after appreciating the spirit of the present invention. Also, a detailed description of known method techniques is omitted here for the sake of brevity.
Those skilled in the art will appreciate that the above-described embodiments are exemplary and not limiting. The different technical features presented in the different embodiments may be combined to advantage. Other variations to the disclosed embodiments can be understood and effected by those skilled in the art in view of the drawings, the description, and the claims. In the claims, the term "comprising" does not exclude other means or steps; the indefinite article "a" does not exclude a plurality; the terms "first," "second," and the like, are used for designating a name and not for indicating any particular order. Any reference signs in the claims shall not be construed as limiting the scope. The functions of the various elements presented in the claims may be implemented by means of a single hardware or software module. The presence of certain features in different dependent claims does not imply that these features cannot be combined to advantage.
Claims (9)
1. The super capacitor life monitoring method is characterized by comprising the following steps of:
obtaining the capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series;
acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor in a preset corresponding relation between the capacitance value and the internal resistance of the super capacitor;
determining an aging factor by using the target capacitor internal resistance, the current of the super capacitor and the capacitor failure parameter, wherein the capacitor failure parameter is related to the voltage which can be achieved by the super capacitor failure, and the aging factor is used for representing the influence of aging on the capacitor internal resistance;
determining the service life time of the super capacitor corresponding to the aging factor according to the aging factor;
the method further comprises the steps of:
obtaining the capacitance and internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process;
and according to the capacitance and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, adopting a fitting algorithm to obtain a fitting curve of the capacitance and the internal resistance of the super capacitor, and taking the fitting curve as a corresponding relation of the capacitance and the internal resistance of a preset super capacitor.
2. The method of claim 1, wherein the obtaining the capacitance of the super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling period comprises:
for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle moment of the sampling time period and the duration of the sampling time period;
determining the capacitance of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period;
and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
3. The method of claim 2, wherein determining the capacitance of the capacitor module according to the first quotient of the first product and the voltage variation of the capacitor module over the sampling period comprises:
calculating the average value of the first quotient values in a plurality of sampling time periods to be used as the capacitance value of the capacitor module;
or alternatively, the process may be performed,
and taking the first quotient value in the sampling time period as the capacitance value of the capacitor module.
4. The method of claim 1, wherein determining the aging factor using the target internal resistance of the capacitor, the current of the supercapacitor, and the capacitor failure parameter comprises:
calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor;
and determining the aging factor according to the difference value between the second quotient and the target capacitance internal resistance.
5. The method of claim 1, wherein the determining a lifetime of the supercapacitor corresponding to the aging factor according to the aging factor comprises:
calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor;
and determining the service life time of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
6. The method as recited in claim 1, further comprising:
obtaining capacitance values corresponding to aging time of the plurality of capacitor modules in the aging process;
obtaining internal resistance corresponding to an aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure duty ratio which is reduced to an initial capacity value;
obtaining individual failure parameters corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value;
and determining the capacitance failure parameters based on the individual failure parameters corresponding to each capacitance module.
7. A supercapacitor life monitoring device, comprising:
the capacitance value acquisition module is used for acquiring the capacitance value of the super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series;
the internal resistance acquisition module is used for acquiring a target capacitor internal resistance corresponding to the capacity value of the super capacitor in a preset corresponding relation between the capacity value of the super capacitor and the internal resistance;
the aging factor determining module is used for determining an aging factor by utilizing the target internal resistance of the capacitor, the current of the super capacitor and the capacitor failure parameter, wherein the capacitor failure parameter is related to the voltage which can be achieved by the failure of the super capacitor, and the aging factor is used for representing the influence of aging on the internal resistance of the capacitor;
the service life determining module is used for determining the service life time length of the super capacitor corresponding to the aging factor according to the aging factor;
the apparatus further comprises:
the fitting module is used for acquiring the capacitance and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process; and according to the capacitance and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, adopting a fitting algorithm to obtain a fitting curve of the capacitance and the internal resistance of the super capacitor, and taking the fitting curve as a corresponding relation of the capacitance and the internal resistance of a preset super capacitor.
8. The device of claim 7, wherein the supercapacitor life monitoring device is provided in a pitch controller of a wind turbine.
9. A storage medium storing a computer program which, when executed by a processor, implements the supercapacitor life monitoring method according to any one of claims 1 to 6.
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| CN107860979B (en) * | 2017-09-11 | 2020-07-03 | 宁波中车新能源科技有限公司 | Method and system for testing capacity and internal resistance of super capacitor energy storage system |
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| CN109307821B (en) * | 2018-11-30 | 2021-09-03 | 广东电网有限责任公司 | Aging performance test method for super capacitor |
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