CN112444677A - Super capacitor life monitoring method and device and storage medium - Google Patents
Super capacitor life monitoring method and device and storage medium Download PDFInfo
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Abstract
The embodiment of the invention discloses a super capacitor service life monitoring method and device and a storage medium, and relates to the field of electronics and electricity. The method comprises the following steps: obtaining the capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series; acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor from the corresponding relation between the capacitance value and the internal resistance of the preset super capacitor; determining an aging factor by using the target capacitance internal resistance, the current of the super capacitor and the capacitance failure parameter, wherein the aging factor is used for representing the influence of aging on the capacitance internal resistance; and determining the service life duration of the super capacitor corresponding to the aging factor according to the aging factor. The technical scheme of the embodiment of the invention can realize the monitoring of the service life of the super capacitor.
Description
Technical Field
The invention belongs to the field of electronics and electrics, and particularly relates to a method and a device for monitoring the service life of a super capacitor and a storage medium.
Background
A supercapacitor (i.e., ultracapacitors), also known as electrochemical capacitors (electrochemical capacitors), is an electrochemical element that stores energy by polarizing an electrolyte. The super capacitor can be repeatedly charged and discharged for tens of thousands of times, and can be used as a backup power supply and the like.
Because the super capacitor has a certain charge-discharge cycle life, when the life of the super capacitor is reduced, the capacitance value and the energy storage capacity of the super capacitor are also reduced. The use of the super capacitor as a backup power source and the like is important to the time division of a system in which the super capacitor is located. Therefore, a method for monitoring the lifetime of a super capacitor is needed.
Disclosure of Invention
The embodiment of the invention provides a method and a device for monitoring the service life of a super capacitor and a storage medium, which can monitor the service life of the super capacitor.
In a first aspect, an embodiment of the present invention provides a method for monitoring a lifetime of a super capacitor, including: obtaining the capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series; acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor from the corresponding relation between the capacitance value and the internal resistance of the preset super capacitor; determining an aging factor by using the target capacitance internal resistance, the current of the super capacitor and the capacitance failure parameter, wherein the aging factor is used for representing the influence of aging on the capacitance internal resistance; and determining the service life duration of the super capacitor corresponding to the aging factor according to the aging factor.
In some embodiments, obtaining a capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period includes: for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle moment of the sampling time period and the duration of the sampling time period; determining the capacitance value of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period; and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
In some embodiments, determining the capacitance value of the capacitive module according to the first product and the first quotient of the voltage change amount of the capacitive module in the sampling period includes: calculating the average value of the first quotient values in a plurality of sampling time periods to serve as the capacitance value of the capacitor module; or, the first quotient value in one sampling time period is used as the capacitance value of the capacitor module.
In some embodiments, determining the aging factor using the target internal capacitance resistance, the current of the super-capacitor, and the capacitance failure parameter includes: calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor; and determining an aging factor according to the difference value of the second quotient and the target capacitance internal resistance.
In some embodiments, determining the lifetime duration of the supercapacitor corresponding to the aging factor according to the aging factor comprises: calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor; and determining the service life duration of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
In some embodiments, the method for monitoring the lifetime of the super capacitor further includes: acquiring capacitance values and internal resistances corresponding to aging time of the plurality of capacitor modules in an aging process; and obtaining a fitting curve of the capacitance value and the internal resistance of the super capacitor by adopting a fitting algorithm according to the capacitance value and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, and taking the fitting curve as a preset corresponding relation between the capacitance value and the internal resistance of the super capacitor.
In some embodiments, the method for monitoring the lifetime of the super capacitor further includes: acquiring a capacitance value corresponding to each aging time of the plurality of capacitor modules in the aging process; acquiring internal resistance corresponding to the aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure ratio which is reduced to an initial capacity value; obtaining an individual failure parameter corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value; and determining the capacitor failure parameters based on the individual failure parameters corresponding to each capacitor module.
In a second aspect, an embodiment of the present invention provides a device for monitoring a lifetime of a super capacitor, including: the capacitance value acquisition module is used for acquiring the capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series; the internal resistance acquisition module is used for acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor in the corresponding relation between the capacitance value and the internal resistance of the preset super capacitor; the aging factor determining module is used for determining an aging factor by using the target capacitance internal resistance, the current of the super capacitor and the capacitance failure parameter, wherein the aging factor is used for representing the influence of aging on the capacitance internal resistance; and the service life determining module is used for determining the service life duration of the super capacitor corresponding to the aging factor according to the aging factor.
In some embodiments, the capacity value obtaining module is specifically configured to: for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle moment of the sampling time period and the duration of the sampling time period; determining the capacitance value of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period; and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
In some embodiments, the capacitance value obtaining module is further configured to: calculating the average value of the first quotient values in a plurality of sampling time periods to serve as the capacitance value of the capacitor module; or, the first quotient value in one sampling time period is used as the capacitance value of the capacitor module.
In some embodiments, the aging factor determination module is specifically configured to: calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor; and determining an aging factor according to the difference value of the second quotient and the target capacitance internal resistance.
In some embodiments, the lifetime determination module is specifically configured to: calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor; and determining the service life duration of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
In some embodiments, the supercapacitor life monitoring device further includes a fitting module, where the fitting module is configured to obtain capacitance values and internal resistances corresponding to aging times of the plurality of capacitor modules in an aging process; and obtaining a fitting curve of the capacitance value and the internal resistance of the super capacitor by adopting a fitting algorithm according to the capacitance value and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, and taking the fitting curve as a preset corresponding relation between the capacitance value and the internal resistance of the super capacitor.
In some embodiments, the device for monitoring the lifetime of the super capacitor further includes a failure parameter determining module, where the failure parameter determining module is configured to obtain a capacitance value corresponding to each aging time of the plurality of capacitor modules in an aging process; acquiring internal resistance corresponding to the aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure ratio which is reduced to an initial capacity value; obtaining an individual failure parameter corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value; and determining the capacitor failure parameters based on the individual failure parameters corresponding to each capacitor module.
In some embodiments, the supercapacitor life monitoring device is disposed in a pitch controller of the wind turbine generator set.
In a third aspect, an embodiment of the present invention provides a storage medium, where the storage medium stores a computer program, and the computer program, when executed by a processor, implements the method for monitoring the lifetime of a super capacitor in the technical solution of the first aspect.
The embodiment of the invention provides a method and a device for monitoring the service life of a super capacitor and a storage medium, wherein the capacitance value of the super capacitor in a capacitor module is obtained based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period. And acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor, and determining an aging factor capable of representing the influence of aging on the capacitance internal resistance by using the target capacitance internal resistance, the current of the super capacitor and a capacitance failure parameter, so that the service life of the super capacitor after receiving the aging influence is determined, and the monitoring on the service life of the super capacitor is realized.
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The present invention will be better understood from the following description of specific embodiments thereof taken in conjunction with the accompanying drawings, in which like or similar reference characters designate like or similar features.
FIG. 1 is a flow chart of a method for monitoring the lifetime of a super capacitor according to an embodiment of the present invention;
fig. 2 is a structural diagram of a discharge circuit in which a capacitor module is located according to an embodiment of the present invention;
FIG. 3 is a schematic diagram illustrating a discharge curve of a super capacitor according to an embodiment of the present invention;
FIG. 4 is a flow chart of a method for monitoring the lifetime of a super capacitor according to another embodiment of the present invention;
FIG. 5 is a flow chart of a method for monitoring the lifetime of a super capacitor according to another embodiment of the present invention;
FIG. 6 is a block diagram of a super capacitor life monitoring device according to an embodiment of the present invention;
fig. 7 is a block diagram of a super capacitor life monitoring device according to another embodiment of the invention.
Detailed Description
Features and exemplary embodiments of various aspects of the present invention will be described in detail below. In the following detailed description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present invention by illustrating examples of the present invention. The present invention is in no way limited to any specific configuration and algorithm set forth below, but rather covers any modification, replacement or improvement of elements, components or algorithms without departing from the spirit of the invention. In the drawings and the following description, well-known structures and techniques are not shown in order to avoid unnecessarily obscuring the present invention.
The embodiment of the invention provides a method and a device for monitoring the service life of a super capacitor and a storage medium, which can be applied to a scene of monitoring the service life of the super capacitor. For example, in the field of wind power generation, in order to ensure normal operation of a wind turbine generator system and control power output, a pitch control system can perform an emergency pitch retracting function when the wind turbine generator system fails. Under the condition that the power grid is normal, the power grid can supply power to the variable pitch system. When a power grid fails, such as power failure or low voltage ride through, the pitch system needs a backup power supply for supplying power. The super capacitor has the advantages of high power density, high charging speed, long cycle life, wide working temperature range and the like, can be used as a backup power supply to supply power to the pitch system, and is applied to the harsh working environment of the pitch system of the wind generating set.
The super capacitor has a certain charge-discharge cycle life, referred to as life for short. When the service life of the super capacitor is reduced, the capacitance and the stored energy of the super capacitor are also reduced suddenly. With the development of wind power generation technology, the number of wind generating sets is increased sharply, and the time for putting the wind generating sets into operation is gradually prolonged, so that the evaluation of the service life of the super capacitor is more critical and important.
In the embodiment of the invention, the service life duration of the super capacitor is determined by utilizing the capacitance value of the super capacitor, the preset corresponding relation between the capacitance value and the internal resistance of the super capacitor, the current of the super capacitor and the capacitor failure parameter, so as to realize the monitoring of the service life of the super capacitor.
Fig. 1 is a flowchart of a method for monitoring lifetime of a super capacitor according to an embodiment of the present invention. As shown in fig. 1, the method for monitoring the lifetime of a super capacitor may include steps S101 to S104.
In step S101, a capacitance value of a super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period.
The capacitor module comprises a super capacitor or more than two super capacitors connected in series. The working state of the capacitor module comprises a charging state and a discharging state. In the case where the capacitor module is in the charging state, the current of the capacitor module is the charging current of the capacitor module, and specifically, the charging current of the charger that charges the capacitor module can be directly obtained as the charging current of the capacitor module. Under the condition that the capacitor module is in the discharge state, the current of the capacitor module is the discharge current of the capacitor module, specifically, the resistance value of the discharge resistor of the discharge circuit where the capacitor module is located and the voltage of the capacitor module can be obtained, and the discharge current of the capacitor module is obtained according to the resistance value of the discharge resistor of the discharge circuit where the capacitor module is located and the voltage of the capacitor module.
For example, fig. 2 is a structural diagram of a discharge circuit in which a capacitor module is located in an embodiment of the present invention. As shown in fig. 2, the discharge circuit includes a capacitor module C', a contactor switch K1, and a discharge resistor R1. The resistance of the discharge resistor R1 is the resistance of the discharge resistor of the discharge circuit.
The duration of the sampling time period may be set according to a working scene and a working requirement, and is not limited herein. In order to improve the accuracy of the lifetime monitoring, the duration of the sampling period may be set to be longer, for example, 1 to 8 seconds. It should be noted that, when the capacitance value of the super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the resistance value of the power consumption resistor of the working circuit where the capacitor module is located in more than two sampling time periods, the time lengths of the more than two sampling time periods may be the same or different, and are not limited herein.
For a sampling time period, in the sampling time period, the voltage of the capacitor module may be collected for multiple times, and a corresponding relationship between the voltage of the capacitor module and time in the sampling time period, such as a voltage curve graph, may also be obtained, specifically, a charging curve graph of the super capacitor or a discharging curve graph of the super capacitor, and the like.
For example, fig. 3 is a schematic diagram of a discharge curve of a super capacitor in an embodiment of the present invention. As shown in fig. 3, the abscissa is time and the ordinate is voltage. The discharge curve shown in fig. 3 can refer to the discharge circuit shown in fig. 2, and the discharge curve in fig. 3 is the discharge curve of the capacitor module in fig. 2. As can be seen from fig. 3, during the discharging process of the capacitor module, the voltage of the capacitor module is continuously decreased, and the voltage decrease rate of the capacitor module is also continuously decreased. And the discharge current of the capacitor module can be obtained by utilizing the voltage of the capacitor module and the resistance value of the discharge resistor of the discharge circuit where the capacitor module is positioned in the sampling time period. The capacitance value of the capacitor module can be obtained by using the voltage of the capacitor module and the discharge current of the capacitor module. And obtaining the capacitance value of the super capacitor in the capacitor module according to the capacitance value of the capacitor module.
In step S102, a target capacitance internal resistance corresponding to the capacitance value of the super capacitor is obtained from the preset correspondence between the capacitance value and the internal resistance of the super capacitor.
Through experiments on the plurality of capacitor modules, the corresponding relation between the capacitance value and the internal resistance of the super capacitor is obtained and used as the corresponding relation between the capacitance value and the internal resistance of the preset super capacitor. And obtaining relevant factory parameters of different capacitor modules through large-range sampling, and obtaining the corresponding relation between the capacitance value and the internal resistance of the super capacitor as the corresponding relation between the capacitance value and the internal resistance of the preset super capacitor. Other ways of obtaining the corresponding relationship between the capacitance value and the internal resistance of the preset super capacitor are also within the protection scope of the embodiment of the invention.
The preset corresponding relationship between the capacitance value and the internal resistance of the super capacitor includes at least one group of capacitance value and internal resistance of the corresponding super capacitor, and the internal resistance corresponding to the capacitance value of the super capacitor obtained in step S101 in the corresponding relationship is the target capacitor internal resistance.
In step S103, an aging factor is determined using the target internal resistance of the capacitor, the current of the super capacitor, and the capacitor failure parameter.
The aging factor is used for representing the influence of aging on the internal resistance of the capacitor. The capacitance failure parameter is related to the voltage achievable by the supercapacitor failure. In embodiments of the present invention, capacitance failure is considered to be related to aging. Therefore, an aging factor can be obtained by using the capacitance failure parameter, the target capacitance content and the current of the super capacitor.
The current of the super capacitor is the current flowing through the super capacitor. Taking the super capacitor in the discharging state as an example, the current of the super capacitor may be the discharging current. For example, if the super capacitor discharges with a constant current and the discharge current is 5A (i.e., amperes), the current of the super capacitor is 5A.
In step S104, the lifetime duration of the super capacitor corresponding to the aging factor is determined according to the aging factor.
The aging factor is related to the capacitance value of the super capacitor, the accelerated aging time and the service life duration, namely the normal working duration. Therefore, the life duration of the super capacitor corresponding to the aging factor can be determined according to the aging chair.
After the service life duration of the super capacitor is obtained, if the operation duration of the super capacitor is greater than or equal to the service life duration of the super capacitor, the super capacitor is possibly out of service; if the running time of the super capacitor is shorter than the service life of the super capacitor, the super capacitor can be continuously used normally. And the obtained difference value between the service life duration of the super capacitor and the operation duration of the super capacitor is the remaining service life duration of the super capacitor.
In the embodiment of the invention, the capacitance value of the super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period. And acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor, and determining an aging factor capable of representing the influence of aging on the capacitance internal resistance by using the target capacitance internal resistance, the current of the super capacitor and a capacitance failure parameter, so that the service life of the super capacitor after receiving the aging influence is determined, and the monitoring on the service life of the super capacitor is realized.
In addition, in the process of monitoring the service life of the super capacitor in the embodiment of the invention, for the super capacitor, the influence of the process variables such as the charging and discharging times and the temperature of the super capacitor is not required to be concerned, but the capacitance value of the super capacitor is concerned, so that the monitoring of the service life of the super capacitor is simplified. The method for monitoring the service life of the super capacitor is suitable for super capacitors with different voltage levels, can also be applied to the super capacitor in a charging process or a discharging process, and has wider applicability. Because the super-capacitor life monitoring method in the embodiment of the invention is simpler, the performance requirements on components such as a controller or a processor for executing the super-capacitor life monitoring method are lower, the miniaturization of devices, equipment and the like for realizing the super-capacitor life monitoring method is facilitated, and the cost of the devices, equipment and the like for realizing the super-capacitor life monitoring method can be reduced.
FIG. 4 is a flowchart illustrating a method for monitoring lifetime of a super capacitor according to another embodiment of the present invention. Fig. 4 is different from fig. 1 in that step S101 shown in fig. 1 can be subdivided into step S1011 to step S1013 shown in fig. 4; step S103 shown in fig. 1 may be subdivided into step S1031 and step S1032 shown in fig. 4; step S104 shown in fig. 1 can be subdivided into step S1041 and step S1042 shown in fig. 4.
In step S1011, a first product of the current of the capacitor module at the middle of the sampling period and the duration of the sampling period is calculated.
In step S1012, a capacitance value of the capacitor module is determined according to a first quotient of the first product and a voltage variation of the capacitor module during the sampling period.
Under the condition that the super capacitor is in a working state, the change of the voltage curve of the super capacitor has a certain rule. For example, when the super capacitor is in a charging state, the voltage of the super capacitor gradually rises; under the condition that the super capacitor is in a discharging state, the voltage of the super capacitor gradually decreases. It should be noted that the voltage curve of the super capacitor may fluctuate and jump to some extent.
In the embodiment of the present invention, the current of the capacitor module is calculated by using a median method, and the following description will take an example that a super capacitor in the capacitor module is in a discharging state.
For example, the discharge curve of the battery module is shown in fig. 3, the discharge curve can be divided into a large number of segments, and the curve in each segment can be approximately regarded as a straight line. For example, the time period between the time t1 and the time tn is a sampling time period, the curve corresponding to the time period between the time t1 and the time tn is approximately regarded as a straight line, and the following formula (1) can be obtained according to the characteristics of the straight line equation:
Utn+Ut1＝Utn-1+Ut2＝Utn-2+Ut3＝2×(Utn/2) (1)
wherein, Ut1Is the voltage of the capacitor module at time t1, Ut2Is the voltage of the capacitor module at time t2, Ut3Is the voltage of the capacitor module at time t3, Utn/2For the voltage of the capacitor module at time tn/2, Utn-2For the voltage of the capacitor module at time tn-2, Utn-1For the voltage of the capacitor module at time tn-1, UtnThe voltage of the capacitor module at time tn.
It can be obtained that the voltage of the capacitor module at the middle time of the sampling time period is approximately equal to the average voltage value in the sampling time period. Because the resistance value of the discharge resistor in the discharge circuit where the capacitor module is located is fixed, the current of the capacitor module at the middle moment of the sampling time period is approximately equal to the current mean value in the sampling time period, and therefore the accuracy of current measurement of the capacitor module in the capacitance value calculation process of the capacitor module can be improved.
According to steps S1011 to S1013, the capacitance value of the capacitor module can be obtained according to equation (2):
C’＝(I×t)/ΔU＝(U×t)/(ΔU×R1) (2)
wherein C' is the capacitance value of the capacitor module, I is the current of the capacitor module at the middle moment of the sampling time period, t is the duration of the sampling time period, Delta U is the voltage variation of the capacitor module in the sampling time period, U is the voltage of the capacitor module at the middle moment of the sampling time period, and R1Is the resistance value of the discharge resistor of the discharge circuit where the capacitor module is located.
It should be noted that the duration of the sampling time period may be set longer, for example, the duration of the sampling time period may be in a range of 1 to 8 seconds, so that Δ U in the above equation becomes larger, and the influence of voltage fluctuation when the capacitor module is in a working state is reduced, thereby improving the measurement accuracy of the capacitance value of the capacitor module.
In some examples, an average value of the first quotient values over a plurality of sampling periods may be calculated as the capacitance value of the capacitive module. And the first quotient in each sampling time period is the capacitance value of the capacitance module in the sampling time period. The average value of the capacitance values of the capacitor modules in a plurality of sampling time periods is used as the capacitance value of the capacitor module participating in subsequent calculation, so that the accuracy of the service life of the obtained super capacitor is further improved. The time interval of the plurality of sampling time periods cannot be too long, so that the accuracy of the obtained service life of the super capacitor is not influenced.
For example, the average value of the first quotient values in two adjacent sampling time periods can be used as the capacitance value of the capacitance module. Specifically, for example, three time points in chronological order are time point t1, time point t2, and time point t3, respectively. Before the capacitance value of the capacitor module is measured for the first time, the measurement count and the capacitance value accumulation are initialized and cleared. When the time reaches the time t1, the first measurement of the capacitance value of the capacitor module is started, the time is ended at the time t2, the first measurement of the capacitance value of the capacitor module is ended, the measurement count is increased by one, and the capacitance value is accumulated and increased by the capacitance value measured for the first time. I.e., the time period between time t1 and time t2, is the first sampling time period. However, when the time reaches the time t2, the second measurement of the capacitance value of the capacitor module is started, and when the time reaches the time t3, the second measurement of the capacitance value of the capacitor module is ended, the measurement count is increased by one, and the capacitance value is cumulatively increased by the capacitance value measured for the second time. I.e., the time period between time t2 and time t3, is the second sampling time period. The quotient of the capacitance accumulation and the measurement count is the average value of the capacitance of the capacitor module in the first sampling time period and the capacitance of the capacitor module in the second sampling time period.
In other examples, the first quotient value in one sampling period is used as the capacitance value of the capacitance module. If only the first quotient value in one sampling time period is calculated, the first quotient value in the sampling time period can be directly used as the capacitance value of the capacitance module. If the first quotient values in the multiple sampling time periods are calculated, the first quotient value in any sampling time period can be selected as the capacitance value of the capacitor module, or the first quotient value in one of the sampling time periods can be selected as the capacitance value of the capacitor module according to a certain rule. For example, the first quotient with the middle magnitude in the plurality of sampling time periods is selected as the capacitance value of the capacitive module, which is not limited herein.
In step S1013, the capacitance value of the super capacitor in the capacitor module is determined based on the capacitance value of the capacitor module.
If the capacitor module comprises a super capacitor, the capacitance value of the capacitor module can be used as the capacitance value of the super capacitor. If the capacitor module comprises N series-connected super capacitors, the capacitance value of the super capacitor is N times of that of the capacitor module.
In step S1031, a second quotient of the capacitance failure parameter and the current of the super capacitor is calculated.
In step S1032, an aging factor is determined according to a difference between the second quotient and the target capacitance internal resistance.
In step S1041, a second product of the aging factor and the capacitance value of the super capacitor is calculated.
In step S1042, the lifetime duration of the super capacitor corresponding to the aging factor is determined by using the second product and a preset aging time conversion coefficient.
The capacitor module can be applied in a pulse scene. It should be noted that, in a scenario where the instantaneous current is large, a super capacitor with low internal Resistance (ESR) may be selected to reduce the voltage drop, and in a scenario where a small current is applied, a super capacitor with a large capacity may be selected to reduce the voltage drop.
For example, in a pulse scenario, the relationship between the difference between the initial operating voltage and the cut-off operating voltage of the super capacitor, the aging factor of the super capacitor, the current of the super capacitor, and the internal resistance of the super capacitor is shown in equation (3):
V＝I(R+T×a/c) (3)
v is the difference value between the initial working voltage and the cut-off working voltage of the super capacitor, I is the current of the super capacitor, R is the internal resistance of the super capacitor, T multiplied by a/c is the aging factor of the super capacitor, T is the normal working time of the super capacitor, namely the service life of the super capacitor, a is the aging time conversion coefficient between the accelerated aging time of the super capacitor and the service life of the super capacitor, and c is the capacitance value of the super capacitor.
Under the influence of aging, the difference between the actual working voltage and the cut-off working voltage of the super capacitor is reduced. In some examples, the off operating voltage is 0V. The capacitance failure parameter is related to the voltage achievable by the supercapacitor failure. Therefore, the relationship among the capacitor failure parameter, the difference between the initial operating voltage and the cut-off operating voltage of the super capacitor, the aging factor of the super capacitor, the current of the super capacitor and the internal resistance of the super capacitor is shown as equation (4):
I(R+T×a/c)＞M (4)
where M is a capacitance failure parameter, and the physical meaning of other parameters in equation (4) can be found in equation (3).
From the above equation (4), equation (5) for the lifetime of the supercapacitor can be obtained:
T＞(M/I-R)×c/a (5)
it should be noted that the capacitance value of the super capacitor calculated in step S1014 may not be used to determine the lifetime duration of the super capacitor, and the capacitance value of the capacitor module obtained in step S1013 may be used to determine the lifetime duration of the super capacitor. If the capacitor module comprises N super capacitors connected in series, the capacitance value of the capacitor module is equal to 1/N of the capacitance value of the super capacitor, and the internal resistance of the capacitor module is equal to N times of the internal resistance of the super capacitor. Correspondingly, the capacitor failure parameter corresponding to the capacitor module is N times of the capacitor failure parameter corresponding to the super capacitor. Substituting the capacitance value of the capacitor module, the internal resistance of the capacitor module and the capacitor failure parameter corresponding to the capacitor module into the above equation (5) can eliminate N, and can still adopt the equation (5) to calculate.
FIG. 5 is a flowchart illustrating a method for monitoring lifetime of a super capacitor according to another embodiment of the present invention. Fig. 5 is different from fig. 1 in that the method for monitoring the lifetime of the super capacitor shown in fig. 5 may further include steps S105 to S110.
In step S105, capacitance values and internal resistances corresponding to aging times of the plurality of capacitor modules during the aging process are obtained.
The aging experiment can be carried out on a plurality of capacitor modules, and the capacitance value and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process are obtained. For example, the following table one shows capacitance values, internal resistances, capacitance value changes, internal resistance changes, and differences between the initial operating voltage and the cut-off operating voltage of the super capacitor (referred to as voltage differences in table one) corresponding to different aging times of the four capacitor modules in the aging process.
Watch 1
The capacitor module comprises four capacitor modules, namely a module 1, a module 2, a module 3 and a module 4.
In step S106, a fitting algorithm is adopted according to the capacitance value and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process to obtain a fitting curve of the capacitance value and the internal resistance of the super capacitor, and the fitting curve is used as a preset corresponding relationship between the capacitance value and the internal resistance of the super capacitor.
For example, according to the capacitance value and the internal resistance corresponding to each aging time of the capacitor module in the first table in the aging process, a fitting curve of the capacitance value and the internal resistance of the super capacitor is obtained through fitting, and the fitting curve represents the corresponding relation between the capacitance value and the internal resistance of the super capacitor. According to the capacity value and the internal resistance in the first table, the expression of the fitting curve obtained by fitting is shown as equation (6):
R＝(A-D)/[1+(c/C)B]+D (6)
wherein R is the internal resistance of the super capacitor, c is the capacitance value of the super capacitor, and A, B, C and D are constant coefficients. According to the data in table one, a-0.72453215178867, B-13.7344879830501, C-2695.84379114985 and D-0.102391229153561 can be calculated. According to the result of the fitting curve, the fitting precision is 0.95, the fitting curve is high in precision, and therefore the service life duration of the super capacitor obtained through service life monitoring is more accurate.
It should be noted that in some fields, such as the field of wind power generation, due to the limitations of the device precision and the sampling precision, it is difficult to detect the internal resistance of the super capacitor on line. Because the number of the wind generating sets is large, the workload of detaching the super capacitor from the wind generating set for detection is huge, and the workload of installing the super capacitor to the wind generating set is also huge. Therefore, it is not practical to detect the internal resistance of the super capacitor offline.
In the embodiment of the invention, the target capacitor internal resistance corresponding to the super capacitor is determined by using the fitting curve obtained by fitting, on one hand, the requirement on the detection precision of equipment is not high, and on the other hand, the super capacitor does not need to be disassembled and re-assembled, thereby greatly reducing the workload.
In step S107, capacitance values corresponding to aging times of the plurality of capacitor modules during the aging process are obtained.
In step S108, the internal resistance corresponding to the aging failure capacitance value of each capacitor module is obtained.
Wherein the aging failure capacity value is a capacity value of the failure ratio which is reduced to the initial capacity value. The failure percentage may be set according to a working scene and a working requirement, and is not limited herein. For example, if the failure percentage is 80%, the super capacitor is considered to be likely to fail when the capacitance value of the super capacitor is reduced to 80% of the initial capacitance value. As can be seen from Table I, the tolerance of the module 1, the module 2, the module 3 and the module 4 at the aging time of 779.5 hours is the aging failure tolerance.
In step S109, an individual failure parameter corresponding to each capacitor module is obtained according to the aging failure capacitance value of each capacitor module and the internal resistance corresponding to the aging failure capacitance value.
And calculating the difference value between the initial working voltage and the cut-off working voltage corresponding to each capacitor module by using the aging failure capacity value of the capacitor module and the internal resistance corresponding to the aging failure capacity value to serve as the individual failure parameter corresponding to each capacitor module.
For example, as can be seen from table one, the individual failure parameters corresponding to module 1, module 2, module 3, and module 4 are 4.148751526, 4.219895806, 4.127009028, and 4.574356112, respectively.
In step S110, a capacitance failure parameter is determined based on the individual failure parameter corresponding to each capacitance module.
Wherein, a value can be selected as the capacitance failure parameter within a value range determined according to each individual failure parameter. For example, from the individual failure parameters in table one, 4.5 may be selected as the capacitance failure parameter.
It should be noted that, if the capacitor module includes a super capacitor, the capacitor failure parameter of the capacitor module can be used as the capacitor failure parameter of the super capacitor. If the capacitor module comprises N super capacitors connected in series, the capacitor failure parameter of the capacitor module is N times of the capacitor failure parameter of the super capacitors.
And obtaining a plurality of individual failure parameters according to the aging failure capacitance values of the plurality of capacitor modules along with the shadow and the resistance corresponding to the aging failure capacitance values. And determining a capacitance failure parameter according to the plurality of individual failure parameters. The capacitor failure parameters are consistent, so that the service life duration of the super capacitor obtained in the embodiment of the invention is more accurate.
Fig. 6 is a block diagram of a super capacitor life monitoring device according to an embodiment of the invention. As shown in fig. 6, the super capacitor life monitoring apparatus 200 may include a capacitance value obtaining module 201, an internal resistance obtaining module 202, an aging factor determining module 203, and a life determining module 204.
The capacitance value obtaining module 201 is configured to obtain a capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period.
The capacitor module comprises a super capacitor or more than two super capacitors connected in series.
The internal resistance obtaining module 202 is configured to obtain a target capacitance internal resistance corresponding to a capacitance value of the super capacitor from a preset correspondence between the capacitance value and the internal resistance of the super capacitor.
And the aging factor determining module 203 is used for determining an aging factor by using the target internal resistance of the capacitor, the current of the super capacitor and the capacitor failure parameter.
The aging factor is used for representing the influence of aging on the internal resistance of the capacitor.
And the life determining module 204 determines the life duration of the super capacitor corresponding to the aging factor according to the aging factor.
In the embodiment of the invention, the capacitance value of the super capacitor in the capacitor module is obtained based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period. And acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor, and determining an aging factor capable of representing the influence of aging on the capacitance internal resistance by using the target capacitance internal resistance, the current of the super capacitor and a capacitance failure parameter, so that the service life of the super capacitor after receiving the aging influence is determined, and the monitoring on the service life of the super capacitor is realized.
In some examples, the capacitance value obtaining module 201 may be specifically configured to: for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle moment of the sampling time period and the duration of the sampling time period; determining the capacitance value of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period; and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
Specifically, the capacity value obtaining module 201 may be further configured to: calculating the average value of the first quotient values in a plurality of sampling time periods to serve as the capacitance value of the capacitor module; or, the first quotient value in one sampling time period is used as the capacitance value of the capacitor module.
In some examples, the aging factor determination module 203 may be specifically configured to: calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor; and determining an aging factor according to the difference value of the second quotient and the target capacitance internal resistance.
In some examples, the lifetime determination module 204 may be specifically configured to: calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor; and determining the service life duration of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
Fig. 7 is a block diagram of a super capacitor life monitoring device according to another embodiment of the invention. Fig. 7 differs from fig. 6 in that the supercapacitor life monitoring device shown in fig. 7 may further include a fitting module 205 and a failure parameter determination module 206.
The fitting module 205 is configured to obtain capacitance values and internal resistances corresponding to aging times of the plurality of capacitor modules in an aging process; and obtaining a fitting curve of the capacitance value and the internal resistance of the super capacitor by adopting a fitting algorithm according to the capacitance value and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, and taking the fitting curve as a preset corresponding relation between the capacitance value and the internal resistance of the super capacitor.
A failure parameter determining module 206, configured to obtain a capacitance value corresponding to each aging time of the multiple capacitor modules in the aging process; acquiring internal resistance corresponding to the aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure ratio which is reduced to an initial capacity value; obtaining an individual failure parameter corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value; and determining the capacitor failure parameters based on the individual failure parameters corresponding to each capacitor module.
In some examples, the supercapacitor life monitoring device 200 described above may be provided in a pitch controller of a wind turbine generator set to monitor the life duration of a supercapacitor in a pitch system of the wind turbine generator set.
The embodiment of the present invention further provides a storage medium, where a computer program is stored on the storage medium, and when the computer program is executed by a processor, the processes of the embodiment of the method for monitoring the lifetime of a super capacitor in the foregoing embodiment are implemented, and the same technical effect can be achieved, and in order to avoid repetition, details are not described here again. The storage medium may include a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk, and the like, but is not limited thereto.
It should be clear that the embodiments in this specification are described in a progressive manner, and the same or similar parts in the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. For apparatus embodiments and storage medium embodiments, reference may be made to the description of the method embodiments for their relevance. The present invention is not limited to the specific steps and structures described above and shown in the drawings. Those skilled in the art may make various changes, modifications and additions or change the order between the steps after appreciating the spirit of the invention. Also, a detailed description of known process techniques is omitted herein for the sake of brevity.
It will be appreciated by persons skilled in the art that the above embodiments are illustrative and not restrictive. Different features which are present in different embodiments may be combined to advantage. Other variations to the disclosed embodiments can be understood and effected by those skilled in the art upon studying the drawings, the specification, and the claims. In the claims, the term "comprising" does not exclude other means or steps; the indefinite article "a" does not exclude a plurality; the terms "first" and "second" are used to denote a name and not to denote any particular order. Any reference signs in the claims shall not be construed as limiting the scope. The functions of the various parts appearing in the claims may be implemented by a single hardware or software module. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage.
Claims (10)
1. A super capacitor life monitoring method is characterized by comprising the following steps:
obtaining the capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series;
acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor in a preset corresponding relation between the capacitance value and the internal resistance of the super capacitor;
determining an aging factor by using the target capacitance internal resistance, the current of the super capacitor and the capacitance failure parameter, wherein the aging factor is used for representing the influence of aging on the capacitance internal resistance;
and determining the service life duration of the super capacitor corresponding to the aging factor according to the aging factor.
2. The method of claim 1, wherein obtaining the capacitance value of the super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling period comprises:
for each sampling time period, calculating to obtain a first product of the current of the capacitor module at the middle moment of the sampling time period and the duration of the sampling time period;
determining the capacitance value of the capacitor module according to the first product and a first quotient of the voltage variation of the capacitor module in the sampling time period;
and determining the capacitance value of the super capacitor in the capacitor module based on the capacitance value of the capacitor module.
3. The method of claim 2, wherein determining the capacitance value of the capacitive module according to a first quotient of the first product and a voltage change of the capacitive module over the sampling period comprises:
calculating an average value of the first quotient values in the plurality of sampling time periods to serve as a capacitance value of the capacitance module;
alternatively, the first and second electrodes may be,
and taking the first quotient value in one sampling time period as the capacitance value of the capacitance module.
4. The method of claim 1, wherein determining an aging factor using the target internal capacitance resistance, the current of the super-capacitor, and the capacitance failure parameter comprises:
calculating to obtain a second quotient of the capacitor failure parameter and the current of the super capacitor;
and determining the aging factor according to the difference value between the second quotient and the target capacitance internal resistance.
5. The method of claim 1, wherein determining the age of the supercapacitor corresponding to the aging factor based on the aging factor comprises:
calculating to obtain a second product of the aging factor and the capacitance value of the super capacitor;
and determining the service life duration of the super capacitor corresponding to the aging factor by using the second product and a preset aging time conversion coefficient.
6. The method of claim 1, further comprising:
acquiring capacitance values and internal resistances corresponding to aging time of the plurality of capacitor modules in an aging process;
and obtaining a fitting curve of the capacitance value and the internal resistance of the super capacitor by adopting a fitting algorithm according to the capacitance value and the internal resistance corresponding to each aging time of the plurality of capacitor modules in the aging process, and taking the fitting curve as a preset corresponding relation of the capacitance value and the internal resistance of the super capacitor.
7. The method of claim 1, further comprising:
acquiring a capacitance value corresponding to each aging time of the plurality of capacitor modules in the aging process;
acquiring internal resistance corresponding to an aging failure capacity value of each capacitor module, wherein the aging failure capacity value is a capacity value of failure ratio which is reduced to an initial capacity value;
obtaining an individual failure parameter corresponding to each capacitor module according to the aging failure capacity value of each capacitor module and the internal resistance corresponding to the aging failure capacity value;
and determining the capacitor failure parameters based on the individual failure parameters corresponding to each capacitor module.
8. A supercapacitor life monitoring device, comprising:
the capacitance value acquisition module is used for obtaining the capacitance value of a super capacitor in the capacitor module based on the voltage of the capacitor module and the current of the capacitor module in at least one sampling time period, wherein the capacitor module comprises one super capacitor or more than two super capacitors connected in series;
the internal resistance acquisition module is used for acquiring a target capacitance internal resistance corresponding to the capacitance value of the super capacitor in a preset corresponding relation between the capacitance value and the internal resistance of the super capacitor;
the aging factor determining module is used for determining an aging factor by using the target capacitance internal resistance, the current of the super capacitor and the capacitance failure parameter, wherein the aging factor is used for representing the influence of aging on the capacitance internal resistance;
and the service life determining module is used for determining the service life duration of the super capacitor corresponding to the aging factor according to the aging factor.
9. The apparatus of claim 8, wherein the supercapacitor life monitoring device is disposed in a pitch controller of a wind turbine generator set.
10. A storage medium, characterized in that the storage medium stores a computer program which, when executed by a processor, implements the supercapacitor life monitoring method according to any one of claims 1 to 7.
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| CN113406407A (en) * | 2021-05-10 | 2021-09-17 | 中车青岛四方机车车辆股份有限公司 | Auxiliary power supply support capacitance monitoring method and system |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140062200A1 (en) * | 2012-08-30 | 2014-03-06 | Honeywell International Inc. | Capacitive power system having a service life extending approach |
| CN106802371A (en) * | 2015-11-25 | 2017-06-06 | 中船重工(重庆)海装风电设备有限公司 | A kind of health status monitoring method of super capacitor, system and Wind turbines |
| CN107860979A (en) * | 2017-09-11 | 2018-03-30 | 宁波中车新能源科技有限公司 | A kind of test super capacitor energy storage system capacity, the method and system of internal resistance |
| CN108008201A (en) * | 2017-11-21 | 2018-05-08 | 新疆金风科技股份有限公司 | The Forecasting Methodology and device of capacitor remaining life |
| CN108414856A (en) * | 2018-02-26 | 2018-08-17 | 南方电网科学研究院有限责任公司 | The lifetime estimation method and device of the submodule capacitor of modularization multi-level converter |
| CN108918968A (en) * | 2018-03-30 | 2018-11-30 | 金卡智能集团股份有限公司 | Super capacitor DC internal resistance test method, switching time algorithm and readable medium |
| CN109085428A (en) * | 2018-08-22 | 2018-12-25 | 广东电网有限责任公司 | Supercapacitor internal resistance measuring method, device and computer readable storage medium |
| CN109307821A (en) * | 2018-11-30 | 2019-02-05 | 广东电网有限责任公司 | A kind of ageing properties test method of supercapacitor |
| CN109586318A (en) * | 2018-12-27 | 2019-04-05 | 武汉世纪精能科技发展有限公司 | Reactive-load compensation method, user equipment, storage medium and device |
| CN110008558A (en) * | 2019-03-28 | 2019-07-12 | 江苏理工学院 | Supercapacitor service life On-line Estimation method |
| CN110031705A (en) * | 2019-04-29 | 2019-07-19 | 西安特锐德智能充电科技有限公司 | Electrochemical capacitor life monitoring method, device, electronic equipment and storage medium |
-
2019
- 2019-09-02 CN CN201910821940.XA patent/CN112444677B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20140062200A1 (en) * | 2012-08-30 | 2014-03-06 | Honeywell International Inc. | Capacitive power system having a service life extending approach |
| CN106802371A (en) * | 2015-11-25 | 2017-06-06 | 中船重工(重庆)海装风电设备有限公司 | A kind of health status monitoring method of super capacitor, system and Wind turbines |
| CN107860979A (en) * | 2017-09-11 | 2018-03-30 | 宁波中车新能源科技有限公司 | A kind of test super capacitor energy storage system capacity, the method and system of internal resistance |
| CN108008201A (en) * | 2017-11-21 | 2018-05-08 | 新疆金风科技股份有限公司 | The Forecasting Methodology and device of capacitor remaining life |
| CN108414856A (en) * | 2018-02-26 | 2018-08-17 | 南方电网科学研究院有限责任公司 | The lifetime estimation method and device of the submodule capacitor of modularization multi-level converter |
| CN108918968A (en) * | 2018-03-30 | 2018-11-30 | 金卡智能集团股份有限公司 | Super capacitor DC internal resistance test method, switching time algorithm and readable medium |
| CN109085428A (en) * | 2018-08-22 | 2018-12-25 | 广东电网有限责任公司 | Supercapacitor internal resistance measuring method, device and computer readable storage medium |
| CN109307821A (en) * | 2018-11-30 | 2019-02-05 | 广东电网有限责任公司 | A kind of ageing properties test method of supercapacitor |
| CN109586318A (en) * | 2018-12-27 | 2019-04-05 | 武汉世纪精能科技发展有限公司 | Reactive-load compensation method, user equipment, storage medium and device |
| CN110008558A (en) * | 2019-03-28 | 2019-07-12 | 江苏理工学院 | Supercapacitor service life On-line Estimation method |
| CN110031705A (en) * | 2019-04-29 | 2019-07-19 | 西安特锐德智能充电科技有限公司 | Electrochemical capacitor life monitoring method, device, electronic equipment and storage medium |
Non-Patent Citations (1)
| Title |
|---|
| 顾帅等: "超级电容器老化特征与寿命测试研究展望", 《中国电机工程学报》 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113406407A (en) * | 2021-05-10 | 2021-09-17 | 中车青岛四方机车车辆股份有限公司 | Auxiliary power supply support capacitance monitoring method and system |
| CN113406407B (en) * | 2021-05-10 | 2022-05-10 | 中车青岛四方机车车辆股份有限公司 | Auxiliary power supply support capacitance monitoring method and system |
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