CN112433941A - Test analysis method, device, equipment and storage medium - Google Patents
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Abstract
The present disclosure provides a test analysis method, apparatus, device and storage medium, wherein the method comprises: acquiring a reference test index matched with a target test object from a pre-stored test index library; acquiring index correction information corresponding to the reference test index; generating a target test index of a target test object according to the reference test index and the index correction information; acquiring a target test case corresponding to a target test index; acquiring test data of a target test object based on the target test index and the target test case; and obtaining a test analysis result of the target test object based on the test data of the target test object and the test analysis standard corresponding to the target test index. The method and the device can improve the processing efficiency of the test analysis process, effectively reduce the labor time cost and improve the user experience.
Description
Technical Field
The present disclosure relates to the field of computer technologies, and in particular, to a test analysis method, apparatus, device, and storage medium.
Background
The test analysis project flow generally involves multiple stages of defining test objects, determining test indexes, compiling test cases, performing tests, analyzing results, and the like, and each stage requires a defined output, such as test indexes, test cases, and analysis results (e.g., scoring results, test object ordering, and the like). At present, each stage of a traditional test analysis project usually adopts manual operation, such as index specification, case writing and the like, and has the defects of low processing efficiency, high time cost, incapability of ensuring test integrity and analysis result accuracy and the like. For example, in a large project such as type-selection test analysis, hundreds of test case documents and various analysis evaluation standards may be involved, and manual document editing and result analysis consumes a lot of manpower and time, and is prone to generating problems such as index, document omission and analysis result error.
Therefore, it is desirable to provide an improved test analysis scheme to solve the above problems, improve the efficiency of test analysis, and reduce the labor time cost.
Disclosure of Invention
The present disclosure provides a test analysis method, device, apparatus, and storage medium, which can improve the processing efficiency of the test analysis process, effectively reduce the labor time cost, and improve the user experience.
In one aspect, the present disclosure provides a test analysis method, the method comprising:
acquiring a reference test index matched with a target test object from a pre-stored test index library;
acquiring index correction information corresponding to the reference test index;
generating a target test index of the target test object according to the reference test index and the index correction information;
acquiring a target test case corresponding to the target test index;
acquiring test data of a target test object based on the target test index and the target test case;
and obtaining a test analysis result of the target test object based on the test data of the target test object and the test analysis standard corresponding to the target test index.
In another aspect, the present disclosure provides a test assay device, the device comprising:
an index acquisition module: the device comprises a test target database, a reference test index database and a target test index database, wherein the test target database is used for storing a target test target;
a correction information acquisition module: the index correction information is used for acquiring index correction information corresponding to the reference test index;
an index generation module: the target test index of the target test object is generated according to the reference test index and the index correction information;
a use case acquisition module: the target test case is used for acquiring a target test case corresponding to the target test index;
a data acquisition module: the test data of the target test object is obtained based on the target test index and the target test case;
an analysis module: and the test analysis result of the target test object is obtained based on the test data of the target test object and the test analysis standard corresponding to the target test index.
In another aspect, the present disclosure provides a computer-readable storage medium having at least one instruction or at least one program stored therein, the at least one instruction or at least one program being loaded and executed by the processor to implement the test analysis method as described above.
In another aspect, the present disclosure provides a test analysis apparatus comprising a processor and a memory, wherein at least one instruction or at least one program is stored in the memory, and the at least one instruction or the at least one program is loaded and executed by the processor to implement the test analysis method as described above.
The test analysis method, the test analysis device, the test analysis equipment and the storage medium have the following technical effects:
the method comprises the steps of obtaining a reference test index matched with a target test object from a pre-stored test index library, generating a target test index according to the reference test index and corresponding index correction information, improving automation of an index designation process by using pre-stored resources in the test index library, then obtaining a target test case corresponding to the target test index to implement testing and obtain test data, analyzing the test data based on a test analysis standard corresponding to the target test index to obtain a test analysis result, and effectively improving automation degree of a test case generation process and an analysis process. The scheme disclosed by the invention can improve the processing efficiency of the test analysis process, effectively reduce the labor time cost and improve the user experience.
Drawings
In order to more clearly illustrate the embodiments of the present disclosure or the technical solutions and advantages of the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present disclosure, and other drawings can be obtained by those skilled in the art without inventive efforts.
FIG. 1 is a schematic diagram of an application environment provided by an embodiment of the present disclosure;
FIG. 2 is a table structure of a database in a test analysis system provided by an embodiment of the present disclosure;
FIG. 3 is a schematic flow chart diagram of a test analysis method provided by an embodiment of the present disclosure;
FIG. 4 is an index management interface of the type-selection test analysis system provided by the embodiments of the present disclosure;
FIG. 5 is a user management interface of a type-selection test analysis system provided by an embodiment of the present disclosure;
FIG. 6 is a test case interface of the type-selection test analysis system provided by an embodiment of the present disclosure;
FIG. 7 is a schematic diagram of a test case document provided by an embodiment of the present disclosure;
FIG. 8 is a schematic structural diagram of a test analysis apparatus provided in an embodiment of the present disclosure;
fig. 9 is a schematic structural diagram of a test analysis apparatus according to an embodiment of the present disclosure.
Detailed Description
The technical solutions in the embodiments of the present disclosure will be clearly and completely described below with reference to the drawings in the embodiments of the present disclosure, and it is obvious that the described embodiments are only a part of the embodiments of the present disclosure, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without making any creative effort, shall fall within the protection scope of the present disclosure.
It should be noted that the terms "first," "second," and the like in the description and claims of the present disclosure and in the above-described drawings are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the disclosure described herein are capable of operation in sequences other than those illustrated or otherwise described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or server that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Referring to fig. 1, fig. 1 is a schematic diagram of an application environment according to an embodiment of the present application, and as shown in fig. 1, the application environment includes at least two network nodes, namely a terminal device 01 and a server 02.
In the embodiment of the present disclosure, the terminal device 01 may be configured to perform human-computer interaction with a user, display information related to test analysis to the user, and receive one or more user instructions, for example, receive a correction operation instruction of the user on a reference test index. Specifically, the terminal device 01 may be an electronic device having a display device, such as a notebook computer, a desktop computer, an intelligent display, a tablet computer, a smart phone, a digital assistant, or an intelligent wearable device.
In practical application, the terminal device 01 may be configured to display a platform interface of the test analysis system, and implement information display and human-computer interaction related to test analysis through the platform interface.
In the embodiment of the present disclosure, the server 02 may be configured to provide a database storing data required for test analysis, where the required data may include, but is not limited to, a test case library, a test index library, a test object library, and the like. The server 02 may be an independent physical server, a server cluster or a distributed system formed by a plurality of physical servers, or a cloud server providing basic cloud computing services such as a cloud service, a cloud database, cloud computing, a cloud function, cloud storage, a Network service, cloud communication, a middleware service, a domain name service, a security service, a CDN (Content Delivery Network), a big data and artificial intelligence platform.
In practical applications, the reference test indicator may be pre-stored in the test indicator library, and the server 02 may obtain one or more user instructions and generate the reference test indicator obtaining trigger event in response to the one or more user instructions. Alternatively, the reference test index may include, but is not limited to, a reference test function, a reference test performance, a reference test reliability, and the like. The one or more user instructions include, but are not limited to, at least one of a key press, a click, a swipe, a gesture.
In the embodiment of the present disclosure, the terminal device 01 and the server 02 may be directly or indirectly connected through a wired or wireless communication manner, and the present application is not limited herein.
In the embodiment of the present disclosure, the test analysis method of the present disclosure may be implemented by a test analysis system. The system architecture of the test analysis system may include at least a display layer, a data layer, and a control layer; specifically, the system architecture may be a Browser/Server architecture (Browser/Server, B/S) or a Client/Server architecture (Client/Server, C/S), etc. The test analysis system may support multi-terminal logging.
In practical applications, the data layer may set up a database to store data required for test analysis, for example, the database may include, but is not limited to, a test object library, a test case library, a test index library, and the like. The test object library, the test case library and the test index library have mapping relations, the test object library is associated with the test index library, each test object can correspond to one or more test indexes, the test index library is associated with the test case library, the test indexes and the test cases can be in one-to-one correspondence, or one test case corresponds to a plurality of test indexes, or one test index corresponds to a plurality of test cases, and each test index has a corresponding test case. The database supports operations such as adding, deleting, modifying and querying.
In one embodiment, referring to fig. 2, fig. 2 shows a table structure of a test object library (products detail _ t), a test index library (index _ x), and a test example library (case _ t) in a test analysis system. The test object library may include a test object name (product _ name), a test object vendor name (vend _ name), a life cycle (life cycle), an application scene (application _ scene), and the like; the test index library (index _ x) may include, but is not limited to, an index name (index _ name), index details (index _ description), index codes (index _ id), index test tools (tool), first index codes (first _ index _ id), second index codes (tow _ index _ id), and the like; the test case library (case _ t) may include, but is not limited to, a test date (test _ date), a test location (test _ location), a test purpose (test _ purpose), a test condition (test _ conditions), a test step (test _ procedure), an expected result (expected _ results), a test result (test _ results), and the like.
In practical application, the display layer may provide a system operation interface for displaying data and receiving services such as user transmission data and enabling interaction with a user, where the system operation interface may include, but is not limited to, a test analysis project management interface, an index management interface, a test case interface, a result analysis interface, and the like.
In some embodiments, a user may perform operations such as test analysis item content filling, index selection, index correction, index addition and deletion, test case filling, test case correction, test case import and export, and the like by inputting login verification information on the system operation interface.
In practical application, the control layer can process transactions such as business rules, data access, validity check and the like. Specifically, the operation instruction corresponding to the operation may be executed in response to the operation of the user on the system operation interface, the test may be performed based on the test case and the test index to obtain test data, the test data may be analyzed based on the test analysis standard to obtain a test analysis result, and the like, for example, the corresponding structural layer may be controlled to access the database to obtain data services, or the corresponding structural layer may be controlled to screen the user input data for classification processing, and the like. In a specific embodiment, the control layer may be configured to identify an operation instruction and operation information corresponding to the user correction operation, and execute the operation instruction to process the operation information.
Further, the control layer may be further configured to verify login verification information of the user, and determine an operation right corresponding to the login verification information, such as a login system right, a modified project person right, an index modification operation right, a test case modification operation right, and the like. Therefore, the authority management in the test analysis process is realized, the authority control is ensured, and the confidentiality of the test analysis project data is further ensured.
Referring now to fig. 3, fig. 3 is a schematic flow chart of a test analysis method provided by an embodiment of the present disclosure, which provides the method operation steps described in the embodiment or the flow chart, but may include more or less operation steps based on conventional or non-inventive labor. The order of steps recited in the embodiments is merely one manner of performing the steps in a multitude of orders and does not represent the only order of execution. In practice, the system or server product may be implemented in a sequential or parallel manner (e.g., parallel processor or multi-threaded environment) according to the embodiments or methods shown in the figures. Specifically, as shown in fig. 3, the test analysis method may include:
s210: and acquiring a reference test index matched with the target test object from a pre-stored test index library.
In the embodiment of the present disclosure, a database may be stored, and the test index database is pre-stored in the database. Specifically, a plurality of test indexes are stored in the test index library, and the test indexes and test objects have corresponding relations. The reference test index is a test index in the test index library that matches the target test object.
In practical applications, the test indexes in the test index library may include, but are not limited to, a primary test index, a secondary test index, a tertiary test index, and the like.
In practical application, the test index library can be organized according to historical test analysis items, and can be continuously added, deleted and completed along with newly added test analysis items. Specifically, the updating of the test index library can support manual entry and excel form import, and can also support excel export.
In a specific embodiment, the test analysis item is specifically a type-selection test analysis item, the test index library includes a primary test index, a secondary test index and a tertiary test index corresponding to the test object, and the primary test index represents the overall classification of indexes, mainly including functions, performance, reliability and the like; the secondary test indexes belong to the primary test indexes, for example, the secondary test indexes refine functions to time characteristics and resource characteristics, and the primary test indexes are refined to safety, interoperability, suitability, accuracy and compliance; the third-level test indexes belong to the second-level test indexes, and are specific test index parameters, for example, the third-level test indexes refine the resource characteristics of the second-level test indexes into the size of a local disk, the size of a memory and the like.
Further, referring to fig. 4, fig. 4 shows an index management interface of the type-selection test analysis system, where the index management interface supports the user to add, delete, and modify the test indexes. For example, a user may modify the three-level test index description of the motherboard in fig. 4, modify the B360 chipset into a B370 chipset, modify an index _ description field of the index (see fig. 2) after the user operates the type-selection test analysis system, so as to modify the test index, store the modified test index, and store the modified test index in the database.
In the embodiment of the present disclosure, in step S210: the obtaining of the reference test index matched with the target test object from the pre-stored test index library may include:
s2101: determining a reference test object matched with the target test object from a pre-stored test object library;
s2102: and acquiring the test index corresponding to the reference test object from the test index library, and taking the test index corresponding to the reference test object as the reference test index.
In practical applications, the test object library may be configured to store description information of the test object, such as a name of the test object, a supplier of the test object, a life cycle, an application scenario, and the like, where the test object in the test object library and the test index in the test index library have a mapping relationship, that is, the reference test object has a mapped test index in the test index library, and the mapping relationship may be established according to a corresponding relationship between the corresponding test object and the test index in the historical test analysis item.
Further, one test analysis item may include a plurality of test objects, and the plurality of test objects may be the same product from different suppliers, for example, the test objects in the type-selection test analysis item may be servers, display terminals, software programs, etc. of different suppliers; or it may be a different product, such as a different module in a software system, etc.
In a specific embodiment, a test object in the test object library whose test object description information is similar to the target test object description information may be used as the reference test object, for example, a test object with the same test object name. Specifically, the test object with the highest similarity may be used as the reference test object, or the similar test object may be displayed on the system interface, so as to facilitate the user to select, receive the similar test object selected by the user, and use the similar test object as the reference test object.
Further, if there is no test object matching the target test object in the test object library, for example, the description information of all test objects in the test object library is different from the target test object, the category of the target test object may be determined, and the test object in the test object library having the same category as the target test object is provided for the user to select. The categories of the target test objects can be, for example, a software category, a hardware category and the like, the detailed categories of the software category can be, for example, instant messaging software, job automatic processing software and the like, and the detailed categories of the hardware category can be, for example, chips, processors, displays, display cards and the like.
In practical application, a related test object library and a test index library are prestored, a reference test object matched with a target test object is obtained from the test object library, and a corresponding reference test index of the reference test object in the test index library is obtained, so that the efficiency of index designation is effectively improved, and the possibility of index error and leakage is favorably reduced.
S310: and acquiring index correction information corresponding to the reference test index.
In the embodiment of the present disclosure, the reference test indicator is an automatically provided and generated test indicator, and there may be redundancy, deficiency, or deviation, and therefore, the reference test indicator needs to be modified accordingly.
In the specific embodiment, step S310: the obtaining of the index correction information corresponding to the reference test index may specifically be: and identifying index correction information corresponding to the user index correction operation in response to the user index correction operation corresponding to the reference test index.
In the embodiment of the present disclosure, in step S310: before the index correction information corresponding to the reference test index is obtained, the test analysis method of the present disclosure may further include a step of authority verification, which may specifically include: judging whether the current user authority modifies the operation authority or not according to the account information of the current user; if yes, the above step S310 is executed. Therefore, the authority management and control of the test analysis process are realized, and the test analysis and related data confidentiality requirements are met.
In a specific embodiment, the system interface of the type-selection test analysis system may include a user management interface, please refer to fig. 5, where fig. 5 shows the user management interface of the type-selection test analysis system, the user management interface includes sub-interfaces of account management, authority management, role management, and personnel assessment, and a user with the highest management authority may perform a modification operation on the user management interface.
In some embodiments, at step S310: after the index correction information corresponding to the reference test index is obtained, the test analysis method further includes S311: and displaying the test index correction information according to a preset format. The preset format may include, but is not limited to, highlighting text, thickening text, a preset color different from the colors of other text in the interface, and the like. And the modified index correction information is highlighted on the system interface through a preset format, so that the display of the index correction information to different users is facilitated.
S410: and generating a target test index of the target test object according to the reference test index and the index correction information.
In the embodiment of the disclosure, the reference test index is corrected according to the identified index correction information, so as to obtain the target test index of the target test object.
In practical application, the target test indexes may include a plurality of first-level test indexes, each first-level test index may further include a second-level test index, and the second-level test indexes may further include a third-level test index.
In a specific embodiment, the first-level test index, the second-level test index or the second-level test index obtained after correction in the target test index can be displayed in a preset format.
S510: and acquiring a target test case corresponding to the target test index.
In some embodiments, step S510: obtaining the target test case corresponding to the target test index may include:
s5111: acquiring a reference test case corresponding to the reference test index from a pre-stored test case library;
in practical application, the test cases corresponding to the test indexes can be prestored in the test case library, and the corresponding relationship between the test indexes and the test cases can be established based on historical test analysis projects. And acquiring a test case corresponding to the reference test index from a pre-stored test case library, and taking the test case corresponding to the reference test index as the reference test case. In some embodiments, a test case may correspond to one or more three-level test metrics.
Specifically, updating of the test case library can support modes such as manual entry and document entry, for example, word case document entry, and in a scenario of manual entry, the obtained corresponding fields can be directly filled in corresponding fields in the database table for storage; in the case of importing the use case document, the imported use case document and the fields in the database table can be matched to obtain matched fields, the imported use case document is disassembled according to the matched fields to obtain the fields corresponding to the matched fields, the fields corresponding to the matched fields are stored in a text form and filled in the matched fields in the database table for storage, and the fields can be associated with the test indexes in the database. In some embodiments, the disassembling of the imported use case document may specifically be: and disassembling the imported word use case document through a docx library of a third party of python.
In a specific embodiment, if the matched field is for the test purpose, the corresponding field after the test purpose is stored in text form and stored in the test _ purpose field in the database table (please refer to fig. 2). Specifically, the fields may be matched exactly when matched, and the test analysis system may support downloading of a preset test case template corresponding to the case document.
S5112: acquiring test case correction information corresponding to the reference test case;
in a specific embodiment, step S5112 may specifically be: and responding to the user test case modification operation corresponding to the reference test case, and identifying test case modification information corresponding to the user test case modification operation.
Specifically, the user test case modification operation may include a modification operation of the user on the test case content on the test case interface, and the like.
In the embodiment of the present disclosure, in step S5112: before obtaining the test case modification information corresponding to the reference test case, the test analysis method of the present disclosure may further include a step of authority verification, which may specifically include: judging whether the current user authority modifies the operation authority or not according to the account information of the current user; if yes, the above step S5112 is executed. Therefore, the authority management and control of the test analysis process are realized, and the test analysis and related data confidentiality requirements are met.
S5113: and generating a target test case corresponding to the target test index according to the reference test case and the test case correction information.
In a specific embodiment, the reference test case is modified according to the identified test case modification information, and a target test index corresponding to the target test index is obtained.
In other embodiments, step S510: obtaining the target test case corresponding to the target test index may include:
s5121: obtaining a test case document corresponding to the target test index;
s5122: identifying a target field corresponding to a preset test case template in the test case document;
s5123: and generating the target test case according to the target field and the preset test case template.
In a specific embodiment, a test case document uploaded by a user and corresponding to a target test index can be received, after a target field in the test case document is identified, a corresponding field behind the target field is filled in a preset test case template to obtain a target test case, and the target test case can be displayed on a test case interface. The test case document uploaded by the user can be a document filled according to a preset test case template.
In practical applications, the case component elements of the test case may include, but are not limited to, a case number, a test date, a case name, test equipment, a test target, an overall index, a test method, a test step, a test result, a test signature, and the like. The preset test case template and the test case document may include a case component element field of the test case, for example, the case component element field is used as a chapter, and the case component element field may be used for field matching and may also be used as the target field.
It should be noted that the generation process of the target test case may also be: displaying a case component element field of the test case; receiving use case component element description information input by a user; and filling the description information of the case component elements into the corresponding case component element fields to generate the target test case.
In a specific embodiment, referring to fig. 6, fig. 6 shows a test case interface in the type-selection test analysis system, where case components of a test case are displayed in a tabular manner in the test case interface. A test case import option (import word document in FIG. 6) and a test case export option (export word in FIG. 6) are provided in the test case interface. The user may select the test case content to be downloaded to perform export operation, the test analysis system may convert the test case content selected by the user into a document in a preset test case template format, and may also perform typesetting and numbering on the test case document according to the selected test case content, please refer to fig. 7, where fig. 7 shows a schematic diagram of the test case document.
S610: and acquiring the test data of the target test object based on the target test index and the target test case.
In the embodiment of the disclosure, the target test object is tested based on the target test index and the corresponding target test case, and corresponding test data is obtained. The target test index may include a passing index and an evaluative index, the test data corresponding to the passing index may include pass and fail test results, and the test data corresponding to the evaluative index may include index parameter results, and the like.
S710: and obtaining a test analysis result of the target test object based on the test data of the target test object and the test analysis standard corresponding to the target test index.
In embodiments of the present disclosure, the target test indicator may correspond to one or more test analysis criteria. In some embodiments, the test analysis criteria may correspond one-to-one to the three levels of test indicia. The test analysis results may include pass, fail, test score, and test rank, among others.
In a particular embodiment, the passing test analysis criteria, such as pass or score, corresponds to a passing indicator. The test analysis criteria corresponding to the evaluative index may include scoring rules, such as ranking score, linear score, and point score, where different scoring rules may correspond to different scoring formulas, and score the corresponding test analysis result according to the scoring rule corresponding to the target test index to obtain a test score of the test object corresponding to the target test index, so as to obtain a test ranking of the plurality of test objects corresponding to the target test index.
Based on the foregoing specific implementation, in the embodiment of the present disclosure, the test analysis method may further include:
s811: storing the target test index into the test index library;
s812: storing the target test case into the test case library;
s813: and generating a mapping relation among the target test object, the target test index and the target test case.
In practical application, the target test indexes and the target test cases generated in the test analysis process are respectively stored so as to update data in the test index library and the test case library. The mapping relationship may be generated in a database table based on a corresponding relationship between the target test object, the target test indicator, and the target test case.
In some embodiments, if the test indexes in the test index library are completely the same as the first-level test indexes and/or the second-level test indexes of the target test indexes, but the pre-stored test indexes are different from the third-level test indexes of the target test indexes, the target test indexes are stored and associated as new test indexes. For example, a CPU dominant frequency test index is prestored in the test index library, the dominant frequency parameter requirement in the three-stage test index is 2GHz, but when the test object is a server, the dominant frequency parameter requirement in the three-stage test index is changed to 4GHz, the CPU dominant frequency test index corresponding to the modified 4GHz dominant frequency parameter requirement is stored in the test index library, and the CPU dominant frequency test index corresponding to the 2GHz dominant frequency parameter requirement coexists and is associated with the server in the test object library.
In a specific embodiment, the target test case includes at least one case component, and step S812: storing the target test case into the test case library may include:
s8121: and acquiring at least one use case component element in the target test use case and a field corresponding to the at least one use case component element.
S8122: and storing the at least one use case component element and the field corresponding to the at least one use case component element into the test case library.
In the embodiment of the present disclosure, the test analysis method may further include S910: and generating a target test report based on one or more of the target test index, the target test case, the test data of the target test object and the test analysis result of the target test object.
In practical application, the target test report may include information such as a test background, a target test index, a target test case, test team personnel information, and a test analysis result.
According to the technical scheme provided by the embodiment of the disclosure, the reference test indexes matched with the target test object are obtained from the pre-stored test index library, the target test indexes are generated according to the reference test indexes and the corresponding index correction information, the automation of the index designation process is improved by using the pre-stored resources in the test index library, then the target test cases corresponding to the target test indexes are obtained to implement the test and obtain the test data, and the test data is analyzed based on the test analysis standards corresponding to the target test indexes to obtain the test analysis result.
The disclosed embodiment provides a terminal, which comprises a processor and a memory, wherein at least one instruction and at least one program are stored in the memory, and the at least one instruction and the at least one program are loaded and executed by the processor to realize the test analysis method.
The embodiment of the present disclosure provides a server, which includes a processor and a memory, where the memory stores at least one instruction and at least one program, and the at least one instruction and the at least one program are loaded and executed by the processor to implement the test analysis method described above.
In the embodiment of the present disclosure, the memory may be used to store software programs and modules, and the processor executes various functional applications and data processing by operating the software programs and modules stored in the memory. The memory can mainly comprise a program storage area and a data storage area, wherein the program storage area can store an operating system, application programs needed by functions and the like; the storage data area may store data created according to use of the apparatus, and the like. Further, the memory may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid state storage device. Accordingly, the memory may also include a memory controller to provide the processor access to the memory.
The embodiment of the present disclosure also provides a test analysis apparatus, as shown in fig. 8, the apparatus may include:
the index acquisition module 10: the device comprises a test target database, a reference test index database and a target test index database, wherein the test target database is used for storing a target test target;
the correction information acquisition module 20: the index correction information is used for acquiring index correction information corresponding to the reference test index;
the index generation module 30: the target test index of the target test object is generated according to the reference test index and the index correction information;
the use case obtaining module 40: the target test case is used for acquiring a target test case corresponding to the target test index;
the data acquisition module 50: the test data of the target test object is obtained based on the target test index and the target test case;
the analysis module 60: and the test analysis result of the target test object is obtained based on the test data of the target test object and the test analysis standard corresponding to the target test index.
Based on the foregoing specific implementation, in the embodiment of the present disclosure, the index obtaining module 10 may include:
a reference test object determination unit: the device comprises a test object library, a reference test object and a target test object, wherein the reference test object is used for determining a reference test object matched with the target test object from a pre-stored test object library;
a reference test index acquisition unit: and the test index library is used for acquiring the test index corresponding to the reference test object from the test index library, and taking the test index corresponding to the reference test object as the reference test index.
Based on the foregoing specific embodiments, in some embodiments, the use case obtaining module 40 may include:
a reference test case acquisition unit: the device is used for acquiring a reference test case corresponding to the reference test index from a pre-stored test case library;
a test case correction information acquisition unit: the test case correction information corresponding to the reference test case is obtained;
a first target test case generation unit: and the target test case corresponding to the target test index is generated according to the reference test case and the test case correction information.
Based on some or all of the foregoing specific embodiments, in other embodiments, the use case obtaining module 40 may include:
a test case document acquisition unit: the test case document corresponding to the target test index is obtained;
a target field identification unit: the system comprises a target field, a target field and a target field, wherein the target field is used for identifying a target field in the test case document corresponding to a preset test case template;
a second target test case generation unit: and the target test case is generated according to the target field and the preset test case template.
Based on some or all of the above specific embodiments, in the embodiments of the present disclosure, the test analysis apparatus may further include:
an index storage module: the target test index is stored in the test index library;
a use case storage module: the target test case is stored into the test case library;
a mapping relationship generation module: and the mapping relation among the target test object, the target test index and the target test case is generated.
Based on some or all of the above specific embodiments, in the embodiments of the present disclosure, a target test case includes at least one case component, and the case storage module includes:
an element acquisition unit: the field is used for acquiring at least one use case component element and at least one field corresponding to the use case component element in the target test use case;
an element storage unit: and the method is used for storing the at least one use case component and the field corresponding to the at least one use case component into the test case library.
Based on some or all of the above specific embodiments, in the embodiment of the present disclosure, the test analysis apparatus further includes a correction information display unit: and the display module is used for displaying the test index correction information according to a preset format after the index correction information corresponding to the reference test index is obtained.
The device and method embodiments in the device embodiment described are based on the same inventive concept.
The embodiment of the present disclosure also provides a computer-readable storage medium, in which at least one instruction or at least one program is stored, and the at least one instruction or the at least one program is loaded and executed by the processor to implement the test analysis method described above.
The embodiment of the present disclosure further provides a test analysis device, which includes a memory and a processor, where the memory stores at least one instruction and at least one program, and the at least one instruction and the at least one program are loaded and executed by the processor to implement the test analysis method.
Further, fig. 9 shows a schematic hardware structure diagram of a test analysis device for implementing the test analysis method provided by the embodiment of the present disclosure, and the test analysis device may participate in constituting or including the apparatus or system provided by the embodiment of the present disclosure. As shown in fig. 9, the test and analysis device 1 may comprise one or more (shown as 102a, 102b, … …, 102 n) processors 102 (the processors 102 may include, but are not limited to, a processing device such as a microprocessor MCU or a programmable logic device FPGA), a memory 104 for storing data, and a transmission device 106 for communication functions. Besides, the method can also comprise the following steps: a display, an input/output interface (I/O interface), a Universal Serial Bus (USB) port (which may be included as one of the ports of the I/O interface), a network interface, a power source, and/or a camera. It will be understood by those skilled in the art that the structure shown in fig. 9 is merely illustrative and is not intended to limit the structure of the test and analysis apparatus described above. For example, the test and analysis device 1 may also include more or fewer components than shown in fig. 9, or have a different configuration than shown in fig. 9.
It should be noted that the one or more processors 102 and/or other data processing circuitry described above may be referred to generally herein as "data processing circuitry". The data processing circuitry may be embodied in whole or in part in software, hardware, firmware, or any combination thereof. Furthermore, the data processing circuit may be a single stand-alone processing module, or incorporated in whole or in part into any of the other elements in the test and analysis device 1 (or mobile device). As referred to in the embodiments of the application, the data processing circuit acts as a processor control (e.g. selection of a variable resistance termination path connected to the interface).
The memory 104 may be used to store software programs and modules of application software, such as program instructions/data storage devices corresponding to the methods in the embodiments of the present disclosure, and the processor 102 executes various functional applications and data processing by executing the software programs and modules stored in the memory 104, so as to implement the test analysis method described above. The memory 104 may include high speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include memory remotely located from the processor 102, which may be connected to the test analysis apparatus 1 via a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The transmission device 106 is used for receiving or transmitting data via a network. The above-described specific example of the network may include a wireless network provided by a communication provider of the test analysis apparatus 1. In one example, the transmission device 106 includes a network adapter (NIC) that can be connected to other network devices through a base station so as to communicate with the internet. In one example, the transmission device 106 can be a Radio Frequency (RF) module, which is used for communicating with the internet in a wireless manner.
The display may be, for example, a touch screen type Liquid Crystal Display (LCD) that may enable a user to interact with a user interface of the test and analysis device 1 (or mobile device).
As can be seen from the above embodiments of the test analysis method, apparatus, device, terminal, server, system or storage medium provided by the present disclosure, the present disclosure obtains a reference test index matching a target test object from a pre-stored test index library, and generating a target test index according to the reference test index and the corresponding index correction information, improving the automation of the index designation process by using prestored resources in a test index library, then obtaining a target test case corresponding to the target test index to implement the test and obtain test data, and then, the test data is analyzed based on the test analysis standard corresponding to the target test index to obtain a test analysis result, so that the automation degree of the test case generation process and the analysis process is effectively improved, the processing efficiency of the test analysis process can be improved, the labor time cost is effectively reduced, and the user experience is improved.
It should be noted that: the precedence order of the embodiments of the present disclosure is merely for description, and does not represent the merits of the embodiments. And specific embodiments thereof have been described above. Other embodiments are within the scope of the following claims. In some cases, the actions or steps recited in the claims may be performed in a different order than in the embodiments and still achieve desirable results. In addition, the processes depicted in the accompanying figures do not necessarily require the particular order shown, or sequential order, to achieve desirable results. In some embodiments, multitasking and parallel processing may also be possible or may be advantageous.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, as for the apparatus, system and server embodiments, since they are substantially similar to the method embodiments, the description is relatively simple, and reference may be made to some descriptions of the method embodiments for relevant points.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program instructing relevant hardware, where the program may be stored in a computer-readable storage medium, and the above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.
The above description is only exemplary of the present disclosure and is not intended to limit the present disclosure, so that any modification, equivalent replacement, or improvement made within the spirit and principle of the present disclosure should be included in the scope of the present disclosure.
Claims (10)
1. A method of test analysis, the method comprising:
acquiring a reference test index matched with a target test object from a pre-stored test index library;
acquiring index correction information corresponding to the reference test index;
generating a target test index of the target test object according to the reference test index and the index correction information;
acquiring a target test case corresponding to the target test index;
acquiring test data of a target test object based on the target test index and the target test case;
and obtaining a test analysis result of the target test object based on the test data of the target test object and the test analysis standard corresponding to the target test index.
2. The method of claim 1, wherein the obtaining the reference test index matching the target test object from the pre-stored test index library comprises:
determining a reference test object matched with the target test object from a pre-stored test object library;
and acquiring the test index corresponding to the reference test object from the test index library, and taking the test index corresponding to the reference test object as the reference test index.
3. The method according to claim 1, wherein the obtaining of the target test case corresponding to the target test index comprises:
acquiring a reference test case corresponding to the reference test index from a pre-stored test case library;
acquiring test case correction information corresponding to the reference test case;
and generating a target test case corresponding to the target test index according to the reference test case and the test case correction information.
4. The method according to claim 1, wherein the obtaining of the target test case corresponding to the target test index comprises:
obtaining a test case document corresponding to the target test index;
identifying a target field corresponding to a preset test case template in the test case document;
and generating the target test case according to the target field and the preset test case template.
5. The method according to any one of claims 1-4, further comprising:
storing the target test index into the test index library;
storing the target test case into the test case library;
and generating a mapping relation among the target test object, the target test index and the target test case.
6. The method of claim 5, wherein the target test case comprises at least one case component, and wherein storing the target test case into the test case library comprises:
acquiring at least one use case component element in the target test use case and a field corresponding to the at least one use case component element;
and storing the at least one use case component element and the field corresponding to the at least one use case component element into the test case library.
7. The method according to any one of claims 1-4, wherein after the obtaining of the index correction information corresponding to the reference test index, the method further comprises:
and displaying the test index correction information according to a preset format.
8. A test analysis device, the device comprising:
an index acquisition module: the device comprises a test target database, a reference test index database and a target test index database, wherein the test target database is used for storing a target test target;
a correction information acquisition module: the index correction information is used for acquiring index correction information corresponding to the reference test index;
an index generation module: the target test index of the target test object is generated according to the reference test index and the index correction information;
a use case acquisition module: the target test case is used for acquiring a target test case corresponding to the target test index;
a data acquisition module: the test data of the target test object is obtained based on the target test index and the target test case;
an analysis module: and the test analysis result of the target test object is obtained based on the test data of the target test object and the test analysis standard corresponding to the target test index.
9. A test analysis device comprising a processor and a memory, wherein at least one instruction or at least one program is stored in the memory, and wherein the at least one instruction or the at least one program is loaded and executed by the processor to implement a test analysis method according to any one of claims 1 to 7.
10. A computer-readable storage medium, in which at least one instruction or at least one program is stored, which is loaded and executed by a processor to implement a test analysis method according to any one of claims 1 to 7.
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