CN112422463A - Direct current offset calibration method, device and medium - Google Patents
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Abstract
The application discloses a direct current offset calibration method, equipment and a medium, which are applied to a direct current offset calibration system, wherein the method comprises the following steps: determining preset scanning information; controlling the arbitrary signal generator, the microwave source and the mixer to scan; receiving a scanning result sent by the spectrum analyzer, and selecting a plurality of candidate voltage values; merging candidate voltage values which meet preset conditions in the plurality of candidate voltage values; and selecting the specified value as the optimal voltage value in the candidate voltage value range with the range larger than the preset threshold value. By combining the candidate voltage values meeting the conditions, a plurality of ranges are generated, and the range in which the optimal voltage value is located can be found. And then selecting an optimal voltage value in a range meeting the conditions, and acquiring the direct current offset calibration parameters of the frequency mixer with the high-stability local oscillator leakage suppression effect under the condition of meeting the local oscillator leakage suppression requirement.
Description
Technical Field
The present application relates to the field of mixers, and in particular, to a mixer dc offset calibration method, device, and medium.
Background
A mixer is a circuit where the output signal frequency is equal to the sum, difference, or other combination of the two input signal frequencies. The mixer is usually made up of a non-linear element and a frequency selective loop.
During daily use, the mixer needs to be calibrated by direct current offset. In the process of dc offset calibration, the dc offset voltages of the input ports need to be respectively adjusted to seek for the minimum local oscillator signal output in the signals output by the output ports, that is, the local oscillator signal has the minimum leakage.
However, in the prior art, the dc offset voltage combination that minimizes the local oscillator leakage is often in a narrow voltage region, where the local oscillator leakage is very small but the local oscillator leakage changes very steeply, and beyond this region, the local oscillator leakage may be higher than the local oscillator leakage that satisfies the local oscillator leakage requirement but does not satisfy the local oscillator leakage suppression requirement, even not satisfy the local oscillator leakage suppression requirement. However, various noises existing in an actual working scene may cause the combination of the dc offset voltages input to the mixer to exceed the effective range, resulting in large jitter of the local oscillator leakage, and it is difficult to obtain the mixer dc offset calibration parameters with high-stability local oscillator leakage suppression effect under the condition of satisfying the local oscillator leakage suppression requirement.
Disclosure of Invention
In order to solve the above problem, the present application provides a dc offset calibration method, including: the method is applied to a direct current offset calibration system, the direct current offset calibration system comprises an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer and an upper computer, and the method comprises the following steps: determining preset scanning information, wherein the scanning information comprises a scanning range, a scanning point number and a threshold value; controlling the arbitrary signal generator, the microwave source and the frequency mixer to scan according to the scanning information; receiving a scanning result sent by the spectrum analyzer, and selecting a plurality of candidate voltage values based on the threshold value and the scanning result; combining candidate voltage values meeting a preset condition in the plurality of candidate voltage values to obtain a plurality of candidate voltage value ranges, wherein if any number of candidate voltage values are in a relation of adjacent points in the point-by-point scanning process, the any number of candidate voltage values meet the preset condition; and selecting the specified value as the optimal voltage value in the candidate voltage value range with the range larger than the preset threshold value.
In one example, selecting the specified value as the optimal voltage value in the candidate voltage value range with the range larger than the preset threshold value includes: and selecting the appointed value as the optimal voltage value in the candidate voltage value range with the maximum range.
In one example, selecting the specified value as the optimal voltage value in the candidate voltage value range with the largest range includes: selecting a middle candidate voltage value as an optimal voltage value in the candidate voltage value range with the largest range; or in the candidate voltage value range with the largest range, taking the average value of the two candidate voltage values in the middle as the optimal voltage value.
In one example, the scan range corresponds to a voltage output range of the arbitrary signal generator.
In one example, the mixer is provided with a plurality of input ports for receiving input signals, the scanning range includes a scanning range corresponding to each input port, the candidate voltage values are candidate voltage value combinations, and the optimal voltage value is an optimal voltage value combination.
In one example, controlling the arbitrary signal generator, the microwave source, and the mixer to scan according to the scan information includes: determining a stepping value according to the scanning range and the number of scanning points; and controlling the arbitrary signal generator to send an input signal to the frequency mixer and controlling the microwave source to send a local oscillation signal to the frequency mixer based on the stepping value, the scanning range and a preset initial voltage value.
In one example, controlling the arbitrary signal generator to send an input signal to the mixer and controlling the microwave source to send a local oscillator signal to the mixer based on the step value, the scan range, and a preset initial voltage value includes: starting with a preset initial voltage value, executing a sending process point by point according to a designated sequence, and stopping the sending process until a voltage value corresponding to the sent input signal exceeds a voltage value corresponding to the scanning range, wherein the designated sequence comprises that the voltage value is from high to low or the voltage value is from low to high; the sending process comprises the following steps: controlling the arbitrary signal generator to send the input signal corresponding to the initial voltage value to the mixer; and increasing or decreasing the initial voltage value by a step value to obtain a recalculated voltage value, and using the recalculated voltage value in the next round of sending process.
In one example, receiving a sweep result transmitted by the spectrum analyzer and selecting a plurality of candidate voltage values based on the threshold value and the sweep result includes: receiving a scanning result sent by the spectrum analyzer, wherein the scanning result carries a local oscillation signal of each scanning point in an output signal; and taking the number of scanning points corresponding to the local oscillation signal in the output information number being lower than the threshold value as a candidate voltage value.
In another aspect, the present application further provides a dc offset calibration apparatus, including: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to: a method as in any preceding example.
In another aspect, the present application further provides a non-volatile computer storage medium for dc offset calibration, storing computer-executable instructions configured to: a method as in any preceding example.
The DC offset calibration method provided by the application can bring the following beneficial effects:
by combining the candidate voltage values meeting the conditions, a plurality of ranges are generated, and the range in which the optimal voltage value is located can be found. And then selecting an optimal voltage value in a range meeting the conditions, and acquiring the direct current offset calibration parameters of the frequency mixer with the high-stability local oscillator leakage suppression effect under the condition of meeting the local oscillator leakage suppression requirement.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the application and together with the description serve to explain the application and not to limit the application. In the drawings:
FIG. 1 is a schematic flow chart illustrating a DC offset calibration method according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a DC offset calibration apparatus according to an embodiment of the present application;
FIG. 3 is a schematic flow chart illustrating a DC offset calibration method according to an embodiment of the present application;
fig. 4 is a schematic diagram of a dc offset calibration system according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the technical solutions of the present application will be described in detail and completely with reference to the following specific embodiments of the present application and the accompanying drawings. It should be apparent that the described embodiments are only some of the embodiments of the present application, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
The embodiment of the application provides a mixer direct current offset calibration method, which is applied to a direct current offset calibration system, and as shown in fig. 4, the direct current offset calibration system comprises an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer and an upper computer.
Where any signal generator is connected to the mixer, it may represent a combination of signal generators, any waveform generators or similar devices. The arbitrary signal generator is mainly used for sending a corresponding input signal to the mixer, and then scanning in the direct current offset calibration process is carried out through the sent input signal. In addition, due to different requirements during operation, up-conversion or down-conversion is required, and at this time, any signal generator needs to be connected with different ports of the mixer. For example, in up-conversion, an arbitrary signal generator needs to be connected to an Intermediate Frequency (IF) port of the mixer, and in down-conversion, an arbitrary signal generator needs to be connected to a Radio Frequency (RF) port of the mixer. For convenience of description in the embodiments of the present application, the above frequency conversion is explained as an example, that is, any signal generator is connected to an intermediate frequency port of a mixer, and an intermediate frequency signal is input. However, it should be understood by those skilled in the art that, when performing down-conversion, the method in the embodiment of the present application can be implemented only by performing corresponding changes according to common knowledge, and thus the method corresponding to down-conversion is not described again.
The microwave source represents a device capable of generating microwave energy, which is connected to a Local Oscillator (LO) port (i.e., the L port shown in fig. 4) of the mixer, and is mainly used to transmit a corresponding local oscillator signal to perform a scanning process.
An intermediate frequency port of the mixer is connected to any signal generator, and a local oscillator port is connected to the microwave source, and is configured to combine the received local oscillator signal with the intermediate frequency signal and output a radio frequency signal through a radio frequency port (i.e., an R port shown in fig. 4). The input port of the mixer (in the embodiment of the present application, the intermediate frequency port is taken as an example) may have only one port, or may include a plurality of ports, for example, two ports including an in-phase component (I) and a quadrature component (Q), i.e., the I port and the Q port shown in fig. 4.
The spectrum analyzer is connected with the radio frequency port of the mixer and is mainly used for receiving the radio frequency signal output by the mixer, carrying out corresponding analysis and generating an analysis result.
The upper computer is connected with any signal generator, the microwave source and the spectrum analyzer and is mainly used for correspondingly controlling the starting and stopping of the signal generator and the generated intermediate frequency signal, correspondingly controlling the starting and stopping of the microwave source and the generated local oscillation signal, acquiring an analysis result generated by the spectrum analyzer and carrying out corresponding parameter calculation.
As shown in fig. 1 and 3, the method includes:
s101, determining preset scanning information, wherein the scanning information comprises a scanning range, a scanning point number and a threshold value.
Before scanning, the scanning information needs to be set in the upper computer correspondingly, and the setting may be set by a user or according to a corresponding rule, for example, according to a historical operation record. After the scanning information is set, the upper computer can acquire the scanning information. The scanning information may include a scanning range, a number of scanning points corresponding to the scanning, and a threshold value. The scanning range refers to a range of voltage values when an arbitrary signal generator transmits a signal during scanning. The number of scanning points refers to the number of points to be scanned in a scanning range, where different scanned points correspond to different voltage values of signals input by any signal generator, and each scanning point is generally uniformly distributed in the scanning range, that is, the difference between the voltage values corresponding to every two scanning points is the same, and the difference may be referred to as a step value in the working process. The threshold value is a preset value and can be set correspondingly according to actual conditions.
Furthermore, the scanning range can correspond to the voltage output range of any signal generator, and the scanning range is close to the voltage output range of any signal generator as much as possible, so that the scanning range is as large as possible, and more voltage values can be scanned.
And S102, controlling the arbitrary signal generator, the microwave source and the frequency mixer to scan according to the scanning information.
After the scanning information is determined, the upper computer can control any signal transmission, the microwave source and the mixer to scan. The upper computer may first determine a step value from the scan information. How to determine the step value has been described in the above embodiments, and the step value can be implemented according to the explanation related to the step value, which is not described herein again. After the step value is obtained, based on the step value, the scanning range and the preset initial voltage value, the arbitrary signal generator is controlled to send the input signal to the mixer point by point according to the designated sequence, and the microwave source is controlled to send the local oscillation signal to the mixer. The initial voltage value may be set randomly or based on a preset algorithm, which is not described herein, and the specified sequence includes that the voltage value is from high to low or the voltage value is from low to high.
Further, in the scanning process, firstly, any signal generator is controlled to send an input signal corresponding to the initial voltage value to the mixer. And then, increasing or decreasing the initial voltage value by the voltage value corresponding to the step value, and then continuously sending the input signal corresponding to the calculated voltage value until the voltage value reaches the maximum voltage value or the minimum voltage value corresponding to the scanning range, namely, the scanning process is finished.
S103, receiving the scanning result sent by the spectrum analyzer, and selecting a plurality of candidate voltage values based on the threshold value and the scanning result.
In the scanning process, the mixer outputs corresponding output signals to the spectrum analyzer, and the spectrum analyzer can perform corresponding analysis on the output signals and obtain scanning results after the scanning is finished. Then the spectrum analyzer can send the scanning result to the host computer, and the host computer can carry out corresponding calculation, processing.
Specifically, the upper computer may select a plurality of candidate voltage values from the scanning results based on the threshold value during the processing. When selecting, the voltage value corresponding to the local oscillation signal being lower than the threshold value may be selected from the output signals corresponding to the scanning result. Since the local oscillation signal in the output signal is low for the voltage value that meets the condition, and the voltage value or a voltage value near the voltage value is likely to appear as an optimal voltage value, the voltage value that meets the condition may be used as a candidate voltage value.
And S104, combining the candidate voltage values meeting the preset condition in the plurality of candidate voltage values to obtain a plurality of candidate voltage value ranges, wherein if any number of candidate voltage values are in the relation of adjacent points in the point-by-point scanning process, the any number of candidate voltage values meet the preset condition.
After determining the plurality of candidate voltage values, the candidate voltage values meeting the preset condition in the plurality of candidate voltage values may be merged. The condition that the voltage values meet the preset condition means that if any number of candidate voltage values belong to the relationship between adjacent points in the scanning process of point-by-point scanning, the candidate voltage values meet the requirement, and the candidate voltage values of any number are combined to obtain a candidate voltage value range. For example, when scanning is performed, the first scanning point is scanned first, and the voltage value corresponding to the first scanning point is used as the candidate voltage value. And then obtaining a voltage value corresponding to the second scanning point after increasing or decreasing the step value, wherein the voltage value of the second scanning point in the obtained result is also used as a candidate voltage value. At this time, the first scanning point and the second scanning point belong to the relationship between adjacent points and also belong to candidate voltage values, that is, the first scanning point and the second scanning point can be combined to obtain a candidate voltage value range. Similarly, after performing the means of combining for all candidate voltage values, several candidate voltage value ranges can be obtained.
And S105, selecting the specified value as the optimal voltage value in the candidate voltage value range with the range larger than the preset threshold value.
After obtaining a plurality of candidate voltage value ranges, one candidate voltage value range can be selected from the plurality of candidate voltage value ranges, and the specified value is selected as the optimal voltage value. In order to ensure the stability of the selected optimal voltage value, the voltage value may be selected from a range of candidate voltage values, which is greater than a preset range.
Specifically, the selection may be made in the range of candidate voltage values with the largest range. If a plurality of candidate voltage values with the same maximum range appear, the specified value can be selected from each candidate voltage value, and then scanning is performed again according to the specified values, so that the optimal voltage value is finally obtained. When the appointed value is selected, if the number of scanning points in the candidate voltage value range is singular, the middle candidate voltage value can be used as the optimal voltage value; if it is a double number, the average of the two candidate voltage values in the middle can be used as the optimal voltage value.
In one embodiment, when a plurality of input ports for receiving input signals are provided in the mixer, a plurality of ports for transmitting input signals are also provided in any signal generator, for example, when the number of input ports is two, the input ports may be two input ports of an in-phase component (I) and a quadrature component (Q), and at this time, the scanning range includes a scanning range corresponding to each input port. When the candidate voltage values and the optimal voltage values are determined, candidate voltage value combinations and optimal voltage value combinations can be obtained, each candidate voltage value combination comprises candidate voltage values corresponding to the two input ports, and the optimal voltage value combination comprises optimal voltage values corresponding to the two input ports.
As shown in fig. 2, an embodiment of the present application further provides a dc offset calibration apparatus, including:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to: a method as in any preceding embodiment.
An embodiment of the present application further provides a non-volatile computer storage medium for dc offset calibration, in which computer-executable instructions are stored, and the computer-executable instructions are configured to: a method as in any preceding embodiment.
The embodiments in the present application are described in a progressive manner, and the same and similar parts among the embodiments can be referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the device and media embodiments, the description is relatively simple as it is substantially similar to the method embodiments, and reference may be made to some descriptions of the method embodiments for relevant points.
The device and the medium provided by the embodiment of the application correspond to the method one to one, so the device and the medium also have the similar beneficial technical effects as the corresponding method, and the beneficial technical effects of the method are explained in detail above, so the beneficial technical effects of the device and the medium are not repeated herein.
As will be appreciated by one skilled in the art, embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flow diagrams and/or block diagrams, and combinations of flows and/or blocks in the flow diagrams and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In a typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include forms of volatile memory in a computer readable medium, Random Access Memory (RAM) and/or non-volatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of a computer-readable medium.
Computer-readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of computer storage media include, but are not limited to, phase change memory (PRAM), Static Random Access Memory (SRAM), Dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), Read Only Memory (ROM), Electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), Digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store information that can be accessed by a computing device. As defined herein, a computer readable medium does not include a transitory computer readable medium such as a modulated data signal and a carrier wave.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
The above description is only an example of the present application and is not intended to limit the present application. Various modifications and changes may occur to those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (10)
1. A direct current offset calibration method is characterized by being applied to a direct current offset calibration system, wherein the direct current offset calibration system comprises an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer and an upper computer, and the method comprises the following steps:
determining preset scanning information, wherein the scanning information comprises a scanning range, a scanning point number and a threshold value;
controlling the arbitrary signal generator, the microwave source and the frequency mixer to scan according to the scanning information;
receiving a scanning result sent by the spectrum analyzer, and selecting a plurality of candidate voltage values based on the threshold value and the scanning result;
combining candidate voltage values meeting a preset condition in the plurality of candidate voltage values to obtain a plurality of candidate voltage value ranges, wherein if any number of candidate voltage values are in a relation of adjacent points in the point-by-point scanning process, the any number of candidate voltage values meet the preset condition;
and selecting the specified value as the optimal voltage value in the candidate voltage value range with the range larger than the preset threshold value.
2. The method of claim 1, wherein selecting the specified value as the optimal voltage value in the candidate voltage value range having a range greater than the preset threshold comprises:
and selecting the appointed value as the optimal voltage value in the candidate voltage value range with the maximum range.
3. The method of claim 2, wherein selecting the specified value as the optimal voltage value in the candidate voltage value range with the largest range comprises:
selecting a middle candidate voltage value as an optimal voltage value in the candidate voltage value range with the largest range; or
And in the candidate voltage value range with the largest range, taking the average value of the two candidate voltage values in the middle as the optimal voltage value.
4. The method of claim 1, wherein the scan range corresponds to a voltage output range of the arbitrary signal generator.
5. The method of claim 1, wherein the mixer is provided with a plurality of input ports for receiving input signals, the sweep range includes a sweep range corresponding to each of the input ports, the candidate voltage values are candidate voltage value combinations, and the optimal voltage value is an optimal voltage value combination.
6. The method of claim 1, wherein controlling the arbitrary signal generator, the microwave source, and the mixer to scan according to the scan information comprises:
determining a stepping value according to the scanning range and the number of scanning points;
and controlling the arbitrary signal generator to send an input signal to the frequency mixer and controlling the microwave source to send a local oscillation signal to the frequency mixer based on the stepping value, the scanning range and a preset initial voltage value.
7. The method of claim 6, wherein controlling the arbitrary signal generator to send an input signal to the mixer and controlling the microwave source to send a local oscillator signal to the mixer based on the step value, the sweep range, and a preset initial voltage value comprises:
starting with a preset initial voltage value, executing a sending process point by point according to a designated sequence, and stopping the sending process until a voltage value corresponding to the sent input signal exceeds a voltage value corresponding to the scanning range, wherein the designated sequence comprises that the voltage value is from high to low or the voltage value is from low to high;
the sending process comprises the following steps:
controlling the arbitrary signal generator to send the input signal corresponding to the initial voltage value to the mixer;
and increasing or decreasing the initial voltage value by a step value to obtain a recalculated voltage value, and using the recalculated voltage value in the next round of sending process.
8. The method of claim 1, wherein receiving the scan results transmitted by the spectrum analyzer and selecting a plurality of candidate voltage values based on the threshold value and the scan results comprises:
receiving a scanning result sent by the spectrum analyzer, wherein the scanning result carries a local oscillation signal of each scanning point in an output signal;
and taking the number of scanning points corresponding to the local oscillation signal in the output information number being lower than the threshold value as a candidate voltage value.
9. A dc offset calibration apparatus, comprising:
at least one processor; and the number of the first and second groups,
a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,
the memory stores instructions executable by the at least one processor to enable the at least one processor to: the method of any one of claims 1-8.
10. A non-transitory computer storage medium having stored thereon computer-executable instructions configured to: the method of any one of claims 1-8.
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