CN112083370B - Method, equipment and medium for calibrating direct current bias of mixer - Google Patents

Method, equipment and medium for calibrating direct current bias of mixer Download PDF

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Publication number
CN112083370B
CN112083370B CN202010864644.0A CN202010864644A CN112083370B CN 112083370 B CN112083370 B CN 112083370B CN 202010864644 A CN202010864644 A CN 202010864644A CN 112083370 B CN112083370 B CN 112083370B
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scanning
mixer
value
voltage value
voltage
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CN112083370A (en
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李清石
金长新
刘强
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Shandong Inspur Science Research Institute Co Ltd
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Shandong Inspur Science Research Institute Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/005Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references

Abstract

The application discloses a method, equipment and medium for calibrating direct current offset of a mixer, which are applied to a direct current offset calibration system, wherein the method comprises the following steps: the upper computer determines preset first scanning information; performing a first scanning according to the first scanning information; receiving a first scanning result sent by a spectrum analyzer, and selecting a plurality of candidate voltage values; determining preset second scanning information; performing a second scan based on the second scan information and the plurality of candidate voltage values; and receiving a second scanning result sent by the spectrum analyzer, and selecting an optimal voltage value. Therefore, the scanning accuracy can be higher while the scanning times are not excessive. In addition, the obtained optimal voltage value is a global optimal voltage value, and is not a local optimal voltage value, so that the scanning effect can be ensured.

Description

Method, equipment and medium for calibrating direct current bias of mixer
Technical Field
The application relates to the field of mixers, in particular to a method, equipment and medium for calibrating direct current offset of a mixer.
Background
A mixer is a circuit in which the output signal frequency is equal to the sum, difference, or other combination of the two input signal frequencies. The mixer is typically composed of a nonlinear element and a frequency selective loop.
In the daily use working process, the mixer needs to be calibrated by direct current bias. In the process of direct current offset calibration, the direct current offset voltage of the input port needs to be respectively adjusted so as to seek that the signal output by the output end has the minimum local oscillation signal output, namely the influence of the local oscillation signal on the output signal is minimum.
However, in the prior art, when performing dc offset calibration, if the number of scans is too small, the final scan result is poor, and if the number of scans is too large, the calibration time is too long.
Disclosure of Invention
In order to solve the above problems, the present application proposes a method for calibrating a dc offset of a mixer, including: the method is applied to a direct current offset calibration system, the direct current offset calibration system comprises an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer and an upper computer, and the method comprises the following steps: the upper computer determines preset first scanning information, wherein the first scanning information comprises a first scanning range, first scanning points and a threshold value; according to the first scanning information, controlling the arbitrary signal generator, the microwave source and the mixer to perform first scanning; receiving a first scanning result sent by the spectrum analyzer, and selecting a plurality of candidate voltage values based on the threshold value and the first scanning result; determining preset second scanning information, wherein the second scanning information comprises a voltage relative value and second scanning points, and the voltage relative value corresponds to a second scanning range; controlling the arbitrary signal generator, the microwave source and the mixer to perform a second scanning based on the second scanning information and the plurality of candidate voltage values; and receiving a second scanning result sent by the spectrum analyzer, and selecting an optimal voltage value based on the second scanning result.
In one example, according to the first scanning information, controlling the arbitrary signal generator, the microwave source, and the mixer to perform the first scanning includes: determining a first stepping value according to the first scanning range and the first scanning point number; based on the first step value, the first scanning range and a preset initial voltage value, controlling the arbitrary signal generator to send an input signal to the mixer, and controlling the microwave source to send a local oscillation signal to the mixer; based on the second scanning information and the plurality of candidate voltage values, controlling the arbitrary signal generator, the microwave source and the mixer to perform second scanning comprises the following steps: determining a second stepping value according to the voltage relative value and the second scanning point number; and controlling the arbitrary signal generator to send an input signal to the mixer and controlling the microwave source to send a local oscillation signal to the mixer based on the second stepping value, the voltage relative value and the plurality of candidate voltage values.
In one example, based on the first step value, the first scan range, and a preset initial voltage value, controlling the arbitrary signal generator to transmit an input signal to the mixer, and controlling the microwave source to transmit a local oscillator signal to the mixer includes: controlling the arbitrary signal generator to send the input signal corresponding to the initial voltage value to the mixer; after the initial voltage value is increased or decreased by the first step value, a recalculated voltage value is obtained, and the arbitrary signal generator is controlled to send the input signal corresponding to the recalculated voltage value to the mixer until the recalculated voltage value reaches the voltage value corresponding to the first scanning range; based on the second step value, the voltage relative value, and the plurality of candidate voltage values, controlling the arbitrary signal generator to transmit an input signal to the mixer, and controlling the microwave source to transmit a local oscillator signal to the mixer, includes: for each candidate voltage value in the plurality of candidate voltage values, controlling the arbitrary signal generator to send the input signal corresponding to the candidate voltage value to the mixer; and after the candidate voltage value is increased or decreased by the second step value, a recalculated voltage value is obtained, and the arbitrary signal generator is controlled to send the input signal corresponding to the recalculated voltage value to the mixer until the recalculated voltage value reaches a scanning range corresponding to the voltage relative value.
In one example, determining a second step value from the voltage relative value, the second scan number of points, includes: second step value = the voltage relative value x 2/the second scan point number.
In one example, the first scan range corresponds to a voltage output range of the arbitrary signal generator.
In one example, the first number of scan points is above a first preset threshold and the second number of scan points is above a second preset threshold, the first preset threshold and the second preset threshold being related to voltage accuracy of the arbitrary signal generator.
In one example, the mixer is provided with a plurality of input ports for receiving input signals, and the first scanning range includes a first scanning range corresponding to each of the input ports; selecting a number of candidate voltage values based on the threshold value and the first scan result, including: selecting a plurality of candidate voltage value combinations based on the threshold value and the first scanning result, wherein each candidate voltage value combination comprises candidate voltage values respectively corresponding to a plurality of input ports; selecting an optimal voltage value based on the second scanning result, including: and selecting an optimal voltage value based on the second scanning result, wherein the optimal voltage value combination comprises a plurality of optimal voltage values respectively corresponding to the input ports.
In one example, selecting a number of candidate voltage values based on the threshold value and the first scan result includes: selecting a voltage value of which the local oscillation signal is lower than the threshold value from the output signals corresponding to the first scanning result as a candidate voltage value; selecting an optimal voltage value based on the second scanning result, including: and selecting the lowest voltage value of the local oscillation signal as the optimal voltage value in the output signals corresponding to the second scanning result.
On the other hand, the application also provides a direct current offset calibration device of a mixer, which is applied to a direct current offset calibration system, wherein the direct current offset calibration system comprises any signal generator, a microwave source, a mixer, a spectrum analyzer and an upper computer, and the device comprises: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method as described in any one of the examples above.
In another aspect, the present application further proposes a non-volatile computer storage medium storing computer executable instructions for dc offset calibration of a mixer, where the dc offset calibration system includes an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer, and a host computer, where the computer executable instructions are configured to: a method as in any one of the examples above.
The method for calibrating the direct current offset of the mixer has the following beneficial effects:
when DC offset calibration is performed, first scanning can be performed through the set first scanning information, and a plurality of candidate voltage values are selected. And taking the candidate voltage values as a plurality of points, scanning for the second time, and scanning the voltage values of the electricity and the nearby voltage values for the second time to obtain the final optimal voltage value. Therefore, the scanning accuracy can be higher while the scanning times are not excessive. In addition, the obtained optimal voltage value is a global optimal voltage value, and is not a local optimal voltage value, so that the scanning effect can be ensured.
Drawings
The accompanying drawings, which are included to provide a further understanding of the application and are incorporated in and constitute a part of this application, illustrate embodiments of the application and together with the description serve to explain the application and do not constitute an undue limitation to the application. In the drawings:
fig. 1 is a flow chart of a method for calibrating a dc offset of a mixer according to an embodiment of the present application;
FIG. 2 is a schematic diagram of a DC offset calibration apparatus for a mixer in an embodiment of the present application;
FIG. 3 is a schematic diagram of a DC offset calibration system according to an embodiment of the present application;
fig. 4 is a schematic flow chart of a method for calibrating a dc offset of a mixer according to an embodiment of the present application.
Detailed Description
For the purposes, technical solutions and advantages of the present application, the technical solutions of the present application will be clearly and completely described below with reference to specific embodiments of the present application and corresponding drawings. It will be apparent that the described embodiments are only some, but not all, of the embodiments of the present application. All other embodiments, which can be made by one of ordinary skill in the art without undue burden from the present disclosure, are within the scope of the present disclosure.
The following describes in detail the technical solutions provided by the embodiments of the present application with reference to the accompanying drawings.
The embodiment of the application provides a direct current offset calibration method of a mixer, which is applied to a direct current offset calibration system, as shown in fig. 3, wherein the direct current offset calibration system comprises an arbitrary signal generator, a microwave source, the mixer, a spectrum analyzer and an upper computer.
Wherein any signal generator is connected to the mixer, which may represent a combination of signal generators, any waveform generators or similar devices. The arbitrary signal generator is mainly used for transmitting corresponding input signals to the mixer, and then scanning in the direct current offset calibration process is carried out through the transmitted input signals. In addition, in operation, up-conversion or down-conversion is required due to different requirements, where any signal generator needs to be connected to different ports of the mixer. For example, in up-conversion, any signal generator needs to be connected to the Intermediate Frequency (IF) port of the mixer, while in down-conversion, any signal generator needs to be connected to the Radio Frequency (RF) port of the mixer. For convenience of description in the embodiment of the present application, the up-conversion is taken as an example for explanation, that is, an arbitrary signal generator is connected to an intermediate frequency port of a mixer, and an intermediate frequency signal is input. However, it should be understood by those skilled in the art that when performing the down-conversion, the method in the embodiment of the present application may be implemented only by performing a corresponding change according to common general knowledge, so that a detailed description of the corresponding method of the down-conversion is omitted.
A microwave source means a device capable of generating microwave energy and is connected to a Local Oscillator (LO) port (i.e., the L port shown in fig. 3) of a mixer, and is mainly used to transmit a corresponding local oscillator signal to perform a scanning process.
The intermediate frequency port of the mixer is connected with any signal generator, and the local oscillation port is connected with a microwave source and is used for combining the received local oscillation signal with the intermediate frequency signal and outputting a radio frequency signal through a radio frequency port (namely an R port shown in figure 3). The input port of the mixer (in this embodiment, the intermediate frequency port is taken as an example) may have only one port, or may include multiple ports, for example, two ports including an in-phase component (I) and a quadrature component (Q), i.e., the I port and the Q port shown in fig. 3.
The spectrum analyzer is connected with the radio frequency port of the mixer and is mainly used for receiving the radio frequency signal output by the mixer and carrying out corresponding analysis to generate an analysis result.
The upper computer is connected with any signal generator, a microwave source and a spectrum analyzer, and is mainly used for correspondingly controlling the start and stop of the signal generator and the generated intermediate frequency signal, correspondingly controlling the start and stop of the microwave source and the generated local oscillator signal, acquiring an analysis result generated by the spectrum analyzer and carrying out corresponding parameter calculation.
As shown in fig. 1 and 4, the method includes:
s101, the upper computer determines preset first scanning information, wherein the first scanning information comprises a first scanning range, first scanning points and a threshold value.
Before the first scan is performed, the first scan information needs to be set correspondingly, which may be set by the user or may be set according to a corresponding rule, for example, according to a history of operation, etc. After the first scanning information is set, the upper computer can acquire the first scanning information. The first scan information may include a first scan range, a first scan point number, and a threshold value. The first scanning range refers to a range of voltage values when any signal generator transmits a signal during the first scanning. The number of scanning points refers to the number of points to be scanned in the scanning range, and the number of first scanning points represents the number of corresponding scanning points in the first scanning process. Wherein the different scanned points correspond to different voltage values of the signal input by any signal generator, and the scanned points are generally uniformly distributed in the scanning range, i.e. the difference between the voltage values corresponding to every two scanned points is the same, and the difference can be called a step value during operation.
Further, the first scanning range may correspond to the voltage output range of the arbitrary signal generator, and the first scanning range is made as close to the voltage output range of the arbitrary signal generator as possible, so that the scanning range is as large as possible. The number of the first scanning points is also higher than a first preset threshold, the first preset threshold is related to the voltage precision of any signal generator, and the number of the first scanning points is set higher than the first preset threshold, so that the condition that the candidate voltage value cannot be found later due to too low finish reading in the first scanning process can be prevented. The higher the voltage accuracy, the higher the first preset threshold value is generally.
S102, controlling the arbitrary signal generator, the microwave source and the mixer to perform first scanning according to the first scanning information.
After the first scanning information is determined, the upper computer can control any signal transmission, microwave source and mixer to carry out first scanning. The upper computer may first determine a first step value according to the first scan information. How to determine the step values is described in the above embodiments, and the step values may be implemented according to the explanation related to the step values, which is not described herein. After the first step value is obtained, the arbitrary signal generator can be controlled to send an input signal to the mixer and the microwave source can be controlled to send a local oscillation signal to the mixer based on the first step value, the first scanning range and a preset initial voltage value. The initial voltage value may be set randomly or based on a preset algorithm. The preset algorithm may be: firstly, determining the highest voltage value and the lowest voltage value corresponding to the scanning range, then, calculating the average value of the highest voltage value and the lowest voltage value, and taking the average value as the optimal voltage value. For example, when the highest voltage value is 0.1V and the lowest voltage value is-0.1V, the optimal voltage value is 0V.
Further, in the scanning process, an arbitrary signal generator is first controlled to send an input signal corresponding to the initial voltage value to the mixer. Then, the initial voltage value is increased or decreased by the voltage value corresponding to the first step value, and then the input signal corresponding to the calculated voltage value is continuously sent until the voltage value reaches the maximum voltage value or the minimum voltage value corresponding to the first scanning range, and the first scanning process is completed.
S103, receiving a first scanning result sent by the spectrum analyzer, and selecting a plurality of candidate voltage values based on the threshold value and the first scanning result.
In the first scanning process, the mixer outputs corresponding output signals to the spectrum analyzer, and the spectrum analyzer can perform corresponding analysis on the output signals and obtain a first scanning result after the first scanning is finished. And then the spectrum analyzer can send the first scanning result to the upper computer, and the upper computer can perform corresponding calculation and processing.
Specifically, when the upper computer processes, the upper computer can select a plurality of candidate voltage values from the first scanning results based on the threshold value. When selecting, selecting a voltage value of which the local oscillation signal is lower than the threshold value from the output signals corresponding to the first scanning result. Since the voltage value that meets the condition is low in the output signal, the voltage value or a voltage value in the vicinity thereof is likely to appear as an optimal voltage value, and therefore, the voltage value that meets the condition can be taken as a candidate voltage value.
S104, determining preset second scanning information, wherein the second scanning information comprises a voltage relative value and second scanning points, and the voltage relative value corresponds to a second scanning range.
The preset second scan information may be determined at this time, and the second scan information may be set after the end of the first scan process, or may be set before the first scan process, which is not limited herein. The second scanning process comprises a voltage relative value and a second scanning point number. The voltage relative value corresponds to the second scanning range, that is, the size of the second scanning range can be determined according to the size of the relative value. The number of the second scanning points is also larger than a second preset threshold, the specific setting reasons and the specific setting process are similar to those of the first scanning points, and the description is omitted again.
And S105, controlling the arbitrary signal generator, the microwave source and the mixer to perform second scanning based on the second scanning information and the plurality of candidate voltage values.
S106, receiving a second scanning result sent by the spectrum analyzer, and selecting an optimal voltage value based on the second scanning result.
After the second scan information is determined, the second scan can be performed according to the second scan information and the determined candidate voltage values. And after the second scanning is finished, obtaining the corresponding optimal voltage value in the whole scanning process according to the second scanning result. The optimum voltage value indicates that the signal is input to the mixer at the optimum voltage value, and the influence of the local oscillation signal is minimal in the output signal of the mixer.
When the second scanning process is performed, similar to the first scanning process, the second step value is calculated according to the voltage relative value and the second scanning point number. The formula can be used: second step value=voltage relative value×2/scan point number. Then, for each candidate voltage value, controlling any signal generator to send an input signal corresponding to the candidate voltage value to the mixer. And then, after the candidate voltage value is increased or decreased by a second step value, a recalculated voltage value is obtained, and an arbitrary signal generator is controlled to send an input signal corresponding to the recalculated voltage value to the mixer until the recalculated voltage value reaches a scanning range corresponding to the voltage relative value, so that the scanning process for the candidate voltage value is completed. And then the like, the scanning process of all the candidate voltage values is completed, namely the second scanning process is completed.
In one embodiment, when a plurality of input ports for receiving input signals are provided in the mixer, a plurality of ports for transmitting input signals are also provided in any signal generator, for example, when the number of input ports is two, it may be two input ports of in-phase component (I) and quadrature component (Q), respectively, and in this case, the first scanning range includes a first scanning range corresponding to each input port. When determining the candidate voltage values and the optimal voltage values, a candidate voltage value combination and an optimal voltage value combination can be obtained, wherein each candidate voltage value combination comprises candidate voltage values corresponding to two input ports, and the optimal voltage value combination comprises optimal voltage values corresponding to two input ports.
As shown in fig. 2, the embodiment of the present application further provides a dc offset calibration device of a mixer, where the dc offset calibration device is applied in a dc offset calibration system, where the dc offset calibration system includes an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer, and an upper computer, and the device includes:
at least one processor; the method comprises the steps of,
a memory communicatively coupled to the at least one processor; wherein, the liquid crystal display device comprises a liquid crystal display device,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method as described in any one of the embodiments above.
The embodiment of the application also provides a non-volatile computer storage medium for calibrating the direct current bias of the mixer, which stores computer executable instructions, and is characterized in that the non-volatile computer storage medium is applied to a direct current bias calibration system, the direct current bias calibration system comprises any signal generator, a microwave source, the mixer, a spectrum analyzer and an upper computer, and the computer executable instructions are set as follows: a method as in any above embodiment.
All embodiments in the application are described in a progressive manner, and identical and similar parts of all embodiments are mutually referred, so that each embodiment mainly describes differences from other embodiments. In particular, for the apparatus and medium embodiments, the description is relatively simple, as it is substantially similar to the method embodiments, with reference to the section of the method embodiments being relevant.
The devices and media provided in the embodiments of the present application are in one-to-one correspondence with the methods, so that the devices and media also have similar beneficial technical effects as the corresponding methods, and since the beneficial technical effects of the methods have been described in detail above, the beneficial technical effects of the devices and media are not described in detail herein.
It will be appreciated by those skilled in the art that embodiments of the present application may be provided as a method, system, or computer program product. Accordingly, the present application may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present application is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
In one typical configuration, a computing device includes one or more processors (CPUs), input/output interfaces, network interfaces, and memory.
The memory may include volatile memory in a computer-readable medium, random Access Memory (RAM) and/or nonvolatile memory, such as Read Only Memory (ROM) or flash memory (flash RAM). Memory is an example of computer-readable media.
Computer readable media, including both non-transitory and non-transitory, removable and non-removable media, may implement information storage by any method or technology. The information may be computer readable instructions, data structures, modules of a program, or other data. Examples of storage media for a computer include, but are not limited to, phase change memory (PRAM), static Random Access Memory (SRAM), dynamic Random Access Memory (DRAM), other types of Random Access Memory (RAM), read Only Memory (ROM), electrically Erasable Programmable Read Only Memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital Versatile Discs (DVD) or other optical storage, magnetic cassettes, magnetic tape magnetic disk storage or other magnetic storage devices, or any other non-transmission medium, which can be used to store information that can be accessed by a computing device. Computer-readable media, as defined herein, does not include transitory computer-readable media (transmission media), such as modulated data signals and carrier waves.
It should also be noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article or apparatus that comprises the element.
The foregoing is merely exemplary of the present application and is not intended to limit the present application. Various modifications and changes may be made to the present application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc. which are within the spirit and principles of the present application are intended to be included within the scope of the claims of the present application.

Claims (8)

1. The direct current offset calibration method of the mixer is characterized by being applied to a direct current offset calibration system, wherein the direct current offset calibration system comprises an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer and an upper computer, and the method comprises the following steps:
the upper computer determines preset first scanning information, wherein the first scanning information comprises a first scanning range, first scanning points and a threshold value;
according to the first scanning information, controlling the arbitrary signal generator, the microwave source and the mixer to perform first scanning;
receiving a first scanning result sent by the spectrum analyzer, and selecting a plurality of candidate voltage values based on the threshold value and the first scanning result;
determining preset second scanning information, wherein the second scanning information comprises a voltage relative value and second scanning points, and the voltage relative value corresponds to a second scanning range;
controlling the arbitrary signal generator, the microwave source and the mixer to perform a second scanning based on the second scanning information and the plurality of candidate voltage values;
receiving a second scanning result sent by the spectrum analyzer, and selecting an optimal voltage value based on the second scanning result;
selecting a number of candidate voltage values based on the threshold value and the first scan result, including:
selecting a voltage value of which the local oscillation signal is lower than the threshold value from the output signals corresponding to the first scanning result as a candidate voltage value;
selecting an optimal voltage value based on the second scanning result, including:
selecting the lowest voltage value of the local oscillation signal as the optimal voltage value in each output signal corresponding to the second scanning result;
according to the first scanning information, controlling the arbitrary signal generator, the microwave source and the mixer to perform first scanning, including:
determining a first stepping value according to the first scanning range and the first scanning point number;
based on the first step value, the first scanning range and a preset initial voltage value, controlling the arbitrary signal generator to send an input signal to the mixer, and controlling the microwave source to send a local oscillation signal to the mixer;
based on the second scanning information and the plurality of candidate voltage values, controlling the arbitrary signal generator, the microwave source and the mixer to perform second scanning comprises the following steps:
determining a second stepping value according to the voltage relative value and the second scanning point number;
and controlling the arbitrary signal generator to send an input signal to the mixer and controlling the microwave source to send a local oscillation signal to the mixer based on the second stepping value, the voltage relative value and the plurality of candidate voltage values.
2. The method of claim 1, wherein controlling the arbitrary signal generator to send an input signal to the mixer and controlling the microwave source to send a local oscillator signal to the mixer based on the first step value, the first scan range, and a preset initial voltage value comprises:
controlling the arbitrary signal generator to send the input signal corresponding to the initial voltage value to the mixer;
after the initial voltage value is increased or decreased by the first step value, a recalculated voltage value is obtained, and the arbitrary signal generator is controlled to send the input signal corresponding to the recalculated voltage value to the mixer until the recalculated voltage value reaches the voltage value corresponding to the first scanning range;
based on the second step value, the voltage relative value, and the plurality of candidate voltage values, controlling the arbitrary signal generator to transmit an input signal to the mixer, and controlling the microwave source to transmit a local oscillator signal to the mixer, includes:
for each candidate voltage value in the plurality of candidate voltage values, controlling the arbitrary signal generator to send the input signal corresponding to the candidate voltage value to the mixer;
and after the candidate voltage value is increased or decreased by the second step value, a recalculated voltage value is obtained, and the arbitrary signal generator is controlled to send the input signal corresponding to the recalculated voltage value to the mixer until the recalculated voltage value reaches a scanning range corresponding to the voltage relative value.
3. The method of claim 1, wherein determining a second step value based on the voltage relative value and the second number of scan points comprises:
second step value = the voltage relative value x 2/the second scan point number.
4. The method of claim 1, wherein the first scan range corresponds to a voltage output range of the arbitrary signal generator.
5. The method of claim 1, wherein the first number of scans is above a first predetermined threshold and the second number of scans is above a second predetermined threshold, the first predetermined threshold and the second predetermined threshold being related to voltage accuracy of the arbitrary signal generator.
6. The method of claim 1, wherein the mixer is provided with a plurality of input ports for receiving input signals, the first scanning range comprising a first scanning range corresponding to each of the input ports;
selecting a number of candidate voltage values based on the threshold value and the first scan result, including:
selecting a plurality of candidate voltage value combinations based on the threshold value and the first scanning result, wherein each candidate voltage value combination comprises candidate voltage values respectively corresponding to a plurality of input ports;
selecting an optimal voltage value based on the second scanning result, including:
and selecting an optimal voltage value based on the second scanning result, wherein the optimal voltage value combination comprises a plurality of optimal voltage values respectively corresponding to the input ports.
7. A direct current offset calibration device for a mixer, the direct current offset calibration device being used in a direct current offset calibration system, the direct current offset calibration system comprising an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer, and an upper computer, the device comprising:
at least one processor; the method comprises the steps of,
a memory communicatively coupled to the at least one processor; wherein, the liquid crystal display device comprises a liquid crystal display device,
the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-6.
8. A non-volatile computer storage medium storing computer executable instructions for dc offset calibration of a mixer, the non-volatile computer storage medium being used in a dc offset calibration system, the dc offset calibration system comprising an arbitrary signal generator, a microwave source, a mixer, a spectrum analyzer, and a host computer, the computer executable instructions configured to: a method as claimed in any one of claims 1 to 6.
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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002084870A2 (en) * 2001-04-17 2002-10-24 Telefonaktiebolaget Lm Ericsson (Publ) Methods and apparatus for tuning rf-filters in radio receivers
CN101330332A (en) * 2007-06-22 2008-12-24 中兴通讯股份有限公司 Zero intermediate frequency calibration method for board for receiving and sending message
CN102123116A (en) * 2011-03-11 2011-07-13 京信通信系统(中国)有限公司 Direct-current offset calibration method and device
CN103166900A (en) * 2011-12-15 2013-06-19 北京北广科技股份有限公司 Intelligent testing method and system of digital television exciter
CN105395200A (en) * 2015-12-02 2016-03-16 沈阳东软医疗系统有限公司 Scanning method and radio-frequency power calibration method and device of magnetic resonance imaging system
CN106546911A (en) * 2016-09-29 2017-03-29 江苏艾科半导体有限公司 A kind of VOH/VOL calibration steps of ATE digit drivers
CN110865235A (en) * 2019-11-29 2020-03-06 山东浪潮人工智能研究院有限公司 Automatic calibration system and method for frequency mixer

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8615205B2 (en) * 2007-12-18 2013-12-24 Qualcomm Incorporated I-Q mismatch calibration and method
US9729110B2 (en) * 2013-03-27 2017-08-08 Qualcomm Incorporated Radio-frequency device calibration
US9934348B2 (en) * 2015-12-18 2018-04-03 International Business Machines Corporation Adjusting scan connections based on scan control locations

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2002084870A2 (en) * 2001-04-17 2002-10-24 Telefonaktiebolaget Lm Ericsson (Publ) Methods and apparatus for tuning rf-filters in radio receivers
CN101330332A (en) * 2007-06-22 2008-12-24 中兴通讯股份有限公司 Zero intermediate frequency calibration method for board for receiving and sending message
CN102123116A (en) * 2011-03-11 2011-07-13 京信通信系统(中国)有限公司 Direct-current offset calibration method and device
CN103166900A (en) * 2011-12-15 2013-06-19 北京北广科技股份有限公司 Intelligent testing method and system of digital television exciter
CN105395200A (en) * 2015-12-02 2016-03-16 沈阳东软医疗系统有限公司 Scanning method and radio-frequency power calibration method and device of magnetic resonance imaging system
CN106546911A (en) * 2016-09-29 2017-03-29 江苏艾科半导体有限公司 A kind of VOH/VOL calibration steps of ATE digit drivers
CN110865235A (en) * 2019-11-29 2020-03-06 山东浪潮人工智能研究院有限公司 Automatic calibration system and method for frequency mixer

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
Quadrature Errors and DC Offsets Calibration of Analog Complex Cross-Correlator for Interferometric Passive Millimeter-Wave Imaging Applications;Chao Wang et al.;Sensors;第18卷(第2期);677 *
一种零中频接收机的直流偏置校准技术;梁晓峰 等;现代信息科技(2019年第10期);38-41 *
扫频接收机中宽带频响自动补偿技术;张宁;《电子质量》(第04期);35-37页 *

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