CN112415433A - Long-lead short-circuit fault point positioning device and method - Google Patents
Long-lead short-circuit fault point positioning device and method Download PDFInfo
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- CN112415433A CN112415433A CN201910772276.4A CN201910772276A CN112415433A CN 112415433 A CN112415433 A CN 112415433A CN 201910772276 A CN201910772276 A CN 201910772276A CN 112415433 A CN112415433 A CN 112415433A
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- 238000012360 testing method Methods 0.000 claims abstract description 41
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- 239000004020 conductor Substances 0.000 claims abstract description 3
- 238000005259 measurement Methods 0.000 claims description 5
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/08—Locating faults in cables, transmission lines, or networks
- G01R31/081—Locating faults in cables, transmission lines, or networks according to type of conductors
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Abstract
本发明提出了一种长导线短路故障点定位装置，包括：主控MCU，恒流源，高精度仪用放大器，高精度ADC，显示屏；其中，所述主控MCU为STM32H743；所述恒流源作为激励信号，接在测试点的一端；所述高精度仪用放大器接在两个测试点，放大两个测试点的差模电压；在所述高精度仪用放大器的输出端接到所述高精度ADC的输入端，测量放大后的两个测试点间的差模电压；测得差模电压后，通过SPI协议完成所述高精度ADC和所述主控MCU的通信，所述主控MCU收到数据后，反推出短路故障点距离测试点的位置；所述显示屏用于显示。
The invention proposes a long-conductor short-circuit fault point locating device, comprising: a main control MCU, a constant current source, a high-precision instrument amplifier, a high-precision ADC, and a display screen; wherein, the main control MCU is STM32H743; The current source is used as an excitation signal and is connected to one end of the test point; the amplifier for the high-precision instrument is connected to the two test points to amplify the differential mode voltage of the two test points; the output end of the amplifier for the high-precision instrument is connected to The input end of the high-precision ADC measures the differential-mode voltage between the two amplified test points; after the differential-mode voltage is measured, the communication between the high-precision ADC and the main control MCU is completed through the SPI protocol, and the After the main control MCU receives the data, it inverts the position of the short-circuit fault point from the test point; the display screen is used for display.
Description
Technical Field
The invention relates to the field of fault detection, in particular to a long-conductor short-circuit fault point positioning device and method.
Background
Short-circuit failure is one of the most prone failure modes, and the conventional measurement of the short-circuit failure point is as follows: the utility model discloses a short-circuit fault detection device, including the universal meter, the short-circuit fault detection device is used to detect the short-circuit fault of long wire, and the short-circuit fault detection device is used to detect the short-circuit fault of long wire.
At present, no long-lead short-circuit fault point positioning device exists in the market.
Disclosure of Invention
Aiming at the defects of the prior art, the invention provides the long-lead short-circuit fault point positioning device and method which are simple in structure, low in cost, convenient to use and accurate in test.
The invention has the main functions of detecting the short circuit of the long lead, simultaneously accurately analyzing the position of a short-circuit fault point and displaying the distance from the test point on a display screen.
In order to realize the functions, the invention provides the following technical scheme: the utility model provides a long wire short circuit fault point positioner, includes a master control MCU, MCU is STM32H743, a constant current source, a high accuracy is amplifier for the appearance, a high accuracy ADC, and a display screen is used for showing.
The functionality of the present invention is thus implemented. The idea of the invention is that the length of the wire can be analyzed by measuring the resistance of the wire between the measuring points, thereby reversely deducing the position of the short-circuit point. In order to measure the size of the wire resistance, a constant current source is adopted as an excitation signal and connected to one end of a test point, an amplifier for the high-precision instrument is connected to two test points to amplify the differential mode voltage of the two test points, the output end of the amplifier for the high-precision instrument is connected to the input end of a high-precision ADC, and the amplified differential mode voltage between the two test points is measured. After the differential mode voltage is measured, the communication between the high-precision ADC and the master control MCU is completed through the SPI protocol, and after the master control MCU receives the data, the position of the short-circuit fault point and the distance test point is reversely deduced.
The long lead is made of uniform materials and has good linearity, so that resistivity information of the long lead needs to be obtained before testing, 3cm and 5cm leads are clamped between two testing points respectively before formal measurement, voltage values of corresponding position points are stored according to the prompt of a display screen, a straight line is determined according to the theorem of two points, and the main control MCU obtains the corresponding relation between the distance and the voltage values according to the voltage values of the two points. When the position of the short-circuit point is tested, the two ends of the wire are clamped between the two test points, at the moment, the constant current source is electrified, after the voltage of the short-circuit point is stable, the distance between the short-circuit point and the test point A is calculated according to the measured voltage and is displayed on the display screen, and at the moment, a user can quickly find the position of the short-circuit fault point according to the numerical value displayed on the display screen to perform quick troubleshooting.
Drawings
FIG. 1 is a schematic diagram of the overall scheme of the present invention;
FIG. 2 is a schematic view of an interface according to the present invention;
FIG. 3 is a circuit diagram of a constant current source of the present invention;
FIG. 4 is a circuit diagram of an amplifier for a high-precision instrument according to the present invention;
FIG. 5 is a circuit diagram of a high-precision ADC according to the present invention;
FIG. 6 is a code flow diagram of the present invention;
Detailed Description
The invention is further described in detail with reference to the following specific examples and the accompanying drawings. The procedures, conditions, experimental methods and the like for carrying out the present invention are general knowledge and common general knowledge in the art except for the contents specifically mentioned below, and the present invention is not particularly limited.
Referring to the attached figure 1, the main body of the invention is a constant current source, a high-precision instrument amplifier, a high-precision ADC, a main control MCU and a display screen.
Referring to fig. 2, in addition to identifying the position of the short-circuit point, the interface of the present invention is further provided with three touch buttons, namely, a "3 cm" acquisition, a "5 cm" acquisition, and a "start test". After a user starts the machine, the test point is clamped at the positions of 3cm and 5cm, the 3cm acquisition button is pressed after the 3cm position is clamped, the 5cm acquisition button is pressed after the 5cm position is clamped, at the moment, the voltage values at the positions of 3cm and 5cm are stored by the main control MCU, and the relation between the coordinate and the voltage is calculated. And clamping the long lead at A, B, pressing a 'start test' button, reading the voltage value of the high-precision AD by the main control MCU, deducing the distance from the short circuit point to the test point according to the calculated formula, and displaying the distance at the corresponding position of the display screen. And the display screen is communicated with the main control MCU through a serial port.
Referring to fig. 3, as shown in the schematic diagram of the constant current source, the AD5060 is a programmable 16-bit DAC, the magnitude of the output current of the constant current source can be precisely controlled by the MCU, and the communication mode between the AD5060 and the master MCU is SPI. REF3220 is a reference source chip of TI company, and its excellent low temperature drift characteristic can be used as a reference source of the AD5060, thereby ensuring that the output value of the constant current source is stable. According to the ohm theorem, the differential mode voltage of the two test points is stable when the same short-circuit fault point is ensured.
Referring to fig. 4, a schematic diagram of the amplifier for high-precision instruments is shown, the amplifier for high-precision instruments uses AD8227 manufactured by ADI corporation, and has excellent common mode rejection ratio, and can amplify differential mode voltage in microvolt level, thereby meeting the requirement of high precision in the present invention. The gain of the AD8227 can support an external resistance setting, which can be set by R1 and R2 in fig. 4. In the invention, the differential mode signals of the two test points are amplified by 20 times so as to ensure the precision of 1 cm.
Referring to fig. 5, the high-precision ADC is AD7793 manufactured by ADI corporation, suitable for high-precision measurement applications, and incorporates a low-noise 24-bit ADC with three differential analog inputs. An internal reference source may be used, also supporting an external reference source, several diodes in fig. 5 providing protection for the input pins of AD 7793.
Referring to fig. 6, the work flow of the master MCU is as follows. After the computer is started, when a 3cm acquisition key on the touch screen is pressed, a voltage value of 3cm is stored, when a 5cm acquisition key on the touch screen is pressed, a voltage value of 5cm is stored, and if a start test key is pressed before the voltage value of 3cm and the voltage value of 5cm are acquired, the key is judged to be invalid, and the computer returns to the previous state. When the voltage value at the position of 3cm and the voltage value at the position of 5cm are both collected, the relationship between the distance and the voltage value is calculated by the main control MCU according to the two values, the relation is judged to be effective after the 'start test' button is pressed, and the main control MCU can display the distance between the current short-circuit fault point and the test point and display the distance on the display screen.
Examples of the embodiments
The actual measurement result of the device for testing the short-circuit fault point is shown in table 1, and the error of the short-circuit fault point is judged to be within 1 cm.
TABLE 1 test example of short-circuit failure points
The protection of the present invention is not limited to the above embodiments. Variations and advantages that may occur to those skilled in the art may be incorporated into the invention without departing from the spirit and scope of the inventive concept, and the scope of the appended claims is intended to be protected.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201910772276.4A CN112415433A (en) | 2019-08-21 | 2019-08-21 | Long-lead short-circuit fault point positioning device and method |
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| CN201910772276.4A CN112415433A (en) | 2019-08-21 | 2019-08-21 | Long-lead short-circuit fault point positioning device and method |
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Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100102824A1 (en) * | 2007-04-18 | 2010-04-29 | Mario Tremblay | Electrical network fault location by distributed voltage measurements |
| CN102707190A (en) * | 2012-01-10 | 2012-10-03 | 成都唐源电气有限责任公司 | Direct-current-side short-circuit fault distance measuring device and method of metro tractive power supply system |
| CN102967796A (en) * | 2012-10-31 | 2013-03-13 | 陕西海泰电子有限责任公司 | Detecting method for short dot position of cable |
| CN105425100A (en) * | 2015-11-04 | 2016-03-23 | 上海电气电站设备有限公司 | Method for measuring degree of turn-to-turn short-circuit fault of rotor and accurately positioning same |
| CN106353643A (en) * | 2016-11-09 | 2017-01-25 | 雷细军 | Resistance proportion cable fault tester |
| CN106405326A (en) * | 2016-08-25 | 2017-02-15 | 华南理工大学 | Time-domain fault range finding method for co-tower double-loop DC power transmission line based on single-loop electrical quantity |
-
2019
- 2019-08-21 CN CN201910772276.4A patent/CN112415433A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100102824A1 (en) * | 2007-04-18 | 2010-04-29 | Mario Tremblay | Electrical network fault location by distributed voltage measurements |
| CN102707190A (en) * | 2012-01-10 | 2012-10-03 | 成都唐源电气有限责任公司 | Direct-current-side short-circuit fault distance measuring device and method of metro tractive power supply system |
| CN102967796A (en) * | 2012-10-31 | 2013-03-13 | 陕西海泰电子有限责任公司 | Detecting method for short dot position of cable |
| CN105425100A (en) * | 2015-11-04 | 2016-03-23 | 上海电气电站设备有限公司 | Method for measuring degree of turn-to-turn short-circuit fault of rotor and accurately positioning same |
| CN106405326A (en) * | 2016-08-25 | 2017-02-15 | 华南理工大学 | Time-domain fault range finding method for co-tower double-loop DC power transmission line based on single-loop electrical quantity |
| CN106353643A (en) * | 2016-11-09 | 2017-01-25 | 雷细军 | Resistance proportion cable fault tester |
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