CN112399175B - Test platform of ARINC818 daughter card - Google Patents
Test platform of ARINC818 daughter card Download PDFInfo
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- CN112399175B CN112399175B CN202011227312.8A CN202011227312A CN112399175B CN 112399175 B CN112399175 B CN 112399175B CN 202011227312 A CN202011227312 A CN 202011227312A CN 112399175 B CN112399175 B CN 112399175B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N17/00—Diagnosis, testing or measuring for television systems or their details
- H04N17/004—Diagnosis, testing or measuring for television systems or their details for digital television systems
Abstract
The invention discloses a test platform of ARINC818 daughter card, comprising: a digital video interface DVI signal case, an ARINC818 daughter card test case and a display; a plurality of ARINC818 daughter cards are fixedly arranged in the ARINC818 daughter card test case through a test adapter plate; when the test platform carries out environment test and test verification on the ARINC818 daughter card, the ARINC818 daughter card test case is placed in a test incubator, and simultaneously a plurality of ARINC818 daughter cards in the ARINC818 daughter card test case are tested and verified; and the DVI signal case and the display are positioned outside the test incubator during the test. The invention gets rid of the dependence on one-to-one accompanying test equipment, and can realize the simultaneous test and test of 4ARINC818 daughter cards; the test platform has high reliability and good compatibility. The operation is convenient.
Description
The technical field is as follows:
the present invention relates to the field of computer hardware technology, and is especially one kind of ARINC818 daughter card test platform for test system.
Background art:
the ARINC818 protocol (avionics environment digital video bus protocol) is a digital video interface standard established for video transmission in an avionics environment, and is used in a plurality of types of machines such as foreign a400M, boeing 787, domestic C919 and the like. The ARINC818 daughter card product is used as a digital video transmission end node of an avionics system, provides a Digital Video Interface (DVI) receiving port- > ARINC818 sending port protocol and data conversion and the ARINC818 receiving port- > DVI sending port protocol and data conversion functions, and provides an electrical interface or an optical interface for an external ARINC818 port according to different module types by the ARINC818 daughter card. Prior to delivery of the ARINC818 daughter card, the ARINC818 daughter card needs to be tested, tried and approved.
In the conventional design, the ARINC818 daughter card does not have an independent detection excitation source and a test environment, and the ARINC818 daughter card needs to be coupled with the main control module, and then excitation is applied in the environment of the whole machine or the tool by the main control module to perform test and experimental verification. The single-node computer has the advantages that the throughput of the realization mode requiring the host environment accompanying test is extremely low, the main control module is excessively dependent, the long-time accompanying test inevitably causes the loss of the main control module, the economy is poor, and the test cost and the test time cannot meet the test requirements of a large number of ARINC node computers, so that the platform supporting a plurality of ARINC818 daughter cards to simultaneously carry out the test and the test is very urgent.
The invention content is as follows:
the purpose of the invention is: the embodiment of the invention provides a test platform for ARINC818 daughter cards, which is used for solving the problems of excessive dependence on test accompanying equipment, poor test convenience, low throughput and the like in the traditional test mode of ARINC818 nodes, so that the related work of test and experiment can be simultaneously carried out by a plurality of ARINC818 daughter cards, and the test throughput and convenience are improved.
The technical solution of the invention is as follows: the embodiment of the invention provides a test platform of an ARINC818 daughter card, which is characterized by comprising the following components: a digital video interface DVI signal case, an ARINC818 daughter card test case and a display;
wherein, DVI signal machine case includes: DVI signal source, DVI exchanger and DVI image integration equipment; the DVI signal case and the ARINC818 daughter card test case are interconnected through a DVI cable;
a plurality of ARINC818 daughter cards are fixedly arranged in the ARINC818 daughter card test case through a test adapter plate;
the testing platform is used for placing the ARINC818 daughter card testing case in the testing incubator when carrying out environment testing and testing verification on the ARINC818 daughter card, and simultaneously carrying out testing and testing verification on a plurality of ARINC818 daughter cards in the ARINC818 daughter card testing case; and the DVI signal case and the display are positioned outside the test incubator during the test.
Alternatively, in the test platform for the ARINC818 daughter card described above,
the ARINC818 daughter card test case comprises: the structure comprises a case structure part, a motherboard positioned inside the case structure part and an aviation connector arranged outside the case structure part; the motherboard is provided with a power supply and a plurality of test adapter plates; the test adapter board is used for correspondingly inserting the fixed optical interface ARINC818 daughter card or the electrical interface ARINC818 daughter card one by one;
the ARINC818 daughter cards at least comprise 4 daughter cards, in the test process, the daughter card 1 and the daughter card 2 carry out communication test according to a preset test data flow direction, and the daughter card 3 and the daughter card 4 carry out communication test according to a preset test data flow direction.
Alternatively, in the test platform for the ARINC818 daughter card described above,
the DVI signal source in the DVI signal source case is provided by the DVI interface video data generating device, and the DVI interface video data generating device is used for generating specific DVI image data and outputting the specific DVI image data to the DVI exchanger through the DVI interface.
Alternatively, in the test platform for the ARINC818 daughter card described above,
the DVI exchanger in the DVI signal source case is a DVI image branching device and is used for dividing 1 path of DVI image into at least 4 paths of same DVI image output, and an output DVI interface of the DVI exchanger is connected to a test adapter plate DVI input interface in a one-to-one correspondence manner through an aviation connector and a mother board at the front end of the ARINC818 daughter card test case;
the 4-channel DVI output interface at the rear end of the ARINC818 daughter card test case is connected to a DVI image integration device and used for integrating and displaying at least 4 channels of DVI output images at the rear end of the ARINC818 daughter card test case through DVI image integration equipment.
Alternatively, in the test platform for the ARINC818 daughter card described above,
the test adapter plate in the ARINC818 daughter card testing machine box is divided into the following components according to different ARINC818 daughter card types: an electrical interface adapter board for an electrical interface ARINC818 daughter card and an optical interface adapter board for an optical interface ARINC818 daughter card; the backplane connector of the adapter board is a uniform photoelectric mixed connector and is coupled with the ARINC818 daughter card through a high-speed inter-board daughter card connector;
in the electrical interface adapter plate, an inter-board daughter card connector is arranged close to a backplane connector, a plurality of electrical interfaces of the photoelectric mixed connector are respectively set as ARINC818 electrical receiving signals, ARINC818 electrical sending signals, DVI receiving signals, DVI sending signals and 5V power supply, and the photoelectric mixed connector leads the signals to the high-speed inter-board daughter card connector;
in the optical interface adapter plate, a photoelectric transceiver on an ARINC818 daughter card and the outgoing direction of a tail fiber of the photoelectric transceiver are aligned with a photoelectric mixed connector, an MT connector at the tail end of the tail fiber is fixed on an optical interface of the photoelectric mixed connector, a plurality of electrical interfaces of the photoelectric mixed connector are respectively set to be DVI receiving signals, DVI sending signals and 5V power supply, and the photoelectric mixed connector leads the signals to the daughter card connector between high-speed boards.
Alternatively, in the test platform for the ARINC818 daughter card described above,
in the ARINC818 daughter card testing machine box, at least 4ARINC818 daughter card slots and power supplies are arranged on a mother board;
the power supply is used for converting the voltage of 28V to 5V input from the outside and supplying power to the ARINC818 daughter card on at least 4 slots; and the positions of the daughter cards are sequentially set to be the daughter cards 1 to 4 according to a preset direction.
Alternatively, in the test platform for the ARINC818 daughter card described above,
ARINC818 electrical signal wiring rules in the motherboard include:
the ARINC818 electrical transmit signal of daughter card 1 is connected to the ARINC818 electrical receive signal of daughter card 2, the ARINC818 electrical receive signal of daughter card 1 is connected to the ARINC818 electrical transmit signal of daughter card 2;
the ARINC818 electrical transmit signal of daughter card 3 is connected to the ARINC818 electrical receive signal of daughter card 4 and the ARINC818 electrical receive signal of daughter card 3 is connected to the ARINC818 electrical transmit signal of daughter card 4.
Optionally, in the test platform of the ARINC818 daughter card as described above, the optical interface on the optoelectronic hybrid connector is configured to: the interconnection of ARINC818 optical signals between slots corresponding to the daughter card 1 and the daughter card 2 and the interconnection of ARINC818 optical signals between slots corresponding to the daughter card 3 and the daughter card 4 are realized through optical fibers;
ARINC818 optical signal wiring rule in the motherboard comprises:
ARINC818 optical transmitting signals of the daughter card 1 are connected with ARINC818 optical receiving signals of the daughter card 2, and ARINC818 optical receiving signals of the daughter card 1 are connected with ARINC818 optical transmitting signals of the daughter card 2;
the ARINC818 optical transmit signals of the daughter card 3 are connected to the ARINC818 optical receive signals of the daughter card 4 and the ARINC818 optical receive signals of the daughter card 3 are connected to the ARINC818 optical transmit signals of the daughter card 4.
Optionally, in the test platform of ARINC818 daughter cards as described above, there are 4ARINC818 daughter cards in the test platform, and corresponding 4-way DVI input signal and 4-way DVI output signal
The test data flow direction of the ARINC818 daughter card test case during testing comprises the following steps:
the 1 st path of test data flow: DVI signal source- > DVI SWITCH- > 1 st DVI input- > daughter card 1DVI received signal- > daughter card 1ARINC818 electric/optical sent signal- > daughter card 2ARINC818 electric/optical received signal- > daughter card 2DVI output signal- > DVI image integration device- > display;
the 2 nd path test data flow direction: DVI signal source- > DVI SWITCH- > 2 nd path DVI input- > daughter card 2DVI received signal- > daughter card 2ARINC818 electric/optical sent signal- > daughter card 1ARINC818 electric/optical received signal- > daughter card 1DVI output signal- > DVI image integration device- > display;
the 4 th test data flow direction is as follows: DVI signal source- > DVI SWITCH- > 4 th DVI input- > daughter card 4DVI received signal- > daughter card 4ARINC818 electric/optical sent signal- > daughter card 3ARINC818 electric/optical received signal- > daughter card 3DVI output signal- > DVI image integration device- > display.
The invention has the advantages that:
(1) getting rid of one-to-one accompanying equipment dependence: the single DVI signal source and the display respectively realize the integration and display of front-end 4-channel DVI input and rear-end 4-channel DVI output images based on DVI SWITCH and DVI image integration equipment, complete the interconnection of corresponding data signals in a test case and realize the simultaneous test and test of 4ARINC818 daughter cards;
(2) the test platform has high reliability: in the test process, only the ARINC818 daughter card test case is arranged inside the incubator, and other devices are arranged outside the incubator and are interconnected through a DVI (digital visual interface), so that the loss of the platform is low, and the reliability is high;
(3) the compatibility is good: the adaptation of different types of electrical interface or optical interface ARINC818 daughter cards and the test and verification on the test platform can be realized only by replacing the adapter plate;
(4) the operation is convenient: the ARINC818 daughter card test platform equipment interconnection is only a DVI cable, and the platform is electrified to directly output a display result through a display.
Drawings
The accompanying drawings are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the example serve to explain the principles of the invention and not to limit the invention.
Fig. 1 is a schematic diagram of an interconnect structure of an ARINC818 daughter card test platform according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of an electrical interface patch panel and signal interconnections in the test platform of the ARINC818 daughter card provided by the embodiment of the present invention;
fig. 3 is a schematic structural diagram of an optical interface interposer and signal interconnections in a test platform of the ARINC818 daughter card according to an embodiment of the present invention;
fig. 4 is a schematic diagram of an ARINC818 daughter card test chassis and signal interconnections in an ARINC818 daughter card test platform provided by an embodiment of the present invention.
The specific implementation mode is as follows:
in order to make the objects, technical solutions and advantages of the present invention more apparent, embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be noted that the embodiments and features of the embodiments in the present application may be arbitrarily combined with each other without conflict.
Aiming at the defects of excessive dependence on test accompanying equipment, poor test convenience, low throughput and the like in the traditional test mode of the ARINC818 node, the invention innovatively provides a design scheme of a test platform of the ARINC818 daughter card, realizes the separation of a test accompanying main control module, and meets the requirements of simultaneously carrying out tests and experiments on a plurality of ARINC818 daughter cards.
The test platform of the ARINC818 daughter card provided by the embodiment of the invention mainly comprises a DVI signal source, an ARINC818 daughter card test case, DVI image integration equipment and a display; a plurality of electrical interface ARINC818 daughter cards and optical interface ARINC818 daughter cards are fixed in an ARINC818 daughter card test case through corresponding test adapter plates; during testing, only the testing case is arranged inside the testing incubator, the other devices are arranged outside the testing incubator, and the devices are interconnected through DVI cables; a single ARINC818 daughter card test chassis supports at least 4ARINC818 daughter cards to conduct testing and testing simultaneously; the ARINC818 daughter cards with different structural types can be tested and tested on the test platform by adapting special test adapter boards.
The following specific embodiments of the present invention may be combined, and the same or similar concepts or processes may not be described in detail in some embodiments.
Fig. 1 is a schematic diagram of an interconnect structure of a test platform of ARINC818 daughter card according to an embodiment of the present invention. The test platform of the ARINC818 daughter card provided by the embodiment of the invention comprises: a digital video interface DVI signal case, an ARINC818 daughter card test case and a display.
As shown in fig. 1, in the interconnection structure of the test platform, the DVI signal cabinet includes: DVI signal source, DVI exchanger and DVI image integration equipment; the DVI signal case and the ARINC818 daughter card test case are interconnected through a DVI cable; a plurality of ARINC818 daughter cards are fixedly installed inside the ARINC818 daughter card test chassis through a test adapter plate.
Based on the hardware structure of the test platform, when the test platform is used for carrying out environment test and test verification on the ARINC818 daughter card, the ARINC818 daughter card test case is placed in a test incubator, and simultaneously a plurality of ARINC818 daughter cards in the ARINC818 daughter card test case are tested and verified; and the DVI signal case and the display are positioned outside the test incubator during the test. The test platform provided by the embodiment of the invention does not need to depend on accompanying test equipment.
The embodiments are described in detail below with reference to the accompanying drawings.
The test platform provided by the embodiment of the invention is mainly divided into the following structures, namely a DVI signal source generation and display part and an ARINC818 daughter card test case part, and the implementation mode and the data flow direction in the test process of the invention are explained in detail by taking a test platform of 4 paths of ARINC818 daughter cards as an example.
(1) DVI signal source generating and displaying part
The DVI signal source generation and display part consists of a DVI signal source case and a display, the part is positioned outside the incubator during test, and the DVI signal source case internally comprises a DVI signal source, a DVI switch (DVI SWITCH) and DVI image integration equipment.
The DVI signal source is a device for generating DVI interface video data, and can generate specific DVI image data and output the specific DVI image data to DVI SWITCH through the DVI interface.
DVI SWITCH is DVI image branching device, which can divide 1 path DVI image into 4 paths of same DVI image output, the output DVI interface is connected with 4 paths of DVI input interface at the front end of ARINC818 daughter card test case; the DVI image integration equipment realizes the integration and display of 4 paths of DVI output images at the rear end of the ARINC818 daughter card test case, 4 paths of output images can be integrated and then displayed in 1 display, and each path of image occupies 1/4. The whole DVI signal case is interconnected with the ARINC818 daughter card test case through a DVI cable.
(2) ARINC818 daughter card test case part
The ARINC818 daughter card test case consists of a test adapter plate, a mother board, a 28V-5V power supply, a case structural member and an aviation connector, and is positioned inside a test incubator during test.
The test pinboard can be divided into the following types according to different ARINC818 daughter card types: an electrical interface interposer (see fig. 2) for an electrical interface ARINC818 daughter card and an optical interface interposer for an optical interface ARINC818 daughter card; fig. 2 is a schematic diagram of an electrical interface interposer and signal interconnection in the test platform of the ARINC818 daughter card provided in the embodiment of the present invention, and fig. 3 is a schematic diagram of a structure of an optical interface interposer and signal interconnection in the test platform of the ARINC818 daughter card provided in the embodiment of the present invention.
The backplane connector of the adapter board in the embodiment of the invention adopts a uniform photoelectric mixed connector and is coupled with the ARINC818 daughter card through a daughter card connector between high-speed boards.
As shown in fig. 2, for the electrical interface adapter board, the daughter card connector between boards is placed close to the backplane connector, and the electrical interface portions of the opto-electrical hybrid connector are defined as ARINC818 electrical receive signal, ARINC818 electrical transmit signal, DVI receive signal, DVI transmit signal and 5V power supply, and these signal leads are connected to the daughter card connector between boards of high speed.
As shown in fig. 3, for the optical interface adapter board, the optoelectronic transceiver on the ARINC818 daughter card and the outgoing direction of the tail fiber thereof are placed in alignment with the optoelectronic mixed connector, the MT connector at the tail end of the tail fiber is fixed at the optical interface portion of the optoelectronic mixed connector, the electrical interface portion of the optoelectronic mixed connector is defined as DVI receiving signal, DVI sending signal and 5V power supply, and these signals are led to the daughter card connector between high speed boards.
Fig. 4 is a schematic diagram of an ARINC818 daughter card test chassis and signal interconnections in an ARINC818 daughter card test platform according to an embodiment of the present invention. The motherboard is configured with 4ARINC818 daughter card slots and 28V-5V power supplies that enable 28V to 5V external input voltage conversion and provide power to the ARINC818 daughter cards on the 4 slots.
In addition, in the embodiment of the present invention, routing of the electrical signals of the ainc 818 on the motherboard is strictly controlled, and as shown in fig. 4, the daughter card positions are defined from daughter card 1 to daughter card 4 from left to right.
On one hand, the ARINC818 electrical signal wiring rule between the corresponding slots of the daughter cards 1 and 2, and the daughter cards 3 and 4 in the mother board is as follows: the ARINC818 electrical transmit signal of daughter card 1 is connected to the ARINC818 electrical receive signal of daughter card 2, the ARINC818 electrical receive signal of daughter card 1 is connected to the ARINC818 electrical transmit signal of daughter card 2; similarly, the ARINC818 electrical transmit signal of the daughter card 3 is connected to the ARINC818 electrical receive signal of the daughter card 4, the ARINC818 electrical receive signal of the daughter card 3 is connected to the ARINC818 electrical transmit signal of the daughter card 4, and the signal routing meets the signal integrity requirement.
On the other hand, for the optical interface part on the optical electrical hybrid connector, the connection of ARINC818 optical signals between the corresponding slots of the daughter card 1 and the daughter card 2 and the connection of ARINC818 optical signals between the corresponding slots of the daughter card 3 and the daughter card 4 are realized through optical fibers. Specifically, the ARINC818 optical signal wiring rule is: ARINC818 optical transmitting signals of the daughter card 1 are connected with ARINC818 optical receiving signals of the daughter card 2, and ARINC818 optical receiving signals of the daughter card 1 are connected with ARINC818 optical transmitting signals of the daughter card 2; similarly, ARINC818 optical transmit signals of daughter card 3 are connected to ARINC818 optical receive signals of daughter card 4, ARINC818 optical receive signals of daughter card 3 are connected to ARINC818 optical transmit signals of daughter card 4. The case structure provides fixing and heat dissipation functions for the ARINC818 daughter card and the mother board, and the aviation connector achieves 28V power supply access outside the case and 4-channel input and 4-channel output of DVI image signals.
(3) Test data flow direction
In the test process, the board card 1 and the board card 2, and the board card 3 and the board card 4 perform mutual communication test, and the data flow direction in the test process shown in fig. 1 includes:
the 1 st way test data flow direction: DVI signal source- > DVI SWITCH- > 1 st DVI input- > daughter card 1DVI received signal- > daughter card 1ARINC818 electric/optical sent signal- > daughter card 2ARINC818 electric/optical received signal- > daughter card 2DVI output signal- > DVI image integration device- > display;
the 2 nd path test data flow direction: DVI signal source- > DVI SWITCH- > 2 nd path DVI input- > daughter card 2DVI received signal- > daughter card 2ARINC818 electric/optical sent signal- > daughter card 1ARINC818 electric/optical received signal- > daughter card 1DVI output signal- > DVI image integration device- > display;
the 4 th test data flow direction: DVI signal source- > DVI SWITCH- > 4 th DVI input- > daughter card 4DVI received signal- > daughter card 4ARINC818 electric/optical transmitted signal- > daughter card 3ARINC818 electric/optical received signal- > daughter card 3DVI output signal- > DVI image integration device- > display.
The test platform for the ARINC818 daughter cards provided by the embodiment of the invention can get rid of excessive dependence on test accompanying equipment in the traditional design, support a plurality of ARINC818 daughter cards to simultaneously carry out related testing and test work, and improve the test throughput and convenience. In the specific implementation, the test platform consists of a DVI signal source case, an ARINC818 daughter card test case, DVI image integration equipment and a display; the electrical interface and optical interface ARINC818 daughter card is fixed in the test case through the test adapter plate; during testing, only the testing case is arranged inside the testing incubator, the other devices are arranged outside the testing incubator, and the devices are interconnected through DVI cables; a single ARINC818 daughter card test case supports 4 daughter cards to simultaneously carry out tests and tests; the ARINC818 daughter cards with different structural types can be tested and tested on the test platform by adapting the special test adapter plate. The test platform of the ARINC818 daughter cards provided by the embodiment of the invention can get rid of the dependence on one-to-one test accompanying equipment, and can realize that 4ARINC818 daughter cards can simultaneously carry out tests and tests; the test platform is high in reliability, only the ARINC818 daughter card test case is arranged inside the incubator in the test process, and other devices are arranged outside the incubator and are interconnected through a DVI (digital visual interface) interface, so that the loss of the platform is low; the compatibility is good, and the adaptation of different types of electrical interface or optical interface ARINC818 daughter cards and the test and verification on the test platform can be realized only by replacing the adapter plate; the operation is convenient, the interconnection between ARINC818 daughter card test platform devices is only DVI cables, and the platform is electrified to directly output a display result through a display.
Although the embodiments of the present invention have been described above, the above description is only for the convenience of understanding the present invention, and is not intended to limit the present invention. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
Claims (9)
1. A test platform for ARINC818 daughter cards, said test platform comprising: a digital video interface DVI signal case, an ARINC818 daughter card test case and a display;
wherein, DVI signal machine case includes: DVI signal source, DVI exchanger and DVI image integration equipment; the DVI signal case and the ARINC818 daughter card test case are interconnected through a DVI cable;
a plurality of ARINC818 daughter cards are fixedly arranged in the ARINC818 daughter card test case through a test adapter plate; a plurality of test adapter plates are arranged on a motherboard in the ARINC818 daughter card testing machine box and used for correspondingly inserting and fixing a plurality of ARINC818 daughter cards one by one;
the testing platform is used for placing the ARINC818 daughter card testing case in the testing incubator when carrying out environment testing and testing verification on the ARINC818 daughter card, and simultaneously carrying out testing and testing verification on a plurality of ARINC818 daughter cards in the ARINC818 daughter card testing case; and the DVI signal case and the display are positioned outside the test incubator during the test.
2. The ARINC818 daughter card testing platform of claim 1,
the ARINC818 daughter card test case comprises: the structure comprises a case structure part, a motherboard positioned inside the case structure part and an aviation connector arranged outside the case structure part; the motherboard is provided with a power supply and a plurality of test adapter plates; the test adapter board is used for correspondingly inserting the fixed optical interface ARINC818 daughter card or the electrical interface ARINC818 daughter card one by one;
the ARINC818 daughter cards at least comprise 4 daughter cards, in the test process, the daughter card 1 and the daughter card 2 carry out communication test according to a preset test data flow direction, and the daughter card 3 and the daughter card 4 carry out communication test according to a preset test data flow direction.
3. The ARINC818 daughter card testing platform of claim 2,
the DVI signal source in the DVI signal source case is provided by a generating device of DVI interface video data, and the generating device of the DVI interface video data is used for generating specific DVI image data and outputting the specific DVI image data to the DVI exchanger through a DVI interface.
4. The ARINC818 daughter card testing platform of claim 3,
the DVI exchanger in the DVI signal source case is a DVI image branching device and is used for dividing 1 path of DVI image into at least 4 paths of same DVI image output, and an output DVI interface of the DVI exchanger is connected to a test adapter plate DVI input interface in a one-to-one correspondence manner through an aviation connector and a mother board at the front end of the ARINC818 daughter card test case;
the 4-channel DVI output interface at the rear end of the ARINC818 daughter card test case is connected to the DVI image integration equipment and used for integrating and displaying at least 4 channels of DVI output images at the rear end of the ARINC818 daughter card test case through the DVI image integration equipment.
5. The ARINC818 daughter card testing platform of claim 4,
the test adapter plate in the ARINC818 daughter card testing machine box is divided into the following components according to different ARINC818 daughter card types: an electrical interface adapter board for an electrical interface ARINC818 daughter card and an optical interface adapter board for an optical interface ARINC818 daughter card; the backplane connector of the adapter board is a uniform photoelectric mixed connector and is coupled with the ARINC818 daughter card through a high-speed inter-board daughter card connector;
in the electrical interface adapter plate, a daughter card connector between boards is placed close to a backplane connector, a plurality of electrical interfaces of the photoelectric mixed connector are respectively set as ARINC818 electrical receiving signals, ARINC818 electrical sending signals, DVI receiving signals, DVI sending signals and 5V power supply power, and the photoelectric mixed connector leads the signals to the daughter card connector between high speed boards;
in the optical interface adapter plate, a photoelectric transceiver on an ARINC818 daughter card and the outgoing direction of a tail fiber of the photoelectric transceiver are aligned with a photoelectric mixed connector, an MT connector at the tail end of the tail fiber is fixed on an optical interface of the photoelectric mixed connector, a plurality of electrical interfaces of the photoelectric mixed connector are respectively set to be DVI receiving signals, DVI sending signals and 5V power supply, and the photoelectric mixed connector leads the signals to the daughter card connector between high-speed boards.
6. The ARINC818 daughter card testing platform of claim 5,
in the ARINC818 daughter card testing machine box, at least 4ARINC818 daughter card slots and power supplies are arranged on a mother board;
the power supply is used for converting the voltage of 28V to 5V input from the outside and supplying power to the ARINC818 daughter card on at least 4 slots; and the positions of the daughter cards are sequentially set to be the daughter cards 1 to 4 according to a preset direction.
7. The ARINC818 daughter card testing platform of claim 6,
ARINC818 electrical signal wiring rule in the motherboard comprises:
the ARINC818 electrical transmit signal of daughter card 1 is connected to the ARINC818 electrical receive signal of daughter card 2, the ARINC818 electrical receive signal of daughter card 1 is connected to the ARINC818 electrical transmit signal of daughter card 2;
the ARINC818 electrical transmit signal of daughter card 3 is connected to the ARINC818 electrical receive signal of daughter card 4 and the ARINC818 electrical receive signal of daughter card 3 is connected to the ARINC818 electrical transmit signal of daughter card 4.
8. The ARINC818 daughter card testing platform of claim 6 wherein said optical interface on said opto-electronic hybrid connector is configured to: the interconnection of ARINC818 optical signals between slots corresponding to the daughter card 1 and the daughter card 2 and the interconnection of ARINC818 optical signals between slots corresponding to the daughter card 3 and the daughter card 4 are realized through optical fibers;
ARINC818 optical signal wiring rules in the motherboard include:
ARINC818 optical sending signals of the daughter card 1 are connected with ARINC818 optical receiving signals of the daughter card 2, and ARINC818 optical receiving signals of the daughter card 1 are connected with ARINC818 optical sending signals of the daughter card 2;
ARINC818 optical transmission signals of the daughter card 3 are connected with ARINC818 optical reception signals of the daughter card 4, and ARINC818 optical reception signals of the daughter card 3 are connected with ARINC818 optical transmission signals of the daughter card 4.
9. The ARINC818 daughter card testing platform of any of claims 1-8 having 4ARINC818 daughter cards in the testing platform and corresponding 4DVI input signals and 4DVI output signals;
the test data flow direction of the ARINC818 daughter card test case during testing comprises the following steps:
the 1 st way test data flow direction: DVI signal source- > DVI switch- > 1 st path DVI input- > daughter card 1DVI received signal- > daughter card 1ARINC818 electric/optical sending signal- > daughter card 2ARINC818 electric/optical receiving signal- > daughter card 2DVI output signal- > DVI image integration device- > display;
the 2 nd path test data flow direction: DVI signal source- > DVI switch- > 2 nd path DVI input- > daughter card 2DVI received signal- > daughter card 2ARINC818 electric/optical sending signal- > daughter card 1ARINC818 electric/optical receiving signal- > daughter card 1DVI output signal- > DVI image integration device- > display;
path 3 test data flow: DVI signal source- > DVI switchboard- > 3 rd path DVI input- > daughter card 3DVI received signal- > daughter card 3ARINC818 electric/optical sending signal- > daughter card 4ARINC818 electric/optical receiving signal- > daughter card 4DVI output signal- > DVI image integration device- > display;
the 4 th test data flow direction is as follows: DVI signal source- > DVI switch- > 4 th path DVI input- > daughter card 4DVI received signal- > daughter card 4ARINC818 electric/optical sending signal- > daughter card 3ARINC818 electric/optical receiving signal- > daughter card 3DVI output signal- > DVI image integration device- > display.
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| CN202011227312.8A CN112399175B (en) | 2020-11-05 | 2020-11-05 | Test platform of ARINC818 daughter card |
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| CN112399175B true CN112399175B (en) | 2022-09-20 |
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| CN202011227312.8A Active CN112399175B (en) | 2020-11-05 | 2020-11-05 | Test platform of ARINC818 daughter card |
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| CN108924442A (en) * | 2018-08-10 | 2018-11-30 | 上海埃威航空电子有限公司 | DVI-ARINC818 signal converts display methods |
| CN209390084U (en) * | 2019-04-12 | 2019-09-13 | 北京旋极信息技术股份有限公司 | A kind of ARINC818 Bus simulator test device |
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| FR2917204B1 (en) * | 2007-06-05 | 2011-07-01 | Airbus France | METHOD AND DEVICE FOR ACQUIRING, RECORDING AND OPERATING CAPTURED DATA IN AN AIRCRAFT |
| CN104518837B (en) * | 2013-09-30 | 2016-05-11 | 科大国盾量子技术股份有限公司 | A kind of testing backboard, testing arrangement and test macro of board |
| CN105357070A (en) * | 2015-11-05 | 2016-02-24 | 天津津航计算技术研究所 | FPGA-based ARINC818 bus analysis and test apparatus |
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| CN108924442A (en) * | 2018-08-10 | 2018-11-30 | 上海埃威航空电子有限公司 | DVI-ARINC818 signal converts display methods |
| CN209390084U (en) * | 2019-04-12 | 2019-09-13 | 北京旋极信息技术股份有限公司 | A kind of ARINC818 Bus simulator test device |
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