CN112379449B - Processing method and device for electromagnetic data of controllable source - Google Patents

Processing method and device for electromagnetic data of controllable source Download PDF

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CN112379449B
CN112379449B CN202011193167.6A CN202011193167A CN112379449B CN 112379449 B CN112379449 B CN 112379449B CN 202011193167 A CN202011193167 A CN 202011193167A CN 112379449 B CN112379449 B CN 112379449B
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measuring
apparent resistivity
area equivalent
equivalent apparent
data
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CN112379449A (en
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王志刚
崔志伟
鲁瑶
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China National Petroleum Corp
BGP Inc
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China National Petroleum Corp
BGP Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V3/00—Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination, deviation
    • G01V3/38—Processing data, e.g. for analysis, for interpretation, for correction
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02A—TECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
    • Y02A90/00—Technologies having an indirect contribution to adaptation to climate change
    • Y02A90/30—Assessment of water resources

Abstract

The invention provides a processing method and a device of controllable source electromagnetic data, wherein the method comprises the following steps: receiving measurement point data on a measurement line acquired by time-frequency electromagnetic exploration of a target area; determining the full-area equivalent apparent resistivity of the measuring points on the measuring line and the average full-area equivalent apparent resistivity of the first P pieces of high-frequency data according to the amplitude data and the phase data of the measuring point data; performing interpolation smoothing processing, determining average full-area equivalent apparent resistivity of corrected measuring points, and determining amplitude and phase of the measuring points on the measuring line after the measuring points affect static displacement; and inverting the amplitude and the phase of the corrected measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as a processing result of the controllable source electromagnetic data. The scheme for effectively processing the electromagnetic field data of the controllable source electromagnetic method is provided, the static displacement effect caused by the position change of the field source, the fluctuation of the topography and the non-uniformity of the near-surface electricity is effectively eliminated, and the technical support and the guarantee are provided for the controllable source electromagnetic method in deep and residual secret oil and gas exploration.

Description

Processing method and device for electromagnetic data of controllable source
Technical Field
The invention relates to petroleum and natural gas exploration technology, in particular to a method and a device for processing electromagnetic data of a controllable source.
Background
The requirements of national economy on oil gas resources are rapidly increased, the dependence of oil gas on the outside is increased to more than 69.8%, and deep and residual secret oil gas exploration forces are greatly improved. The electromagnetic exploration method is one of the most potential methods for detecting deep oil and gas targets, and the core difficulty faced in achieving high identification accuracy while increasing the detection depth is how to eliminate the distortion (static displacement) of observed data caused by complicated earth surface and shallow uneven bodies and eliminate the electrical false abnormality on a resistivity inversion section caused by the static displacement. Wherein, how to carry out static displacement correction to the manual source data is particularly important to the processing and interpretation of the manual source electromagnetic data.
With the progress of the forward and inversion processing technology, the controllable source electromagnetic method observation data processing is to directly invert the amplitude of electromagnetic field data instead of inverting apparent resistivity data. The electromagnetic change of the complicated earth surface, shallow layer non-uniformity and adjacent emission sources causes obvious static displacement in electromagnetic field data, but the amplitude intensity of an electric field and a magnetic field of the electromagnetic method observation data of the controllable source is related to parameters such as the length, the receiving and transmitting distance, the coordinates of a measuring point and the like of the emission sources, and the amplitude curve height change trend of the electric field and the magnetic field has no corresponding relation with the resistivity change of an underground electrical layer. Thus the usual static correction method for magnetotelluric comprises: spatial filtering, curve translation, impedance phase correction, low pass filtering cannot be used for static correction of controllable source electromagnetic field amplitude data.
Disclosure of Invention
The invention provides a processing method of controllable source electromagnetic data, which comprises the following steps:
receiving measurement point data on a measurement line acquired by time-frequency electromagnetic exploration of a target area;
determining the full-area equivalent apparent resistivity of the measuring point on the measuring line according to the amplitude data and the phase data of the measuring point data;
determining a measuring point with static displacement, a measuring point without static displacement and offset distances of the measuring points according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
determining the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line;
performing interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and determining the average full-area equivalent apparent resistivity of the first P high-frequency data after the measuring point on the measuring line is interpolated;
smoothing the average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation;
determining the average total area equivalent apparent resistivity of the corrected measuring points according to the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing of the static displacement measuring points, the average total area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line, the average total area equivalent apparent resistivity of the static displacement measuring points and the average total area equivalent apparent resistivity of the measuring points without the static displacement;
Determining the amplitude and the phase of the corrected measuring point on the measuring line, which affect the static displacement, according to the full-area equivalent apparent resistivity of the corrected measuring point;
and inverting the amplitude and the phase of the corrected measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as a processing result of the controllable source electromagnetic data.
In the embodiment of the present invention, the receiving measurement point data on a measurement line acquired by performing time-frequency electromagnetic exploration on a target area includes:
according to the distribution range and the component type of the actually measured electromagnetic time-frequency electromagnetic method shooting frequency, selecting a time-frequency electromagnetic measuring line, and collecting measuring point data of the selected measuring line.
In the embodiment of the invention, the determining the full field equivalent apparent resistivity of the measuring point on the measuring line according to the amplitude data and the phase data of the measuring point data comprises the following steps:
calculating the frequency domain full-area equivalent apparent resistivity of the measuring point on the measuring line;
and carrying out logarithmic processing on the frequency domain full-area equivalent apparent resistivity to determine the full-field equivalent apparent resistivity of the measuring point on the measuring line.
In the embodiment of the present invention, the determining the measurement point with static displacement, the measurement point without static displacement and the offset distance of each measurement point according to the full-area equivalent apparent resistivity of the measurement point on the measurement line includes:
Determining a full-area equivalent apparent resistivity profile of the measuring point on the measuring line according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
and (3) using the Kriging method to grid the full-area equivalent apparent resistivity to determine the measuring points with static displacement and the measuring points without static displacement.
In the embodiment of the present invention, the interpolation processing is performed by using the offset distance of the measurement point without static displacement and the average total area equivalent apparent resistivity of the first P high frequency data, and the determining the average total area equivalent apparent resistivity of the first P high frequency data after the measurement point interpolation on the measurement line includes:
and performing cubic spline interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and interpolating the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring point with static displacement to obtain the average full-area equivalent apparent resistivity of the first three high-frequency data after the measuring point on the measuring line is interpolated.
In the embodiment of the present invention, the smoothing processing of the average total area equivalent apparent resistivity of the first P high frequency data after interpolation of the measuring points on the measuring line after the interpolation processing includes:
and performing cubic spline smoothing on the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing according to a preset smoothing coefficient.
In the embodiment of the present invention, the determining the corrected average total area equivalent apparent resistivity of the measurement points according to the average total area equivalent apparent resistivity of the first P high frequency data after interpolation smoothing with static displacement measurement points, the average total area equivalent apparent resistivity of the first P high frequency data with static displacement measurement points, and the average total area equivalent apparent resistivity of the measurement points without static displacement measurement points includes:
determining a difference dρ between an average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing with static displacement measurement points and an average full-area equivalent apparent resistivity of the first P high-frequency data of measurement points on a line prior to interpolation a ；
Average full-area equivalent apparent resistivity with static displacement measurement point plus the difference dρ a The average full-area equivalent apparent resistivity of the corrected measuring points is formed by the average full-area equivalent apparent resistivity of the measuring points without static displacement.
In the embodiment of the invention, the amplitude and phase determination resistivity section chart after correction of the measuring points on the inversion measuring line is used as a processing result of the controllable source electromagnetic data, and the processing result comprises:
inverting the amplitude and the phase after correction of the measuring points on the measuring line by using a controllable source 2.5D inversion algorithm to determine a resistivity profile;
And inverting the corrected amplitude and phase of the measuring point on the measuring line by using a controllable source 1D self-adaptive differential evolution algorithm to obtain a polarization ratio section diagram under the measuring line.
Meanwhile, the invention also provides a processing device of the electromagnetic data of the controllable source, which comprises:
the data receiving module is used for receiving measurement point data on a measurement line acquired by time-frequency electromagnetic exploration of a target area;
the full-area equivalent apparent resistivity determining module is used for determining the full-area equivalent apparent resistivity of the measuring points on the measuring line according to the amplitude data and the phase data of the measuring point data;
the measuring point determining module is used for determining a measuring point with static displacement, a measuring point without static displacement and offset distances of the measuring points according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
the high-frequency data resistivity determining module is used for determining the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line;
the interpolation processing module is used for carrying out interpolation processing by utilizing the offset distance of the measuring point without static displacement and the average total area equivalent apparent resistivity of the first P high-frequency data, and determining the average total area equivalent apparent resistivity of the first P high-frequency data after the measuring point on the measuring line is interpolated;
The smoothing processing module is used for carrying out smoothing processing on the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing;
the correction module is used for determining the average total area equivalent apparent resistivity of the corrected measuring points according to the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing treatment of the static displacement measuring points, the average total area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line, the average total area equivalent apparent resistivity of the static displacement measuring points and the average total area equivalent apparent resistivity of the measuring points without static displacement;
the amplitude phase determining module is used for determining the amplitude and the phase after the correction of the influence of the measuring point on the measuring line on the static displacement according to the full-area equivalent apparent resistivity of the corrected measuring point;
and the inversion module is used for inverting the amplitude and the phase after correction of the measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as a processing result of the controllable source electromagnetic data.
In the embodiment of the invention, the full-area equivalent apparent resistivity determining module comprises:
the calculating unit is used for calculating the frequency domain full-area equivalent apparent resistivity of the measuring point on the measuring line;
And the logarithmic processing unit is used for carrying out logarithmic processing on the frequency domain full-area equivalent apparent resistivity to determine the full-field equivalent apparent resistivity of the measuring point on the measuring line.
In the embodiment of the invention, the full-area equivalent apparent resistivity determining module comprises:
the frequency domain full-area equivalent apparent resistivity determining unit is used for determining the frequency domain full-area equivalent apparent resistivity of the measuring point on the measuring line;
and the logarithmic processing unit is used for carrying out logarithmic processing on the full-area equivalent apparent resistivity of the frequency domain to determine the full-field equivalent apparent resistivity of the measuring point on the measuring line.
In an embodiment of the present invention, the measurement point determining module includes:
the offset distance determining unit is used for determining a full-area equivalent apparent resistivity profile of the measuring point on the measuring line and an offset distance of the measuring point according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
and the static displacement measuring point determining unit is used for determining the measuring points with and without static displacement by using the Kriging method to grid the full-area equivalent apparent resistivity.
In the embodiment of the present invention, the interpolation processing module performs interpolation processing by using the offset distance of the measurement point without static displacement and the average total area equivalent apparent resistivity of the first P high frequency data, and determining the average total area equivalent apparent resistivity of the first P high frequency data after the measurement point on the measurement line is interpolated includes:
And performing cubic spline interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and interpolating the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring point with static displacement to obtain the average full-area equivalent apparent resistivity of the first three high-frequency data after the measuring point on the measuring line is interpolated.
In the embodiment of the present invention, the smoothing module performs smoothing on the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing, where the smoothing module includes:
and performing cubic spline smoothing on the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing according to a preset smoothing coefficient.
In an embodiment of the present invention, the correction module includes:
a difference value determining unit for determining a difference value dρ between the average full-area equivalent apparent resistivity of the first P high frequency data after interpolation smoothing with static displacement measuring points and the average full-area equivalent apparent resistivity of the first P high frequency data of measuring points on the measuring line before interpolation a ；
A correction processing unit for adding the difference dρ to the average full-area equivalent apparent resistivity with static displacement measuring points a The average full-area equivalent apparent resistivity of the corrected measuring points is formed by the average full-area equivalent apparent resistivity of the measuring points without static displacement.
In an embodiment of the present invention, the inversion module includes:
the resistivity profile determining unit is used for inverting the amplitude and the phase after correction of the measuring points on the measuring line by using a 2.5D inversion algorithm of the controllable source to determine a resistivity profile;
and the polarizability section chart determining unit is used for inverting the corrected amplitude and phase of the measuring point on the measuring line by using the controllable source 1D self-adaptive differential evolution algorithm to obtain the polarizability section chart below the measuring line.
The invention also provides a computer device, which comprises a memory, a processor and a computer program stored on the memory and capable of running on the processor, wherein the processor executes the computer program to realize the method.
Meanwhile, the invention also provides a computer readable storage medium which stores a computer program for executing the method.
The invention provides a processing method and a device for effectively processing the electromagnetic field number of a controllable source electromagnetic method, effectively eliminates static displacement effect caused by field source position change, topography fluctuation and near-surface electrical property nonuniformity, provides observation data reflecting the electrical property of an underground medium for a 2.5D processing technology, improves the longitudinal and transverse high-resolution imaging of the controllable source electromagnetic, provides a novel processing technology and means for the controllable source electromagnetic exploration, and also provides technical support and guarantee for the controllable source electromagnetic method in deep and residual secret oil and gas exploration.
The foregoing and other objects, features and advantages of the invention will be apparent from the following more particular description of preferred embodiments, as illustrated in the accompanying drawings.
Drawings
In order to more clearly illustrate the embodiments of the invention or the technical solutions in the prior art, the drawings that are required in the embodiments or the description of the prior art will be briefly described, it being obvious that the drawings in the following description are only some embodiments of the invention, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a flow chart of a method for processing controllable source electromagnetic data provided by the invention;
FIG. 2 is a cross-section of the Ex component amplitude in an embodiment of the invention;
FIG. 3 is a phase profile of an Ex component in an embodiment of the invention;
FIG. 4 is a graph of the full-area equivalent apparent resistivity of the Ex component in an embodiment of the invention;
FIG. 5 is a cross-sectional view of the equivalent apparent resistivity of the Ex component region in an embodiment of the invention;
FIG. 6 is a trend chart of the average value of the equivalent apparent resistivity of the whole area of the first three frequency points in the embodiment of the invention;
FIG. 7 is a trend chart of the average value of the equivalent apparent resistivity of the whole area of the first three frequency points after correction in the embodiment of the invention;
FIG. 8 is a cross section of the corrected Ex component full area equivalent apparent resistivity in an embodiment of the invention;
FIG. 9 is a cross-section of corrected Ex component amplitudes in an embodiment of the invention;
FIG. 10 is a phase profile of the corrected Ex component in accordance with one embodiment of the present invention;
FIG. 11 is an inversion section of the resistivity of the Ex component in an embodiment of the invention;
FIG. 12 is an inversion section of the polarization ratio of Ex component in an embodiment of the invention;
FIG. 13 is a block diagram of the processing of controllable source electromagnetic data provided by the present invention;
fig. 14 is a schematic diagram of an electronic device according to an embodiment of the present invention.
Detailed Description
The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.
The research on the static displacement correction method of the amplitude data of the controllable source electromagnetic data field improves the 2.5D inversion processing and geological interpretation precision, and is one of the technical problems which need to be solved in the current electromagnetic method data processing method.
The electromagnetic field generated by the emission source of the controllable source electromagnetic method at any point in the layered medium can be calculated through an analytic formula, the electromagnetic field intensity and the resistivity of the underground medium are hidden functional relations, the apparent resistivity cannot be directly calculated by using the electromagnetic field intensity, but the electromagnetic field calculation formula in the layered medium is subjected to optimization algorithm (comprising dichotomy, inheritance and recursion) to obtain the apparent resistivity of the whole area, and the influence of parameters such as the length of the emission source AB, the emission current, the position of an observation point and the like is eliminated. Many students at home and abroad develop the research of a controllable source electromagnetic method whole-area apparent resistivity calculation method and a rapid imaging method, the whole-area apparent resistivity parameter is used in construction parameter design and feasible research, and the electric characteristics of underground media are researched by using the whole-area apparent resistivity parameter, so that the method is applied to data processing in the fields of underground water exploration, geothermal resource investigation, mineral resource exploration and the like. At present, a method for correcting static displacement in the data of the active electromagnetic method by using a full-area apparent resistivity method and processing the corrected electromagnetic field amplitude data by using a 2.5D inversion technology is not proposed, and the published paper is not discussed in a related way.
As shown in fig. 1, a flowchart of a method for processing electromagnetic data with controllable source provided by the invention includes:
Step S101, receiving measurement point data on a measurement line acquired by performing time-frequency electromagnetic exploration on a target area;
step S102, determining the full-area equivalent apparent resistivity of the measuring point on the measuring line according to the amplitude data and the phase data of the measuring point data;
step S103, determining a measuring point with static displacement, a measuring point without static displacement and offset distances of the measuring points according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
step S104, determining the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line;
step S105, interpolation processing is carried out by utilizing the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and the average full-area equivalent apparent resistivity of the first P high-frequency data after the measuring point on the measuring line is interpolated is determined;
step S106, smoothing the average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing;
step S107, determining the average full-area equivalent apparent resistivity of the corrected measuring point according to the average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing of the static displacement measuring point, the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring point on the measuring line, the average full-area equivalent apparent resistivity of the static displacement measuring point and the average full-area equivalent apparent resistivity of the measuring point without the static displacement;
Step S108, determining the amplitude and the phase of the corrected measuring point on the measuring line to influence the static displacement according to the full-area equivalent apparent resistivity of the corrected measuring point;
and S109, inverting the amplitude and the phase after correction of the measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as a processing result of the controllable source electromagnetic data.
The invention relates to electromagnetic exploration of petroleum and natural gas, time shift monitoring technology of oil and gas reservoir, offer a processing method of electromagnetic observation data of controllable source, it is mainly to time-frequency electromagnetic method and long offset transient electromagnetic method electric field or distortion of the magnetic field amplitude data that cause because of shadow effect of the source of the field, topography fluctuation and shallow layer are uneven first, then invert and obtain the underground resistivity and polarizability distribution characteristic of the work area to the amplitude data corrected.
The embodiment of the invention is realized by the following steps:
1) According to the distribution range and the component type of the real time frequency electromagnetic method shooting frequency, selecting data of N measuring points on one measuring line of the time frequency electromagnetic method to carry out inversion;
in this embodiment, according to the distribution range and component type of the actually measured electromagnetic time-frequency electromagnetic method injection frequency, a time-frequency electromagnetic one-measuring line is selected, the measurement point data of the selected measuring line is collected, and the specific range of the emission frequency of the time-frequency electromagnetic multi-source multi-component in inversion is 0.01-1000Hz.
The components of the time-frequency electromagnetic multisource multicomponent participating in inversion are an electric field component Ex and a ground vertical magnetic field component Bz which are parallel to the field source.
2) Calculating the full-field equivalent apparent resistivity of the frequency domain data of the N measuring points on the measuring line;
the frequency domain equivalent resistivity is solved by a recursive dichotomy, and the frequency domain electromagnetic field strength of the long-conductor source is calculated by the following formula:
Figure BDA0002753309840000081
Figure BDA0002753309840000082
where I is the emission current, ρ is the resistivity of the uniform half space, and l is half the distance of the long wire source AB;
x and y are the coordinates of the measurement point, where,
Figure BDA0002753309840000091
ζ is the coordinate at the integration point, ω is the angular frequency, μ=4ζ10 -7 ，
Figure BDA0002753309840000092
μ 0 Is the permeability in vacuum;
3) Calculating the offset of each measuring point on the measuring line;
specifically, the formula of the step 2) is utilized to determine the frequency domain full-area equivalent apparent resistivity of the measuring point on the measuring line;
and carrying out logarithmic processing on the full-area equivalent apparent resistivity of the frequency domain to determine the full-field equivalent apparent resistivity of the measuring point on the measuring line.
In this embodiment, the logarithm of the frequency based on 10 is taken from the observation data of each measuring point to obtain the logarithm-taken frequency, and the logarithm based on 10 is taken from the equivalent apparent resistivity of the whole region in the observation data of each measuring point to obtain the equivalent apparent resistivity of the whole region;
The offset distance of each measuring point refers to the distance between adjacent measuring points after accumulating and summing by taking the first measuring point as a starting point.
4) Drawing an equivalent apparent resistivity profile of the whole area of N measuring points on the measuring line, and finding out M measuring points without static displacement and K measuring points with static displacement effect influence;
specifically, determining a full-area equivalent apparent resistivity profile of the measuring point on the measuring line and an offset distance of the measuring point according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
and (3) using the Kriging method to grid the full-area equivalent apparent resistivity to determine the measuring points with static displacement and the measuring points without static displacement.
The x-axis of the whole-region apparent resistivity profile is an offset distance, the y-axis is the frequency after taking the logarithm, and the whole-region equivalent apparent resistivity after taking the logarithm is meshed by the Kriging method.
Wherein the sum of the measuring point without static displacement and the measuring point with static displacement influence is equal to the number of measuring points on the measuring line, and M+k=N.
5) Calculating the average full-area equivalent apparent resistivity of the first three high-frequency data of the N measuring points on the measuring line to obtain the equivalent apparent resistivity rho of the first three frequencies a 。
The full-area equivalent apparent resistivity is the logarithmic full-area equivalent apparent resistivity.
6) Interpolation of the offset distance of M measuring points without static displacement and the average total area equivalent apparent resistivity of the first three high frequency data to obtain the average total area equivalent apparent resistivity ρi of the first three high frequency data after interpolation of N measuring points on the measuring line a ；
The interpolation method is a cubic spline interpolation method.
The average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line is determined;
and performing cubic spline interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and interpolating the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring point with static displacement to obtain the average full-area equivalent apparent resistivity of the first three high-frequency data after the measuring point on the measuring line is interpolated.
In this embodiment, the first P pieces of high frequency data are the first three pieces of high frequency data.
7) Calculating average full-area equivalent apparent resistivity value ρs of the first three smoothed high-frequency data of N measuring points on the measuring line a ；
Wherein the smoothing method is a cubic spline smoothing method, and the value range of the smoothing coefficient is 0.9-1.
8) Calculating average total-area equivalent apparent resistivity ρs of three high-frequency data after interpolation smoothing of K measuring points with static displacement effect influence a Equivalent apparent resistivity ρo of the average full area of three high frequency data before interpolation a Is the difference dρ of (2) a ；
9) The difference dρ of the average total area equivalent apparent resistivity of K measuring points with static displacement effect plus the average total area equivalent apparent resistivity of the first three high frequency data a The corrected N measuring point total area equivalent apparent resistivity ρc is composed with the total area equivalent apparent resistivity of the M measuring points without static displacement a ；
10 Calculating amplitude and phase of N measuring points on the measuring line after the static displacement effect is influenced and corrected;
the electromagnetic field amplitude and phase are calculated using equations (1) and (2), respectively.
The resistivity used for calculating the amplitude and phase of the electromagnetic field is the corrected full-area equivalent apparent resistivity ρc a 。
11 Inverting the corrected amplitudes and phases of the N measuring points on the measuring line to obtain a resistivity section diagram below the measuring line; wherein the inversion in this step refers to a controllable source 2.5D inversion algorithm.
12 Inverting the corrected amplitudes and phases of the N measuring points on the measuring line to obtain a polarization ratio section diagram below the measuring line; inversion in the step refers to inversion algorithm of controllable source 1D self-adaptive Charles evolution algorithm, and the polarization model is a Cole-Cole model.
13 Geologic interpretation of resistivity and polarizability profile, analysis of shallow gravel layer distribution rules and deep geologic structure characteristics, and prediction of oil-gas properties of deep structure by resistivity and polarizability parameters.
According to the invention, the resistivity and polarization rate distribution information under the measuring line is obtained by carrying out data processing on the time-frequency electromagnetic actual measurement data. After converting vibration-controllable source time-frequency electromagnetic field amplitude data into full-area equivalent apparent resistivity, normalizing acquisition parameters such as current, receiving-transmitting distance, offset distance and the like, linking the equivalent apparent resistivity with underground real resistivity, and identifying measuring points with static displacement effect according to fluctuation characteristics of high-frequency full-area equivalent apparent resistivity of all measuring points of the whole measuring line. The static displacement effect caused by the position change of a field source, the fluctuation of topography and the non-uniformity of near-surface electricity can be automatically realized by using a cubic spline interpolation method, a cubic spline smoothing function method and a curve translation method, so that the resolution of resistivity and polarizability distribution obtained by 2.5D resistivity inversion and 1D polarizability inversion in the transverse direction and the longitudinal direction is higher, the resolution is more consistent with the known information, and the precision of time-frequency electromagnetic oil-gas target exploration and prediction is improved. And a new data processing means and method are provided for the controllable source time-frequency electromagnetic data processing.
In this embodiment, artificial source time-frequency electromagnetic exploration is performed in the quasi-Song basin GJ region, static displacement, field source effect correction and data inversion are performed on time-frequency electromagnetic data by applying the technology of the invention, and specific technologies and steps of implementation examples are as follows:
1) Inversion is carried out on amplitude data and phase data of Ex components of 185 measuring points acquired by a GJ region of the cone basin, the point numbers are 100-284, and the frequency range is 0.011Hz-153Hz;
FIG. 2 is an amplitude profile of the Ex component of the 185 measurement points of the line, and FIG. 3 is a phase profile of the Ex component of the 185 measurement points of the line;
2) Calculating the full-field area equivalent apparent resistivity of the frequency domain data of 185 measuring points on the measuring line to obtain the full-field area equivalent apparent resistivity;
FIG. 4 is a graph of the full area equivalent apparent resistivity of the Ex component of 185 points of the line;
3) Calculating offset distances of 185 measuring points on the measuring line, taking the logarithm of the base 10 of the frequency in the observation data of each measuring point to obtain the logarithm-taking frequency, and taking the logarithm of the base 10 of the total area equivalent apparent resistivity in the observation data of each measuring point to obtain the total area equivalent apparent resistivity;
4) Gridding the full-area equivalent apparent resistivity after taking the base 10 logarithm by using a Kriging method (Kriging), and drawing a full-area equivalent apparent resistivity profile;
FIG. 5 is a cross-sectional view of the equivalent apparent resistivity of a region of 185 points on the line, wherein 110 points without static displacement are provided, the number of points is 100-118 and 130-220, 75 points with static displacement effect influence are provided, and the number of points is 119-129 and 221-284;
5) Calculating the average full-area equivalent apparent resistivity of the first three high-frequency data of 185 measuring points on the measuring line to obtain an average value rho of the equivalent apparent resistivity of the first three frequencies a ；
Fig. 6 is a full-area equivalent apparent resistivity average trend graph of the first three high frequency data of the Ex component of uncorrected 185 stations.
6) Interpolation of the average full-area equivalent apparent resistivity of the first three high-frequency data of 75 measuring points with static displacement effect is carried out by using the offset distance of 110 measuring points without static displacement and the average full-area equivalent apparent resistivity of the first three high-frequency data by using a method of cubic spline interpolation, and the average full-area equivalent apparent resistivity ρi of the first three high-frequency data after interpolation of 185 measuring points on the measuring line is obtained a ；
7) Setting a smoothing coefficient to be 0.95 by using a cubic spline smoothing method, and processing the full-area equivalent apparent resistivity of the first three frequency points of the high frequency to obtain an average value ρs of the equivalent apparent resistivity of the first three smoothed frequencies a ；
FIG. 7 is a graph showing calculated average trend of the total equivalent apparent resistivity of the first three smoothed high frequency data for 185 points on the line;
8) Calculating the difference dρ between the average full-area equivalent apparent resistivity of three high-frequency data after interpolation smoothing of 75 measuring points with the influence of static displacement effect and the average full-area equivalent apparent resistivity of three high-frequency data before interpolation a ；
9) The difference dρ of the average total area equivalent apparent resistivity of 75 measuring points with static displacement effect plus the average total area equivalent apparent resistivity of the first three high frequency data a Composition of the corrected total area equivalent apparent resistivity with 110 measuring points without static displacement and 185 measuring points total area equivalent apparent resistivity ρc a ；
FIG. 8 is a cross-sectional view of the equivalent apparent resistivity of the 185 sites over this line;
10 Calculating amplitude data of 185 measuring points on the measuring line after the static displacement effect is influenced and corrected according to the formula (1);
FIG. 9 is an amplitude profile after static displacement correction, and FIG. 10 is a phase profile after static displacement correction, wherein the phase data after static displacement effect influence correction of 185 measuring points on the measuring line is calculated according to the formula (2);
11 Inversion of the corrected amplitudes and phases of 185 measuring points on the measuring line by using a 2.5D inversion algorithm method of the controllable source to obtain a resistivity profile below the measuring line;
FIG. 11 is a resistivity inversion section obtained by inversion of this line;
12 Inversion algorithm of controllable source 1D self-adaptive Chart evolutionary algorithm, the polarization model is Cole-Cole model, corrected amplitudes and phases of 185 measuring points on the measuring line are inverted to obtain a polarization rate section diagram under the measuring line, and FIG. 12 is a polarization rate inversion section obtained by inversion of the measuring line;
13 Geologic interpretation is carried out on the resistivity and the polarizability section diagram, the characteristics of the two-fold system and the three-fold system structures and the distribution rule of the carbocoal system in the work area are analyzed, and the resistivity and the polarizability parameters are used for predicting the oil-gas property of the deep structure.
According to the invention, the resistivity and polarization rate distribution information under the measuring line is obtained by carrying out data processing on the time-frequency electromagnetic actual measurement data. After converting vibration-controllable source time-frequency electromagnetic field amplitude data into full-area equivalent apparent resistivity, normalizing acquisition parameters such as current, receiving-transmitting distance, offset distance and the like, linking the equivalent apparent resistivity with underground real resistivity, and identifying measuring points with static displacement effect according to fluctuation characteristics of high-frequency full-area equivalent apparent resistivity of all measuring points of the whole measuring line. The static displacement effect caused by the position change of a field source, the fluctuation of topography and the non-uniformity of near-surface electricity can be automatically realized by using a cubic spline interpolation method, a cubic spline smoothing function method and a curve translation method, so that the resolution of resistivity and polarizability distribution obtained by 2.5D resistivity inversion and 1D polarizability inversion in the transverse direction and the longitudinal direction is higher, the resolution is more consistent with the known information, and the precision of time-frequency electromagnetic oil-gas target exploration and prediction is improved. And a new data processing means and method are provided for the controllable source time-frequency electromagnetic data processing.
The invention also provides a processing device of the controllable source electromagnetic data, as shown in fig. 13, which comprises:
the data receiving module 301 is configured to receive measurement point data on a measurement line acquired by performing time-frequency electromagnetic exploration on a target area;
the full-area equivalent apparent resistivity determining module 302 is configured to determine the full-area equivalent apparent resistivity of the measurement point on the measurement line according to the amplitude data and the phase data of the measurement point data;
the measuring point determining module 303 is configured to determine a measuring point with static displacement, a measuring point without static displacement, and offset distances of the measuring points according to the full-area equivalent apparent resistivity of the measuring points on the measuring line;
the high-frequency data resistivity determining module 304 is configured to determine an average full-area equivalent apparent resistivity of the first P high-frequency data of the measurement point on the measurement line;
the interpolation processing module 305 is configured to perform interpolation processing by using the offset distance of the measurement point without static displacement and the average total area equivalent apparent resistivity of the first P high frequency data, and determine the average total area equivalent apparent resistivity of the first P high frequency data after interpolation of the measurement point on the measurement line;
the smoothing module 306 is configured to smooth the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measurement points on the measurement line after interpolation;
The correction module 307 is configured to determine an average full-area equivalent apparent resistivity of the corrected measurement point according to the average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing of the measurement point with static displacement, the average full-area equivalent apparent resistivity of the first P high-frequency data of the measurement point on the measurement line, the average full-area equivalent apparent resistivity of the measurement point with static displacement, and the average full-area equivalent apparent resistivity of the measurement point without static displacement;
an amplitude phase determining module 308, configured to determine, according to the corrected full-area equivalent apparent resistivity of the measurement point, an amplitude and a phase after the measurement point on the measurement line affects the static displacement;
and the inversion module 309 is used for inverting the amplitude and the phase after correction of the measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as processing results of the controllable source electromagnetic data.
The present embodiment also provides an electronic device, which may be a desktop computer, a tablet computer, a mobile terminal, or the like, and the present embodiment is not limited thereto. In this embodiment, the electronic device may refer to the embodiments of the foregoing method and apparatus, and the content thereof is incorporated herein, and the repetition is not repeated.
Fig. 14 is a schematic block diagram of a system configuration of an electronic device 600 according to an embodiment of the present invention. As shown in fig. 14, the electronic device 600 may include a central processor 100 and a memory 140; memory 140 is coupled to central processor 100. Notably, the diagram is exemplary; other types of structures may also be used in addition to or in place of the structures to implement telecommunications functions or other functions.
In one embodiment, the processing functionality of the controllably source electromagnetic data may be integrated into the central processor 100. Wherein the central processor 100 may be configured to control as follows:
receiving measurement point data on a measurement line acquired by time-frequency electromagnetic exploration of a target area;
determining the full-area equivalent apparent resistivity of the measuring point on the measuring line according to the amplitude data and the phase data of the measuring point data;
determining a measuring point with static displacement, a measuring point without static displacement and offset distances of the measuring points according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
determining the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line;
performing interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and determining the average full-area equivalent apparent resistivity of the first P high-frequency data after the measuring point on the measuring line is interpolated;
smoothing the average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation;
determining the average total area equivalent apparent resistivity of the corrected measuring points according to the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing of the static displacement measuring points, the average total area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line, the average total area equivalent apparent resistivity of the static displacement measuring points and the average total area equivalent apparent resistivity of the measuring points without the static displacement;
Determining the amplitude and the phase of the corrected measuring point on the measuring line, which affect the static displacement, according to the full-area equivalent apparent resistivity of the corrected measuring point;
and inverting the amplitude and the phase of the corrected measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as a processing result of the controllable source electromagnetic data.
As shown in fig. 14, the electronic device 600 may further include: a communication module 110, an input unit 120, an audio processing unit 130, a display 160, a power supply 170. It is noted that the electronic device 600 need not include all of the components shown in fig. 14; in addition, the electronic device 600 may further include components not shown in fig. 14, to which reference is made to the related art.
As shown in fig. 14, the central processor 100, also sometimes referred to as a controller or operational control, may include a microprocessor or other processor device and/or logic device, which central processor 100 receives inputs and controls the operation of the various components of the electronic device 600.
The memory 140 may be, for example, one or more of a buffer, a flash memory, a hard drive, a removable media, a volatile memory, a non-volatile memory, or other suitable device. The information about failure may be stored, and a program for executing the information may be stored. And the central processor 100 can execute the program stored in the memory 140 to realize information storage or processing, etc.
The input unit 120 provides an input to the central processor 100. The input unit 120 is, for example, a key or a touch input device. The power supply 170 is used to provide power to the electronic device 600. The display 160 is used for displaying display objects such as images and characters. The display may be, for example, but not limited to, an LCD display.
The memory 140 may be a solid state memory such as Read Only Memory (ROM), random Access Memory (RAM), SIM card, or the like. But also a memory which holds information even when powered down, can be selectively erased and provided with further data, an example of which is sometimes referred to as EPROM or the like. Memory 140 may also be some other type of device. Memory 140 includes a buffer memory 141 (sometimes referred to as a buffer). The memory 140 may include an application/function storage 142, the application/function storage 142 for storing application programs and function programs or a flow for executing operations of the electronic device 600 by the central processor 100.
The memory 140 may also include a data store 143, the data store 143 for storing data, such as contacts, digital data, pictures, sounds, and/or any other data used by the electronic device. The driver storage 144 of the memory 140 may include various drivers of the electronic device for communication functions and/or for performing other functions of the electronic device (e.g., messaging applications, address book applications, etc.).
The communication module 110 is a transmitter/receiver 110 that transmits and receives signals via an antenna 111. A communication module (transmitter/receiver) 110 is coupled to the central processor 100 to provide an input signal and receive an output signal, which may be the same as in the case of a conventional mobile communication terminal.
Based on different communication technologies, a plurality of communication modules 110, such as a cellular network module, a bluetooth module, and/or a wireless local area network module, etc., may be provided in the same electronic device. The communication module (transmitter/receiver) 110 is also coupled to a speaker 131 and a microphone 132 via an audio processor 130 to provide audio output via the speaker 131 and to receive audio input from the microphone 132 to implement usual telecommunication functions. The audio processor 130 may include any suitable buffers, decoders, amplifiers and so forth. In addition, the audio processor 130 is also coupled to the central processor 100 so that sound can be recorded locally through the microphone 132 and so that sound stored locally can be played through the speaker 131.
The embodiment of the present invention also provides a computer-readable program, wherein when the program is executed in an electronic device, the program causes a computer to execute the method for processing controllable-source electromagnetic data as described in the above embodiment in the electronic device.
The embodiment of the present invention also provides a storage medium storing a computer-readable program, wherein the computer-readable program causes a computer to execute the processing of the controllable-source electromagnetic data described in the above embodiment in an electronic device.
Preferred embodiments of the present invention are described above with reference to the accompanying drawings. The many features and advantages of the embodiments are apparent from the detailed specification, and thus, it is intended by the appended claims to cover all such features and advantages of the embodiments which fall within the true spirit and scope thereof. Further, since numerous modifications and changes will readily occur to those skilled in the art, it is not desired to limit the embodiments of the invention to the exact construction and operation illustrated and described, and accordingly, all suitable modifications and equivalents may be resorted to, falling within the scope thereof.
It will be appreciated by those skilled in the art that embodiments of the present invention may be provided as a method, system, or computer program product. Accordingly, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, the present invention may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and the like) having computer-usable program code embodied therein.
The present invention is described with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the invention. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing apparatus to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.
These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.
The principles and embodiments of the present invention have been described in detail with reference to specific examples, which are provided to facilitate understanding of the method and core ideas of the present invention; meanwhile, as those skilled in the art will have variations in the specific embodiments and application scope in accordance with the ideas of the present invention, the present description should not be construed as limiting the present invention in view of the above.

Claims (18)

1. A method of processing controllably sourced electromagnetic data, the method comprising:
receiving measurement point data on a measurement line acquired by time-frequency electromagnetic exploration of a target area;
determining the full-area equivalent apparent resistivity of the measuring point on the measuring line according to the amplitude data and the phase data of the measuring point data;
Determining a measuring point with static displacement, a measuring point without static displacement and offset distances of the measuring points according to the full-area equivalent apparent resistivity of the measuring point on the measuring line; the offset distance of each measuring point refers to the distance between adjacent measuring points after accumulating and summing by taking the first measuring point as a starting point;
determining the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line;
performing interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and determining the average full-area equivalent apparent resistivity of the first P high-frequency data after the measuring point on the measuring line is interpolated;
smoothing the average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation;
determining the average total area equivalent apparent resistivity of the corrected measuring points according to the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing of the static displacement measuring points, the average total area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line, the average total area equivalent apparent resistivity of the static displacement measuring points and the average total area equivalent apparent resistivity of the measuring points without the static displacement;
Determining the amplitude and the phase of the corrected measuring point on the measuring line, which affect the static displacement, according to the full-area equivalent apparent resistivity of the corrected measuring point;
and inverting the amplitude and the phase of the corrected measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as a processing result of the controllable source electromagnetic data.
2. The method for processing controllable-source electromagnetic data according to claim 1, wherein receiving measurement point data on a measurement line acquired by time-frequency electromagnetic exploration of a target area comprises:
according to the distribution range and the component type of the actually measured electromagnetic time-frequency electromagnetic method shooting frequency, selecting a time-frequency electromagnetic measuring line, and collecting measuring point data of the selected measuring line.
3. The method for processing electromagnetic data of controllable source according to claim 1, wherein determining the full field equivalent apparent resistivity of the measuring point on the measuring line according to the amplitude data and the phase data of the measuring point data comprises:
determining the frequency domain full-area equivalent apparent resistivity of the measuring point on the measuring line;
and carrying out logarithmic processing on the frequency domain full-area equivalent apparent resistivity to determine the full-field equivalent apparent resistivity of the measuring point on the measuring line.
4. The method for processing controllable-source electromagnetic data according to claim 1, wherein determining the measurement point with the static displacement, the measurement point without the static displacement, and the offset of each measurement point according to the full-area equivalent apparent resistivity of the measurement point on the measurement line comprises:
Determining a full-area equivalent apparent resistivity profile of the measuring point on the measuring line according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
and (3) using the Kriging method to grid the full-area equivalent apparent resistivity to determine the measuring points with static displacement and the measuring points without static displacement.
5. The method for processing electromagnetic data of controllable source according to claim 1, wherein the interpolating process is performed by using the offset without static displacement measurement points and the average total area equivalent apparent resistivity of the first P pieces of high frequency data, and determining the average total area equivalent apparent resistivity of the first P pieces of high frequency data after the measurement point interpolation on the measurement line includes:
and performing cubic spline interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and interpolating the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring point with static displacement to obtain the average full-area equivalent apparent resistivity of the first three high-frequency data after the measuring point on the measuring line is interpolated.
6. The method for processing electromagnetic data of controllable source according to claim 1, wherein the smoothing the average total area equivalent apparent resistivity of the first P pieces of high frequency data after interpolation of the measuring points on the measuring line after interpolation processing includes:
And performing cubic spline smoothing on the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing according to a preset smoothing coefficient.
7. The method for processing electromagnetic data of controllable source according to claim 1, wherein determining the corrected average total area equivalent apparent resistivity of the measurement points according to the average total area equivalent apparent resistivity of the first P pieces of high frequency data after interpolation smoothing with static displacement measurement points, the average total area equivalent apparent resistivity of the first P pieces of high frequency data of measurement points on the measurement line, the average total area equivalent apparent resistivity with static displacement measurement points, and the average total area equivalent apparent resistivity without static displacement measurement points comprises:
determining a difference dρ between an average full-area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing with static displacement measurement points and an average full-area equivalent apparent resistivity of the first P high-frequency data of measurement points on a line prior to interpolation a ；
Adding the difference dρ to the average full-area equivalent apparent resistivity with static displacement measuring points a The average full-area equivalent apparent resistivity of the corrected measuring points is formed by the average full-area equivalent apparent resistivity of the measuring points without static displacement.
8. The method for processing controllable-source electromagnetic data according to claim 1, wherein determining the resistivity profile and the polarizability profile as the processing result of the controllable-source electromagnetic data from the amplitude and the phase of the corrected measurement points on the inversion line comprises:
Inverting the amplitude and the phase after correction of the measuring points on the measuring line by using a controllable source 2.5D inversion algorithm to determine a resistivity profile;
and inverting the corrected amplitude and phase of the measuring point on the measuring line by using a controllable source 1D self-adaptive differential evolution algorithm to obtain a polarization ratio section diagram under the measuring line.
9. A device for processing controllably sourced electromagnetic data, the device comprising:
the data receiving module is used for receiving measurement point data on a measurement line acquired by time-frequency electromagnetic exploration of a target area;
the full-area equivalent apparent resistivity determining module is used for determining the full-area equivalent apparent resistivity of the measuring points on the measuring line according to the amplitude data and the phase data of the measuring point data;
the measuring point determining module is used for determining a measuring point with static displacement, a measuring point without static displacement and offset distances of the measuring points according to the full-area equivalent apparent resistivity of the measuring point on the measuring line; the offset distance of each measuring point refers to the distance between adjacent measuring points after accumulating and summing by taking the first measuring point as a starting point;
the high-frequency data resistivity determining module is used for determining the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line;
the interpolation processing module is used for carrying out interpolation processing by utilizing the offset distance of the measuring point without static displacement and the average total area equivalent apparent resistivity of the first P high-frequency data, and determining the average total area equivalent apparent resistivity of the first P high-frequency data after the measuring point on the measuring line is interpolated;
The smoothing processing module is used for carrying out smoothing processing on the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing;
the correction module is used for determining the average total area equivalent apparent resistivity of the corrected measuring points according to the average total area equivalent apparent resistivity of the first P high-frequency data after interpolation smoothing treatment of the static displacement measuring points, the average total area equivalent apparent resistivity of the first P high-frequency data of the measuring points on the measuring line, the average total area equivalent apparent resistivity of the static displacement measuring points and the average total area equivalent apparent resistivity of the measuring points without static displacement;
the amplitude phase determining module is used for determining the amplitude and the phase after the correction of the influence of the measuring point on the measuring line on the static displacement according to the full-area equivalent apparent resistivity of the corrected measuring point;
and the inversion module is used for inverting the amplitude and the phase after correction of the measuring points on the measuring line to determine a resistivity section chart and a polarizability section chart as a processing result of the controllable source electromagnetic data.
10. The apparatus for processing controllably source electromagnetic data according to claim 9, wherein the global equivalent apparent resistivity determination module comprises:
the calculating unit is used for calculating the frequency domain full-area equivalent apparent resistivity of the measuring point on the measuring line;
And the logarithmic processing unit is used for carrying out logarithmic processing on the frequency domain full-area equivalent apparent resistivity to determine the full-field equivalent apparent resistivity of the measuring point on the measuring line.
11. The apparatus for processing controllably source electromagnetic data according to claim 9, wherein the global equivalent apparent resistivity determination module comprises:
the frequency domain full-area equivalent apparent resistivity determining unit is used for determining the frequency domain full-area equivalent apparent resistivity of the measuring point on the measuring line;
and the logarithmic processing unit is used for carrying out logarithmic processing on the full-area equivalent apparent resistivity of the frequency domain to determine the full-field equivalent apparent resistivity of the measuring point on the measuring line.
12. The apparatus for processing controllably source electromagnetic data according to claim 9, wherein the station determination module comprises:
the offset distance determining unit is used for determining a full-area equivalent apparent resistivity profile of the measuring point on the measuring line and an offset distance of the measuring point according to the full-area equivalent apparent resistivity of the measuring point on the measuring line;
and the static displacement measuring point determining unit is used for determining the measuring points with and without static displacement by using the Kriging method to grid the full-area equivalent apparent resistivity.
13. The apparatus for processing electromagnetic data of controllable source according to claim 9, wherein the interpolation processing module performs interpolation processing using an offset distance of a measurement point without static displacement and an average total area equivalent apparent resistivity of the first P pieces of high frequency data, and determining the average total area equivalent apparent resistivity of the first P pieces of high frequency data after interpolation of the measurement point on the measurement line includes:
And performing cubic spline interpolation processing by using the offset distance of the measuring point without static displacement and the average full-area equivalent apparent resistivity of the first P high-frequency data, and interpolating the average full-area equivalent apparent resistivity of the first P high-frequency data of the measuring point with static displacement to obtain the average full-area equivalent apparent resistivity of the first three high-frequency data after the measuring point on the measuring line is interpolated.
14. The apparatus for processing electromagnetic data of controllable source according to claim 9, wherein the smoothing module performs smoothing on an average total area equivalent apparent resistivity of the first P pieces of high frequency data interpolated at the measuring points on the measuring line after interpolation processing, comprising:
and performing cubic spline smoothing on the first P high-frequency data after interpolation of the measuring points on the measuring line after interpolation processing according to a preset smoothing coefficient.
15. The apparatus for processing controllably source electromagnetic data according to claim 9, wherein the correction module comprises:
a difference value determining unit for determining a difference value dρ between the average full-area equivalent apparent resistivity of the first P high frequency data after interpolation smoothing with static displacement measuring points and the average full-area equivalent apparent resistivity of the first P high frequency data of measuring points on the measuring line before interpolation a ；
A correction processing unit for adding the difference dρ to the average full-area equivalent apparent resistivity with static displacement measuring points a The average full-area equivalent apparent resistivity of the corrected measuring points is formed by the average full-area equivalent apparent resistivity of the measuring points without static displacement.
16. The apparatus for processing controllable-source electromagnetic data of claim 9, wherein said inversion module comprises:
the resistivity profile determining unit is used for inverting the amplitude and the phase after correction of the measuring points on the measuring line by using a 2.5D inversion algorithm of the controllable source to determine a resistivity profile;
and the polarizability section chart determining unit is used for inverting the corrected amplitude and phase of the measuring point on the measuring line by using the controllable source 1D self-adaptive differential evolution algorithm to obtain the polarizability section chart below the measuring line.
17. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the method of any of claims 1 to 8 when executing the computer program.
18. A computer readable storage medium, characterized in that the computer readable storage medium stores a computer program for executing the method of any one of claims 1 to 8.
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