CN111060979B - Determination method and device of apparent resistivity - Google Patents
Determination method and device of apparent resistivity Download PDFInfo
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Abstract
The invention discloses a method and a device for determining apparent resistivity. Wherein, the method comprises the following steps: determining a magnetic field component of a measuring point in a frequency domain in the horizontal Y direction; determining a normalization function corresponding to the magnetic field component; and determining apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters. The invention solves the technical problem that the electromagnetic measurement technology in the related technology can not carry out independent measurement and processing on the magnetic field component in the horizontal Y direction of the frequency domain.
Description
Technical Field
The invention relates to the field of geological exploration, in particular to a method and a device for determining apparent resistivity.
Background
At present, the electromagnetic measurement technology generally uses a controllable source audio magnetotelluric sounding method CSAMT to synchronously measure the horizontal X-direction electric field component and the Y-direction magnetic field component of a frequency domain. However, the frequency domain horizontal Y-direction magnetic field component cannot be processed separately, and the definition and calculation method of the horizontal Y-direction magnetic field component full-area apparent resistivity cannot be formed, and only the approximate kania apparent resistivity is calculated according to the ratio of the frequency domain horizontal X-direction electric field component to the horizontal Y-direction magnetic field component. However, the above approaches are susceptible to static displacement and terrain; in addition, most of the electric field measurement is average information in the coverage range of the electrode of about 50-100 meters, the fixed point performance is weak, and the transverse resolution is low.
In view of the above-mentioned problem that the electromagnetic measurement technology in the related art cannot separately measure and process the magnetic field component in the horizontal Y direction of the frequency domain, no effective solution has been proposed at present.
Disclosure of Invention
The embodiment of the invention provides a method and a device for determining apparent resistivity, which at least solve the technical problem that the electromagnetic measurement technology in the related art cannot independently measure and process the magnetic field component in the horizontal Y direction of a frequency domain.
According to an aspect of an embodiment of the present invention, there is provided a method of determining apparent resistivity, including: determining a magnetic field component of a measuring point in a frequency domain in the horizontal Y direction; determining a normalization function corresponding to the magnetic field component; and determining apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters.
Optionally, determining apparent resistivity in the frequency domain from the normalization function and the frequency domain parameters comprises: determining a connecting line between a central point and a measuring point of an electric dipole and an azimuth angle between the electric dipole; determining a corresponding relation between the normalization function and the frequency domain parameters according to the azimuth angles; and determining apparent resistivity in the frequency domain according to the corresponding relation.
Optionally, determining the corresponding relationship between the normalization function and the frequency domain parameter according to the azimuth angle includes: in the case where the azimuth angle is 0 ° ≦ Φ < 34 ° and the azimuth angle is 35.2644 ° ≦ Φ < 39.4 °, the correspondence between the normalization function and the frequency domain is a first correspondence, wherein the first correspondence is a monotonic relationship; in the case that the azimuth angle is 34.0 ° ≦ Φ < 35.2644 °, the correspondence between the normalization function and the frequency domain is a second correspondence, wherein the second correspondence is a monotonic relationship and a three-valued coexistence relationship; under the condition that the azimuth angle is more than or equal to 39.4 degrees and less than 45 degrees, the corresponding relation between the normalization function and the frequency domain is a third corresponding relation, wherein the third corresponding relation is a relation of monotone, bivalue and coexistence of three values; in the case that the azimuth angle is phi is 45 degrees, a correspondence between the normalization function and the frequency domain is a fourth correspondence, wherein the fourth correspondence is a two-valued correspondence; and under the condition that the azimuth angle is more than or equal to 45 degrees and less than 90 degrees, the corresponding relation between the normalization function and the frequency domain is a fifth corresponding relation, wherein the fifth corresponding relation is a single-value coexisting relation and a double-value coexisting relation.
Optionally, determining apparent resistivity in the frequency domain according to the correspondence includes: and determining apparent resistivity in the frequency domain by adopting a dichotomy according to the normalization function under the condition that the corresponding relation is the first corresponding relation.
Optionally, determining apparent resistivity in the frequency domain according to the correspondence includes: determining an interval in which the normalization function has a maximum value and an interval in which the normalization function has a minimum value under the condition that the corresponding relationship is the second corresponding relationship and the third corresponding relationship; correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function; and determining apparent resistivity in the frequency domain according to the theoretical normalization function.
Optionally, determining apparent resistivity in the frequency domain according to the correspondence includes: under the condition that the corresponding relation is the fourth corresponding relation, correcting the normalization function according to a preset condition to obtain a theoretical normalization function; searching a maximum value point of a theoretical normalization function, and determining a first sub-normalization function and a second sub-normalization function which respectively correspond to two sides of the maximum value point; determining a monotonicity according to the first sub-normalization function and a monotonicity of the second sub-normalization function; and determining apparent resistivity in the frequency domain according to the monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function.
Optionally, determining apparent resistivity in the frequency domain according to the correspondence includes: determining the apparent resistivity by adopting a dichotomy for a third sub-normalization function corresponding to the first interval of the normalization function under the condition that the corresponding relation is the fifth corresponding relation; correcting a fourth sub-normalization function corresponding to a second interval of the normalization function to obtain a corrected second sub-normalization function; and determining apparent resistivity in the frequency domain according to the corrected second sub-normalization function.
Optionally, before determining the apparent resistivity in the frequency domain according to the correspondence, the method for determining the apparent resistivity further includes: determining the first interval and the second interval according to the relation between the normalization function and a predetermined value, wherein the predetermined value is |2cos2Phi-1, phi being the azimuth.
Optionally, the modifying the interval in which the maximum value exists and the interval in which the minimum value exists to obtain the theoretical normalization function includes: obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:
wherein the content of the first and second substances,
for the theoretical normalization function, β is a correction factor,
as the normalization function, HyRepresenting the magnetic field component in the horizontal Y-direction of the measurement point in the frequency domain.
Optionally, before the modifying the interval in which the maximum value exists and the interval in which the minimum value exists to obtain the theoretical normalization function, the method for determining apparent resistivity further includes: and determining the correction coefficient.
According to another aspect of the embodiments of the present invention, there is also provided an apparent resistivity determination apparatus, including: a first determination unit for determining a magnetic field component of a measurement point in a frequency domain in a horizontal Y direction; a second determination unit for determining a normalization function corresponding to the magnetic field component; and the third determining unit is used for determining the apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters.
Optionally, the third determining unit includes: the first determining subunit is used for determining a connecting line between a central point and a measuring point of an electric dipole and an azimuth angle between the electric dipole; the second determining subunit is used for determining the corresponding relation between the normalization function and the frequency domain parameter according to the azimuth angle; and the third determining subunit is used for determining the apparent resistivity in the frequency domain according to the corresponding relation.
Optionally, the second determining subunit includes: a first determining module for determining a first correspondence between the normalization function and the frequency domain in case the azimuth angle is 0 ° ≦ Φ < 34 ° and the azimuth angle is 35.2644 ° ≦ Φ < 39.4 °, wherein the first correspondence is a monotonic relationship; a second determining module, configured to determine a second corresponding relationship as a corresponding relationship between the normalization function and the frequency domain in a case that the azimuth angle is 34.0 ° ≦ Φ < 35.2644 °, where the second corresponding relationship is a monotonic relationship and a three-valued coexistence relationship; a third determining module, configured to determine, when the azimuth angle is greater than or equal to 39.4 ° < phi < 45 °, that a correspondence between the normalization function and the frequency domain is a third correspondence, where the third correspondence is a relationship in which a monotone, a binary, and a ternary coexist; a fourth determining module, configured to determine that a correspondence between the normalization function and the frequency domain is a fourth correspondence when the azimuth angle is equal to 45 °, where the fourth correspondence is a two-valued correspondence; and the fifth determining module is used for determining that the corresponding relation between the normalization function and the frequency domain is a fifth corresponding relation under the condition that the azimuth angle is more than or equal to 45 degrees and less than 90 degrees, wherein the fifth corresponding relation is a single-value coexisting relation and a double-value coexisting relation.
Optionally, the third determining subunit includes: and a sixth determining module, configured to determine, according to the normalization function, apparent resistivity in the frequency domain by using a dichotomy when the correspondence is the first correspondence.
Optionally, the third determining subunit includes: a seventh determining module, configured to determine, when the correspondence is the second correspondence or the third correspondence, an interval in which a maximum value exists and an interval in which a minimum value exists in the normalization function; the first acquisition module is used for correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function; and the eighth determining module is used for determining the apparent resistivity in the frequency domain according to the theoretical normalization function.
Optionally, the third determining subunit includes: the second obtaining module is used for correcting the normalization function according to a preset condition under the condition that the corresponding relation is the fourth corresponding relation to obtain a theoretical normalization function; a ninth determining module, configured to search a maximum point of a theoretical normalization function, and determine a first sub-normalization function and a second sub-normalization function that correspond to two sides of the maximum point, respectively; a tenth determining module, configured to determine monotonicity according to the first sub-normalization function and monotonicity of the second sub-normalization function; an eleventh determining module, configured to determine apparent resistivity in the frequency domain according to a monotonicity of the first sub-normalization function and a monotonicity of the second sub-normalization function.
Optionally, the third determining subunit includes: a twelfth determining module, configured to determine, by using a dichotomy method, the apparent resistivity for a third sub-normalization function corresponding to a first interval of the normalization function when the correspondence is the fifth correspondence; a thirteenth obtaining module, configured to modify a fourth sub-normalization function corresponding to a second interval of the normalization function to obtain a modified second sub-normalization function; a fourteenth determining module, configured to determine apparent resistivity in the frequency domain according to the modified second sub-normalization function.
Optionally, the apparatus for determining apparent resistivity further includes: a fourth determining subunit configured to determine the first interval and the second interval according to a relationship between the normalization function and a predetermined value before determining the apparent resistivity in the frequency domain according to the correspondence relationship, wherein the predetermined value is |2cos2Phi-1, phi being the azimuth.
Optionally, the first obtaining module includes:the obtaining submodule is used for obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:
wherein the content of the first and second substances,
for the theoretical normalization function, β is a correction factor,
as the normalization function, HyRepresenting the magnetic field component in the horizontal Y-direction of the measurement point in the frequency domain.
Optionally, the apparatus for determining apparent resistivity further includes: and the fifteenth determining module is used for determining the correction coefficient before correcting the interval with the maximum value and the interval with the minimum value to obtain the theoretical normalization function.
According to another aspect of the embodiments of the present invention, there is also provided a storage medium including a stored program, wherein the program executes the method for determining apparent resistivity according to any one of the above.
According to another aspect of the embodiments of the present invention, there is also provided a processor, configured to execute a program, where the program executes the method for determining apparent resistivity.
In the embodiment of the invention, the magnetic field component of a measuring point in a determined frequency domain in the horizontal Y direction is adopted; then determining a normalization function corresponding to the magnetic field component; the manner in which apparent resistivity in the frequency domain is then determined from the normalization function and frequency domain parameters. The apparent resistivity determination method provided by the embodiment of the invention can establish the horizontal Y-direction magnetic field component in the frequency domain for independent measurement and processing, thereby effectively reducing the static displacement effect existing in the horizontal direction electric field component, the terrain effect for measuring in the terrain complex area, and the defect of higher difficulty in arranging measuring points when measuring in the terrain complex area, realizing small-point-distance measurement, improving the horizontal transverse resolution capability of the underground medium, and further solving the technical problem that the electromagnetic measurement technology in the related technology cannot independently measure and process the horizontal Y-direction magnetic field component in the frequency domain.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
FIG. 1 is a flow chart of a method of apparent resistivity determination according to an embodiment of the invention;
FIG. 2 is a schematic diagram of field deployment of frequency domain ground electromagnetic methods according to an embodiment of the present invention;
FIG. 3 is a schematic representation of "full-field" apparent resistivity in accordance with an embodiment of the invention;
fig. 4 is a schematic diagram of an apparent resistivity determination apparatus according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
For convenience of description, some terms or expressions appearing in the embodiments of the present invention are explained in detail below:
frequency domain: it is meant that the function is analyzed from the frequency point of view of the function, as opposed to the frequency domain, which is the time domain. That is, if the signal is analyzed from the time domain, time is abscissa and amplitude is ordinate, and frequency is abscissa and amplitude is ordinate in the frequency domain.
Electric dipole: is a system consisting of two equal-quantity different-sign point charges. It is characterized by an electric dipole moment p-qi, where i is the distance between two point charges and the directions of i and p are specified to point from-q to + q.
Circular frequency: the movement of an object that is referred to as simply vibrating in harmonic terms can be described by a reference circle. The mass points do uniform circular motion on a circle with the amplitude as the radius around the center of the circle, and the angular velocity is 2 pi times of the vibration frequency of the mass points. One rotation of the mass point around the center of the circle is equivalent to one angular vibration cycle of uniform circular motion.
Resistivity: is a physical quantity for expressing the resistance characteristics of various substances, that is, the ratio of the product of the resistance and the cross-sectional area of an original (20 ℃ at normal temperature) made of a certain substance to the length. The resistivity is independent of factors such as the length and cross-sectional area of the conductor, is an electrical property of the conductor material itself, is determined by the material of the conductor, and is temperature dependent.
1, amount of the wine: are concepts from functional and complex functions.
Frequency spectrum: it is the abbreviation of frequency spectrum density, and is the distribution curve of frequency. The complex oscillations are decomposed into harmonic oscillations of different amplitudes and different frequencies, and the pattern of the amplitude of these harmonic oscillations arranged in terms of frequency is called the frequency spectrum.
Apparent resistivity: are parameters that reflect changes in the conductivity of rock and ore. In the case of uneven electrical distribution or uneven surface of underground rock, the resistivity obtained by the method for measuring the earth resistivity of an even level and the calculation formula is called apparent resistivity, and is expressed by the symbol ps, and the unit and the resistivity are the same as Ω · m.
Normalization: the method is a simplified calculation mode, namely, a dimensional expression is converted into a dimensionless expression through transformation, and the dimensionless expression becomes a scalar.
Example 1
In accordance with an embodiment of the present invention, there is provided a method embodiment of a method of apparent resistivity determination, it being noted that the steps illustrated in the flowchart of the drawings may be performed in a computer system, such as a set of computer-executable instructions, and that while a logical order is illustrated in the flowchart, in some cases the steps illustrated or described may be performed in an order different than presented herein.
Fig. 1 is a flowchart of a determination method of apparent resistivity according to an embodiment of the present invention, as shown in fig. 1, the determination method of apparent resistivity includes the steps of:
in step S102, the magnetic field component of the measuring point in the frequency domain in the horizontal Y direction is determined.
The ground electromagnetic method is an electromagnetic exploration method which adopts an artificial source to emit an excitation signal and observes an induced electromagnetic total field in a research area so as to research an underground electrical structure.
FIG. 2 is a schematic diagram of field deployment of frequency domain terrestrial electromagnetic methods according to an embodiment of the invention. As shown in fig. 2, the physical quantity measured at the observation point is a magnetic field in the horizontal Y direction, that is: hy(f) (in nt), where f is the observation frequency (in Hz). In FIG. 2, AB is the transmitting electric dipole, the intensity of the current for feeding a sine wave to the ground by the transmitter is I, and the dipole moment of the transmitting electric dipole is PEI.ab (ampere/meter),
is the transmitting-receiving distance (the distance from the central point O of AB to the measuring point P, unit: meter), phi is the connecting line of the central point O of the transmitting electric dipole and the measuring point P and the transmitting electricityThe angle between the dipoles AB. Hy(f) Is the horizontal Y-direction magnetic field component perpendicular to the emitting electric dipole. The dots in the figure are the measuring points, typically 2-10 meters apart.
Generally, over a limited time frame (e.g., 1 day or 1 week), the spectrum of the total horizontal magnetic field component is obtained for each frequency bin at all stations, i.e.: hy(xi,yi,ωj) I is 1, …, M; j is 1, …, N. M is the number of actual observed points on the ground, and N is the total frequency point observed on each measuring point. Omega is the circular frequency, omegaj＝2πfj. And acquiring resistivity plane distribution data of a stratum at a specific depth (for example, an ignition layer in fire flooding exploitation) in the underground through processing and inverting the frequency spectrum data.
Step S104, determining a normalization function corresponding to the magnetic field component.
And step S106, determining apparent resistivity in a frequency domain according to the normalization function and the frequency domain parameters.
In the above step, the magnetic field component of the survey point in the frequency domain in the horizontal Y direction is determined, then the normalization function corresponding to the magnetic field component is determined, and the apparent resistivity in the frequency domain is determined according to the normalization function and the frequency domain parameters. Compared with the defect that the electromagnetic measurement technology in the related technology cannot carry out independent measurement and processing on the magnetic field component in the horizontal Y direction of the frequency domain, the apparent resistivity determination method provided by the embodiment of the invention can establish the independent measurement and processing on the magnetic field component in the horizontal Y direction of the frequency domain, thereby effectively reducing the static displacement effect existing in the electric field component in the horizontal direction, the topographic effect of measuring complex terrain areas and the defect of higher difficulty in arranging measuring points when measuring the complex terrain areas, realizing small-point-distance measurement, improving the horizontal transverse resolution capability of an underground medium and further solving the technical problem that the electromagnetic measurement technology in the related technology cannot carry out independent measurement and processing on the magnetic field component in the horizontal Y direction of the frequency domain.
In the embodiment of the invention, an artificial source mode is adopted, a layout mode shown in figure 2 is adopted for field data acquisition, and measuring points can be in a line or a plane within a certain area range. An independent horizontal Y-direction magnetic field component probe (e.g., an induction coil) is placed at each measurement point. The frequency spectrum of the horizontal Y-direction magnetic field component is obtained on a frequency point-by-frequency point basis at all the survey points over a finite and short time frame.
"Total area" apparent resistivity in embodiments of the invention
Implicit in the following equation (1):
wherein the content of the first and second substances,
i and K are each a molar amount of
The first and second class of modified bessel functions.
In addition, the first and second substrates are,
referred to as the theoretical normalization function of the horizontal Y-direction magnetic field component, which is of the form (2):
through the conversion processing, a horizontal Y-direction magnetic field component normalization function is calculated:
as an alternative embodiment of the present invention, determining apparent resistivity in the frequency domain from the normalization function and the frequency domain parameters may comprise: determining a connecting line between a central point of the electric dipole and the measuring point and an azimuth angle between the electric dipoles; determining a corresponding relation between the normalization function and the frequency domain parameters according to the azimuth angle; and determining apparent resistivity in the frequency domain according to the corresponding relation.
In the above embodiment, determining the correspondence between the normalization function and the frequency domain parameter according to the azimuth angle may include: under the condition that the azimuth angle is between 0 degrees and less than 34 degrees and the azimuth angle is between 35.2644 degrees and less than 39.4 degrees, the corresponding relation between the normalization function and the frequency domain is a first corresponding relation, wherein the first corresponding relation is a monotonous relation; under the condition that the azimuth angle is between 34.0 degrees and phi less than 35.2644 degrees, the corresponding relation between the normalization function and the frequency domain is a second corresponding relation, wherein the second corresponding relation is a monotonous relation and a three-value coexistence relation; under the condition that the azimuth angle is more than or equal to 39.4 degrees and less than 45 degrees, the corresponding relation between the normalization function and the frequency domain is a third corresponding relation, wherein the third corresponding relation is a relation of monotone, double values and coexistence of the three values; in the case that the azimuth angle is phi is 45 degrees, the corresponding relation between the normalization function and the frequency domain is a fourth corresponding relation, wherein the fourth corresponding relation is a two-value relation; and under the condition that the azimuth angle is more than or equal to 45 degrees and less than 90 degrees, the corresponding relation between the normalization function and the frequency domain is a fifth corresponding relation, wherein the fifth corresponding relation is a single-value coexisting relation and a double-value coexisting relation.
As can be seen from the above embodiments, the manner for determining the apparent resistivity is different when the corresponding relationship between the normalization function and the frequency domain parameter is different, and the following detailed description is given.
For example, determining apparent resistivity in the frequency domain from the correspondence may include: and determining apparent resistivity in a frequency domain by adopting a dichotomy according to the normalization function under the condition that the corresponding relation is the first corresponding relation.
For another example, determining apparent resistivity in the frequency domain from the correspondence may include: determining an interval with a maximum value and an interval with a minimum value of the normalization function under the condition that the corresponding relation is a second corresponding relation and a third corresponding relation; correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function; and determining apparent resistivity in a frequency domain according to a theoretical normalization function.
For another example, determining apparent resistivity in the frequency domain from the correspondence may include: under the condition that the corresponding relation is the fourth corresponding relation, correcting the normalization function according to a preset condition to obtain a theoretical normalization function; searching a maximum value point of the theoretical normalization function, and determining a first sub-normalization function and a second sub-normalization function which respectively correspond to two sides of the maximum value point; determining the monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function; and determining apparent resistivity in the frequency domain according to the monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function.
In addition, determining apparent resistivity in the frequency domain according to the correspondence may include: determining apparent resistivity by adopting a dichotomy method for a third sub-normalization function corresponding to the first interval of the normalization function under the condition that the corresponding relation is a fifth corresponding relation; correcting a fourth sub-normalization function corresponding to a second interval of the normalization function for the second interval to obtain a corrected second sub-normalization function; and determining apparent resistivity in the frequency domain according to the modified second sub-normalization function.
As an optional embodiment of the present invention, before determining the apparent resistivity in the frequency domain according to the correspondence, the method for determining the apparent resistivity may further include: determining a first interval and a second interval according to the relation between the normalization function and a predetermined value, wherein the predetermined value is |2cos2Phi-1 and phi is the azimuth angle.
As an optional embodiment of the present invention, the modifying the interval in which the maximum value exists and the interval in which the minimum value exists to obtain the theoretical normalization function may include: obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:
wherein the content of the first and second substances,
as a theoretical normalization function, beta is a modificationThe positive coefficient is a positive coefficient of the total of the linear vibration,
for the normalization function, Hy represents the magnetic field component in the horizontal Y-direction at the measurement point in the frequency domain.
As an optional embodiment of the present invention, before the modifying the interval in which the maximum value exists and the interval in which the minimum value exists to obtain the theoretical normalization function, the method for determining apparent resistivity may further include: a correction factor is determined.
The following describes in detail the determination method of apparent resistivity provided in the embodiment of the present invention.
The first step is to obtain the horizontal Y-direction magnetic field record data H of the frequency domain acquired in the fieldy(xi,yi,ωj),i＝1,…,M；j＝1,…,N。
With the arrangement shown in fig. 2, a separate horizontal Y-direction magnetic field component probe (e.g., an induction coil) is arranged at each measurement point. The frequency spectrum of the horizontal Y-direction magnetic field component is obtained on a frequency point-by-frequency point basis at all survey points over a limited and short time frame (e.g., 1 day or 1 week).
And secondly, calculating an actually measured normalization function of the magnetic field component in the horizontal Y direction. The method can be completed by adopting the formula (3).
Thirdly, actually measuring a normalization function of the horizontal Y-direction magnetic field component in the frequency domain, and calculating the apparent resistivity of the whole region by adopting a morphological expansion method and a dichotomy method
The specific calculation procedure is as follows.
(1) When the azimuth angle is more than or equal to 0 degree and less than 34 degrees, the angle is larger than or equal to 0 degree
The relationship between the variable a and real (k) r (a is a frequency domain parameter) is monotonous, so that the calculation of the dichotomy can be adopted
Initial endpointValue is taken as (i.e. define the root spacing interval)
And
the "dichotomy" referred to herein refers to a "dichotomy" in solving a nonlinear equation in a numerical calculation method.
(2) When the angle is more than or equal to 34.0 degrees and less than 35.2644 degrees,
the relationship with the variable a is monotonic and ternary. Therefore, the measured normalization function of the horizontal Y-direction magnetic field component
In the interval of local maximum and minimum, the method is modified into
Recalculating
The "morphological dilation method" referred to herein is a "morphological dilation method" in which all measured normalization functions within a region are modified to normalized field values that are formalized and normalized (satisfy the theoretical normalization function characteristics of a uniform half-space), and such modification is referred to as a normalization function. The characteristic parameters of the theoretical normalization function of the horizontal Y-direction magnetic field component belonging to the azimuth angle are calculated in advance from the analytical solution of the uniform half-space (equation (2) above)
And
that is, two false solutions can be excluded from three equivalent solutions to obtain only one true solution. Where a is real (k) r.
(3) When the angle is between 35.2644 DEG and phi is less than 39.4 DEG,
the relationship with the variable a is monotonic. Calculating by using a dichotomy
The initial endpoint value (i.e., root-spaced interval) is taken as
And
(4) when the angle is more than or equal to 39.4 degrees and less than 45 degrees,
the relation between the variable a is monotonous, two-valued and three-valued. Therefore, the measured normalization function of the horizontal Y-direction magnetic field component
In the interval of local maximum and minimum, the method is modified into
Recalculating
The characteristic parameter pertaining to the azimuth is calculated in advance from the analytical solution of the uniform half-space (equation (2) above)
And
i.e., two spurious solutions can be excluded from the three equivalent solutions.
(5) When in use
The method comprises the following steps:
and the variable a is in a relationship of double-value correspondence. The characteristic parameter pertaining to this azimuth angle is
The measured normalization function of the horizontal Y-direction magnetic field component is 'shape-expanded' to the maximum value
Equal to state 0.2491125. Then, the two sides of the maximum value point are respectively calculated by adopting a dichotomy method according to the monotonous condition
(6) Phi is more than or equal to 45 degrees and less than 90 degrees.
The relation between the frequency parameter a and the frequency parameter a is single-value and double-value. Magnetic field component actual measurement normalization function in horizontal Y direction
The interval of (A) adopts the dichotomy "
Magnetic field component actual measurement normalization function in horizontal Y direction
Interval of local maximum
Modified from 'morphological dilation method' to
Recalculation
Is calculated in advance from the analytical solution of the uniform half-space (equation (2) above)The characteristic parameter belonging to the azimuth angle is
And
i.e. one spurious solution can be excluded from the two equivalent solutions. The correction coefficient β of the "morphological dilation method" can be taken by equation (4) as:
therefore, the actually measured normalization function of the horizontal Y-direction magnetic field component is corrected to be in the form shown in the formula (5) by a form expansion method:
according to the steps, the 'whole-area' apparent resistivity corresponding to the horizontal Y-direction magnetic field component at any azimuth angle can be calculated
FIG. 3 is a graphical representation of "total zone" apparent resistivity according to an embodiment of the invention, which is a continuous curve and maintains an approximate positive correspondence with resistivity characteristics of the subsurface electrical formation. It has the main functions as follows: firstly, an initial model of inversion is conveniently solved, and secondly, the method can be used for constructing a proper inversion target function, so that the inversion can be ensured to normally start and continue and converge to a true solution.
Compared with the prior art, the determination method of the apparent resistivity provided by the embodiment of the invention has the following effects:
(1) only the magnetic field component in the horizontal Y direction is collected, and the engineering cost is reduced.
(2) The acquisition device is a magnetic probe. If an induction coil (magnetic bar) is used, the size is small, so that the device has better stationarity of detection signals. If a smaller measurement point distance is selected, the horizontal direction stratum resolution capability of the engineering survey can be improved.
(3) Because the magnetic field component in the horizontal Y direction is collected, the mutual interference among the measuring points is small, and the signal-to-noise ratio of the data is improved.
(4) The spectrum of the horizontal magnetic field component is obtained on a frequency point by frequency point basis at all the measurement points over a limited short time range (e.g., 1 day or 1 week). This is equivalent to synchronously collecting the data of all the measuring points in one measuring area, thereby having timeliness. The accuracy of dynamic monitoring of the oil reservoir is improved.
(5) The definition and calculation method of the accurate and non-approximate 'full zone' apparent resistivity are given. The key technical difficulties of subsequent processing and inversion are solved.
Table 1 shows the correspondence between the number of layers and the resistivity and the thickness of the bottom layer, and in particular as shown in table 1,
TABLE 1
Example 2
According to the embodiment of the present invention, there is also provided an apparatus for determining apparent resistivity, and it should be noted that the apparatus for determining apparent resistivity according to the embodiment of the present invention may be used to execute the method for determining apparent resistivity according to the embodiment of the present invention. The following describes an apparatus for determining apparent resistivity according to an embodiment of the present invention.
Fig. 4 is a schematic diagram of an apparent resistivity determination apparatus according to an embodiment of the present invention, as shown in fig. 4, including: a first determining unit 41, a second determining unit 43 and a third determining unit 45. The determination device of the apparent resistivity is explained in detail below.
A first determination unit 41 for determining a magnetic field component of the survey point in the frequency domain in the horizontal Y-direction.
A second determining unit 43, connected to the second determining unit 43, for determining a normalization function corresponding to the magnetic field component.
And a third determining unit 45, connected to the second determining unit 43, for determining apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters.
In the above-described embodiment, the magnetic field component of the survey point in the frequency domain in the horizontal Y direction may be determined by the first determination unit; then, a second determination unit is adopted to determine a normalization function corresponding to the magnetic field component; and determining apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters by using a third determination unit. Compared with the defect that the electromagnetic measurement technology in the related technology cannot carry out independent measurement and processing on the magnetic field component in the horizontal Y direction of the frequency domain, the apparent resistivity determining device provided by the embodiment of the invention can establish the magnetic field component in the horizontal Y direction in the frequency domain for independent measurement and processing, thereby effectively reducing the static displacement effect existing in the electric field component in the horizontal direction, the topographic effect in a region with complex terrain, and the defect of higher difficulty in laying measuring points when measuring in the region with complex terrain, realizing small-point-distance measurement, improving the horizontal transverse resolution capability of an underground medium, and further solving the technical problem that the electromagnetic measurement technology in the related technology cannot carry out independent measurement and processing on the magnetic field component in the horizontal Y direction of the frequency domain.
As an alternative embodiment of the present invention, the third determining unit may include: the first determining subunit is used for determining a connecting line between a central point of the electric dipole and the measuring point and an azimuth angle between the electric dipoles; the second determining subunit is used for determining the corresponding relation between the normalization function and the frequency domain parameters according to the azimuth angle; and the third determining subunit is used for determining the apparent resistivity in the frequency domain according to the corresponding relation.
As an alternative embodiment of the present invention, the second determining subunit may include: the first determining module is used for determining that the corresponding relation between the normalization function and the frequency domain is a first corresponding relation under the conditions that the azimuth angle is more than or equal to 0 degrees and less than 34 degrees and the azimuth angle is more than or equal to 35.2644 degrees and less than 39.4 degrees, wherein the first corresponding relation is a monotonous relation; the second determining module is used for determining that the corresponding relation between the normalization function and the frequency domain is a second corresponding relation under the condition that the azimuth angle is more than or equal to 34.0 degrees and less than 35.2644 degrees, wherein the second corresponding relation is a monotonous relation and a three-value coexistence relation; the third determining module is used for determining that the corresponding relation between the normalization function and the frequency domain is a third corresponding relation under the condition that the azimuth angle is more than or equal to 39.4 degrees and less than 45 degrees, wherein the third corresponding relation is a relation of monotony, double values and coexistence of the three values; a fourth determining module, configured to determine, when the azimuth angle is phi ═ 45 °, that a correspondence between the normalization function and the frequency domain is a fourth correspondence, where the fourth correspondence is a binary relationship; and the fifth determining module is used for determining that the corresponding relation between the normalization function and the frequency domain is a fifth corresponding relation under the condition that the azimuth angle is more than or equal to 45 degrees and less than 90 degrees, wherein the fifth corresponding relation is a single-value coexisting relation and a double-value coexisting relation.
As an alternative embodiment of the present invention, the third determining subunit may include: and the sixth determining module is used for determining the apparent resistivity in the frequency domain by adopting a dichotomy according to the normalization function under the condition that the corresponding relation is the first corresponding relation.
As an alternative embodiment of the present invention, the third determining subunit may include: the seventh determining module is used for determining an interval of the normalization function with a maximum value and an interval of the normalization function with a minimum value under the condition that the corresponding relation is the second corresponding relation and the third corresponding relation; the first acquisition module is used for correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function; and the eighth determining module is used for determining apparent resistivity in a frequency domain according to the theoretical normalization function.
As an alternative embodiment of the present invention, the third determining subunit may include: the second obtaining module is used for correcting the normalization function according to a preset condition under the condition that the corresponding relation is a fourth corresponding relation to obtain a theoretical normalization function; a ninth determining module, configured to search a maximum point of the theoretical normalization function, and determine a first sub-normalization function and a second sub-normalization function that correspond to two sides of the maximum point, respectively; a tenth determining module, configured to determine a monotonicity according to the first sub-normalization function and a monotonicity of the second sub-normalization function; and the eleventh determining module is used for determining the apparent resistivity in the frequency domain according to the monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function.
As an alternative embodiment of the present invention, the third determining subunit may include: a twelfth determining module, configured to determine, by using a dichotomy, an apparent resistivity for a third sub-normalization function corresponding to the first interval of the normalization function when the correspondence is the fifth correspondence; a thirteenth obtaining module, configured to modify a fourth sub-normalization function corresponding to a second interval of the normalization function to obtain a modified second sub-normalization function; and a fourteenth determining module, configured to determine the apparent resistivity in the frequency domain according to the modified second sub-normalization function.
As an optional embodiment of the present invention, the apparatus for determining apparent resistivity may further include: a fourth determining subunit for determining the first interval and the second interval according to a relationship between the normalization function and a predetermined value before determining the apparent resistivity in the frequency domain according to the correspondence relationship, wherein the predetermined value is |2cos2Phi-1 and phi is the azimuth angle.
As an optional embodiment of the present invention, the first obtaining module may include: the obtaining submodule is used for obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:
wherein the content of the first and second substances,
as a theoretical normalization function, beta is a correction factor,
as a normalizing function, HyRepresenting the magnetic field component in the horizontal Y-direction of the measurement point in the frequency domain.
As an optional embodiment of the present invention, the apparatus for determining apparent resistivity may further include: and the fifteenth determining module is used for determining a correction coefficient before correcting the interval with the maximum value and the interval with the minimum value to obtain the theoretical normalization function.
The determination device for apparent resistivity comprises a processor and a memory, wherein the first determination unit 41, the second determination unit 43, the third determination unit 45 and the like are stored in the memory as program units, and the processor executes the program units stored in the memory to realize corresponding functions.
The processor comprises a kernel, and the kernel calls a corresponding program unit from the memory. The kernel can be set to be one or more, and apparent resistivity in a frequency domain is determined according to the normalization function and the frequency domain parameters by adjusting kernel parameters.
The memory may include volatile memory in a computer readable medium, Random Access Memory (RAM) and/or nonvolatile memory such as Read Only Memory (ROM) or flash memory (flash RAM), and the memory includes at least one memory chip.
According to another aspect of an embodiment of the present invention, there is also provided a storage medium including a stored program, wherein the program performs the determination method of apparent resistivity of any one of the above.
According to another aspect of the embodiments of the present invention, there is also provided a processor, configured to execute a program, where the program executes the method for determining apparent resistivity.
The embodiment of the present invention further provides an apparatus, which includes a processor, a memory, and a program stored in the memory and executable on the processor, and when the processor executes the program, the following steps are implemented: determining a magnetic field component of a measuring point in a frequency domain in the horizontal Y direction; determining a normalization function corresponding to the magnetic field component; and determining apparent resistivity in a frequency domain according to the normalization function and the frequency domain parameters.
There is also provided in an embodiment of the invention a computer program product adapted to perform a program for initializing the following method steps when executed on a data processing device: determining a magnetic field component of a measuring point in a frequency domain in the horizontal Y direction; determining a normalization function corresponding to the magnetic field component; and determining apparent resistivity in a frequency domain according to the normalization function and the frequency domain parameters.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (16)
1. A method for determining apparent resistivity, comprising:
determining a magnetic field component of a measuring point in a frequency domain in the horizontal Y direction;
determining a normalization function corresponding to the magnetic field component;
determining apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameters;
wherein determining apparent resistivity in the frequency domain from the normalization function and the frequency domain parameters comprises: determining a connecting line between a central point and a measuring point of an electric dipole and an azimuth angle between the electric dipole; determining a corresponding relation between the normalization function and the frequency domain parameters according to the azimuth angles; determining apparent resistivity in the frequency domain according to the corresponding relation;
wherein determining the corresponding relationship between the normalization function and the frequency domain parameter according to the azimuth angle comprises: at said azimuth angle of
And the azimuth angle is
In the case of (a), a correspondence between the normalization function and the frequency domain is a first correspondence, wherein the first correspondence is a monotonic relationship; at said azimuth angle of
In the case of (3), a correspondence between the normalization function and the frequency domain is a second correspondence, where the second correspondence is a monotonic relationship and a three-value coexistence relationship; at said azimuth angle of
In the case of (3), a correspondence between the normalization function and the frequency domain is a third correspondence, where the third correspondence is a relationship of monotone, binary, and coexistence of ternary; at said azimuth angle of
In the case of (3), a correspondence between the normalization function and the frequency domain is a fourth correspondence, wherein the fourth correspondence is a two-valued relationship; at said azimuth angle of
In this case, the correspondence between the normalization function and the frequency domain is a fifth correspondence, where the fifth correspondence is a single-value and double-value coexistence relationship.
2. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:
and determining apparent resistivity in the frequency domain by adopting a dichotomy according to the normalization function under the condition that the corresponding relation is the first corresponding relation.
3. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:
determining an interval in which the normalization function has a maximum value and an interval in which the normalization function has a minimum value under the condition that the corresponding relationship is the second corresponding relationship and the third corresponding relationship;
correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function;
and determining apparent resistivity in the frequency domain according to the theoretical normalization function.
4. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:
under the condition that the corresponding relation is the fourth corresponding relation, correcting the normalization function according to a preset condition to obtain a theoretical normalization function;
searching a maximum value point of a theoretical normalization function, and determining a first sub-normalization function and a second sub-normalization function which respectively correspond to two sides of the maximum value point;
determining a monotonicity according to the first sub-normalization function and a monotonicity of the second sub-normalization function;
and determining apparent resistivity in the frequency domain according to the monotonicity of the first sub-normalization function and the monotonicity of the second sub-normalization function.
5. The method of claim 1, wherein determining apparent resistivity in the frequency domain from the correspondence comprises:
determining the apparent resistivity by adopting a dichotomy for a third sub-normalization function corresponding to the first interval of the normalization function under the condition that the corresponding relation is the fifth corresponding relation;
correcting a fourth sub-normalization function corresponding to a second interval of the normalization function to obtain a corrected second sub-normalization function;
and determining apparent resistivity in the frequency domain according to the corrected second sub-normalization function.
6. The method of claim 5, further comprising, prior to determining apparent resistivity in the frequency domain from the correspondence:
determining the first interval and the second interval according to the relation between the normalization function and a predetermined value, wherein the predetermined value is |2cos2Phi-1, phi being the azimuth.
7. The method of claim 3, wherein modifying the interval in which the maximum value exists and the interval in which the minimum value exists to obtain the theoretical normalization function comprises:
obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:
wherein the content of the first and second substances,
for the theoretical normalization function, β is a correction factor,
as the normalization function, HyRepresenting the magnetic field component in the horizontal Y-direction of the measurement point in the frequency domain.
8. An apparent resistivity determination apparatus, comprising:
a first determination unit for determining a magnetic field component of a measurement point in a frequency domain in a horizontal Y direction;
a second determination unit for determining a normalization function corresponding to the magnetic field component;
a third determining unit, configured to determine apparent resistivity in the frequency domain according to the normalization function and the frequency domain parameter;
wherein the third determination unit includes: the first determining subunit is used for determining a connecting line between a central point and a measuring point of an electric dipole and an azimuth angle between the electric dipole; the second determining subunit is used for determining the corresponding relation between the normalization function and the frequency domain parameter according to the azimuth angle; the third determining subunit is used for determining the apparent resistivity in the frequency domain according to the corresponding relation;
wherein the second determining subunit includes: a first determination module for determining at said azimuth angle
And the azimuth angle is
Determining that a correspondence between the normalization function and the frequency domain is a first correspondence, wherein the first correspondence is a monotonic relationship; a second determination module for determining at said azimuth angle
Determining a corresponding relation between the normalization function and the frequency domain as a second corresponding relation, wherein the second corresponding relation is a monotonic relation and a three-value coexistence relation; a third determining module for determining at said azimuth angle
Determining that a corresponding relation between the normalization function and the frequency domain is a third corresponding relation, wherein the third corresponding relation is a relation of monotone, double values and coexistence of three values; a fourth determining module for determining at said azimuth angle
Determining that a correspondence between the normalization function and the frequency domain is a fourth correspondence, wherein the fourth correspondence is a two-valued correspondence; a fifth determining module for determining at said azimuth angle
Determining that a corresponding relation between the normalization function and the frequency domain is a fifth corresponding relation, wherein the fifth corresponding relation is a single-value and double-value coexistence relation.
9. The apparatus of claim 8, wherein the third determining subunit comprises:
and a sixth determining module, configured to determine, according to the normalization function, apparent resistivity in the frequency domain by using a dichotomy when the correspondence is the first correspondence.
10. The apparatus of claim 9, wherein the third determining subunit comprises:
a seventh determining module, configured to determine, when the correspondence is the second correspondence or the third correspondence, an interval in which a maximum value exists and an interval in which a minimum value exists in the normalization function;
the first acquisition module is used for correcting the interval with the maximum value and the interval with the minimum value to obtain a theoretical normalization function;
and the eighth determining module is used for determining the apparent resistivity in the frequency domain according to the theoretical normalization function.
11. The apparatus of claim 8, wherein the third determining subunit comprises:
the second obtaining module is used for correcting the normalization function according to a preset condition under the condition that the corresponding relation is the fourth corresponding relation to obtain a theoretical normalization function;
a ninth determining module, configured to search a maximum point of a theoretical normalization function, and determine a first sub-normalization function and a second sub-normalization function that correspond to two sides of the maximum point, respectively;
a tenth determining module, configured to determine monotonicity according to the first sub-normalization function and monotonicity of the second sub-normalization function;
an eleventh determining module, configured to determine apparent resistivity in the frequency domain according to a monotonicity of the first sub-normalization function and a monotonicity of the second sub-normalization function.
12. The apparatus of claim 8, wherein the third determining subunit comprises:
a twelfth determining module, configured to determine, by using a dichotomy method, the apparent resistivity for a third sub-normalization function corresponding to a first interval of the normalization function when the correspondence is the fifth correspondence;
a thirteenth obtaining module, configured to modify a fourth sub-normalization function corresponding to a second interval of the normalization function to obtain a modified second sub-normalization function;
a fourteenth determining module, configured to determine apparent resistivity in the frequency domain according to the modified second sub-normalization function.
13. The apparatus of claim 12, further comprising:
a fourth determining subunit for determining whether to perform the following operationsBefore the apparent resistivity in the frequency domain is determined according to the corresponding relation, determining the first interval and the second interval according to the relation between the normalization function and a preset value, wherein the preset value is |2cos2Phi-1, phi being the azimuth.
14. The apparatus of claim 10, wherein the first obtaining module comprises:
the obtaining submodule is used for obtaining a theoretical normalization function through a first formula, wherein the first formula is as follows:
wherein the content of the first and second substances,
for the theoretical normalization function, β is a correction factor,
as the normalization function, HyRepresenting the magnetic field component in the horizontal Y-direction of the measurement point in the frequency domain.
15. A storage medium characterized by comprising a stored program, wherein the program executes the determination method of apparent resistivity according to any one of claims 1 to 7.
16. A processor, characterized in that the processor is configured to run a program, wherein the program is configured to perform the method of determining apparent resistivity of any one of claims 1 to 7 when running.
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