CN112379252A - Primary and secondary fusion pole switch test system - Google Patents

Primary and secondary fusion pole switch test system Download PDF

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Publication number
CN112379252A
CN112379252A CN202011211069.0A CN202011211069A CN112379252A CN 112379252 A CN112379252 A CN 112379252A CN 202011211069 A CN202011211069 A CN 202011211069A CN 112379252 A CN112379252 A CN 112379252A
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test
primary
equipment
testing
control device
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CN112379252B (en
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席禹
陈浩敏
姚森敬
于力
辛文成
姜臻
张凡
敖榜
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China Southern Power Grid Digital Grid Technology Guangdong Co ltd
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Southern Power Grid Digital Grid Research Institute Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers

Abstract

The application relates to a test system of a secondary fusion column switch, which comprises a first test device, a second test device and a test control device, wherein the first test device and the second test device are connected with the test control device; the test control device sends a primary independent test instruction to the first test device and receives test data returned by the first test device for independent test of primary equipment, sends a secondary independent test instruction to the second test device and receives test data returned by the second test device for independent test of secondary equipment, and sends a combined test instruction to the first test device and the second test device and receives returned test data; and analyzing the test data to obtain a test result. By the adoption of the method and the device, independent testing and combined testing of the primary and secondary fusion column switch can be achieved, and testing reliability and testing quality are improved.

Description

Primary and secondary fusion pole switch test system
Technical Field
The application relates to the technical field of electrical equipment, in particular to a primary and secondary fusion pole-mounted switch testing system.
Background
With the continuous development of intelligent technology, the column switch in a complete set design gradually becomes a mainstream, and a primary and secondary fusion column switch in a complete set design is composed of a control part device (FTU) and a primary part device (breaker), and the FTU and the primary fusion column switch respectively undertake breaker control and primary connection and disconnection work.
In a traditional primary and secondary fusion pole-mounted switch, primary equipment and secondary equipment of the traditional primary and secondary fusion pole-mounted switch are independent of each other in links of design, manufacture, test and the like and are designed, manufactured and tested by different manufacturers respectively. The method for testing independently of each other not only causes a long testing process, but also can only test the quality of the primary equipment or the secondary equipment, cannot test whether the functions and the performances of the primary equipment and the secondary equipment meet the operation requirements when the primary equipment and the secondary equipment are used in a combined mode, and is low in testing reliability.
Disclosure of Invention
Therefore, it is necessary to provide a primary and secondary fusion column switch testing system capable of improving testing reliability in view of the above technical problems.
A test system for a secondary fusion column switch comprises a first test device, a second test device and a test control device, wherein the first test device and the second test device are connected with the test control device, the first test device is used for connecting primary equipment of the secondary fusion column switch, and the second test device is used for connecting secondary equipment of the secondary fusion column switch;
the test control device sends a primary independent test instruction to the first test device, the first test device independently tests the primary equipment according to the primary independent test instruction and returns test data, the test control device sends a secondary independent test instruction to the second test device, the second test device independently tests the secondary equipment according to the secondary independent test instruction and returns test data, the test control device sends a combined test instruction to the first test device and the second test device, and the first test device and the second test device jointly test the first equipment and the secondary equipment according to the combined test instruction and return test data respectively; and the test control device analyzes the test data to obtain a test result.
The test control device is adopted to control the first test device to independently test the primary equipment, control the second test device to independently test the secondary equipment, control the first test device and the second test device to jointly test the primary equipment and the secondary equipment, and analyze test data obtained by the test to obtain a test result, can realize independent test and combined test of primary equipment and secondary equipment in the primary and secondary fusion column switches, so that the test device has a combined test function on the basis of having an independent test function, does not need to separate the test of primary equipment and secondary equipment, breaks through the current situation of the traditional separated test of the primary equipment and the secondary equipment, the condition of primary equipment and secondary equipment when using can test in combination to promote test reliability and test quality to the switch on the one secondary fusion post.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present application, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a block diagram of a system for testing a switch on a primary and secondary fusion column according to an embodiment;
FIG. 2 is a schematic flow chart illustrating a second fused switch test according to an embodiment;
FIG. 3 is a block diagram of a first testing device in one embodiment;
FIG. 4 is a schematic flow chart illustrating an embodiment of an independent test for a primary device;
FIG. 5 is a block diagram of a second testing device according to an embodiment;
FIG. 6 is a block diagram of a secondary fusion pole top switch test system in another embodiment;
FIG. 7 is a schematic diagram illustrating an embodiment of a process for performing independent testing of secondary devices;
FIG. 8 is a flow diagram that illustrates joint testing, according to one embodiment;
FIG. 9 is a block diagram of a process for testing a secondary fused switch on a column in another embodiment.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Embodiments of the present application are set forth in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another. For example, a first resistance may be referred to as a second resistance, and similarly, a second resistance may be referred to as a first resistance, without departing from the scope of the present application. The first resistance and the second resistance are both resistances, but they are not the same resistance.
It is to be understood that "connection" in the following embodiments is to be understood as "electrical connection", "communication connection", and the like if the connected circuits, modules, units, and the like have communication of electrical signals or data with each other.
As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," etc., specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof.
As shown in fig. 1, in one embodiment, a secondary fusion pole-mounted switch testing system is provided, which includes a first testing device 110, a second testing device 130, and a testing control device 150, wherein the first testing device 110 and the second testing device 130 are connected to the testing control device 150, and the first testing device 110 is configured to connect to a primary device of a secondary fusion pole-mounted switch, such as a primary device may be a circuit breaker, and the second testing device 130 is configured to connect to a secondary device of the secondary fusion pole-mounted switch, such as a secondary device may be an FTU.
The test control device 150 sends a single test command to the first test device 110, where the single test command is used to control the first test device 110 to perform a single test on a single device. The first testing device 110 performs an independent test on the primary device according to the primary independent test instruction and returns test data. The test data returned by the first testing apparatus 110 for performing the independent test on the primary device is data obtained in the process of independently testing the primary device, and may specifically include data obtained from the primary device.
The test control device 150 sends a secondary independent test instruction to the second test device 130, where the secondary independent test instruction is used to control the second test device 130 to perform an independent test on the secondary device. The second testing device 130 independently tests the secondary equipment according to the secondary independent test instruction and returns test data. The test data returned by the second testing apparatus 130 for performing the independent test on the secondary device is data obtained in the independent test process of the secondary device, and may specifically include data obtained from the secondary device.
The test control device 150 sends a joint test command to the first test device 110 and the second test device 130, where the joint test command is used to control the first test device 110 and the second test device 130 to perform a joint test on the primary equipment and the secondary equipment. The first testing device 110 and the second testing device 130 perform a joint test on the first device and the second device according to the joint test instruction, and return test data.
Specifically, the order in which the test control device 150 sends the primary independent test instruction, the secondary independent test instruction, and the joint test instruction may be arbitrarily set according to actual requirements, that is, the test order in which the primary device is independently tested, the secondary device is independently tested, and the primary device and the secondary device are jointly tested may be arbitrarily set. For example, the first independent test instruction may be sent first, the second independent test instruction may be sent after the first device is independently tested, and the joint test instruction may be sent after the second device is independently tested, so as to complete the joint test.
The test control device 150 analyzes the test data to obtain a test result. After the primary equipment is independently tested, the secondary equipment is independently tested, and the primary equipment and the secondary equipment are jointly tested, the test control device 150 receives test data; specifically, after each test, the test control device 150 analyzes the test data to obtain a test result according to the test data obtained at this time, so that the test result includes a test result of an independent test on the primary device, a test result of an independent test on the secondary device, and a test result of a combined test. For example, after receiving the test data returned by the first test device 110 according to the first independent test instruction, the test control device 150 analyzes the current test data to obtain a test result for independently testing the primary device, after receiving the test data returned by the second test device 130 according to the second independent test instruction, the test control device 150 analyzes the current test data to obtain a test result for independently testing the secondary device, and after receiving the test data returned by the first test device 110 and the second test device 130 according to the joint test instruction, the test control device 150 analyzes the test data to obtain a test result for joint testing.
Specifically, the test control device 150 analyzes the test data, and may process the test data according to the test specification to determine whether the test data meets the requirements. For example, the test control device 150 may store the range values of various types of data in the database under normal conditions, and the test control device 150 compares the test data obtained by the test with the range values of such data in the database to obtain the test result.
In the above-mentioned primary and secondary fusion column switch test system, the test control device 150 is used to control the first test device 110 to independently test the primary equipment, control the second test device 130 to independently test the secondary equipment, control the first test device 110 and the second test device 130 to jointly test the primary equipment and the secondary equipment, and analyze the test data obtained by the test to obtain the test result, can realize independent test and combined test of primary equipment and secondary equipment in the primary and secondary fusion column switches, so that the test device has a combined test function on the basis of having an independent test function, does not need to separate the test of primary equipment and secondary equipment, breaks through the current situation of the traditional separated test of the primary equipment and the secondary equipment, the condition of primary equipment and secondary equipment when using can test in combination to promote test reliability and test quality to the switch on the one secondary fusion post.
In addition, the traditional separate testing mode depends on manpower, frequent wiring is needed, a large amount of labor cost is wasted, the testing time is long, and manual reading and error recording are needed; the utility model provides a switch test system on post is fused to a secondary, need not to adjust the wiring repeatedly after the switch test system on post is fused to a secondary that is surveyed, can once the wiring test completion promptly, can use manpower sparingly and shorten test time, obtains the test result by test control device 150 automatic acquisition test data in addition, does not need artifical reading, avoids artifical reading error, promotes efficiency of software testing and precision.
Specifically, the test control device 150 may further store the test data and the test result, which is convenient for data call, thereby providing support for functions such as intelligent analysis of test contents and suggestion of switch quality improvement.
In one embodiment, the first testing apparatus 110 includes a first testing device, a virtual FTU, and a first communication device, and the second testing apparatus 130 includes a second testing device, a virtual circuit breaker, and a second communication device. The first test device and the virtual FTU are connected to the primary equipment and connected to the test control apparatus 150 through the first communication equipment, and the second test device and the virtual breaker are connected to the secondary equipment and connected to the test control apparatus 150 through the second communication equipment. The virtual FTU simulates the secondary equipment (FTU) to send control commands and receive information when being used for testing the primary equipment (circuit breaker), and the virtual circuit breaker simulates the function of the circuit breaker when being used for testing the secondary equipment.
The first testing device and the virtual FTU are communicated with the testing control device 150 through first communication equipment, the second testing device and the virtual circuit breaker are communicated with the testing control device 150 through second communication equipment, and the first testing device and the second testing device are used for testing and returning testing data; the primary equipment of the primary and secondary fusion column switch is generally a circuit breaker, the secondary equipment is generally an FTU, and the virtual FTU and the virtual circuit breaker are respectively configured in the first testing device 110 and the second testing device 130, so that the primary and secondary fusion column switch is used for independently testing the FTU and the circuit breaker in the primary and secondary fusion column switch to be tested.
In one embodiment, as shown in fig. 2, before the test control device 150 sends a single independent test command, the first test device 110 is controlled to be switched into the virtual FTU, and the second test device 130 is controlled to close the virtual breaker; before the test control device 150 sends the secondary independent test, the first test device 110 is controlled to close the virtual FTU, and the second test device 130 is controlled to be put into the virtual breaker; before the test control device 150 sends the joint test command, the first test device 110 is controlled to turn off the virtual FTU, and the second test device 130 is controlled to turn off the virtual breaker. In fig. 2, taking the example of independently testing the secondary device (FTU), independently testing the primary device (circuit breaker), and then jointly testing, it can be understood that in other embodiments, the primary device may be independently tested, and then jointly tested.
The virtual FTU is put into the primary equipment when the primary equipment is independently tested, the virtual circuit breaker is put into the secondary equipment when the secondary equipment is independently tested, and the virtual FTU and the virtual circuit breaker are not put into use during the joint test, so that the independent test and the joint test of the primary equipment and the secondary equipment can be realized. Specifically, the test control device 150 may control to switch in or not switch in the virtual FTU by controlling connection/disconnection between the virtual FTU and the primary device, and control to switch in or not switch in the virtual breaker by controlling connection/disconnection between the virtual breaker and the secondary device. It is understood that in other embodiments, the commissioning or non-commissioning of the virtual FTU and virtual circuit breaker may be controlled in other ways.
In one embodiment, the first testing device comprises a first program-controlled power source, a boosting and current rising mechanism, a sensing device and a first information recording feedback instrument; the first program-controlled power source is connected with the boosting and current rising mechanism, the boosting and current rising mechanism and the first information recording feedback instrument are respectively connected with the primary equipment, the sensing device is arranged at a preset data point to be tested of the primary equipment, and the first program-controlled power source, the sensing device and the first information recording feedback instrument are all connected with the test control device 150 through the first communication equipment.
The preset data point to be measured can be set according to the position point which needs to be measured actually. The first program-controlled power source is used for outputting signals (voltage and current) to the boosting and current-boosting mechanism, the boosting and current-boosting mechanism is used for boosting/current-boosting the signals output by the first program-controlled power source, the first information recording feedback instrument is used for recording information of primary equipment and feeding the information back to the test control device 150, and the sensing device is used for collecting data of the primary equipment in the operation process and feeding the data back to the test control device 150. Specifically, the primary device to be tested is connected to the boost and boost mechanism, the first information recording feedback instrument, and the virtual FTU of the first testing apparatus 110 through the analog primary connection, and the corresponding connection and the sensing contact of the sensing device are arranged.
In one embodiment, the first information recording feedback instrument comprises a wave recorder and a three-phase meter, the wave recorder and the three-phase meter are connected with the primary equipment, and are connected with the test control device 150 through the first communication equipment. The wave recorder and the three-phase meter are used for measuring the information of the test. Specifically, as shown in fig. 3, the three-phase table is a high-precision three-phase table. The wave recorder and the three-phase meter are adopted to measure the information of the primary equipment, so that various information can be obtained and fed back.
In one embodiment, as shown in fig. 3, the sensing device includes a temperature sensor, a hydraulic sensor and a pneumatic sensor, and the temperature sensor, the hydraulic sensor and the pneumatic sensor are disposed at a preset data point to be tested of the primary device and connected to the test control apparatus 150 through the first communication device. For example, the temperature sensor may be disposed at a location where the primary device needs to measure temperature, the hydraulic pressure sensor may be disposed at a location where the primary device needs to measure hydraulic pressure, and the air pressure sensor may be disposed at a location where the primary device needs to measure air pressure. By adopting the temperature sensor, the hydraulic sensor and the air pressure sensor, various data in the operation process of primary equipment can be measured, and the data acquisition is comprehensive.
In one embodiment, as shown in fig. 3, the first communication device is a switch. Correspondingly, the switch may be connected to the test control device 150 through a communication cable. It is understood that in other embodiments, the first communication device may also be a serial server; the first communication device may also be a wireless communication module, in which case the first testing apparatus 110 and the test control apparatus 150 may communicate wirelessly.
In one embodiment, the test data returned by the first testing device 110 according to the one-time independent test instruction includes the operation state information and the sensing collection data. The operation state information is information generated in the operation process of primary equipment and is acquired by a first information recording feedback instrument, and the sensing acquisition data is data measured by a sensing device.
Specifically, the first testing device 110 performs an independent test on a primary device according to a primary independent test instruction and returns test data, including: the first program-controlled power source sends sequence voltage and current according to a primary independent test instruction, and the sequence voltage and current are output to primary equipment in a matching mode through a boosting and current-boosting device, so that the primary equipment responds and operates; the first information recording feedback instrument records the running state information of the primary equipment and feeds the running state information back to the test control device 150 through the first communication equipment; the sensing device measures the sensing data and feeds the sensing data back to the test control device 150 through the first communication device.
Specifically, the first program-controlled power source outputs a signal to the voltage boosting and current boosting device in cooperation with the voltage boosting and current boosting device, and the voltage boosting and current boosting device performs voltage boosting/current boosting according to the signal. The first program control power source, the boosting and current rising device, the first information recording feedback instrument, the sensing device and the virtual FTU are used for testing and obtaining test data, and the test data are fed back through the first communication equipment, so that the primary equipment is independently tested. Specifically, in the independent test process, the virtual FTU may receive a primary independent test instruction sent by the test control apparatus 150, simulate the FTU to send a control command to the primary device, and receive information returned by the primary device.
Specifically, before testing, the test control device 150 may simulate an operating environment, simulate a test condition of the primary device under a normal condition to obtain simulated test data, store instructions used in various test conditions and the simulated test data obtained by the test, establish a test case library, and call data in the test case library when performing an independent test on the primary device of the same type. For example, as shown in fig. 4, the one-time independent test command includes a control command of the programmable power source, the test control device 150 includes a control screen, and the test control device 150 is further configured to generate a test analysis report after obtaining the test result.
In one embodiment, the second testing device includes a second programmable power source, a voltage-current converting device and a second information recording feedback instrument, the second programmable power source is connected to the voltage-current converting device and connected to the second information recording feedback instrument through a second communication device, the voltage-current converting device and the second information recording feedback instrument are connected to the secondary device, and the second programmable power source and the second information recording feedback instrument are connected to the testing control device 150 through a second communication device.
The second programmable power source is used for outputting power, namely voltage and current. The voltage and current conversion device is used for converting the voltage and current output by the second program control power source and outputting the converted voltage and current to secondary equipment; specifically, the voltage-current conversion device is responsible for combining or switching signals output by the second program control power source into signals output by different loops, so that FTU parallel testing of the two-time fusion column switch is realized. The second information recording feedback instrument is used for recording information of the secondary equipment and signals output by the second program control power source and feeding the information and the signals back to the test control device 150.
In one embodiment, the second information recording feedback instrument is the same as the first information recording feedback instrument and also comprises a wave recorder and a three-phase meter, the wave recorder and the three-phase meter of the second information recording feedback instrument are connected with the secondary equipment, and are connected with the test control device 150 through the second communication equipment. The wave recorder and the three-phase meter are responsible for monitoring output signals of voltage and current and measuring and returning information of secondary equipment. Specifically, as shown in fig. 5, the three-phase table is a high-precision three-phase table. The wave recorder and the three-phase meter are adopted to measure information of the secondary equipment, and various information can be obtained and fed back.
In one embodiment, as shown in fig. 5, the second communication device is a switch. Correspondingly, the switch may be connected to the test control device 150 through a communication cable. It is understood that in other embodiments, the second communication device may also be a serial server; or the second communication device may also be a wireless communication module, in which case the second testing apparatus 110 and the test control apparatus 150 may communicate wirelessly.
Specifically, as shown in fig. 5, the second programmable power source, the wave recorder, the high-precision three-phase meter, and the virtual circuit breaker are respectively connected to the serial server/switch through optical fibers, receive the control command related to the test control device 150, and return test data.
Specifically, the second testing device 130 further includes an interface, and the voltage-current conversion device, the wave recorder of the second information recording feedback instrument, the high-precision three-phase meter, and the virtual circuit breaker are connected to the secondary device through the interface. For example, as shown in fig. 6, the interface may be a standardized interface, and the secondary device to be tested is connected to the interface through a standardized wiring, so as to be connected to the second testing apparatus 130, thereby ensuring the efficiency and reliability of the test assembly.
In one embodiment, the test data returned by the second testing device 130 according to the secondary independent test command includes the four-remote signal, the open signal of the second programmable power source, and the virtual breaker response signal. The four remote signals are signals output in the test process of the secondary equipment, the opening signal of the second programmable power source is a signal output by the second programmable power source, and the virtual circuit breaker response signal is a signal in which the virtual circuit breaker receives the response of the control instruction of the secondary equipment in the test process.
Specifically, the second testing device 130 performs independent testing on the secondary device according to the secondary independent testing instruction and returns testing data, including: the second program-controlled power source sends a sequence voltage and current to the voltage and current conversion device according to the secondary independent test instruction; the voltage and current conversion device converts the sequence voltage and current and outputs the converted sequence voltage and current to secondary equipment; the second information recording feedback instrument measures four remote signals output by the secondary equipment and an output signal of the second programmable power source, and feeds the signals back to the test control device 150 through the second communication equipment; the virtual circuit breaker executes the control command sent by the secondary device, and feeds back a virtual circuit breaker response signal obtained by responding to the control command to the test control apparatus 150 through the second communication device.
Specifically, the secondary independent test command may include a power output command, and the test control device 150 sends the power output command to the second programmable power source, and the second programmable power source is responsible for receiving the power output command, editing and outputting a controlled sequence signal, i.e., a voltage and a current. The voltage-current conversion device is responsible for combining or switching the signals output by the second programmable power source into signals output by different loops. In the test process, the secondary equipment sends out four-remote signals and sends a control command to the virtual circuit breaker; the four remote signals are recorded and fed back by a second information recording feedback instrument. The second program control power source, the voltage-current conversion device, the second information recording feedback instrument and the virtual circuit breaker are used for testing and obtaining test data, and the test data are fed back through the second communication equipment, so that independent testing of the secondary equipment is achieved.
Specifically, before the test, the test control device 150 may also perform the operation environment simulation to simulate the test conditions of the secondary device under normal conditions to obtain simulated test data, store the instructions used in various test conditions and the simulated test data obtained by the test, establish a test case library, and call the data in the test case library when the same type of secondary device is independently tested. For example, as shown in fig. 7, the second testing device 130 may be a testing screen, and the testing control device 150 (control screen) is used to generate a testing analysis report after obtaining the testing result.
In one embodiment, the joint test instruction comprises a first type of instruction and a second type of instruction; the test control device 150 sends the joint test instruction to the first test device 110 and the second test device 130, and the first test device 110 and the second test device 130 perform the joint test on the first device and the secondary device according to the joint test instruction and return the test data, including: the test control device 150 sends a first type of instruction to the first test device 110, the first test device 110 outputs a first test signal to the primary equipment according to the first type of instruction, and the second test device 130 returns test data to the test control device 150; the test control device 150 sends the second type of instruction to the second test device 130, and the second test device 130 outputs the second test signal to the secondary device according to the second type of instruction, so that the first test device 110 returns the test data to the test control device 150.
The combined test of the primary equipment and the secondary equipment is carried out under the condition that the primary equipment and the secondary equipment are used in a combined mode and the secondary equipment controls the running state of the primary equipment. During the combined test, the first type of instruction is sent to the first testing device 110, the test data returned by the second testing device 130 is correspondingly received, the relevant information of the secondary equipment during the combined use can be tested, the second type of instruction is sent to the second testing device 130, the test data returned by the first testing device 110 is correspondingly received, the relevant information of the primary equipment during the combined use can be tested, the test of the primary equipment and the secondary equipment during the combined use is completed, and the test effect is good.
Specifically, the flow of the joint test may be as shown in fig. 8, where the test panel 1 is the first test apparatus 110, the test panel 2 is the second test apparatus 130, and the control panel is the test control apparatus 150. Specifically, dynamic analog voltage and current are loaded on a primary part of circuit breakers, a primary and secondary fusion column switch combined test is realized by setting various faults, test data recording and storage are realized by monitoring wave forms of a test screen 1 and a test screen 2 and a high-precision three-phase meter in the test process, and finally test result analysis is realized by a control screen.
In one embodiment, after the test control device 150 analyzes the test data to obtain the test result, the method further includes: and generating a test analysis report according to the test result and outputting the test analysis report. Specifically, the test analysis report may be output to an external device, such as an upper computer, or may be output to a screen for display.
Specifically, as shown in fig. 6, the test control device 150 may be composed of various software function modules such as an operating environment simulation system, an interactive configuration module, an export module, and an import module, and is a management core of a primary and secondary fusion column switch test system. During the test process, the corresponding simulation environment can be configured by the operating environment simulation system in the test control device 150, and the test content, the test sequence and the test method can be selected or configured by the test case library. Action signals are loaded to the test screen 1 and the test screen 2 through the opening module respectively, test data are returned through the opening module, and corresponding results are analyzed, stored, recorded and analyzed. Specifically, the overall flow chart for testing a secondary fusion switch on a post is shown in fig. 9.
The primary and secondary fusion column switch testing system fully considers independent testing contents and combined testing contents of all parts, corresponding testing contents of primary and secondary equipment independent testing are standardized by related industry standards and are not detailed here, and for the primary and secondary fusion column switch combined testing, the testing contents and the testing method can refer to the following table 1.
TABLE 1
Figure BDA0002758849090000131
Figure BDA0002758849090000141
Figure BDA0002758849090000151
Figure BDA0002758849090000161
Figure BDA0002758849090000171
In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the application. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims (10)

1. A test system for a secondary fusion column switch is characterized by comprising a first test device, a second test device and a test control device, wherein the first test device and the second test device are connected with the test control device, the first test device is used for connecting primary equipment of the secondary fusion column switch, and the second test device is used for connecting secondary equipment of the secondary fusion column switch;
the test control device sends a primary independent test instruction to the first test device, the first test device independently tests the primary equipment according to the primary independent test instruction and returns test data, the test control device sends a secondary independent test instruction to the second test device, the second test device independently tests the secondary equipment according to the secondary independent test instruction and returns test data, the test control device sends a combined test instruction to the first test device and the second test device, and the first test device and the second test device jointly test the first equipment and the secondary equipment according to the combined test instruction and return test data respectively; and the test control device analyzes the test data to obtain a test result.
2. The system according to claim 1, wherein the first testing device comprises a first testing device, a virtual FTU and a first communication device, and the second testing device comprises a second testing device, a virtual circuit breaker and a second communication device;
the first testing device and the virtual FTU are connected with the primary equipment and the testing control device through the first communication equipment, the second testing device and the virtual circuit breaker are connected with the secondary equipment and the testing control device through the second communication equipment.
3. The system according to claim 2, wherein before the test control device sends the primary independent test command, the first test device is controlled to switch on the virtual FTU, and the second test device is controlled to switch off the virtual breaker;
before the test control device sends the secondary independent test, controlling the first test device to close the virtual FTU and controlling the second test device to switch into the virtual circuit breaker;
and before the test control device sends the combined test instruction, controlling the first test device to close the virtual FTU and controlling the second test device to close the virtual circuit breaker.
4. The system for testing the primary and secondary fusion column switch according to claim 2, wherein the first testing device comprises a first programmable power source, a boost and boost mechanism, a sensing device and a first information recording feedback instrument; the first program-controlled power source is connected with the boosting and current-rising mechanism, the boosting and current-rising mechanism and the first information recording feedback instrument are respectively connected with the primary equipment, the sensing device is arranged at a preset data point to be tested of the primary equipment, and the first program-controlled power source, the sensing device and the first information recording feedback instrument are all connected with the test control device through the first communication equipment.
5. The system for testing a secondary fusion column switch according to claim 4, wherein the first information recording feedback instrument comprises a wave recorder and a three-phase meter, the wave recorder and the three-phase meter are connected with the primary device, and are connected with the test control device through the first communication device.
6. The primary and secondary fusion pole-mounted switch test system according to claim 4, wherein the test data returned by the first test device according to the primary independent test instruction comprises operating state information and sensing acquisition data; the first testing device independently tests the primary equipment according to the primary independent test instruction and returns test data, and the method comprises the following steps:
the first program-controlled power source sends sequence voltage and current according to the primary independent test instruction and outputs the sequence voltage and current to the primary equipment in cooperation with the boosting and current boosting device;
the first information recording feedback instrument records the running state information of the primary equipment and feeds the running state information back to the test control device through the first communication equipment;
and the sensing device measures to obtain sensing acquisition data, and the sensing acquisition data is fed back to the test control device through the first communication equipment.
7. The system according to any one of claims 2-6, wherein the second testing device comprises a second programmable power source, a voltage-to-current converter, and a second information recording feedback instrument, the second programmable power source is connected to the voltage-to-current converter and connected to the second information recording feedback instrument via the second communication device, the voltage-to-current converter and the second information recording feedback instrument are connected to the secondary device, and the second programmable power source and the second information recording feedback instrument are connected to the testing control device via the second communication device.
8. The primary and secondary fusion pole-mounted switch test system according to claim 7, wherein the test data returned by the second test device according to the secondary independent test instruction comprises a four-remote signal, an open signal of a second programmable power source, and a virtual breaker response signal; the second testing device independently tests the secondary equipment according to the secondary independent test instruction and returns test data, and the method comprises the following steps:
the second program-controlled power source sends a sequence voltage and current to the voltage and current conversion device according to the secondary independent test instruction;
the voltage and current conversion device converts the sequence voltage and current and outputs the converted sequence voltage and current to the secondary equipment;
the second information recording feedback instrument measures four remote signals output by the secondary equipment and an output signal of the second programmable power source, and feeds the signals back to the test control device through the second communication equipment;
and the virtual circuit breaker executes the control command sent by the secondary equipment, and feeds back a virtual circuit breaker response signal obtained by responding to the control command to the test control device through the second communication equipment.
9. The system according to claim 1, wherein the joint test command comprises a first type of command and a second type of command; the test control device sends a joint test instruction to the first test device and the second test device, and the first test device and the second test device perform joint test on the first equipment and the secondary equipment respectively according to the joint test instruction and return test data, including:
the test control device sends the first class instruction to the first test device, the first test device outputs a first test signal to the primary equipment according to the first class instruction, and the second test device returns test data to the test control device;
and the test control device sends the second type of instruction to the second test device, the second test device outputs a second test signal to the secondary equipment according to the second type of instruction, and the first test device returns test data to the test control device.
10. The system according to claim 1, wherein the test control device further comprises, after analyzing the test data to obtain a test result:
and generating a test analysis report according to the test result and outputting the test analysis report.
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