CN112345083B - High-temperature superconducting terahertz radiation source intelligent testing device based on different bias conditions - Google Patents
High-temperature superconducting terahertz radiation source intelligent testing device based on different bias conditions Download PDFInfo
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- 230000005855 radiation Effects 0.000 title claims abstract description 148
- 238000012360 testing method Methods 0.000 title claims abstract description 98
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims abstract description 192
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- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims abstract description 17
- 229910052802 copper Inorganic materials 0.000 claims abstract description 17
- 239000010949 copper Substances 0.000 claims abstract description 17
- 239000001307 helium Substances 0.000 claims description 49
- 229910052734 helium Inorganic materials 0.000 claims description 49
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 claims description 49
- 238000006073 displacement reaction Methods 0.000 claims description 24
- 230000003287 optical effect Effects 0.000 claims description 19
- 238000005057 refrigeration Methods 0.000 claims description 18
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/0003—Radiation pyrometry, e.g. infrared or optical thermometry for sensing the radiant heat transfer of samples, e.g. emittance meter
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B25/00—Machines, plants or systems, using a combination of modes of operation covered by two or more of the groups F25B1/00 - F25B23/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/068—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling parameters other than temperature
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Abstract
The invention discloses an intelligent testing device of a high-temperature superconducting terahertz radiation source based on different bias conditions, which comprises a test board, wherein a low-temperature refrigerating system, a light path transmission system and a signal acquisition and storage system are fixedly arranged on the upper surface of the test board, a sealing shell is fixedly arranged on the left side of the upper surface of the test board, the low-temperature refrigerating system comprises a Stirling refrigerator, a cooling cavity is arranged at the output end of the Stirling refrigerator, and a liquid nitrogen cooling tank is arranged on the right side of the cooling cavity. According to the intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions, the improved Stirling refrigerator is matched with the liquid nitrogen cooling tank for use, the radiation source is installed in the cooling cavity of the Stirling refrigerator through the red copper supporting piece, and the computer controls the liquid nitrogen flow switch of the liquid nitrogen cooling tank through the temperature controller self-made by the laboratory so as to control the flow of liquid nitrogen and the cooling efficiency of the Stirling refrigerator and accurately control the temperature in the cooling cavity.
Description
Technical Field
The invention relates to the field of testing devices, in particular to the field of intelligent testing devices of high-temperature superconducting terahertz radiation sources based on different bias conditions.
Background
As is well known, terahertz waves include electromagnetic waves with a frequency of 0.1 to 10THz, the term is applicable to frequencies between a high-frequency edge (300 GHz) of a millimeter wave band of electromagnetic radiation and a low-frequency far-infrared spectral band edge (3000 GHz), and radiation with corresponding wavelengths ranges from 0.03mm to 3mm in the frequency band.
The existing testing device of a typical terahertz radiation source is mainly divided into three parts: the low-temperature refrigeration system, the optical path transmission system and the signal acquisition and storage system, in the early low-temperature test, liquid helium cooling is a common method, but the dissipation is fast, the price is expensive, many laboratories carry out low-temperature tests by using a Stirling refrigerator at present, the test preparation time is greatly shortened, the operation process is very simple, convenient and safe, but the problems exist when the Stirling refrigerator is used for refrigeration, firstly, the Stirling refrigerator is provided with a cold head frame, and the radiation source is placed below the cold head frame of the Stirling refrigerator for refrigeration, so that the surface refrigeration of the radiation source is unbalanced, the refrigeration effect is poor, secondly, the Stirling refrigerator is used for refrigeration, the refrigeration method is single, the refrigeration temperature can not be quickly and accurately adjusted, and finally, the Stirling refrigerator is used for refrigeration to spray liquid helium to the radiation source, the terahertz waves emitted by the radiation source are possibly scattered by liquid helium molecules to influence the power of the terahertz waves, and in order to solve the problems, the intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions is provided.
Disclosure of Invention
The invention mainly aims to provide an intelligent testing device of a high-temperature superconducting terahertz radiation source based on different bias conditions, which can effectively solve the problems in the background technology: firstly, a Stirling refrigerator is provided with a cold head frame, a radiation source is placed below the cold head frame of the Stirling refrigerator for refrigeration, the surface refrigeration of the radiation source is possibly unbalanced, the refrigeration effect is poor, secondly, the Stirling refrigerator is used for refrigeration, the refrigeration method is single, the refrigeration temperature cannot be quickly and accurately adjusted, and finally, the Stirling refrigerator is used for refrigerating liquid helium sprayed to the radiation source, so that terahertz waves emitted by the radiation source are possibly scattered by liquid helium molecules, and the power of the terahertz waves is influenced.
In order to achieve the purpose, the invention adopts the technical scheme that:
the intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions comprises a test board, wherein a low-temperature refrigerating system, a light path transmission system and a signal acquisition and storage system are fixedly mounted on the upper surface of the test board, a sealing shell is fixedly mounted on the left side of the upper surface of the test board, the low-temperature refrigerating system is located below the sealing shell and comprises a Stirling refrigerator, a cooling cavity is mounted at the output end of the Stirling refrigerator, a liquid nitrogen cooling tank is mounted on the right side of the cooling cavity, a supporting frame is fixedly mounted at the bottom of the liquid nitrogen cooling tank, and the supporting frame is fixedly mounted on the upper surface of the test board;
the front of the cooling cavity is rotatably connected with a heat insulation door, the inner bottom of the cooling cavity is fixedly provided with a red copper support piece, the inner surface of the cooling cavity is fixedly provided with a liquid nitrogen pipeline and a helium pipeline which are both in a spiral shape, the liquid nitrogen pipeline and the helium pipeline are connected in a double-spiral shape, the inner part of the cooling cavity is fixedly provided with a thermometer on the upper surface of the red copper support piece, the bottom of the Stirling refrigerator is fixedly provided with a fixed plate, the bottom of the fixed plate is fixedly connected with the upper surface of a test bench, the output end of a liquid nitrogen cooling tank is fixedly provided with a liquid nitrogen flow switch, so that the device fixedly installs a radiation source at the central part of the cooling cavity through the arranged circular cooling cavity, the surface of the radiation source is uniformly cooled, the service life of the radiation source can be effectively prolonged, and the liquid nitrogen pipeline and the helium pipeline are arranged in a spiral shape, the liquid nitrogen pipeline and the helium pipeline are in double-spiral connection, so that the contact area between the liquid nitrogen pipeline and the helium pipeline is increased, the cooling efficiency can be greatly enhanced, the surface of a radiation source is further uniformly cooled, and the liquid nitrogen and the helium are prevented from being in contact with the surface of the radiation source, so that terahertz radiation emitted by the radiation source is scattered by the liquid nitrogen and the helium, the radiation energy is reduced, the accuracy of experimental data is influenced, and better creativity and practicability are achieved;
the end part of the output end of the liquid nitrogen cooling tank is communicated with the input end of a liquid nitrogen pipeline, the side surface of the cooling cavity is fixedly provided with a nitrogen outlet and a cold head frame, the input end of the nitrogen outlet is communicated with the output end of the liquid nitrogen pipeline, the input end of the cold head frame is connected with a cold air end pipeline of the Stirling refrigerator, the output end of the cold head frame is communicated with a helium pipeline, the side surface of the cooling cavity is also provided with a waveguide propagation window through which terahertz waves can penetrate out, the upper surface of the sealing shell is fixedly provided with an air pump which can vacuumize the interior of the sealing shell, the side surface of the sealing shell is provided with a propagation window, the waveguide propagation window corresponds in position to the propagation window, the upper surface of the test bench is fixedly provided with a computer which can control the whole test process, and the device is matched with the liquid nitrogen cooling tank through the arranged improved Stirling refrigerator, the radiation source passes through red copper support piece and installs in the cooling chamber of stirling refrigerator, and the computer controls the liquid nitrogen flow switch of liquid nitrogen cooling tank and then controls the flow of liquid nitrogen and stirling refrigerator's cooling efficiency through the self-controlled temperature controller in this laboratory, and the inside temperature of accurate control cooling chamber, very big shortening experiment preparation time, can accurate quick control cooling chamber inside temperature, and set up like this and can help practicing thrift the helium resource, reduce the experiment cost.
The invention is further improved in that a chopper for modulating terahertz waves is fixedly arranged in the middle of the upper surface of the test table, the optical path transmission system comprises a displacement platform and a light-isolating cover which are fixed on the upper surface of the test table, the displacement platform is positioned at the inner bottom of the light-isolating cover, the input end of the chopper is connected with the waveguide transmission window through an optical fiber, the output end of the chopper is connected with a terahertz wave transmission pipeline through an optical path, a first off-axis parabolic mirror for converging divergent terahertz waves into parallel beams is fixedly arranged in the terahertz wave transmission pipeline, and the terahertz wave transmission pipeline is positioned below the light-isolating cover.
The invention further improves the structure that the output end of the terahertz wave transmission pipeline is connected with a first beam splitter and a second beam splitter through an optical path, the first beam splitter and the second beam splitter form a plane whole by two crossed six-finger tooth sockets, the first beam splitter is fixed on the upper surface of a test bench, the second beam splitter is installed on a displacement platform, the second beam splitter can move back and forth on the displacement platform, and the output ends of the first beam splitter and the second beam splitter are connected with a second off-axis parabolic mirror through the optical path.
The invention has the further improvement that the included angle between the first beam splitter and the second off-axis parabolic mirror is 45 degrees, the included angle between the first beam splitter and the first off-axis parabolic mirror is 45 degrees, the first beam splitter and the second beam splitter are always arranged in parallel, and the output end of the second off-axis parabolic mirror is connected with a radiation signal detector for detecting radiation information of a radiation source through an optical fiber.
The invention has the further improvement that the signal acquisition and storage system comprises an electric transport test unit and a radiation intensity test unit, wherein the electric transport test unit comprises a voltage-controlled current source capable of acquiring current signals of a radiation source, a low-noise amplifier capable of acquiring voltage signals of the radiation source and a temperature controller capable of accurately controlling the temperature in a cooling cavity, the voltage input end of the voltage-controlled current source is connected with a computer, the output end of the computer is connected with the temperature controller, the output end of the computer is also connected with a direct current bias module capable of changing the bias condition of the radiation source, and the signal emitting end of the direct current bias module is connected with the radiation source.
The invention further improves that the radiation intensity test unit comprises a chopper controller and a phase-locked amplifier, and the phase-locked amplifier is suitable for amplifying the signal of the radiation signal detector and the chopper signal with the same frequency so as to accurately detect the terahertz radiation power of the radiation source.
The invention further improves the intelligent testing device of the high-temperature superconducting terahertz radiation source based on different bias conditions, and the using method comprises the following steps:
a, a test board is arranged on the ground, a heat insulation door is opened to fix a radiation source on a red copper support of a cooling cavity, a temperature sensor is also fixed on the test board, a thermometer is connected with a temperature controller, the environmental temperature of a sample is monitored in real time through a computer program, circuits of all parts are connected according to a circuit diagram, an air pump carries out vacuumizing treatment on the interior of a sealed shell, then a computer controls a Stirling refrigerator and a liquid nitrogen flow switch to work, the radiation source is fixedly arranged at the central part of the cooling cavity through a circular cooling cavity, so that the surface of the radiation source is uniformly cooled, the service life of the radiation source can be effectively prolonged, a liquid nitrogen pipeline and a helium pipeline are spirally arranged, and the liquid nitrogen pipeline and the helium pipeline are spirally connected, so that the contact area between the liquid nitrogen pipeline and the helium pipeline is increased, and the whole cavity is uniformly cooled;
b, after finishing the step A, controlling a direct current bias module by a computer to bias a certain current at a radiation source and change the current in a specific range, radiating terahertz waves by the radiation source, transmitting the terahertz waves to a chopper through a transmission window and a waveguide transmission window for modulation, enabling the terahertz waves after being modulated to enter a terahertz wave transmission pipeline and to be converged into parallel light beams through a first off-axis parabolic mirror, connecting an output end of the terahertz wave transmission pipeline with a first beam splitter and a second beam splitter through an optical path, enabling the first beam splitter and the second beam splitter to form a plane whole by two crossed six-finger tooth sockets, fixing the first beam splitter on the upper surface of a test bench, installing the second beam splitter on a displacement platform, enabling the second beam splitter to move back and forth on the displacement platform, connecting output ends of the first beam splitter and the second beam splitter with a second off-axis parabolic mirror through the optical path, enabling the light beams to enter a radiation signal detector through the second off-axis parabolic mirror, the radiation signal detector sends the detected radiation signal to a computer to obtain the radiation power intensity;
and C, when the step B is finished, the terahertz waves transmitted to the chopper through the transmission window and the waveguide transmission window are modulated by the chopper, so that the radiation signal detector receives the signals according to a specific frequency, meanwhile, the working frequency of the chopper is used as a reference signal of the phase-locked amplifier, and finally, the two signals are amplified by the phase-locked amplifier, and the terahertz radiation power is accurately detected.
Compared with the prior art, the invention has the following beneficial effects:
1. this device uses through the improved generation stirling refrigerator and the cooperation of liquid nitrogen cooling tank that set up, the radiation source passes through red copper support piece and installs in the cooling intracavity portion of stirling refrigerator, the liquid nitrogen flow switch of the temperature controller control liquid nitrogen cooling tank that the computer passes through this laboratory self-control and then the flow of control liquid nitrogen and the cooling efficiency of stirling refrigerator, the inside temperature of accurate control cooling intracavity portion, very big shortening experiment preparation time, can accurate quick control cooling intracavity portion's temperature, and set up like this and help saving helium resource, reduce the experiment cost.
2. This device is through the circular shape cooling chamber that sets up, with radiation source fixed mounting at the central point of cooling chamber, the surface that makes the radiation source is cooled evenly, can effectively increase the life-span of radiation source, liquid nitrogen pipeline and helium pipeline are the heliciform setting, and the two heliciform of liquid nitrogen pipeline and helium pipeline are connected, make area of contact increase between liquid nitrogen pipeline and the helium pipeline, can strengthen cooling efficiency greatly, it is even further to make the radiation source surface receive to cool, prevent liquid nitrogen and helium and radiation source surface contact simultaneously, lead to the terahertz radiation that the radiation source sent to be scattered by liquid nitrogen and helium, thereby lead to radiant energy to reduce, influence the accuracy of experimental data, better creativity and practicality have.
Drawings
Fig. 1 is a schematic overall structure diagram of an intelligent testing device for a high-temperature superconducting terahertz radiation source based on different bias conditions.
Fig. 2 is a schematic diagram of the principle of an electric transport test module of the intelligent test device for the high-temperature superconducting terahertz radiation source based on different bias conditions.
Fig. 3 is a schematic diagram of a refrigeration chamber of the high-temperature superconducting terahertz radiation source intelligent test device based on different bias conditions.
Fig. 4 is a schematic diagram of the inside of a cooling cavity of the high-temperature superconducting terahertz radiation source intelligent test device based on different bias conditions.
Fig. 5 is a schematic sectional view of a refrigeration chamber of the high-temperature superconducting terahertz radiation source intelligent test device based on different bias conditions.
FIG. 6 is a schematic diagram of connection between a liquid nitrogen pipeline and a helium pipeline of the intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions.
Fig. 7 is a schematic diagram of an optical path transmission system of the high-temperature superconducting terahertz radiation source intelligent test device based on different bias conditions.
Fig. 8 is a schematic diagram of a radiation intensity testing principle of the intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions.
In the figure: 1. a test bench; 2. sealing the housing; 3. a stirling cooler; 4. an air pump; 5. a propagation window; 6. a fixing plate; 7. a cooling chamber; 8. a support frame; 9. a cold head frame; 10. a nitrogen outlet; 11. a chopper; 12. a computer; 13. a radiation signal detector; 14. a light-blocking cover; 15. a support base plate; 16. a displacement platform; 17. a heat-insulating door; 18. a waveguide propagation window; 19. a liquid nitrogen cooling tank; 20. a liquid nitrogen flow switch; 21. a red copper support; 22. a liquid nitrogen pipeline; 23. a support plate; 24. a helium gas conduit; 25. a terahertz wave transmission pipeline; 26. a first off-axis parabolic mirror; 27. a first beam splitter; 28. a second beam splitter; 29. a second off-axis parabolic mirror.
Detailed Description
In order to make the technical means, the original characteristics, the achieved objects and the functions of the present invention easy to understand, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate the orientation or the positional relationship based on the orientation or the positional relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, but not for indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and thus not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance. The invention will be further illustrated with reference to specific embodiments.
Example 1
As shown in fig. 1-8, an intelligent testing device for a high-temperature superconducting terahertz radiation source based on different bias conditions comprises a testing table (1), wherein a low-temperature refrigerating system, a light path transmission system and a signal acquisition and storage system are fixedly mounted on the upper surface of the testing table (1), a sealing shell (2) is fixedly mounted on the left side of the upper surface of the testing table (1), the low-temperature refrigerating system is located below the sealing shell (2), the low-temperature refrigerating system comprises a stirling refrigerator (3), a cooling cavity (7) is mounted at the output end of the stirling refrigerator (3), a liquid nitrogen cooling tank (19) is mounted on the right side of the cooling cavity (7), a supporting frame (8) is fixedly mounted at the bottom of the liquid nitrogen cooling tank (19), and the supporting frame (8) is fixedly mounted on the upper surface of the testing table (1);
the front surface of the cooling cavity (7) is rotatably connected with a heat insulation door (17), a red copper support piece (21) is fixedly installed at the inner bottom of the cooling cavity (7), a liquid nitrogen pipeline (22) and a helium pipeline (24) are fixedly installed on the inner surface of the cooling cavity (7), both the liquid nitrogen pipeline (22) and the helium pipeline (24) are in a spiral shape, the liquid nitrogen pipeline (22) and the helium pipeline (24) are in a double-spiral connection, a thermometer is fixedly installed in the cooling cavity (7) and positioned on the upper surface of the red copper support piece (21), a fixing plate (6) is fixedly installed at the bottom of the Stirling refrigerator (3), the bottom of the fixing plate (6) is fixedly connected with the upper surface of the test bench (1), and a liquid nitrogen flow switch (20) is fixedly installed at the output end of the liquid nitrogen cooling tank (19);
the end part of the output end of the liquid nitrogen cooling tank (19) is communicated with the input end of a liquid nitrogen pipeline (22), the side surface of the cooling cavity (7) is fixedly provided with a nitrogen outlet (10) and a cold head frame (9), the input end of the nitrogen outlet (10) is communicated with the output end of the liquid nitrogen pipeline (22), the input end of the cold head frame (9) is connected with a cold air end pipeline of the Stirling refrigerator (3), the output end of the cold head frame (9) is communicated with a helium pipeline (24), the side surface of the cooling cavity (7) is further provided with a waveguide propagation window (18) capable of penetrating out terahertz waves, the upper surface of the sealing shell (2) is fixedly provided with an air pump (4) capable of vacuumizing the inside of the sealing shell (2), the side surface of the sealing shell (2) is provided with a propagation window (5), the position of the waveguide propagation window (18) corresponds to the propagation window (5), and the upper surface of the test bench (1) is fixedly provided with a computer (12) capable of controlling the whole test process.
In the embodiment, a chopper (11) for modulating terahertz waves is fixedly installed in the middle of the upper surface of a test platform (1), an optical path transmission system comprises a displacement platform (16) and a light-isolating cover (14) which are fixed on the upper surface of the test platform (1), the displacement platform (16) is located at the inner bottom of the light-isolating cover (14), the input end of the chopper (11) is connected with a waveguide propagation window (18) through an optical fiber, the output end of the chopper (11) is connected with a terahertz wave transmission pipeline (25) through an optical path, a first off-axis parabolic mirror (26) for converging divergent terahertz waves into parallel beams is fixedly installed in the terahertz wave transmission pipeline (25), and the terahertz wave transmission pipeline (25) is located below the light-isolating cover (14).
In this embodiment, the output end of the terahertz wave transmission pipeline (25) is connected with a first beam splitter (27) and a second beam splitter (28) through an optical path, the first beam splitter (27) and the second beam splitter (28) form a plane whole by two crossed six-finger tooth spaces, the first beam splitter (27) is fixed on the upper surface of the test platform (1), the second beam splitter (28) is installed on the displacement platform (16), the second beam splitter (28) can move back and forth on the displacement platform (16), and the output ends of the first beam splitter (27) and the second beam splitter (28) are connected with a second off-axis parabolic mirror (29) through an optical path.
In the embodiment, an included angle between the first beam splitter (27) and the second off-axis parabolic mirror (29) is 45 degrees, an included angle between the first beam splitter (27) and the first off-axis parabolic mirror (26) is 45 degrees, the first beam splitter (27) and the second beam splitter (28) are always arranged in parallel, and the output end of the second off-axis parabolic mirror (29) is connected with a radiation signal detector (13) for detecting radiation information of a radiation source through an optical fiber.
In this embodiment, the signal collection and storage system includes an electric transport test unit and a radiation intensity test unit, the electric transport test unit includes a voltage-controlled current source capable of collecting current signals of the radiation source, a low-noise amplifier capable of collecting voltage signals of the radiation source, and a temperature controller capable of accurately controlling the temperature inside the cooling cavity (7), a voltage input end of the voltage-controlled current source is connected with the computer (12), an output end of the computer (12) is connected with the temperature controller, an output end of the computer (12) is further connected with a dc bias module capable of changing bias conditions of the radiation source, and a signal emitting end of the dc bias module is connected with the radiation source.
In the embodiment, the radiation intensity testing unit comprises a chopper (11) controller and a lock-in amplifier, wherein the lock-in amplifier is suitable for amplifying the signal of the radiation signal detector (13) and the signal of the same-frequency chopper (11) so as to accurately detect the terahertz radiation power of the radiation source.
By adopting the technical scheme: this device uses through improved generation stirling refrigerator (3) and liquid nitrogen cooling tank (19) cooperation that sets up, the radiation source passes through red copper support piece (21) and installs inside cooling chamber (7) in stirling refrigerator (3), liquid nitrogen flow switch (20) and then the flow of control liquid nitrogen and the cooling efficiency of stirling refrigerator (3) of computer (12) through this self-control temperature controller control liquid nitrogen cooling tank (19) of laboratory, the inside temperature of accurate control cooling chamber (7), very big shortening experiment preparation time, can accurate quick control cooling chamber (7) inside temperature, and set up like this and help saving the helium resource, reduce the experiment cost.
Example 2
As shown in fig. 1-8, an intelligent testing device for a high-temperature superconducting terahertz radiation source based on different bias conditions comprises a testing table (1), wherein a low-temperature refrigerating system, a light path transmission system and a signal acquisition and storage system are fixedly mounted on the upper surface of the testing table (1), a sealing shell (2) is fixedly mounted on the left side of the upper surface of the testing table (1), the low-temperature refrigerating system is located below the sealing shell (2), the low-temperature refrigerating system comprises a stirling refrigerator (3), a cooling cavity (7) is mounted at the output end of the stirling refrigerator (3), a liquid nitrogen cooling tank (19) is mounted on the right side of the cooling cavity (7), a supporting frame (8) is fixedly mounted at the bottom of the liquid nitrogen cooling tank (19), and the supporting frame (8) is fixedly mounted on the upper surface of the testing table (1);
the front surface of the cooling cavity (7) is rotatably connected with a heat insulation door (17), a red copper support piece (21) is fixedly installed at the inner bottom of the cooling cavity (7), a liquid nitrogen pipeline (22) and a helium pipeline (24) are fixedly installed on the inner surface of the cooling cavity (7), both the liquid nitrogen pipeline (22) and the helium pipeline (24) are in a spiral shape, the liquid nitrogen pipeline (22) and the helium pipeline (24) are in a double-spiral connection, a thermometer is fixedly installed in the cooling cavity (7) and positioned on the upper surface of the red copper support piece (21), a fixing plate (6) is fixedly installed at the bottom of the Stirling refrigerator (3), the bottom of the fixing plate (6) is fixedly connected with the upper surface of the test bench (1), and a liquid nitrogen flow switch (20) is fixedly installed at the output end of the liquid nitrogen cooling tank (19);
the end part of the output end of the liquid nitrogen cooling tank (19) is communicated with the input end of a liquid nitrogen pipeline (22), the side surface of the cooling cavity (7) is fixedly provided with a nitrogen outlet (10) and a cold head frame (9), the input end of the nitrogen outlet (10) is communicated with the output end of the liquid nitrogen pipeline (22), the input end of the cold head frame (9) is connected with a cold air end pipeline of the Stirling refrigerator (3), the output end of the cold head frame (9) is communicated with a helium pipeline (24), the side surface of the cooling cavity (7) is further provided with a waveguide propagation window (18) capable of penetrating out terahertz waves, the upper surface of the sealing shell (2) is fixedly provided with an air pump (4) capable of vacuumizing the inside of the sealing shell (2), the side surface of the sealing shell (2) is provided with a propagation window (5), the position of the waveguide propagation window (18) corresponds to the propagation window (5), and the upper surface of the test bench (1) is fixedly provided with a computer (12) capable of controlling the whole test process.
In the embodiment, a chopper (11) for modulating terahertz waves is fixedly installed in the middle of the upper surface of a test platform (1), an optical path transmission system comprises a displacement platform (16) and a light-isolating cover (14) which are fixed on the upper surface of the test platform (1), the displacement platform (16) is located at the inner bottom of the light-isolating cover (14), the input end of the chopper (11) is connected with a waveguide propagation window (18) through an optical fiber, the output end of the chopper (11) is connected with a terahertz wave transmission pipeline (25) through an optical path, a first off-axis parabolic mirror (26) for converging divergent terahertz waves into parallel beams is fixedly installed in the terahertz wave transmission pipeline (25), and the terahertz wave transmission pipeline (25) is located below the light-isolating cover (14).
In this embodiment, the output end of the terahertz wave transmission pipeline (25) is connected with a first beam splitter (27) and a second beam splitter (28) through an optical path, the first beam splitter (27) and the second beam splitter (28) form a plane whole by two crossed six-finger tooth spaces, the first beam splitter (27) is fixed on the upper surface of the test platform (1), the second beam splitter (28) is installed on the displacement platform (16), the second beam splitter (28) can move back and forth on the displacement platform (16), and the output ends of the first beam splitter (27) and the second beam splitter (28) are connected with a second off-axis parabolic mirror (29) through an optical path.
In the embodiment, an included angle between the first beam splitter (27) and the second off-axis parabolic mirror (29) is 45 degrees, an included angle between the first beam splitter (27) and the first off-axis parabolic mirror (26) is 45 degrees, the first beam splitter (27) and the second beam splitter (28) are always arranged in parallel, and the output end of the second off-axis parabolic mirror (29) is connected with a radiation signal detector (13) for detecting radiation information of a radiation source through an optical fiber.
In this embodiment, the signal collection and storage system includes an electric transport test unit and a radiation intensity test unit, the electric transport test unit includes a voltage-controlled current source capable of collecting current signals of the radiation source, a low-noise amplifier capable of collecting voltage signals of the radiation source, and a temperature controller capable of accurately controlling the temperature inside the cooling cavity (7), a voltage input end of the voltage-controlled current source is connected with the computer (12), an output end of the computer (12) is connected with the temperature controller, an output end of the computer (12) is further connected with a dc bias module capable of changing bias conditions of the radiation source, and a signal emitting end of the dc bias module is connected with the radiation source.
In the embodiment, the radiation intensity testing unit comprises a chopper (11) controller and a lock-in amplifier, wherein the lock-in amplifier is suitable for amplifying the signal of the radiation signal detector (13) and the signal of the same-frequency chopper (11) so as to accurately detect the terahertz radiation power of the radiation source.
By adopting the technical scheme: this device is through circular shape cooling chamber (7) that sets up, with the central point of radiation source fixed mounting in cooling chamber (7), the surface that makes the radiation source is cooled evenly, can effectively increase the life-span of radiation source, liquid nitrogen pipeline (22) and helium pipeline (24) are the heliciform setting, and liquid nitrogen pipeline (22) and helium pipeline (24) double helix form are connected, make area of contact increase between liquid nitrogen pipeline (22) and helium pipeline (24), can strengthen cooling efficiency greatly, it is even further to make the radiation source surface receive cold, prevent liquid nitrogen and helium and radiation source surface contact simultaneously, lead to the terahertz radiation that the radiation source sent to be scattered by liquid nitrogen and helium, thereby lead to radiant energy to reduce, influence the accuracy of experimental data, better creativity and practicality have.
The invention is to be noted that the invention is a high-temperature superconducting terahertz radiation source intelligent testing device based on different bias conditions, when in use, firstly, a test bench (1) is installed on the ground, a heat insulation door (17) is opened to fix the radiation source on a red copper support (21) of a cooling cavity (7), a temperature sensor is also fixed on the red copper support, a thermometer is connected with a temperature controller, the environmental temperature of a sample is monitored in real time through a computer (12) program, circuits of all parts are connected according to a circuit diagram, an air pump (4) carries out vacuum pumping treatment on the inside of a sealed shell (2), then the computer (12) controls a Stirling refrigerator (3) and a liquid nitrogen flow switch (20) to work, the device fixedly installs the radiation source at the central part of the cooling cavity (7) through a circular cooling cavity (7) arranged, so that the surface of the radiation source is uniformly cooled, the service life of a radiation source can be effectively prolonged, the liquid nitrogen pipeline (22) and the helium pipeline (24) are arranged in a spiral shape, the liquid nitrogen pipeline (22) and the helium pipeline (24) are connected in a double-spiral shape, so that the contact area between the liquid nitrogen pipeline (22) and the helium pipeline (24) is increased, the whole cavity is uniformly cooled, then, a computer (12) controls a direct current bias module to bias a certain current at the radiation source and change in a specific range, the radiation source radiates terahertz waves, the terahertz waves are transmitted to a chopper (11) for modulation through a transmission window (5) and a waveguide transmission window (18), the modulated terahertz waves enter a terahertz wave transmission pipeline (25) and are converged into parallel beams through a first parabolic mirror (26), the output end of the terahertz wave transmission pipeline (25) is connected with a first beam splitter (27) and a second beam splitter (28) through a light path, the first beam splitter (27) and the second beam splitter (28) form a plane whole by two crossed six-finger tooth sockets, the first beam splitter (27) is fixed on the upper surface of the test platform (1), the second beam splitter (28) is installed on the displacement platform (16), the second beam splitter (28) can move back and forth on the displacement platform (16), the output ends of the first beam splitter (27) and the second beam splitter (28) are connected with a second off-axis parabolic mirror (29) through a light path, light beams enter the radiation signal detector (13) through the second off-axis parabolic mirror (29), the radiation signal detector (13) sends detected radiation signals into a computer to obtain radiation power intensity, and finally terahertz waves transmitted to the chopper (11) through the transmission window (5) and the waveguide transmission window (18) are modulated through the chopper (11), so that the radiation signal detector (13) receives the signals according to a specific frequency, meanwhile, the working frequency of the chopper (11) is used as a reference signal of the phase-locked amplifier, and finally the two signals are amplified by the phase-locked amplifier, so that the terahertz radiation power is accurately detected.
The foregoing shows and describes the general principles and broad features of the present invention and advantages thereof. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are described in the specification and illustrated only to illustrate the principle of the present invention, but that various changes and modifications may be made therein without departing from the spirit and scope of the present invention, which fall within the scope of the invention as claimed. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (6)
1. The utility model provides a high temperature superconductor terahertz radiation source intelligent test device based on different biasing conditions, includes the testboard, the last fixed surface of testboard installs low temperature refrigerating system, light path transmission system and signal acquisition and save system, its characterized in that: the left side of the upper surface of the test board is fixedly provided with a sealing shell, the low-temperature refrigeration system is positioned below the sealing shell and comprises a Stirling refrigerator, the output end of the Stirling refrigerator is provided with a cooling cavity, the right side of the cooling cavity is provided with a liquid nitrogen cooling tank, the bottom of the liquid nitrogen cooling tank is fixedly provided with a support frame, and the support frame is fixedly arranged on the upper surface of the test board;
the front side of the cooling cavity is rotatably connected with a heat insulation door, a red copper support piece is fixedly installed at the inner bottom of the cooling cavity, a liquid nitrogen pipeline and a helium pipeline are fixedly installed on the inner surface of the cooling cavity, the liquid nitrogen pipeline and the helium pipeline are both spiral, the liquid nitrogen pipeline and the helium pipeline are connected in a double-spiral manner, a thermometer is fixedly installed inside the cooling cavity and located on the upper surface of the red copper support piece, a fixing plate is fixedly installed at the bottom of the Stirling refrigerator, the bottom of the fixing plate is fixedly connected with the upper surface of the test board, and a liquid nitrogen flow switch is fixedly installed at the output end of the liquid nitrogen cooling tank; the end part of the output end of the liquid nitrogen cooling tank is communicated with the input end of a liquid nitrogen pipeline, the side surface of the cooling cavity is fixedly provided with a nitrogen outlet and a cold head frame, the input end of the nitrogen outlet is communicated with the output end of the liquid nitrogen pipeline, the input end of the cold head frame is connected with a cold air end pipeline of the Stirling refrigerator, the output end of the cold head frame is communicated with a helium pipeline, the side surface of the cooling cavity is also provided with a waveguide propagation window through which terahertz waves can penetrate, the upper surface of the sealing shell is fixedly provided with an air pump capable of vacuumizing the interior of the sealing shell, the side surface of the sealing shell is provided with a propagation window, the waveguide propagation window corresponds to the propagation window in position, and the upper surface of the test board is fixedly provided with a computer capable of controlling the whole test process; the signal acquisition and storage system comprises an electric transport test unit and a radiation intensity test unit, wherein the electric transport test unit comprises a voltage-controlled current source capable of acquiring current signals of a radiation source, a low-noise amplifier capable of acquiring voltage signals of the radiation source and a temperature controller capable of accurately controlling the temperature in a cooling cavity, the voltage input end of the voltage-controlled current source is connected with a computer, the output end of the computer is connected with the temperature controller, the output end of the computer is further connected with a direct current bias module capable of changing the bias condition of the radiation source, and the signal emitting end of the direct current bias module is connected with the radiation source.
2. The intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions, according to claim 1, is characterized in that: the terahertz wave transmission system comprises a displacement platform and a light-isolating cover, wherein the displacement platform is fixed on the upper surface of the test board, the displacement platform is located at the inner bottom of the light-isolating cover, the input end of the chopper is connected with a waveguide transmission window through an optical fiber, the output end of the chopper is connected with a terahertz wave transmission pipeline through an optical path, a first off-axis parabolic mirror for converging divergent terahertz waves into parallel beams is fixedly installed in the terahertz wave transmission pipeline, and the terahertz wave transmission pipeline is located below the light-isolating cover.
3. The intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions, according to claim 2, is characterized in that: the output end of the terahertz wave transmission pipeline is connected with a first beam splitter and a second beam splitter through a light path, the first beam splitter and the second beam splitter form a plane whole by two crossed six-finger tooth sockets, the first beam splitter is fixed on the upper surface of the test board, the second beam splitter is installed on the displacement platform, the second beam splitter can move back and forth on the displacement platform, and the output ends of the first beam splitter and the second beam splitter are connected with a second off-axis parabolic mirror through the light path.
4. The intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions, according to claim 3, is characterized in that: the included angle of a beam splitter and second off-axis parabolic mirror is 45 degrees, the included angle of a beam splitter and first off-axis parabolic mirror is 45 degrees, a beam splitter and No. two beam splitters are parallel arrangement all the time, the output end of second off-axis parabolic mirror is connected with the radiation signal detector of detecting radiation source radiation information through optic fibre.
5. The intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions, according to claim 1, is characterized in that: the radiation intensity testing unit comprises a chopper controller and a phase-locked amplifier, and the phase-locked amplifier is suitable for amplifying signals of the radiation signal detector and chopper signals with the same frequency so as to accurately detect the terahertz radiation power of the radiation source.
6. The intelligent testing device for the high-temperature superconducting terahertz radiation source based on different bias conditions, according to any one of claims 1 to 5, is characterized in that: the using method comprises the following steps:
a, a test board is arranged on the ground, a heat insulation door is opened to fix a radiation source on a red copper support of a cooling cavity, a temperature sensor is also fixed on the test board, a thermometer is connected with a temperature controller, the environmental temperature of a sample is monitored in real time through a computer program, circuits of all parts are connected according to a circuit diagram, an air pump carries out vacuumizing treatment on the interior of a sealed shell, then a computer controls a Stirling refrigerator and a liquid nitrogen flow switch to work, the radiation source is fixedly arranged at the central part of the cooling cavity through a circular cooling cavity, so that the surface of the radiation source is uniformly cooled, the service life of the radiation source can be effectively prolonged, a liquid nitrogen pipeline and a helium pipeline are spirally arranged, and the liquid nitrogen pipeline and the helium pipeline are spirally connected, so that the contact area between the liquid nitrogen pipeline and the helium pipeline is increased, and the whole cavity is uniformly cooled;
b, after finishing the step A, controlling a direct current bias module by a computer to bias a certain current at a radiation source and change the current in a specific range, radiating terahertz waves by the radiation source, transmitting the terahertz waves to a chopper through a transmission window and a waveguide transmission window for modulation, enabling the terahertz waves after being modulated to enter a terahertz wave transmission pipeline and to be converged into parallel light beams through a first off-axis parabolic mirror, connecting an output end of the terahertz wave transmission pipeline with a first beam splitter and a second beam splitter through an optical path, enabling the first beam splitter and the second beam splitter to form a plane whole by two crossed six-finger tooth sockets, fixing the first beam splitter on the upper surface of a test bench, installing the second beam splitter on a displacement platform, enabling the second beam splitter to move back and forth on the displacement platform, connecting output ends of the first beam splitter and the second beam splitter with a second off-axis parabolic mirror through the optical path, enabling the light beams to enter a radiation signal detector through the second off-axis parabolic mirror, the radiation signal detector sends the detected radiation signal to a computer to obtain the radiation power intensity;
and C, when the step B is finished, the terahertz waves transmitted to the chopper through the transmission window and the waveguide transmission window are modulated by the chopper, so that the radiation signal detector receives the signals according to a specific frequency, meanwhile, the working frequency of the chopper is used as a reference signal of the phase-locked amplifier, and finally, the two signals are amplified by the phase-locked amplifier, and the terahertz radiation power is accurately detected.
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6070414A (en) * | 1998-04-03 | 2000-06-06 | Raytheon Company | Cryogenic cooler with mechanically-flexible thermal interface |
| CN101377406A (en) * | 2007-08-31 | 2009-03-04 | 佳能株式会社 | Apparatus and method for obtaining information related to terahertz waves |
| WO2012081783A1 (en) * | 2010-12-13 | 2012-06-21 | 한국원자력연구원 | Cryogenic low-loss two-dimensional waveguide-type mesh mirror terahertz free-electron laser resonator for desktop terahertz free-electron laser |
| CN103175609A (en) * | 2013-03-04 | 2013-06-26 | 南京大学 | Device using high-temperature superconducting YBCO (yttrium barium copper oxide) bicrystal junction for detecting terahertz radiation of high-temperature superconducting BSCCO (bismuth strontium calcium copper oxide) |
| CN103983363A (en) * | 2014-05-29 | 2014-08-13 | 哈尔滨工业大学 | Optimal refrigerating plate for low-temperature infrared target source |
| CN204086851U (en) * | 2014-08-25 | 2015-01-07 | 南京工程学院 | Based on the linear electric motors track tracing device of modified automatic disturbance rejection controller |
| CN104729691A (en) * | 2015-03-25 | 2015-06-24 | 西安应用光学研究所 | Terahertz detector parameter measuring device and measuring method |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102323220A (en) * | 2011-05-31 | 2012-01-18 | 南京大学 | Detection system for improving stability of high sensitivity terahertz mixer and detection method |
-
2020
- 2020-11-05 CN CN202011222687.5A patent/CN112345083B/en not_active Expired - Fee Related
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6070414A (en) * | 1998-04-03 | 2000-06-06 | Raytheon Company | Cryogenic cooler with mechanically-flexible thermal interface |
| CN101377406A (en) * | 2007-08-31 | 2009-03-04 | 佳能株式会社 | Apparatus and method for obtaining information related to terahertz waves |
| WO2012081783A1 (en) * | 2010-12-13 | 2012-06-21 | 한국원자력연구원 | Cryogenic low-loss two-dimensional waveguide-type mesh mirror terahertz free-electron laser resonator for desktop terahertz free-electron laser |
| CN103175609A (en) * | 2013-03-04 | 2013-06-26 | 南京大学 | Device using high-temperature superconducting YBCO (yttrium barium copper oxide) bicrystal junction for detecting terahertz radiation of high-temperature superconducting BSCCO (bismuth strontium calcium copper oxide) |
| CN103983363A (en) * | 2014-05-29 | 2014-08-13 | 哈尔滨工业大学 | Optimal refrigerating plate for low-temperature infrared target source |
| CN204086851U (en) * | 2014-08-25 | 2015-01-07 | 南京工程学院 | Based on the linear electric motors track tracing device of modified automatic disturbance rejection controller |
| CN104729691A (en) * | 2015-03-25 | 2015-06-24 | 西安应用光学研究所 | Terahertz detector parameter measuring device and measuring method |
Non-Patent Citations (2)
| Title |
|---|
| DC流对液氦温区斯特林型脉管制冷机的影响;韩磊 等;《低温工程》;20161231;全文 * |
| Effect of Bias Electrode Position on Terahertz Radiation From Pentagonal Mesas of Superconducting Bi2Sr2CaCu2O8+δ;Kaveh Delfanazari 等;《IEEE TRANSACTIONS ON TERAHERTZ SCIENCE AND TECHNOLOGY》;20150531;全文 * |
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