CN110687424B - Avalanche diode high-frequency parameter low-temperature test system - Google Patents
Avalanche diode high-frequency parameter low-temperature test system Download PDFInfo
- Publication number
- CN110687424B CN110687424B CN201910956345.7A CN201910956345A CN110687424B CN 110687424 B CN110687424 B CN 110687424B CN 201910956345 A CN201910956345 A CN 201910956345A CN 110687424 B CN110687424 B CN 110687424B
- Authority
- CN
- China
- Prior art keywords
- avalanche diode
- test
- temperature
- oscillator
- liquid nitrogen
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a high-frequency parameter low-temperature test system for an avalanche diode, which comprises a test chamber, wherein a lifting support is arranged at the bottom in the test chamber, a medium cooling table is arranged at the top end of the lifting support, a temperature sensor and an oscillator for loading the avalanche diode to be tested are arranged on the medium cooling table, and a circulator is arranged above the oscillator; the side wall of the test chamber is respectively provided with a first waveguide element, a second waveguide element, a first electric connector and a second electric connector; an injection locking signal source, an avalanche diode reverse bias power supply, a power meter, a high-frequency test loop, a harmonic mixing detection unit, a temperature sensor power supply, a vacuum pump, a liquid nitrogen tank, a program control valve, a flow meter, a liquid nitrogen recovery device, a microcontroller and a display screen are arranged outside the test chamber; the invention can effectively inhibit the technical defect that the transmission loss is increased to further influence the reduction of the output efficiency of the millimeter wave avalanche diode due to the condensation and frosting of the transmission loop in the low-temperature test of the avalanche diode in the prior art, and ensures the accuracy of the device test.
Description
Technical Field
The invention relates to the technical field of millimeter wave testing, in particular to a high-frequency parameter low-temperature testing system for an avalanche diode.
Background
The avalanche diode can realize high-power output in millimeter wave band under the condition of impedance matching with an external circuit, and due to the characteristic, various millimeter wave oscillators based on the avalanche diode are applied to the military and civil fields, such as millimeter wave radar detection, nondestructive object detection, millimeter wave security check instruments and the like. The application of the high-power output and millimeter wave oscillator is realized, the first premise is that the avalanche diode resonates based on the central working frequency in the millimeter wave band and generates high-power output, and therefore, for the millimeter wave avalanche diode, the main performance indexes for evaluating the high-frequency parameters of the millimeter wave avalanche diode are the working frequency and the output power.
In a millimeter wave band, signal transmission is mainly completed based on a waveguide structure, waveguide transmission loss fluctuation is a factor that output change is not negligible during millimeter wave avalanche diode high-frequency parameter testing, especially in a low-temperature environment, due to the influence of low-temperature water vapor, the waveguide structure has increased internal transmission loss, working frequency deviation in millimeter wave avalanche diode high-frequency parameters is easily caused, output power is reduced, and finally, a testing result is unreliable.
At present, a high-frequency parameter low-temperature test system based on avalanche diodes is only mentioned in scientific research institutions or laboratories of colleges and universities, and the shown high-frequency parameter low-temperature test process of the avalanche diodes is to directly place pulse-type avalanche diodes above a refrigeration box filled with liquid nitrogen in advance, to cool a module to be tested by means of the surface temperature of the refrigeration box, and the method is expressed and illustrated in the research on 3 mm frequency-stabilized pulse avalanche oscillator of the university of electronic science and technology university Master. Based on the method, the tested module loaded with the avalanche diode and the transmission waveguide connected with the tested module are exposed in the air, a large amount of water vapor appears on the tested module and the transmission waveguide when the liquid nitrogen is cooled, the water vapor is increased along with the increase of time, the waveguide loss is increased, and the test output is influenced.
In addition, the temperature of the refrigeration module exposed to air during the test varies greatly, making the test results unreliable. Therefore, the effective reduction of the waveguide transmission loss while ensuring the constant-temperature refrigeration environment is a necessary condition for realizing the reliable test of the high-frequency parameters of the avalanche diode under the low-temperature condition, and is a bottleneck for restricting the high-frequency characteristic parameter test evaluation of the avalanche diode under the low-temperature environment in the millimeter wave band.
Disclosure of Invention
The invention aims to provide a high-frequency parameter low-temperature test system for an avalanche diode, which effectively solves the problems of work frequency drift and output power reduction of the avalanche diode caused by the increase of self loss of a low-temperature frosted waveguide structure while ensuring the temperature stability of a test environment, and ensures the accuracy of high-frequency performance test of a device in the low-temperature environment.
The technical scheme adopted by the invention for solving the technical problems is as follows:
a high-frequency parameter low-temperature test system for an avalanche diode comprises a test chamber, wherein a lifting support is arranged at the bottom in the test chamber, a medium cooling table is arranged at the top end of the lifting support, a temperature sensor and an oscillator for loading the avalanche diode to be tested are arranged on the medium cooling table, and a circulator is arranged above the oscillator;
the side wall of the test chamber is respectively provided with a first waveguide element, a second waveguide element, a first electric connector and a second electric connector;
an injection locking signal source, an avalanche diode reverse bias power supply, a power meter, a high-frequency test loop, a harmonic mixing detection unit, a temperature sensor power supply, a vacuum pump, a liquid nitrogen tank, a program control valve, a flow meter, a liquid nitrogen recovery device, a microcontroller and a display screen are arranged outside the test chamber;
the vacuum pump is communicated with the bottom of the testing chamber, a detachable sealing cover plate is arranged at the top of the testing chamber, and observation glass is arranged on the sealing cover plate;
a first interface of the circulator is connected with an injection locking signal source through a first waveguide element, a second interface of the circulator is connected with an oscillator, a third interface of the circulator is connected with a high-frequency test loop through a second waveguide element, and output interfaces of the high-frequency test loop are respectively connected with a power meter and a harmonic mixing detection unit;
the reverse bias power supply of the avalanche diode is connected with a power supply end of the oscillator through a first electric connector; the output interface of the microcontroller is respectively connected with the vacuum pump, the program control valve and the display screen; the temperature sensor is respectively connected with the temperature sensor power supply and the input interface of the microcontroller through a second electric connector; a refrigerant input pipe and a refrigerant output pipe are arranged on the side wall of the test chamber in a penetrating manner, the outer end of the refrigerant input pipe is connected with the liquid nitrogen tank through a program control valve, the inner end of the refrigerant input pipe is connected with a medium inlet of the medium cooling table, the inner end of the refrigerant output pipe is connected with a medium outlet of the medium cooling table, and the outer end of the refrigerant output pipe is connected with a liquid nitrogen recovery device; the flowmeter is arranged on a pipeline of the refrigerant input pipe and is connected to an input interface of the microprocessor.
The invention has the beneficial effects that:
the invention establishes a set of low-temperature test system with an intelligent temperature control device and suitable for the millimeter wave avalanche diode, and can effectively overcome the technical defect that the transmission loss is increased and the reduction of the output efficiency of the millimeter wave avalanche diode is influenced because a transmission loop is condensed and frosted during the low-temperature test of the avalanche diode in the prior art.
The testing system respectively controls the vacuum pump and the program control valve by the microcontroller, thereby realizing the program control management of the vacuum degree and the liquid nitrogen flow and realizing the low-temperature dynamic balance under high vacuum.
And thirdly, in a test chamber with a certain vacuum degree, a liquid nitrogen medium cooling platform based on stable flow is used for cryogenically cooling the oscillator loaded with the avalanche diode, the cooling temperature is detected by a temperature sensor close to the oscillator on a cooling platform surface, the detected information is sent to a microcontroller, the microcontroller controls a display screen to display the temperature information in real time, and simultaneously, a program control valve connected with an output port of the liquid nitrogen tank is subjected to program control management based on comparison between a temperature measured value and a preset value, the flow of liquid nitrogen input into the medium cooling platform is controlled, and therefore the effect of real-time intelligent temperature control management is achieved.
In the airtight test chamber, under the high vacuum pressure environment, the transmission coefficient of the air medium to the temperature is reduced, the temperature change under the unit cubic environment is very small, the condition of water vapor condensation of a waveguide channel in a test link is caused by a refrigeration module under the normal temperature environment, the high vacuum environment can be greatly improved, the waveguide loss is basically consistent with the loss under the normal temperature under the environment, therefore, the loss correction value of the waveguide under the normal temperature can be continuously brought into use during the low temperature vacuum environment test, and the effectiveness of the test result is ensured.
Drawings
The invention is further illustrated with reference to the following figures and examples:
FIG. 1 is a schematic diagram of the system of the present invention;
FIG. 2 is a schematic view of a media cooling station of the present invention;
FIG. 3 is a schematic diagram of the distribution of the media tubes in the media cooling station of the present invention.
Detailed Description
As shown in fig. 1, the present invention provides a high-frequency parameter low-temperature testing system for an avalanche diode, which includes a testing chamber 229, a lifting support 222 is disposed at the bottom inside the testing chamber 229, a medium cooling platform 221 is disposed at the top end of the lifting support 222, a temperature sensor 210 and an oscillator 201 for loading the avalanche diode 200 to be tested are disposed on the medium cooling platform 221, and a circulator 205 is disposed above the oscillator 201.
The side walls of the test chamber 229 are provided with a first waveguide element 204, a second waveguide element 206, a first electrical connector 223 and a second electrical connector 211, respectively.
The test chamber 229 is externally provided with an injection locking signal source 203, an avalanche diode reverse bias power supply 202, a power meter 208, a high-frequency test loop 207, a harmonic mixing detection unit 209, a temperature sensor power supply 212, a vacuum pump 225, a liquid nitrogen tank 217, a program control valve 230, a flow meter 216, a liquid nitrogen recovery device 215, a microcontroller 218 and a display screen 219.
The vacuum pump 225 is communicated with the bottom of the test chamber 229, a detachable sealing cover plate 226 is arranged at the top of the test chamber 229, and the sealing cover plate 226 is provided with an observation glass 227.
A first interface of the circulator 205 is connected with the injection locking signal source 203 through a first waveguide element 204, a second interface is connected with the oscillator 201, a third interface is connected with a high-frequency test loop 207 through a second waveguide element 206, and output interfaces of the high-frequency test loop 207 are respectively connected with a power meter 208 and a harmonic mixing detection unit 209. The injection locking signal source 203 is composed of a local vibration source customized by a user, a test module such as an injection locking amplifier, etc., the high-frequency test loop 207 is composed of a coupler, an attenuator, an isolator, a waveguide element, etc. selected by the user, the high-frequency test loop 207 respectively sends the output signal of the oscillator to the power meter 208 and the harmonic mixing detection unit 209 through the internal coupler, wherein the harmonic mixing detection unit 209 is composed of a detector, an oscilloscope, a spectrum analyzer, etc. selected by the user.
The avalanche diode reverse bias power supply 202 is connected with a power supply end of the oscillator 201 through a first electric connector 223; the output interface of the microcontroller 218 is respectively connected with a vacuum pump 225, a liquid nitrogen tank 217 and a display screen 219; the temperature sensor 210 is respectively connected with the input interface of the temperature sensor power supply 212 and the microcontroller 218 through a second electric connector 211; a refrigerant input pipe 220 and a refrigerant output pipe 213 are arranged on the side wall of the test chamber 229 in a penetrating manner, the outer end of the refrigerant input pipe 213 is connected with the liquid nitrogen tank 217 through a program control valve 230, the inner end of the refrigerant output pipe 213 is connected with a medium inlet of the medium cooling platform 221, the inner end of the refrigerant output pipe 213 is connected with a medium outlet of the medium cooling platform 221, and the outer end of the refrigerant output pipe is connected with the liquid nitrogen recovery device 215 through a one-way valve 214; the flow meter 216 is disposed on the line of the refrigerant input pipe 220 and connected to the input port of the microprocessor 218.
Referring to fig. 2 and 3, the medium cooling platform 221 includes a supporting platform a04, a serpentine medium cooling tube a02 is disposed at the bottom of the supporting platform a04, an inlet a01 of the medium cooling tube a02 is connected to the refrigerant input tube 220, and an outlet a03 of the medium cooling tube a02 is connected to the refrigerant output tube 213.
In operation, the sealing cover 226 of the testing chamber 229 is removed to make the testing chamber 229 in an atmospheric environment, then the avalanche diode 200 to be tested is loaded in the oscillator 201 and connected to the second interface of the circulator 205, the injection locking signal source 203 is connected to the first interface of the circulator 205 through the first waveguide element 204, the third interface of the circulator 205 is connected to the external high-frequency testing loop 207 through the second waveguide element 206, and the coupler selected in the high-frequency testing loop 207 can transmit the signal to the power meter 208 and the harmonic mixing detection unit 209, respectively. The reverse bias and current excitation signals required for the operation of the avalanche diode 200 are applied to the power source terminal of the oscillator 201 by the avalanche diode reverse bias power source 202 through the first connector 223.
Under the condition of normal temperature and atmospheric pressure, the output of the injection locking signal source 203 and the reverse bias power source 202 of the avalanche diode are adjusted, the avalanche diode 200 resonates in the oscillator 201 by combining the mechanical tuning mode of the oscillator 201 and the like, and then the high-frequency parameter tests of the operating frequency, the output power and the like of the avalanche diode 200 are respectively completed through the harmonic mixing detection unit 209 and the power meter 208. When the high-frequency parameters of the avalanche diode 200 meet the specification requirement at normal temperature, the output conditions of the injection locking signal source 203 and the avalanche diode reverse bias power supply 202 are fixed, the peripheral state of the mechanical tuning of the oscillator 201 is fixed, and finally the injection locking signal source 203 and the avalanche diode reverse bias power supply 202 are closed.
The oscillator 201 which completes high-frequency parameter tuning output at normal temperature is placed on a medium cooling table 221 which is not filled with liquid nitrogen, at this time, the oscillator 201 is required to be close to a temperature sensor 210 which is already installed on the medium cooling table 221 as much as possible, the height of the medium cooling table 221 is adjusted in a micro-motion mode through a lifting support 222, the situation that the oscillator 201 is not tightly attached to the medium cooling table 221 due to the fact that the position of the medium cooling table 221 is too low or a circulator 205 connected with the oscillator 201 is jacked up due to the fact that the position of the medium cooling table 221 is too high is avoided, the height of the medium cooling table 221 needs to be maintained to be in tight contact with the oscillator 201, and meanwhile, the circulator 205, a first waveguide element 204 and a second waveguide element 206 are kept at.
Installing a sealing cover plate 226, presetting low-temperature conditions required by the high-frequency parameter test of the avalanche diode 200 and a vacuum pressure value in a test chamber 229 by a microcontroller 218, then starting a vacuum pump 225 by the microcontroller 218 to enable the test chamber 229 to be in a vacuum state, simultaneously reading an output value of a vacuum sensor configured in the vacuum pump 225 by the microcontroller 218 through a bidirectional program control mode to monitor the vacuum degree in the test chamber 229, controlling to open a program control valve 230 connected with an output port of a liquid nitrogen tank 217 by the microcontroller 218 when the vacuum degree in the test chamber 229 is higher than 0.01 pascal, transmitting the liquid nitrogen in the liquid nitrogen tank 217 to a medium cooling platform 221 through a refrigerant input pipe 220, taking the liquid nitrogen as a cooling medium, passing through a serpentine medium cooling pipe A02 of the medium cooling platform 221, entering a one-way valve 214 through a refrigerant output pipe 213, and finally entering a liquid ammonia recovery device 215, wherein the liquid nitrogen recovery device 215 is a cylindrical or tank, the check valve 214 is to prevent liquefied nitrogen from flowing back into the refrigerant output pipe 213, which results in unstable temperature lowering state of the cooling platform 221.
When liquid nitrogen passes through the medium cooling table 221, the oscillator 201 placed on the medium cooling table 221 is cooled, and the temperature sensor 210 is also cooled, the temperature sensor 210 is powered by a temperature sensor power supply 212 outside the test chamber 229 through the second connector 211, the temperature sensor 210 collects temperature information on the medium cooling table 221 in real time and transmits the temperature to the microcontroller 218, the microcontroller 218 controls the display screen 219 to display the temperature information in real time and judges whether the temperature reaches a preset value, if the temperature reaches a preset low-temperature value, the microcontroller 218 controls the program control valve 230 to close or adjust the output flow of the liquid nitrogen, the flow meter 216 feeds back the flow state to the microprocessor in real time, and the oscillator 201 loading the avalanche diode 200 is in a low-temperature constant state at this time. And if the acquired temperature information shows that the temperature does not reach the preset low-temperature value, continuing to keep inputting the liquid nitrogen until the temperature meets the preset value.
After the temperature initially reaches the preset low temperature value, the microcontroller 218 starts timing, and based on the temperature information fed back to the microcontroller 218 by the temperature sensor 210, the low temperature state on the medium cooling stage 221 is kept in dynamic balance within a timing time which is not less than 30 minutes by controlling the program control valve 230 to close or adjust the output flow of liquid nitrogen, so as to ensure that the avalanche diode 200 loaded in the oscillator 201 completely presents a low temperature mode. After the timing is finished, the injection locking signal source 203 and the avalanche diode reverse bias power supply 202 are started, the output states of the injection locking signal source 203 and the avalanche reverse bias power supply 202 are adjusted to be fixed output conditions when resonance occurs in a high-frequency parameter test of the avalanche diode 200 at normal temperature, then the output power of the avalanche diode 200 at low temperature is measured through the power meter 208, and the working frequency value of the avalanche diode 200 at low temperature is measured through the harmonic mixing detection unit 209.
In the process of temperature reduction and constant temperature of the system, an intelligent vacuum temperature control unit consisting of a microcontroller 218, a program control valve 230, a liquid nitrogen tank 217, a flow meter 216, a refrigerant input pipe 220, a medium cooling platform 221, a refrigerant output pipe 213, a one-way valve 214, a liquid nitrogen recovery device 215, a temperature sensor 210, a second electric connector 211, a temperature sensor power supply 212 and a test chamber 229 with a vacuum pump 225 adjusts the flow rate of liquid nitrogen through the feedback of the flow meter 216, so that the low-temperature environment on the avalanche diode 200 placed in the test chamber 229 can be in a dynamic balance state, and the liquid nitrogen sent to the medium cooling platform 221 is finally recovered by the liquid nitrogen recovery device 215 in the dynamic balance working state. The state of the inside of the test chamber 229 during the operation of the system can be observed through the sight glass 227 mounted on the sealing cover 226.
The foregoing is merely a preferred embodiment of the invention and is not intended to limit the invention in any manner; those skilled in the art can make numerous possible variations and modifications to the present teachings, or modify equivalent embodiments to equivalent variations, without departing from the scope of the present teachings, using the methods and techniques disclosed above. Therefore, any simple modification, equivalent replacement, equivalent change and modification made to the above embodiments according to the technical essence of the present invention are still within the scope of the protection of the technical solution of the present invention.
Claims (1)
1. The high-frequency parameter low-temperature test system for the avalanche diode is characterized by comprising a test chamber, wherein a lifting support is arranged at the bottom in the test chamber, a medium cooling table is arranged at the top end of the lifting support, a temperature sensor and an oscillator for loading the avalanche diode to be tested are arranged on the medium cooling table, and a circulator is arranged above the oscillator;
the side wall of the test chamber is respectively provided with a first waveguide element, a second waveguide element, a first electric connector and a second electric connector;
an injection locking signal source, an avalanche diode reverse bias power supply, a power meter, a high-frequency test loop, a harmonic mixing detection unit, a temperature sensor power supply, a vacuum pump, a liquid nitrogen tank, a program control valve, a flow meter, a liquid nitrogen recovery device, a microcontroller and a display screen are arranged outside the test chamber;
the vacuum pump is communicated with the bottom of the testing chamber, a detachable sealing cover plate is arranged at the top of the testing chamber, and observation glass is arranged on the sealing cover plate;
a first interface of the circulator is connected with an injection locking signal source through a first waveguide element, a second interface of the circulator is connected with an oscillator, a third interface of the circulator is connected with a high-frequency test loop through a second waveguide element, and output interfaces of the high-frequency test loop are respectively connected with a power meter and a harmonic mixing detection unit;
the reverse bias power supply of the avalanche diode is connected with a power supply end of the oscillator through a first electric connector; the output interface of the microcontroller is respectively connected with the vacuum pump, the program control valve and the display screen; the temperature sensor is respectively connected with the temperature sensor power supply and the input interface of the microcontroller through a second electric connector; a refrigerant input pipe and a refrigerant output pipe are arranged on the side wall of the test chamber in a penetrating manner, the outer end of the refrigerant input pipe is connected with the liquid nitrogen tank through a program control valve, the inner end of the refrigerant input pipe is connected with a medium inlet of the medium cooling table, the inner end of the refrigerant output pipe is connected with a medium outlet of the medium cooling table, and the outer end of the refrigerant output pipe is connected with a liquid nitrogen recovery device; the flowmeter is arranged on a pipeline of the refrigerant input pipe and is connected to an input interface of the microprocessor.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910956345.7A CN110687424B (en) | 2019-10-10 | 2019-10-10 | Avalanche diode high-frequency parameter low-temperature test system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910956345.7A CN110687424B (en) | 2019-10-10 | 2019-10-10 | Avalanche diode high-frequency parameter low-temperature test system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110687424A CN110687424A (en) | 2020-01-14 |
| CN110687424B true CN110687424B (en) | 2021-05-18 |
Family
ID=69111875
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910956345.7A Active CN110687424B (en) | 2019-10-10 | 2019-10-10 | Avalanche diode high-frequency parameter low-temperature test system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110687424B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113823890B (en) * | 2021-09-23 | 2022-04-12 | 华东光电集成器件研究所 | High-frequency high-power IMPATT pipe electrical parameter debugging device |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002071454A (en) * | 2000-08-30 | 2002-03-08 | Hioki Ee Corp | Cooling apparatus and photodetector |
| CN101714682A (en) * | 2009-12-21 | 2010-05-26 | 中国电子科技集团公司第十六研究所 | Microwave low-loss waveguide vacuum window |
| CN103389451A (en) * | 2013-07-24 | 2013-11-13 | 广东瑞谷光纤通信有限公司 | Testing method and testing device of avalanche photodiode |
| CN103499755A (en) * | 2013-09-26 | 2014-01-08 | 工业和信息化部电子第五研究所 | Automatic testing method and automatic testing device for parameters of microwave oscillator |
| CN104731126A (en) * | 2015-01-21 | 2015-06-24 | 中国科学院上海技术物理研究所 | Temperature control method based on integrated Dewar component temperature change testing refrigeration structure |
| CN205594129U (en) * | 2016-04-27 | 2016-09-21 | 索尔思光电（成都）有限公司 | Avalanche photodiode fault monitoring circuit |
| CN205941801U (en) * | 2016-08-29 | 2017-02-08 | 武汉亿德光兴科技有限公司 | APD automatic test equipment |
| CN106405362A (en) * | 2016-08-25 | 2017-02-15 | 华东光电集成器件研究所 | Avalanche diode low frequency parameter testing apparatus |
| CN207198291U (en) * | 2017-03-31 | 2018-04-06 | 深圳市芯思杰智能物联网技术有限公司 | Avalanche photodide temperature coefficient test device |
-
2019
- 2019-10-10 CN CN201910956345.7A patent/CN110687424B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002071454A (en) * | 2000-08-30 | 2002-03-08 | Hioki Ee Corp | Cooling apparatus and photodetector |
| CN101714682A (en) * | 2009-12-21 | 2010-05-26 | 中国电子科技集团公司第十六研究所 | Microwave low-loss waveguide vacuum window |
| CN103389451A (en) * | 2013-07-24 | 2013-11-13 | 广东瑞谷光纤通信有限公司 | Testing method and testing device of avalanche photodiode |
| CN103499755A (en) * | 2013-09-26 | 2014-01-08 | 工业和信息化部电子第五研究所 | Automatic testing method and automatic testing device for parameters of microwave oscillator |
| CN104731126A (en) * | 2015-01-21 | 2015-06-24 | 中国科学院上海技术物理研究所 | Temperature control method based on integrated Dewar component temperature change testing refrigeration structure |
| CN205594129U (en) * | 2016-04-27 | 2016-09-21 | 索尔思光电（成都）有限公司 | Avalanche photodiode fault monitoring circuit |
| CN106405362A (en) * | 2016-08-25 | 2017-02-15 | 华东光电集成器件研究所 | Avalanche diode low frequency parameter testing apparatus |
| CN205941801U (en) * | 2016-08-29 | 2017-02-08 | 武汉亿德光兴科技有限公司 | APD automatic test equipment |
| CN207198291U (en) * | 2017-03-31 | 2018-04-06 | 深圳市芯思杰智能物联网技术有限公司 | Avalanche photodide temperature coefficient test device |
Non-Patent Citations (2)
| Title |
|---|
| 3毫米稳频脉冲雪崩管振荡器研究;陈会;《中国优秀硕士学位论文全文数据库 信息科技辑》;20021215(第2期);第I135-207页 * |
| S/X波段低损耗波导真空窗技术研究;李大志 等;《低温与超导》;20111224;第39卷(第12期);第64-67页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110687424A (en) | 2020-01-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110687424B (en) | Avalanche diode high-frequency parameter low-temperature test system | |
| US20140176136A1 (en) | Cryogen-free cooling system for electron paramagnetic resonance spectrometer | |
| US7667476B2 (en) | Measuring module for rapid measurement of electrical, electronic and mechanical components at cryogenic temperatures and measuring device having such a module | |
| CN111044567A (en) | Chilled-mirror dew point hygrometer capable of quickly measuring extremely low dew point | |
| CN103234661A (en) | Calibrating device with independent vacuum chamber | |
| Naumov et al. | A closed-cycle cryostat for optical and Mössbauer spectroscopy in the temperature range 4.2–300 K | |
| CN102339655B (en) | Temperature-controlled inflatable vacuum radiation equipment | |
| CN109490359A (en) | Profound hypothermia Oscillating flow heat transfer property test platform and method | |
| CN106998205B (en) | A kind of coefficient of coup adjusts sapphire microwave source and adjusting method | |
| CN209460179U (en) | A kind of profound hypothermia Oscillating flow heat transfer property test platform | |
| Chervin et al. | Micro‐Raman at variable low‐temperature and very high pressure | |
| CN113295544A (en) | Long-term aging test device | |
| CN204539085U (en) | Dielectric cavity oscillation body device under a kind of room temperature environment | |
| CN104935291B (en) | A kind of Low phase noise sapphire microwave oscillator | |
| CN107154799B (en) | Sapphire microwave frequency source and control method | |
| Jelley et al. | An Operational Ruby Maser for Observations at 21 Centimeters with a 60‐Foot Radio Telescope | |
| CN220552801U (en) | Device for low-temperature test | |
| Bohan et al. | Combined 3He Cryostat and Pulsed ESR Spectrometer | |
| Hanley et al. | A high-sensitivity laboratory system for measuring the microwave properties of gases under simulated conditions for planetary atmospheres | |
| CN112461458A (en) | Helium concentration detection control device for helium mass spectrometer leak detection test system | |
| Kytin et al. | Installation of Relative Acoustic Gas Thermometry in the Low Temperature Range from 4.2 to 80 K | |
| CN212568363U (en) | Viscosity-temperature characteristic monitoring instrument for mining explosion-proof hydraulic equipment | |
| US11644224B2 (en) | Portable automatic refrigerant charging device and method | |
| Pitre et al. | The comparison between a second‐sound thermometer and a melting‐curve thermometer from 0.8 K down to 20 mK | |
| CN116124229B (en) | Method for detecting pipeline flow of liquid nitrogen tank by adopting passive resonant cavity |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |