CN112327072B - Multi-column shunt test method for resistor disc - Google Patents
Multi-column shunt test method for resistor disc Download PDFInfo
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- CN112327072B CN112327072B CN202011070169.6A CN202011070169A CN112327072B CN 112327072 B CN112327072 B CN 112327072B CN 202011070169 A CN202011070169 A CN 202011070169A CN 112327072 B CN112327072 B CN 112327072B
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- 238000010998 test method Methods 0.000 title claims abstract description 9
- 238000000034 method Methods 0.000 claims abstract description 32
- 238000012360 testing method Methods 0.000 claims abstract description 28
- 238000004364 calculation method Methods 0.000 claims description 7
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 8
- 238000005259 measurement Methods 0.000 description 7
- 238000002474 experimental method Methods 0.000 description 4
- 239000011787 zinc oxide Substances 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000010521 absorption reaction Methods 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910044991 metal oxide Inorganic materials 0.000 description 2
- 150000004706 metal oxides Chemical class 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/10—Measuring sum, difference or ratio
Abstract
The invention provides a multi-column shunt test method for resistor discs, which comprises the steps of sequentially placing a corresponding group of resistor discs at shunt positions corresponding to serial numbers in shunt equipment according to serial numbers on a plurality of branches of multi-column shunt test equipment, carrying out primary current impact, recording the sum of current of each branch and current of each branch, namely total current, and calculating a shunt ratio to sequentially fill a table; then sequentially moving the positions of the resistor disc columns for a plurality of times, performing current impact once each time, recording the sum of the current of each branch and the current of each branch, namely the total current, and calculating the split ratio to sequentially fill the table; and finally, the data are arranged to obtain the actual shunt ratio of the resistor disc and the inherent shunt ratio of the shunt equipment. The invention utilizes the duty ratio shift addition method to calculate the inherent shunt coefficient of the shunt equipment and the calculated shunt coefficient of the resistor disc column, and provides a method for calibrating experimental data by using the inherent shunt coefficient.
Description
Technical Field
The invention relates to a resistor disc, in particular to a multi-column shunt test method for a resistor disc.
Background
With the rapid development of the power industry, novel power equipment such as a direct-current extra-high voltage converter station, series compensation equipment, a direct-current breaker and the like are greatly developed, and a metal oxide lightning arrester is required to absorb huge energy; or under higher action current, the residual voltage of the whole product is ensured to be lower than the required value. And an excessively large diameter of the single-chip resistor sheet inevitably causes various defects due to the manufacturing process. Therefore, the parallel connection of multi-column resistors is a main method for solving the problems.
Under the condition that the resistor disc columns are connected in parallel, the voltage of each column is equal, so that the lightning arrester group acts instantaneously, and the passing current of each column is the energy absorption of each column. Due to the non-linearity of the metal oxide resistor, the current per column is not exactly equal in the case of a parallel connection of multiple columns. And the difference in current distribution between each column determines the energy absorption of the entire resistor string. For the parallel group of the multi-column zinc oxide resistor disc, the measurement of the non-uniformity of the current distribution of the parallel group becomes a key production process for manufacturing the multi-column parallel lightning arrester.
The current DC reference voltage method and residual voltage method are all indirect measurement. Because of inaccurate measurement of characteristic parameters of each resistor sheet and few samples, the methods cannot exclude that the voltage-current characteristics of the columns of the resistor sheets have large difference, and the actual product distribution is uneven and inconsistent with the calculated value, so that the distribution is seriously uneven. The appearance of novel reposition of redundant personnel measuring equipment has greatly improved the accuracy and the intuitiveness of the reposition of redundant personnel unevenness test of multi-column parallel resistance card post group.
The accuracy of the shunt device directly determines the accuracy of the component flow coefficient of the resistor disc column. Therefore, in order to ensure the reliability of the test conclusion, the measurement accuracy analysis should be performed on the shunt device first. While the method of measurement accuracy analysis is temporarily not standard and previous example-compliant.
Disclosure of Invention
The invention aims to provide a multi-column shunt test method for a resistor disc by adopting a multi-column shift addition method.
In order to solve the technical problems, the invention adopts the following technical scheme: a multi-column shunt test method for a resistor disc comprises the following steps:
(1) Sequentially placing m groups of resistor sheets at the shunt positions corresponding to serial numbers in the shunt equipment according to serial numbers on m branches of the multi-column shunt test equipment, performing primary current impact, recording the sum of the current of each branch and the current of each branch, namely the total current, and calculating the shunt ratio to sequentially fill the table;
(2) Sequentially moving m resistor disc columns, namely moving a 1 st resistor disc column to a 2 nd shunt position, moving a 2 nd resistor disc column to a 3 rd shunt position, … …, moving an m-1 st resistor disc column to an m-th shunt position, moving an m-1 st resistor disc column to a 1 st shunt position, performing primary current impact according to the method of the step 1, recording the sum of current of each branch and current of each branch, namely the total current, and calculating a shunt ratio to sequentially fill a table;
(3) Sequentially moving the positions of m resistor disc columns for m times according to the method of the step 2, respectively performing primary current impact, recording the sum of the current of each branch and the current of each branch, namely the total current, and calculating the split ratio to sequentially fill the table;
(4) Data arrangement, namely rearranging data according to positions and the resistor pieces, so as to ensure the current occupation ratio of the same resistor piece at different positions in the same behavior, wherein the same row is the current occupation ratio of the same resistor piece at different positions; then adding each row, wherein the ratio of the sum value of each row is the actual shunt ratio of the resistor disc; the ratio of the sum value of each column is the inherent shunt ratio of the shunt device, added for each column.
The calculation method in the step (1) is that on m branches of multi-column shunt test equipment, the current of each branch in an ideal state accounts for 1/m of the total current ratio; the inherent split ratio of the equipment is set to be K, and the inherent split ratio of each branch is set to be K 1 ……k m The method comprises the steps of carrying out a first treatment on the surface of the Selecting m resistor columns, wherein the split ratio of the m resistor columns under the same impact current is set as n under the condition of not considering the influence of equipment errors, and the split ratio of the m resistor columns is set as n 1 ....n m The inherent shunt ratio k of the device and the shunt ratio n of the resistor disc per se are unchanged under the same waveform and similar impact current; the total current per impact is set as I Total (S) Branch current is I 1 ....I m Then:
I 1 ＝I total (S) ×n 1 ×k 1 n 1 ×k 1 ＝I 1 /I Total (S)
I 2 ＝I Total (S) ×n 2 ×k 2 n 2 ×k 2 ＝I 2 /I Total (S)
…………
I m ＝I Total (S) ×n m ×k m n m ×k m ＝I m /I Total (S) 。
The method of the data arrangement in the step (4) adds each row, and the sum of the first row is n 1 The sum of the second row is n 2 … …, sum of m-th row n m The method comprises the steps of carrying out a first treatment on the surface of the As set forth above, k corresponds to a certain row in the case where the difference in current per impact is not large 1 ……k m With little variation, the sum of which is considered to be a constant value, the ratio of m rows of sums can be reduced by a constant value, n 1 :n 2 :……:n m This is the actual shunt value of the resistor disc; similarly, for each column, the sum of the first columns is k 1 The sum of the second column is k 2 The sum of column m is k m The ratio of the sum of m columns is k 1 :k 2 :……:k m This is the inherent split ratio of the splitting device.
The invention adopts the multi-column shunt test method of the resistor disc designed by the technical scheme, analyzes the errors of the resistor disc under different waveforms and current impact according to experimental data, provides a method for measuring and calculating the inherent shunt coefficient of the shunt device and the calculated shunt coefficient of the resistor disc by using the duty ratio shift phase-change method, and provides a method for calibrating the experimental data by using the inherent shunt coefficient. The experiment shows that the invention adopts the duty ratio shift addition method to be feasible and effective, and particularly has more obvious effect under the condition of larger shunt coefficient.
Drawings
FIG. 1 shows a schematic diagram of a displacement principle of a multi-column shunt test device of the present invention;
FIG. 2 shows the ratio of the current to the current of each resistor after 8 sets of tests at the time of the operation wave 500A test;
FIG. 3 shows calculated values of the shunt ratio of the resistor sheet in the operation wave 500A test;
FIG. 4 shows calculated values of the intrinsic split ratio of the device in the operation wave 500A test;
FIG. 5 shows the calculation of shunt ratio for a resistive patch under an operating wave;
FIG. 6 shows the measured shunt ratio of the resistor disc at 8 sequential shifts of lightning impulse 1000A;
FIG. 7 shows calculated shunt values for the resistive patches under lightning wave 1000A;
FIG. 8 shows intrinsic shunt coefficient values of the device under lightning wave 1000A;
fig. 9 shows a comparative diagram of the front and rear of the shunt ratio under the lightning wave 1000A.
Detailed Description
The zinc oxide resistor disc multi-column shunt test equipment used by the invention mainly comprises a control console, an impact current generator and a multi-column parallel zinc oxide resistor disc column group test console. The impulse current generator can generate impulse current which simulates the non-current value of various common impulse waveforms of lightning arresters such as lightning impulse, operation impulse and the like. The multi-column parallel zinc oxide resistor disc column group test board is disc-shaped, the multi-column resistor disc columns are connected in parallel with test equipment according to radial positions through a pneumatic tool, a control board is provided with a voltage and current acquisition device, 8 paths of current waveforms are displayed through an oscilloscope, and the non-uniformity coefficient is directly provided through calculation.
The invention relates to a method for calibrating accuracy of a multi-column shunt test of a resistor disc, which comprises the following specific principles: the multi-column shunt test equipment is not absolutely even distributed in different shunt branches due to the fact that inductance, capacitance and resistance inherent in the structure are under the impact currents of different waveforms even though the resistor disc columns are completely equalized. Taking 8 branches of multi-column split-flow test equipment as an example, the method comprises the following steps:
(1) In an ideal state, the current of each branch is 1/8 of the total current ratio on 8 branches of the multi-column shunt test equipment, and the inherent shunt ratio of the equipment is actually assumed to be k (the inherent shunt ratio of each branch is k 1 ……k 8 ). Selecting 8 resistor columns, wherein the 8 resistor columns do not consider equipment errorsUnder the influence, the shunt ratio under the same impact current is n (8 resistance pieces are n 1 ……n 8 ). It is believed that the inherent split ratio of the device is k and the split ratio n of the resistor disc itself is unchanged at the same waveform, similar impact current.
Assuming a total current per impact of I Total (S) Branch current is I 1 ....I 8 Then
I 1 ＝I Total (S) ×n 1 ×k 1 n 1 ×k 1 ＝I 1 /I Total (S)
I 2 ＝I Total (S) ×n 2 ×k 2 n 2 ×k 2 ＝I 2 /I Total (S)
…………
I 8 ＝I Total (S) ×n 8 ×k 8 n 8 ×k 8 ＝I 8 /I Total (S)
Sequentially placing 8 groups of resistor discs into a shunt position corresponding to a serial number in shunt equipment according to the serial number for carrying out primary current impact, recording the current and total current (calculation sum) of each branch, calculating a shunt ratio and sequentially filling the calculated shunt ratio into a table;
(2) Sequentially moving the 8 resistance sheet columns, namely moving the 1 st resistance sheet column to the 2 nd shunt position, moving the 2 nd resistance sheet column to the 3 rd shunt position, … …, moving the 7 th resistance sheet column to the 8 th shunt position, moving the 8 th resistance sheet column to the 1 st shunt position, performing one-time current impact according to the method of the step 1, recording the sum of the current of each branch and the current of each branch, namely the total current, and calculating the shunt ratio to sequentially fill the table;
(3) Sequentially moving the positions of the 8 resistor disc columns for 8 times according to the method of the step 2, respectively performing current impact once, recording the sum of the current of each branch and the current of each branch, namely the total current, and calculating the split ratio to sequentially fill the table;
(4) And (3) data arrangement, namely rearranging data according to the positions and the resistor pieces, so as to ensure the duty ratio of the same resistor piece at different positions in the same action, wherein the same row is the duty ratio of the different resistor pieces at the same position. However, the method is thatThen add each row, the sum of the first row is n 1 (k 1 +k 2 +……k 8 ) The sum of the second row is n 2 ((k 1 +k 2 +……k 8 ) And so on, the sum of the eighth row is n 8 ((k 1 +k 2 +……k 8 ). As set forth above, k is considered to be the same for each surge current 1 ……k 8 With little variation, the sum of which is considered to be a constant value, the ratio of 8 rows of sums can be reduced to a constant value, n 1 :n 2 :n 3 :n 4 :n 5 :n 6 :n 7 :n 8 This is the actual shunt value of the resistor disc. Similarly, the sum of the first column is k 1 (n 1 +n 2 +……n 8 ) The sum of the second column is k 2 (n 1 +n 2 +……n 8 ) And so on, the sum of the eighth column is k 8 (n 1 +n 2 +……n 8 ) Then the ratio of the 8 column sums is k 1 :k 2 :k 3 :k 4 :k 5 :k 6 :k 7 :k 8 This is the inherent split ratio of the splitting device.
Specific test
The invention is illustrated by five groups of experiments of operating waves and lightning waves, wherein the test products are resistance cards with the diameter of 85mm, one group of 3 sheets is 8 groups. In order to make the difference of each column obvious, no current sharing adjustment is performed among each group.
1. Taking the test data of the operation wave 500A as an example, the test of 8 rounds is finished, and the test data are shown in a table I (the deep bottom data are the data of the No. 1 resistor disc, and the rest are pushed in the same way):
table one: shunt test results for resistor disc
Calculating the current occupation ratio of each column of resistor disc by using the current calculation sum, and see Table II:
and (II) table: ratio of current of resistor disc
According to the method, in an Excel file, the experimental data position is adjusted by using a calling function, see Table III:
table three: split ratio after position arrangement
As can be seen from fig. 2, 3 and 4, the inherent shunt correction of the device is very accurate with an error below 0.004 under the operating wave waveform. Therefore, the actual shunt ratio has very little error with the calculated shunt ratio, and the error of 8 measurements is also very small, which means that the actual measured values of 8 groups of resistor plates at any position in the shunt device can be fully considered as equivalent actual shunt values.
2. The operation waves 250A and 700A were each tested in the same manner as described above, and the calculated value of the shunt ratio of the resistor sheet at the end of the 8-round test operation wave is shown in fig. 6. At operating waves 250A and 700A, the inherent shunt coefficient error of the device is less than 0.005 and 0.006, respectively. Thus, it can be considered that the set of resistor pads can directly represent the actual shunt value with the measured value under the operation waveform.
3. Taking lightning impulse 1000A as an example, the ratio of 8-time impulse current is shown in fig. 6, and the figure shows that under the condition of lightning impulse, the error of the shunt coefficient is very large, the inherent shunt coefficient of the equipment is also very large, and the data needs to be calibrated and cannot be directly used. Calculating a shunt value according to the calculated resistance card as shown in FIG. 7 and an inherent shunt coefficient of the device under lightning wave as shown in FIG. 8, passing through I i ＝I Total (S) ×n i ×k i Obtaining n i ＝(I i /I Total (S) )/k i (i= … … 8), the actual shunt coefficient can be obtained by using the inherent shunt coefficient of the device, and the calibrated data is matched with the calculated shunt value, so that the method is feasible and effective.
4. The comparison of the calculated values of the shunt coefficient of the resistor sheet before, after and after calibration under the current is shown in fig. 9 by the measurement and calculation of the lightning wave 1000A, and the calibration method is very effective for the shunt device or waveform with larger inherent shunt coefficient of the device.
From the above experiments, it was found that the intrinsic shunt ratio of the device and the shunt ratio of the resistor sheet itself were unchanged under the same waveform and similar impact current. When the device is accurately calibrated and the inherent shunt coefficient is smaller, the shunt result can be directly used without compensation. The experiment shows that the duty ratio shift addition method adopted by the invention is feasible and effective, and particularly has more obvious effect under the condition of larger shunt coefficient.
Claims (3)
1. A multi-column shunt test method for a resistor disc is characterized by comprising the following steps of:
on m branches of the multi-column shunt test equipment, sequentially placing m groups of resistor sheets at shunt positions corresponding to serial numbers in the shunt equipment according to serial numbers, performing primary current impact, recording the sum of current of each branch and current of each branch, namely total current, and calculating a shunt ratio to sequentially fill in a table;
sequentially moving m resistor disc columns, namely moving a 1 st resistor disc column to a 2 nd shunt position, moving a 2 nd resistor disc column to a 3 rd shunt position, … …, moving an m-1 st resistor disc column to an m-th shunt position, moving an m-1 st resistor disc column to a 1 st shunt position, performing primary current impact according to the method of the step (1), recording the sum of current of each branch and current of each branch, namely the total current, and calculating a shunt ratio to sequentially fill a table;
sequentially moving the positions of m resistor disc columns for m times according to the method of the step (2), respectively performing current impact once, recording the sum of the current of each branch and the current of each branch, namely the total current, and calculating the split ratio to sequentially fill the table;
step (4) data arrangement, namely rearranging data according to the positions and the resistor sheets, and ensuring the current occupation ratio of the same resistor sheet in different positions in the same behavior, wherein the same row is the current occupation ratio of the same resistor sheet in the same position; then adding each row, wherein the ratio of the sum value of each row is the actual shunt ratio of the resistor disc; the ratio of the sum value of each column is the inherent shunt ratio of the shunt device, added for each column.
2. The multi-column shunt test method of resistive sheet according to claim 1, wherein the calculation method of step (1) is that on m branches of the multi-column shunt test device, the current of each branch should be 1/m in total current ratio under ideal condition; the inherent split ratio of the equipment is set to be k, and the inherent split ratio of each branch is set to be k 1 ……k m The method comprises the steps of carrying out a first treatment on the surface of the Selecting m resistor columns, wherein the split ratio of the m resistor columns under the same impact current is set as n under the condition of not considering the influence of equipment errors, and the split ratio of the m resistor columns is set as n 1 ....n m The inherent shunt ratio k of the device and the shunt ratio n of the resistor disc per se are unchanged under the same waveform and similar impact current; the total current per impact is set as I Total (S) Branch current is I 1 ....I m Then:
I 1 =I total (S) ×n 1 ×k 1 n 1 ×k 1 =I 1 /I Total (S)
I 2 =I Total (S) ×n 2 ×k 2 n 2 ×k 2 =I 2 /I Total (S)
…………
I m =I Total (S) ×n m ×k m n m ×k m =I m /I Total (S) 。
3. The method of multi-column shunt test of resistive sheet according to claim 1, wherein said method of data sorting of step (4) adds up each row, the sum of the first row being n 1 The sum of the second row is n 2 … …, sum of m-th row n m The method comprises the steps of carrying out a first treatment on the surface of the As set forth above, k corresponds to a certain row in the case where the difference in current per impact is not large 1 ……k m With little variation, the sum of which is considered to be a constant value, the ratio of m rows of sums can be reduced by a constant value, n 1 :n 2 :……:n m This is the actual shunt value of the resistor disc; similarly, for each column, the sum of the first columns is k 1 The sum of the second column is k 2 The sum of column m is k m The ratio of the sum of m columns is k 1 :k 2 :……:k m This is the inherent split ratio of the splitting device.
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| ±800kV特高压直流换流站EM避雷器工况分析及其关键技术的研究;胡淑慧;赵冬一;赵峥;黄勇;张永耀;厍海波;;电瓷避雷器(04);全文 * |
| 1000kV瓷外套MOA电位分布计算与试验;赵宇;马文玲;窦小晶;王琼;张源斌;;高电压技术(01);全文 * |
| 110kV整只氧化锌避雷器雷电冲击老化特性研究;林楚标;廖永力;李锐海;李盛涛;王辉;高超;何锦强;;南方电网技术(07);全文 * |
| 氧化锌避雷器设备缺陷的带电检测有效性试验研究;史志强;中国优秀硕士学位论文全文数据库工程科技Ⅱ辑;全文 * |
| 额定电压780kV特高压交流避雷器电位分布计算与测量;王陆璐;熊易;汤霖;左中秋;陈曦;;电瓷避雷器(04);全文 * |
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