CN112285444A - Terahertz electric field measuring method, system and device - Google Patents
Terahertz electric field measuring method, system and device Download PDFInfo
- Publication number
- CN112285444A CN112285444A CN202011024321.7A CN202011024321A CN112285444A CN 112285444 A CN112285444 A CN 112285444A CN 202011024321 A CN202011024321 A CN 202011024321A CN 112285444 A CN112285444 A CN 112285444A
- Authority
- CN
- China
- Prior art keywords
- light
- laser
- pump light
- terahertz
- electric field
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005684 electric field Effects 0.000 title claims abstract description 51
- 238000000034 method Methods 0.000 title claims abstract description 16
- 239000000523 sample Substances 0.000 claims abstract description 39
- 238000005259 measurement Methods 0.000 claims abstract description 36
- 230000008878 coupling Effects 0.000 claims abstract description 18
- 238000010168 coupling process Methods 0.000 claims abstract description 18
- 238000005859 coupling reaction Methods 0.000 claims abstract description 18
- 238000001675 atomic spectrum Methods 0.000 claims abstract description 14
- 230000009471 action Effects 0.000 claims abstract description 9
- TVFDJXOCXUVLDH-UHFFFAOYSA-N caesium atom Chemical compound [Cs] TVFDJXOCXUVLDH-UHFFFAOYSA-N 0.000 claims description 27
- 238000001514 detection method Methods 0.000 claims description 17
- 230000007704 transition Effects 0.000 claims description 14
- 230000005281 excited state Effects 0.000 claims description 9
- 230000003321 amplification Effects 0.000 claims description 7
- 239000013078 crystal Substances 0.000 claims description 7
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 7
- 238000000691 measurement method Methods 0.000 claims description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 3
- 239000006096 absorbing agent Substances 0.000 claims description 3
- 229910052792 caesium Inorganic materials 0.000 claims description 3
- 150000001340 alkali metals Chemical group 0.000 abstract description 6
- 239000007789 gas Substances 0.000 description 34
- 238000010586 diagram Methods 0.000 description 9
- 230000005540 biological transmission Effects 0.000 description 6
- 230000003287 optical effect Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 230000005284 excitation Effects 0.000 description 4
- 238000003384 imaging method Methods 0.000 description 3
- 238000001228 spectrum Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 2
- 238000007664 blowing Methods 0.000 description 2
- 230000001066 destructive effect Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000005672 electromagnetic field Effects 0.000 description 2
- 230000005674 electromagnetic induction Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 230000005283 ground state Effects 0.000 description 2
- 230000007935 neutral effect Effects 0.000 description 2
- 239000013307 optical fiber Substances 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 238000005481 NMR spectroscopy Methods 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 238000005034 decoration Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000704 physical effect Effects 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 238000005086 pumping Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 230000002269 spontaneous effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
- G01R29/14—Measuring field distribution
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention provides a terahertz electric field measuring method, system and device. The method comprises the steps that a first laser system emits primary pump light and probe light; the second laser system emits high-power pump light; generating coupled light based on the high-power pump light; reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light; acting a terahertz source on an atomic gas chamber; the electric field of the terahertz source is measured by detecting the atomic spectrum of the rydberg atoms. The invention can prepare alkali metal atoms to a Reedberg state, and realizes the electric field measurement of sub-THz wave and THz wave radio frequency fields. The method for measuring the EIT of the Reidberg does not need a cold atom vacuum system under the action of laser, can be operated at room temperature, has the advantages of wide measurement range, small and portable experimental device and the like, is more practical, and realizes the precise measurement of the multi-wave frequency of the THz frequency band.
Description
Technical Field
The invention relates to the field of quantum precision measurement, in particular to a terahertz electric field measurement method, a system and a device.
Background
In the electromagnetic spectrum of various frequency bands, compared with microwave, X-ray and nuclear magnetic resonance detection, THz detection can give not only the density information of an object but also physical property information such as dielectric constant, refractive index, absorption coefficient and the like. Due to the special properties of THz, the THz technology has great scientific research value and application prospect in many aspects such as object imaging, medical diagnosis, military radar and the like. Compared to traditional electromagnetic wave imaging, many characteristics of THz waves make them very suitable for imaging applications.
The existing terahertz electric field measurement technology mainly measures the THz electric field through a terahertz electro-optic crystal terahertz detector, and the terahertz electric field changes the refractive index of the GaP electro-optic crystal, so that terahertz detection is realized.
Disclosure of Invention
The technical problem solved by the invention is as follows: the defects of the prior art are overcome, and the terahertz electric field measuring method, system and device are provided.
In order to solve the technical problem, the invention provides a terahertz electric field measuring method, which comprises the following steps:
the first laser system emits primary pump light and probe light;
the second laser system emits high-power pump light;
generating coupled light based on the high-power pump light;
reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light;
acting a terahertz source on the atomic gas chamber;
and measuring the electric field of the terahertz source by detecting the atomic spectrum of the rydberg atoms.
Optionally, the first laser system is a 852nm laser system; the first laser system emits primary pump light and probe light, and comprises:
and generating primary pump light and probe light acting on the atomic transition line by the 852nm laser system.
Optionally, the second laser system includes a 1020nm laser system and an amplifying system, and the second laser system emits a high-power pump light, including:
generating high-power pump light by the 1020nm laser system and the amplifying system;
the pump light based on the high power generates coupled light, including:
and generating 510nm coupled light acting on the excited state to the rydberg state based on the pump light through a frequency doubling system.
In order to solve the above technical problem, the present invention further provides a terahertz electric field measurement system, including:
the terahertz electric field measurement system includes: the system comprises a first laser system, a second laser system, an amplification system, a frequency doubling system, a cesium primary gas chamber, a laser detection system and a terahertz source;
the first laser system is used for emitting primary pump light and probe light;
the second laser system and the amplifying system generate high-power pump light;
the frequency doubling system generates coupling light acting from an excited state to a Reedberg state based on the high-power pump light;
reversely leading the primary pump light, the detection light and the coupling light to enter a cesium atom gas chamber to prepare a Reidberg atom;
acting a terahertz source on the atomic gas chamber;
and detecting the atomic spectrum of the Reedberg atoms by the laser detection system to measure the electric field of the terahertz source.
Optionally, the second laser system is a 1020nm laser system;
generating high-power pump light by the 1020nm laser system and the amplification system;
by means of a frequency doubling system, 510nm coupled light acting on the excited to the rydberg state is generated.
Optionally, the first laser system is a 852nm laser system, and the 852nm laser system includes a 852nm laser, an EOM electro-optical modulator, and a 852nm saturable absorber device, for locking the 852nm laser onto a corresponding atomic transition line.
Optionally, the frequency doubling system is characterized in that PPKTP linearly-polarized crystals are added into the standing wave field.
Optionally, the cesium atom gas chamber is a cuboid hollow structure made of quartz glass;
electrodes are arranged on the upper surface and the lower surface of the cesium atom gas chamber;
the cesium atom gas chamber has a cesium atom gas and a buffer gas inside.
Optionally, the laser detection system is a 852nm avalanche photodetector.
Optionally, the terahertz source comprises a terahertz generator and a terahertz horn antenna.
In order to solve the above technical problem, the present invention further provides a terahertz electric field measurement system apparatus, including:
the first emitting module is used for emitting primary pump light and probe light by the first laser system;
the second emitting module is used for emitting high-power pump light by the second laser system;
a generating module for generating coupled light based on the high-power pump light;
the preparation module is used for reversely entering the atomic gas chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light;
the action module is used for acting the terahertz source on the atomic gas chamber;
and the measuring module is used for measuring the electric field of the terahertz source by detecting the atomic spectrum of the rydberg atoms.
Compared with the prior art, the invention has the advantages that:
according to the scheme provided by the embodiment of the invention, primary pump light and probe light are emitted by a first laser system; the second laser system emits high-power pump light; generating coupled light based on the high-power pump light; reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light; acting a terahertz source on an atomic gas chamber; the electric field of the terahertz source is measured by detecting the atomic spectrum of the rydberg atoms. The invention can prepare alkali metal atoms to a Reedberg state, and realizes the electric field measurement of sub-THz wave and THz wave radio frequency fields. The method for measuring the EIT of the Reidberg does not need a cold atom vacuum system under the action of laser, can be operated at room temperature, has the advantages of wide measurement range, small and portable experimental device and the like, is more practical, and realizes the precise measurement of the multi-wave frequency of the THz frequency band.
Drawings
Fig. 1 is a flowchart illustrating steps of a terahertz electric field measurement method according to an embodiment of the present invention;
FIG. 2 is a schematic structural diagram of a terahertz electric field measurement system provided by an embodiment of the present invention;
FIG. 3 is an atomic energy level transition diagram provided by an embodiment of the present invention;
FIG. 4 is a diagram of a frequency doubling system for generating 510nm laser by 1020nm laser according to an embodiment of the present invention;
FIG. 5 is a schematic view of an atomic gas cell with electrodes provided by an embodiment of the present invention;
fig. 6 is a schematic structural diagram of a terahertz electric field measuring apparatus provided in an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1, a flowchart illustrating steps of a terahertz electric field measurement method provided by an embodiment of the present invention is shown, and as shown in fig. 1, the method may specifically include the following steps:
step 110: the first laser system emits primary pump light and probe light.
The first laser system is a 852nm laser system; the first laser system emits primary pump light and probe light.
In a specific implementation manner of the present invention, the step 110 may include:
substep A1: and generating primary pump light and probe light acting on the atomic transition line by the 852nm laser system.
Locking system by 852nm laser and 852nm laser wavelength corresponding to 133Cs atoms D2Line 6S1/2-6P3/2(F' ═ 3,4,5) transitions.
Step 120: the second laser system emits pump light of high power.
The second laser system comprises a 1020nm laser system and an amplifying system, and the second laser system emits high-power pump light.
In a specific implementation manner of the present invention, the step 120 may include:
substep B1: by means of the 1020nm laser system and the amplification system, high-power pump light is generated.
Step 130: coupled light is generated based on the high-power pump light.
In a specific implementation manner of the present invention, the step 130 may include:
substep C1: and generating 510nm coupled light acting on the excited state to the rydberg state based on the pump light through a frequency doubling system.
Step 140: and reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light.
In a laser, external energy is typically input into a lasing medium in the form of light or current to excite electrons in the ground state to a higher energy level state.
The rydberg state is a quantum state in which an electron in an atom or molecule is excited to a higher principal number n due to its larger electric dipole moment and highThe polarizability is very sensitive to external fields, and the quantum state coherent control of the particles is easily realized through external field tuning of electric fields, magnetic fields, microwave radiation and the like. The lifetime of the rydberg state atoms is long, the probability of spontaneous transition is small, the lifetime of the state is in direct proportion, and the energy level interval of the rydberg atoms is small (n)*-3) The method is in a radio frequency wave band, the radio frequency field can be coupled with the rydberg atoms, the interaction of the rydberg atoms can be regulated and controlled by the radio frequency field, and a novel technology for measuring the field intensity of the microwave field is provided.
The 1020nm laser frequency range is 1018nm-1022nm, the external cavity continuous scanning range is larger (> 2GHz), 1020nm laser of 10mW is output by the seed laser, and the 1020nm laser is input into the 1020nm optical fiber amplifier through the optical isolator, and the 1020nm narrow-line width laser with the power of 5W and capable of being continuously tuned can be obtained. 1020nm laser is frequency-doubled by designing a two-mirror standing wave cavity to obtain hundred milliwatt 510nm laser to act on 6P3/2(F′＝5)-nS1/2And realizing the Reedberg transition.
Step 150: and acting a terahertz source on the atomic gas chamber.
The frequency of the terahertz source is 210-220GHz, the central frequency is 215GHz, the intensity is 10mW, and the terahertz source is aligned to the cesium atom gas chamber through the horn antenna.
The cesium atom gas chamber is specially designed into a cuboid shape, so that the deformation of cesium-bulb glass caused by a traditional blowing mode is reduced, and the optical effect is influenced. And the cuboid planar structure is beneficial to adding electrodes, and the precise measurement of THz multi-wave frequency is realized.
Step 160: and measuring the electric field of the terahertz source by detecting the atomic spectrum of the rydberg atoms.
The THz wave has sufficient time to ionize it; and secondly, the natural width of the rydberg atomic spectral line is narrow, the resonance width of the spectral line is mainly determined by the Doppler width or the width of an excitation light source, the peak wavelength corresponding to the ionization probability is narrow, and the THz detection of specific frequency can be realized. The preparation of neutral atom rydberg state can be realized by utilizing multi-photon excitation, the quantum state of the neutral atom rydberg state is sensitive to an electromagnetic field, and the spectrum splitting caused by the coupling of the rydberg state atom and an environmental electromagnetic field can be detected by an electromagnetic induction transparency (or Autler-Townes effect) based spectrum technology, so that the precise measurement of the microwave field is realized. Therefore, through the research of the invention, alkali metal atoms are prepared to be in a rydberg state, and the electric field measurement of sub-THz wave and THz wave radio frequency fields is realized. The method for measuring the EIT of the Reidberg does not need a cold atom vacuum system under the action of laser, can be operated at room temperature, has the advantages of wide measurement range, small and portable experimental device and the like, and is more practical.
According to the scheme provided by the embodiment of the invention, primary pump light and probe light are emitted by a first laser system; the second laser system emits high-power pump light; generating coupled light based on the high-power pump light; reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light; acting a terahertz source on an atomic gas chamber; the electric field of the terahertz source is measured by detecting the atomic spectrum of the rydberg atoms. The invention can prepare alkali metal atoms to a Reedberg state, and realizes the electric field measurement of sub-THz wave and THz wave radio frequency fields. The method for measuring the EIT of the Reidberg does not need a cold atom vacuum system under the action of laser, can be operated at room temperature, has the advantages of wide measurement range, small and portable experimental device and the like, is more practical, and realizes the precise measurement of the multi-wave frequency of the THz frequency band.
Referring to fig. 2, a terahertz electric field measurement system provided by an embodiment of the invention is shown.
As shown in fig. 2, the terahertz electric field measurement system includes:
a first laser system 201, a second laser system 202, an amplifying system 203, a frequency doubling system 204, a cesium primary gas chamber 205, a laser detection system 206 and a terahertz source 207; the first laser system 201 is used for emitting primary pump light and probe light; the second laser system 202 and the amplification system 203 (not shown in fig. 2) generate high-power pump light; the frequency doubling system 204 generates coupled light acting from an excited state to a rydberg state based on the high-power pump light; reversely allowing the primary pump light, the probe light and the coupling light to enter a cesium atom gas chamber 205 to prepare a rydberg atom; applying a terahertz source 207 to the cesium atom gas chamber 205; the electric field of the terahertz source 207 is measured by detecting the atomic spectrum of the rydberg atoms by the laser detection system 206.
A510 nm high-reflection 852nm high-transmission lens is arranged between the laser detection system 206 and the frequency doubling system 204.
Locking system by 852nm laser and 852nm laser wavelength corresponding to 133Cs atoms D2 line 6S1/2-6P3/2(F' ═ 3,4,5) transitions.
The 1020nm laser frequency range is 1018nm-1022nm, the external cavity continuous scanning range is larger (> 2GHz), 1020nm laser of 10mW is output by the seed laser, and the 1020nm laser is input into the 1020nm optical fiber amplifier through the optical isolator, and the 1020nm narrow-line width laser with the power of 5W and capable of being continuously tuned can be obtained. 1020nm laser is frequency-doubled by designing a two-mirror standing wave cavity to obtain hundred milliwatt 510nm laser to act on 6P3/2(F′＝5)-nS1/2And realizing the Reedberg transition.
The frequency of the THz source is 210-220GHz, the central frequency is 215GHz, the intensity is 10mW, and the THz source is aligned to the cesium atom gas chamber through a horn antenna. The cesium atom gas chamber is specially designed into a cuboid shape, so that the deformation of cesium-bulb glass caused by a traditional blowing mode is reduced, and the optical effect is influenced. And the cuboid planar structure is beneficial to adding electrodes, and the precise measurement of THz multi-wave frequency is realized.
The second laser system 202 is a 1020nm laser system.
Generating high-power pump light by the 1020nm laser system and the amplifying system 203; the 510nm coupled light acting on the excited to the rydberg state is generated by the frequency doubling system 204.
The first laser system 201 is a 852nm laser system; the 852nm laser system includes a 852nm laser, an EOM electro-optic modulator, and a 852nm saturable absorber device for locking the 852nm laser onto a corresponding atomic transition line.
The frequency doubling system 204 is formed by adding PPKTP linear polarization crystal into a standing wave field.
The cesium atom gas chamber 205 is a cuboid hollow structure made of quartz glass; electrodes are arranged on the upper surface and the lower surface of the cesium atom gas chamber 205; the cesium atom gas chamber 205 has a cesium atom gas and a buffer gas therein.
The laser detection system 206 is a 852nm avalanche photodetector.
The terahertz source 207 comprises a terahertz generator and a terahertz horn antenna.
The frequency of the terahertz source is 210-220GHz, the central frequency is 215GHz, the intensity is 10mW, and the terahertz source is aligned to the cesium atom gas chamber through the horn antenna.
As shown in FIG. 3, it is an atomic level transition diagram, using 852nm optical field as the detecting light frequency and |1>To |2>By making the ground state atoms to an excited state (from | 1)>To |2>) (ii) a 1020nm laser light after passing through the frequency doubling cavity produces 510nm light as coupled light, and the addition of the 510nm intense light results in |2>To |3>The excited state atoms are prepared to the rydberg state (from | 2)>To |3>) From |1>The excitation amplitudes to the two decorated states would be opposite, resulting in destructive quantum interference on the two excitation paths. Therefore, a transparent window is opened for the probe light, i.e., the probe light transmission is enhanced, which is called electromagnetic-induced transparency (EIT-electromagnetic-induced transparency). The THz wave excites atoms of the rydberg state to further rydberg states. If properly selected |3>And |4>Can be coupled in the microwave field |3>And |4>. A third decoration state is introduced into EIT, which results in destructive interference of the detection light absorption. This splits the EIT resonance into two, the new maximum transmission value being determined by the draw ratio frequency omega of the microwave field for the resonant drive fieldMWAnd (6) determining. This is the AT splitting effect of the EIT signal, which is related to the field fed in so that the electric field strength can be measured.
When 510nm frequency doubling light is prepared, a two-mirror standing wave cavity with low power consumption is selected, so that the energy of a pumping light source is fully utilized. The schematic diagram of the two-mirror standing wave cavity is shown in fig. 4, is a frequency doubling system diagram for generating 510nm laser by 1020nm laser, and consists of a plane mirror (M1) and a plane concave mirror (M2), wherein the plane mirror M1 is an input coupling mirror, and requires a certain transmittance in a fundamental frequency light band to ensure impedance matching of the frequency doubling cavity, and in an experiment, the transmittance of M1 in the 1020nm band is 6%. The back surface of the mirror M2 is glued with a hollow piezo-ceramic for locking of the feedback system. M2 needs to output 510nm frequency doubling laser, 1020nm laser high reflection mirror (the reflectivity to 1020nm laser is 99.99%), and high transmission to 510nm laser (the transmission to 509nm laser is 99.9%). The PPLN crystal is easy to generate photorefractive loss at room temperature, so that a frequency doubling cavity is built based on the PPKTP crystal in an experiment and is used for 1020nm laser frequency doubling to realize 510nm laser.
As shown in fig. 5, which is a schematic diagram of an atomic gas chamber with electrodes, 852nm probe light is focused by a lens, and then propagates in the opposite direction to the 510nm coupled light focused by the lens to act on a cesium atom sample, inert gas is filled in the cesium atom gas chamber with electrodes, voltage is applied through an electrode plate (+), and an electrode plate (-) without adding THz wave, an EIT transmission peak with a three-level structure can be detected, when the THz wave is added, the rydberg atom interacts with the THz wave, so that the electromagnetic induction transparency condition is destroyed, and the probe light is strongly absorbed by the sample atoms to form the EIT transmission peak.
According to the scheme provided by the embodiment of the invention, primary pump light and probe light are emitted by a first laser system; the second laser system emits high-power pump light; generating coupled light based on the high-power pump light; reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light; acting a terahertz source on an atomic gas chamber; the electric field of the terahertz source is measured by detecting the atomic spectrum of the rydberg atoms. The invention can prepare alkali metal atoms to a Reedberg state, and realizes the electric field measurement of sub-THz wave and THz wave radio frequency fields. The method for measuring the EIT of the Reidberg does not need a cold atom vacuum system under the action of laser, can be operated at room temperature, has the advantages of wide measurement range, small and portable experimental device and the like, is more practical, and realizes the precise measurement of the multi-wave frequency of the THz frequency band.
Referring to fig. 6, a structural block diagram of a terahertz electric field measuring apparatus provided by an embodiment of the present invention is shown.
As shown in fig. 6, the terahertz electric field measuring apparatus includes: a first emitting module 301, configured to emit primary pump light and probe light by a first laser system; a second emitting module 302, configured to emit high-power pump light by a second laser system; a generating module 303, configured to generate coupled light based on the high-power pump light; the preparation module 304 is configured to reversely enter the atomic gas chamber to prepare the rydberg atoms based on the primary pump light, the probe light and the coupling light; an action module 305 for acting a terahertz source on the atomic gas chamber; a measurement module 306 for measuring an electric field of the terahertz source by detecting an atomic spectrum of the rydberg atoms.
Optionally, the first laser system is a 852nm laser system; the first launch module is specifically configured to: and generating primary pump light and probe light acting on the atomic transition line by the 852nm laser system.
Optionally, the second laser system includes a 1020nm laser system and an amplifying system, and the second emission module is specifically configured to:
generating high-power pump light by the 1020nm laser system and the amplifying system;
the generation module is specifically configured to:
and generating 510nm coupled light acting on the excited state to the rydberg state based on the pump light through a frequency doubling system.
According to the scheme provided by the embodiment of the invention, primary pump light and probe light are emitted by a first laser system; the second laser system emits high-power pump light; generating coupled light based on the high-power pump light; reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light; acting a terahertz source on an atomic gas chamber; the electric field of the terahertz source is measured by detecting the atomic spectrum of the rydberg atoms. The invention can prepare alkali metal atoms to a Reedberg state, and realizes the electric field measurement of sub-THz wave and THz wave radio frequency fields. The method for measuring the EIT of the Reidberg does not need a cold atom vacuum system under the action of laser, can be operated at room temperature, has the advantages of wide measurement range, small and portable experimental device and the like, is more practical, and realizes the precise measurement of the multi-wave frequency of the THz frequency band.
Those skilled in the art will appreciate that those matters not described in detail in the present specification are well known in the art.
Claims (11)
1. A terahertz electric field measurement method is characterized by comprising the following steps:
the first laser system emits primary pump light and probe light;
the second laser system emits high-power pump light;
generating coupled light based on the high-power pump light;
reversely entering an atom air chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light;
acting a terahertz source on the atomic gas chamber;
and measuring the electric field of the terahertz source by detecting the atomic spectrum of the rydberg atoms.
2. The method of claim 1, wherein the first laser system is a 852nm laser system; the first laser system emits primary pump light and probe light, and comprises:
and generating primary pump light and probe light acting on the atomic transition line by the 852nm laser system.
3. The method of claim 1, wherein the second laser system comprises a 1020nm laser system and an amplification system, the second laser system emitting high power pump light, comprising:
generating high-power pump light by the 1020nm laser system and the amplifying system;
the pump light based on the high power generates coupled light, including:
and generating 510nm coupled light acting on the excited state to the rydberg state based on the pump light through a frequency doubling system.
4. A terahertz electric field measurement system, comprising: the system comprises a first laser system, a second laser system, an amplification system, a frequency doubling system, a cesium primary gas chamber, a laser detection system and a terahertz source;
the first laser system is used for emitting primary pump light and probe light;
the second laser system and the amplifying system generate high-power pump light;
the frequency doubling system generates coupling light acting from an excited state to a Reedberg state based on the high-power pump light;
reversely leading the primary pump light, the detection light and the coupling light to enter a cesium atom gas chamber to prepare a Reidberg atom;
acting a terahertz source on the cesium atom gas chamber;
and detecting the atomic spectrum of the Reedberg atoms by the laser detection system to measure the electric field of the terahertz source.
5. The terahertz electric field measurement system of claim 4, wherein the second laser system is a 1020nm laser system;
generating high-power pump light by the 1020nm laser system and the amplification system;
by means of a frequency doubling system, 510nm coupled light acting on the excited to the rydberg state is generated.
6. The terahertz electric field measurement system of claim 4, wherein the first laser system is a 852nm laser system;
the 852nm laser system includes a 852nm laser, an EOM electro-optic modulator, and a 852nm saturable absorber device for locking the 852nm laser onto a corresponding atomic transition line.
7. The terahertz electric field measuring system of claim 4, wherein the frequency doubling system is a PPKTP linearly polarized crystal added in the standing wave field.
8. The terahertz electric field measurement system according to claim 4, wherein the cesium atom gas chamber is a cuboid-packed hollow structure made of quartz glass;
electrodes are arranged on the upper surface and the lower surface of the cesium atom gas chamber;
the cesium atom gas chamber has a cesium atom gas and a buffer gas inside.
9. The terahertz electric field measurement system of claim 4, wherein the laser detection system is a 852nm avalanche photodetector.
10. The terahertz electric field measurement system of claim 3, wherein the terahertz source comprises a terahertz generator and a terahertz horn antenna.
11. A terahertz electric field measurement system apparatus, comprising:
the first emitting module is used for emitting primary pump light and probe light by the first laser system;
the second emitting module is used for emitting high-power pump light by the second laser system;
a generating module for generating coupled light based on the high-power pump light;
the preparation module is used for reversely entering the atomic gas chamber to prepare the Reedberg atoms based on the primary pump light, the probe light and the coupling light;
the action module is used for acting the terahertz source on the atomic gas chamber;
and the measuring module is used for measuring the electric field of the terahertz source by detecting the atomic spectrum of the rydberg atoms.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011024321.7A CN112285444A (en) | 2020-09-25 | 2020-09-25 | Terahertz electric field measuring method, system and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011024321.7A CN112285444A (en) | 2020-09-25 | 2020-09-25 | Terahertz electric field measuring method, system and device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112285444A true CN112285444A (en) | 2021-01-29 |
Family
ID=74421248
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011024321.7A Pending CN112285444A (en) | 2020-09-25 | 2020-09-25 | Terahertz electric field measuring method, system and device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112285444A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113219223A (en) * | 2021-03-15 | 2021-08-06 | 北京航空航天大学 | Totally-enclosed rectangular terahertz darkroom |
| CN113405988A (en) * | 2021-05-14 | 2021-09-17 | 清远市天之衡量子科技有限公司 | Terahertz imaging method and system based on atomic gas chamber |
| CN117309768A (en) * | 2023-11-28 | 2023-12-29 | 中北大学 | Preparation method and application of ultra-bandwidth terahertz detection-oriented micro atomic gas chamber |
| US11940374B2 (en) | 2021-01-21 | 2024-03-26 | Honeywell International Inc. | Continuous tunable RF sensor using rydberg atoms with high transmissivity |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103644970A (en) * | 2013-12-18 | 2014-03-19 | 河南师范大学 | Rydberg atom terahertz wave detection system |
| CN107121593A (en) * | 2017-04-20 | 2017-09-01 | 山西大学 | The measuring method of rf electric field frequency based on Rydberg atom quantum coherence effect |
| CN107528626A (en) * | 2017-08-30 | 2017-12-29 | 西安空间无线电技术研究所 | A kind of millimeter wave and Terahertz orbital angular momentum wave beam produces and conversion method |
| CN109163815A (en) * | 2018-09-28 | 2019-01-08 | 华南师范大学 | A kind of millimeter wave detection method and device |
| CN110401492A (en) * | 2018-07-27 | 2019-11-01 | 中国计量科学研究院 | A kind of radio amplitude-modulated signal method of reseptance and amplitude modulation Quantum receiver based on quantum effect |
| US20190339586A1 (en) * | 2018-05-07 | 2019-11-07 | National University Of Singapore | Continuous-wave terahertz generation via optically pumped rydberg states |
| CN110440919A (en) * | 2019-06-18 | 2019-11-12 | 华南师范大学 | A kind of real-time Terahertz Near-Field Radar Imaging method and device of two dimension |
| CN110488265A (en) * | 2019-07-08 | 2019-11-22 | 清远市天之衡传感科技有限公司 | Radar velocity measurement system and method based on the transparent effect of Rydberg atom electromagnetically induced |
| WO2020070470A1 (en) * | 2018-10-04 | 2020-04-09 | The University Of Durham | Method and apparatus for terahertz or microwave imaging |
| CN111308228A (en) * | 2020-01-15 | 2020-06-19 | 中国科学院大学 | Method and device for improving microwave electric field intensity measurement signal-to-noise ratio through Zeeman frequency modulation |
-
2020
- 2020-09-25 CN CN202011024321.7A patent/CN112285444A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103644970A (en) * | 2013-12-18 | 2014-03-19 | 河南师范大学 | Rydberg atom terahertz wave detection system |
| CN107121593A (en) * | 2017-04-20 | 2017-09-01 | 山西大学 | The measuring method of rf electric field frequency based on Rydberg atom quantum coherence effect |
| CN107528626A (en) * | 2017-08-30 | 2017-12-29 | 西安空间无线电技术研究所 | A kind of millimeter wave and Terahertz orbital angular momentum wave beam produces and conversion method |
| US20190339586A1 (en) * | 2018-05-07 | 2019-11-07 | National University Of Singapore | Continuous-wave terahertz generation via optically pumped rydberg states |
| CN110401492A (en) * | 2018-07-27 | 2019-11-01 | 中国计量科学研究院 | A kind of radio amplitude-modulated signal method of reseptance and amplitude modulation Quantum receiver based on quantum effect |
| CN109163815A (en) * | 2018-09-28 | 2019-01-08 | 华南师范大学 | A kind of millimeter wave detection method and device |
| WO2020070470A1 (en) * | 2018-10-04 | 2020-04-09 | The University Of Durham | Method and apparatus for terahertz or microwave imaging |
| CN110440919A (en) * | 2019-06-18 | 2019-11-12 | 华南师范大学 | A kind of real-time Terahertz Near-Field Radar Imaging method and device of two dimension |
| CN110488265A (en) * | 2019-07-08 | 2019-11-22 | 清远市天之衡传感科技有限公司 | Radar velocity measurement system and method based on the transparent effect of Rydberg atom electromagnetically induced |
| CN111308228A (en) * | 2020-01-15 | 2020-06-19 | 中国科学院大学 | Method and device for improving microwave electric field intensity measurement signal-to-noise ratio through Zeeman frequency modulation |
Non-Patent Citations (1)
| Title |
|---|
| 樊佳蓓: "Rydberg原子的微波电磁感应透明-Autler-Townes光谱", 《物理学报》, vol. 67, no. 9, pages 1 - 6 * |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11940374B2 (en) | 2021-01-21 | 2024-03-26 | Honeywell International Inc. | Continuous tunable RF sensor using rydberg atoms with high transmissivity |
| CN113219223A (en) * | 2021-03-15 | 2021-08-06 | 北京航空航天大学 | Totally-enclosed rectangular terahertz darkroom |
| CN113405988A (en) * | 2021-05-14 | 2021-09-17 | 清远市天之衡量子科技有限公司 | Terahertz imaging method and system based on atomic gas chamber |
| CN117309768A (en) * | 2023-11-28 | 2023-12-29 | 中北大学 | Preparation method and application of ultra-bandwidth terahertz detection-oriented micro atomic gas chamber |
| CN117309768B (en) * | 2023-11-28 | 2024-02-20 | 中北大学 | Preparation method and application of ultra-bandwidth terahertz detection-oriented micro atomic gas chamber |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN112285444A (en) | Terahertz electric field measuring method, system and device | |
| Hänsch et al. | Two-photon spectroscopy of Na 3s-4d without Doppler broadening using a cw dye laser | |
| Minck et al. | Nonlinear optics | |
| Zhao et al. | Microwave induced transparency in ruby | |
| Zibrov et al. | Observation of a three-photon electromagnetically induced transparency in hot atomic vapor | |
| US11303086B1 (en) | Generating radio frequency electromagnetic radiation | |
| Buchmann et al. | High-power few-cycle THz generation at MHz repetition rates in an organic crystal | |
| CN100438237C (en) | Broad band TH2 light generator | |
| Peters et al. | Frequency‐comb spectroscopy of the hydrogen 1S‐3S and 1S‐3D transitions | |
| Hayashi et al. | High-brightness continuously tunable narrowband subterahertz wave generation | |
| CN108803194B (en) | Terahertz wave internal modulation device | |
| JP2006091802A (en) | Device and method for terahertz electromagnetic wave generation | |
| Bjorkholm | Analysis of the doubly resonant optical parametric oscillator without power-dependent reflections | |
| Matsuoka et al. | Optical Second-Harmonic Generation in Gases:" Rotation" of Quadrupole Moment in Magnetic Field | |
| Chebotayev et al. | Application of LiF crystals with F 2− colour centers | |
| Joubert et al. | A new microwave resonant technique for studying rare earth photoionization thresholds in dielectric crystals under laser irradiation | |
| Chen et al. | A high-peak-power orthogonally-polarized multi-wavelength laser at 1.6-1.7 µm based on the cascaded nonlinear optical frequency conversion | |
| Skvortsov et al. | Optical frequency standard based on a Nd: YAG laser stabilised by saturated absorption resonances in molecular iodine using second-harmonic radiation | |
| Wang et al. | Populations of B 2 Σ u+ and X 2 Σ g+ electronic states of molecular nitrogen ions in air determined by fluorescence measurement | |
| US3982136A (en) | Ternary ferroelectric fluoride nonlinear devices | |
| Li et al. | Frequency Chirped Intensity Modulated Mid-Infrared Light Source Based on Optical Parametric Oscillation | |
| Lin | Study of a dielectric internal laser accelerating structure | |
| Ashburn | Bibliography of the open literature on lasers | |
| RU2797691C1 (en) | Fiber optical quantum sweep generator with positive distributed feedback | |
| Gong et al. | Terahertz spectroscopy technology trend using 1550‐nm ultrafast fiber laser |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |