CN112284552B - Method for rapidly judging normal refrigerating temperature of refrigerating type linear infrared detector - Google Patents
Method for rapidly judging normal refrigerating temperature of refrigerating type linear infrared detector Download PDFInfo
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- CN112284552B CN112284552B CN202010943097.5A CN202010943097A CN112284552B CN 112284552 B CN112284552 B CN 112284552B CN 202010943097 A CN202010943097 A CN 202010943097A CN 112284552 B CN112284552 B CN 112284552B
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- temperature
- infrared detector
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- refrigerating
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- 238000000034 method Methods 0.000 title claims abstract description 12
- 238000005057 refrigeration Methods 0.000 claims description 41
- 230000002159 abnormal effect Effects 0.000 claims description 6
- 238000001514 detection method Methods 0.000 abstract description 3
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention relates to a method for rapidly judging whether the refrigerating temperature of a refrigerating line array infrared detector is normal, which rapidly judges whether the refrigerating temperature of the infrared detector is normal or not by presetting the temperature of the infrared detector according to the characteristic that the refrigerating temperature of the refrigerating line array infrared detector is continuously reduced in a normal working state, and shortens the whole detection process to two minutes, and compared with the original 6-8 minutes, the time for judging whether the refrigerating temperature of the infrared detector is normal or not is effectively shortened.
Description
Technical Field
The invention belongs to the technical field of infrared detectors, and relates to a method for rapidly judging whether the refrigeration temperature of a refrigeration type linear array infrared detector is normal.
Background
Before the refrigeration type infrared detector works normally, the refrigeration time is generally 6 to 8 minutes, and after the refrigerator reaches the working temperature, whether the infrared detector can start to work normally can be judged. The refrigerating temperature of the refrigerating type linear infrared detector is continuously reduced in a normal working state, so that the product has overlong waiting time in the detection process. In order to shorten the waiting time for judging whether the refrigeration type infrared detector can work normally, a method for rapidly judging whether the refrigeration temperature of the refrigeration type linear infrared detector is normal is provided.
Disclosure of Invention
Technical problem to be solved
In order to avoid the defects of the prior art, the invention provides a method for rapidly judging whether the refrigeration temperature of the refrigeration type linear infrared detector is normal or not, and shortens the waiting time for judging whether the refrigeration type linear infrared detector can work normally or not.
Technical proposal
A method for rapidly judging the normal refrigerating temperature of a refrigerating type linear infrared detector is characterized by comprising the following steps:
step 1: after the refrigeration type linear infrared detector is electrified for the first time, the refrigeration temperature of the infrared detector is read every 5 seconds within 10 minutes, and a temperature L array is put in, wherein L is the number of temperature values; after the recording is completed, storing temperature data in a temperature [ L ] array into a nonvolatile memory, and powering down an infrared detector;
step 2: after the refrigeration type linear infrared detector is electrified, the stored temperature value is read from a nonvolatile memory and put into a temperature [ L ] array;
step 3, reading the refrigeration temperature of the current infrared detector at the 30 th second when timing begins, and searching the position, namely the time, of the current infrared detector in the temperature L array;
step 4, if the current temperature is not within the temperature L array range, the refrigeration temperature of the infrared detector is considered to be abnormal and the infrared detector cannot work normally; if the refrigeration temperature of the current infrared detector is within the temperature L range, finding a subscript index in the temperature L which is more than or equal to the current temperature value, and when the L-index is more than 12, selecting a temperature value corresponding to the temperature index+10 as a temperature judgment threshold value threshold; otherwise, selecting a temperature value corresponding to temperature [ L ] as a temperature judgment threshold;
and 5, reading the refrigeration temperature of the current infrared detector at the 90 th second when timing begins, if the refrigeration temperature of the current infrared detector is not greater than the temperature judgment threshold value threshold, judging that the refrigeration of the infrared detector is normal, otherwise, judging that the refrigeration of the infrared detector is abnormal.
Advantageous effects
According to the method for rapidly judging whether the refrigerating temperature of the refrigerating line array infrared detector is normal or not, whether the refrigerating temperature of the infrared detector is normal or not is rapidly judged by presetting the temperature of the infrared detector according to the characteristic that the refrigerating temperature of the refrigerating line array infrared detector is continuously reduced in a normal working state, the whole detection process is shortened to two minutes, and compared with the original 6-8 minutes, the time for judging whether the refrigerating temperature of the infrared detector is normal or not is effectively shortened.
Drawings
Fig. 1: is a flow chart of the invention
Detailed Description
The invention will now be further described with reference to examples, figures:
step 1, after a refrigeration type linear array infrared detector is electrified for the first time, the refrigeration temperature of the infrared detector is read every 5 seconds within 10 minutes, and a temperature L array is put in, wherein L is the number of temperature values of 120; after the recording is completed, storing temperature data in a temperature [ L ] array into a nonvolatile memory, and powering down an infrared detector;
step 2, after the refrigeration type linear infrared detector is electrified, reading the stored temperature value from a nonvolatile memory, and putting the temperature value into a temperature [ L ] array;
step 3, after the refrigeration type linear infrared detector is electrified, reading the refrigeration temperature of the current infrared detector at the 30 th second from the beginning of timing, and searching the position of the refrigeration type linear infrared detector in the temperature [ L ] array;
step 4, if the current temperature is not within the temperature L array range, the refrigeration temperature of the infrared detector is considered to be abnormal and the infrared detector cannot work normally; if the refrigerating temperature of the current infrared detector is within the temperature L range, finding a subscript index in the temperature L which is more than or equal to the current temperature value, and when the (L-index) is more than 12, selecting a temperature value corresponding to the temperature index+10 as a temperature judgment threshold value threshold; otherwise, selecting a temperature value corresponding to temperature [ L ] as a temperature judgment threshold;
and 5, reading the refrigeration temperature of the current infrared detector at the 90 th second when timing begins, if the refrigeration temperature of the current infrared detector is not greater than the temperature judgment threshold value threshold, judging that the refrigeration of the infrared detector is normal, otherwise, judging that the refrigeration of the infrared detector is abnormal.
Claims (1)
1. A method for rapidly judging the normal refrigerating temperature of a refrigerating type linear infrared detector is characterized by comprising the following steps:
step 1: after the refrigeration type linear infrared detector is electrified for the first time, the refrigeration temperature of the infrared detector is read every 5 seconds within 10 minutes, and a temperature L array is put in, wherein L is the number of temperature values; after the recording is completed, storing temperature data in a temperature [ L ] array into a nonvolatile memory, and powering down an infrared detector;
step 2: after the refrigeration type linear infrared detector is electrified, the stored temperature value is read from a nonvolatile memory and put into a temperature [ L ] array;
step 3, reading the refrigeration temperature of the current infrared detector at the 30 th second when timing begins, and searching the position, namely the time, of the current infrared detector in the temperature L array;
step 4, if the current temperature is not within the temperature L array range, the refrigeration temperature of the infrared detector is considered to be abnormal and the infrared detector cannot work normally; if the refrigeration temperature of the current infrared detector is within the temperature L range, finding a subscript index in the temperature L which is more than or equal to the current temperature value, and when the L-index is more than 12, selecting a temperature value corresponding to the temperature index+10 as a temperature judgment threshold value threshold; otherwise, selecting a temperature value corresponding to temperature [ L ] as a temperature judgment threshold;
and 5, reading the refrigeration temperature of the current infrared detector at the 90 th second when timing begins, if the refrigeration temperature of the current infrared detector is not greater than the temperature judgment threshold value threshold, judging that the refrigeration of the infrared detector is normal, otherwise, judging that the refrigeration of the infrared detector is abnormal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010943097.5A CN112284552B (en) | 2020-09-09 | 2020-09-09 | Method for rapidly judging normal refrigerating temperature of refrigerating type linear infrared detector |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010943097.5A CN112284552B (en) | 2020-09-09 | 2020-09-09 | Method for rapidly judging normal refrigerating temperature of refrigerating type linear infrared detector |
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| Publication Number | Publication Date |
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| CN112284552A CN112284552A (en) | 2021-01-29 |
| CN112284552B true CN112284552B (en) | 2023-12-22 |
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| CN202010943097.5A Active CN112284552B (en) | 2020-09-09 | 2020-09-09 | Method for rapidly judging normal refrigerating temperature of refrigerating type linear infrared detector |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1441274A2 (en) * | 2003-01-27 | 2004-07-28 | Behr America, Inc | Temperature control with infrared sensing |
| EP1953509A1 (en) * | 2007-01-30 | 2008-08-06 | NEC Electronics Corporation | Method and apparatus for compensating infrared sensor for temperature |
| CN202267538U (en) * | 2011-07-08 | 2012-06-06 | 凯迈（洛阳）测控有限公司 | Refrigeration type infrared detector with fault detection function |
| CN107246919A (en) * | 2017-05-03 | 2017-10-13 | 华中光电技术研究所（中国船舶重工集团公司第七七研究所） | The control system and its refrigeration decision method of a kind of refrigeration type infrared detector |
-
2020
- 2020-09-09 CN CN202010943097.5A patent/CN112284552B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1441274A2 (en) * | 2003-01-27 | 2004-07-28 | Behr America, Inc | Temperature control with infrared sensing |
| EP1953509A1 (en) * | 2007-01-30 | 2008-08-06 | NEC Electronics Corporation | Method and apparatus for compensating infrared sensor for temperature |
| CN202267538U (en) * | 2011-07-08 | 2012-06-06 | 凯迈（洛阳）测控有限公司 | Refrigeration type infrared detector with fault detection function |
| CN107246919A (en) * | 2017-05-03 | 2017-10-13 | 华中光电技术研究所（中国船舶重工集团公司第七七研究所） | The control system and its refrigeration decision method of a kind of refrigeration type infrared detector |
Non-Patent Citations (1)
| Title |
|---|
| 制冷机与红外探测器冷链耦合技术研究;王亚妮;张巍;迟国春;朱志雄;;激光与红外(第02期);22-26 * |
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| CN112284552A (en) | 2021-01-29 |
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