CN107246919A - The control system and its refrigeration decision method of a kind of refrigeration type infrared detector - Google Patents
The control system and its refrigeration decision method of a kind of refrigeration type infrared detector Download PDFInfo
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- 238000005057 refrigeration Methods 0.000 title claims abstract description 115
- 238000000034 method Methods 0.000 title claims abstract description 29
- 238000005070 sampling Methods 0.000 claims abstract description 26
- 230000008859 change Effects 0.000 claims abstract description 16
- 230000005611 electricity Effects 0.000 claims abstract 2
- 238000012937 correction Methods 0.000 claims description 3
- 238000011010 flushing procedure Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract 1
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- 230000004888 barrier function Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000008014 freezing Effects 0.000 description 2
- 238000007710 freezing Methods 0.000 description 2
- 206010000234 Abortion spontaneous Diseases 0.000 description 1
- 241001269238 Data Species 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
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- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
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- 208000015994 miscarriage Diseases 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B49/00—Arrangement or mounting of control or safety devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
- G01J5/06—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity
- G01J5/068—Arrangements for eliminating effects of disturbing radiation; Arrangements for compensating changes in sensitivity by controlling parameters other than temperature
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B2700/00—Sensing or detecting of parameters; Sensors therefor
- F25B2700/15—Power, e.g. by voltage or current
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B2700/00—Sensing or detecting of parameters; Sensors therefor
- F25B2700/21—Temperatures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J2005/0077—Imaging
Abstract
The invention discloses a kind of control system of refrigeration type infrared detector and its refrigeration decision method, the system includes refrigeration type infrared detector, penetrates a grade follower, AD sampling modules and microcontroller.The method that this method uses the temperature feedback of continuous Timing measurement focal plane infrared detector, it is modified by the amending unit of microcontroller according to the actual use situation focal plane operating temperature of infrared detector with respect to the functional relation of output voltage, pass through the change slope of the comprehensive descision unit of microcontroller to temperature versus time again, stable refrigeration work temperature, reach that the time of stable refrigeration work temperature carries out comprehensive descision, the temperature of focal plane infrared detector is monitored in real time, reduction erroneous judgement causes focal plane infrared detector, and upper electricity or refrigeration machine have freezed well in advance but focal plane infrared detector can not go up situation that is electric and causing Startup calibration failure.
Description
Technical field
The present invention relates to infrared thermal imaging technique field, more particularly to a kind of refrigeration type infrared detector control system and
Its decision method that freezes.
Background technology
IRDS has following several advantages：Environmental suitability height, good concealment, the ability for recognizing camouflaged target
By force, its small volume, lightweight, low in energy consumption and compared with radar system.Due to infrared detection technique have the advantages that its it is unique so as to
It is set to have obtained extensive research and application, the especially traction in military requirement and related skill in military and national defense and civil area
, will more extensively in following application as the infrared detection technique of new and high technology under the promotion of art development, status is more important.
The core devices of IRDS are infrared detectors, due to making the material energy gap very little of infrared detector,
If environment temperature is high, the dark current caused is gushed by heat and thermal noise is big, signal to noise ratio, the response wave length of detector is directly influenced
With each index such as responsive time constant.In order to improve the performance of IRDS, it is necessary to reduce infrared spy by freezing
The operating temperature of device is surveyed, to contain the generation of dark current, increases signal to noise ratio.Infrared detector is after sub-cooled, the response time
Shortening, sensitivity raising, response wave length broadening, limited ambient noise reduce.
Infrared detector can be divided into refrigeration type infrared detector and non-refrigeration type infrared detector according to refrigeration modes.System
The stability of cold mould infrared detector operating temperature directly determines the performance of IRDS.Most of infrared spy in focal plane
Survey device and be all operated in 77K~80K humidity provinces.
Tradition judges that refrigeration type infrared detector reaches that the method for stable refrigeration work temperature and working stability is setting one
Individual temperature spot, when focal plane infrared detector operating temperature reaches that this temperature is judged to freezing, not up to then continues to freeze.But
The voltage data corresponding with operating temperature for being limited in that focal plane infrared detector output of the method, desired voltage signal
The curve of monotonic increase, but actual acquisition to voltage feedback signal be gradually to increase, and have a curve of many local extremums,
Traditional decision method sets fixed temperature value to be judged erroneous judgement just occurs, and the method does not consider the following aspects also
Influence：
1. the operating temperature of each focal plane infrared detector is different；
2. each focal plane infrared detector configures different disposal circuit, operating temperature can be variant；
3. the environment temperature residing for the infrared detector of focal plane can also have an impact to its operating temperature.
Refrigeration type infrared detector will be caused to reach stable refrigeration work temperature but far beyond design temperature in summary
Point, and the different stable refrigeration work temperature of Shi Jishiyong situation are also dynamic change.Therefore using traditional decision method just
It can not accurately judge whether refrigeration type infrared detector freezes, the probability for occurring judging by accident is higher, influence refrigeration mode infrared acquisition
Device normal work.
The content of the invention
The technical problem to be solved in the present invention is for being difficult to accurately judge refrigeration type infrared detector in the prior art
Refrigerating state defect there is provided a kind of control system of refrigeration type infrared detector and its refrigeration decision method.
The technical solution adopted for the present invention to solve the technical problems is：
The present invention provides a kind of control system of refrigeration type infrared detector, including is sequentially connected and constitutes the refrigeration of loop
Type infrared detector, emitter follower, A/D sampling modules and microcontroller, refrigeration type infrared detector include refrigeration machine and Jiao
Plane infrared detector；The output end of microcontroller is connected with refrigeration machine, the output end of focal plane infrared detector and emitter-base bandgap grading with
It is connected with device；Wherein：
Thermometric diode built in the infrared detector of focal plane, thermometric diode is with focal plane infrared detector operating temperature
Change and itself resistance changes, and then the output voltage of focal plane infrared detector is changed；
Emitter follower is used to input A/D sampling modules after the output voltage of focal plane infrared detector is amplified,
Data acquisition is carried out by A/D sampling modules；
Microcontroller, including amending unit and comprehensive descision unit, refrigeration is completed for setting focal plane infrared detector
Operating temperature it is interval, the amending unit that the data that A/D sampling modules are collected are sent in microcontroller is modified, and is intended
Actual relationship curve is closed out, the slope changed by comprehensive descision unit to the temperature data relative time in data office, Jiao Ping
The operating temperature of surface detector, and reach that the time three of stable refrigeration work temperature is compared, judge that focal plane is infrared
Whether detector has reached stable refrigeration work temperature and steady operation, and then calculates the motor control amount of refrigeration machine, passes through control
The motor running speed of refrigeration machine processed, makes focal plane infrared detector be operated in cryogenic temperature interval.
The present invention provides a kind of refrigeration decision method of the control system of refrigeration type infrared detector, comprises the following steps：
Thermometric diode built in S1, focal plane infrared detector is with the change of focal plane infrared detector operating temperature
And itself resistance changes, and then the output voltage of focal plane infrared detector is set to change；Corresponding with temperature is defeated
Go out voltage and A/D sampling modules are input to after emitter follower amplifies, data acquisition is carried out by A/D sampling modules；
S2, setting continuous sampling interval time, the focal plane infrared detector work at multiple moment that every continuous acquisition is arrived
Make the corresponding voltage data of temperature to be modified by the amending unit of microcontroller, fit actual relationship curve, then by micro-
The comprehensive descision unit of controller is to the slope of the temperature data relative time change in data, the work temperature of focus planar detector
Degree, reaches that the time three of stable refrigeration work temperature is compared, judges whether focal plane infrared detector has reached stabilization
Refrigeration work temperature and steady operation；
The operating temperature that S3, in the microcontroller setting focal plane infrared detector complete refrigeration is interval, and A/D is sampled mould
The data that block is collected are sent to microcontroller and calculated, and the motor control amount of refrigeration machine is obtained by calculating, by controlling to make
The motor running speed of cold, makes focal plane infrared detector be operated in cryogenic temperature interval.
Further, the focal plane infrared detector work at 3 moment arrived continuous acquisition in step S2 of the invention
The corresponding voltage data of temperature is compared by microcontroller.
Further, by controlling the power model of refrigerating device inner in step S3 of the invention, to the motor of refrigeration machine
Running speed is controlled.
Further, in step S2 of the invention by amending unit to its operating temperature and corresponding voltage data relation
It is fitted, the functional relation between the actual work temperature and output voltage of focal plane infrared detector is：
T=-460.6631 (kV)4+1052.8133(kV)3-812.6656(kV)2-227.7627(kV)+539.6459
Wherein, T is the operating temperature of focus planar detector, and V is output voltage, and k is correction factor.
Further, the operating temperature that the focal plane infrared detector set in step S2 of the invention completes refrigeration is interval
For：[T10,T20]=[50K, 90K], reach the time t of stable refrigeration work temperature0=10min, hot operation；8min, normal temperature
Work.
Further, determine whether to reach stable refrigeration work temperature and the method for working stability in step S3 of the invention
For：
Continuous sampling interval time t is set, t ,=tn+1-tn=tn-tn-1, n takes 2,3,4 ... N gathers t respectivelyn-1,
tn, tn+1The temperature voltage data of the focal plane infrared detector at three moment, it is amplified to be converted to corresponding temperature Tn-1, Tn,
Tn+1Microcontroller is delivered to, the slope for the temperature data relative time change sampled by microcontroller to adjacent continuous is compared,
Slope calculation formula is：
Kn-1=(Tn-Tn-1)/(tn-tn-1)
Kn=(Tn+1-Tn)/(tn+1-tn)
Will | K1| and | K2|, | K2| and | K3| ... ... | Kn-1| and | Kn| compare；
If | Kn|≥|Kn-1|, but Tn-1, Tn,Then judge the refrigeration machine event of focal plane infrared detector
Barrier；
If | Kn|≤|Kn-1|, even if Tn-1, Tn, Tn+1∈[T10,T20], though then judge that focal plane infrared detector reaches surely
Customize cold operating temperature but refrigeration machine not up to stable state；
Only as | Kn|≥|Kn-1|, and Tn-1, Tn, Tn+1∈[T10,T20], tn+1≤t0Three conditions are met simultaneously, are just sentenced
Focus plane infrared detector and reach stable refrigeration work temperature, and working stability.
The beneficial effect comprise that：The control system and its refrigeration of the refrigeration type infrared detector of the present invention judge
Method, it is contemplated that individual difference, use environment, the process circuit of configuration and the acquisition module equal difference of refrigeration type infrared detector
It is different to cause its stable refrigeration work temperature different, using the refrigeration judgement side of this refrigeration type infrared detector of the present invention
Method, expands stable refrigeration work temperature range, it is ensured that existing refrigeration type infrared detector is all suitable for；Refrigeration type infrared detector
Stable refrigeration work temperature is dynamic change, using the refrigeration decision method of this refrigeration type infrared detector of the present invention,
Set interval, the temperature voltage data of collection focal plane infrared detector, and continuous three gathered datas are carried out in real time
Compare to determine, effectively reduce traditional decision method probability of miscarriage of justice, it is ensured that refrigeration type infrared detector normal work.
Brief description of the drawings
Below in conjunction with drawings and Examples, the invention will be further described, in accompanying drawing：
Fig. 1 is the system block diagram of the embodiment of the present invention；
Fig. 2 is the microcontroller theory diagram of the embodiment of the present invention；
Fig. 3 is the revised temperature and voltage relationship matched curve figure of the embodiment of the present invention；
Fig. 4 is the temperature and time graph of relation of the embodiment of the present invention.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only to explain the present invention, not
For limiting the present invention.
As shown in figure 1, the control system of the refrigeration type infrared detector of the embodiment of the present invention, including be sequentially connected and constitute
Refrigeration type infrared detector, emitter follower, A/D sampling modules and the microcontroller of loop, refrigeration type infrared detector include
Refrigeration machine and focal plane infrared detector；The output end of microcontroller is connected with refrigeration machine, the output of focal plane infrared detector
End is connected with emitter follower；Wherein：
Thermometric diode built in the infrared detector of focal plane, thermometric diode is with focal plane infrared detector operating temperature
Change and itself resistance changes, and then the output voltage of focal plane infrared detector is changed；
Emitter follower is used to input A/D sampling modules after the output voltage of focal plane infrared detector is amplified,
Data acquisition is carried out by A/D sampling modules；
Microcontroller, including amending unit and comprehensive descision unit, refrigeration is completed for setting focal plane infrared detector
Operating temperature it is interval, the amending unit that the data that A/D sampling modules are collected are sent in microcontroller is modified, and is intended
Actual relationship curve is closed out, the slope changed by comprehensive descision unit to the temperature data relative time in data office, Jiao Ping
The operating temperature of surface detector, and reach that the time three of stable refrigeration work temperature is compared, judge that focal plane is infrared
Whether detector has reached stable refrigeration work temperature and steady operation, and then calculates the motor control amount of refrigeration machine, passes through control
The motor running speed of refrigeration machine processed, makes focal plane infrared detector be operated in cryogenic temperature interval.
As shown in Fig. 2 the refrigeration decision method of the control system of the refrigeration type infrared detector of the embodiment of the present invention, including
Following steps：
Thermometric diode built in S1, focal plane infrared detector is with the change of focal plane infrared detector operating temperature
And itself resistance changes, and then the output voltage of focal plane infrared detector is set to change；Corresponding with temperature is defeated
Go out voltage and A/D sampling modules are input to after emitter follower amplifies, data acquisition is carried out by A/D sampling modules；
S2, setting continuous sampling interval time, the focal plane infrared detector work at multiple moment that every continuous acquisition is arrived
Make the corresponding voltage data of temperature (such as table 1) to be modified by the amending unit of microcontroller, fit actual relationship curve (such as
Shown in Fig. 3), then the slope K changed by the comprehensive descision unit of microcontroller to the temperature data relative time in data, it is burnt
The work temperature of planar detector, reaches that the time t three of stable refrigeration work temperature is compared, judges that focal plane is infrared
Whether detector has reached stable refrigeration work temperature and steady operation.
The operating temperature of the focal plane infrared detector of table 1 and output voltage tables of data
The operating temperature that S3, in the microcontroller setting focal plane infrared detector complete refrigeration is interval, and A/D is sampled mould
The data that block is collected are sent to microcontroller and calculated, and the motor control amount of refrigeration machine is obtained by calculating, by controlling to make
The motor running speed of cold, makes focal plane infrared detector be operated in cryogenic temperature interval；
Function in the step S2 of the present invention between the actual work temperature and output voltage of focal plane infrared detector is closed
It is to be：
T=-460.6631 (kV)4+1052.8133(kV)3-812.6656(kV)2-227.7627(kV)+539.6459
Wherein, T is the operating temperature of focus planar detector, and V is output voltage, and k is correction factor.
The focal plane infrared detector set in the step S3 of the present invention complete the operating temperature interval of refrigeration as：[T10,
T20]=[50K, 90K], reach the time t of stable refrigeration work temperature0=10min (hot operation), 8min (normal temperature work).
As shown in figure 4, determining whether that the method for reaching stable refrigeration work temperature is in the step S3 of the present invention：The company of setting
Continuous sampling interval duration t, t ,=tn+1-tn=tn-tn-1, n takes 2,3,4 ... N gathers t respectivelyn-1, tn, tn+1Three moment
The temperature voltage data of focal plane infrared detector, it is amplified to be converted to corresponding temperature Tn-1, Tn, Tn+1Deliver to microcontroller,
The slope for the temperature data relative time change sampled by microcontroller to adjacent continuous is compared, and slope calculation formula is：
Kn-1=(Tn-Tn-1)/(tn-tn-1)
Kn=(Tn+1-Tn)/(tn+1-tn)
Will | K1| and | K2|, | K2| and | K3| ... ... | Kn-1| and | Kn| compare；
If | Kn|≥|Kn-1|, but Tn-1, Tn,Then judge the refrigeration machine event of focal plane infrared detector
Barrier.
If | Kn|≤|Kn-1|, even if Tn-1, Tn, Tn+1∈[T10,T20], though then judge that focal plane infrared detector reaches surely
Customize cold operating temperature but refrigeration machine not up to stable state.
Only as | Kn|≥|Kn-1|, and Tn-1, Tn, Tn+1∈[T10,T20], tn+1≤t0Three conditions are met simultaneously, just may be used
Judge that focal plane infrared detector has reached stable refrigeration work temperature, and working stability.
It should be appreciated that for those of ordinary skills, can according to the above description be improved or converted,
And all these modifications and variations should all belong to the protection domain of appended claims of the present invention.
Claims (7)
1. a kind of control system of refrigeration type infrared detector, it is characterised in that the refrigeration including being sequentially connected and constituting loop
Type infrared detector, emitter follower, A/D sampling modules and microcontroller, refrigeration type infrared detector include refrigeration machine and Jiao
Plane infrared detector；The output end of microcontroller is connected with refrigeration machine, the output end of focal plane infrared detector and emitter-base bandgap grading with
It is connected with device；Wherein：
Thermometric diode built in the infrared detector of focal plane, thermometric diode is with the change of focal plane infrared detector operating temperature
Change and itself resistance changes, and then the output voltage of focal plane infrared detector is changed；
Emitter follower is used to input A/D sampling modules after the output voltage of focal plane infrared detector is amplified, by A/D
Sampling module carries out data acquisition；
Microcontroller, including amending unit and comprehensive descision unit, the work of refrigeration is completed for setting focal plane infrared detector
Make temperature range, the amending unit that the data that A/D sampling modules are collected are sent in microcontroller is modified, and is fitted
Actual relationship curve, the slope changed by comprehensive descision unit to the temperature data relative time in data office, focal plane is visited
The operating temperature of device is surveyed, and reaches that the time three of stable refrigeration work temperature is compared, focal plane infrared acquisition is judged
Whether device has reached stable refrigeration work temperature and steady operation, and then calculates the motor control amount of refrigeration machine, by controlling to make
The motor running speed of cold, makes focal plane infrared detector be operated in cryogenic temperature interval.
2. a kind of refrigeration decision method of the control system of the refrigeration type infrared detector described in claim 1, it is characterised in that
Comprise the following steps：
Thermometric diode built in S1, focal plane infrared detector with the change of focal plane infrared detector operating temperature from
Body resistance changes, and then the output voltage of focal plane infrared detector is changed；The output electricity corresponding with temperature
Pressure is input to A/D sampling modules after emitter follower amplifies, and data acquisition is carried out by A/D sampling modules；
S2, setting continuous sampling interval time, the focal plane infrared detector work temperature at multiple moment that every continuous acquisition is arrived
Spend corresponding voltage data to be modified by the amending unit of microcontroller, fit actual relationship curve, then pass through microcontroller
The slope that the comprehensive descision unit of device changes to the temperature data relative time in data, the operating temperature of focus planar detector,
Reach that the time three of stable refrigeration work temperature is compared, judge whether focal plane infrared detector has reached stable refrigeration
Operating temperature and steady operation；
The operating temperature that S3, in the microcontroller setting focal plane infrared detector complete refrigeration is interval, and A/D sampling modules are adopted
The data collected are sent to microcontroller and calculated, and the motor control amount of refrigeration machine are obtained by calculating, by controlling refrigeration machine
Motor running speed, focal plane infrared detector is operated in cryogenic temperature interval.
3. the refrigeration decision method of the control system of refrigeration type infrared detector according to claim 2, it is characterised in that
The corresponding voltage data of focal plane infrared detector operating temperature at 3 moment for arriving continuous acquisition in step S2 passes through micro-control
Device processed is compared.
4. the refrigeration decision method of the control system of refrigeration type infrared detector according to claim 2, it is characterised in that
By controlling the power model of refrigerating device inner in step S3, the motor running speed to refrigeration machine is controlled.
5. the refrigeration decision method of the control system of refrigeration type infrared detector according to claim 2, it is characterised in that
Its operating temperature and corresponding voltage data relation are fitted by amending unit in step S2, focal plane infrared detector
Actual work temperature and output voltage between functional relation be：
T=-460.6631 (kV)4+1052.8133(kV)3-812.6656(kV)2-227.7627(kV)+539.6459
Wherein, T is the operating temperature of focus planar detector, and V is output voltage, and k is correction factor.
6. the refrigeration decision method of the control system of refrigeration type infrared detector according to claim 2, it is characterised in that
The focal plane infrared detector set in step S2 complete the operating temperature interval of refrigeration as：[T10,T20]=[50K, 90K], reach
To the time t for stablizing refrigeration work temperature0=10min, hot operation；8min, normal temperature work.
7. the refrigeration decision method of the control system of refrigeration type infrared detector according to claim 6, it is characterised in that
Determine whether that the method for reaching stable refrigeration work temperature and working stability is in step S3：
Continuous sampling interval time t is set, t ,=tn+1-tn=tn-tn-1, n takes 2,3,4 ... N gathers t respectivelyn-1, tn, tn+1
The temperature voltage data of the focal plane infrared detector at three moment, it is amplified to be converted to corresponding temperature Tn-1, Tn, Tn+1Deliver to
Microcontroller, the slope for the temperature data relative time change sampled by microcontroller to adjacent continuous is compared, slope meter
Calculating formula is：
Kn-1=(Tn-Tn-1)/(tn-tn-1)
Kn=(Tn+1-Tn)/(tn+1-tn)
Will | K1| and | K2|, | K2| and | K3| ... ... | Kn-1| and | Kn| compare；
If | Kn|≥|Kn-1|, but Tn-1, Tn,Then judge the refrigeration machine failure of focal plane infrared detector；
If | Kn|≤|Kn-1|, even if Tn-1, Tn, Tn+1∈[T10, T20], though then judge that focal plane infrared detector reaches stable system
Cold operating temperature but refrigeration machine is not up to stable state；
Only as | Kn|≥|Kn-1|, and Tn-1, Tn, Tn+1∈[T10, T20], tn+1≤t0Three conditions are met simultaneously, just judge burnt flat
Flushing external detector has reached stable refrigeration work temperature, and working stability.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110907041A (en) * | 2019-12-06 | 2020-03-24 | 中国空空导弹研究院 | Refrigeration state judgment system of refrigeration type infrared focal plane detector |
| CN111765979A (en) * | 2020-06-05 | 2020-10-13 | 威图视觉系统(深圳)有限公司 | Infrared thermal imaging measurement data analysis combined compensation temperature calibration method |
| CN112284552A (en) * | 2020-09-09 | 2021-01-29 | 中国航空工业集团公司洛阳电光设备研究所 | Method for rapidly judging normal refrigeration temperature of refrigeration type linear infrared detector |
| CN114244978A (en) * | 2021-11-25 | 2022-03-25 | 中国空间技术研究院 | Reliability management system and method for infrared camera with infrared refrigerator |
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| CN111765979A (en) * | 2020-06-05 | 2020-10-13 | 威图视觉系统(深圳)有限公司 | Infrared thermal imaging measurement data analysis combined compensation temperature calibration method |
| CN112284552A (en) * | 2020-09-09 | 2021-01-29 | 中国航空工业集团公司洛阳电光设备研究所 | Method for rapidly judging normal refrigeration temperature of refrigeration type linear infrared detector |
| CN112284552B (en) * | 2020-09-09 | 2023-12-22 | 中国航空工业集团公司洛阳电光设备研究所 | Method for rapidly judging normal refrigerating temperature of refrigerating type linear infrared detector |
| CN114244978A (en) * | 2021-11-25 | 2022-03-25 | 中国空间技术研究院 | Reliability management system and method for infrared camera with infrared refrigerator |
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