CN112257282A - Electronic product reuse evaluation method for flight test return - Google Patents
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Abstract
The invention relates to an electronic product reuse evaluation method for flight test return, which comprises the following steps: s1, acquiring performance parameters of an electronic product to be evaluated, and formulating a reusable capacity analysis and evaluation scheme of the electronic product based on the performance parameters; s2, analyzing and evaluating the reusability of the electronic product based on the reusable ability analyzing and evaluating scheme, and determining the number of times of repeated use of the electronic product; s3, if the repeated use times of the electronic product meet the requirements, comprehensively evaluating the product state of the electronic product after undergoing a flight test, and acquiring a first result; and S4, judging whether the electronic product is reused or not based on the first result. The scheme provides a basis for the product to perform the clearance evaluation of the flight test again.
Description
Technical Field
The invention relates to the field of aerospace, in particular to a reuse evaluation method for an electronic product returned in a flight test.
Background
With the rapid development of the aerospace industry, the launching frequency of the spacecraft is continuously improved, and the operation scale is continuously enlarged. In the face of increasingly high-density space mission requirements, the cost of the spacecraft is reduced, and the development period is shortened, so that the method becomes a necessary way for promoting the continuous, healthy and rapid development of the space service.
The returned products of the spacecraft flight test mainly comprise mechanical products, electromechanical products, electronic products and the like. Because the electronic products contain a large number of expensive components, the electronic products occupy a higher proportion in the development cost of the spacecraft. Therefore, the electronic product can be reused after flight test, and the method is an important direction for researching the reuse of returned products.
Disclosure of Invention
The invention aims to provide an electronic product reuse evaluation method for flight test return, which is used for realizing the reuse of electronic products.
In order to achieve the above object, the present invention provides an electronic product reuse evaluation method for flight test return, including:
s1, acquiring performance parameters of an electronic product to be evaluated, and formulating a reusable capacity analysis and evaluation scheme of the electronic product based on the performance parameters;
s2, analyzing and evaluating the reusability of the electronic product based on the reusable ability analyzing and evaluating scheme, and determining the number of times of repeated use of the electronic product;
s3, if the repeated use times of the electronic product meet the requirements, comprehensively evaluating the product state of the electronic product after undergoing a flight test, and acquiring a first result;
and S4, judging whether the electronic product is reused or not based on the first result.
According to one aspect of the invention, the reusability analysis and assessment scheme comprises:
the environmental influence factor analysis sub-scheme is used for analyzing the electronic product under the set environmental influence factors;
the mechanical condition analysis sub-scheme is used for analyzing the electronic product under the set mechanical condition;
the life analysis sub-scheme for acceptance test time or times is used for analyzing the test time or test times of the electronic product under the mechanical conditions set by the mechanical condition analysis sub-scheme;
the test verification sub scheme is repeatedly used and is used for carrying out test verification on the electronic product;
and the repeated use times analysis and evaluation sub-scheme is used for comprehensively evaluating the repeated use times of the electronic product based on the acceptance test time or times life analysis sub-scheme and the analysis results obtained in the repeated use test verification sub-scheme.
According to an aspect of the present invention, step S2 includes:
s21, analyzing the electronic product based on the environmental influence factor analysis sub-scheme;
s22, analyzing the electronic product based on the mechanical condition analysis sub-scheme, wherein the allowance of the electronic product at the identification level and the acceptance level is analyzed by adopting the acceptance level and the identification level mechanical environment design conditions of the electronic product;
s23, analyzing the electronic product based on the acceptance test time or frequency life analysis sub-scheme, wherein the longest acceptance level mechanical environment test time or test frequency allowed by the electronic product is obtained by adopting acceptance level and identification level mechanical environment design conditions of the electronic product;
s24, analyzing the electronic product based on the repeated use test verification sub-scheme, wherein a new product in the same batch as the electronic product is obtained, a plurality of tests are repeated based on acceptance level and identification level mechanical environment design conditions in the mechanical condition analysis sub-scheme, corresponding test results are obtained, the test results are compared with the analysis results obtained in the step S23, and the rationality of the electronic product for repeated use is verified based on the comparison results, and verification results are obtained;
s25, analyzing the electronic product based on the repeated use number analysis and evaluation sub-scheme, wherein the repeated use number of the electronic product is determined based on the analysis result obtained in the step S23 and the verification result obtained in the step S24.
According to an aspect of the present invention, in step S23, the step of obtaining the longest acceptable-grade mechanical environment test time or test times allowed by the electronic product using the acceptable-grade and acceptable-grade mechanical environment design conditions of the electronic product includes:
s231, acquiring a service life analysis relational expression aiming at the electronic product;
s232, analyzing the corresponding relation between the service life of the electronic product and the mechanical environment of the acceptance level based on the service life analysis relational expression and by combining the mechanical environment conditions of the identification level and the acceptance level of the electronic product;
and S233, acquiring the longest acceptable mechanical environment test time or test times of the electronic product based on the corresponding relation.
According to an aspect of the present invention, in step S231, the life analysis relation of the electronic product is:
tA＝(tQ)(2)(a/6)(M-S-K)
wherein，tAIs the sum of the proof test time and the flight test time, which produces an equivalent cumulative fatigue failure over the duration of the proof test;
tQto identify the duration of the vibration test;
a is the inverse of the fatigue curve slope of the stress-cycle number relationship of most fatigue-sensitive materials in the product;
m is the margin between the identification and acceptance of the vibration test input, dB;
s is a constant, when the manufacturing processes of the identification product and the acceptance product are consistent, S is 2, and when the manufacturing processes of the identification product and the acceptance product are different, S is 3;
k is a constant between 0.6 and 2.
According to an aspect of the present invention, in step S231, values of the parameter K in the life analysis relation of the electronic product satisfy the following relationship:
according to an aspect of the present invention, in step S3, the step of performing a comprehensive product status evaluation on the status of the electronic product after undergoing the flight test includes:
s31, collecting the history of the electronic product after the mechanical test;
s32, carrying out state check on the state of the electronic product after the flight test;
s33, performing power-on test on the electronic product;
s34, performing repeated use mechanical test condition coverage analysis on the electronic product;
s35, obtaining the results generated in the steps S31 to S34, and generating the first result after the results are integrated.
According to one aspect of the invention, in step S31, the mechanical environment actually experienced by the electronic product during the ground test and the flight test is collected and compared with the acceptance level mechanical environment test conditions.
According to an aspect of the present invention, in step S34, if the electronic product is transferred to a different type of spacecraft for reuse, the actual design mechanical condition of the electronic product is compared with the spacecraft mechanical environmental condition, and if the actual design mechanical condition of the electronic product covers the spacecraft mechanical environmental condition, the number of times of reuse of the electronic product obtained in step S2 is confirmed to be valid for the spacecraft.
According to an aspect of the present invention, in step S21, if the electronic product has undergone multiple actual flight tests, the analysis result may directly adopt the test result of the actual flight test.
According to the scheme provided by the invention, the returned product after the spacecraft flight test is reused, the ground development period of the spacecraft can be obviously shortened, unnecessary repeated development expenditure is saved, and the development cost of the spacecraft is reduced.
According to the scheme provided by the invention, the reusable capacity of the product is comprehensively and accurately measured and evaluated by adopting two aspects of primary analysis and evaluation of the reusable design capacity and comprehensive evaluation of the state of the product after the flight test, so that a reliable basis is provided for the reusable of the product, the safety of the reuse of the product can be ensured, and the reasonable utilization of resources is effectively ensured.
According to the scheme provided by the invention, in the analysis and evaluation process of the reusability of the product, the plurality of established sub-schemes are respectively aligned in sequence to carry out complete test, so that omission in the test process is effectively avoided, and the method is favorable for effectively ensuring accurate judgment and use safety of the product.
According to one scheme of the invention, by adopting strict mechanical environment conditions to analyze the product, the risk caused by accidental factors can be effectively eliminated, and the method is favorable for further ensuring the accuracy of the evaluation result.
According to one scheme of the invention, by establishing the corresponding relation between the service life of the product and the acceptance level mechanical environment, the quantitative analysis of the use duration or the use times of the product is realized, so that the method is favorable for intuitively and effectively acquiring the performance of the product and also provides a judgment basis for subsequent state evaluation.
According to the scheme of the invention, through analysis of coverage of mechanical experiment conditions, effective basis is provided for effectively ensuring the repeated use of products in different models, the repeated utilization rate and the application range of the products are ensured, resources are saved, the repeated evaluation process of the products in transferring other models is also saved, and the product reuse efficiency is greatly improved.
Drawings
Fig. 1 is a block diagram schematically illustrating steps of an electronic product reuse evaluation method for flight test return according to an embodiment of the present invention.
Detailed Description
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the embodiments will be briefly described below. It is obvious that the drawings in the following description are only some embodiments of the invention, and that for a person skilled in the art, other drawings can be derived from them without inventive effort.
In describing embodiments of the present invention, the terms "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in an orientation or positional relationship that is based on the orientation or positional relationship shown in the associated drawings, which is for convenience and simplicity of description only, and does not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus, the above-described terms should not be construed as limiting the present invention.
The present invention is described in detail below with reference to the drawings and the specific embodiments, which are not repeated herein, but the embodiments of the present invention are not limited to the following embodiments.
As shown in fig. 1, according to an embodiment of the present invention, a method for evaluating the reuse of an electronic product returned by a flight test according to the present invention includes:
s1, acquiring performance parameters of an electronic product to be evaluated, and formulating a reusable capacity analysis and evaluation scheme of the electronic product based on the performance parameters;
s2, analyzing and evaluating the reusability of the electronic product based on the reusable ability analyzing and evaluating scheme, and determining the times of repeated use of the electronic product;
s3, if the repeated use times of the electronic product meet the requirements, comprehensively evaluating the product state of the electronic product after the electronic product is subjected to a flight test, and acquiring a first result;
and S4, judging whether the electronic product is reused or not based on the first result.
According to one embodiment of the present invention, a reusability analysis and assessment scheme includes:
the environmental influence factor analysis sub-scheme is used for analyzing the electronic product under the set environmental influence factors;
the mechanical condition analysis sub-scheme is used for analyzing the electronic product under the set mechanical condition;
the life analysis sub-scheme for checking and accepting the test time or times is used for analyzing the test time or test times of the electronic product under the mechanical conditions set by the mechanical condition analysis sub-scheme;
the test verification sub-scheme is repeatedly used and is used for carrying out test verification on the electronic product;
and the repeated use times analysis and evaluation sub-scheme is used for comprehensively evaluating the repeated use times of the electronic product based on the analysis results obtained in the acceptance test time or times life analysis sub-scheme and the repeated use test verification sub-scheme.
According to an embodiment of the present invention, step S2 includes:
s21, analyzing the electronic product based on the environmental influence factor analysis sub-scheme; in this embodiment, if the electronic product has undergone multiple actual flight tests, the analysis result may be directly the test result of the actual flight test. Because the spacecraft can ensure that the carried electronic product works under the appropriate environment such as temperature and humidity through control, the influence of the environment such as temperature and humidity experienced by multiple flight tests on the service life of the electronic product is small, and then the test result of the flight test can be directly adopted, and certainly, the influence of the mechanical environment in the flight process on the service life of the product can be not considered as required and is mainly considered.
And S22, analyzing the electronic product based on the mechanical condition analysis sub-scheme, wherein the allowance of the electronic product in the authentication level and the acceptance level is analyzed by adopting the mechanical environment design conditions of the acceptance level and the authentication level of the electronic product. In this embodiment, the acceptance level and qualification level mechanical environment design conditions may be generated by collecting the mechanical environment design conditions of the electronic product at the previous acceptance level and qualification level.
And S23, analyzing the electronic product based on the acceptance test time or frequency life analysis sub-scheme, wherein the longest acceptance level mechanical environment test time or test frequency allowed by the electronic product is obtained by adopting the acceptance level and identification level mechanical environment design conditions of the electronic product. In this embodiment, the evaluation-level mechanical environment design condition may be converted to obtain equivalent acceptance level time and number, that is, the actual life of the product, and then only the longest acceptance level test time or number is required, that is, the life of the electronic product is obtained. Furthermore, the step of obtaining the longest acceptable mechanical environment test time or test times of the electronic product by adopting the acceptable and certified mechanical environment design conditions of the electronic product comprises:
s231, acquiring a service life analysis relational expression for the electronic product; in this embodiment, the life analysis relation of the electronic product is as follows:
tA＝(tQ)(2)(a/6)(M-S-K)
wherein, tAIs the sum of the proof test time (i.e., proof test time) and the flight test time, which produces an equivalent cumulative fatigue failure over the duration of the proof test; in this embodiment, the qualification test time can be determined from the environment of the productObtained under the test conditions. The model of each product corresponds to a corresponding product environment test condition for verifying the environmental adaptability of the product. Wherein the test conditions include an identification test and an acceptance test. This is the key to the evaluation of product reusability.
By using the formula and combining the identification test time in the product environment test condition, the equivalent acceptance test time can be obtained. Since each acceptance test is equivalent to experiencing a flight environment, the time of acceptance is known, as is the number of flight tests that the product can experience, i.e., the life or number of reuses of the product.
tQFor qualification grade vibration test duration;
a is the inverse of the fatigue curve slope of the stress versus cycle number for (most) fatigue sensitive materials in the product;
m is the margin between the identification and acceptance of the vibration test input (i.e. the test tolerance), dB (which is a typical unit in the test condition of the product environment and is used for measuring the test magnitude level);
s is a constant, when the manufacturing processes of the identification product and the acceptance product are consistent, S is 2, and when the manufacturing processes of the identification product and the acceptance product are different, S is 3;
k is a constant between 0.6 and 2.
In this embodiment, the value of the parameter K in the life analysis relational expression of the electronic product satisfies the following relationship:
s232, analyzing the corresponding relation between the service life of the electronic product and the mechanical environment of the acceptance level based on the service life analysis relational expression and by combining the mechanical environment conditions of the identification level and the acceptance level of the electronic product;
and S233, acquiring the longest acceptable mechanical environment test time or test times of the electronic product based on the corresponding relation.
For example: the test time of the identification-level mechanical environment is 3min, the allowance is 3dB relative to the test-level mechanical environment, if the fatigue sensitive material of the product is 2024-T3 aluminum, a can be 6, and T can be obtained according to the formula and the mechanical test condition of the productA24min, it is shown that the fatigue failure of the product when subjected to a 24min proof mechanical environment is equivalent to the fatigue failure when the vibration test is identified. If the ground has undergone an acceptance level environmental test for 1min (mainly considering rocket ascension flight) in a flight test for 1min, 24-1-22 min of service life is also left, that is, the product can also undergo 22 acceptance tests or flight tests.
S24, analyzing the electronic product based on the repeated use test verification sub-scheme, wherein new products in the same batch as the electronic product are obtained, and based on the acceptance level and identification level mechanical environment design conditions in the mechanical condition analysis sub-scheme, repeated tests are carried out for multiple times, corresponding test results are obtained, the test results are compared with the analysis results obtained in the step S23, and whether the electronic product can be repeatedly used is verified based on the comparison results, and verification results are obtained; that is, in this step, the new products produced in the same batch are utilized, and the mechanical environment conditions of the acceptance level of the same magnitude are applied on the vibration table (namely, the acceptance level is used for examining during the experiment, since the longest acceptance times that the products can bear are known, the experiment is carried out by using the actual acceptance level conditions during the verification through the experiment), and the mechanical cycle experiment of the acceptance level is carried out, and the mechanical experiment is repeated for many times, so that the reasonability of the analysis result in the step S23 is verified.
And S25, analyzing the electronic product based on the repeated use number analysis and evaluation sub-scheme, wherein the repeated use number of the electronic product is determined based on the analysis result obtained in the step S23 and the verification result obtained in the step S24.
According to an embodiment of the present invention, in step S3, the step of performing the comprehensive product status evaluation on the status of the electronic product after undergoing the flight test includes:
s31, collecting the history of the electronic product after the mechanical test; in the embodiment, the mechanical environment actually experienced by the electronic product in the ground test and flight test processes is collected and compared with the experimental conditions of the acceptance level mechanical environment. Theoretically, the mechanical environment actually experienced by the product should not exceed the designed acceptance level environmental conditions.
S32, carrying out state check on the state of the electronic product after the flight test; in the embodiment, after the product is subjected to the flight test, the appearance and the cover opening of the product can be checked according to the actual condition of the product, and the integrity of the welding parts of the circuit board, the device and the like can be checked.
S33, performing power-on test on the electronic product; in the embodiment, the product is tested in all directions according to the technical specification of product testing, and the electrical property of the product after the product is subjected to a flight test and returns to the ground is comprehensively evaluated.
S34, performing repeated use mechanical test condition coverage analysis on the electronic product; in this embodiment, if the electronic product is transferred to a spacecraft of a different model for repeated use, the actual design mechanical condition of the electronic product is compared with the spacecraft mechanical environmental condition, and if the actual design mechanical condition of the electronic product covers the spacecraft mechanical environmental condition, it is determined that the number of times of repeated use of the electronic product obtained in step S2 is valid for the spacecraft. For example, when a returned product of a shenzhou airship is used for a flight test of a cargo airship, the mechanical environment design conditions of other types need to be compared with the mechanical environment design conditions of the product on a prototype number. When the actual design mechanical conditions of the product cover other types of mechanical environment conditions, the method can be applied to the analysis results of the reusability of the product.
S35, obtaining the results generated in the steps S31 to S34, and generating a first result after the results are integrated.
The foregoing is merely exemplary of particular aspects of the present invention and devices and structures not specifically described herein are understood to be those of ordinary skill in the art and are intended to be implemented in such conventional ways.
The above description is only one embodiment of the present invention, and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. An electronic product reuse evaluation method for flight test return, comprising:
s1, acquiring performance parameters of an electronic product to be evaluated, and formulating a reusable capacity analysis and evaluation scheme of the electronic product based on the performance parameters;
s2, analyzing and evaluating the reusability of the electronic product based on the reusable ability analyzing and evaluating scheme, and determining the number of times of repeated use of the electronic product;
s3, if the repeated use times of the electronic product meet the requirements, comprehensively evaluating the product state of the electronic product after undergoing a flight test, and acquiring a first result;
and S4, judging whether the electronic product is reused or not based on the first result.
2. The method of claim 1, wherein the reusability analysis and assessment scheme comprises:
the environmental influence factor analysis sub-scheme is used for analyzing the electronic product under the set environmental influence factors;
the mechanical condition analysis sub-scheme is used for analyzing the electronic product under the set mechanical condition;
the life analysis sub-scheme for acceptance test time or times is used for analyzing the test time or test times of the electronic product under the mechanical conditions set by the mechanical condition analysis sub-scheme;
the test verification sub scheme is repeatedly used and is used for carrying out test verification on the electronic product;
and the repeated use times analysis and evaluation sub-scheme is used for comprehensively evaluating the repeated use times of the electronic product based on the acceptance test time or times life analysis sub-scheme and the analysis results obtained in the repeated use test verification sub-scheme.
3. The electronic product reuse evaluation method according to claim 2, wherein step S2 includes:
s21, analyzing the electronic product based on the environmental influence factor analysis sub-scheme;
s22, analyzing the electronic product based on the mechanical condition analysis sub-scheme, wherein the allowance of the electronic product at the identification level and the acceptance level is analyzed by adopting the acceptance level and the identification level mechanical environment design conditions of the electronic product;
s23, analyzing the electronic product based on the acceptance test time or frequency life analysis sub-scheme, wherein the longest acceptance level mechanical environment test time or test frequency allowed by the electronic product is obtained by adopting acceptance level and identification level mechanical environment design conditions of the electronic product;
s24, analyzing the electronic product based on the repeated use test verification sub-scheme, wherein a new product in the same batch as the electronic product is obtained, a plurality of tests are repeated based on acceptance level and identification level mechanical environment design conditions in the mechanical condition analysis sub-scheme, corresponding test results are obtained, the test results are compared with the analysis results obtained in the step S23, and the rationality of the electronic product for repeated use is verified based on the comparison results, and verification results are obtained;
s25, analyzing the electronic product based on the repeated use number analysis and evaluation sub-scheme, wherein the repeated use number of the electronic product is determined based on the analysis result obtained in the step S23 and the verification result obtained in the step S24.
4. The method for evaluating the reusability of an electronic product according to claim 3, wherein in step S23, the step of obtaining the maximum acceptable mechanical environment testing time or testing times of the electronic product using the acceptable and acceptable mechanical environment design conditions of the electronic product comprises:
s231, acquiring a service life analysis relational expression aiming at the electronic product;
s232, analyzing the corresponding relation between the service life of the electronic product and the mechanical environment of the acceptance level based on the service life analysis relational expression and by combining the mechanical environment conditions of the identification level and the acceptance level of the electronic product;
and S233, acquiring the longest acceptable mechanical environment test time or test times of the electronic product based on the corresponding relation.
5. The method for evaluating reuse of electronic products according to claim 4, wherein in step S231, said life analysis relation of said electronic products is:
tA＝(tQ)(2)(a/6)(M-S-K)
wherein, tAIs the sum of the proof test time and the flight test time, which produces an equivalent cumulative fatigue failure over the duration of the proof test;
tQto identify the duration of the vibration test;
a is the reciprocal of the fatigue curve slope of the relation between the stress of the fatigue sensitive material in the product and the cycle number;
m is the margin between the identification and acceptance of the vibration test input, dB;
s is a constant, when the manufacturing processes of the identification product and the acceptance product are consistent, S is 2, and when the manufacturing processes of the identification product and the acceptance product are different, S is 3;
k is a constant between 0.6 and 2.
6. The method for evaluating the reuse of an electronic product according to claim 5, wherein in step S231, the value of the parameter K in the life analysis relation of the electronic product satisfies the following relation:
7. the method for evaluating the reuse of an electronic product according to any one of claims 1 to 6, wherein in step S3, the step of performing the comprehensive evaluation of the product status on the status of the electronic product after undergoing the flight test comprises:
s31, collecting the history of the electronic product after the mechanical test;
s32, carrying out state check on the state of the electronic product after the flight test;
s33, performing power-on test on the electronic product;
s34, performing repeated use mechanical test condition coverage analysis on the electronic product;
s35, obtaining the results generated in the steps S31 to S34, and generating the first result after the results are integrated.
8. The method for evaluating the reuse of an electronic product according to claim 7, wherein in step S31, the mechanical environment actually experienced by the electronic product during the ground test and the flight test is collected and compared with the acceptance level mechanical environment test conditions.
9. The method for evaluating reuse of an electronic product according to claim 7, wherein in step S34, if the electronic product is transferred to a spacecraft of a different model for reuse, the actual design mechanical conditions of the electronic product are compared with the mechanical environmental conditions of the spacecraft, and if the actual design mechanical conditions of the electronic product cover the mechanical environmental conditions of the spacecraft, the number of times of reuse of the electronic product obtained in step S2 is confirmed to be valid for the spacecraft.
10. The method for evaluating the reuse of an electronic product according to any one of claims 3 to 6, wherein in step S21, if the electronic product has undergone multiple actual flight tests, the analysis result can directly adopt the test result of the actual flight test.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113720356A (en) * | 2021-09-10 | 2021-11-30 | 北京控制工程研究所 | IMU (inertial measurement Unit) world round-trip reusability performance verification method |
| CN115310210A (en) * | 2022-09-29 | 2022-11-08 | 中国人民解放军63921部队 | Method and device for evaluating design scheme of vertical take-off and landing reusable carrier rocket |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5961076A (en) * | 1996-12-20 | 1999-10-05 | Trw Inc. | Modular spacecraft development process |
| JP2008145414A (en) * | 2006-11-17 | 2008-06-26 | Ntn Corp | Life estimation method and system from truncated life test |
| CN106484957A (en) * | 2016-09-18 | 2017-03-08 | 中国运载火箭技术研究院 | A kind of Reusable Launch Vehicles ablated configuration Guidance and control performance evaluation system |
| CN106501640A (en) * | 2016-10-18 | 2017-03-15 | 北京空间技术研制试验中心 | Electrical property integrated test facility after reusable launch vehicle return |
| US20170110018A1 (en) * | 2015-10-19 | 2017-04-20 | Honeywell International Inc. | Aircraft maneuver data management system |
| CN109614684A (en) * | 2018-12-04 | 2019-04-12 | 中国航天标准化研究所 | A kind of satellite electron method for predicting service life of product under more stress resultants |
| WO2019202520A1 (en) * | 2018-04-17 | 2019-10-24 | Okulov Paul D | Autonomous structural health monitor |
-
2020
- 2020-10-29 CN CN202011182177.XA patent/CN112257282A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5961076A (en) * | 1996-12-20 | 1999-10-05 | Trw Inc. | Modular spacecraft development process |
| JP2008145414A (en) * | 2006-11-17 | 2008-06-26 | Ntn Corp | Life estimation method and system from truncated life test |
| US20170110018A1 (en) * | 2015-10-19 | 2017-04-20 | Honeywell International Inc. | Aircraft maneuver data management system |
| CN106484957A (en) * | 2016-09-18 | 2017-03-08 | 中国运载火箭技术研究院 | A kind of Reusable Launch Vehicles ablated configuration Guidance and control performance evaluation system |
| CN106501640A (en) * | 2016-10-18 | 2017-03-15 | 北京空间技术研制试验中心 | Electrical property integrated test facility after reusable launch vehicle return |
| WO2019202520A1 (en) * | 2018-04-17 | 2019-10-24 | Okulov Paul D | Autonomous structural health monitor |
| CN109614684A (en) * | 2018-12-04 | 2019-04-12 | 中国航天标准化研究所 | A kind of satellite electron method for predicting service life of product under more stress resultants |
Non-Patent Citations (1)
| Title |
|---|
| 王俊峰;韩增尧;张玉梅;丁继锋;邹元杰;: "可重复使用航天器力学试验方法及试验条件设计综述", 航天器环境工程, no. 05, 25 October 2020 (2020-10-25), pages 464 - 472 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113720356A (en) * | 2021-09-10 | 2021-11-30 | 北京控制工程研究所 | IMU (inertial measurement Unit) world round-trip reusability performance verification method |
| CN115310210A (en) * | 2022-09-29 | 2022-11-08 | 中国人民解放军63921部队 | Method and device for evaluating design scheme of vertical take-off and landing reusable carrier rocket |
| CN115310210B (en) * | 2022-09-29 | 2022-12-09 | 中国人民解放军63921部队 | Method and device for evaluating design scheme of vertical take-off and landing reusable carrier rocket |
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