CN112218324B - Automatic debugging and testing system and method for wireless terminal - Google Patents
Automatic debugging and testing system and method for wireless terminal Download PDFInfo
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- CN112218324B CN112218324B CN202010911773.0A CN202010911773A CN112218324B CN 112218324 B CN112218324 B CN 112218324B CN 202010911773 A CN202010911773 A CN 202010911773A CN 112218324 B CN112218324 B CN 112218324B
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04W—WIRELESS COMMUNICATION NETWORKS
- H04W24/00—Supervisory, monitoring or testing arrangements
- H04W24/08—Testing, supervising or monitoring using real traffic
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
Abstract
The embodiment of the invention provides an automatic debugging and testing system and a debugging and testing method of a wireless terminal, belonging to the technical field of electronic testing; the automatic debugging system and the debugging method of the wireless terminal test the radio frequency index of the DUT through the comprehensive tester and return the test case, the test result and the test allowance related to the comparison protocol to the PC terminal debugging system; the debugging system records the parameter information NV and the test allowance of the current DUT (device under test) according to the fed back test case, searches for the corresponding test case in the system, and sets the adjustment range and the stepping space of the parameters of the DUT to be tested, so that the parameters of the DUT to be tested are continuously modified until the better test indexes are met; the automatic debugging method of the wireless terminal meets the test indexes and simultaneously considers the optimal degree of the margin, and the whole process is subjected to full-automatic test, so that the test efficiency can be effectively improved.
Description
Technical Field
The invention relates to the technical field of electronic testing, in particular to an automatic debugging and testing system and method for a wireless terminal.
Background
In current terminal products containing wireless communication modules: the system comprises a mobile phone, a communication module, an automobile OBD/Tracer, a water meter, an electric meter, a gas meter, an intelligent vehicle and the like, wherein products need to meet the corresponding protocol standard requirements. In addition to a hardware device debugging means, the existing terminal product also needs a developer to optimize platform parameters according to a platform test and experience process. The parameter optimization meets the debugging requirement after meeting the index requirement. The part of the debugging process has more repetitive operations to personnel and low testing efficiency, and the terminal only meets certain index requirements and does not achieve the optimal degree of margin.
Disclosure of Invention
In view of the above, an object of the present invention is to provide an automatic testing system and an automatic testing method for a wireless terminal, which can improve the automatic testing efficiency and satisfy the testing index while considering the optimal margin.
The technical scheme adopted by the invention for solving the technical problems is as follows:
a first aspect of the present invention provides an automatic commissioning system for a wireless terminal, the system comprising: the system comprises a regulating and testing system, a comprehensive tester, a piece to be tested and a current source; the debugging system is connected with the comprehensive tester through a GPIB card, and the debugging system is connected with a DUT (device under test) through a serial port or a USB; the regulating and testing system is connected with the current source through a GPIB card; the comprehensive tester and the DUT to be tested are connected through a radio frequency Cable.
In some embodiments, the integrated tester sends a radio frequency line Cable to the DUT to measure a radio frequency index of the DUT, and the integrated tester returns a test case, a test result, and test allowance related to the comparison protocol to the debugging system according to the measurement result.
In some embodiments, the commissioning system includes a logging unit, a commissioning unit, a storage unit, and an analysis unit;
the recording unit is used for recording the parameter information NV and the test allowance of the current DUT to be tested according to the information fed back by the DUT to be tested;
the debugging unit is used for calling a test case in a debugging and testing system and setting the adjustment range and the stepping space of the parameters of the DUT (device under test);
the storage unit is used for storing test cases required by the DUT test;
and the analysis unit is used for analyzing the adjustment parameter test and the allowance in the debugging unit, recording the DUT parameters with the best result and writing the DUT parameters into the DUT to be tested.
The second aspect of the present invention further provides an automatic commissioning method for a wireless terminal, including the following steps:
testing the radio frequency index of the DUT (device under test) through the comprehensive tester, and returning a test case, a test result and test allowance related to the comparison protocol to the debugging and testing system;
the debugging and testing system records the parameter information NV and the test allowance of the DUT (device under test) according to the fed back test case, and searches whether the system has a corresponding test case;
when finding out the corresponding test case, the debugging system sets the adjustment range and the stepping space of the DUT parameters to be tested;
the debugging system calls a debugging tool in the system to modify parameters of the DUT;
and after the parameters are successfully modified, the debugging and testing system controls the power on and off of the DUT to be tested through controlling the current source so as to realize the functions of modifying and storing the parameters of the DUT to be tested.
In some embodiments, after the parameter modification is successful, the adjusting and testing system performs power-on and power-off control on the DUT by controlling the current source to realize the functions of modifying and storing the parameters of the DUT, and then further includes the steps of: and the integrated tester tests the DUT with the modified parameters again, and returns a test case, a test result and comparison allowance to the debugging and testing system.
In some embodiments, the method for testing the DUT with the modified parameters by the integrated tester again and returning the test case, the test result, and the comparison margin to the debugging system further includes the steps of: and the debugging and testing system analyzes the measured test adjustment parameters and test allowance of the DUT to be tested, records the parameters of the DUT to be tested with the best result and writes the parameters into the DUT to be tested.
In some embodiments, the debugging and testing system records the parameter information NV and the test allowance of the DUT currently to be tested according to the fed back test case, and further includes the following steps after finding whether there is a corresponding test case in the system: and when the debugging system does not find a corresponding test case or the test scheme in the debugging system cannot meet the requirement of the test index, the debugging system calls an LOG grabbing tool of the platform to be tested.
In some embodiments, the debugging and testing system records the parameter information NV and the test allowance of the DUT currently to be tested according to the fed back test case, and further includes the following steps after finding whether there is a corresponding test case in the system: and the debugging and testing system analyzes the returned DUT parameter information, the returned test result and the captured LOG information of the current DUT to be tested.
In some embodiments, the debugging and testing system further includes, after analyzing the returned DUT parameter information, test result, and captured LOG information of the current DUT, the steps of: the debugging system realizes the DUT parameter writing process by controlling the current source.
The present application also provides a computer-readable storage medium comprising a processor, a computer-readable storage medium and a computer program stored on the computer-readable storage medium, which computer program, when executed by the processor, performs the steps of the method described above.
The automatic debugging system and the debugging method of the wireless terminal provided by the embodiment of the invention test the radio frequency index of the DUT (device under test) through the comprehensive tester and return a test case, a test result and test allowance related to a comparison protocol to the debugging system of the PC (personal computer) end; the debugging and testing system records the parameter information NV and the test allowance of the current DUT (device under test) according to the fed back test case, searches for the corresponding test case in the system, and sets the adjustment range and the stepping space of the parameters of the DUT, so that the parameters of the DUT are continuously modified until the better test indexes are met; according to the automatic debugging method of the wireless terminal, the testing index is met, the optimal degree of the margin can be considered, and the whole process is subjected to full-automatic testing, so that the testing efficiency can be effectively improved.
Drawings
Fig. 1 is a block diagram of an embodiment of an automatic testing system of a wireless terminal according to the present invention;
fig. 2 is a block diagram of an automatic testing system of a wireless terminal according to another embodiment of the present invention;
fig. 3 is a flowchart of an embodiment of an automatic testing method for a wireless terminal according to the present invention;
fig. 4 is a flowchart of an automatic testing method for a wireless terminal according to another embodiment of the present invention.
Detailed Description
In order to make the technical problems, technical solutions and advantageous effects of the present invention more clear and obvious, the present invention is further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
Aiming at the problems that in the prior art, when the wireless terminal is automatically debugged, the repetitive operation on personnel is more, the testing efficiency is low, the terminal only meets certain index requirements and the optimal degree of the margin is not achieved, the invention provides the automatic debugging system and the debugging method of the wireless terminal, the automatic debugging system and the debugging method can improve the automatic testing efficiency, and the optimal degree of the margin can be considered while meeting the testing index.
The first embodiment is as follows:
referring to fig. 1, the automatic testing system of a wireless terminal mainly includes a testing system, an integrated tester 20, a DUT30 to be tested, and a current source 40, and in this embodiment, the testing system is a PC-side testing system 10. The PC end debugging system 10 is connected with the comprehensive tester 20 through a GPIB (General-Purpose Interface Bus) card; the PC side debugging system 10 and the DUT30 to be tested are connected through a USB/UART serial port, in the application, the connection mode between the PC side debugging system 10 and the DUT30 to be tested is not limited to the USB/UART serial port connection, but also depends on the debugging interface of the wireless terminal, and the connection mode can be selected according to the debugging interface of the wireless terminal; the PC end regulating and testing system 10 is connected with the current source 40 through a GPIB (general purpose interface bus) card; the comprehensive tester 20 is connected with the DUT30 to be tested through a radio frequency Cable; the current source 40 provides power to the DUT30 and provides power to the modules in the automatic test system.
In the automatic testing system of the wireless terminal according to the embodiment of the present application, the PC-side testing system 10 is connected to the integrated tester 20 via a GPIB (General-Purpose Interface Bus) card 101, the PC-side testing system 10 is connected to the DUT30 to be tested via a USB/UART serial port, and the PC-side testing system 10 is connected to the current source 40 via a GPIB card, and then the DUT30 to be tested is electrically connected to the PC-side testing system, so that the PC-side testing system 10 can transmit and receive data signals to and from the integrated tester 20, the DUT30 to be tested, and the current source 40, respectively.
Specifically, the integrated tester 20 sends a radio frequency line Cable to the DUT30 to be tested to measure the radio frequency index of the DUT30 to be tested, and the integrated tester 20 returns the test case, the test result, and the test allowance related to the comparison protocol to the PC-side debugging system 10 according to the measurement result.
Referring to fig. 2, in an embodiment, the PC debugging system 10 includes a recording unit 101, a debugging unit 102, a storage unit 103, and an analysis unit 104.
The recording unit 101 is configured to record parameter information NV and Test margin of a current DUT (Device Under Test) 30 according to information fed back by the DUT 30;
the debugging unit 102 is configured to invoke a test case in the PC-side debugging system 10, and set an adjustment range and a stepping space of parameters of the DUT30 to be tested;
specifically, the debugging unit 102 modifies the parameters of the DUT30 according to the parameter information fed back by the DUT30, and controls the current source 40 to electrically power on and off the DUT30, so as to modify and store the parameters of the DUT 30.
The storage unit 103 is configured to store a test case required by the DUT30 test.
The analysis unit 104 is configured to analyze the adjustment parameter test and the margin in the debugging unit 102, record a parameter with the largest test margin, that is, a parameter of the DUT30 with the best result, and write the parameter into the DUT 30.
In this embodiment, the integrated tester 20 will test the DUT30 with modified parameters again, and return test cases and test results and comparison margins to the PC-side test system 10. The PC terminal debugging system 10 will continue to call the test cases and set the adjustment range and the stepping space of the parameters of the DUT30 to be tested, so as to continuously modify the parameters of the DUT to be tested until the better test indexes are met; the automatic debugging and testing system of the wireless terminal can meet the testing index and also can give consideration to the optimal degree of the allowance, and the whole process is subjected to full-automatic testing, so that the testing efficiency can be effectively improved.
Example two:
referring to fig. 3, an automatic tuning and testing method for a wireless terminal according to the present invention specifically includes the following steps:
s1, respectively connecting a regulating and testing system 10 with a comprehensive tester 20, a DUT30 to be tested and a current source 40;
specifically, in this embodiment, the PC-side debugging system 10 is connected to the integrated tester 20 through a GPIB (General-Purpose-voltage Interface Bus) card; the PC end debugging system 10 is connected with the DUT30 to be tested through a USB/UART serial port; the PC end regulating and testing system 10 is connected with the current source 40 through a GPIB card 101; the comprehensive tester 20 is connected with the DUT30 to be tested through a radio frequency Cable; the current source 40 provides power to the DUT 30.
S2, testing the radio frequency index of the DUT30 to be tested through the comprehensive tester 20, and returning a test case, a test result and test allowance related to a comparison protocol to the PC terminal debugging and testing system 10;
s3, the debugging system 10 records parameter information NV and Test allowance of a DUT (Device Under Test) according to the fed back Test cases, and searches whether a corresponding Test case exists in the system;
and S4, when the corresponding test case is found, the debugging and testing system 10 sets the adjustment range and the stepping space of the DUT parameters to be tested.
S5, the debugging system 10 calls a debugging tool in the system to modify parameters of the DUT;
s6, after the parameters are modified successfully, the debugging and testing system 10 controls the DUT30 to be tested to be powered on and powered off through controlling the current source 10 so as to realize the functions of parameter modification and storage of the DUT30 to be tested.
And S7, the integrated tester 20 tests the DUT30 with the modified parameters again, and returns a test case, a test result and comparison allowance to the debugging and testing system 10.
And S8, analyzing the measured test adjustment parameters and test allowance of the DUT to be tested by the debugging system 10, recording the DUT parameters with the best result, and writing the DUT parameters into the DUT to be tested.
Specifically, the debugging system 10 analyzes the measured test adjustment parameters and test margins of the DUT to be tested, and the debugging system 10 controls the power-on and power-off control of the current source 40, records the DUT parameters to be tested with the best results, and writes the parameters into the DUT to be tested, wherein the parameters with the largest test margins, i.e., the parameters with the best test adjustment, i.e., the final debugging parameters of the DUT to be tested, i.e., the DUT parameters to be tested with the best results.
And (5) repeating the steps S3-S8 in sequence to carry out automatic testing.
Referring to fig. 4, in an embodiment, after the step S3, the method further includes the steps of:
s41, when the debugging system 10 does not find a corresponding test case or a test scheme in the debugging system 10 cannot meet the requirement of a test index, the debugging system 10 calls an LOG grabbing tool of a platform to be tested;
s42, the debugging system 10 compares and analyzes the returned parameter information and the returned Test result of the DUT (Device Under Test Device) of the current Device to be tested with the captured LOG information;
s43, the debugging system 10 realizes the DUT parameter writing process by controlling the current source 40;
specifically, the debugging system 10 analyzes the returned parameter information of the current Device Under Test DUT (Device Under Test DUT), the Test result, and the captured LOG information, sets the parameter with the largest Test margin as the best parameter information, and writes the best parameter information into the DUT through the control current source 40.
S44, judging whether the LOG grabbing tool of the platform to be tested is in normal communication with the piece to be tested, and testing again after the LOG grabbing tool passes normally. Steps S3-S4-S41 to S45 are then repeated.
And S45, providing the stored parameter information of the DUT30 to be tested, the test result of the comprehensive tester 20 and the LOG grabbing information to research and development personnel for analysis.
According to the automatic debugging method of the wireless terminal, the radio frequency index of the DUT30 to be tested is tested through the comprehensive tester 20, and the test case, the test result and the test allowance related to the comparison protocol are returned to the PC terminal debugging system 10; the debugging and testing system 10 records the parameter information NV and the test allowance of the current DUT (device under test) according to the fed back test case, searches for the corresponding test case in the system, and sets the adjustment range and the stepping space of the parameters of the DUT30 to be tested, so that the parameters of the DUT to be tested are continuously modified until the better test indexes are met; according to the automatic debugging method of the wireless terminal, the testing index is met, the optimal degree of the margin can be considered, and the whole process is subjected to full-automatic testing, so that the testing efficiency can be effectively improved.
Example three:
according to an embodiment of the present invention, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the steps in the above-mentioned method for automatically tuning and testing a wireless terminal are implemented, and specific steps are as described in the first embodiment, and are not described herein again.
The memory in the present embodiment may be used to store software programs as well as various data. The memory may mainly include a storage program area and a storage data area, wherein the storage program area may store an operating system, an application program required for at least one function, and the like; the storage data area may store data created according to the use of the mobile phone, and the like. Further, the memory may include high speed random access memory, and may also include non-volatile memory, such as at least one magnetic disk storage device, flash memory device, or other volatile solid state storage device.
According to an example of this embodiment, all or part of the processes in the methods of the embodiments described above may be implemented by a computer program to instruct related hardware, where the program may be stored in a computer-readable storage medium, and in this embodiment of the present invention, the program may be stored in the storage medium of a computer system and executed by at least one processor in the computer system, so as to implement the processes including the embodiments of the methods described above. The storage medium includes, but is not limited to, a magnetic disk, a flash disk, an optical disk, a Read-Only Memory (ROM), and the like.
The preferred embodiments of the present invention have been described above with reference to the accompanying drawings, and are not to be construed as limiting the scope of the invention. Those skilled in the art can implement the invention in various modifications, such as features from one embodiment can be used in another embodiment to yield yet a further embodiment, without departing from the scope and spirit of the invention. Any modification, equivalent replacement and improvement made within the technical idea of using the present invention should be within the scope of the right of the present invention.
Claims (7)
1. An automatic regulating and testing system of a wireless terminal is characterized by comprising a regulating and testing system, a comprehensive tester, a piece to be tested and a current source; the debugging system is connected with the comprehensive tester through a GPIB card, and the debugging system is connected with a DUT (device under test) through a serial port or a USB; the regulating and testing system is connected with the current source through a GPIB card; the comprehensive tester is connected with the DUT to be tested through a radio frequency Cable;
the debugging and testing system comprises a recording unit, a debugging unit, a storage unit and an analysis unit;
the recording unit is used for recording the parameter information NV and the test allowance of the current DUT to be tested according to the information fed back by the DUT to be tested;
the debugging unit is used for calling a test case in the debugging and testing system according to the parameter information NV and the test allowance of the current DUT to be tested, and setting the adjustment range and the stepping space of the parameters of the DUT to be tested;
the storage unit is used for storing test cases required by the DUT test;
and the analysis unit is used for analyzing the adjustment parameter test and the allowance in the debugging unit, recording the DUT parameters with the best result and writing the DUT parameters into the DUT.
2. The system according to claim 1, wherein the integrated tester sends a radio frequency Cable to the DUT to measure a radio frequency indicator of the DUT, and the integrated tester returns a test case, a test result, and a test margin related to the comparison protocol to the testing system according to the measurement result.
3. An automatic commissioning method for a wireless terminal, said method comprising the steps of:
testing the radio frequency index of the DUT (device under test) through the comprehensive tester, and returning a test case, a test result and test allowance related to the comparison protocol to the debugging and testing system;
the debugging and testing system records the parameter information NV and the test allowance of the DUT (device under test) according to the fed back test case, and searches whether the system has a corresponding test case;
when finding out the corresponding test case, the debugging system sets the adjustment range and the stepping space of the DUT parameters to be tested;
the debugging system calls a debugging tool in the system to modify parameters of the DUT;
after the parameters are successfully modified, the debugging and testing system controls the DUT to be tested to be powered on and powered off through the control current source so as to realize the functions of modifying and storing the parameters of the DUT to be tested;
the comprehensive tester tests the DUT with the modified parameters again, and returns a test case, a test result and a comparison allowance to the debugging system;
and the debugging and testing system analyzes the measured test adjustment parameters and the test allowance of the DUT to be tested, records the DUT parameters with the best result and writes the DUT parameters into the DUT to be tested.
4. The method according to claim 3, wherein the method for automatically testing the wireless terminal further comprises the following steps:
and when the debugging system does not find a corresponding test case or the test scheme in the debugging system cannot meet the requirement of the test index, the debugging system calls an LOG grabbing tool of the platform to be tested.
5. The method according to claim 4, wherein the method for automatically testing the wireless terminal further comprises the following steps of, after the testing system records the parameter information NV and the test allowance of the DUT (device under test) according to the fed back test case and finds whether a corresponding test case exists in the system:
and the debugging and testing system analyzes the returned DUT parameter information, the returned test result and the captured LOG information of the current DUT to be tested.
6. The method according to claim 5, wherein the step of analyzing the returned DUT parameter information, test result and captured LOG information of the current DUT by the test system further comprises:
the debugging system realizes the DUT parameter writing process by controlling the current source.
7. A computer-readable storage medium, comprising a computer program stored on the computer-readable storage medium, which, when executed by a processor, carries out the steps of the method according to any one of claims 3 to 6.
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| JP3447638B2 (en) * | 1999-12-24 | 2003-09-16 | 日本電気株式会社 | Semiconductor device test method and system, and recording medium |
| US20060036907A1 (en) * | 2004-08-11 | 2006-02-16 | Emc Corporation | Area-and product-independent test automation system and method for automatically synchronizing tests of multiple devices |
| US8805306B2 (en) * | 2012-09-07 | 2014-08-12 | Apple Inc. | Method for determining optimum power amplifier configurations using list mode testing |
| US9261098B2 (en) * | 2013-08-13 | 2016-02-16 | Lenovo Enterprise Solutions (Singapore) Pte. Ltd. | Fan speed and memory regulator control based on memory margin |
| CN104954085A (en) * | 2015-06-24 | 2015-09-30 | 上海斐讯数据通信技术有限公司 | Mobile terminal GPRS (general packet radio service) radio frequency testing system and method |
| US10482006B2 (en) * | 2017-06-16 | 2019-11-19 | Cognizant Technology Solutions India Pvt. Ltd. | System and method for automatically categorizing test cases for model based testing |
| CN113396396A (en) * | 2019-01-31 | 2021-09-14 | 特克特朗尼克公司 | System, method and apparatus for high speed input/output margin testing |
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