CN112213608A - 一种半导体器件故障检测装置 - Google Patents
一种半导体器件故障检测装置 Download PDFInfo
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- CN112213608A CN112213608A CN202011086458.5A CN202011086458A CN112213608A CN 112213608 A CN112213608 A CN 112213608A CN 202011086458 A CN202011086458 A CN 202011086458A CN 112213608 A CN112213608 A CN 112213608A
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 42
- 238000001514 detection method Methods 0.000 title claims abstract description 30
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- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
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CN202011086458.5A CN112213608B (zh) | 2020-10-12 | 2020-10-12 | 一种半导体器件故障检测装置 |
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CN202011086458.5A CN112213608B (zh) | 2020-10-12 | 2020-10-12 | 一种半导体器件故障检测装置 |
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CN112213608A true CN112213608A (zh) | 2021-01-12 |
CN112213608B CN112213608B (zh) | 2024-07-23 |
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Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201255751Y (zh) * | 2008-08-29 | 2009-06-10 | 上海千驰电力设备有限公司 | 零序电流指示器 |
CN105932403A (zh) * | 2016-06-23 | 2016-09-07 | 福建南安市泉盛电子有限公司 | 一种带有指示灯的对讲机天线 |
CN205582835U (zh) * | 2016-03-04 | 2016-09-14 | 朱佳豪 | 一种高安全性集成电路继电器 |
CN109164353A (zh) * | 2018-09-27 | 2019-01-08 | 国网湖南省电力有限公司电力科学研究院 | 一种用于配电网上的故障指示器 |
CN208384044U (zh) * | 2018-07-20 | 2019-01-15 | 无锡其诺电气有限公司 | 线圈电气性能波形检测装置 |
CN209418143U (zh) * | 2019-07-06 | 2019-09-20 | 兴化市华讯达电子有限公司 | 一种具有故障检测功能的电子蜂鸣器 |
CN110275100A (zh) * | 2019-08-01 | 2019-09-24 | 天台卫冕智能科技有限公司 | 一种半导体导电性能测试系统 |
CN210465601U (zh) * | 2019-08-09 | 2020-05-05 | 贵州永兴建设工程质量检测有限公司 | 用于半导体测试的夹持装置 |
CN211235934U (zh) * | 2019-11-11 | 2020-08-11 | 芯创(湖北)半导体科技有限公司 | 一种二极管生产检测装置 |
CN211404462U (zh) * | 2020-02-11 | 2020-09-01 | 厦门晶星电子材料有限公司 | 一种发光二极管的连接检测装置 |
-
2020
- 2020-10-12 CN CN202011086458.5A patent/CN112213608B/zh active Active
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN201255751Y (zh) * | 2008-08-29 | 2009-06-10 | 上海千驰电力设备有限公司 | 零序电流指示器 |
CN205582835U (zh) * | 2016-03-04 | 2016-09-14 | 朱佳豪 | 一种高安全性集成电路继电器 |
CN105932403A (zh) * | 2016-06-23 | 2016-09-07 | 福建南安市泉盛电子有限公司 | 一种带有指示灯的对讲机天线 |
CN208384044U (zh) * | 2018-07-20 | 2019-01-15 | 无锡其诺电气有限公司 | 线圈电气性能波形检测装置 |
CN109164353A (zh) * | 2018-09-27 | 2019-01-08 | 国网湖南省电力有限公司电力科学研究院 | 一种用于配电网上的故障指示器 |
CN209418143U (zh) * | 2019-07-06 | 2019-09-20 | 兴化市华讯达电子有限公司 | 一种具有故障检测功能的电子蜂鸣器 |
CN110275100A (zh) * | 2019-08-01 | 2019-09-24 | 天台卫冕智能科技有限公司 | 一种半导体导电性能测试系统 |
CN210465601U (zh) * | 2019-08-09 | 2020-05-05 | 贵州永兴建设工程质量检测有限公司 | 用于半导体测试的夹持装置 |
CN211235934U (zh) * | 2019-11-11 | 2020-08-11 | 芯创(湖北)半导体科技有限公司 | 一种二极管生产检测装置 |
CN211404462U (zh) * | 2020-02-11 | 2020-09-01 | 厦门晶星电子材料有限公司 | 一种发光二极管的连接检测装置 |
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Effective date of registration: 20240625 Address after: 518129 Room 502, No. 7-1 Lipu Street, Dafapu Community, Bantian Street, Longgang District, Shenzhen City, Guangdong Province Applicant after: Shenzhen Shengchuangxin Semiconductor Co.,Ltd. Country or region after: China Address before: 518000 a5-802, Hangcheng innovation and entrepreneurship Park, 159 Hangcheng Avenue, Sanwei community, Hangcheng street, Bao'an District, Shenzhen City, Guangdong Province Applicant before: Tao Jin Country or region before: China |
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