CN112213544A - Voltage detection circuit and voltage detection method - Google Patents
Voltage detection circuit and voltage detection method Download PDFInfo
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Abstract
The invention relates to the field of voltage detection, in particular to a voltage detection circuit and a voltage detection method. The voltage detection circuit comprises a reference power circuit and a detection chip, and the detection chip is electrically connected with the reference power circuit; the reference power supply circuit is used for providing a reference voltage V1; the detection chip is used for acquiring a reference voltage V1 and acquiring a first detection voltage V2 according to a reference voltage V1, electrically connected with a node to be detected, and acquiring a second detection voltage V3 according to the voltage of the node to be detected; the detection chip is also used for calculating the voltage of the node to be detected according to the reference voltage V1, the first detection voltage V2 and the second detection voltage V3. The voltage detection method adopts the voltage detection circuit to detect the voltage. The voltage detection circuit and the voltage detection method have the advantages of simple voltage detection and accurate detection result.
Description
Technical Field
The invention relates to the field of voltage detection, in particular to a voltage detection circuit and a voltage detection method.
Background
Voltage sensing has a corresponding need in many areas. When detecting voltage, it is troublesome to realize accurate voltage detection, and a circuit for detecting voltage is complicated.
Therefore, how to provide a simple solution for detecting the voltage is a need in the prior art.
Disclosure of Invention
The invention mainly aims to provide a voltage detection circuit and a voltage detection method, and aims to solve the technical problem that the existing scheme is troublesome in voltage detection.
In order to achieve the above object, the present invention provides a voltage detection circuit for detecting a voltage of a node to be detected, wherein the voltage detection circuit includes a reference power circuit and a detection chip, and the detection chip is electrically connected to the reference power circuit; the reference power supply circuit is used for providing a reference voltage V1;
the detection chip is used for acquiring a reference voltage V1 and acquiring a first detection voltage V2 according to a reference voltage V1, electrically connected with a node to be detected, and acquiring a second detection voltage V3 according to the voltage of the node to be detected;
the detection chip is also used for calculating the voltage of the node to be detected according to the reference voltage V1, the first detection voltage V2 and the second detection voltage V3.
Preferably, when the reference voltage V1 is not equal to the first detection voltage V2, the voltage of the node to be tested is V1V 3/V2,
if the configuration of the sense die is adjusted according to the reference voltage V1 and the first sensing voltage V2 to calibrate the sense die such that the voltage of the node under test is equal to V3 when the reference voltage V1 is equal to the first sensing voltage V2.
Preferably, the detection chip comprises a first detection end and a second detection end, and the first detection end is connected with the reference power circuit; the second detection end is used for being electrically connected with the node to be detected.
Preferably, the voltage detection circuit further includes a first voltage division circuit and a second voltage division circuit, the reference power supply circuit is electrically connected to the first detection terminal through the first voltage division circuit, and the second voltage division circuit is electrically connected to the node to be detected through the second voltage division circuit.
Preferably, the first voltage dividing circuit includes a first resistor and a second resistor, a first end of the first resistor is electrically connected to the reference power circuit, a second end of the first resistor is electrically connected to the first detection end and the first end of the second resistor, respectively, and a second end of the second resistor is grounded.
Preferably, the first voltage dividing circuit further includes a first capacitor, a first end of the first capacitor is electrically connected to a first end of the second resistor, and a second end of the first capacitor is electrically connected to a second end of the second resistor.
Preferably, the second voltage-dividing circuit includes a third resistor and a fourth resistor, a first end of the third resistor is electrically connected to the node to be detected, a second end of the third resistor is electrically connected to the second detection end and the first end of the fourth resistor, respectively, and a second end of the fourth resistor is grounded.
Preferably, the second voltage-dividing circuit further includes a second capacitor, a first end of the second capacitor is electrically connected to a first end of the fourth resistor, and a second end of the second resistor is electrically connected to a second end of the fourth resistor.
The invention also provides a voltage detection method, which adopts the voltage detection circuit to detect the voltage of a node to be detected, and the voltage detection method comprises the following steps:
acquiring a detection reference voltage V1 of a reference power supply circuit;
reading the first detection voltage V2;
adjusting the configuration of a detection chip according to the reference voltage V1 and the first detection voltage V2;
determining whether the detection reference voltage V1 is equal to the first detection voltage V2;
if the detection reference voltage V1 is equal to the first detection voltage V2, the voltage of the node under test is read to obtain a second detection voltage V3, wherein the voltage of the node under test is V3.
The invention also provides a voltage detection method, which adopts the voltage detection circuit to detect the voltage of a node to be detected, and the voltage detection method comprises the following steps:
acquiring a reference voltage V1 of a reference power supply circuit;
reading the first detection voltage V2;
acquiring a second detection voltage V3 according to the voltage of the node to be detected;
and calculating the voltage of the node to be tested, wherein the voltage of the node to be tested is V1V 3/V2.
Preferably, before acquiring the second detection voltage V3 according to the voltage of the node to be detected, the method further includes:
the ratio V1/V2 of the reference voltage V1 and the first detection voltage V2 is stored.
Compared with the prior art, the voltage detection circuit and the voltage detection method provided by the invention have the advantages of simple voltage detection, easiness in realization and high voltage detection precision.
Drawings
FIG. 1 is a schematic diagram of a module structure of a voltage detection circuit according to the present invention;
FIG. 2 is a schematic diagram of a voltage detection circuit according to an embodiment of the present invention;
FIG. 3 is a schematic flow chart illustrating a voltage detection method according to an embodiment of the invention;
fig. 4 is a schematic flow chart of a voltage detection method according to another embodiment of the invention.
The implementation, functional features and advantages of the objects of the present invention will be further explained with reference to the accompanying drawings.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The terms "first," "second," "third," "fourth," and the like in the description and in the claims of the present application and in the drawings described above, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It will be appreciated that the data so used may be interchanged under appropriate circumstances such that the embodiments described herein may be practiced otherwise than as specifically illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It should be noted that the description relating to "first", "second", etc. in the present invention is for descriptive purposes only and is not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between various embodiments may be combined with each other, but must be realized by a person skilled in the art, and when the technical solutions are contradictory or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
Referring to fig. 1, the present invention provides a voltage detection circuit 10 for detecting a voltage of a node to be detected. The voltage detection circuit 10 includes a reference power supply circuit 11, a first voltage division circuit 12, a second voltage division circuit 13, and a detection chip 14. The reference power circuit 11 is connected with the detection chip 14 through the first voltage division circuit 12 in a telecommunication mode, the node to be detected is electrically connected with the second voltage division circuit 13, and the second voltage division circuit 13 is connected with the detection chip 14 in a telecommunication mode. The reference power circuit 11 provides a reference voltage V1, the reference voltage is divided by the first voltage dividing circuit 12, the detection chip 14 is configured to obtain a specific value of the reference voltage V1, and obtain a first detection voltage V2 according to the divided reference voltage V1, the voltage of the node to be detected is divided by the second voltage circuit, the detection chip 14 detects the voltage of the divided node to be detected to obtain a second detection voltage V3, and the detection chip 14 can calculate the voltage of the node to be detected according to a relationship between the first detection voltage V2 and the second detection voltage.
The node to be measured is an electrical node of the detected voltage, the node to be measured can be an electrical output node of a certain electronic component, and the node to be measured can also be an output end of a certain circuit or an electrical node of the middle part of a certain circuit needing voltage measurement.
Referring to fig. 2, the first voltage divider circuit 12 is used to make the voltage detected by the detecting chip 14 conform to the voltage range detected by the detecting chip 14. The first voltage divider circuit 12 includes a first resistor R1, a second resistor R2, and a first capacitor C1, wherein a first end of the first resistor R1 is electrically connected to the reference power circuit 11, a second end of the first resistor R1 is electrically connected to the detection chip 14 and a first end of the second resistor R2, respectively, and a second end of the second resistor R2 is grounded. The first end of the first capacitor C1 is electrically connected to the first end of the second resistor R2, and the second end of the first capacitor C1 is electrically connected to the second end of the second resistor R2. The first capacitor C1 can improve the stability of the detecting chip 14 when obtaining the first detecting voltage V2. The detection chip 14 can detect the reference voltage V1 divided by the first resistor R1 of the first voltage dividing circuit 12.
The second voltage dividing circuit 13 is used to make the voltage detected by the detection chip 14 conform to the voltage detection range of the detection chip 14. The second voltage division circuit 13 includes a third resistor R3, a fourth resistor R4 and a second capacitor C2, a first end of the third resistor R3 is electrically connected to the node to be measured, a second end of the third resistor R3 is electrically connected to the first ends of the detection chip 14 and the fourth resistor R4, and a second end of the fourth resistor R4 is grounded. The first end of the second capacitor C2 is electrically connected to the first end of the fourth resistor R4, and the second end of the second capacitor C2 is electrically connected to the second end of the fourth resistor R4. The second capacitor C2 can improve the stability of the detecting chip 14 when obtaining the second detecting voltage V3. The detection chip 14 can detect the voltage of the node to be detected after being divided by the third resistor R3 of the second voltage dividing circuit 13. In this embodiment, the ratio of the resistance of the first resistor R1 to the resistance of the second resistor R2 is equal to the ratio of the resistance of the third resistor R3 to the resistance of the fourth resistor R4, and if the resistance of the first resistor R1 is R1, the resistance of the second resistor R2 is R2, the resistance of the third resistor R3 is R3, and the resistance of the fourth resistor R4 is R4, then R1/R2 is R3/R4.
The reference voltage V1 provided by reference supply circuit 11 is known and accurate. For example, the reference power supply circuit 11 supplies a reference voltage of 5V. The reference power supply circuit 11 includes a power supply chip U1, and the model of the power supply chip U1 may be "BU 33TD3 WG". The power chip U1 includes the following pins:
a first pin: the first pin is used for obtaining working power so as to enable the power supply chip U1 to work. The first pin is electrically connected with an external power supply. The first pin may be an IN pin (pin No. 1).
A second pin: and the second pin outputs reference voltage when the first pin acquires working electric energy. The second pin is electrically connected to a first end of the resistor R1 of the first voltage divider circuit 12. It can be understood that the type of the power chip U1 is not limited, and a stable reference voltage can be output. The second pin may be an OUT pin (pin No. 5).
In this embodiment, the reference power circuit 11 further includes a third capacitor C3 and a fourth capacitor C4, a first end of the third capacitor C3 is electrically connected to the first pin, and a second end of the third capacitor C3 is grounded; the first terminal of the fourth capacitor C4 is electrically connected to the second pin, and the second terminal of the fourth capacitor C4 is grounded. The third capacitor C3 is used for filtering, so that the voltage provided by the power supply chip is more stable. The fourth capacitor C4 makes the voltage output by the power chip U1 more stable.
The model of the detection chip 14 is "STM 32F103R 8", and the detection chip 14 comprises:
the first detection terminal is used for detecting the voltage at the first detection terminal, and the detection chip 14 converts the detected voltage at the first detection terminal from an analog signal to a digital signal. The first detection terminal is electrically connected to the second terminal of the first resistor R1 of the first voltage divider circuit 12. The first detection terminal detects the voltage of the second terminal of the first resistor R1 to obtain a first detection voltage V2, and the value of the first detection voltage V2 is determined. The first detection terminal is the first ADC port of the detection chip 14. The first detection terminal is the ADC0 pin of the detection chip 14.
And a second detection terminal for detecting a voltage at the second detection terminal, wherein the detection chip 14 converts the detected voltage at the second detection terminal from an analog signal to a digital signal. The second detection terminal is electrically connected to the second terminal of the third resistor R3 of the second voltage divider circuit 13. The third detection terminal detects the voltage of the second terminal of the third resistor R3 to obtain a second detection voltage V3, and the value of the second detection voltage V3 is determined. The second detection terminal is a second ADC port of the detection chip 14. The second detection terminal is the ADC1 pin of the detection chip 14.
And the power supply pin is used for supplying working electric energy to the detection chip 14. The power supply pin may be electrically connected to an external power supply, or the power supply pin may be electrically connected to the second pin of the reference power supply circuit 11, as long as the working electric energy for detecting the chip 14 can be obtained.
The detection chip 14 is further configured to calculate a voltage of a node to be detected according to a reference voltage V1, a first detection voltage V2, and a second detection voltage V3, where when the reference voltage V1 is not equal to the first detection voltage V2, the voltage of the node to be detected is V1V 3/V2. It is understood that if the configuration of the sense die is adjusted according to the reference voltage V1 and the first sensing voltage V2 to calibrate the sense die, so that the reference voltage V1 is equal to the first sensing voltage V2, and then the second sensing voltage V3 is detected, the voltage of the node under test is equal to V3.
It is understood that the second terminal of the first resistor R1 and the second terminal of the third resistor R3 may be connected to the same sensing terminal of the sense chip 14, such as the second terminal of the first resistor R1 and the second terminal of the third resistor R3 are connected to the first sensing terminal at the same time; or the second end of the first resistor R1 and the second end of the third resistor R3 are connected with the second detection end at the same time, so that the reference power circuit 11 and the node to be detected are not powered at the same time, and the voltage of the node to be detected can be detected.
In use, the reference power supply circuit 11, the first voltage dividing circuit 12, the second voltage dividing circuit 13 and the detection chip 14 of the voltage detection circuit 10 may be integrated, that is, a voltage detection device is provided, such that the voltage detection device includes the reference power supply circuit 11, the first voltage dividing circuit 12, the second voltage dividing circuit 13 and the detection chip 14. It is also possible to integrate only the first voltage-dividing circuit 12, the second voltage-dividing circuit 13, and the detection chip 14, i.e., to provide a voltage detection device including the first voltage-dividing circuit 12, the second voltage-dividing circuit 13, and the detection chip 14.
Referring to fig. 3, the present invention further provides a voltage detection method, which uses the voltage detection circuit to detect a voltage of a node to be detected, the voltage detection method includes:
s11: acquiring a reference voltage V1 of a reference power supply circuit;
the detection chip acquires an actual value of the reference voltage V1. Either user input or pre-stored.
S12: reading the first detection voltage V2;
the first detection voltage V2 can be read by the detection chip, and specifically, the reference voltage V1 can be read by the first detection terminal of the detection chip. The read first detection voltage V2 is derived from the reference voltage V1 of the circuit. The value of the first detection voltage V2 read out by the divided voltage V1 of the first voltage dividing circuit is not equal to the actual value of the reference voltage V1 of the reference power supply circuit. If the value of the reference voltage V1 is 5V, the value of the first detection voltage V2 read by the detection chip is 4V.
S13: adjusting the configuration of a detection chip according to the reference voltage V1 and the first detection voltage V2;
when the reference voltage V1 and the first detection voltage V2 are different, the arrangement of the detection chips is adjusted so that the reference voltage V1 and the first detection voltage V2 obtained by reading the reference voltage V1 by the first detection chip have the same value, which means that the actual values of the first detection voltage V2 and the reference voltage V1 read by the detection chips are equal. When the configuration of the detection chip is adjusted, the value of the first detection voltage V2 read by the detection chip is unchanged, the judgment of the first detection voltage V2 read by the detection chip is changed, for example, the value of the reference voltage V1 is 5V, the voltage value for supplying power to the first detection end is 4V, the detection chip considers that the voltage value at the first detection end is 4V before the configuration of the detection chip is adjusted, and the detection chip considers that the voltage at the first detection end is 5V after the configuration of the detection chip is adjusted; if the reference voltage V1 has a value of 5V and the voltage value for supplying power to the first detection terminal has a value of 4V, the detection chip considers that the voltage value at the first detection terminal is 3V before the configuration of the detection chip is adjusted because of a problem with the detection chip itself, and the detection chip considers that the voltage at the first detection terminal is 5V after the configuration of the detection chip is adjusted. The configuration of the detection chip is adjusted, that is, the detection chip is calibrated, and the calibration can be performed when the voltage detection circuit leaves a factory, so that the detected voltage is the actual voltage.
S14: determining whether the detection reference voltage V1 is equal to the first detection voltage V2;
the adjustment of the configuration of the detection chip is also stopped when the detection reference voltage V1 is equal to the first detection voltage V2. When the detection reference voltage V1 is not equal to the first detection voltage V2, the configuration of the detection chip is continuously adjusted according to the reference voltage V1 and the first detection voltage V2.
S15: if the detection reference voltage V1 is equal to the first detection voltage V2, the voltage of the node under test is read to obtain a second detection voltage V3, wherein the voltage of the node under test is V3.
The voltage of the node to be detected can be obtained by the detection chip. Specifically, the voltage of the node to be detected is read by the first detection end of the detection chip, and also by the second detection end of the detection chip. The actual values of the voltage and the voltage read by the detection chip are equal, and when the voltage of the node to be detected is read, the obtained second detection voltage V3 is equal to the actual voltage value of the node to be detected.
The voltage detection method of the embodiment can calibrate the detection chip before delivery, so that the voltage detection is accurate when the detection chip detects the voltage, and the accuracy of the voltage detection is improved.
Referring to fig. 4, the present invention further provides a voltage detection method, which uses the voltage detection circuit to detect a voltage of a node to be detected, the voltage detection method includes:
s21: acquiring a reference voltage V1 of a reference power supply circuit;
the detection chip acquires an actual value of the reference voltage V1. Either user input or pre-stored.
S22: reading the first detection voltage V2;
the first detection voltage V2 can be read by the detection chip, and specifically, the reference voltage V1 can be read by the first detection terminal of the detection chip. The read first detection voltage V2 is derived from the reference voltage V1 of the circuit. The value of the first detection voltage V2 read out by the divided voltage V1 of the first voltage dividing circuit is not equal to the actual value of the reference voltage V1 of the reference power supply circuit. If the value of the reference voltage V1 is 5V, the value of the first detection voltage V2 read by the detection chip is 4V.
S23: acquiring a second detection voltage V3 according to the voltage of the node to be detected;
the voltage of the node to be detected can be obtained by the detection chip. Specifically, the voltage of the node to be detected may be obtained by a first detection end of the detection chip, or may be obtained by a second detection end of the detection chip. The value of the second detection voltage V3 is determined.
S24: and calculating the voltage of the node to be tested, wherein the voltage of the node to be tested is V1V 3/V2.
For example, when the reference voltage V1 is 5V, the detection chip reads the reference voltage V1, the first detection voltage obtained is 4V, and the voltage of the node to be detected read by the detection chip is 8V, the voltage of the node to be detected can be calculated to be 10V.
The voltage detection method of the embodiment can calibrate the numerical value during calculation, so that the voltage detection is accurate when the voltage detection chip detects the voltage, and the accuracy of the voltage detection is improved.
Optionally, before acquiring the second detection voltage V3 according to the voltage of the node to be detected, the method may further include:
the ratio V1/V2 of the reference voltage V1 and the first detection voltage V2 is stored.
After the first detection voltage V2 is obtained, the detection chip stores the ratio V1/V2 of the reference voltage V1 and the first detection voltage V2, and when the voltage of the node to be detected is detected subsequently, the reference voltage does not need to be detected first every time, so that the efficiency of detecting the voltage of the node to be detected is improved.
It should be noted that the above-mentioned numbers of the embodiments of the present invention are merely for description, and do not represent the merits of the embodiments. And the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, apparatus, article, or method that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, apparatus, article, or method. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a process, apparatus, article, or method that includes the element.
The above description is only a preferred embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes, which are made by using the contents of the present specification and the accompanying drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.
Claims (11)
1. A voltage detection circuit is used for detecting the voltage of a node to be detected, and is characterized in that: the voltage detection circuit comprises a reference power circuit and a detection chip, and the detection chip is electrically connected with the reference power circuit; the reference power supply circuit is used for providing a reference voltage V1;
the detection chip is used for acquiring a reference voltage V1 and acquiring a first detection voltage V2 according to a reference voltage V1, electrically connected with a node to be detected, and acquiring a second detection voltage V3 according to the voltage of the node to be detected;
the detection chip is also used for calculating the voltage of the node to be detected according to the reference voltage V1, the first detection voltage V2 and the second detection voltage V3.
2. The voltage detection circuit of claim 1, wherein:
when the reference voltage V1 is not equal to the first detection voltage V2, the voltage of the node to be tested is V1V 3/V2,
if the configuration of the sense die is adjusted according to the reference voltage V1 and the first sensing voltage V2 to calibrate the sense die such that the voltage of the node under test is equal to V3 when the reference voltage V1 is equal to the first sensing voltage V2.
3. The voltage detection circuit of claim 1, wherein: the detection chip comprises a first detection end and a second detection end, and the first detection end is connected with the reference power supply circuit; the second detection end is used for being electrically connected with the node to be detected.
4. The voltage detection circuit of claim 3, wherein: the voltage detection circuit further comprises a first voltage division circuit and a second voltage division circuit, the reference power supply circuit is electrically connected with the first detection end through the first voltage division circuit, and the second voltage division circuit is electrically connected with the node to be detected through the second voltage division circuit.
5. The voltage detection circuit of claim 4, wherein: the first voltage division circuit comprises a first resistor and a second resistor, a first end of the first resistor is electrically connected with the reference power circuit, a second end of the first resistor is electrically connected with the first detection end and a first end of the second resistor respectively, and a second end of the second resistor is grounded.
6. The voltage detection circuit of claim 5, wherein: the first voltage division circuit further comprises a first capacitor, a first end of the first capacitor is electrically connected with a first end of the second resistor, and a second end of the first capacitor is electrically connected with a second end of the second resistor.
7. The voltage detection circuit of claim 4, wherein: the second voltage division circuit comprises a third resistor and a fourth resistor, the first end of the third resistor is electrically connected with the node to be detected, the second end of the third resistor is electrically connected with the second detection end and the first end of the fourth resistor respectively, and the second end of the fourth resistor is grounded.
8. The voltage detection circuit of claim 7, wherein: the second voltage division circuit further comprises a second capacitor, a first end of the second capacitor is electrically connected with a first end of the fourth resistor, and a second end of the second resistor is electrically connected with a second end of the fourth resistor.
9. A voltage detection method which uses the voltage detection circuit according to any one of claims 1 to 8 to detect a voltage of a node to be detected, characterized in that: the voltage detection method comprises the steps of,
acquiring a reference voltage V1 of a reference power supply circuit;
reading the first detection voltage V2;
adjusting the configuration of a detection chip according to the reference voltage V1 and the first detection voltage V2;
determining whether the detection reference voltage V1 is equal to the first detection voltage V2;
if the detection reference voltage V1 is equal to the first detection voltage V2, the voltage of the node under test is read to obtain a second detection voltage V3, wherein the voltage of the node under test is V3.
10. A voltage detection method which uses the voltage detection circuit according to any one of claims 1 to 8 to detect a voltage of a node to be detected, characterized in that: the voltage detection method comprises the steps of,
acquiring a reference voltage V1 of a reference power supply circuit;
reading the first detection voltage V2;
acquiring a second detection voltage V3 according to the voltage of the node to be detected;
and calculating the voltage of the node to be tested, wherein the voltage of the node to be tested is V1V 3/V2.
11. The voltage detection method according to claim 10, characterized in that: before the obtaining of the second detection voltage V3 according to the voltage of the node to be detected, the method further includes:
the ratio V1/V2 of the reference voltage V1 and the first detection voltage V2 is stored.
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| CN104062487A (en) * | 2013-03-20 | 2014-09-24 | 鸿富锦精密工业(武汉)有限公司 | Voltage detection system |
| CN104483529A (en) * | 2014-12-26 | 2015-04-01 | 青岛歌尔声学科技有限公司 | Negative voltage detecting device and detecting method |
| CN204514995U (en) * | 2015-03-04 | 2015-07-29 | 上海顶策科技有限公司 | For the high-accuracy voltage metering circuit that chip ATE tests |
| CN105699904A (en) * | 2016-01-19 | 2016-06-22 | 北京华大信安科技有限公司 | Battery voltage detecting circuit and method |
| CN109470913A (en) * | 2018-09-19 | 2019-03-15 | 东莞市正旭新能源设备科技有限公司 | A method of supply voltage is pushed away by reference to voltage is counter |
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