CN112162124A - High-speed high-precision digital-to-analog conversion chip testing equipment convenient to operate - Google Patents
High-speed high-precision digital-to-analog conversion chip testing equipment convenient to operate Download PDFInfo
- Publication number
- CN112162124A CN112162124A CN202011078999.3A CN202011078999A CN112162124A CN 112162124 A CN112162124 A CN 112162124A CN 202011078999 A CN202011078999 A CN 202011078999A CN 112162124 A CN112162124 A CN 112162124A
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- gear
- arc gear
- fixedly connected
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- rocker
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- 238000012360 testing method Methods 0.000 title claims abstract description 23
- 238000006243 chemical reaction Methods 0.000 title claims abstract description 14
- 230000005540 biological transmission Effects 0.000 claims abstract description 36
- 238000007789 sealing Methods 0.000 claims description 5
- 230000000694 effects Effects 0.000 abstract description 6
- 238000000034 method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses high-speed high-precision digital-to-analog conversion chip testing equipment convenient to operate, and relates to the technical field of chip replacement. The device includes the fuselage, the left side fixedly connected with rocker of fuselage, the rocker passes through the rocker pivot and is connected with the transmission of a transmission post, arc gear of fixedly connected with on the transmission post, arc gear and No. two arc gear meshing, No. two arc gear are through the bottom inner wall fixed connection of a telescopic link and fuselage, No. two arc gear and a gear swing joint, No. one gear and No. two gear meshing, No. two arc gear and the quantity of a telescopic link be two, and the device can reach through the rocker, and when needs tested the chip, the rocker moves down, and No. two arc gear and a gear meshing in bottom, No. one gear and No. two gear meshing, No. two gears drive the chip and carry out the rotation test, so just reached the effect of test.
Description
Technical Field
The invention relates to the technical field of chip replacement, in particular to high-speed high-precision digital-to-analog conversion chip testing equipment convenient to operate.
Background
Integrated circuits or microcircuits, microchips, chips/chips, are a way in electronics to miniaturize circuits (including primarily semiconductor devices, including passive components, etc.) and are often fabricated on the surface of semiconductor wafers.
When testing the chip, when the staff changes the chip, because the volume of chip is too small, therefore need to change the test with the help of the apparatus in the process of changing the chip, therefore when changing the chip, it is very troublesome.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides the high-speed high-precision digital-to-analog conversion chip testing equipment which is convenient to operate, and solves the problem that different chips are inconvenient to replace.
(II) technical scheme
In order to achieve the purpose, the invention is realized by the following technical scheme: a high-speed high-precision digital-to-analog conversion chip testing device convenient to operate comprises a machine body, wherein a rocker is fixedly connected to the left side of the machine body and is in transmission connection with a first transmission column through a rocker rotating shaft, a first arc gear is fixedly connected to the first transmission column and is meshed with a second arc gear, the second arc gear is fixedly connected to the inner wall of the bottom of the machine body through a first telescopic rod and is movably connected with a first gear, the first gear is meshed with the second gear, the number of the second arc gear and the number of the first telescopic rod are two, the second arc gear and the first telescopic rod are symmetrical by taking the first arc gear as a symmetry axis, the second arc gear is meshed with a third gear which is in transmission connection with the third arc gear, and the third arc gear is meshed with a fourth arc gear, no. four arc gears are connected with a threaded rod transmission, a threaded rod and a rack threaded connection, a rack and No. four gear engagement, No. four gears are connected with No. two threaded rod transmissions, No. two threaded rods and fly leaf threaded connection, No. two racks of left side fixedly connected with of fly leaf, No. two racks are through No. five gears and No. three rack engagement, No. two telescopic links of bottom fixedly connected with of No. three racks.
Preferably, the left side of the third rack is fixedly connected with a first hydraulic rod.
Preferably, the first hydraulic piston is fixedly connected to the bottom of the first hydraulic rod.
Preferably, the first hydraulic piston is connected with the second hydraulic piston sealing piston through a hydraulic chamber.
Preferably, the right side of the second hydraulic piston is fixedly connected with a second hydraulic rod.
Preferably, the rocker is connected with the left side surface of the machine body in a sliding mode.
(III) advantageous effects
The invention provides a high-speed high-precision digital-to-analog conversion chip test device which is convenient to operate. The method has the following beneficial effects:
(1) the device can be achieved through a rocker, when a chip needs to be replaced, a worker can move the rocker up and down due to the fact that the rocker is in sliding connection with the left side of the machine body and is in transmission connection with a first transmission column through a rocker rotating shaft, the first transmission column is fixedly connected with a first arc gear, the first arc gear is meshed with a second arc gear, the second arc gear is fixedly connected with a first telescopic rod, the number of the second arc gear and the number of the first telescopic rod are two, the second arc gear and the first telescopic rod are symmetrical by taking the first arc gear as a symmetrical axis, when the rocker moves upwards, the second arc gear is meshed with a third gear, the rocker is rocked to rotate the third gear, the third gear is in transmission connection with the third arc gear, the third arc gear is meshed with a fourth arc gear, and the fourth arc gear is in transmission connection with a first threaded rod, the first threaded rod is in transmission connection with the first rack, so that when the rocker is rotated, the first rack moves rightwards, the first rack is meshed with the fourth gear, the fourth gear is in transmission connection with the second threaded rod, the second threaded rod is in threaded connection with the movable plate, so that when the first rack moves rightwards, the movable plate is driven to move upwards, the left side of the movable plate is fixedly connected with the second rack, the second rack is meshed with the third rack through the fourth gear, so that when the movable plate moves upwards, the third rack moves downwards, the third rack is fixedly connected with the first hydraulic rod, when the third rack moves upwards, the first hydraulic rod also moves upwards along with the third rack, the bottom of the first hydraulic rod is fixedly connected with the first hydraulic piston, the first hydraulic piston is connected with the second hydraulic piston sealing piston through the hydraulic chamber, the right side of the second hydraulic piston is fixedly connected with the second hydraulic rod, and when the first hydraulic rod moves upwards, the second hydraulic rod can be driven to move leftwards, so that the chip is driven to replace the tested chip leftwards, and the effect of facilitating chip replacement is achieved.
(2) The device can reach through the rocker, and when needs tested the chip, the rocker moves down, and No. two arc gears in bottom and a gear engagement, a gear and No. two gear engagement, No. two gears drive the chip and carry out the rotation test, so just reached the effect of test.
Drawings
FIG. 1 is a schematic view of the overall structure of the present invention;
FIG. 2 is a schematic view of part A of the present invention;
FIG. 3 is a schematic view of part B of the present invention.
In the figure: the hydraulic cylinder comprises a body 1, a rocker 2, a transmission column 3, an expansion rod 4, an arc gear 5 II, an arc gear 6I, a gear 7 III, a gear 8I, a gear 9 II, a hydraulic rod 10 II, a hydraulic piston 11 II, a hydraulic cabin 12, a hydraulic piston 13I, a hydraulic rod 14I, an expansion rod 15 II, a rack 16 III, a gear 17V, a rack 18 II, a movable plate 19, a threaded rod 20 II, a gear 21 IV, a rack 22I, an arc gear 23 III, an arc gear 24 IV and a threaded rod 25I.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-3, the present invention provides a technical solution: a high-speed high-precision digital-to-analog conversion chip testing device convenient to operate comprises a machine body 1, wherein a rocker 2 is fixedly connected to the left side of the machine body 1, the rocker 2 is in transmission connection with a first transmission column 3 through a rocker rotating shaft, a first arc gear 6 is fixedly connected to the first transmission column 3, the first arc gear 6 is meshed with a second arc gear 5, the second arc gear 5 is fixedly connected with the inner wall of the bottom of the machine body 1 through a first telescopic rod 4, the second arc gear 5 is movably connected with a first gear 8, the first gear 8 is meshed with a second gear 9, the number of the second arc gear 5 and the first telescopic rod 4 is two, the second arc gear 5 and the first telescopic rod 4 are symmetrical by taking the first arc gear 6 as a symmetrical axis, the second arc gear 5 at the top is meshed with a third gear 7, the third gear 7 is in transmission connection with a third arc gear 23, the third arc gear 23 is meshed with a fourth arc gear 24, no. four arc gears 24 are in transmission connection with a threaded rod 25, a threaded rod 25 is in threaded connection with a rack 22, a rack 22 is meshed with a gear 21, a gear 21 is in transmission connection with a threaded rod 20, a threaded rod 20 is in threaded connection with a movable plate 19, a rack 18 II is fixedly connected to the left side of the movable plate 19, a rack 18 II is meshed with a rack 16 III through a gear 17V, a telescopic rod 15 II is fixedly connected to the bottom of the rack 16 III, a hydraulic rod 14 is fixedly connected to the left side of the rack 16, a hydraulic piston 13 is fixedly connected to the bottom of the hydraulic rod 14, the hydraulic piston 13 is connected with a hydraulic piston 11 through a hydraulic cabin 12 in a sealing piston mode, a hydraulic rod 10 is fixedly connected to the right side of the hydraulic piston 11, and a rocker 2 is in sliding connection with the left side surface of the machine body 1.
When a chip needs to be replaced, the rocker is connected with the left side of the machine body in a sliding manner, so that a worker can move the rocker up and down, the rocker is connected with a first transmission column through a rocker rotating shaft in a transmission manner, a first arc gear is fixedly connected to the first transmission column and meshed with a second arc gear, a first telescopic rod is fixedly connected to the second arc gear, the number of the second arc gear and the number of the first telescopic rod is two, the second arc gear and the first telescopic rod are symmetrical by taking the first arc gear as a symmetrical shaft, when the rocker moves upwards, the second arc gear is meshed with a third gear, the rocker is rocked to rotate the third gear, the third gear is connected with a third arc gear in a transmission manner, the third arc gear is meshed with a fourth arc gear, the fourth arc gear is connected with a first threaded rod in a transmission manner, the first threaded rod is connected with a first rack in a transmission manner, therefore, when the rocker is rotated, the first rack moves rightwards, the first rack is meshed with the fourth gear, the fourth gear is in transmission connection with the second threaded rod, the second threaded rod is in threaded connection with the movable plate, so that when the first rack moves rightwards, the movable plate is driven to move upwards, the left side of the movable plate is fixedly connected with the second rack, the second rack is meshed with the third rack through the fourth gear, therefore, when the movable plate moves upwards, the third rack moves downwards, the third rack is fixedly connected with the first hydraulic rod, when the third rack moves upwards, the first hydraulic rod moves upwards, the bottom of the first hydraulic rod is fixedly connected with the first hydraulic piston, the first hydraulic piston is connected with the second hydraulic piston sealing piston through the hydraulic cabin, the right side of the second hydraulic piston is fixedly connected with the second hydraulic rod, and when the first hydraulic rod moves upwards, the second hydraulic rod is driven to move leftwards, thereby drive the chip and replace the chip that has tested finishing left, so just reached the effect of being convenient for to change the chip, when needs test the chip, the rocker moves down, and No. two arc gears in bottom and a gear engagement, a gear and No. two gear engagement, No. two gears drive the chip and carry out the rotation test, so just reached the effect of test.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a high-speed high accuracy digital-to-analog conversion chip test equipment of convenient operation, includes fuselage (1), its characterized in that: the left side of the machine body (1) is fixedly connected with a rocker (2), the rocker (2) is in transmission connection with a first transmission column (3) through a rocker rotating shaft, the first transmission column (3) is fixedly connected with a first arc gear (6), the first arc gear (6) is meshed with a second arc gear (5), the second arc gear (5) is fixedly connected with the inner wall of the bottom of the machine body (1) through a first telescopic rod (4), the second arc gear (5) is movably connected with a first gear (8), the first gear (8) is meshed with a second gear (9), the number of the second arc gear (5) and the number of the first telescopic rod (4) are two, the second arc gear (5) and the first telescopic rod (4) are symmetrical by taking the first arc gear (6) as a symmetry axis, the top portion of the second arc gear (5) is meshed with a third gear (7), no. three gear (7) are connected with No. three arc gear (23) transmission, No. three arc gear (23) and No. four arc gear (24) meshing, No. four arc gear (24) are connected with a threaded rod (25) transmission, a threaded rod (25) and a rack (22) threaded connection, a rack (22) and No. four gear (21) meshing, No. four gear (21) are connected with No. two threaded rod (20) transmission, No. two threaded rod (20) and fly leaf (19) threaded connection, No. two racks (18) of left side fixedly connected with of fly leaf (19), No. two racks (18) through No. five gear (17) and No. three rack (16) meshing, No. two telescopic link (15) of bottom fixedly connected with of No. three rack (16).
2. The high-speed high-precision digital-to-analog conversion chip testing device convenient to operate of claim 1, wherein: the left side of the third rack (16) is fixedly connected with a first hydraulic rod (14).
3. The high-speed high-precision digital-to-analog conversion chip testing device convenient to operate of claim 2, wherein: the bottom of the first hydraulic rod (14) is fixedly connected with a first hydraulic piston (13).
4. The high-speed high-precision digital-to-analog conversion chip testing device convenient to operate of claim 3, wherein: the first hydraulic piston (13) is connected with the second hydraulic piston (11) through a hydraulic chamber (12) in a sealing manner.
5. The high-speed high-precision digital-to-analog conversion chip testing device convenient to operate of claim 4, wherein: the right side of the second hydraulic piston (11) is fixedly connected with a second hydraulic rod (10).
6. The high-speed high-precision digital-to-analog conversion chip testing device convenient to operate of claim 1, wherein: the rocker (2) is connected with the left side surface of the machine body (1) in a sliding manner.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011078999.3A CN112162124B (en) | 2020-10-10 | 2020-10-10 | High-speed high-precision digital-to-analog conversion chip test equipment convenient to operate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011078999.3A CN112162124B (en) | 2020-10-10 | 2020-10-10 | High-speed high-precision digital-to-analog conversion chip test equipment convenient to operate |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112162124A true CN112162124A (en) | 2021-01-01 |
| CN112162124B CN112162124B (en) | 2023-11-10 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202011078999.3A Active CN112162124B (en) | 2020-10-10 | 2020-10-10 | High-speed high-precision digital-to-analog conversion chip test equipment convenient to operate |
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| CN (1) | CN112162124B (en) |
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| CN210690737U (en) * | 2019-07-22 | 2020-06-05 | 苏州德赫奇自动化科技有限公司 | Automatic test packaging machine for aluminum electrolytic capacitor |
| CN211061643U (en) * | 2019-09-25 | 2020-07-21 | 武汉奥亿特科技有限公司 | Power-up device for chip test |
| CN211150681U (en) * | 2020-06-28 | 2020-07-31 | 深圳氢时代新能源科技有限公司 | Membrane electrode combination fixing mechanism |
-
2020
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| DE10205115A1 (en) * | 2002-02-07 | 2003-08-21 | Kupka Harald | Coupling device for coupling testing circuit board of test head of an integrated circuit testing device to circuit under test, has drawing in and auxiliary frames for circuit board positioning |
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| Publication number | Publication date |
|---|---|
| CN112162124B (en) | 2023-11-10 |
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