CN112113746A - Calibration method and calibration system of light source stroboscopic tester based on external modulation light source method - Google Patents
Calibration method and calibration system of light source stroboscopic tester based on external modulation light source method Download PDFInfo
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Abstract
The invention discloses a calibration method and a calibration system of a light source stroboscopic tester based on an external modulation light source method, wherein the method comprises the following steps: generating a stable frequency reference signal; inputting a light beam generated by a laser light source into an optical isolator for processing; selecting different output waveform signals according to different frequency reference signals, and modulating light beams passing through an optical isolator to generate a strobe light signal; amplifying the stroboscopic light signal, outputting the amplified stroboscopic light signal to a reference detector, performing photoelectric conversion on the received light signal by the reference detector, outputting the photoelectrically converted light signal to a frequency meter, and outputting a frequency reference signal to the frequency meter; the frequency meter measures the optical signal and records the value; replacing a reference detector and a frequency meter with a light source stroboscopic tester to be calibrated; the light signal is directly measured by using the light source stroboscopic tester to be calibrated, and the value read by the light source stroboscopic tester to be calibrated is consistent with the value read by the frequency meter through continuous debugging, so that the calibration is completed.
Description
Technical Field
The invention relates to the technical field of light source stroboscopic test, in particular to a calibration method and a calibration system of a light source stroboscopic tester based on an external modulation light source method.
Background
The light source stroboscopic tester is used for testing stroboscopic effect of a light source or other lighting equipment, and at present, no metering technical specification of the light source stroboscopic tester exists in China, and no patent of a related automatic calibration system or method exists. For the calibration of a light source stroboscopic tester, instrument manufacturers such as Hangzhou remote photoelectricity and Japan Jingli motors mainly use a method for manually comparing a reference oscilloscope with a tested light source stroboscopic tester at present, and a calibration device of the stroboscopic tester mainly comprises a light source, a photoelectric converter and the reference oscilloscope. As disclosed in chinese patent publication No. CN109799366A, published: 2019.05.24, discloses a light curtain target calibration device based on stroboscopic light source and its calibration method, specifically discloses a light curtain calibration device comprising an initial calibration light curtain structure, a cut-off calibration light curtain structure, a computer, a light source controller and a signal collector, wherein the initial calibration light curtain structure comprises an initial target emission light source mounting rack, an initial target stroboscopic light source and an initial target photoelectric converter; the cut-off calibration light curtain structure comprises a cut-off target emission light source mounting frame, a cut-off target stroboscopic light source and a cut-off target photoelectric converter.
The above prior art mainly has the following disadvantages: high-precision calibration cannot be realized, and the efficiency is not high; the oscilloscope has low frequency measurement precision, and is not beneficial to tracing the flicker frequency of the light source; the used light source is a wide-spectrum light source, and the waveform is widened, the rise time is increased and the flicker index parameter cannot be accurately measured due to different optical response times of the instrument to different wavelength components; the wide-spectrum light source is limited by materials, cannot generate high-frequency stroboscopic signals, and has a limited measuring capacity range.
Disclosure of Invention
The invention provides a calibration method and a calibration system of a light source stroboscopic tester based on an external modulation light source method, aiming at solving the problems of insufficient precision and low efficiency in the prior art, so that the high-precision metering calibration and tracing of the light source stroboscopic tester are realized, and the calibration efficiency is improved.
In order to achieve the purpose of the invention, the technical scheme is as follows: a calibration method of a light source stroboscopic tester based on an external modulation light source method comprises the following steps:
s1: generating a stable frequency reference signal;
s2: in order to reduce the disturbance of optical power, a light beam generated by a laser light source is input into an optical isolator for processing;
s3: selecting different output waveform signals according to different frequency reference signals, and modulating a light beam passing through an optical isolator so as to generate a strobe light signal;
s4: amplifying the light beam of the generated stroboscopic light signal, and outputting the amplified light beam to a reference detector, wherein the reference detector performs photoelectric conversion on the received light signal and outputs the converted light signal to a frequency meter, and meanwhile, the reference signal of the frequency is output to the frequency meter; the frequency meter measures the optical signal, displays the value and records the value;
s5: replacing a reference detector and a frequency meter with a light source stroboscopic tester to be calibrated, namely amplifying a stroboscopic signal generated by a light source and outputting the stroboscopic signal to the light source stroboscopic tester to be calibrated;
s6: the light signal is directly measured by using the light source stroboscopic tester to be calibrated, and the value read by the light source stroboscopic tester to be calibrated is consistent with the value read by the frequency meter through continuous debugging, so that the calibration is completed.
Based on the calibration method of the light source stroboscopic tester based on the external modulation light source method, the invention also provides a calibration system of the calibration method of the light source stroboscopic tester based on the external modulation light source method, wherein the system comprises an atomic frequency standard instrument, an arbitrary waveform generator, a laser, an optical isolator, a modulator, a beam expander, a reference detector, a frequency meter and a light source stroboscopic tester to be calibrated;
the atomic frequency standard instrument provides stable frequency reference signals for the arbitrary waveform generator and the frequency meter respectively;
the arbitrary waveform generator selects different output waveform signals according to different frequency reference signals;
the laser can be set according to different requirements to generate a laser light source;
the optical isolator is used for reducing light reflected back to the laser and reducing disturbance of optical power;
the modulator is used for receiving the signal of the arbitrary waveform generator and modulating the output light beam of the optical isolator to obtain a stroboscopic signal;
the beam expander is used for amplifying the light beam of the output optical signal, increasing the diameter of a light spot and reducing the power density;
the reference detector performs photoelectric conversion on the received optical signal and outputs the optical signal to the frequency meter, and the frequency meter performs measurement and numerical value display on the optical signal and records the numerical value;
and replacing the reference detector and the frequency meter by using the light source stroboscopic tester to be calibrated, namely inputting the optical signal output by the beam expander into the light source stroboscopic tester to be calibrated, and adjusting the light source stroboscopic tester to ensure that the display numerical value is consistent with the numerical value displayed by the frequency meter so as to finish calibration.
The invention has the following beneficial effects:
the invention adopts an external modulation light source method to realize the output of the high-frequency light source flicker signal, adopts the ultra-high precision atomic frequency standard and realizes the direct tracing from the light source flicker frequency to the frequency standard; an arbitrary waveform generator is adopted to realize the measurement of the flicker frequency, the flicker index and the flicker percentage; the laser diode is used as a light source, the monochromaticity is good, the signal rise time is short, the accurate measurement of the flicker index parameter is realized, and meanwhile, the response measurement of the light source stroboscopic tester to light sources with different wavelengths can be realized by changing lasers with different wavelengths.
Drawings
Fig. 1 is a flowchart of a calibration method of a light source stroboscopic tester based on an external modulation light source method in embodiment 1.
FIG. 2 is a waveform diagram of an optical signal output in embodiment 1.
FIG. 3 is a partial block diagram of a calibration system of the light source strobe tester with a frequency meter according to embodiment 3.
FIG. 4 is another block diagram of a part of the calibration system of the light source stroboscopic tester with frequency meter in embodiment 3.
FIG. 5 is a partial block diagram of a calibration system of the light source stroboscope with oscilloscope according to embodiment 4.
Detailed Description
The invention is described in detail below with reference to the drawings and the detailed description.
Example 1
As shown in fig. 1, a calibration method of a light source strobe tester based on an external modulation light source method includes the following steps:
s1: generating a stable frequency reference signal;
s2: in order to reduce the disturbance of optical power, a light beam generated by a laser light source is input into an optical isolator for processing;
s3: selecting different output waveform signals according to different frequency reference signals, and modulating a light beam passing through an optical isolator so as to generate a strobe light signal;
s4: amplifying the light beam of the generated stroboscopic light signal, and outputting the amplified light beam to a reference detector, wherein the reference detector performs photoelectric conversion on the received light signal and outputs the converted light signal to a frequency meter, and meanwhile, the reference signal of the frequency is output to the frequency meter; the frequency meter measures the optical signal, displays the value and records the value;
s5: replacing a reference detector and a frequency meter with a light source stroboscopic tester to be calibrated, namely amplifying a stroboscopic signal generated by a light source and outputting the stroboscopic signal to the light source stroboscopic tester to be calibrated;
s6: the light signal is directly measured by using the light source stroboscopic tester to be calibrated, and the value read by the light source stroboscopic tester to be calibrated is consistent with the value read by the frequency meter through continuous debugging, so that the calibration is completed.
In the embodiment, an external modulation light source method is adopted to realize the output of a high-frequency light source flicker signal, and an ultra-high-precision atomic frequency standard is adopted to realize the direct tracing from the light source flicker frequency to the frequency standard; to reduce the light reflected back to the laser diode to reduce the perturbation variation in optical power, the laser light source is input to the reference detector through an optical isolator. However, in order to increase the spot diameter of the optical signal and reduce the power density, the laser light source passes through an optical isolator, is amplified, and then is input into the reference detector.
In a specific embodiment, the output waveform signal includes a sine wave, a square wave, a pulse wave, an amplitude modulation signal, a pulse width modulation signal, an amplitude keying modulation signal, and a custom waveform signal, and the measurement of the flicker frequency, the flicker index, and the flicker percentage is realized.
In a specific embodiment, the calculation formula of the flicker index is as follows:
in the formula, S1 represents the waveform area of the portion above the average value in one cycle, and S2 represents the waveform area of the portion below the average value in one cycle.
In a specific embodiment, the calculation formula of the flicker percentage is as follows:
y by custom waveformmax、yminAnd calculating the value, and outputting light signals with different modulation depth values.
Example 2
The present embodiment also provides a calibration method for a light source stroboscopic tester based on an external modulation light source method, which is similar to the calibration method described in embodiment 1, and the frequency meter is mainly replaced by an oscilloscope, that is, the oscilloscope is used to measure and display an optical signal and record the value, and the oscilloscope can observe waveform curves of various signal amplitudes changing with time, and can measure signals such as frequency, phase difference, amplitude modulation and the like of stroboscopic signals.
Example 3
Based on the calibration method described in embodiment 1, this embodiment provides a calibration system of a light source stroboscopic tester based on an external modulation light source method, where the system includes an atomic frequency standard, an arbitrary waveform generator, a laser, an optical isolator, a modulator, a beam expander, a reference detector, a frequency meter, and a light source stroboscopic tester to be calibrated;
the atomic frequency standard instrument provides stable frequency reference signals for the arbitrary waveform generator and the frequency meter respectively;
the arbitrary waveform generator selects different output waveform signals according to different frequency reference signals;
the laser can be set according to different requirements to generate a laser light source;
the optical isolator is used for reducing light reflected back to the laser and reducing disturbance of optical power;
the modulator is used for receiving the signal of the arbitrary waveform generator and modulating the output light beam of the optical isolator to obtain a stroboscopic signal;
the beam expander is used for amplifying the light beam of the output optical signal, increasing the diameter of a light spot and reducing the power density; because the spot area may be too small, or the laser energy may be too concentrated to damage the instrument, it is necessary to use a beam expander for processing.
The reference detector performs photoelectric conversion on the received optical signal and outputs the optical signal to the frequency meter, and the frequency meter performs measurement and numerical value display on the optical signal and records the numerical value;
and replacing the reference detector and the frequency meter by using the light source stroboscopic tester to be calibrated, namely inputting the optical signal output by the beam expander into the light source stroboscopic tester to be calibrated, and adjusting the light source stroboscopic tester to ensure that the display numerical value is consistent with the numerical value displayed by the frequency meter so as to finish calibration.
The arbitrary waveform generator selects different output waveform signals according to different frequency reference signals, and according to parameters and ranges to be calibrated, the output signals comprise sine waves, square waves, pulse waves, amplitude modulation signals, pulse width modulation signals, amplitude keying modulation signals and self-defined waveforms, so that the measurement of the flicker frequency, the flicker index and the flicker percentage is realized. Wherein the square wave may have a duty cycle of 1% to 99%.
The advantage of using the arbitrary waveform generator in this embodiment is: as long as the stroboscopic tester is in the detection range, the duty ratio and the depth MD of the stroboscopic light signal can be set by any waveform generator, namely the duty ratio and the depth MD of the light signal can be changed within 1-99% according to needs.
The frequency meter described in this embodiment is used for receiving the output signal of the reference detector and performing waveform analysis, and has an external reference signal input function. In the embodiment, the frequency reference signal generated by the atomic frequency standard instrument is respectively input to the arbitrary waveform generator and the frequency meter, so that the ultra-high-precision reference frequency signal is provided, and the measurement precision is improved.
In a specific embodiment, the calibration system further comprises an intelligent terminal, and the intelligent terminal is electrically connected with the laser, the atomic frequency standard instrument, the frequency meter, the arbitrary waveform generator, and the light source stroboscopic tester with the program control interface through the following communication interfaces including but not limited to USB, LAN, and GPIB, so as to achieve data acquisition and calibration parameters. The intelligent terminal comprises a notebook computer, a desktop computer and the like. The intelligent terminal controls and automatically calibrates and tests the laser, the atomic frequency standard instrument, the frequency meter and the arbitrary waveform generator, and performs data acquisition and analysis to obtain a calibration result.
Example 4
Based on the calibration method described in embodiment 2, this embodiment provides another calibration system of a light source stroboscopic tester based on an external modulation light source method, where the system includes an atomic frequency standard, an arbitrary waveform generator, a laser, an optical isolator, a modulator, a beam expander, a reference detector, a frequency meter, and a light source stroboscopic tester to be calibrated;
the atomic frequency standard instrument provides stable frequency reference signals for the arbitrary waveform generator and the frequency meter respectively;
the arbitrary waveform generator selects different output waveform signals according to different frequency reference signals;
the laser can be set according to different requirements to generate a laser light source;
the optical isolator is used for reducing light reflected back to the laser and reducing disturbance of optical power;
the modulator is used for receiving the signal of the arbitrary waveform generator and modulating the output light beam of the optical isolator to obtain a stroboscopic signal;
the beam expander is used for amplifying the light beam of the output optical signal, increasing the diameter of a light spot and reducing the power density; because the spot area may be too small, or the laser energy may be too concentrated to damage the instrument, it is necessary to use a beam expander for processing.
The reference detector performs photoelectric conversion on the received optical signal and outputs the optical signal to the frequency meter, and the frequency meter performs measurement and numerical value display on the optical signal and records the numerical value;
and replacing the reference detector and the frequency meter by using the light source stroboscopic tester to be calibrated, namely inputting the optical signal output by the beam expander into the light source stroboscopic tester to be calibrated, and adjusting the light source stroboscopic tester to ensure that the display numerical value is consistent with the numerical value displayed by the frequency meter so as to finish calibration.
The oscilloscope described in this embodiment is used for receiving the output signal of the reference detector and performing waveform analysis, and has an external reference signal input function. In the embodiment, the frequency reference signal generated by the atomic frequency standard instrument is respectively input to the arbitrary waveform generator and the frequency meter, so that the ultra-high-precision reference frequency signal is provided, and the measurement precision is improved.
It should be understood that the above-described embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the claims of the present invention.
Claims (10)
1. A calibration method of a light source stroboscopic tester based on an external modulation light source method is characterized in that: the calibration method comprises the following steps:
s1: generating a stable frequency reference signal;
s2: in order to reduce the disturbance of optical power, a light beam generated by a laser light source is input into an optical isolator for processing;
s3: selecting different output waveform signals according to different frequency reference signals, and modulating a light beam passing through an optical isolator so as to generate a strobe light signal;
s4: amplifying the light beam of the generated stroboscopic light signal, and outputting the amplified light beam to a reference detector, wherein the reference detector performs photoelectric conversion on the received light signal and outputs the converted light signal to a frequency meter, and meanwhile, the reference signal of the frequency is output to the frequency meter; the frequency meter measures the optical signal, displays the value and records the value;
s5: replacing a reference detector and a frequency meter with a light source stroboscopic tester to be calibrated, namely amplifying a stroboscopic signal generated by a light source and outputting the stroboscopic signal to the light source stroboscopic tester to be calibrated;
s6: the light signal is directly measured by using the light source stroboscopic tester to be calibrated, and the value read by the light source stroboscopic tester to be calibrated is consistent with the value read by the frequency meter through continuous debugging, so that the calibration is completed.
2. The calibration method of the light source stroboscopic tester based on the external modulation light source method as claimed in claim 1, wherein: the frequency meter can be replaced by an oscilloscope.
3. The method for calibrating the light source stroboscope based on the external modulation light source method according to any one of claims 1 or 2, wherein: the output waveform signals comprise sine waves, square waves, pulse waves, amplitude modulation signals, pulse width modulation signals, amplitude keying modulation signals and self-defined waveform signals, and the measurement of the flicker frequency, the flicker index and the flicker percentage is realized.
4. The calibration method of the light source stroboscopic tester based on the external modulation light source method as claimed in claim 3, wherein: the calculation formula of the flicker index is as follows:
in the formula, S1 represents the waveform area of the portion above the average value in one cycle, and S2 represents the waveform area of the portion below the average value in one cycle.
5. The method for calibrating the light source stroboscopic tester based on the external modulation light source method according to claim 4, wherein: the calculation formula of the flicker percentage is as follows:
y by custom waveformmax、yminAnd calculating the value, and outputting light signals with different modulation depth values.
6. A calibration system based on the calibration method of the light source stroboscopic tester based on the external modulation light source method of any one of claims 1, 2, 4 and 5, wherein: the system comprises an atomic frequency standard instrument, an arbitrary waveform generator, a laser, an optical isolator, a modulator, a beam expander, a reference detector, a frequency meter and a light source stroboscopic tester to be calibrated;
the atomic frequency standard instrument provides stable frequency reference signals for the arbitrary waveform generator and the frequency meter respectively;
the arbitrary waveform generator selects different output waveform signals according to different frequency reference signals;
the laser can be set according to different requirements to generate a laser light source;
the optical isolator is used for reducing light reflected back to the laser and reducing disturbance of optical power;
the modulator is used for receiving the signal of the arbitrary waveform generator and modulating the output light beam of the optical isolator to obtain a stroboscopic signal;
the beam expander is used for amplifying the light beam of the output optical signal, increasing the diameter of a light spot and reducing the power density;
the reference detector performs photoelectric conversion on the received optical signal and outputs the optical signal to the frequency meter, and the frequency meter performs measurement and numerical value display on the optical signal and records the numerical value;
and replacing the reference detector and the frequency meter by using the light source stroboscopic tester to be calibrated, namely inputting the optical signal output by the beam expander into the light source stroboscopic tester to be calibrated, and adjusting the light source stroboscopic tester to ensure that the display numerical value is consistent with the numerical value displayed by the frequency meter so as to finish calibration.
7. The system for calibrating a light source stroboscopic tester based on the external modulation light source method of claim 6, wherein: the frequency bandwidth of the reference detector is greater than the frequency bandwidth of the output optical signal.
8. The system for calibrating a light source stroboscopic tester based on the external modulation light source method of claim 7, wherein: the calibration system further comprises an intelligent terminal, and the intelligent terminal is electrically connected with the laser, the atomic frequency standard instrument, the frequency meter, the arbitrary waveform generator and the light source stroboscopic tester with the program control interface through the communication interface respectively, so that data acquisition and parameter calibration are realized.
9. The method for calibrating the stroboscopic tester for the light source based on the external modulation light source method of claim 8, wherein: the communication interface comprises USB, LAN and GPIB.
10. The calibration system of the light source stroboscopic tester based on the external modulation light source method according to any one of claims 6 to 9, wherein: the frequency meter can be replaced by an oscilloscope.
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Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60237328A (en) * | 1984-05-11 | 1985-11-26 | Agency Of Ind Science & Technol | Calibration of variable light attenuator |
| CN101207957A (en) * | 2007-12-19 | 2008-06-25 | 北京交通大学 | High-frequency modulated light source for millimicrosecond magnitude fluorescence lifetime measurement |
| CN101711373A (en) * | 2007-04-30 | 2010-05-19 | 阿兰·阿纳迪·马特利 | Light modulation device and system |
| CN102739314A (en) * | 2012-07-06 | 2012-10-17 | 长春理工大学 | Test system and method for scintillation characteristic of fake partially coherent light transmitted in atmosphere turbulence |
| CN103487238A (en) * | 2013-09-17 | 2014-01-01 | 中国科学院半导体研究所 | Light source stroboscopic testing device |
| CN103607541A (en) * | 2013-12-02 | 2014-02-26 | 吴东辉 | Method and system for obtaining information by way of camera shooting, camera shooting device and information modulation device |
| CN104410445A (en) * | 2014-10-16 | 2015-03-11 | 北京理工大学 | Calibration device and method of optical transmitter modulation measurement equipment |
| CN204291543U (en) * | 2015-01-16 | 2015-04-22 | 张玉华 | The special stroboscopic lamp of a kind of light disturbed test |
| CN205404086U (en) * | 2016-03-08 | 2016-07-27 | 江西科技学院 | Optic fibre break -make detects laser pen |
| CN207541162U (en) * | 2017-11-28 | 2018-06-26 | 广州广电计量检测股份有限公司 | Data line shield effectiveness detection circuit |
| CN108426586A (en) * | 2018-05-21 | 2018-08-21 | 浙江大学 | One kind being based on optical fibre gyro bandwidth test calibration method and calibrating installation |
| CN111239052A (en) * | 2020-02-16 | 2020-06-05 | 中北大学 | Photoelastic modulation polarization imaging biosensing system of double-period nanopore chip |
-
2020
- 2020-09-08 CN CN202010934699.4A patent/CN112113746B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60237328A (en) * | 1984-05-11 | 1985-11-26 | Agency Of Ind Science & Technol | Calibration of variable light attenuator |
| CN101711373A (en) * | 2007-04-30 | 2010-05-19 | 阿兰·阿纳迪·马特利 | Light modulation device and system |
| CN101207957A (en) * | 2007-12-19 | 2008-06-25 | 北京交通大学 | High-frequency modulated light source for millimicrosecond magnitude fluorescence lifetime measurement |
| CN102739314A (en) * | 2012-07-06 | 2012-10-17 | 长春理工大学 | Test system and method for scintillation characteristic of fake partially coherent light transmitted in atmosphere turbulence |
| CN103487238A (en) * | 2013-09-17 | 2014-01-01 | 中国科学院半导体研究所 | Light source stroboscopic testing device |
| CN103607541A (en) * | 2013-12-02 | 2014-02-26 | 吴东辉 | Method and system for obtaining information by way of camera shooting, camera shooting device and information modulation device |
| CN104410445A (en) * | 2014-10-16 | 2015-03-11 | 北京理工大学 | Calibration device and method of optical transmitter modulation measurement equipment |
| CN204291543U (en) * | 2015-01-16 | 2015-04-22 | 张玉华 | The special stroboscopic lamp of a kind of light disturbed test |
| CN205404086U (en) * | 2016-03-08 | 2016-07-27 | 江西科技学院 | Optic fibre break -make detects laser pen |
| CN207541162U (en) * | 2017-11-28 | 2018-06-26 | 广州广电计量检测股份有限公司 | Data line shield effectiveness detection circuit |
| CN108426586A (en) * | 2018-05-21 | 2018-08-21 | 浙江大学 | One kind being based on optical fibre gyro bandwidth test calibration method and calibrating installation |
| CN111239052A (en) * | 2020-02-16 | 2020-06-05 | 中北大学 | Photoelastic modulation polarization imaging biosensing system of double-period nanopore chip |
Non-Patent Citations (2)
| Title |
|---|
| 席勇辉等: "频闪仪的脉冲频率法校准", 《工业计量》 * |
| 李凤娇: "光源频闪测量仪校准方法研究", 《计量与测试技术》 * |
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