CN108267799B - High-precision infrared detector time constant testing system and method - Google Patents
High-precision infrared detector time constant testing system and method Download PDFInfo
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Abstract
The invention discloses a high-precision infrared detector time constant testing system and method. Wherein the system comprises: the system comprises an infrared light source unit, an infrared optical system unit, an infrared detector adapter unit, a photoelectric signal acquisition unit and an information processing unit; the infrared light source unit generates modulated infrared light signals, the infrared light signals are subjected to optical shaping through the infrared optical system unit and are vertically projected to the infrared detector adapter unit, the infrared detector adapter unit converts the light signals into electric signals, the electric signals are collected and read through the photoelectric signal collecting unit, and the time constant of the infrared detector is obtained through the information processing unit. The invention solves the problems of poor precision and low efficiency of the prior testing technology.
Description
Technical Field
The invention belongs to the field of photoelectric detection, and particularly relates to a high-precision infrared detector time constant testing system and method.
Background
The original test method of the infrared detector is a mechanical frequency method, a blackbody and mechanical modulation disk is used as a light source, the change of a detection signal along with modulation frequency is recorded, and a time constant is calculated by utilizing a tangent line drawing. Due to the mechanical modulation mode of the modulation disk, the light source is in a waveform with both a rising edge and a falling edge being slowly changed, and meanwhile, an artificial estimation factor exists in a method of drawing points and making a tangent line through coordinate paper, so that the test accuracy is poor. At present, the time constant of an infrared detector is about 3ms, and as shown in fig. 1, in order to ensure the test precision, both the rising edge and the falling edge of the light source waveform need to be less than 0.3 ms.
The light source used in the current optical pulse method reported in the literature or patent is usually a blackbody or a pulsed laser. The black body needs to be equipped with a mechanical switch type shutter to work, the high-quality mechanical shutter is very expensive, the requirement that the rising edge and the falling edge of the test light source are steep is difficult to meet, mechanical vibration exists, the quality of the light source is affected, and the service life is short. According to the specification of a 6.6.1 pulse response time testing method in GB/T13584-2011 infrared detector parameter testing method, a pulse laser is adopted as a testing light source, the pulse laser can ensure steeper rising edge and falling edge, and the pulse laser has good adaptability to a photon type detector with a small response time constant. However, the time constant of the thermistor infrared detector is about 5ms at most, the single pulse width of the pulse laser is usually short, the time length is difficult to reach, the photoresponse cannot reach the rising platform shown in the curve of fig. 1, and the next pulse starts.
Disclosure of Invention
The technical problem solved by the invention is as follows: the method overcomes the defects of the time constant testing technology of the infrared detector, provides a testing system and a method adopting light pulses as light sources, and solves the problems of poor precision and low efficiency in the prior testing technology.
The purpose of the invention is realized by the following technical scheme: according to one aspect of the invention, a high-precision infrared detector time constant testing system is provided, which comprises: the system comprises an infrared light source unit, an infrared optical system unit, an infrared detector adapter unit, a photoelectric signal acquisition unit and an information processing unit; the infrared light source unit generates modulated infrared light signals, the infrared light signals are subjected to optical shaping through the infrared optical system unit and are vertically projected to the infrared detector adapter unit, the infrared detector adapter unit converts the light signals into electric signals, the electric signals are collected and read through the photoelectric signal collecting unit, and the time constant of the infrared detector is obtained through the information processing unit.
In the high-precision infrared detector time constant test system, the infrared light source unit comprises a light source module, a temperature control module, a power supply module and a modulation module; the power supply module provides working voltage for the light source module, the temperature control module controls the temperature of the light source module to ensure stable light emitting power, the light source module generates infrared light, and the modulation module modulates the infrared light into rectangular waves.
In the high-precision infrared detector time constant test system, the infrared optical system unit comprises an infrared main lens and an infrared correction lens; and the rectangular wave is shaped by the infrared main lens and the infrared correction lens of the infrared optical system unit to obtain light spots matched with sensitive elements of the infrared detector adapter unit.
In the high-precision infrared detector time constant test system, the infrared detector adapter unit comprises a coupler, an infrared detector and a bias power supply; the light spot is incident to the infrared detector through the coupler, and the infrared detector converts the light spot into an electric signal; the bias power supply provides a voltage to the infrared detector.
In the high-precision infrared detector time constant test system, the photoelectric signal acquisition unit comprises an amplifier and a digital oscilloscope module; the electric signal is amplified by the amplifier and then is transmitted into the digital oscilloscope module to be collected to obtain a digital signal, and the digital signal enters the information processing unit.
In the high-precision infrared detector time constant test system, the information processing unit comprises a data acquisition module and a data analysis module; the digital signal is processed by the data acquisition module to obtain a light response curve, and the time constant of the infrared detector is obtained by the data analysis module.
In the high-precision infrared detector time constant test system, the light source module is an infrared LED light source; the power supply module comprises a diode circuit protection circuit and is used for preventing strong pulse current from damaging the infrared LED light source; the modulation module adopts a digital frequency synthesizer to combine with the FPGA to manufacture a signal generator to generate a standard modulation waveform.
In the high-precision infrared detector time constant test system, the infrared main lens is a concave-convex lens.
In the high-precision infrared detector time constant testing system, the double surfaces of the infrared main lens are plated with infrared antireflection films.
According to another aspect of the present invention, there is also provided a high-precision infrared detector time constant testing method, including the following steps: the infrared light source unit generates modulated infrared light signals; performing optical shaping through an infrared optical system unit, and vertically projecting to an infrared detector adapter unit; converting the optical signal into an electrical signal by an infrared detector adapter unit; the electric signal is collected and read by the photoelectric signal collecting unit, and the time constant of the infrared detector is obtained by the information processing unit.
Compared with the prior art, the invention has the following beneficial effects:
(1) the invention adopts the optical pulse method to test the time constant of the infrared detector, uses the rapid optical pulse signal modulated by the precise circuit as the light source, has steep rising edge and falling edge, adjustable holding time, approximate rectangular wave waveform, high test precision and good retest repeatability.
(2) The invention adopts the control of the information processing unit to realize real-time acquisition and automatic processing, and the efficiency is obviously improved compared with the traditional mechanical method of multi-person operation and manual tracing and plotting.
(3) The invention can be popularized and applied to the time constant test of all types of non-refrigeration infrared detectors, and has the advantages of high test precision, small volume and high efficiency.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to refer to like parts throughout the drawings. In the drawings:
FIG. 1 is a schematic diagram of a time constant test signal waveform;
FIG. 2 is a block diagram of a time constant test system;
FIG. 3 is a diagram of the components and optical paths of an infrared optical system;
FIG. 4 is a schematic diagram of a measurement of an output characteristic of an infrared light source;
fig. 5 is a schematic view of the infrared detector adapter electromagnetic shielding measures.
Detailed Description
Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art. It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
A high-precision infrared detector time constant testing system is shown in figure 2 and comprises an infrared light source unit (comprising a light source module, a temperature control module, a power supply module and a modulation module), an infrared optical system unit (comprising an infrared main lens and a correcting mirror), an infrared detector adapter unit (comprising a coupler, an infrared detector and a bias power supply), a photoelectric signal acquisition unit (comprising an amplifier and a digital oscilloscope module), and an information processing unit (comprising a data acquisition module and a data analysis module). The power module of the infrared light source unit provides working voltage of the light source module, the temperature control module controls the temperature of the light source module to ensure stable light emitting power, the light source module generates infrared light, the modulation module modulates the infrared light into rectangular waves, the rectangular waves shape light beams through a main lens and a correcting mirror of the infrared optical system unit to obtain light spots matched with a sensitive element of the infrared detector, the light spots are incident to the infrared detector through a coupler and converted into electric signals (mu V magnitude), a bias power supply provides voltage for the infrared detector, the electric signals are amplified through an amplifier and transmitted to a digital oscilloscope module to be collected to obtain digital signals, the digital signals enter an information processing unit, an optical response curve is obtained through processing of a data collection module, and a time constant of the infrared detector is obtained through a data analysis module.
The following sub-units are illustrated:
1) infrared light source unit
The infrared light source unit comprises a light source module, a temperature control module, a power supply module and a modulation module.
The infrared light source module is packaged on a heat sink by adopting 10 infrared LED chips, and has small volume, light weight, high reliability and service life generally longer than 1 ten thousand hours; can be directly modulated, has simple structure and safe use; the infrared lens is adopted to ensure the directional output of infrared light, and the optical alignment precision of the packaged light source module is within 0.1 mm.
The output power of the LED is closely related to the working temperature, the output power of the LED can be obviously reduced when the temperature is increased, the power of the LED is 30-40 mW, and the LED works at half power usually. The stability of the output power of the infrared LED is ensured through the temperature control module, and the temperature fluctuation is kept to be less than 1 ℃ through semiconductor refrigeration and a temperature controller.
The power module is provided with a diode protection circuit to prevent the LED chip from being damaged by strong pulse current; the stability of the electric current is ensured through the voltage stabilizing chip so as to improve the stability of the output light power of the LED; the input current can be adjusted according to the requirement, and the output power of the infrared light source can be dynamically controlled.
The modulation module adopts an AD9850(DDS direct digital frequency synthesizer, can be programmed to realize an arbitrary waveform generator) and is combined with the FPGA to manufacture a signal generator, a standard modulation square wave signal is generated, and the error is microsecond magnitude; the level width can be dynamically adjusted within the range of 10-40 ms; the light is modulated by direct modulation, as shown in the measurement result of the output characteristic of the infrared light source in fig. 4, the rising edge is 0.1 ms; falling edge 0.1 ms; keeping 10-40 ms adjustable.
2) Infrared optical system unit
As shown in fig. 3, the infrared optical system unit is designed to optimize the output infrared light directivity according to the far-field output characteristics of the LED, so as to ensure that the infrared light energy is effectively transmitted to the surface of the detector and is optically corrected into a circular spot with a diameter of 10 mm. The infrared optical system unit comprises an infrared main lens and a correcting lens, simulates the characteristics of light spots, ensures that the light field distribution is circular distribution with the diameter of 10mm, and obtains uniform light field distribution.
The infrared main mirror is designed into a concave-convex mirror, so that the reflection loss caused by large-angle incidence is reduced, the collection rate of the LED infrared light is improved, and the infrared light in the LED divergence angle is effectively collected and focused. The focused infrared light is corrected into approximately parallel light, so that the butt joint and the adjustment of a light source and an infrared detector are facilitated; the infrared reflection reducing films are plated on the two sides of the main mirror, so that the infrared reflection loss of the germanium mirror is reduced, and the transmittance of infrared light emitted by the infrared LED array is increased by not less than 85%.
3) Infrared detector adapter unit
The infrared detector adapter unit comprises a coupler, an infrared detector and a bias power supply. The coupler is used for fixing the infrared detector and enabling infrared light to irradiate the sensitive element of the detector, and the connector structure is adopted to facilitate replacement of the detector during testing. The bias power supply is used for providing stable bias voltage required by the infrared detector, the detector is powered by a 22.5-volt battery pack, the light source and the data acquisition system are powered by 220-volt alternating current, and the 193# infrared detector is tested by +/-17V bias voltage.
In order to avoid external electromagnetic interference, the probe adapter needs to take electromagnetic shielding measures, as shown in fig. 5, a conductive cavity is formed by communicating a conductive shielding cover and a shell to shield external electromagnetic waves, and low-frequency signals (including power) output or input through a feedthrough shielding cavity are connected through a feedthrough capacitor, so that part of incoming noise can be filtered.
4) Photoelectric signal acquisition unit
The photoelectric signal acquisition unit comprises an amplifier and a digital oscilloscope module. The amplifier amplifies the received electric signals of the 0.05-300 Hz mu V infrared detector by 200-20000 times to a measurable level: the bandwidth is 1 MHz; the gain is adjustable by 10-20000 times; the equivalent input noise voltage spectral density is less than or equal to 40nV/Hz0.5(10Hz), and the maximum signal amplitude is +/-10V.
The digital oscilloscope module collects, displays and transmits real-time measurement waveforms, the measurement data of the waveforms are firstly recorded in the memory of the oscilloscope and then analyzed and processed, and the related parameters of the waveforms can be accurately calculated, so that the measurement uncertainty caused by human factors is greatly reduced. Sampling rate 1 GSa/s; 2, a channel; vertical resolution: 8 bits.
5) Information processing unit
The information processing unit comprises a data acquisition module and a data analysis module. And the data acquisition module can adjust parameters such as power and pulse width of the light source and acquire real-time waveforms of response photoelectric signals of the infrared detector. The data analysis module can acquire the original data corresponding to the stored waveform, store the intermediate data and perform data analysis processing.
As shown in fig. 1, the output signal of the infrared detector cannot achieve the effect of rectangular pulse, but has a rising time course, which is performed according to the following rule:
V(t)＝V(0)[1-e-t/τ]
V(0)represents the maximum signal that the detector finally reaches, τ represents the time constant of the infrared detector, when t ═ τ, there are:
V(τ)＝0.63V(0)
and (3) carrying out data analysis on the collected test values of which the responses change along with time, taking the maximum value of the signal as a reference, and calculating the time required by the response rising to 0.63 time of the maximum signal through software data processing to obtain a time constant.
To avoid 1/f noise and the measurement uncertainty caused by the noise, when each infrared detector carries out response time-varying curve acquisition, 10 response-time curves are acquired firstly, and then the root mean square of the acquired response voltage signals at each time point is taken by software:
Τrms＝((1/N)∑xi 2)1/2
＝((x1 2+x2 2+…+xN 2)/N)1/2
and taking the numerical value as the response voltage of the time point, and then obtaining the response curves of all the time points as a root mean square response-time curve of the infrared detector.
Each infrared detector needs to acquire and process according to the method to obtain 5 root mean square response-time curves, and then each curve is processed to obtain a time constant.
The 5 obtained time constant values were averaged according to the following equation:
mean value τp＝∑(τn)/n
And taking the averaged time constant as a final time constant value.
The 193# infrared detector is tested, 5 time constant values obtained by processing 5 root mean square response-time curves are respectively 2.82ms, 2.81ms, 2.83ms, 2.82ms and 2.82ms, the time constant value after averaging is 2.82ms, one decimal point is generally taken, and the final time constant value is 2.8 ms.
The effect evaluation is applied to the embodiment:
by adopting the infrared detector time constant test system of the embodiment, the infrared detector is actually tested, the effect is evaluated, and the result is shown in table 1.
TABLE 1 test results of the new method for testing time constants
The 10 detectors are tested once every day, and 3 tests are carried out in total, so that the repeatability of the test result is good, the maximum error is 3.1%, and is far lower than the level of 8% of the repeated measurement error of the original test system, and the test precision of the time constant test system is improved. And randomly extracting 5 detectors tested by the existing and new methods to a third-party professional detection unit for detection, wherein the deviation of the test result of the embodiment is less than 0.3ms, and the deviation of the original test system is maximally 1ms, which shows that the time constant test precision of the infrared detector is obviously improved after the embodiment is adopted.
The embodiment also provides a high-precision infrared detector time constant testing method, which comprises the following steps: the infrared light source unit generates modulated infrared light signals; performing optical shaping through an infrared optical system unit, and vertically projecting to an infrared detector adapter unit; converting the optical signal into an electrical signal by an infrared detector adapter unit; the electric signal is collected and read by the photoelectric signal collecting unit, and the time constant of the infrared detector is obtained by the information processing unit.
In the embodiment, the optical pulse method is adopted to test the time constant of the infrared detector, the rapid optical pulse signal modulated by the precise circuit is used as the light source, the rising edge and the falling edge of the rapid optical pulse signal are steep, the holding time is adjustable, the waveform is approximate to a rectangular wave, the test precision is high, and the retest repeatability is good. In addition, the embodiment adopts the information processing unit for control, can program and set parameters of the light source, the circuit and the acquired waveform, realizes real-time acquisition and automatic processing, and obviously improves the efficiency compared with the original mechanical method of multi-person operation and manual tracing and plotting.
The above-described embodiments are merely preferred embodiments of the present invention, and general changes and substitutions by those skilled in the art within the technical scope of the present invention are included in the protection scope of the present invention.
Claims (8)
1. A high accuracy infrared detector time constant test system which characterized in that includes: the system comprises an infrared light source unit, an infrared optical system unit, an infrared detector adapter unit, a photoelectric signal acquisition unit and an information processing unit; wherein the content of the first and second substances,
the infrared light source unit generates modulated infrared light signals, the modulated infrared light signals are subjected to optical shaping through the infrared optical system unit and are vertically projected to the infrared detector adapter unit, the optical signals are converted into electric signals through the infrared detector adapter unit, the electric signals are collected and read through the photoelectric signal collecting unit, and the time constant of the infrared detector is obtained through the information processing unit; wherein the content of the first and second substances,
the infrared light source unit comprises a light source module, a temperature control module, a power supply module and a modulation module; the power supply module provides working voltage of the light source module, the temperature control module controls the temperature of the light source module to ensure stable light emitting power, the light source module generates infrared light, and the modulation module modulates the infrared light into rectangular waves; the light source module is an infrared LED module; wherein the content of the first and second substances,
the infrared optical system unit comprises an infrared main lens and an infrared correction lens; wherein the content of the first and second substances,
the rectangular wave is shaped by an infrared main lens and an infrared correcting lens of the infrared optical system unit to obtain light spots matched with sensitive elements of the infrared detector adapter unit;
the infrared detector is a thermistor type infrared detector;
the modulation module generates a standard modulation square wave signal, the error magnitude is microsecond, the level width is dynamically adjusted, and the rising edge is 0.1 ms; falling edge 0.1 ms; keeping 10-40 ms adjustable;
the infrared light source module is packaged on a heat sink by adopting 10 infrared LED chips;
the infrared main lens is coated with infrared antireflection films on two sides, so that the infrared reflection loss of the germanium mirror is reduced, and the transmittance of infrared light emitted by the infrared LED array is increased by not less than 85%.
2. The high precision infrared detector time constant testing system of claim 1, characterized in that: the infrared detector adapter unit comprises a coupler, an infrared detector and a bias power supply; wherein the content of the first and second substances,
the light spot is incident to the infrared detector through the coupler, and the infrared detector converts the light spot into an electric signal;
the bias power supply provides a voltage to the infrared detector.
3. The high accuracy infrared detector time constant test system of claim 2, characterized in that: the photoelectric signal acquisition unit comprises an amplifier and a digital oscilloscope module; wherein the content of the first and second substances,
the electric signal is amplified by the amplifier and then is transmitted into the digital oscilloscope module to be collected to obtain a digital signal, and the digital signal enters the information processing unit.
4. The high accuracy infrared detector time constant test system of claim 3, characterized in that: the information processing unit comprises a data acquisition module and a data analysis module; wherein the content of the first and second substances,
the digital signal is processed by the data acquisition module to obtain a light response curve, and the time constant of the infrared detector is obtained by the data analysis module.
5. The high precision infrared detector time constant testing system of claim 1, characterized in that: the light source module is an infrared LED light source; the power supply module comprises a diode circuit protection circuit and is used for preventing strong pulse current from damaging the infrared LED light source; the modulation module adopts a digital frequency synthesizer to combine with the FPGA to manufacture a signal generator to generate a standard modulation waveform.
6. The high accuracy infrared detector time constant test system of claim 2, characterized in that: the infrared main lens is a concave-convex lens.
7. The high accuracy infrared detector time constant test system of claim 6, characterized in that: the double faces of the infrared main lens are plated with infrared antireflection films.
8. A high-precision infrared detector time constant testing method is characterized by comprising the following steps:
the infrared light source unit generates modulated infrared light signals;
performing optical shaping through an infrared optical system unit, and vertically projecting to an infrared detector adapter unit;
converting the optical signal into an electrical signal by an infrared detector adapter unit;
the electric signal is collected and read by the photoelectric signal collecting unit, and the time constant of the infrared detector is obtained by the information processing unit; wherein the content of the first and second substances,
the infrared light source unit comprises a light source module, a temperature control module, a power supply module and a modulation module; the power supply module provides working voltage of the light source module, the temperature control module controls the temperature of the light source module to ensure stable light emitting power, the light source module generates infrared light, and the modulation module modulates the infrared light into rectangular waves; the light source module is an infrared LED module; wherein the content of the first and second substances,
the infrared optical system unit comprises an infrared main lens and an infrared correction lens; wherein the content of the first and second substances,
the rectangular wave is shaped by an infrared main lens and an infrared correcting lens of the infrared optical system unit to obtain light spots matched with sensitive elements of the infrared detector adapter unit;
the infrared detector is a thermistor type infrared detector;
the modulation module generates a standard modulation square wave signal, the error magnitude is microsecond, the level width is dynamically adjusted, and the rising edge is 0.1 ms; falling edge 0.1 ms; keeping 10-40 ms adjustable;
the infrared light source module is packaged on a heat sink by adopting 10 infrared LED chips;
the infrared main lens is coated with infrared antireflection films on two sides, so that the infrared reflection loss of the germanium mirror is reduced, and the transmittance of infrared light emitted by the infrared LED array is increased by not less than 85%.
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