CN112098883A - Temperature rise test integrated data acquisition circuit and control method - Google Patents
Temperature rise test integrated data acquisition circuit and control method Download PDFInfo
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- CN112098883A CN112098883A CN202010888208.7A CN202010888208A CN112098883A CN 112098883 A CN112098883 A CN 112098883A CN 202010888208 A CN202010888208 A CN 202010888208A CN 112098883 A CN112098883 A CN 112098883A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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Abstract
The invention belongs to the technical field of automobile hybrid power supply products, in particular to a temperature rise test integrated data acquisition circuit and a control method, which comprises a DCDC product, a direct current source group, a direct current electronic load, a temperature rise tester and a PC computer, wherein COM ends of the direct current source group and the direct current electronic load are respectively connected with the PC computer, OUT ends of the direct current source group and the direct current electronic load are respectively connected with the DCDC product, a CH end of the temperature rise tester is connected with a temperature rise interface on the DCDC product, a USB end of the temperature rise tester is connected with the PC computer, and the PC computer is connected with the DCDC product through a CAN bus; the invention has the function of full-automatic product measurement, automatically records data and automatically judges results, greatly improves the measurement efficiency and the accuracy of the measurement results, reduces the production cost of the product, has higher reliability and safety, and further directly improves the market competitiveness of the product.
Description
Technical Field
The invention belongs to the technical field of automobile hybrid power supply products, and particularly relates to a temperature rise test integrated data acquisition circuit and a control method.
Background
With the development of industry and the progress of science and technology, the electrical appliance industry is more and more intelligent, and the service life and the stability of products are more and more valued by users. In order to verify the characteristics of the service life, stability and the like of the electric appliance, the temperature rise effect of the product is generally tested. The temperature rise refers to the temperature of each component in the electronic and electrical equipment above the environment. After the conductor is flowed through, current thermal effect is produced, and the temperature of the surface of the conductor is continuously raised until the conductor is stabilized along with the time. In order to verify the characteristics of the electronic product, such as service life and stability, the temperature rise of important elements (an IC chip and the like) of the electronic product is usually tested, a device to be tested is placed at a certain specific temperature (T =70 ℃) higher than the rated working temperature (T =25 ℃) of the device to operate, the temperature rise of the element higher than the ambient temperature is recorded after stabilization, and whether the design of the product is reasonable or not is verified.
In the development stage of the automobile hybrid product, a laboratory needs to perform temperature rise test on a DC48V-12V power supply of an automobile, when the DC48V is measured and converted into 12V full-load output, the product needs to be placed in a temperature box to be heated to 55-105 ℃, the temperature rise change of each key component in the product is measured, and meanwhile, the upper computer parameters, the channel parameters of a temperature rising instrument, the direct-current source parameters, the load parameters and the like are checked; this results in a large amount of data to be exchanged and recorded. However, in the existing component temperature rise test method, the test environment is mainly set up manually, and a tester needs to manually record test data in front of the test device and manually analyze the test data. However, temperature rise tests are carried out manually for a long time, the test time is long, the temperature rise tests of large transformers even require dozens of hours or even longer, the test process is quite monotonous and dull, the working strength is high, workers are easy to fatigue, the accuracy of the results of the temperature rise tests is low, and the judgment on the product quality is influenced in severe cases. The development personnel are provided with great challenges, and therefore, the existing temperature rise test needs to be improved.
Disclosure of Invention
One of the objectives of the present invention is to provide an integrated temperature rise test data acquisition and measurement system, which can improve the automation level of a DC48V-12V power supply conversion temperature rise test, improve the accuracy of the temperature rise test result, and better promote the development of power supply converter production, in view of the defects and shortcomings of the prior art.
The technical scheme of the invention is as follows:
the temperature rise test integrated data acquisition circuit comprises a DCDC product, a direct current source group, a direct current electronic load, a temperature rise tester and a PC computer, wherein COM ends of the direct current source group and the direct current electronic load are respectively connected with the PC computer;
the direct current source group is provided with a direct current source I, a direct current source II and a direct current source III which are connected with a DCDC product, the direct current source I and the direct current source II respectively input voltage signals to an auxiliary power supply end of the DCDC product, and the direct current source III inputs a main power supply to the DCDC product;
the direct current electronic load is used for measuring the load capacity of the DCDC product;
the temperature rise tester is used for measuring temperature rise parameters of internal components of the DCDC product;
the PC is used for controlling acquisition and communication, data exchange, result storage and data judgment according to the direct current source group, the DCDC product, the direct current electronic load and the temperature rise tester;
and the upper computer sets output working voltage and current parameters for the product through the CAN.
The invention also provides a control method of the temperature rise test integrated data acquisition circuit, which comprises a temperature display module, a data storage module, a display and judgment module and an upper computer control module which are arranged in the PC computer end and read;
the temperature display module is used for displaying the test values of a plurality of channels of the temperature rise tester in real time, marking the corresponding name and unit of each channel measurement point, and displaying the color of a font corresponding to the color displayed by each channel on the screen of the temperature rise tester;
the data storage module is used for storing all measured data at a self-defined interval time, displaying the specific time point of the subsequent 7 secondary data storages, and automatically rescanning to enter the next cycle after 8 storages are completed;
the display and judgment module is used for displaying and collecting the measured value of each channel of the temperature rise tester and the voltage, current and power value of the input and output ends of the DCDC product, and can automatically judge that the measured value exceeds the range through setting the upper limit value of the parameter and then alarm and highlight in red;
the upper computer control module analyzes and writes CAN communication protocol instructions of the DCDC product and a communication protocol of the temperature rise tester into an upper computer through integration, and controls parameter setting of the DCDC product and input and output voltage and current power between the temperature rise tester in a unified mode.
The method comprises the following steps: the PC computer acquires the current time;
step two: setting a time point for acquiring measurement data in a data storage module;
step three: initializing a temperature rise tester and entering measurement preparation;
step four: the PC computer scans the data tested by the temperature rise tester;
step five: setting and obtaining a DCDC product measured value;
step six: and acquiring the current time of the system again, judging whether the current time is equal to the storage time in the data storage module or not, if not, skipping to the fourth step, and if so, judging whether the measured data is qualified or not, and storing the data.
And the data storage module continuously stores specific time points of data for 7 times in the sixth step, and automatically rescans to the second step to enter the next cycle after the 8 th storage is finished.
Compared with the prior art, the invention has the beneficial effects that: the temperature rise test integrated data acquisition circuit and the control method control and exchange and record required data by using the upper computer of the PC computer, manual operation and recording are not needed, time and labor are saved, the accuracy of the acquired and recorded data is high, the judgment of the temperature rise test on the product quality is improved, the temperature rise test integrated data acquisition circuit has the function of fully automatically measuring products, the data and the result are automatically recorded, the accuracy of the measurement efficiency and the measurement result is greatly improved, the production cost of the products is reduced, the reliability and the safety are higher, and further the market competitiveness of the products is directly improved.
Drawings
FIG. 1 is a system block diagram of the temperature rise test integrated data acquisition circuit of the present invention.
FIG. 2 is a flow chart of a control method of the temperature rise test integrated data acquisition circuit of the present invention.
FIG. 3 is a circuit wiring diagram of the temperature rise test integrated data acquisition circuit of the present invention.
FIG. 4 is a system control diagram of the control method of the temperature rise test integrated data acquisition circuit of the present invention.
Detailed Description
As shown in fig. 1-4, the temperature rise test integrated data acquisition circuit of the present invention includes a DCDC product with a specification of DC48V-12V, a DC source set, a DC electronic load, a temperature rise tester, and a PC computer, where the DC source set includes a first DC source with 14.3V, a second DC source with 14.3V, and a third DC source with 48V, which are connected to the DCDC product, the first DC source and the second DC source respectively input voltage signals to an auxiliary power supply terminal of the DCDC product, and the third DC source inputs a main power supply to the DCDC product; the direct current electronic load is used for measuring the load capacity of the DCDC product; the temperature rise tester is used for measuring temperature rise parameters of internal components of the DCDC product; the PC computer is used for controlling acquisition and providing communication, data exchange, result storage and data judgment according to the direct current source group, the DCDC product, the direct current electronic load and the temperature rise tester. The direct current source group and the COM end of the direct current electronic load are respectively connected with a PC (personal computer), the direct current source group and the OUT end of the direct current electronic load are respectively connected with a DCDC product, the CH end of the temperature rise tester is connected with a temperature rise interface on the DCDC product, the USB end of the temperature rise tester is connected with the PC, the PC is provided with an upper computer which is connected with the DCDC product through a CAN (controller area network) bus, and the upper computer sets output working voltage and current parameters for the product through the CAN.
The invention also provides a control method of the temperature rise test integrated data acquisition circuit, which comprises a temperature display module, a data storage module, a display and judgment module and an upper computer control module which are arranged in a PC computer end and read, wherein the temperature display module is used for displaying the test values of 20 channels of the temperature rise tester in real time, and marking the corresponding name and unit of each channel measurement point, and the font display color corresponds to the color displayed by each channel on the screen of the temperature rise tester; the data storage module is used for storing all measured data at a self-defined interval time, displaying the specific time point of the subsequent 7 secondary data storages, and automatically rescanning to enter the next cycle after 8 storages are completed; the display and judgment module is used for displaying and collecting the measured value of each channel of the temperature rise tester and the voltage, current and power value of the input and output ends of the DCDC product, and can automatically judge that the measured value exceeds the range through setting the upper limit value of the parameter and then alarm and highlight in red; the upper computer control module analyzes and writes CAN communication protocol instructions of the DCDC product and a communication protocol of the temperature rise tester into an upper computer through integration, and controls parameter setting of the DCDC product and input and output voltage and current power between the temperature rise tester in a unified mode.
In a preferred embodiment, the control method of the temperature rise test integrated data acquisition circuit further includes the following operation acquisition steps:
the method comprises the following steps: the PC computer acquires the current time;
step two: setting a time point for acquiring measurement data in a data storage module;
step three: initializing a temperature rise tester and entering measurement preparation;
step four: the PC computer scans the data tested by the temperature rise tester;
step five: setting and obtaining a DCDC product measured value;
step six: and acquiring the current time of the system again, judging whether the current time is equal to the storage time in the data storage module or not, if not, skipping to the fourth step, and if so, judging whether the measured data is qualified or not, and storing the data.
In a preferred embodiment, the data saving module continuously saves the data for 7 times in step six, and after the 8 th saving is completed, the data saving module jumps to step two to automatically rescan to enter the next loop.
Through the technical scheme, the temperature rise test integrated data acquisition circuit and the control method control and exchange and record required data through the upper computer using the PC, manual operation recording is not needed, time and labor are saved, the data accuracy of acquisition and recording is high, the judgment of the temperature rise test on the product quality is improved, the full-automatic product measurement function is realized, data are automatically recorded, the result is automatically judged, the measurement efficiency and the accuracy of the measurement result are greatly improved, the production cost of the product is reduced, the reliability and the safety are higher, and further the market competitiveness of the product is directly improved.
While embodiments of the invention have been disclosed above, it is not intended to be limited to the uses set forth in the specification and examples. It can be applied to all kinds of fields suitable for the present invention. Additional modifications will readily occur to those skilled in the art. It is therefore intended that the invention not be limited to the exact details and illustrations described and illustrated herein, but fall within the scope of the appended claims and equivalents thereof.
Claims (4)
1. Temperature rise test integration data acquisition circuit, its characterized in that: the direct current testing device comprises a DCDC product, a direct current source group, a direct current electronic load, a temperature rise tester and a PC (personal computer), wherein COM (component object model) ends of the direct current source group and the direct current electronic load are respectively connected with the PC;
the direct current source group is provided with a direct current source I, a direct current source II and a direct current source III which are connected with a DCDC product, the direct current source I and the direct current source II respectively input voltage signals to an auxiliary power supply end of the DCDC product, and the direct current source III inputs a main power supply to the DCDC product;
the direct current electronic load is used for measuring the load capacity of the DCDC product;
the temperature rise tester is used for measuring temperature rise parameters of internal components of the DCDC product;
the PC is used for controlling acquisition and communication, data exchange, result storage and data judgment according to the direct current source group, the DCDC product, the direct current electronic load and the temperature rise tester;
and the upper computer sets output working voltage and current parameters for the product through the CAN.
2. The control method of the temperature rise test integrated data acquisition circuit is characterized in that: the method comprises the steps of reading a temperature display module, a data storage module, a display and judgment module and an upper computer control module in a PC computer terminal;
the temperature display module is used for displaying the test values of a plurality of channels of the temperature rise tester in real time, marking the corresponding name and unit of each channel measurement point, and displaying the color of a font corresponding to the color displayed by each channel on the screen of the temperature rise tester;
the data storage module is used for storing all measured data at a self-defined interval time, displaying the specific time point of the subsequent 7 secondary data storages, and automatically rescanning to enter the next cycle after 8 storages are completed;
the display and judgment module is used for displaying and collecting the measured value of each channel of the temperature rise tester and the voltage, current and power value of the input and output ends of the DCDC product, and can automatically judge that the measured value exceeds the range through setting the upper limit value of the parameter and then alarm and highlight in red;
the upper computer control module analyzes and writes CAN communication protocol instructions of the DCDC product and a communication protocol of the temperature rise tester into an upper computer through integration, and controls parameter setting of the DCDC product and input and output voltage and current power between the temperature rise tester in a unified mode.
3. The control method of the temperature rise test integrated data acquisition circuit according to claim 2, characterized in that: the method comprises the following collection steps:
the method comprises the following steps: the PC computer acquires the current time;
step two: setting a time point for acquiring measurement data in a data storage module;
step three: initializing a temperature rise tester and entering measurement preparation;
step four: the PC computer scans the data tested by the temperature rise tester;
step five: setting and obtaining a DCDC product measured value;
step six: and acquiring the current time of the system again, judging whether the current time is equal to the storage time in the data storage module or not, if not, skipping to the fourth step, and if so, judging whether the measured data is qualified or not, and storing the data.
4. The control method of the temperature rise test integrated data acquisition circuit according to claim 3, characterized in that: and the data storage module continuously stores specific time points of data for 7 times in the sixth step, and automatically rescans to the second step to enter the next cycle after the 8 th storage is finished.
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| CN202010888208.7A CN112098883A (en) | 2020-08-28 | 2020-08-28 | Temperature rise test integrated data acquisition circuit and control method |
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Patent Citations (9)
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| CN101881671A (en) * | 2009-08-21 | 2010-11-10 | 中华人民共和国无锡出入境检验检疫局 | Virtual program control temperature test instrument |
| CN201965217U (en) * | 2010-11-27 | 2011-09-07 | 西安博昱新能源有限公司 | Integrated test system for LED (light-emitting diode) street lamp power supply |
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| CN205992048U (en) * | 2016-05-05 | 2017-03-01 | 卜路霞 | A kind of small-sized DC/DC power module tester for overall characteristic |
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| CN111487554A (en) * | 2020-03-17 | 2020-08-04 | 北京交通大学 | Automatic testing system and method for direct current-to-direct current power supply module |
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Application publication date: 20201218 |
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