CN112086338A

CN112086338A - Ion source imaging device

Info

Publication number: CN112086338A
Application number: CN201910515317.1A
Authority: CN
Inventors: 朱星高; 代新; 喻佳俊; 刘平; 刘今朝; 黄凯斌; 黄利勇
Original assignee: Guangzhou Hexin Kangyuan Medical Technology Co ltd
Current assignee: Guangzhou Hexin Kangyuan Medical Technology Co ltd
Priority date: 2019-06-14
Filing date: 2019-06-14
Publication date: 2020-12-15

Abstract

The invention discloses an ion source imaging device. The ion source imaging device comprises an ion source cavity, an ion source electrifying module, a reflector, a light-transmitting sealing piece, an imaging lens, a lens supporting piece and an image acquisition mechanism, wherein the ion source cavity is provided with a sample window and a light reflecting window, the ion source electrifying module is arranged in the ion source cavity and close to the sample window, the light-transmitting sealing piece seals the light reflecting window, the lens supporting piece is positioned outside the ion source cavity and connected with the ion source cavity, the lens supporting piece is provided with a reflecting channel, one end of the reflecting channel is opposite to the sample window, the imaging lens and the lens supporting piece are rotatably connected and communicated with the other end of, the image acquisition mechanism is connected with the imaging lens, reflectors are arranged in the ion source cavity and the reflection channel, and the reflectors in the ion source cavity and the reflection channel can transmit the image of the target plate into the imaging lens. The ion source imaging device is simple in structure and easy to operate.

Description

Ion source imaging device

Technical Field

The invention relates to the field of detection, in particular to an ion source imaging device.

Background

Matrix-assisted laser desorption ionization time-of-flight mass spectrometer is a kind of biological mass spectrometer instrument commonly used for macromolecular sample analysis. When a sample is analyzed, after the sample forms a solid on a sample target, the sample target in the sample introduction chamber is transferred to the moving platform in a vacuum state through the lifting device. The electric field generated by the combination of the pole piece and the electric system is utilized to lead the initially dispersed ions into a field-free flight area in an accelerating, focusing and deflecting way, and the ions with different masses are separated and then sequentially sent into a detector for detection. In the process, a sample target is firstly moved to a focal point position of laser focusing, then the deposition condition of a sample is observed, and a sample imaging light path is required to meet the requirements of quick, accurate and clear imaging in the process of observing a sample target point. The existing imaging light path structure has the defects of complex structure, inconvenient adjustment and imaging blur.

Disclosure of Invention

Therefore, there is a need for an ion source imaging apparatus with a simple structure, a small size, and a convenient adjustment and improved imaging effect.

An ion source imaging device comprises an ion source cavity, an ion source power-on module, a reflector, a light-transmitting sealing element, an imaging lens, a lens supporting piece and an image acquisition mechanism, wherein the ion source cavity is provided with a sample window and a light-reflecting window, the ion source power-on module is arranged in the ion source cavity and close to the sample window, the light-transmitting sealing element is arranged in the light-reflecting window to seal the light-reflecting window, the lens supporting piece is positioned outside the ion source cavity and connected with the ion source cavity, the lens supporting piece is provided with a reflecting channel, one end of the reflecting channel is opposite to the sample window, the imaging lens is rotatably connected with the lens supporting piece and communicated with the other end of the reflecting channel, the image acquisition mechanism is connected with the imaging lens, the reflector is arranged in the ion source cavity and in the reflecting channel, the reflector in the ion source cavity and the reflector in the reflection channel can transmit the image at the sample window into the imaging lens.

In one embodiment, the reflection channel is bent at a right angle, and a reflector in the reflection channel is used for reflecting light from the reflector in the ion source cavity into the imaging lens at a right angle.

In one embodiment, the mirrors in the reflective channel are disposed at right-angled corners of the reflective channel.

In one embodiment, the ion source imaging apparatus further includes a mirror holder, the lens holder has a holder channel connected to the reflection channel, the mirror holder has a placement platform for placing a mirror, the mirror platform extends into the reflection channel through the holder channel, and the mirror holder is connected to the lens holder.

In one embodiment, the reflector holder is detachably connected to the lens holder.

In one embodiment, the ion source imaging device further includes a screw, and the reflector fixing member and the lens support member are detachably connected by the screw.

In one embodiment, the ion source imaging device further comprises a lens nut, wherein a boss is arranged at one end, facing the imaging lens, of the lens support, a thread is arranged on the outer peripheral wall of the boss, a thread is arranged on the outer peripheral wall of one end, facing the imaging lens support, of the imaging lens, the imaging lens is abutted to the boss, and the lens nut is in threaded connection with the imaging lens and the lens support to realize that the imaging lens is connected with the lens support.

In one embodiment, the image acquisition mechanism is an industrial camera.

In one embodiment, the mirror is a right triangular prism.

In one embodiment, the image acquisition mechanism is in threaded connection with the imaging lens.

The imaging light path device of the ion source imaging device has the advantages of simple structure, small volume, convenient adjustment and capability of rapidly, accurately and clearly displaying the sample target point so as to improve the imaging effect. In the testing process, the sample points on the target plate can be reflected to the imaging lens through the two reflectors and then acquired by the image acquisition mechanism, so that the actual conditions of the sample target points on the target plate can be checked on a computer display screen. When the imaging lens and the lens supporting piece are installed, the imaging lens and the image acquisition mechanism are connected together, and then the imaging lens and the lens supporting piece are connected. For example, when the imaging device is installed, after the image capturing mechanism is connected to the imaging lens at one of the angles, the image capturing mechanism may not be precisely located at the predetermined angle, and at this time, the position between the imaging lens and the lens supporting member only needs to be adjusted, and the image capturing mechanism can reach the predetermined angle by rotating the imaging lens, so that the adjustment is convenient, the time and the labor are saved, and the imaging effect is improved.

The ion source imaging device is provided with the reflection channel which is bent at a right angle, and the reflection mirror in the reflection channel is used for reflecting light rays from the reflection mirror in the ion source cavity to the imaging lens at a right angle, so that the size of the whole ion source imaging device can be reduced.

The ion source imaging device is provided with the lens nut, the imaging lens and the image acquisition mechanism are connected together during installation, and then the imaging lens is connected with the lens supporting piece, so that the lens nut can be screwed after the position of the image acquisition mechanism is ensured to be in a required direction; in the testing process, when the position of the industrial camera deviates from the set position, the lens nut can be loosened, the image acquisition mechanism is adjusted to the set position, and then the lens nut is screwed, so that the operation is convenient, the image acquisition mechanism can be ensured to be fixed randomly within the range of 360 degrees, and the imaging effect of the target point is improved.

The distance between the right-angle triple prism as the reflector and the sample target point on the imaging lens and the target plate is short, the right-angle triple prism is not easy to deform and high in reflectivity, and the imaging effect can be improved.

Drawings

FIG. 1 is a schematic side view of an ion source imaging apparatus according to an embodiment;

FIG. 2 is a schematic diagram of the ion source imaging apparatus shown in FIG. 1;

FIG. 3 is a schematic side view of the ion source imaging apparatus shown in FIG. 2;

fig. 4 is a crystallographic image of an ACTH sample taken with a conventional imaging device;

FIG. 5 is a crystal mapping image of a SNP site gene sample obtained by a conventional imaging apparatus;

fig. 6 is a crystal image of the ACTH sample obtained by the ion source imaging apparatus shown in fig. 1;

FIG. 7 is a crystal image of the SNP locus gene sample obtained by the ion source imaging apparatus shown in FIG. 1.

Description of the reference numerals

10: an ion source imaging device; 100: an ion source cavity; 110: a sample window; 120: a light reflective window; 200: an ion source power-up module; 300: a mirror; 400: a light transmissive seal; 500: an imaging lens; 600: a lens support; 610: a reflection channel; 620: a boss; 700: an image acquisition mechanism; 800: a reflector fixing member; 900: a lens nut; 20: and (4) a target plate.

Detailed Description

To facilitate an understanding of the invention, the invention will now be described more fully with reference to the accompanying drawings. Preferred embodiments of the present invention are shown in the drawings. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.

It will be understood that when an element is referred to as being "secured to" another element, it can be directly secured to the other element or intervening elements may also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements may also be present. When an element is referred to as being "mounted on" another element, it can be directly mounted on the other element or intervening elements may also be present. When an element is referred to as being "on" another element, it can be directly on the other element or intervening elements may also be present.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. The terminology used in the description of the invention herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Referring to fig. 1, an embodiment of the present invention provides an ion source imaging apparatus 10, which includes an ion source chamber 100, an ion source power-up module 200, a mirror 300, a transparent sealing member 400, an imaging lens 500, a lens support 600, and an image capturing mechanism 700.

The ion source cavity 100 has a sample window 110 and a light reflection window 120, wherein, referring to fig. 1 and 2, the sample window 110 is located on the bottom surface of the ion source cavity 100, and the light reflection window 120 is located on the side surface of the ion source cavity 100. The outer portion of the sample window 110 is used to place the target plate 20. An ion source power-up module 200 is disposed within the ion source chamber 100 and proximate to the sample window 110, the ion source power-up module 200 being configured to accelerate the sample from the target plate 20.

The light transmissive sealing member 400 is installed in the light reflective window 120 to seal the light reflective window 120. The light transmissive sealing member 400 serves to seal the light reflective window 120.

The lens holder 600 is disposed outside the ion source chamber 100 and connected to the ion source chamber 100, the lens holder 600 has a reflection channel 610, one end of the reflection channel 610 is opposite to the sample window 110, and the imaging lens 500 is rotatably connected to the lens holder 600 and communicates with the other end of the reflection channel 610.

Image taking mechanism 700 is connected to imaging lens 500. A mirror 300 is disposed in the ion source chamber 100 and in the reflection channel 610. The mirror 300 in the ion source cavity 100 and the mirror 300 in the reflection channel 610 can emit the image at the sample window 110 into the imaging lens 500.

Preferably, the reflective channel 610 is bent at a right angle. The mirror 300 in the reflection channel 610 is used to reflect light from the mirror 300 in the ion source cavity 100 into the imaging lens 500 at a right angle. The ion source imaging device 10 is provided with the reflection channel 610 bent at a right angle, as shown in fig. 1 and fig. 3, the reflector 300 in the reflection channel 610 is used for reflecting the light from the reflector 300 in the ion source cavity 100 into the imaging lens 500 at a right angle, so that the volume of the whole ion source imaging device 10 can be reduced. The arrangement enables the imaging lens 500 to be tightly attached to the outer wall of the ion source cavity 100, so that the size of the whole ion source imaging device 10 is reduced, the reflection channel 610 bent at a right angle can also shorten the light reflection distance, and the imaging quality is improved.

Further, the reflecting mirror 300 in the reflecting channel 610 is arranged at the right-angle corner of the reflecting channel 610, so that the reflecting mirror 300 is arranged at an angle of 45 degrees, and the light ray at one end of the reflecting channel 610 bent at a right angle can be reflected to the other end, namely, the light ray on the reflecting mirror 300 in the ion source cavity 100 is reflected at a right angle to the imaging lens 500, so that the right-angle bending reflection of the light ray is realized.

Further, the ion source imaging apparatus 10 further includes a mirror mount 800. The lens holder 600 has a holder passage communicating with the reflection passage 610, the mirror holder 800 has a placing platform for placing the mirror 300, the mirror 300 platform extends into the reflection passage 610 through the holder passage, and the mirror holder 800 is connected to the lens holder 600.

Alternatively, the mirror holder 800 is detachably coupled to the lens holder 600.

Further, the ion source imaging apparatus 10 further includes a screw. The mirror fixing member 800 and the lens supporting member 600 are detachably connected by a screw. Specifically, the mirror fixing member 800 and the lens supporting member 600 have screw holes, and the screw has an external thread, and the screw is inserted into the screw holes of the mirror fixing member 800 and the lens supporting member 600 to fix the mirror fixing member 800 and the lens supporting member 600.

In one embodiment, the ion source imaging device 10 further comprises a lens nut 900. The end of the lens support 600 facing the imaging lens 500 is provided with a boss 620, the outer peripheral wall of the boss 620 is provided with threads, the outer peripheral wall of the end of the imaging lens 500 facing the lens support 600 is provided with threads, the imaging lens 500 abuts against the boss 620, and the lens nut 900 is in threaded connection with the imaging lens 500 and the lens support 600 to realize that the imaging lens 500 is connected with the lens support 600. The ion source imaging device 10 is provided with the lens nut 900, when the device is installed, the imaging lens 500 and the image acquisition mechanism 700 are connected together, and then the imaging lens 500 is connected with the lens support member 600, so that the lens nut 900 can be screwed after the position of the image acquisition mechanism 700 is ensured to be in a required direction; in the testing process, when the position of the industrial camera is found to deviate from the set position, the lens nut 900 can be loosened, the image acquisition mechanism 700 is adjusted to the set position, and then the lens nut 900 is screwed, so that the operation is convenient, the image acquisition mechanism 700 can be ensured to be fixed at will within the range of 360 degrees, and the imaging effect of the target point is improved.

In one embodiment, image acquisition mechanism 700 is an industrial camera.

In one embodiment, the reflector 300 is a right triangular prism. The size of the mirror 300 pieces of the right triangular prism is 10mm × 10mm × 10 mm. The ion source imaging device 10 has the advantages that the right-angle triple prism is arranged as the reflector 300, the distance between the imaging lens 500 and the sample target spot on the target plate 20 is short, and the imaging effect can be improved due to the fact that the right-angle triple prism is not prone to deformation and high in reflectivity.

In one embodiment, image capture mechanism 700 is threadably coupled to imaging lens 500, and so configured, the stability of the coupling of image capture mechanism 700 to imaging lens 500 is achieved.

When the ion source imaging device 10 of the present invention is installed, after the image capturing mechanism 700 is connected to the imaging lens 500 at one of the angles, the image capturing mechanism 700 may not be precisely located at the predetermined angle, at this time, only the position between the imaging lens 500 and the lens supporting member 600 needs to be adjusted, the image capturing mechanism 700 can reach the predetermined angle by rotating the imaging lens 500, or the lens supporting member 600 and the imaging lens 500 are loosened by rotating the lens nut 900, the image capturing mechanism 700 can be located at the predetermined position by rotating the imaging lens 500, and the lens supporting member 600 and the imaging lens 500 are fixed by screwing the lens nut 900, so that the adjustment is convenient, the time and labor are saved, and the imaging effect is improved.

Comparative example 1

This comparative example was based on the above examples and each of the mirrors 300 was replaced with a thin mirror having dimensions of 10mm × 10mm × 0.5 mm. An image of a crystal obtained when a rectangular prism having a size of 10mm × 10mm × 10mm is used as the mirror 300 is shown in fig. 4, wherein fig. 4 is an image of an ACTH sample crystal in fig. 4 and 5, and fig. 5 is an image of a SNP site gene sample crystal. The crystal patterns obtained when the mirror 300 is a rectangular prism having a size of 10mm × 10mm × 0.5mm are shown in fig. 6 and 7, in which the left side in fig. 6 is the crystal pattern of the ACTH sample, and fig. 7 is the crystal pattern of the SNP site gene sample. As can be seen from comparison of fig. 4 and 6 and comparison of fig. 5 and 7, the crystal imaging effect of the ion source imaging apparatus 10 using the right-angled triple prism as the reflector is significantly better than that of the conventional thin reflector.

The imaging light path device of the ion source imaging device 10 has the advantages of simple structure, small volume, convenient adjustment and capability of rapidly, accurately and clearly displaying the sample target point so as to improve the imaging effect. In the testing process, the sample point on the target plate 20 can be reflected to the imaging lens 500 by the two reflectors 300 and then acquired by the image acquisition mechanism 700, so that the actual condition of the sample target point on the target plate 20 can be viewed on the computer display screen. When the imaging lens 500 and the image acquisition mechanism 700 are connected together, the imaging lens 500 is connected with the lens supporting piece 600, and the imaging lens 500 and the lens supporting piece 600 can rotate, so that the position of the image acquisition mechanism 700 can be ensured to be in the direction required by testing, and the imaging effect of a target point is improved.

The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.

The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the present invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.

Claims

1. An ion source imaging device, comprising an ion source cavity, an ion source charging module, a reflector, a light-transmitting sealing member, an imaging lens, a lens supporting member and an image acquisition mechanism, wherein the ion source cavity has a sample window and a light reflection window, the ion source charging module is arranged in the ion source cavity and close to the sample window, the light-transmitting sealing member is arranged in the light reflection window to seal the light reflection window, the lens supporting member is arranged outside the ion source cavity and connected with the ion source cavity, the lens supporting member has a reflection channel, one end of the reflection channel is opposite to the sample window, the imaging lens is rotatably connected with the lens supporting member and communicated with the other end of the reflection channel, the image acquisition mechanism is connected with the imaging lens, the ion source cavity and the reflection channel are internally provided with the reflector, and the reflector in the ion source cavity and the reflector in the reflection channel can transmit an image at a sample window to the imaging lens.

2. The ion source imaging device of claim 1, wherein the reflection channel is bent at a right angle, and a mirror in the reflection channel is used for reflecting light from the mirror in the ion source cavity into the imaging lens at a right angle.

3. The ion source imaging apparatus of claim 1, wherein the mirrors in the reflection channel are disposed at right-angled corners of the reflection channel.

4. The ion source imaging apparatus of claim 3, further comprising a mirror mount, wherein the lens support has a support channel in communication with the reflection channel, wherein the mirror mount has a placement platform for placing a mirror, wherein the mirror platform extends into the reflection channel through the support channel, and wherein the mirror mount is coupled to the lens support.

5. The ion source imaging apparatus of claim 4, wherein the mirror mount is removably coupled to the lens support.

6. The ion source imaging device of claim 5, further comprising a screw, wherein the mirror holder and the lens holder are detachably connected by the screw.

7. The ion source imaging device according to any one of claims 1 to 6, further comprising a lens nut, wherein the lens support has a boss at an end facing the imaging lens, the boss has a thread at an outer peripheral wall thereof, the imaging lens has a thread at an outer peripheral wall at an end facing the lens support, the imaging lens abuts against the boss, and the lens nut is screwed to the imaging lens and the lens support to connect the imaging lens and the lens support.

8. The ion source imaging apparatus of any of claims 1-6, wherein the image acquisition mechanism is an industrial camera.

9. The ion source imaging apparatus of any of claims 1-6, wherein the mirror is a right triangular prism.

10. The ion source imaging apparatus of any of claims 1-6, wherein said image capture mechanism is threadably connected to said imaging lens.