CN112067917B - Surge immunity testing system, method and device - Google Patents
Surge immunity testing system, method and device Download PDFInfo
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- CN112067917B CN112067917B CN202010670938.XA CN202010670938A CN112067917B CN 112067917 B CN112067917 B CN 112067917B CN 202010670938 A CN202010670938 A CN 202010670938A CN 112067917 B CN112067917 B CN 112067917B
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Abstract
The embodiment of the invention provides a surge immunity testing system, a surge immunity testing method and a surge immunity testing device, relates to the technical field of electromagnetic compatibility, and can smoothly complete the testing process of the tolerance degree of high-alternating-current voltage power supply equipment (namely tested equipment) to a surge signal, thereby improving the practicability of the surge immunity test. The method comprises the following steps: the voltage dividing device acquires a first power parameter of a target loop, wherein the first power parameter comprises the voltage amplitude of the target loop and the voltage phase angle of the target loop; the voltage dividing device determines a second power parameter according to the first power parameter, wherein the second power parameter comprises a target voltage amplitude and a voltage phase angle of the target loop; in the event that the voltage dividing device determines that the target voltage amplitude is less than or equal to a voltage amplitude threshold, the voltage dividing device sends the second power parameter to a surge signal generator.
Description
Technical Field
The embodiment of the invention relates to the technical field of electromagnetic compatibility, in particular to a surge immunity testing system, a surge immunity testing method and a surge immunity testing device.
Background
Currently, the tolerance level of a device under test (e.g., a television) to a surge signal can be determined by applying the surge signal to the device under test.
Specifically, the surge signal generator may periodically generate surge signals of different magnitudes (specifically, different voltage magnitudes), and then the surge signal generator may respectively transmit the surge signals of different magnitudes to the tested device. Furthermore, after the tested equipment receives the surge signals with different sizes, the surge signals which can be born by the tested equipment can be determined according to the working state of the tested equipment. If the tested equipment can normally work after receiving a certain surge signal, determining that the tested equipment can bear the surge signal, namely, the tested equipment can bear the corresponding surge signal under the voltage amplitude; otherwise, determining that the tested equipment cannot bear the corresponding surge signal under the voltage amplitude.
However, in the above method, the devices to be tested are all power supply devices with low ac voltage, and for power supply devices with high ac voltage (for example, 10kv ac voltage), the surge signal generator may be directly connected in series in the power supply circuit of the power supply device with high ac voltage, which may cause the surge signal generator to malfunction. As such, the above-described testing process of the device under test for the degree of tolerance to the surge signal may not be completed.
Disclosure of Invention
The embodiment of the invention provides a surge immunity testing system, a surge immunity testing method and a surge immunity testing device, which can smoothly complete the testing process of the tolerance degree of high-alternating-current voltage power supply equipment (namely tested equipment) to a surge signal, and improve the practicability of the surge immunity test.
In a first aspect, an embodiment of the present invention provides a surge immunity test system, including: the device comprises a high-voltage power supply, voltage dividing equipment, a surge signal generator and tested equipment; the voltage dividing equipment is connected with the high-voltage power supply and the surge signal generator, and the tested equipment is connected with the high-voltage power supply and the surge signal generator; the high-voltage power supply is used for generating a power supply signal; the voltage dividing device is used for reducing the voltage amplitude in the power supply signal; the surge signal generator is used for generating a surge signal, and the surge signal is used for carrying out surge immunity test on the tested equipment.
In a second aspect, an embodiment of the present invention provides a surge immunity testing method, including: the voltage dividing device acquires a first power parameter of a target loop, wherein the first power parameter comprises the voltage amplitude of the target loop and the voltage phase angle of the target loop; the voltage dividing device determines a second power parameter according to the first power parameter, wherein the second power parameter comprises a target voltage amplitude and a voltage phase angle of the target loop, and the target voltage amplitude is determined after the voltage dividing device reduces the voltage amplitude of the target loop; in the event that the voltage dividing device determines that the target voltage amplitude is less than or equal to a voltage amplitude threshold, the voltage dividing device sends the second power parameter to a surge signal generator.
In a third aspect, an embodiment of the present invention provides a method for testing surge immunity, including: the surge signal generator receives a second power parameter of the voltage dividing device, wherein the second power parameter comprises a target voltage amplitude and a voltage phase angle of a target loop, and the target voltage amplitude is determined after the voltage dividing device reduces the voltage amplitude of the target loop; under the condition that the surge signal generator determines that the voltage phase angle of the target loop is equal to a preset voltage phase angle, the surge signal generator generates a surge signal, and the surge signal is used for carrying out surge immunity test on tested equipment; the surge signal generator transmits the surge signal to the device under test.
In a fourth aspect, an embodiment of the present invention provides a voltage dividing apparatus, including: the device comprises an acquisition module, a determination module and a sending module; the acquisition module is used for acquiring a first power parameter of a target loop, wherein the first power parameter comprises the voltage amplitude of the target loop and the voltage phase angle of the target loop; the determining module is used for determining a second power parameter according to the first power parameter, wherein the second power parameter comprises a target voltage amplitude and a voltage phase angle of the target loop, and the target voltage amplitude is determined after the voltage dividing equipment reduces the voltage amplitude of the target loop; the sending module is used for sending the second power parameter to the surge signal generator when the voltage dividing device determines that the target voltage amplitude is smaller than or equal to a voltage amplitude threshold value.
In a fifth aspect, an embodiment of the present invention provides a surge signal generator, including: the device comprises a receiving module, a signal generating module and a transmitting module; the receiving module is used for receiving a second power parameter of the voltage dividing device, wherein the second power parameter comprises a target voltage amplitude and a voltage phase angle of a target loop, and the target voltage amplitude is a determined voltage amplitude after the voltage dividing device reduces the voltage amplitude of the target loop; the signal generation module is used for generating a surge signal under the condition that the surge signal generator determines that the voltage phase angle of the target loop is equal to a preset voltage phase angle, and the surge signal is used for carrying out surge immunity test on tested equipment; the sending module is used for sending the surge signal to the tested equipment.
In a sixth aspect, an embodiment of the present invention provides another voltage dividing apparatus, including: a processor, a memory, a bus, and a communication interface; the memory is used for storing computer executing instructions, and the processor is connected with the memory through a bus, when the voltage dividing device runs, the processor executes the computer executing instructions stored in the memory, so that the voltage dividing device executes the surge immunity testing method provided in the first aspect.
In a seventh aspect, an embodiment of the present invention provides another surge signal generator, including: a processor, a memory, a bus, and a communication interface; the memory is used for storing computer executing instructions, the processor is connected with the memory through a bus, and when the surge signal generator operates, the processor executes the computer executing instructions stored in the memory, so that the surge signal generator executes the surge immunity testing method provided in the second aspect.
In an eighth aspect, an embodiment of the present invention provides a computer readable storage medium, including instructions that when executed on a voltage dividing device, cause the voltage dividing device to perform a surge immunity test method provided in the first aspect above.
In a ninth aspect, an embodiment of the present invention provides a computer readable storage medium, including instructions that, when run on a surge signal generator, cause the surge signal generator to perform a surge immunity test method provided in the second aspect above.
In a tenth aspect, embodiments of the present invention provide a computer program product comprising instructions which, when run on a computer, cause the computer to perform the surge immunity test method of the first aspect and any one of its implementation forms.
In an eleventh aspect, embodiments of the present invention provide a computer program product comprising instructions which, when run on a computer, cause the computer to perform the surge immunity test method of the second aspect and any one of its implementation manners.
The surge immunity testing system, the surge immunity testing method and the surge immunity testing device provided by the embodiment of the invention are characterized in that voltage dividing equipment acquires first power parameters of a target loop, wherein the first power parameters comprise the voltage amplitude of the target loop and the voltage phase angle of the target loop; then the voltage dividing device determines a second power parameter according to the first power parameter, wherein the second power parameter comprises a target voltage amplitude (namely, the voltage amplitude determined after the voltage amplitude of the target loop is reduced by the voltage dividing device) and a voltage phase angle; in the event that the voltage dividing device determines that the target voltage amplitude is less than or equal to the voltage amplitude threshold, the voltage dividing device sends the second power parameter to the surge signal generator.
In this way, the surge signal generator receives the second power parameter and generates a surge signal if it is determined that the voltage phase angle of the target loop included in the second power parameter is equal to a preset voltage phase angle; the surge signal is then sent to the device under test. In the embodiment of the invention, the voltage amplitude of the target loop is reduced through the voltage dividing equipment, so that the voltage amplitude (namely, the target voltage amplitude smaller than or equal to the voltage amplitude threshold) which can be born by the surge signal generator is obtained, and the normal use of the surge signal generator can be ensured. Therefore, the surge signal generator can generate and send out the surge signal under specific conditions (namely, when the voltage phase angle of the target loop in the second power parameter is determined to be equal to the preset voltage phase angle), the test process of the tolerance degree of the high-alternating-current voltage power supply equipment (namely, the tested equipment) to the surge signal can be successfully completed, and the practicability of the surge immunity test is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below.
FIG. 1 is a schematic diagram of a surge immunity test system according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a surge immunity testing method according to an embodiment of the present invention;
fig. 3 is a schematic waveform diagram of a power signal collected by a surge signal generator according to an embodiment of the present invention;
fig. 4 is a circuit schematic diagram of a surge immunity testing method according to an embodiment of the present invention;
fig. 5 is a second circuit schematic diagram of a surge immunity testing method according to an embodiment of the present invention;
fig. 6 is a schematic structural diagram of a voltage dividing apparatus according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram II of a voltage dividing apparatus according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of a surge signal generator according to an embodiment of the present invention;
fig. 9 is a schematic diagram of a surge signal generator according to a second embodiment of the present invention.
Detailed Description
The surge immunity test system, method and device provided by the embodiment of the invention are described in detail below with reference to the accompanying drawings.
The terms "first" and "second" and the like in the description and the drawings of the present application are used for distinguishing between different objects and not for describing a particular sequence of objects, e.g. a first power parameter and a second power parameter etc. are used for distinguishing between different power parameters and not for describing a particular sequence of power parameters.
Furthermore, references to the terms "comprising" and "having" and any variations thereof in the description of the present application are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those listed but may optionally include other steps or elements not listed or inherent to such process, method, article, or apparatus.
It should be noted that, in the embodiments of the present invention, words such as "exemplary" or "such as" are used to mean serving as an example, instance, or illustration. Any embodiment or design described herein as "exemplary" or "e.g." in an embodiment of the present invention is not to be taken as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary" or "such as" is intended to present related concepts in a concrete fashion.
The term "and/or" as used herein includes the use of either or both of these methods.
In the description of the present application, unless otherwise indicated, the meaning of "a plurality" means two or more.
Based on the problems existing in the background technology, the embodiment of the invention provides a surge immunity testing system, a surge immunity testing method and a surge immunity testing device, wherein voltage dividing equipment acquires first power parameters of a target loop, wherein the first power parameters comprise a voltage amplitude value of the target loop and a voltage phase angle of the target loop; then the voltage dividing device determines a second power parameter according to the first power parameter, wherein the second power parameter comprises a target voltage amplitude (namely, the voltage amplitude determined after the voltage amplitude of the target loop is reduced by the voltage dividing device) and a voltage phase angle; in the event that the voltage dividing device determines that the target voltage amplitude is less than or equal to the voltage amplitude threshold, the voltage dividing device sends the second power parameter to the surge signal generator.
In this way, the surge signal generator receives the second power parameter and generates a surge signal if it is determined that the voltage phase angle of the target loop included in the second power parameter is equal to a preset voltage phase angle; the surge signal is then sent to the device under test. In the embodiment of the invention, the voltage amplitude of the target loop is reduced through the voltage dividing equipment, so that the voltage amplitude (namely, the target voltage amplitude smaller than or equal to the voltage amplitude threshold) which can be born by the surge signal generator is obtained, and the normal use of the surge signal generator can be ensured. Therefore, the surge signal generator can generate and send out the surge signal under specific conditions (namely, when the voltage phase angle of the target loop in the second power parameter is determined to be equal to the preset voltage phase angle), the test process of the tolerance degree of the high-alternating-current voltage power supply equipment (namely, the tested equipment) to the surge signal can be successfully completed, and the practicability of the surge immunity test is improved.
The surge immunity testing method provided by the embodiment of the invention is applied to a scene of surge immunity testing. As shown in fig. 1, the surge immunity test system includes a high-voltage power supply 101, a voltage dividing device 102, a surge signal generator 103, a coupling network 104, a device under test 105, and a decoupling network 106. Specifically, when the surge immunity test is required to be performed on the device under test 105, the high-voltage power supply 101 (which may be a 10kv power supply for example) generates (or provides for the device under test 105) a power supply signal to ensure the normal power supply of the device under test 105; in the process that the high-voltage power supply 101 provides a power signal for the tested device, the voltage dividing device 102 can collect the power signal, and specifically, the voltage dividing device collects a power parameter (such as a voltage) between the high-voltage power supply 101 and the tested device 105 (a loop formed by the voltage dividing device); after receiving the corresponding power signal (or power parameter), the surge signal generator 103 may generate a surge signal, and send the surge signal to the device under test 105 through the coupling network 104, so as to complete the surge immunity test of the device under test 105. Furthermore, as shown in fig. 1, a decoupling network 106 is further included between the high-voltage power supply 101 and the tested device 105, and the decoupling network 106 can attenuate the surge signal, so as to protect the high-voltage power supply 101.
In combination with the surge immunity test system shown in fig. 1, as shown in fig. 2, the surge immunity test method provided by the embodiment of the invention may include S101-S107.
S101, the voltage dividing device collects first power parameters of a target loop.
Wherein the first power parameter includes a voltage magnitude of the target loop and a voltage phase angle of the target loop.
It should be appreciated that the target loop is a loop formed between the high voltage power supply and the device under test, and that the high voltage power supply may generate a power signal and send the power signal to the device under test. In the process that the high-voltage power supply source sends a power signal to the tested equipment, the voltage dividing equipment can collect the power signal, namely, collect the first power parameter of the target loop.
S102, the voltage division equipment determines a second power parameter according to the first power parameter.
The second power parameter comprises a target voltage amplitude and a voltage phase angle of a target loop, wherein the target voltage amplitude is determined after the voltage division equipment reduces the voltage amplitude of the target loop.
It can be understood that, in order to protect the surge signal generator, the surge signal generator is prevented from being damaged by the power supply signal with an excessive voltage amplitude, so that the voltage dividing device is required to reduce the voltage amplitude of the target loop (i.e. the voltage amplitude in the first power parameter), and thus the voltage dividing device can obtain the target voltage amplitude with a lower voltage amplitude (relative to the voltage amplitude of the target loop); and, the voltage phase angle of the target loop (i.e., the voltage phase angle in the first power parameter) does not change. In one implementation, the first power parameter may further include a voltage frequency of the target loop, and the voltage frequency of the target loop does not change in the second power parameter obtained by the voltage dividing device.
S103, when the voltage dividing device determines that the target voltage amplitude is smaller than or equal to the voltage amplitude threshold value, the voltage dividing device sends the second power parameter to the surge signal generator.
In one implementation of the embodiments of the present invention, the voltage magnitude threshold described above may be configured based on an upper voltage limit of the surge signal generator. For example, the voltage amplitude threshold may be 220V, such that the second power parameter is sent to the surge signal generator in case the voltage dividing device determines that the target voltage amplitude is less than or equal to 220V.
In another implementation manner of the embodiment of the present invention, when the voltage dividing device determines that the target voltage amplitude is greater than the voltage amplitude threshold, the voltage dividing device continues to reduce the target voltage amplitude until the target voltage amplitude is less than or equal to the voltage amplitude threshold, and then sends the second power parameter to the surge signal generator.
S104, the surge signal generator receives a second power parameter of the voltage dividing device.
The second power parameter comprises a target voltage amplitude and a voltage phase angle of a target loop, wherein the target voltage amplitude is determined after the voltage division equipment reduces the voltage amplitude of the target loop.
In connection with the above description of the embodiments, it should be understood that the target loop is a loop formed between the high voltage power supply and the device under test, and the high voltage power supply may generate a power signal and transmit the power signal to the device under test.
And S105, when the surge signal generator determines that the voltage phase angle of the target loop is equal to the preset voltage phase angle, the surge signal generator generates a surge signal.
The surge signal is used for carrying out surge immunity test on the tested equipment.
It should be understood that the process of receiving the second power parameter by the surge signal generator is a continuous and uninterrupted process, and may also be understood that the surge signal generator collects the phase signal of the power supply signal (i.e., the voltage phase angle of the target loop) from the second power parameter during the process of receiving the second power parameter. The surge signal may be generated when the surge signal generator collects certain specific phase signals (i.e., voltage phase angles equal to a preset voltage phase angle).
In one implementation, the surge signal generator described above is used to generate the surge signal required in GB/T17626.5-2019.
Exemplary, as shown in fig. 3, a waveform diagram corresponding to the second power parameter (or the power signal) collected by the surge signal generator in the preset period is shown.
It is assumed that the preset voltage phase angles are 90 ° and 270 °, i.e. the surge signal generator generates a surge signal when it collects the second power parameter with a voltage phase angle of 90 ° and/or a voltage phase angle of 270 °, i.e. the surge signal generator generates a surge signal at time t' and/or time t "in fig. 3.
And S106, the surge signal generator sends a surge signal to the tested equipment.
In one implementation of the embodiment of the present invention, S106 specifically includes S1061.
S1061, the surge signal generator sends the surge signal to the coupling network.
It should be appreciated that embodiments of the present invention may incorporate a coupling network between the surge generator and the device under test, the coupling network being used to protect the surge generator. The coupling network can couple the surge signal generated by the surge signal generator into a target loop (namely a line formed by the high-voltage power supply and the tested equipment).
And S107, the tested equipment receives the surge signal of the surge signal generator.
In connection with the description in S1061 above, it should be understood that the device under test may receive the surge signal generated by the surge signal generator from the coupling network, thereby completing the surge immunity test of the device under test.
According to the surge immunity testing method provided by the embodiment of the invention, the voltage dividing equipment collects first power parameters of the target loop, wherein the first power parameters comprise the voltage amplitude of the target loop and the voltage phase angle of the target loop; then the voltage dividing device determines a second power parameter according to the first power parameter, wherein the second power parameter comprises a target voltage amplitude (namely, the voltage amplitude determined after the voltage amplitude of the target loop is reduced by the voltage dividing device) and a voltage phase angle; in the event that the voltage dividing device determines that the target voltage amplitude is less than or equal to the voltage amplitude threshold, the voltage dividing device sends the second power parameter to the surge signal generator.
In this way, the surge signal generator receives the second power parameter and generates a surge signal if it is determined that the voltage phase angle of the target loop included in the second power parameter is equal to a preset voltage phase angle; the surge signal is then sent to the device under test. In the embodiment of the invention, the voltage amplitude of the target loop is reduced through the voltage dividing equipment, so that the voltage amplitude (namely, the target voltage amplitude smaller than or equal to the voltage amplitude threshold) which can be born by the surge signal generator is obtained, and the normal use of the surge signal generator can be ensured. Therefore, the surge signal generator can generate and send out the surge signal under specific conditions (namely, when the voltage phase angle of the target loop in the second power parameter is determined to be equal to the preset voltage phase angle), the test process of the tolerance degree of the high-alternating-current voltage power supply equipment (namely, the tested equipment) to the surge signal can be successfully completed, and the practicability of the surge immunity test is improved.
In another implementation manner of the embodiment of the present invention, a decoupling network is included between the high-voltage power supply and the device under test, where the decoupling network is used to protect the high-voltage power supply.
It should be understood that the surge signal after coupling through the coupling network is transmitted in both directions in the target loop, i.e. the coupled surge signal is transmitted to both the tested device and the high voltage power supply. In order to protect the high-voltage power supply, a decoupling network can be connected in series in the target loop, so that the coupled surge signals can be attenuated.
As shown in fig. 4, there are 5 transmission lines between the high-voltage power supply device and the tested device, including line L1, line L2, line L3, line N, and line PE, and the decoupling network is connected in series between the high-voltage power supply device and the tested device. The voltage dividing device collects a first power parameter from the line L2, and after the voltage amplitude included in the first power parameter is reduced (i.e. after the second power parameter is obtained), sends the second power parameter to the surge signal generator, the surge signal generator generates a surge signal, couples the surge signal between the line L2 and the line L3 (the line L3 includes a capacitor of 18uF, i.e. c=18uf) through the switch S1 and the switch S2, and then sends the coupled surge signal to the device under test.
Similarly, as shown in fig. 5, there are 5 transmission lines between the high-voltage power supply device and the tested device, including line L1, line L2, line L3, line N and line PE, and the decoupling network is connected in series between the high-voltage power supply device and the tested device. The voltage dividing device collects a first power parameter from the line L2, and after reducing the voltage amplitude included in the first power parameter (i.e., after obtaining a second power parameter), sends the second power parameter to the surge signal generator, which generates a surge signal, and couples the surge signal between the line PE and the line L2 (the line L2 includes a resistor of 10Ω (i.e., r=10Ω) and a capacitor of 9uF (i.e., c=9uf)) through the switch S3, and then sends the coupled surge signal to the device under test.
In one implementation manner of the embodiment of the present invention, after the device under test receives the surge signal sent by the surge signal generator, the amplitude of the surge signal tolerance of the device under test (i.e. the amplitude of the surge signal that can be borne by the device under test) may be determined based on the working state of the device under test.
Specifically, the power supply is firstly turned on for the tested equipment, namely, the high-voltage power supply supplies power signals for the tested equipment, and the tested equipment is determined to be in a normal state, namely, the tested equipment can work normally. The device under test may be a television set, for example.
Then, the surge signal generator can generate a 500V surge signal, and the 500V surge signal is sent to the television through the coupling network to determine whether the television is in a normal state. If the television is determined to be in a normal state, the amplitude of the surge signal is continuously increased, for example, a 1000V surge signal is sent to the television through a coupling network. If the television is still in a normal state after receiving the surge signal of 1000V, but after that, when the television receives the surge signal with larger amplitude (for example, 2000V), the television is in an abnormal state, for example, the television has a screen-flashing phenomenon, then the amplitude of the surge-tolerant signal of the television can be determined to be 1000V.
The embodiment of the invention can divide the functional modules of the voltage dividing device, the surge signal generator and the like according to the method example, for example, each functional module can be divided corresponding to each function, and two or more functions can be integrated in one processing module. The integrated modules may be implemented in hardware or in software functional modules. It should be noted that, in the embodiment of the present invention, the division of the modules is schematic, which is merely a logic function division, and other division manners may be implemented in actual implementation.
In the case of dividing the respective functional modules with the respective functions, fig. 6 shows a schematic diagram of one possible configuration of the voltage dividing apparatus involved in the above-described embodiment, and as shown in fig. 6, the voltage dividing apparatus 20 may include: the device comprises an acquisition module 201, a determination module 202 and a sending module 203.
The acquisition module 201 is configured to acquire a first power parameter of a target loop, where the first power parameter includes a voltage amplitude of the target loop and a voltage phase angle of the target loop.
The determining module 202 is configured to determine a second power parameter according to the first power parameter, where the second power parameter includes a target voltage amplitude and a voltage phase angle of the target loop, and the target voltage amplitude is a determined voltage amplitude after the voltage dividing device reduces the voltage amplitude of the target loop.
And a transmitting module 203, configured to transmit the second power parameter to a surge signal generator when the voltage dividing device determines that the target voltage amplitude is less than or equal to a voltage amplitude threshold.
In the case of an integrated unit, fig. 7 shows a schematic diagram of one possible configuration of the voltage dividing device involved in the above-described embodiment. As shown in fig. 7, the voltage dividing apparatus 30 may include: a processing module 301 and a communication module 302. The processing module 301 may be configured to control and manage the motion of the voltage dividing device 30, for example, the processing module 301 may be configured to support the voltage dividing device 30 to perform S102 in the above-described method embodiment. The communication module 302 may be used to support the communication of the voltage dividing device 30 with other entities, for example, the communication module 302 may be used to support the voltage dividing device 30 to perform S103 in the above-described method embodiment. Optionally, as shown in fig. 7, the voltage dividing device 30 may further include a storage module 303 for storing program codes and data of the voltage dividing device 30.
Wherein the processing module 301 may be a processor or a controller. The communication module 302 may be a transceiver, a transceiver circuit, a communication interface, or the like. The storage module 303 may be a memory.
When the processing module 301 is a processor, the communication module 302 is a transceiver, and the storage module 303 is a memory, the processor, the transceiver, and the memory may be connected through a bus. The bus may be a peripheral component interconnect standard (peripheral component interconnect, PCI) bus or an extended industry standard architecture (extended industry standard architecture, EISA) bus, or the like. The buses may be divided into address buses, data buses, control buses, etc.
In the case of dividing the respective functional modules with the respective functions, fig. 8 shows a schematic diagram of one possible configuration of the surge signal generator involved in the above-described embodiment, and as shown in fig. 8, the surge signal generator 40 may include: a receiving module 401, a signal generating module 402 and a transmitting module 403.
The receiving module 401 is configured to receive a second power parameter of the voltage division device, where the second power parameter includes a target voltage amplitude and a voltage phase angle of a target loop, where the target voltage amplitude is a determined voltage amplitude after the voltage division device decreases the voltage amplitude of the target loop.
The signal generating module 402 is configured to generate a surge signal when the surge signal generator determines that the voltage phase angle of the target loop is equal to a preset voltage phase angle, where the surge signal is used to perform a surge immunity test on the device under test.
A sending module 403, configured to send the surge signal to the device under test.
Optionally, the sending module 403 is specifically configured to send the surge signal to a coupling network, so that after the coupling network couples the surge signal, the coupled surge signal is sent to the device under test.
In the case of an integrated unit, fig. 9 shows a schematic diagram of one possible configuration of the surge signal generator involved in the above-described embodiment. As shown in fig. 9, the surge signal generator 50 may include: a processing module 501 and a communication module 502. The processing module 501 may be configured to control and manage the operation of the surge signal generator 50, for example, the processing module 501 may be configured to support the surge signal generator 50 to perform S105 in the above-described method embodiment. The communication module 502 may be used to support communication of the surge signal generator 50 with other entities, for example, the communication module 502 may be used to support the surge signal generator 50 to perform S104 and S106 in the above-described method embodiments. Optionally, as shown in fig. 9, the surge signal generator 50 may further include a storage module 503 for storing program code and data of the surge signal generator 50.
Wherein the processing module 501 may be a processor or a controller. The communication module 502 may be a transceiver, a transceiver circuit, a communication interface, or the like. The storage module 503 may be a memory.
Where the processing module 501 is a processor, the communication module 502 is a transceiver, and the storage module 503 is a memory, the processor, the transceiver, and the memory may be connected by a bus. The bus may be a PCI bus or an EISA bus, etc. The buses may be divided into address buses, data buses, control buses, etc.
It should be understood that, in various embodiments of the present invention, the sequence numbers of the foregoing processes do not mean the order of execution, and the order of execution of the processes should be determined by the functions and internal logic thereof, and should not constitute any limitation on the implementation process of the embodiments of the present invention.
Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the solution. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described systems, apparatuses and units may refer to corresponding procedures in the foregoing method embodiments, and are not repeated herein.
The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
In the above embodiments, it may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented using a software program, it may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the processes or functions described in accordance with embodiments of the present invention are produced in whole or in part. The computer may be a general purpose computer, a special purpose computer, a computer network, or other programmable apparatus. The computer instructions may be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another computer-readable storage medium, for example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center by a wired (e.g., coaxial cable, fiber optic, digital subscriber terminal line (Digital Subscriber Line, DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer readable storage medium may be any available medium that can be accessed by a computer or a data storage device including one or more servers, data centers, etc. that can be integrated with the medium. The usable medium may be a magnetic medium (e.g., a floppy Disk, a hard Disk, a magnetic tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a Solid State Disk (SSD)), or the like.
The foregoing is merely illustrative of the present invention, and the present invention is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (9)
1. The surge immunity testing system is characterized by comprising a high-voltage power supply, voltage dividing equipment, a surge signal generator and tested equipment;
the voltage dividing equipment is connected with the high-voltage power supply and the surge signal generator, and the tested equipment is connected with the high-voltage power supply and the surge signal generator;
the high-voltage power supply is used for generating a power supply signal;
the voltage dividing device is used for reducing the voltage amplitude in the power supply signal;
the surge signal generator is used for generating a surge signal, and the surge signal is used for carrying out surge immunity test on the tested equipment;
the voltage dividing equipment comprises an acquisition module, a determination module and a first sending module;
the acquisition module is used for acquiring first power parameters of a target loop, wherein the first power parameters comprise the voltage amplitude of the target loop and the voltage phase angle of the target loop;
the determining module is configured to determine a second power parameter according to the first power parameter, where the second power parameter includes a target voltage amplitude and a voltage phase angle of the target loop, and the target voltage amplitude is a determined voltage amplitude after the voltage dividing device reduces the voltage amplitude of the target loop;
the first sending module is configured to send the second power parameter to a surge signal generator when the voltage dividing device determines that the target voltage amplitude is less than or equal to a voltage amplitude threshold.
2. The system of claim 1, further comprising a coupling network connected to the surge signal generator and the device under test and a decoupling network connected to the high voltage power supply and the device under test;
the coupling network is used for protecting the surge signal generator;
the decoupling network is used for protecting the high-voltage power supply.
3. The system of claim 1 or 2, wherein the surge signal generator comprises a receiving module, a signal generating module, and a second transmitting module;
the receiving module is configured to receive a second power parameter of the voltage division device, where the second power parameter includes a target voltage amplitude and a voltage phase angle of a target loop, and the target voltage amplitude is a determined voltage amplitude after the voltage division device reduces the voltage amplitude of the target loop;
the signal generation module is used for generating a surge signal when the surge signal generator determines that the voltage phase angle of the target loop is equal to a preset voltage phase angle, and the surge signal is used for carrying out surge immunity test on tested equipment;
the second sending module is used for sending the surge signal to the tested equipment.
4. The system of claim 3, wherein the system further comprises a controller configured to control the controller,
the second sending module is specifically configured to send the surge signal to a coupling network, so that after the coupling network couples the surge signal, the coupled surge signal is sent to the tested device.
5. The surge immunity testing method is characterized by comprising the following steps of:
the voltage dividing device acquires a first power parameter of a target loop, wherein the first power parameter comprises a voltage amplitude of the target loop and a voltage phase angle of the target loop;
the voltage dividing device determines a second power parameter according to the first power parameter, wherein the second power parameter comprises a target voltage amplitude and a voltage phase angle of the target loop, and the target voltage amplitude is determined after the voltage dividing device reduces the voltage amplitude of the target loop;
the voltage dividing device sends the second power parameter to a surge signal generator if the voltage dividing device determines that the target voltage amplitude is less than or equal to a voltage amplitude threshold.
6. The method of claim 5, wherein the method further comprises:
the surge signal generator receives a second power parameter of the voltage dividing device, wherein the second power parameter comprises a target voltage amplitude and a voltage phase angle of a target loop, and the target voltage amplitude is a determined voltage amplitude after the voltage dividing device reduces the voltage amplitude of the target loop;
under the condition that the surge signal generator determines that the voltage phase angle of the target loop is equal to a preset voltage phase angle, the surge signal generator generates a surge signal, and the surge signal is used for carrying out surge immunity test on tested equipment;
the surge signal generator sends the surge signal to the tested equipment.
7. The method of claim 6, wherein the surge signal generator transmitting the surge signal to the device under test comprises:
and the surge signal generator sends the surge signal to a coupling network, so that the coupling network couples the surge signal and then sends the coupled surge signal to the tested equipment.
8. A voltage dividing apparatus, characterized in that the voltage dividing apparatus comprises: a processor, a memory, a bus, and a communication interface; the memory is used for storing computer-executed instructions, and when the voltage dividing device is operated, the processor executes the computer-executed instructions stored in the memory, so that the voltage dividing device executes the surge immunity testing method according to any one of claims 5-7.
9. A surge signal generator, the surge signal generator comprising: a processor, a memory, a bus, and a communication interface; the memory is configured to store computer-executable instructions that, when executed by the surge signal generator, cause the surge signal generator to perform the surge immunity test method of any one of claims 5-7.
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