CN113391171A - Method and device for testing immunity to surge voltage - Google Patents
Method and device for testing immunity to surge voltage Download PDFInfo
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- CN113391171A CN113391171A CN202110583554.9A CN202110583554A CN113391171A CN 113391171 A CN113391171 A CN 113391171A CN 202110583554 A CN202110583554 A CN 202110583554A CN 113391171 A CN113391171 A CN 113391171A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
- G01R31/1227—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
- G01R31/1236—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of surge arresters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0084—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring voltage only
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Abstract
The application relates to a method and a device for testing the immunity to surge voltage. The method for testing the surge voltage immunity is applied to a surge immunity testing system. The method comprises the steps of determining a polarity parameter of a pulse generator, controlling a pulse signal generated by the pulse signal of the pulse generator to be a positive polarity pulse signal or a negative polarity pulse signal, controlling the pulse signal of the pulse generator to be superposed on the position of input voltage of a piece to be tested by determining a phase parameter of the pulse generator, and controlling the pulse voltage amplitude of the pulse signal of the pulse generator by determining a pulse amplitude parameter. The pulse amplitude parameter of the pulse generator is continuously increased, so that the pulse amplitude of the pulse signal superposed to the input voltage of the piece to be detected is continuously increased until the superposed input voltage of the piece to be detected causes the piece to be detected to be damaged, and the surge voltage immunity of the piece to be detected is determined according to the pulse amplitude parameter corresponding to the damaged piece to be detected.
Description
Technical Field
The application relates to the technical field of surge voltage immunity tests, in particular to a method and a device for testing surge voltage immunity.
Background
All countries in the world have requirements on the surge voltage immunity of electronic products, and the products can be sold in the market only through related national standards, so that a method for testing the surge voltage immunity of the electronic products is needed.
Disclosure of Invention
In view of the above, it is desirable to provide a method and an apparatus for testing surge voltage immunity, which can test the surge voltage immunity of an electronic product.
In a first aspect, a method for testing surge voltage immunity is provided, which is applied to a surge immunity testing system, the system includes a pulse generator and a device to be tested, the pulse generator is connected to a power supply terminal of the device to be tested, and the method includes:
setting a polarity parameter, a phase parameter and a pulse amplitude parameter of the pulse generator, generating a pulse signal through the pulse generator, and superposing the pulse signal on an input voltage of a piece to be detected; wherein, under the condition that the phase parameter is a first phase parameter, the polarity parameter is a first polarity parameter or a second polarity parameter, and under the condition that the phase parameter is a second phase parameter, the polarity parameter is a second polarity parameter or a third polarity parameter; the first phase parameter is used for indicating the pulse generator to superpose pulse signals on wave crests of the input voltage of the piece to be detected, and the second phase parameter is used for indicating the pulse generator to superpose pulse signals on wave troughs of the input voltage of the piece to be detected; the first polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, the second polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, and indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested after a preset interval, and the third polarity parameter is used for indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested; the pulse amplitude parameter is used for indicating the voltage amplitude of the pulse signal;
detecting whether the piece to be detected is damaged;
if the piece to be detected is not damaged, increasing pulse amplitude parameters of the pulse generator, generating pulse signals through the pulse generator, and superposing the pulse signals on the input voltage of the piece to be detected until the piece to be detected is damaged;
and removing the surge voltage immunity of the piece to be tested according to the corresponding pulse amplitude parameter when the piece to be tested is damaged.
In one embodiment, before the pulse generator superimposes the pulse signal on the input voltage of the device under test, the method further includes:
and setting a preset interval of the pulse generator, wherein the preset interval is used for indicating an interval market in which the pulse generator superposes two adjacent pulse signals on the input voltage of the piece to be tested.
In one embodiment, before the pulse generator superimposes the pulse signal on the input voltage of the device under test, the method further includes:
and setting a coupling parameter, wherein the coupling parameter is used for indicating a mode of superposing the pulse signal to the input voltage of the piece to be tested by the pulse generator.
In one embodiment, the coupling parameter is a first coupling parameter for instructing the pulse generator to apply a pulse signal between the live line and the ground line of the power terminal of the device under test or a second coupling parameter for instructing the pulse generator to apply a pulse signal between the live line and the neutral line of the power terminal of the device under test.
In one embodiment, before the pulse generator superimposes the pulse signal on the input voltage of the device under test, the method further includes:
and setting a test frequency parameter, wherein the test frequency parameter is used for indicating the frequency of the pulse generator for superposing the pulse signals with the same polarity parameter, phase parameter and pulse amplitude parameter on the input voltage of the piece to be tested.
In one embodiment, the pulse generator is an 10/700 μ s combined wave generator.
In one embodiment, the pulse generator is a 1.2/50 μ s combination wave generator.
In one embodiment, the pulse generator is a lightning surge generator SUG61005 BG.
In a second aspect, a device for testing surge voltage immunity is provided, which includes:
the pulse generator is connected with a power supply end of the piece to be detected and used for generating a pulse signal and superposing the pulse signal on the input voltage of the piece to be detected;
the controller is connected with the pulse generator and is used for determining the polarity parameter, the phase parameter and the pulse amplitude parameter of the pulse generator, controlling the pulse generator to generate a pulse signal and superposing the pulse signal on the input voltage of the piece to be detected; wherein, under the condition that the phase parameter is a first phase parameter, the polarity parameter is a first polarity parameter or a second polarity parameter, and under the condition that the phase parameter is a second phase parameter, the polarity parameter is a second polarity parameter or a third polarity parameter; the first phase parameter is used for indicating the pulse generator to superpose pulse signals on wave crests of the input voltage of the piece to be detected, and the second phase parameter is used for indicating the pulse generator to superpose pulse signals on wave troughs of the input voltage of the piece to be detected; the first polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, the second polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, and indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested after a preset interval, and the third polarity parameter is used for indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested; the pulse amplitude parameter is used for indicating the voltage amplitude of the pulse signal; the pulse generator is also used for detecting whether the piece to be detected is damaged or not, if the piece to be detected is not damaged, the pulse amplitude parameter of the pulse generator is increased, the pulse generator is controlled to generate a pulse signal, and the pulse signal is superposed on the input voltage of the piece to be detected until the piece to be detected is damaged; and the pulse amplitude value parameter is used for determining the surge voltage immunity of the to-be-detected piece according to the corresponding pulse amplitude value parameter when the to-be-detected piece is damaged.
In a third aspect, a device for testing surge voltage immunity is provided, which includes:
the pulse generator is connected with a power supply end of the piece to be detected and used for generating a pulse signal and superposing the pulse signal to the input voltage of the piece to be detected; the pulse generator is also used for detecting whether the piece to be detected is damaged;
the controller is connected with the pulse generator and is used for determining the polarity parameter, the phase parameter and the pulse amplitude parameter of the pulse generator, controlling the pulse generator to generate a pulse signal and superposing the pulse signal on the input voltage of the piece to be detected; wherein, under the condition that the phase parameter is a first phase parameter, the polarity parameter is a first polarity parameter or a second polarity parameter, and under the condition that the phase parameter is a second phase parameter, the polarity parameter is a second polarity parameter or a third polarity parameter; the first phase parameter is used for indicating the pulse generator to superpose pulse signals on wave crests of the input voltage of the piece to be detected, and the second phase parameter is used for indicating the pulse generator to superpose pulse signals on wave troughs of the input voltage of the piece to be detected; the first polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, the second polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, and indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested after a preset interval, and the third polarity parameter is used for indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested; the pulse amplitude parameter is used for indicating the voltage amplitude of the pulse signal; the pulse generator is also used for obtaining a detection result of the pulse generator, if the detection result indicates that the piece to be detected is damaged, the pulse amplitude parameter of the pulse generator is increased, the pulse generator is controlled to generate a pulse signal, and the pulse signal is superposed on the input voltage of the piece to be detected until the detection result indicates that the piece to be detected is damaged; and the device is also used for determining the surge voltage immunity of the to-be-detected piece according to the corresponding pulse amplitude parameter when the to-be-detected piece is damaged.
The method for testing the surge voltage immunity is applied to a surge immunity testing system. The method comprises the steps of determining a polarity parameter of a pulse generator, controlling a pulse signal generated by the pulse signal of the pulse generator to be a positive polarity pulse signal or a negative polarity pulse signal, controlling the pulse signal of the pulse generator to be superposed on the position of input voltage of a piece to be tested by determining a phase parameter of the pulse generator, and controlling the pulse voltage amplitude of the pulse signal of the pulse generator by determining a pulse amplitude parameter. The pulse amplitude parameter of the pulse generator is continuously increased, so that the pulse amplitude of the pulse signal superposed to the input voltage of the piece to be detected is continuously increased until the superposed input voltage of the piece to be detected causes the piece to be detected to be damaged, and the surge voltage immunity of the piece to be detected is determined according to the pulse amplitude parameter corresponding to the damaged piece to be detected.
According to the test method, the pulse generator is controlled to only superpose the pulse signal at the wave crest or the wave trough of the input voltage of the piece to be tested, and compared with the situation that the pulse signal is superposed at the zero crossing point, the wave crest and the wave trough of the input voltage of the piece to be tested, the test time cost can be greatly reduced.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments or the conventional technologies of the present application, the drawings used in the descriptions of the embodiments or the conventional technologies will be briefly introduced below, it is obvious that the drawings in the following descriptions are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
Fig. 1 is a schematic flow chart of a surge voltage immunity test performed by using a lightning surge generator SUG61005 BG;
FIG. 2 is a schematic diagram of an embodiment of a surge voltage immunity test system;
fig. 3 is a waveform diagram of a superimposed signal at the LN end in the case where the phase parameter is 0 ° in one embodiment;
FIG. 4 is a diagram illustrating a waveform of a voltage signal at the VCC terminal when the phase parameter is 0 ° in one embodiment;
fig. 5 is a waveform diagram of a superimposed signal on the LN end in the case where the phase parameter is 90 ° in one embodiment;
FIG. 6 is a diagram illustrating a waveform of a voltage signal at the VCC terminal when the phase parameter is 90 ° in one embodiment;
fig. 7 is a waveform diagram of a superimposed signal on the LN end in the case where the phase parameter is 180 ° in one embodiment;
FIG. 8 is a diagram illustrating a waveform of a voltage signal at the VCC terminal when the phase parameter is 180 ° in one embodiment;
fig. 9 is a waveform diagram of a superimposed signal on the LN side in the case where the phase parameter is 270 ° in one embodiment;
FIG. 10 is a diagram illustrating a waveform of a voltage signal at the VCC terminal when the phase parameter is 270 ° in one embodiment;
FIG. 11 is a flow diagram of a method for testing surge voltage immunity in one embodiment;
FIG. 12 is a schematic diagram of a surge voltage immunity test system in another embodiment;
fig. 13 is a flowchart of a method of testing surge voltage immunity in another embodiment;
fig. 14 is a schematic structural diagram of a device for testing surge voltage immunity in an embodiment.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Embodiments of the present application are set forth in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another.
It will be understood that when an element is referred to as being "connected" to another element, it can be directly connected to the other element or be connected to the other element through intervening elements. Further, "connection" in the following embodiments is understood to mean "electrical connection", "communication connection", or the like, if there is a transfer of electrical signals or data between the connected objects.
As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," etc., specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Also, as used in this specification, the term "and/or" includes any and all combinations of the associated listed items.
Please refer to fig. 1, which is a schematic flow chart of a surge voltage immunity test performed by using a lightning surge generator SUG61005 BG. It will be appreciated that conventional testing of surge immunity of a device under test typically requires the use of a combination wave generator. Taking a lightning surge generator SUG61005BG as an example, as shown in fig. 1, the test of surge immunity of the to-be-tested device by using the lightning surge generator SUG61005BG includes the following steps:
s102: and connecting the connecting wires of the lightning surge generator SUG61005BG as required.
It should be noted that step 102 includes accessing a single phase power supply for operation of the dut at the back panel of the lightning surge generator SUG61005 BG.
S104: the lightning surge generator SUG61005BG is activated.
S106: and setting test parameters required by the piece to be tested on the lightning surge generator SUG61005 BG.
It should be noted that the test parameters include 4, which are respectively a test level, a surge number, a time interval between consecutive pulses, and a port (coupling mode) to which the surge is applied. It should be noted that the time interval between the successive pulses is set according to the value of the test voltage, and the higher the voltage, the longer the time interval between the successive pulses. Optionally, under the condition that the test voltage value is less than 2.0KV, the time interval between consecutive pulses may be 10S; under the condition that the test voltage value is greater than or equal to 2.0KV and less than 4.0KV, the time interval between continuous pulses can be 15S; in the case where the test voltage value is greater than or equal to 4.0KV and less than 6.0KV, the time interval between consecutive pulses may be 20S. It can be understood that the testing parameters can be set on the lightning surge generator by a tester according to actual needs.
S108: the output power is turned on.
It should be noted that turning on the output power supplies provides the operating voltage to the device under test.
S110: and starting a surge voltage test.
It should be noted that, the surge voltage test is started, that is, the lightning surge generator outputs a corresponding pulse signal to the to-be-tested piece according to the set test parameters.
S112: and (4) turning off the lightning surge generator SUG61005BG until the test is failed, dismantling the connecting line and finishing the test.
It should be noted that the test does not pass, i.e. the device under test is damaged.
In a conventional test method, the number of the surge is generally that surge pulses with positive and negative polarities 5 times are respectively applied to the phases of 0 °, 90 °, 180 ° and 270 ° of the working voltage of the device to be tested. When the piece to be tested needs to be evaluated whether to reach the acceptance standard of the surge immunity, a method of continuously approaching a target voltage value needs to be adopted so as to judge whether the piece to be tested approaches, reaches or exceeds the acceptance standard. It should be noted that the target voltage value may be used to evaluate whether the to-be-tested piece meets an acceptance standard of the surge immunity, and if the actual surge voltage value of the to-be-tested piece is smaller than the target voltage value, it is determined that the to-be-tested piece does not meet the acceptance standard of the surge immunity. If the target voltage value is directly used as the test voltage value (hereinafter referred to as pulse amplitude parameter) to test the to-be-tested object, the to-be-tested object is seriously damaged by the pulse signal generated by the lightning surge generator SUG61005BG under the condition that the difference between the actual surge voltage of the to-be-tested object and the target voltage value is large, and the difference between the actual surge voltage of the to-be-tested object and the target voltage value cannot be known. Therefore, in the actual test, a method that the pulse amplitude value is continuously close to the target value is adopted, that is, a plurality of groups of pulse amplitude parameters are set, so that the lightning surge generator SUG61005BG generates a plurality of groups of pulse signals with different pulse amplitude values according to the pulse amplitude parameters, and the pulse amplitude value of the pulse signals is continuously increased. If the target value of the to-be-tested piece is 1KV, multiple groups of test parameters are set, the pulse amplitude parameter of the first group of test parameters is 400V, the pulse amplitude parameter of the second group of test parameters is 600V, the pulse amplitude parameter of the third group of test parameters is 800V, the pulse amplitude parameter of the fourth group of test parameters is 1000V, and the lightning surge generator SUG61005BG generates corresponding pulse signals according to the sequence and outputs the pulse signals to the to-be-tested piece. Specifically, a 400V pulse signal is generated through the lightning surge generator SUG61005BG, a to-be-tested piece is tested, if the to-be-tested piece passes through the test that the pulse amplitude parameter is 400V, that is, the pulse signal with the pulse amplitude of 400V is output to the to-be-tested piece, the to-be-tested piece is not damaged, then the lightning surge generator SUG61005BG generates the 600V pulse signal, the to-be-tested piece is tested, and so on, until the to-be-tested piece is damaged or the to-be-tested piece passes through the test that the pulse amplitude parameter is a target voltage value, then the surge voltage value is evaluated or the to-be-tested piece is judged to meet the acceptance standard according to the corresponding pulse amplitude parameter when the to-be-tested piece is damaged.
Since a voltage test method that is continuously close to the target voltage value is adopted, the test takes a long time. The time t, a, b, c, d, e, f, wherein a is the number of polarity parameters, b is the number of pulse amplitude parameters, c is the number of coupling modes, d is the number of phase parameters, e is the time interval between successive pulses, and f is the number of tests.
For example, when a test of surge voltage immunity is performed on a device under test with a target voltage value of 1KV, the lightning surge generator SUG61005BG is set such that surge pulses of positive and negative polarities are applied to the phases of 0 °, 90 °, 180 °, and 270 ° of the operating voltage of the device under test for 5 times, the time interval between successive pulses is 10s, and the set test voltages are 400V, 600V, 800V, and 1000V. The time t1 × 2 × 4 × 1 × 4 × 10 × 5 required to complete the test is 1600 seconds.
Fig. 2 is a schematic structural diagram of a surge voltage immunity test system according to an embodiment of the present disclosure. It should be noted that the test clock pulse signal is superimposed on the LN end of the ac input line, and the generated voltage stress is at VCC at the rear end of the rectifier circuit of the main board circuit of the device under test. Optionally, the piece to be tested may be an LED lamp.
Referring to fig. 3-10, fig. 3-10 are waveform diagrams illustrating a superimposed signal at the LN terminal and a voltage signal at the VCC terminal of fig. 2 when performing a surge voltage immunity test. It should be noted that in the voltage diagrams shown in fig. 3-10, the polarity parameters of the lightning surge generator SUG61005BG are all set to positive polarity. Specifically, fig. 3 is a waveform diagram of a superimposed signal at an LN end when a phase parameter is 0 °, fig. 4 is a waveform diagram of a voltage signal at a VCC end when the phase parameter is 0 °, fig. 5 is a waveform diagram of a superimposed signal at an LN end when the phase parameter is 90 °, fig. 6 is a waveform diagram of a voltage signal at a VCC end when the phase parameter is 90 °, fig. 7 is a waveform diagram of a superimposed signal at an LN end when the phase parameter is 180 °, fig. 8 is a waveform diagram of a voltage signal at a VCC end when the phase parameter is 180 °, fig. 9 is a waveform diagram of a superimposed signal at a LN end when the phase parameter is 270 °, and fig. 10 is a waveform diagram of a voltage signal at a VCC end when the phase parameter is 270 °. As can be seen from fig. 3 to 10, the corresponding phase parameter is 90 ° when the surge voltage test generates the maximum stress on the product, at this time, the superimposed signal at the LN end is the highest, and the voltage at the VCC end is also the highest.
Meanwhile, since the voltage value of the phase parameter 270 ° at the VCC terminal is positive with the polarity parameter of the lightning surge generator SUG61005BG in the case where the polarity parameter of the lightning surge generator SUG61005BG is negative, the voltage value of the phase parameter 90 ° at the VCC terminal is the same, only with a time delay, such as 10ms in a 50HZ circuit.
In view of this, the present application provides a method for testing surge voltage immunity, which is applied to a surge immunity testing system. The method comprises the steps of determining a polarity parameter of a pulse generator, controlling a pulse signal generated by the pulse signal of the pulse generator to be a positive polarity pulse signal or a negative polarity pulse signal, controlling the pulse signal of the pulse generator to be superposed on the position of input voltage of a piece to be tested by determining a phase parameter of the pulse generator, and controlling the pulse voltage amplitude of the pulse signal of the pulse generator by determining a pulse amplitude parameter. The pulse amplitude parameter of the pulse generator is continuously increased, so that the pulse amplitude of the pulse signal superposed to the input voltage of the piece to be detected is continuously increased until the superposed input voltage of the piece to be detected causes the piece to be detected to be damaged, and the surge voltage immunity of the piece to be detected is determined according to the pulse amplitude parameter corresponding to the damaged piece to be detected. Specifically, when the target voltage value of the to-be-tested piece is 1000V and the to-be-tested piece is not damaged under the condition that the pulse amplitude parameter is not 600V, it can be determined that the to-be-tested piece passes the 600V surge voltage immunity test, and the test is continued. And when the to-be-tested piece is damaged under the condition that the pulse amplitude parameter is 800V, judging that the to-be-tested piece does not pass the 800V surge voltage immunity test.
According to the test method, the pulse generator is controlled to only superpose the pulse signal at the wave crest or the wave trough of the input voltage of the piece to be tested, and compared with the situation that the pulse signal is superposed at the zero crossing point, the wave crest and the wave trough of the input voltage of the piece to be tested, the test time cost can be greatly reduced.
Referring to fig. 11, a flowchart of a method for testing surge voltage immunity according to an embodiment of the present application is shown. The method for testing the surge voltage immunity can be applied to a surge immunity testing system. Referring to fig. 12, a schematic structural diagram of a surge voltage immunity test system in another embodiment of the present application is shown. The surge immunity test system may include a pulse generator 1202 and a device under test 1204. Specifically, the pulse generator 1202 is connected to a power source terminal of the device under test 1204. The pulse generator 1202 may generate a corresponding pulse signal according to the set test parameters on the pulse generator 1202 and superimpose the pulse signal on the input voltage signal of the device under test 1204. In an alternative embodiment of the present application, as shown in fig. 12, the surge immunity test system further comprises a decoupling network electrically connected to the power supply, and the decoupling network is connected to the pulse generator. In particular, the decoupling network can prevent the pulse signal from flowing back to the power supply source and allow the supply current to flow through the device under test. In an alternative embodiment of the present application, the pulse generator may comprise an 10/700 μ s combined wave generator. In an alternative embodiment of the present application, the pulse generator may comprise a 1.2/50 μ s combination wave generator. It should be noted that different combination wave generators should be used according to the port type of the power supply terminal of the piece to be tested, and for the port connected to the outdoor symmetric communication line, 10/700 μ s combination wave generator is used, and for other cases, 1.2/50 μ s combination wave generator is used. Optionally, the 1.2/50 μ s combined wave generator is a lightning surge generator SUG61005 BG.
With continued reference to fig. 11, the method for testing the surge voltage immunity may include:
s1102: setting a polarity parameter, a phase parameter and a pulse amplitude parameter of a pulse generator, generating a pulse signal through the pulse generator, and superposing the pulse signal to the input voltage of the piece to be detected.
Specifically, the polarity parameter is the first polarity parameter or the second polarity parameter when the phase parameter is the first phase parameter, and the polarity parameter is the second polarity parameter or the third polarity parameter when the phase parameter is the second phase parameter.
Specifically, the first phase parameter is used for indicating the pulse generator to superpose the pulse signal on the wave crest of the input voltage of the piece to be measured, and the second phase parameter is used for indicating the pulse generator to superpose the pulse signal on the wave trough of the input voltage of the piece to be measured.
Specifically, the first polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be detected, the second polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be detected, and indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be detected after a preset interval, and the third polarity parameter is used for indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be detected. It should be noted that the preset interval is a time interval between two consecutive pulse signals.
The pulse amplitude parameter is indicative of a voltage amplitude of the pulse signal. It should be noted that the pulse generator may generate a pulse signal having the same pulse amplitude as the pulse amplitude parameter according to the pulse amplitude parameter.
Optionally, the pulse generator is a lightning surge generator SUG61005BG, the first phase parameter is 90 °, the second phase parameter is 270 °, the first polarity parameter is positive polarity, the second polarity parameter is positive and negative alternating polarity, and the third polarity is negative polarity.
S1104: and detecting whether the piece to be detected is damaged.
In an optional embodiment of the present application, the pulse generator has a current detection device, and the current detection device can determine whether the device under test is damaged according to the magnitude of the circuit current. In an optional embodiment of the application, whether the to-be-tested piece is damaged or not is judged by a tester, for example, whether the to-be-tested piece is damaged or not is judged according to the phenomenon that the to-be-tested piece makes a sound and/or fires.
S1106: if the piece to be detected is not damaged, increasing pulse amplitude parameters of the pulse generator, generating pulse signals through the pulse generator, and superposing the pulse signals on the input voltage of the piece to be detected until the piece to be detected is damaged.
In an optional embodiment of the present application, a plurality of sets of test parameters of the pulse generator are set, each set of test parameters at least includes a polarity parameter, a phase parameter, and a pulse amplitude parameter, and each set of pulse amplitude parameters is different and is incremented according to a set order. It should be noted that, in the embodiment of the present application, the difference value of each group of pulse amplitude parameters is not limited, and a tester may set the difference value as needed. And if the piece to be detected is not damaged, the pulse generator generates a pulse signal corresponding to the pulse amplitude parameter of the second group and outputs the pulse signal to the piece to be detected, and the like until the piece to be detected is damaged.
In an optional embodiment of the present application, a set of test parameters of the pulse generator is set, where the set of test parameters at least includes a polarity parameter, a phase parameter, and a pulse amplitude parameter, the pulse generator generates a corresponding pulse signal according to the test parameters, and outputs the pulse signal to the to-be-tested object, and if the to-be-tested object is not damaged, the pulse generator increases the pulse amplitude parameter, generates a pulse signal corresponding to the increased pulse amplitude parameter, and outputs the pulse signal to the to-be-tested object until the to-be-tested object is damaged. It should be noted that, in the embodiment of the present application, the manner and the increased amplitude of the pulse generator for increasing the pulse amplitude parameter are not limited, as long as the pulse generator increases the pulse amplitude parameter and generates the pulse signal corresponding to the increased pulse amplitude parameter.
S1108: and determining the surge voltage immunity of the piece to be detected according to the pulse amplitude parameter corresponding to the damaged piece to be detected.
Specifically, when the pulse generator outputs a pulse signal corresponding to the current pulse amplitude parameter to the piece to be tested, and under the condition that the piece to be tested is not damaged, the piece to be tested is judged to pass the test of the current pulse amplitude parameter; when the pulse generator outputs the pulse signal corresponding to the current pulse amplitude parameter to the piece to be tested, and the piece to be tested is judged not to pass the test of the current pulse amplitude parameter under the condition that the piece to be tested is damaged.
The surge voltage immunity test is to evaluate the value of the surge voltage immunity of the to-be-tested piece by using the pulse amplitude parameter corresponding to the damaged to-be-tested piece, namely when the to-be-tested piece is damaged when the pulse amplitude parameter is 800V, the to-be-tested piece is judged to fail the 800V surge voltage test.
From the above analysis, under the condition that the pulse amplitude parameters are the same, the stress generated on the piece to be tested is the largest under the conditions that the polarity parameter is positive, the phase parameter is 90 degrees or the polarity parameter is negative, and the phase parameter is 270 degrees, so that if the piece to be tested is not damaged under the test conditions that the polarity parameter is positive, the phase parameter is 90 degrees or the polarity parameter is negative, and the phase parameter is 270 degrees, the piece to be tested is tested under the conditions that the phase parameter and/or the polarity parameter are different under the same pulse amplitude parameter, and the piece to be tested is not damaged. Therefore, according to the conventional test, namely, when the polarity parameters of the test parameters comprise positive polarity and negative polarity, and the phase parameters comprise 0 °, 90 °, 180 ° and 270 °, the test is performed, the obtained pulse amplitude parameter corresponding to the damage of the to-be-tested piece is the same as the pulse amplitude parameter corresponding to the damage of the to-be-tested piece when the polarity parameter is positive polarity, the phase parameter is 90 ° or the polarity parameter is negative polarity, and the phase parameter is 270 °, and the obtained pulse amplitude parameter corresponding to the damage of the to-be-tested piece is the same, namely, the evaluation value of the surge voltage immunity of the to-be-tested piece is the same.
When the method for testing the surge voltage immunity provided by the embodiment of the application is used for testing the surge voltage immunity of the to-be-tested piece with the target voltage value of 1KV, the time taken for testing the surge voltage immunity is t 2-1-4-1-10-5-200 seconds. The time t1 required by the conventional test method is 1600 seconds, that is, the test method provided by the embodiment of the application can save 8 times of time for testing one to-be-tested piece. According to the minimum sampling quantity S-1 of the special inspection level of the national standard sampling plan standard GB2828.1-2003, when 5000-25W LED lamps are produced and are ready to be evaluated whether the acceptance standard is approached, reached or surpassed, five LED lamps are sampled at minimum. Therefore, the testing method for the surge voltage immunity provided by the embodiment of the application can greatly save the testing time.
The embodiment of the application provides a method for testing the immunity to surge voltage, which is applied to a system for testing the immunity to surge voltage. The method comprises the steps of determining a polarity parameter of a pulse generator, controlling a pulse signal generated by the pulse signal of the pulse generator to be a positive polarity pulse signal or a negative polarity pulse signal, controlling the pulse signal of the pulse generator to be superposed on the position of input voltage of a piece to be tested by determining a phase parameter of the pulse generator, and controlling the pulse voltage amplitude of the pulse signal of the pulse generator by determining a pulse amplitude parameter. The pulse amplitude parameter of the pulse generator is continuously increased, so that the pulse amplitude of the pulse signal superposed to the input voltage of the piece to be detected is continuously increased until the superposed input voltage of the piece to be detected causes the piece to be detected to be damaged, and the surge voltage immunity of the piece to be detected is determined according to the pulse amplitude parameter corresponding to the damaged piece to be detected.
According to the test method, the pulse generator is controlled to only superpose the pulse signal at the wave crest or the wave trough of the input voltage of the piece to be tested, and compared with the situation that the pulse signal is superposed at the zero crossing point, the wave crest and the wave trough of the input voltage of the piece to be tested, the test time cost can be greatly reduced.
Please refer to fig. 13, which illustrates an exemplary method for testing surge voltage immunity. As shown in fig. 13, the method for testing surge voltage immunity provided by the foregoing embodiment may further include:
s1302, setting a preset interval of the pulse generator.
Specifically, the preset interval is used for indicating the interval duration of overlapping two adjacent pulse signals of the input voltage of the to-be-detected piece by the pulse generator. I.e. the preset interval is the time interval between successive pulses. It should be noted that the preset interval for setting the pulse generator needs to be determined according to the magnitude of the set pulse amplitude parameter. The pulse generator can detect whether the internal voltage value of the pulse generator reaches the voltage value corresponding to the pulse amplitude parameter, if the internal voltage value of the pulse generator does not reach the voltage value corresponding to the pulse amplitude parameter after the last pulse signal is output and passes through a preset interval, the pulse generator can automatically refuse to generate the corresponding pulse signal, the error of value evaluation of the surge immunity of the piece to be detected is avoided, and the pulse generator can output the pulse signal meeting the requirements to the piece to be detected only when the preset interval meets the condition that the pulse generator generates the pulse signal corresponding to the pulse amplitude.
With continued reference to fig. 13, the method for testing the surge voltage immunity provided by the foregoing embodiment may further include:
s1304: and setting coupling parameters.
Specifically, the coupling parameter is used for indicating a mode of the pulse generator for superposing the pulse signal to the input voltage of the piece to be measured. In an alternative embodiment of the present application, the coupling parameter is a first coupling parameter. Specifically, the first coupling parameter is used for instructing the pulse generator to apply a pulse signal between a live wire and a ground wire of a power supply end of the device under test, namely, conducting a line-to-ground (common mode) test. In an alternative embodiment of the present application, the coupling parameter is a second coupling parameter. Specifically, the second coupling parameter is used for instructing the pulse generator to apply a pulse signal between a live wire and a zero wire of a power supply end of the to-be-tested element, namely, a line-to-line (differential mode) test is performed.
With continued reference to fig. 13, the method for testing the surge voltage immunity provided by the foregoing embodiment may further include:
s1306: and setting a test time parameter.
Specifically, the test frequency parameter is used for indicating the frequency of the pulse generator for superposing the pulse signal with the same polarity parameter, phase parameter and pulse amplitude parameter on the input voltage of the to-be-tested piece.
In an optional embodiment of the present application, the pulse generator is a lightning surge generator SUG61005BG, and under the condition that the pulse amplitude parameter is 400V, the polarity parameter is positive and negative alternating polarity, the phase parameter is 90 °, the test time parameter is 2 times, and the preset interval is 10 seconds, the pulse generator superimposes a positive polarity pulse signal with the pulse amplitude of 400V on the 90 ° phase of the input voltage signal of the to-be-tested piece, and the superimposed signal is output to the to-be-tested piece; after 10 seconds, after the pulse generator is clocked, a positive polarity pulse signal with the pulse amplitude of 400V is superposed on the 90-degree phase of the input voltage signal of the piece to be detected, and the superposed signal is output to the piece to be detected; after 10 seconds, the pulse generator superposes a negative pulse signal with the pulse amplitude of 400V on the 90-degree phase of the input voltage signal of the piece to be detected, and the superposed signal is output to the piece to be detected; after 10 seconds, the pulse generator superposes the negative pulse signal with the pulse amplitude of 400V on the 90-degree phase of the input voltage signal of the piece to be detected, and the superposed signal is output to the piece to be detected.
It should be understood that, although the steps in the flowcharts of fig. 11 and 13 are shown in order as indicated by the arrows, the steps are not necessarily performed in order as indicated by the arrows. The steps are not performed in the exact order shown and described, and may be performed in other orders, unless explicitly stated otherwise. Moreover, at least some of the steps in fig. 11 and 13 may include multiple steps or multiple stages, which are not necessarily performed at the same time, but may be performed at different times, and the order of performing the steps or stages is not necessarily sequential, but may be performed alternately or alternately with other steps or at least some of the other steps or stages.
Please refer to fig. 14, which illustrates a schematic structural diagram of a device 1400 for testing surge voltage immunity according to an embodiment of the present application. As shown in fig. 14, the surge voltage immunity test apparatus 1400 includes a first pulse generator 1402 and a first control device 1404. Specifically, the first pulse generator 1402 is connected to a power source terminal of the device under test 1406, and the first control device 1404 is connected to the first pulse generator 1402.
Specifically, the first control device 1404 may determine a polarity parameter, a phase parameter, and a pulse amplitude parameter of the first pulse generator 1402, control the first pulse generator 1402 to generate a pulse signal, and superimpose the pulse signal on the input voltage signal of the device under test 1406. It should be noted that the first control device 1404 may control the polarity parameter, the phase parameter, and the pulse amplitude parameter of the first pulse generator 1402, and set the polarity parameter, the phase parameter, and the pulse amplitude parameter of the first pulse generator 1402 as desired parameters. Optionally, the first control device sets the phase parameter as a first phase parameter, and sets the polarity parameter as a first polarity parameter or a second polarity parameter. Optionally, the first control device sets the phase parameter to a second phase parameter and sets the polarity parameter to the second polarity parameter or the third polarity parameter. Specifically, the first phase parameter is used for indicating the first pulse generator to superpose pulse signals on wave crests of the input voltage signals of the piece to be detected, and the second phase parameter is used for indicating the first pulse generator to superpose pulse signals on wave troughs of the input voltage signals of the piece to be detected; the first polarity parameter is used for indicating the first pulse generator to superpose a positive pulse signal on an input voltage signal of a piece to be detected, the second polarity parameter is used for indicating the first pulse generator to superpose a positive pulse signal on the input voltage signal of the piece to be detected, the first pulse generator is indicated to superpose a negative pulse signal on the input voltage signal of the piece to be detected after a preset interval, and the third polarity parameter is used for indicating the first pulse generator to superpose a negative pulse signal on the input voltage signal of the piece to be detected. Specifically, the pulse amplitude parameter is used to indicate the voltage amplitude of the pulse signal.
Specifically, the first control device 1404 can also be used to detect whether the dut 1406 is damaged. In an optional embodiment of the present application, the first control device obtains a current magnitude in the circuit in real time, and determines whether the to-be-detected device is damaged according to the current magnitude of the circuit.
Specifically, the first control device 1404 may further increase the pulse amplitude parameter of the first pulse generator 1402 when the device under test 1406 is not damaged, control the first pulse generator 1402 to generate a pulse signal corresponding to the increased pulse amplitude parameter, and superimpose the pulse signal on the input voltage signal of the device under test 1406 until the device under test 1406 is damaged.
Specifically, the first control device 1404 may further determine the surge voltage immunity of the to-be-tested piece according to the pulse amplitude parameter corresponding to the to-be-tested piece when the to-be-tested piece is damaged. It should be noted that, in the case that the first pulse generator 1402 outputs the pulse signal corresponding to the current pulse amplitude parameter to the device under test, and the device under test is damaged, the first control 1404 device determines that the device under test does not pass the surge voltage test of the current pulse amplitude parameter.
Specifically, the first pulse generator 1402 may generate a pulse signal and superimpose the pulse signal on the input voltage signal of the device under test.
In an alternative embodiment of the present application, the first pulse generator is provided with a display device, and the first control device can control the display device of the first pulse generator to display the magnitude of the circuit current in real time. In an optional embodiment of the present application, the first control device may further generate a test report, where the test report includes a pulse amplitude parameter corresponding to the damaged dut, total test time, a waveform diagram of a superimposed signal of the dut during the test, and the like. Optionally, the test report is displayed on a display device of the first pulse generator after the test is finished. Optionally, the display device is a liquid crystal display.
In an alternative embodiment of the present application, the surge voltage immunity test device may include a second pulse generator and a second control device. Specifically, the second pulse generator is connected with a power supply end of the piece to be detected, and the second control device is connected with the second pulse generator.
Specifically, the second pulse generator can generate a pulse signal and superimpose the pulse signal on the input voltage signal of the piece to be detected, and the second pulse generator can also be used for monitoring whether the piece to be detected is damaged. In an optional embodiment of the present application, the second pulse generator is provided with a current detection device, the current detection device can detect the current magnitude in the circuit in real time, and the second pulse generator determines whether the to-be-detected piece is damaged according to the current magnitude of the circuit.
Specifically, the second control device may determine a polarity parameter, a phase parameter, and a pulse amplitude parameter of the pulse generator, control the second pulse generator to generate a pulse signal, and superimpose the pulse signal on the input voltage signal of the to-be-measured object. It should be noted that the second control means may control the polarity parameter, the phase parameter, and the pulse amplitude parameter of the second pulse generator, setting the polarity parameter, the phase parameter, and the pulse amplitude parameter of the second pulse generator as desired parameters. Optionally, the second control device sets the phase parameter as the first phase parameter, and sets the polarity parameter as the first polarity parameter or the second polarity parameter. Optionally, the second control device sets the phase parameter to a second phase parameter and sets the polarity parameter to a second polarity parameter or a third polarity parameter. Specifically, the first phase parameter is used for indicating the pulse generator to superpose the pulse signal on the wave crest of the input voltage signal of the piece to be detected, and the second phase parameter is used for indicating the pulse generator to superpose the pulse signal on the wave trough of the input voltage signal of the piece to be detected; the first polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on an input voltage signal of a piece to be detected, the second polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage signal of the piece to be detected, the pulse generator is indicated after a preset interval to superpose a negative pulse signal on the input voltage signal of the piece to be detected, and the third polarity parameter is used for indicating the pulse generator to superpose a negative pulse signal on the input voltage signal of the piece to be detected. Specifically, the pulse amplitude parameter is used to indicate the voltage amplitude of the pulse signal.
Specifically, the second control device may further acquire a detection result of the second pulse generator. It should be noted that the detection result includes whether the object to be detected is damaged. When the detection result obtained by the second control device indicates that the piece to be detected is not damaged, the second control device increases the pulse amplitude parameter of the second pulse generator, controls the second pulse generator to generate a pulse signal corresponding to the increased pulse amplitude parameter, and superimposes the pulse signal on the input voltage of the piece to be detected until the detection result indicates that the piece to be detected is damaged.
Specifically, under the condition that the detection result obtained by the second control device is that the to-be-detected element is damaged, the second control device can also determine the surge voltage immunity of the to-be-detected element according to the pulse amplitude parameter corresponding to the damaged to-be-detected element. It should be noted that, when the piece to be tested is damaged under the condition that the second pulse generator outputs the pulse signal corresponding to the current pulse amplitude parameter to the piece to be tested, the second control device determines that the piece to be tested does not pass the surge voltage test of the current pulse amplitude parameter.
In an optional embodiment of the present application, the second pulse generator is provided with a second display device, and the second display device is connected with the current detection device and displays the magnitude of the circuit current in real time. In an optional embodiment of the present application, the second control device may further generate a test report, where the test report includes a pulse amplitude parameter corresponding to the damaged dut, total test time, a waveform diagram of a superimposed signal of the dut during the test, and the like. Optionally, the second control device is connected to the second display device of the second pulse generator, and the second control device controls the second display device of the second pulse generator to display the test report after the test is finished. Optionally, the second display device is a liquid crystal display.
In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A method for testing surge voltage immunity is applied to a surge immunity testing system, the system comprises a pulse generator and a piece to be tested, the pulse generator is connected with a power supply end of the piece to be tested, and the method comprises the following steps:
setting a polarity parameter, a phase parameter and a pulse amplitude parameter of the pulse generator, generating a pulse signal through the pulse generator, and superposing the pulse signal on the input voltage of the piece to be detected; the polarity parameter is a first polarity parameter or a second polarity parameter under the condition that the phase parameter is a first phase parameter, and the polarity parameter is a second polarity parameter or a third polarity parameter under the condition that the phase parameter is a second phase parameter; the first phase parameter is used for indicating the pulse generator to superpose pulse signals on wave crests of the input voltage of the piece to be detected, and the second phase parameter is used for indicating the pulse generator to superpose pulse signals on wave troughs of the input voltage of the piece to be detected; the first polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be detected, the second polarity parameter is used for indicating the pulse generator to superpose a positive pulse signal on the input voltage of the piece to be detected, and indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be detected after a preset interval, and the third polarity parameter is used for indicating the pulse generator to superpose a negative pulse signal on the input voltage of the piece to be detected; the pulse amplitude parameter is used for indicating the voltage amplitude of the pulse signal;
detecting whether the piece to be detected is damaged or not;
if the piece to be detected is not damaged, increasing pulse amplitude parameters of the pulse generator, generating pulse signals through the pulse generator, and superposing the pulse signals on the input voltage of the piece to be detected until the piece to be detected is damaged;
and determining the surge voltage immunity of the piece to be detected according to the pulse amplitude parameter corresponding to the damaged piece to be detected.
2. The method for testing surge voltage immunity according to claim 1, wherein before the pulse generator superimposes a pulse signal on the input voltage of the device under test, the method further comprises:
and setting a preset interval of the pulse generator, wherein the preset interval is used for indicating the interval duration of the pulse generator for superposing the adjacent two pulse signals on the input voltage of the piece to be detected.
3. The method for testing surge voltage immunity according to claim 1, wherein before the pulse generator superimposes a pulse signal on the input voltage of the device under test, the method further comprises:
and setting a coupling parameter, wherein the coupling parameter is used for indicating a mode of superposing the pulse signal to the input voltage of the piece to be tested by the pulse generator.
4. The method according to claim 3, wherein the coupling parameter is a first coupling parameter or a second coupling parameter, the first coupling parameter is used for instructing the pulse generator to apply a pulse signal between a live line and a ground line of the power end of the device under test, and the second coupling parameter is used for instructing the pulse generator to apply a pulse signal between a live line and a ground line of the power end of the device under test.
5. The method for testing surge voltage immunity according to claim 1, wherein before the pulse generator superimposes a pulse signal on the input voltage of the device under test, the method further comprises:
and setting a test frequency parameter, wherein the test frequency parameter is used for indicating the frequency of the pulse generator for superposing the pulse signals with the same polarity parameter, phase parameter and pulse amplitude parameter on the input voltage of the piece to be tested.
6. The method for testing surge voltage immunity according to claim 1, wherein the pulse generator is an 10/700 μ s combined wave generator.
7. The method for testing surge voltage immunity according to claim 3, wherein the pulse generator is a 1.2/50 μ s combined wave generator.
8. The method for testing the surge voltage immunity according to claim 6, wherein the pulse generator is a lightning surge generator SUG61005 BG.
9. A surge voltage immunity testing device is characterized by comprising:
the first pulse generator is connected with a power supply end of the piece to be detected and used for generating a pulse signal and superposing the pulse signal on the input voltage of the piece to be detected;
the first control device is connected with the first pulse generator and used for determining a polarity parameter, a phase parameter and a pulse amplitude parameter of the first pulse generator, controlling the first pulse generator to generate a pulse signal and superposing the pulse signal on the input voltage of the piece to be detected; the polarity parameter is a first polarity parameter or a second polarity parameter under the condition that the phase parameter is a first phase parameter, and the polarity parameter is a second polarity parameter or a third polarity parameter under the condition that the phase parameter is a second phase parameter; the first phase parameter is used for indicating the first pulse generator to superpose pulse signals on wave crests of the input voltage of the piece to be detected, and the second phase parameter is used for indicating the first pulse generator to superpose pulse signals on wave troughs of the input voltage of the piece to be detected; the first polarity parameter is used for indicating the first pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, the second polarity parameter is used for indicating the first pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, and indicating the first pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested after a preset interval, and the third polarity parameter is used for indicating the first pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested; the pulse amplitude parameter is used for indicating the voltage amplitude of the pulse signal; the pulse generator is also used for detecting whether the piece to be detected is damaged or not, if the piece to be detected is not damaged, the pulse amplitude parameter of the first pulse generator is increased, the first pulse generator is controlled to generate a pulse signal, and the pulse signal is superposed on the input voltage of the piece to be detected until the piece to be detected is damaged; and the pulse amplitude value parameter is used for determining the surge voltage immunity of the piece to be detected according to the pulse amplitude value parameter corresponding to the damaged piece to be detected.
10. A surge voltage immunity testing device is characterized by comprising:
the second pulse generator is connected with a power supply end of the piece to be detected and used for generating a pulse signal and superposing the pulse signal on the input voltage of the piece to be detected; the second pulse generator is also used for detecting whether the piece to be detected is damaged or not;
the second control device is connected with the second pulse generator and used for determining a polarity parameter, a phase parameter and a pulse amplitude parameter of the second pulse generator, controlling the second pulse generator to generate a pulse signal and superposing the pulse signal on the input voltage of the piece to be detected; the polarity parameter is a first polarity parameter or a second polarity parameter under the condition that the phase parameter is a first phase parameter, and the polarity parameter is a second polarity parameter or a third polarity parameter under the condition that the phase parameter is a second phase parameter; the first phase parameter is used for indicating the second pulse generator to superpose pulse signals on wave crests of the input voltage of the piece to be detected, and the second phase parameter is used for indicating the second pulse generator to superpose pulse signals on wave troughs of the input voltage of the piece to be detected; the first polarity parameter is used for indicating the second pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, the second polarity parameter is used for indicating the second pulse generator to superpose a positive pulse signal on the input voltage of the piece to be tested, and indicating the second pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested after a preset interval, and the third polarity parameter is used for indicating the second pulse generator to superpose a negative pulse signal on the input voltage of the piece to be tested; the pulse amplitude parameter is used for indicating the voltage amplitude of the pulse signal; the pulse amplitude parameter of the second pulse generator is increased if the detection result indicates that the piece to be detected is not damaged, the second pulse generator is controlled to generate a pulse signal, and the pulse signal is superposed on the input voltage of the piece to be detected until the detection result indicates that the piece to be detected is damaged; and the pulse amplitude value parameter is used for determining the surge voltage immunity of the piece to be detected according to the corresponding pulse amplitude value parameter when the piece to be detected is damaged.
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Application publication date: 20210914 |
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